CN104882392A - Hollow test clamp for surface acoustic wave filter assembly - Google Patents
Hollow test clamp for surface acoustic wave filter assembly Download PDFInfo
- Publication number
- CN104882392A CN104882392A CN201510254970.9A CN201510254970A CN104882392A CN 104882392 A CN104882392 A CN 104882392A CN 201510254970 A CN201510254970 A CN 201510254970A CN 104882392 A CN104882392 A CN 104882392A
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- China
- Prior art keywords
- acoustic wave
- surface acoustic
- wave filter
- filter assembly
- test
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
Abstract
The invention provides a hollow test clamp for a surface acoustic wave filter assembly. According to the hollow test clamp, the test of packaged chips and on-line debugging of PCBs can be realized, and the communication of the clamp and the assembly can be realized and the grounding of the assembly is guaranteed via inserting holes and grounding holes; a substrate in the assembly is well guaranteed, the test result is more accurate, the test precision is greatly improved, and plug and test and unplugging after test can be truly realized; the inserting holes are used for facilitating repeated tests, old complicated steps of repeated welding and dismounting are abandoned, the test efficiency can be effectively improved, measuring errors due to conventional repeated dismounting and welding can be avoided, and the test precision of the product can be effectively improved; and real-time grounding of the assembly can be realized via the grounding holes.
Description
Technical field
The present invention relates to frequency microwave field, particularly relate to a kind of Surface Acoustic Wave Filter assembly hollow test fixture.
Background technology
Along with the development of radio-frequency technique, the transceiver channel of some conventional communication equipments needs to meet simultaneously and can select various bandwidth, carries out the comprehensive of multiple waveforms and device miniaturization demand, therefore, day by day harsh to the requirement of filter frequencies index.
For Surface Acoustic Wave Filter assembly; if realize carrying out smoothly of surface acoustic wave module die package; just must guarantee that the bare chip in front meets the match circuit parameter at the characterisitic parameter of setting and the back side completely correct; therefore; usually in advance SAW (Surface Acoustic Wave) device can be arranged on base and first carry out a cDNA microarray; determine the correctness of circuit on the pcb board of the back side again with a common test fixture simultaneously, finally the chip chosen could be taken off again and paste into assembly and test.And this way exists Railway Project: the first, screening chip can cause damage to a certain degree to surface acoustic wave chip in advance, if again glued the chip chosen in advance into assembly, its parameter of surveying must change.This reduces conforming product rate, and add debugging difficulty.The second, after assembling components completes, general test fixture cannot be debugged the PCB at the back side again, if desired debugs, and must carry out dismounting again to assembly.
As everyone knows, if the debugging of Surface Acoustic Wave Filter assembly repeated disassembled and assembled, welding peripheral circuit can cause the damage of device or there is reliability hidden danger, inefficiency and test accuracy low being also unfavorable for also can be caused to produce in batches, the cost of product can be increased on the one hand, the qualification rate of product also reduces greatly, therefore, it is possible to carry out the fixture that cDNA microarray and PCB debug, and do not need fixture assembly being carried out to repeated disassembled and assembled to be significant for lifting subassembly performance and speed of production simultaneously.
Summary of the invention
Technical problem to be solved by this invention is to invent a kind of Surface Acoustic Wave Filter assembly hollow test fixture, hollow test clip prodigiosin provided by the invention carries out screening and the circuit debugging of chip on the assembly assembled, effectively can improve the precision of test and the efficiency of debugging, improve the throughput rate of product and the reliability of product, and structure is simple, with low cost, be easy to realize.
The present invention realizes like this, a kind of Surface Acoustic Wave Filter assembly hollow test fixture, comprise testing base, hollow test trough is provided with in the middle part of described testing base, described test trough is consistent with the pcb board shape of Surface Acoustic Wave Filter assembly, and described test trough is used for assembly property test and circuit debugging; Described test trough both sides are respectively provided with a socket hole, and described jack matches with the contact pin of described Surface Acoustic Wave Filter assembly; Described testing base both sides are respectively provided with a row SMA adapter, and described SMA adapter is used for being connected with vector network analyzer; Described jack and described SMA adapter are connected relation one to one.
