CN104807840A - Sample fixing device for superconducting strip XRD texture measurement - Google Patents
Sample fixing device for superconducting strip XRD texture measurement Download PDFInfo
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- CN104807840A CN104807840A CN201510206310.3A CN201510206310A CN104807840A CN 104807840 A CN104807840 A CN 104807840A CN 201510206310 A CN201510206310 A CN 201510206310A CN 104807840 A CN104807840 A CN 104807840A
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- fixing device
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- texture measurement
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Abstract
The invention discloses a sample fixing device for superconducting strip XRD texture measurement. The sample fixing device comprises a vacuum chuck, a vacuum pump, and a vacuum pipeline enabling the vacuum chuck and the vacuum pump to be communicated with each other, wherein the vacuum chuck includes a vacuum chamber of which the upper surface is used as a sample mounting surface, a plurality of capillary pores with openings formed in the upper surface of the vacuum chamber, and a vacuumizing connecting opening formed in the side wall of the vacuum chamber and used for communicating the vacuum pipeline with the vacuum chamber; the capillary pores are communicated with the interior of the vacuum chamber; the vacuum chamber is fixed on an XRD sample platform through a fixing device. The sample fixing device provided by the invention has the advantages as follows: as a separate component, the sample fixing device can be directly used on the existing XRD texture measuring instrument, so that the functions of the existing XRD texture measuring instrument are extended, and the XRD texture measuring instrument can measure thin superconducting strip samples which are liable to deformation; the accuracy and repeatability of the superconducting strip XRD texture measurement are improved, the working difficulty is greatly reduced, the measurement efficiency is improved, and the test sample can be recycled in a non-destructive manner.
Description
Technical field
the present invention relates to testing apparatus technical field, especially relate to a kind of sample fixing device for superconducting tape XRD texture measurement.
Background technology
high temperature superconducting materia all has a wide range of applications in fields such as electric power, new forms of energy, Medical Devices, defence equipments.Have many companies to be devoted to belt material of high temperature superconduct industrialization development and application displaying both at home and abroad, belt material of high temperature superconduct is forming an emerging industry.Main performance-the current capacity of belt material of high temperature superconduct depends on the neat degree of the crystal grain arrangement of superconducting thin film, i.e. crystal texture characteristic, and the crystal property therefore how accurately detecting each thin layer of superconducting tape is the crucial problem of of superconducting tape.But due to the metal sheet band that the belt material of high temperature superconduct use of two generations is very thin, its thickness is between 30 ~ 100 μm, stress small in band is just easy to make deformation of strip, so bending as shown in Figure 1 appears in middle in band usually, and XRD texture measurement is very high to the flatness requirement of sample, this causes measurement result incorrect, maybe cannot measure.
above-mentioned two generation belt material of high temperature superconduct sample XRD texture measurement in, usual practice is sticked together by double faced adhesive tape at superconducting tape and XRD sample stage, concrete steps are: first cut the double faced adhesive tape grown the same as sample length and width, it is attached on XRD sample stage, again sample is attached on double faced adhesive tape, no matter double faced adhesive tape on XRD sample stage, or sample is attached on double faced adhesive tape and all needs very high skill, need very carefully to operate to ensure that double faced adhesive tape develops at sample stage do not have fold to rise and fall and bubble.Usual way is the end thereof contacts XRD sample stage double faced adhesive tape, impose suitable pressure in this one end, then gradually and equably this pressure mobile, make double faced adhesive tape uniform force ground, ground, a direction little by little contacts XRD sample stage, under guaranteeing do not have bubble to be closed in double faced adhesive tape.It double faced adhesive tape is also like this that sample is attached to.The drawback of the method is to ensure repeatability, so same sample, different people, measures time different and sometimes have different results.If sample bonding unsuccessful (than if any bubble, not having centering adjustment line etc.), sample cannot be again bonding, because if sample is torn it down from double faced adhesive tape substantially just ruined sample.And pressing superconducting tape surface, cause some to damage can to superconducting tape surface, affect test result, after test terminates, superconducting tape can not be recycled and does further other tests or deposit other films.
