The content of the invention
The technical problems to be solved by the invention are, there is provided a kind of preparation side of clad metal electrode solar cell
Method, can be such that the compactness of electrode improves and resistance value reduction, so as to improve the conversion efficiency of battery, reduce production cost.
In order to solve the above-mentioned technical problem, the invention provides a kind of preparation side of clad metal electrode solar cell
Method, comprises the following steps:
(1)Using wet method or dry method making herbs into wool, matte is formed in silicon chip surface;
(2)Silicon chip spreads in diffusion furnace, forms p-n junction;
(3)The phosphorosilicate glass that removal thermal diffusion is formed in silicon chip surface;
(4)Antireflective film is formed in front side of silicon wafer;
(5)By being screen printed onto, silicon chip back side prepares back electrode and Al carries on the back electric field;
(6)Ag electrodes are formed in front side of silicon wafer by silk-screen printing Ag slurries;
(7)High temperature sintering;
(8)First mask is covered in into front side of silicon wafer makes the region in addition to Ag electrodes carry out covering;
(9)Cu electrodes are deposited on Ag electrodes using the method for magnetron sputtering C u targets;
(10)Second mask is covered in into front side of silicon wafer makes the region in addition to Cu electrodes carry out covering;
(11)Sn electrodes are deposited on Cu electrodes using the method for magnetron sputtering Sn targets, composite positive electrode is finally given
Solar cell.
Used as the improvement of such scheme, the height h1 of the Ag electrodes is 7-12 microns, and width d1 is 20-30 microns.
Used as the improvement of such scheme, the Cu electrodes are covered on Ag electrodes, and the height h2 of the Cu electrodes is 5-
10 microns, width d2 is 30-50 microns.
Used as the improvement of such scheme, the Sn electrodes are covered on Cu electrodes, and the height h3 of the Sn electrodes is
0.1-1 microns, width d3 is 32-52 microns.
Used as the improvement of such scheme, first mask and the second mask are graphite or metal material.
Used as the improvement of such scheme, first mask covers front side of silicon wafer except Ag electricity with the pattern fits of Ag electrodes
Extremely outer region;Second mask covers region of the front side of silicon wafer in addition to Cu electrodes with the pattern fits of Cu electrodes.
As the improvement of such scheme, the step(2)Target block resistance is controlled during middle diffusion in 100-150 Europe/.
As the improvement of such scheme, the step(4)Using PECVD methods or magnetically controlled sputter method, in the silicon
Plate single-layer silicon nitride silicon, multilayer silicon nitride or silicon nitride/silicon dioxide lamination antireflective film in piece front.
As the improvement of such scheme, the step(5)In by silk-screen printing Ag slurries, form back of the body electricity in silicon chip back side
Pole, by silk-screen printing Al slurries, Al back of the body electric fields is formed in silicon chip back side, is then dried at 200-280 DEG C, removal slurry
Organic principle in material.
Implement the embodiment of the present invention, have the advantages that:
The present invention improves existing simple use and is screen printed onto the method that front side of silicon wafer prepares positive electrode, but first uses silk screen
Printing is obtained smaller and narrower Ag electrodes, then this time deposition Cu electrodes and the Sn electrodes by the way of magnetron sputtering, forms multiple
Close metal electrode.Due to by the way of magnetron sputtering, the good Ag/Cu alloys of compactness being formed, so as to reduce the electricity of electrode
Resistance, increases the collection efficiency of electric current.And prevent Cu electrodes from making as diaphragm in one layer of Sn electrode of Cu electrodes external sediment
Oxidation during, while ensuring the welding performance of electrode.In addition, reduce Ag slurry consumptions and increase the Cu raw materials of low cost,
So that the cost of the combination electrode is substantially reduced.The height of whole composite positive electrode is obviously improved, and reduces the series resistance of battery,
The conversion efficiency of the solar cell obtained by the present invention is set to be imitated than the conversion of the single front surface A g electrode solar cells of industrialization
Rate 0.2%-0.3% high.
Specific embodiment
To make the object, technical solutions and advantages of the present invention clearer, the present invention is made into one below in conjunction with accompanying drawing
Step ground is described in detail.
With reference to Fig. 1, a kind of preparation method of clad metal electrode solar cell of the invention is comprised the following steps:
S100, using wet method or dry method making herbs into wool, matte is formed in silicon chip surface.