Preferably, described testing base is rectangular base, and described testing base is respectively provided with a ground hole with described base four corners to corresponding position, and described ground hole closes on the edge of described test trough; The position of described ground hole is corresponding with the hole on described Surface Acoustic Wave Filter assembly, and size is also consistent with the hole on described Surface Acoustic Wave Filter assembly; Described ground hole is used for coordinating with threaded connector Surface Acoustic Wave Filter assembly and described testing base are fixed together, and threaded connector makes Surface Acoustic Wave Filter assembly and described test fixture ground connection through described ground hole.
Preferably, described test trough comprises four sides and four S shape corners, and two adjacent sides are mutually vertical and by the connection of S shape corner, four sides are connected to form enclosed slot.
Preferably, described ground hole is thread earthing hole, and described thread earthing bore dia is 1.8mm, and the degree of depth is 5mm.
Preferably, described jack has two rows, and every row amount is 3; Accordingly, described SMA adapter has two rows, and every row amount is 3; Each jack is communicated with corresponding SMA adapter (4).
Preferably, described jack and the most contiguous frontier distance of described test trough are 3mm.
Preferably, described SMA adapter is specially a kind of SMA90 degree four runners.
Preferably, the spacing of often arranging described SMA adapter is 23mm.
Preferably, often arrange described SMA adapter and protrude from described testing base for the connecting portion be connected with vector network analyzer; SMA adapter described in every side and testing base ipsilateral penumbra distance are 6mm; Every side is positioned at the described SMA adapter at two ends and testing base lateral edges distance is 7mm.
Implement the present invention, there is following beneficial effect:
The invention provides a kind of Surface Acoustic Wave Filter assembly hollow test fixture, hollow test clip can realize online debugging, the substrate of its component internal also can well be ensured and be made the result of test more accurate, substantially increase the precision of test, really accomplish namely to insert namely to survey, surveyed to finish and namely pull out; The effect of jack is convenient test repeatedly, abandon the tedious steps of old-fashioned dismounting Rewelding, dismounting, effectively can improve the efficiency of test, and old-fashioned repeated disassembled and assembled can be avoided to weld the measure error brought, effectively can improve the measuring accuracy of product; Ground hole can realize the real-time earthing of assembly.
Accompanying drawing explanation
Fig. 1 is the present embodiment hollow test fixture schematic diagram.
Wherein: 1-testing base, 2-test trough, 3-jack, 4-SMA adapter, 5-ground hole.
Embodiment
For making the object, technical solutions and advantages of the present invention clearly, below in conjunction with accompanying drawing, the present invention is described in further detail.
Embodiments provide a kind of Surface Acoustic Wave Filter assembly hollow test fixture, as shown in Figure 1, a kind of Surface Acoustic Wave Filter assembly hollow test fixture, comprise testing base 1, hollow test trough 2 is provided with in the middle part of described testing base 1, described test trough 2 is consistent with the pcb board shape of Surface Acoustic Wave Filter assembly, and described test trough 2 is for assembly property test and circuit debugging; Described test trough 2 both sides are respectively provided with a socket hole 3, and described jack 3 matches with the contact pin of described Surface Acoustic Wave Filter assembly; Described testing base 1 both sides are respectively provided with a row SMA adapter 4, and described SMA adapter 4 is for being connected with vector network analyzer; Described jack 3 and described SMA adapter 4 are connected relation one to one.
Preferably, described testing base 1 is rectangular base, and described testing base 1 is respectively provided with a ground hole 5 with described base four corners to corresponding position, and described ground hole 5 closes on the edge of described test trough 2; The position of described ground hole 5 is corresponding with the hole on described Surface Acoustic Wave Filter assembly, and size is also consistent with the hole on described Surface Acoustic Wave Filter assembly; Described ground hole 5 is for coordinating with threaded connector Surface Acoustic Wave Filter assembly and described testing base 1 are fixed together, and threaded connector makes Surface Acoustic Wave Filter assembly and described test fixture ground connection through described ground hole 5.