the method that we also attempt other is improved, method 1: we cling superconducting tape two ends end to end with adhesive tape, it is made to be fixed on sample stage, the method is easy and simple to handle, do not touch sample surfaces (two ends except non-measured) but find that its drawback is in practice, still can some be protruding in the middle of superconducting tape, cause test data degree of accuracy to decline.Method 2, with the both sides each 2 ~ 4mm of adhesive tape along superconducting tape, is bonded at superconducting tape on sample stage, phase ratio method 1, superconducting tape be raised with many improvement, but still have projection, decrease simultaneously and can measure area, this can when Phi scan introducing error.These methods measurement efficiency is low simultaneously, and the time of gluing sample occupies quite a few of overall measurement time.The angle General Requirements of the placement of sample overlaps with the zero degree of XRD texture measurement instrument or has an accurate angle in addition, the center of sample also requires to overlap with the centre position of XRD texture measurement instrument, but is difficult to accomplish accurate aligning by the method that double faced adhesive tape is bonding.
Summary of the invention
the present invention seeks to: a kind of sample fixing device for superconducting tape XRD texture measurement is provided, vacuum suction method is adopted to be fixed on by superconducting tape sample on existing XRD texture measurement instrument, the function expanding existing XRD texture measurement instrument makes it to measure very thin and yielding superconducting tape sample, the degree of accuracy to superconducting tape XRD texture measurement and repeatability can be improved simultaneously, easy, Quick high measurement efficiency, and test sample can can't harm recovery.
technical scheme of the present invention is: a kind of sample fixing device for superconducting tape XRD texture measurement, comprise vacuum cup, vacuum pump, and be communicated with the vacuum line of described vacuum cup and described vacuum pump, described vacuum cup comprises the vacuum cavity of upper surface as sample installed surface, several openings are located at described vacuum cavity upper surface and the pore be communicated with described vacuum cavity inside, and to be located on described vacuum cavity sidewall and to vacuumize interface for what be communicated with described vacuum line and described vacuum cavity, described vacuum cavity is fixed on XRD sample stage by stationary installation.
as preferred technical scheme, described pore presses hexagonal closs packing structural arrangement at the opening of described vacuum cavity upper surface.
as preferred technical scheme, the aperture of described pore and the pitch of holes of adjacent pore are all less than 1mm.
as preferred technical scheme, the aperture of described pore and the pitch of holes of adjacent pore are all less than 0.5mm.
as preferred technical scheme, in order to adapt to the superconducting tape sample of varying strength, different stress intensity, this sample fixing device also comprises suction regulator, described suction regulator comprises the needle valve be located on described vacuum line, also flow resistance focusing valve or air release can be selected from, and regulate suction according to different superconducting tape sample, make superconducting tape entirely be adsorbed on sample installed surface, be unlikely to again because suction local inequality causes superconducting tape to be out of shape at pore place simultaneously.
as preferred technical scheme, described vacuum pump is placed in outside XRD texture measurement instrument, and be communicated with described vacuum cavity by described vacuum line, because vacuum pump has very strong vibrations usually, and XRD texture measurement instrument is a kind of exact instrument, so the place that must be placed on away from XRD texture measurement instrument do certain noise reduction process, to get rid of the impact of vacuum pump vibrations on XRD texture measurement instrument; Vacuum pump is communicated with the vacuum cavity be fixed on XRD sample stage by vacuum line simultaneously, enough soft to the requirement of vacuum line, be subject to less than any vibrations in XRD texture measurement instrument end feel, and impact can not be had on XRD texture measurement instrument when XRD sample stage does the Phi scanning of 0-360 degree and 0-90 degree Kai scans.
as preferred technical scheme, described vacuum pump is without oily miniature diaphragm vacuum pump.
as preferred technical scheme, described vacuum line is rubber tube or flexible plastic tube, have highly flexible simultaneously again can resistance to live vacuum pressure indeformable, rubber tube is softer, but resistance to pressure reduction, hard plastic tube is resistance to be pressed, but comparatively hard, so flexible plastic tube uses proper here; Simultaneously as follows for the thickness requirement of vacuum cavity, because on XRD texture measurement instrument, the range of adjustment of height of specimen is limited, too thick vacuum cavity is to different XRD texture measurement instrument bad adaptability, usual THICKNESS CONTROL is in 10mm, in best 6mm, and the diameter of vacuum line is also by the impact of vacuum cavity, its diameter range is 3 ~ 6mm.