Preparation method of the present invention can select wet method or dry etching technology, carry out making herbs into wool.
It should be noted that silicon chip of the present invention is the method by P-type silicon raw material crystal growth, crystal bar is formed
Afterwards, the size of 156mm x 156mm is sliced into, but is not limited to the size.
S101, silicon chip spreads in diffusion furnace, forms p-n junction.
N-type emitter stage is formed by being diffused in the front side of silicon wafer, and p-n junction is formed between silicon chip and N-type emitter stage.
It should be noted that P-type silicon piece is put into diffusion furnace carrying out phosphorus diffusion, temperature need to be controlled during diffusion at 800 DEG C
In the range of~820 DEG C, target block resistance is 100-150 Europe/.
S102, the phosphorosilicate glass that removal thermal diffusion is formed in silicon chip surface.
S103, antireflective film is formed in front side of silicon wafer.
The present invention prepares antireflective film and can plate individual layer in the front side of silicon wafer using PECVD methods or magnetically controlled sputter method
Silicon nitride, multilayer silicon nitride or silicon nitride/silicon dioxide lamination antireflective film.On the one hand the effect of antireflective film reduces reflectivity, separately
On the one hand silicon chip surface can be passivated, the compound of carrier is reduced.
S104, by being screen printed onto, silicon chip back side prepares back electrode and Al carries on the back electric field.
The present invention forms back electrode, by silk-screen printing Al slurries, in silicon by silk-screen printing Ag slurries in silicon chip back side
The piece back side forms Al back of the body electric fields, is then dried at 200-280 DEG C, the organic principle in removal slurry.
The existing positive electrode that is formed in front side of silicon wafer is usually according to the ginseng such as the positive electrode pattern, line width, line for designing be high
Number, front side of silicon wafer is coated in using silk-screen printing Ag slurry modes, after after high temperature sintering, forms Ag electrodes.
Silk-screen printing technique can be mass produced and dropped due to there is obvious advantage in the reduction of production cost
The features such as low production cycle, as the Main Means for preparing electrode.However, silk-screen printing technique positive electrode is not in printing process
Can avoid that disconnected grid and empty print phenomenon occurs, and the electrode compactness of silk-screen printing is poor, causes the resistance value of electrode larger.
Additionally, silk-screen printing metal electrode height out is not high, it is necessary to repeatedly printing.
On the other hand, existing positive electricity extremely Ag electrodes, but Ag slurry is expensive, causes the cost of battery always can not be significantly
Decline, lack price competitiveness.
Therefore, the present invention is improved to solve the above problems from step S105 ~ S109 to the preparation method of electrode.
S105, Ag electrodes are formed by silk-screen printing Ag slurries in front side of silicon wafer.
S106, high temperature sintering.
Ag is coated in front side of silicon wafer using screen printing mode first to starch, then by forming Ag electrodes after high temperature sintering,
Because, containing corrosion compositions such as frits, Ag electrodes can burn antireflective film, and p-n junction realizes that ohm connects in front surface A g electrodes
Touch.From unlike existing Ag electrodes, Ag electrode heights h1 of the present invention is only 7-12 microns, and width d2 is only 20-30 microns, than
Existing Ag electrodes(Line is a height of 10-20 microns, and line width is only 55-70 microns)Ag slurry consumptions are greatly reduced, is produced for reducing
Cost has obvious effect.
However, reduce Ag electrodes height and width be only capable of reduce Ag slurry consumption, reduces cost, but the compactness of electrode,
The performances such as electrical conductivity are not improved.The present invention passes through step S107 and step S108 further to solve.
S107, the first mask is covered in into front side of silicon wafer makes the region in addition to Ag electrodes carry out covering.
S108, Cu electrodes are deposited using the method for magnetron sputtering C u targets on Ag electrodes.
It should be noted that the pattern of the first mask hollow out is identical with the pattern of Ag electrodes, Ag electricity is formed in front side of silicon wafer
The covering of the first mask is got on afterwards extremely, hollow out position alignment Ag electrodes cause that region of the front side of silicon wafer in addition to Ag electrodes is all hidden
Width needed for lid, and reserved deposition Cu electrodes.Then, Cu electricity is deposited only on Ag electrodes using the method for magnetron sputtering C u targets
Pole.The result of magnetron sputtering C u targets is one layer of Cu electrode of Ag electrodes outer cladding, and the height h2 of Cu electrodes is 5-10 microns, width
D2 is 30-50 microns.