Described ground hole 5 is thread earthing hole, and described thread earthing bore dia is 1.8mm, and the degree of depth is 5mm.Test trough 2 comprises four sides and four S shape corners, two adjacent sides are mutually vertical also to be connected by S shape corner, article four, side is connected to form enclosed slot, and described circular corner cut is conducive to, after screw inserts described ground hole 5, playing a supportive role to described screw.
Preferably, described jack 3 has two rows, and every row amount is 3; Accordingly, described SMA adapter 4 has two rows, and every row amount is 3; Each jack 3 is communicated with corresponding SMA adapter (4).Described jack 3 frontier distance the most contiguous with described test trough 2 is 3mm.
Preferably, described SMA adapter 4 is specially a kind of SMA90 degree four runners.The spacing of often arranging described SMA adapter 4 is 23mm.
Preferably, often arrange described SMA adapter 4 and protrude from described testing base for the connecting portion be connected with vector network analyzer; SMA adapter 4 described in every side is 6mm with testing base 1 ipsilateral penumbra distance; The described SMA adapter 4 that every side is positioned at two ends is 7mm with testing base 1 lateral edges distance.
Above disclosedly be only present pre-ferred embodiments, certainly can not limit the interest field of the present invention with this, therefore according to the equivalent variations that the claims in the present invention are done, still belong to the scope that the present invention is contained.
Claims (8)
1. a Surface Acoustic Wave Filter assembly hollow test fixture, it is characterized in that, comprise testing base (1), described testing base (1) middle part is provided with hollow test trough (2), described test trough (2) is consistent with the pcb board shape of Surface Acoustic Wave Filter assembly, and described test trough (2) is for assembly property test and circuit debugging; Described test trough (2) both sides are respectively provided with a socket hole (3), and described jack (3) matches with the contact pin of described Surface Acoustic Wave Filter assembly; Described testing base (1) both sides are respectively provided with a row SMA adapter (4), and described SMA adapter (4) is for being connected with vector network analyzer; Described jack (3) and described SMA adapter (4) are connected relation one to one.
2. a kind of Surface Acoustic Wave Filter assembly hollow test fixture according to claim 1, it is characterized in that, described testing base (1) is rectangular base, above respectively be provided with a ground hole (5) with described base four corners to corresponding position in described testing base (1), described ground hole (5) closes on the edge of described test trough (2); The position of described ground hole (5) is corresponding with the hole on described Surface Acoustic Wave Filter assembly, and size is also consistent with the hole on described Surface Acoustic Wave Filter assembly; Described ground hole (5) is for coordinating with threaded connector Surface Acoustic Wave Filter assembly and described testing base (1) are fixed together, and threaded connector makes Surface Acoustic Wave Filter assembly and described test fixture ground connection through described ground hole (5).
3. according to a kind of Surface Acoustic Wave Filter assembly hollow test fixture described in claim 1 or 2, it is characterized in that, described test trough (2) comprises four sides and four S shape corners, two adjacent sides are mutually vertical and by the connection of S shape corner, four sides are connected to form enclosed slot.
4. a kind of Surface Acoustic Wave Filter assembly hollow test fixture according to claim 3, it is characterized in that, described ground hole (5) is thread earthing hole, and described thread earthing bore dia is 1.8mm, and the degree of depth is 5mm.
5., according to a kind of Surface Acoustic Wave Filter assembly hollow test fixture in claim 1,2,4 described in any one, it is characterized in that, described jack (3) has two rows, and every row amount is 3; Described SMA adapter (4) has two rows, and every row amount is 3; Each jack (3) is communicated with corresponding SMA adapter (4).
6. according to a kind of Surface Acoustic Wave Filter assembly hollow test fixture described in claim 5, it is characterized in that, often arrange described SMA adapter (4) and protrude from described testing base (1) for the connecting portion be connected with vector network analyzer.
7., according to a kind of Surface Acoustic Wave Filter assembly hollow test fixture described in claim 6, it is characterized in that, described SMA adapter (4) is specially a kind of SMA90 degree four runners.