as preferred technical scheme, described vacuum pump is connected with foot pedal vacuum switch, and person easy to use, after aligning superconducting tape sample, opens vacuum pump immediately, superconducting tape sample adsorption is lived, reduces and move to possible sample during going to open vacuum pump switch from having aimed at sample.
as preferred technical scheme, described sample installed surface is provided with coordinate line, superconducting tape sample is helped accurately, repeatedly to install on the measuring location, to ensure the setting angle of sample, the center of its coordinate line overlaps with the zero degree position of XRD texture measurement instrument and XRD texture measurement centre.
advantage of the present invention is:
1. the present invention is used for the sample fixing device of superconducting tape XRD texture measurement, the function expanding existing XRD texture measurement instrument makes it to measure very thin and yielding superconducting tape sample, the degree of accuracy to superconducting tape XRD texture measurement and repeatability can be improved, greatly reduce the difficulty of work, improve and measure efficiency, and test sample can can't harm recovery;
2. the present invention is used for the sample fixing device of superconducting tape XRD texture measurement as independent parts, can be directly used on existing XRD texture measurement instrument, easy for installation, cost is low and easy to maintenance, improve its use value, and do not affect the existing running of XRD texture measurement instrument and the rotation of each gage beam;
3. the present invention is used for the sample fixing device of superconducting tape XRD texture measurement, utilize pore pore size, adjacent pore pitch of holes and arrangement mode to make superconducting tape sample reliably, be entirely adsorbed on vacuum cavity upper surface (i.e. sample installed surface), superconducting tape will be caused to be out of shape at pore place because of suction local inequality again simultaneously.
Accompanying drawing explanation
below in conjunction with drawings and Examples, the invention will be further described:
fig. 1 is existing superconducting tape XRD texture measurement view;
fig. 2 is the structural representation of the present invention for the sample fixing device of superconducting tape XRD texture measurement;
wherein: 1 vacuum pump, 2 vacuum lines, 3 vacuum cups, 3-1 vacuum cavity, 3-2 pore, 3-3 vacuumizes interface, 4 stationary installations, 5XRD sample stage, 6 suction regulators, 7 foot pedal vacuum switches, 8 superconducting tapes.
Embodiment
embodiment: with reference to Fig. 1, shown in 2, a kind of sample fixing device for superconducting tape XRD texture measurement, comprise vacuum cup 3, this vacuum pump 1 of vacuum pump 1(is without oily miniature diaphragm vacuum pump), and be communicated with the vacuum line 2 of vacuum cup 3 and vacuum pump 1, vacuum cup 3 comprises the vacuum cavity 3-1 of upper surface as sample installed surface, several openings are located at vacuum cavity 3-1 upper surface and the pore 3-2 be communicated with vacuum cavity 3-1 inside, and to be located on vacuum cavity 3-1 sidewall and to vacuumize interface 3-3 for what be communicated with vacuum line 2 and vacuum cavity 3-1, vacuum cavity 3-1 is fixed on XRD sample stage 5 by stationary installation 4, vacuum pump 1 is also connected with foot pedal vacuum switch 7, person easy to use is after aligning superconducting tape 8 sample, open vacuum pump 1 immediately, superconducting tape 8 sample adsorption is lived, reduce and move to possible sample during going to open vacuum pump 1 switch from having aimed at sample, sample installed surface is provided with coordinate line simultaneously, help superconducting tape 8 sample accurately, install on the measuring location repeatedly, to ensure the setting angle of sample, the center of its coordinate line overlaps with the zero degree position of XRD texture measurement instrument and XRD texture measurement centre.