During sputtering sedimentation, Cu ions enter in the hole of Ag electrodes, and hole is filled up, and form compactness fine
Ag/Cu alloys, the resistance value of electrode can be reduced;Additionally, the empty of Ag electrodes prints or disconnected grid portion in screen printing process
Divide and also disappeared because of the formation of Cu electrodes, reduce the electrode resistance of battery, increase the collection efficiency of electric current;By adjusting magnetic
The time of sputtering is controlled, the height h2 of Cu electrodes is controlled to 5-10 microns, the total height of such Ag electrodes/Cu electrodes reaches 12-
22 microns, and the compactness of this combination electrode is very strong, the ability of collected current is greatly improved.
Additionally, effect of the Cu electrodes without corrosion antireflective film that magnetron sputtering is obtained, it is straight with antireflective film and Ag electrodes
Contact, is not in the phenomenon of Cu destruction p-n junctions, so ensures the conversion efficiency of battery.
But the oxidation resistance of Cu electrodes is poor, and Weldability is not enough, therefore need to also be in one layer of Sn of Cu electrodes outer cladding
Electrode.
S109, the second mask is covered in into front side of silicon wafer makes the region in addition to Cu electrodes carry out covering.
With step S106 similarly, the second mask is covered in the region that front side of silicon wafer makes in addition to Cu electrodes, and is reserved
Width needed for deposition Sn electrodes, Cu electrodes is exposed outside, facilitate subsequent step to continue to deposit Sn electrodes on Cu electrodes.
S110, Sn electrodes are deposited using the method for magnetron sputtering Sn targets on Cu electrodes, finally give composite positive electrode
Solar cell.
By controlling the time of magnetron sputtering Sn targets, the height h3 of Sn electrodes is set to be 0.1-1 microns, width d3 is 32-
52 microns.Because the welding performance of Cu electrodes is very poor, when battery seals into component, the adhesion of welding and battery main gate line is not
It is enough, it is easy to come off, so as to reduce the electric property of component.By depositing a Sn electrode on Cu electrodes, can change significantly
The welding performance of kind battery.Further, since the inoxidizability of Cu electrodes is poor, one layer of Sn electrode of deposition can be prevented as diaphragm
Only Cu electrodes oxidation in use.
It should be noted that the width d3 of Sn electrodes is 32-52 microns, it is ensured that Sn electrodes are fully wrapped around by Cu electrodes, its
Height h3 further improves electrode height for 0.1-1 microns in the case where its welding performance is ensured, improves the conversion effect of battery
Rate.
Solar cell obtained in preparation method of the present invention as shown in Figure 2, the solar cell under upper according to
It is secondary to carry on the back electric field 5 and back electrode 6 including positive electrode 1, antireflective film 2, N-type emitter stage 3, P-type silicon 4, Al.Wherein the positive electrode by it is interior to
Outer is Ag electrodes 11,13 3 clad metal electrodes of metal level composition of Cu electrodes 12 and Sn electrodes, due to using magnetron sputtering
Mode, form the good Ag/Cu alloys of compactness, so as to reduce the resistance value of electrode, increase the collection efficiency of electric current;And
In one layer of Sn electrode of Cu electrodes external sediment as diaphragm, the oxidation in use of Cu electrodes is prevented, and ensure electrode
Welding performance.In addition, reducing Ag slurry consumptions and increasing the consumption of inexpensive Cu raw materials so that the cost of the combination electrode drops significantly
It is low.The height of whole composite positive electrode is obviously improved, and reduces the series resistance of battery, makes solar cell obtained by the present invention
High conversion efficiency 0.2%-0.3% of the conversion efficiency than the single front surface A g electrode solar cells of industrialization.
It is last to should be noted that the above embodiments are merely illustrative of the technical solutions of the present invention rather than the present invention is protected
The limitation of scope is protected, although being explained in detail to the present invention with reference to preferred embodiment, one of ordinary skill in the art should
Understand, technical scheme can be modified or equivalent, without deviating from the essence of technical solution of the present invention
And scope.