8., according to a kind of Surface Acoustic Wave Filter assembly hollow test fixture described in claim 7, it is characterized in that, the spacing of often arranging described SMA adapter (4) is 23mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510254970.9A CN104882392B (en) | 2015-05-19 | 2015-05-19 | A kind of hollow test fixture of SAW filter component |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510254970.9A CN104882392B (en) | 2015-05-19 | 2015-05-19 | A kind of hollow test fixture of SAW filter component |
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| Publication Number | Publication Date |
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| CN104882392A true CN104882392A (en) | 2015-09-02 |
| CN104882392B CN104882392B (en) | 2018-02-09 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201510254970.9A Active CN104882392B (en) | 2015-05-19 | 2015-05-19 | A kind of hollow test fixture of SAW filter component |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107238505A (en) * | 2017-05-24 | 2017-10-10 | 中国电子科技集团公司第四十研究所 | A kind of fixture tested for SAW filter high/low temperature |
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| US5654528A (en) * | 1994-11-24 | 1997-08-05 | Fuji Photo Optical Co., Ltd. | Flexible printed circuit |
| US20050223902A1 (en) * | 2004-04-12 | 2005-10-13 | Lovell William S | Self-powered, wearable personal air purifier |
| CN1808126A (en) * | 2006-01-05 | 2006-07-26 | 厦门大学 | Microwave ceramic element detection clamp and device, and detection method thereof |
| CN201555864U (en) * | 2009-11-26 | 2010-08-18 | 中国电子科技集团公司第二十六研究所 | SAW filter test fixture |
| CN203772978U (en) * | 2014-01-06 | 2014-08-13 | 中国电子科技集团公司第十四研究所 | Multifunctional test device used for surface acoustic wave filter |
| CN204101597U (en) * | 2014-08-20 | 2015-01-14 | 苏州艾福电子通讯有限公司 | A kind of filters to test fixture |
| CN104549591A (en) * | 2015-01-27 | 2015-04-29 | 东南大学 | Universal device for fixing and connecting micro-fluidic chip with electrode |
-
2015
- 2015-05-19 CN CN201510254970.9A patent/CN104882392B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5654528A (en) * | 1994-11-24 | 1997-08-05 | Fuji Photo Optical Co., Ltd. | Flexible printed circuit |
| US20050223902A1 (en) * | 2004-04-12 | 2005-10-13 | Lovell William S | Self-powered, wearable personal air purifier |
| CN1808126A (en) * | 2006-01-05 | 2006-07-26 | 厦门大学 | Microwave ceramic element detection clamp and device, and detection method thereof |
| CN201555864U (en) * | 2009-11-26 | 2010-08-18 | 中国电子科技集团公司第二十六研究所 | SAW filter test fixture |
| CN203772978U (en) * | 2014-01-06 | 2014-08-13 | 中国电子科技集团公司第十四研究所 | Multifunctional test device used for surface acoustic wave filter |
| CN204101597U (en) * | 2014-08-20 | 2015-01-14 | 苏州艾福电子通讯有限公司 | A kind of filters to test fixture |
| CN104549591A (en) * | 2015-01-27 | 2015-04-29 | 东南大学 | Universal device for fixing and connecting micro-fluidic chip with electrode |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107238505A (en) * | 2017-05-24 | 2017-10-10 | 中国电子科技集团公司第四十研究所 | A kind of fixture tested for SAW filter high/low temperature |
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| CN104882392B (en) | 2018-02-09 |
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Inventor after: Wan Fei Inventor after: Huang Xin Inventor after: Yang Sichuan Inventor after: Chen Minghe Inventor after: Li Kai Inventor before: Li Hong Inventor before: Wan Fei Inventor before: Yang Sichuan Inventor before: Chen Minghe Inventor before: Huang Xin Inventor before: Li Kai |
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Address after: 100095, 19C, building 1, international pioneer park, No. 2, information road, Beijing, Haidian District Patentee after: Beijing Zhongke Feihong Technology Co., Ltd Address before: 100095, 19C, building 1, international pioneer park, No. 2, information road, Beijing, Haidian District Patentee before: BEIJING ZHONGKE FEIHONG SCIENCE & TECHNOLOGY Co.,Ltd. |