pore 3-2 of the present invention presses hexagonal closs packing structural arrangement at the opening of vacuum cavity 3-1 upper surface, the aperture of pore 3-2 and the pitch of holes of adjacent pore 3-2 are all less than 0.5mm simultaneously, utilize pore 3-2 pore size, adjacent pore 3-2 pitch of holes and arrangement mode to make superconducting tape 8 sample reliably, be entirely adsorbed on vacuum cavity 3-1 upper surface (i.e. sample installed surface), superconducting tape 8 will be caused to be out of shape at pore 3-2 place because of suction local inequality again simultaneously.
the present invention is in order to adapt to superconducting tape 8 sample of varying strength, different stress intensity, this sample fixing device also comprises suction regulator 6, suction regulator 6 comprises the needle valve be located on vacuum line 2, also flow resistance focusing valve or air release can be selected from, and regulate suction according to different superconducting tape 8 sample, make superconducting tape 8 entirely be adsorbed on sample installed surface, be unlikely to again because suction local inequality causes superconducting tape 8 to be out of shape at pore 3-2 place simultaneously.
vacuum pump 1 of the present invention is placed in outside XRD texture measurement instrument, and be communicated with vacuum cavity 3-1 by vacuum line 2, because vacuum pump 1 has very strong vibrations usually, and XRD texture measurement instrument is a kind of exact instrument, so the place that must be placed on away from XRD texture measurement instrument do certain noise reduction process, shake impact on XRD texture measurement instrument to get rid of vacuum pump 1; Vacuum pump 1 is communicated with the vacuum cavity 3-1 be fixed on XRD sample stage by vacuum line 2 simultaneously, enough soft to the requirement of vacuum line 2, be subject to less than any vibrations in XRD texture measurement instrument end feel, and impact can not be had on XRD texture measurement instrument when XRD sample stage does the Phi scanning of 0-360 degree and 0-90 degree Kai scans.
vacuum line 2 of the present invention is flexible plastic tube, have highly flexible simultaneously again can resistance to live vacuum pressure indeformable, rubber tube is softer, but resistance to pressure reduction, and hard plastic tube is resistance to be pressed, but comparatively hard, so flexible plastic tube uses proper here; Simultaneously as follows for the thickness requirement of vacuum cavity 3-1, because on XRD texture measurement instrument, the range of adjustment of height of specimen is limited, too thick vacuum cavity 3-1 is to different XRD texture measurement instrument bad adaptability, usual THICKNESS CONTROL is in 10mm, in best 6mm, and the diameter of vacuum line 2 is also by the impact of vacuum cavity 3-1, its diameter range is 3 ~ 6mm.
in the present invention, superconducting tape 8 is absorbed and fixed at vacuum cavity 3-1 upper surface, cover all pore 3-2, if measure special little superconducting tape sample and all pore 3-2 cannot be covered, adhesive tape or additive method can also be used to seal unnecessary pore.
above explanation is not limited to for illustration of the present invention limit the scope of the invention; only for technical conceive of the present invention and feature are described; its object is to person skilled in the art person can be understood content of the present invention and implement according to this, can not limit the scope of the invention with this.All equivalent transformations of doing according to Spirit Essence of the present invention or modification, all should be encompassed within protection scope of the present invention.Such as, no matter vacuum cup 3 is square, circular, trapezoidal or stepped ramp type, no matter the vacuum cavity 3-1 of vacuum cup 3 is sealed to form by several pieces, no matter its sealing is formed by O circle, welding or wringing fit, no matter vacuumizing interface 3-3 is at vacuum cavity 3-1 side or the back side, no matter pore 3-2 is circular or square, and no matter XRD texture measurement instrument is Bruker diffractometer, Ricoh's diffractometer or Panalitic diffractometer, all belongs to the scope of the invention.Last fundamental purpose of the present invention is the measurement in order to superconducting tape 8, but the measurement of being out of shape strip in other applications also should be regarded as scope of the present invention.
Claims (10)
1. the sample fixing device for superconducting tape XRD texture measurement, comprise vacuum cup (3), vacuum pump (1), and be communicated with the vacuum line (2) of described vacuum cup (3) and described vacuum pump (1), it is characterized in that, described vacuum cup (3) comprises the vacuum cavity (3-1) of upper surface as sample installed surface, several openings are located at described vacuum cavity (3-1) upper surface and the pore (3-2) be communicated with described vacuum cavity (3-1) inside, and to be located on described vacuum cavity (3-1) sidewall and to vacuumize interface (3-3) for what be communicated with described vacuum line (2) and described vacuum cavity (3-1), described vacuum cavity (3-1) is fixed on XRD sample stage (5) by stationary installation (4).
2. the sample fixing device for superconducting tape XRD texture measurement according to claim 1, is characterized in that, described pore (3-2) presses hexagonal closs packing structural arrangement at the opening of described vacuum cavity (3-1) upper surface.
3. the sample fixing device for superconducting tape XRD texture measurement according to claim 1 and 2, is characterized in that, the aperture of described pore (3-2) and the pitch of holes of adjacent pore (3-2) are all less than 1mm.
4. the sample fixing device for superconducting tape XRD texture measurement according to claim 3, is characterized in that, the aperture of described pore (3-2) and the pitch of holes of adjacent pore (3-2) are all less than 0.5mm.
5. the sample fixing device for superconducting tape XRD texture measurement according to claim 1, it is characterized in that, this sample fixing device also comprises suction regulator (6), and described suction regulator (6) comprises the needle valve be located on described vacuum line (2).
6. the sample fixing device for superconducting tape XRD texture measurement according to claim 1, is characterized in that, described vacuum pump (1) is placed in outside XRD texture measurement instrument, and is communicated with described vacuum cavity (3-1) by described vacuum line (2).
7. the sample fixing device for superconducting tape XRD texture measurement according to claim 6, is characterized in that, described vacuum pump (1) is without oily miniature diaphragm vacuum pump.
8. the sample fixing device for superconducting tape XRD texture measurement according to claim 6, is characterized in that, described vacuum line (2) is rubber tube or flexible plastic tube, and its diameter range is 3 ~ 6mm.
9. the sample fixing device for superconducting tape XRD texture measurement according to claim 1, is characterized in that, described vacuum pump (1) is connected with foot pedal vacuum switch (7).
10. the sample fixing device for superconducting tape XRD texture measurement according to claim 1, it is characterized in that, described sample installed surface is provided with coordinate line, and the center of its coordinate line overlaps with the zero degree position of XRD texture measurement instrument and XRD texture measurement centre.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201510206310.3A CN104807840A (en) | 2015-04-28 | 2015-04-28 | Sample fixing device for superconducting strip XRD texture measurement |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201510206310.3A CN104807840A (en) | 2015-04-28 | 2015-04-28 | Sample fixing device for superconducting strip XRD texture measurement |
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| CN104807840A true CN104807840A (en) | 2015-07-29 |
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| CN201510206310.3A Pending CN104807840A (en) | 2015-04-28 | 2015-04-28 | Sample fixing device for superconducting strip XRD texture measurement |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106370496A (en) * | 2016-10-28 | 2017-02-01 | 长沙开元仪器股份有限公司 | Sample shaping system for X-ray fluorescence on-line testing |
| CN107741353A (en) * | 2017-12-09 | 2018-02-27 | 庄明忠 | The comprehensive hardness measurement instrument of one kind building detection |
| CN108051460A (en) * | 2017-12-07 | 2018-05-18 | 齐鲁工业大学 | A kind of Micro-CT scanning sample preparation methods of stationery substance |
| CN111679164A (en) * | 2020-06-11 | 2020-09-18 | 浙江大学 | Multi-angle visible superconducting strip impact frame |
| CN113302482A (en) * | 2018-11-23 | 2021-08-24 | 株式会社理学 | Device and method for storing single crystal X-ray structure analysis sample |
| CN114388259A (en) * | 2022-01-13 | 2022-04-22 | 中国科学院电工研究所 | Jointless multi-cake coil winding machine |
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111679164A (en) * | 2020-06-11 | 2020-09-18 | 浙江大学 | Multi-angle visible superconducting strip impact frame |
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| CN114388259B (en) * | 2022-01-13 | 2023-11-10 | 中国科学院电工研究所 | Non-joint multi-cake coil winding machine |
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