CN104769422B - 组合共焦x射线荧光和x射线计算机断层扫描的系统和方法 - Google Patents
组合共焦x射线荧光和x射线计算机断层扫描的系统和方法 Download PDFInfo
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- CN104769422B CN104769422B CN201380056545.8A CN201380056545A CN104769422B CN 104769422 B CN104769422 B CN 104769422B CN 201380056545 A CN201380056545 A CN 201380056545A CN 104769422 B CN104769422 B CN 104769422B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2206—Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/24—Earth materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
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- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Pulmonology (AREA)
- Radiology & Medical Imaging (AREA)
- Theoretical Computer Science (AREA)
- Medicinal Chemistry (AREA)
- Food Science & Technology (AREA)
- Environmental & Geological Engineering (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Remote Sensing (AREA)
- Geology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201261698137P | 2012-09-07 | 2012-09-07 | |
| US61/698,137 | 2012-09-07 | ||
| PCT/US2013/058464 WO2014039793A1 (en) | 2012-09-07 | 2013-09-06 | Combined confocal x-ray fluorescence and x-ray computerised tomographic system and method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104769422A CN104769422A (zh) | 2015-07-08 |
| CN104769422B true CN104769422B (zh) | 2018-06-12 |
Family
ID=49213145
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201380056545.8A Active CN104769422B (zh) | 2012-09-07 | 2013-09-06 | 组合共焦x射线荧光和x射线计算机断层扫描的系统和方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US9488605B2 (cg-RX-API-DMAC10.html) |
| EP (1) | EP2893331B1 (cg-RX-API-DMAC10.html) |
| JP (1) | JP6353450B2 (cg-RX-API-DMAC10.html) |
| CN (1) | CN104769422B (cg-RX-API-DMAC10.html) |
| WO (1) | WO2014039793A1 (cg-RX-API-DMAC10.html) |
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| JP5907375B2 (ja) * | 2011-12-28 | 2016-04-26 | 株式会社テクノエックス | 蛍光ｘ線分析装置及び蛍光ｘ線分析方法 |
| JP6036321B2 (ja) * | 2012-03-23 | 2016-11-30 | 株式会社リガク | Ｘ線複合装置 |
| WO2013184021A1 (en) * | 2012-06-09 | 2013-12-12 | Schlumberger, Holdings Limited | A method for estimating porosity of a rock sample |
| US10247682B2 (en) | 2013-04-04 | 2019-04-02 | Illinois Tool Works Inc. | Helical computed tomography |
| CA2904111C (en) * | 2013-04-12 | 2017-05-16 | Illnois Tool Works Inc. | High-resolution computed tomography |
| JP6361871B2 (ja) * | 2014-07-07 | 2018-07-25 | 住友金属鉱山株式会社 | データ処理装置、データ処理プログラム、データ処理方法および処理条件決定方法 |
| EP3190402B1 (en) * | 2014-09-02 | 2023-10-18 | Nikon Corporation | Measurement processing device, x-ray inspection apparatus, method for manufacturing a structure, measurement processing method and measurement processing program |
| CN107076683B (zh) | 2014-09-02 | 2021-05-07 | 株式会社尼康 | 测量处理装置、测量处理方法、测量处理程序和用于制造该装置的方法 |
| CN104502374A (zh) * | 2014-12-17 | 2015-04-08 | 中国石油天然气股份有限公司 | 一种岩心ct扫描射线硬化的校正方法 |
| US9368321B1 (en) * | 2014-12-22 | 2016-06-14 | Fei Company | Fiducial-based correlative microscopy |
| CZ201527A3 (cs) * | 2015-01-20 | 2016-07-27 | Pixel R&D S.R.O. | Způsob trojrozměrného skenování pomocí fluorescence vyvolané elektromagnetickým zářením a zařízení k provádění tohoto způsobu |
| KR102567610B1 (ko) * | 2015-04-02 | 2023-08-16 | 소레크 뉴클리어 리서치 센터 | Ｘｒｆ 마킹을 판독하는 장치와 방법 |
| WO2016193968A1 (en) * | 2015-06-01 | 2016-12-08 | Xwinsys Ltd. | Metrology inspection apparatus |
| US20170023495A1 (en) * | 2015-07-20 | 2017-01-26 | Apple Inc. | Universal computerized tomography fixture system with a multi-scan robotic positioning apparatus |
| US20180247450A1 (en) * | 2015-09-03 | 2018-08-30 | Schlumberger Technology Corporation | A computer-implemented method and a system for creating a three-dimensional mineral model of a sample of a heterogenous medium |
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| WO2017175219A1 (en) * | 2016-04-04 | 2017-10-12 | Soreq Nuclear Research Center | A method and a system for xrf marking and reading xrf marks of electronic systems |
| US11029267B2 (en) | 2016-04-04 | 2021-06-08 | Security Matters Ltd. | Method and a system for XRF marking and reading XRF marks of electronic systems |
| GB201611357D0 (en) * | 2016-06-30 | 2016-08-17 | Cirdan Imaging Ltd | A cabinet x-ray system for imaging a specimen and associated method |
| GB2551980A (en) * | 2016-06-30 | 2018-01-10 | Commw Scient Ind Res Org | Method and system for low level metal analysis of mineral samples |
| US10359376B2 (en) * | 2016-07-20 | 2019-07-23 | Malvern Panalytical B.V. | Sample holder for X-ray analysis |
| WO2018051353A1 (en) * | 2016-09-19 | 2018-03-22 | Soreq Nuclear Research Center | X-ray fluorescence system and method for identifying samples |
| JP6711410B2 (ja) * | 2016-11-01 | 2020-06-17 | 株式会社島津製作所 | 放射線断層撮影装置の撮像倍率校正方法 |
| SE540371C2 (en) | 2017-02-06 | 2018-08-21 | Orexplore Ab | A sample holder for holding a drill core sample or drill cuttings, an apparatus and system comprising the holder |
| CN110662962B (zh) | 2017-03-14 | 2022-05-17 | 沙特阿拉伯石油公司 | 用于感测和预测烃源岩的成熟度的系统和方法 |
| CN107315019A (zh) * | 2017-07-25 | 2017-11-03 | 清华大学 | 射线透射和荧光ct成像系统和成像方法 |
| WO2019107581A1 (ko) * | 2017-11-28 | 2019-06-06 | 오리오스메디칼 주식회사 | 광 간섭 단층 촬영 시스템 |
| US10788435B2 (en) * | 2017-12-21 | 2020-09-29 | Hamilton Sundstrand Corporation | Fixtures for radiographically imaging industrial articles |
| JP6994952B2 (ja) * | 2018-01-12 | 2022-01-14 | 株式会社ミツトヨ | 計測用ｘ線ｃｔ装置、及び、その校正方法 |
| US10764555B2 (en) * | 2018-02-02 | 2020-09-01 | II William G. Behenna | 3-dimensional physical object dynamic display |
| KR102278675B1 (ko) * | 2018-03-28 | 2021-07-16 | 포항공과대학교 산학협력단 | 엑스레이를 이용한 도금두께 측정 장치 |
| GB2572569C (en) * | 2018-04-03 | 2022-12-14 | Mineral Explor Network Finland Ltd | Nugget effect grade assessment |
| CN108597018A (zh) * | 2018-04-28 | 2018-09-28 | 清能艾科（深圳）能源技术有限公司 | 对土壤实现数值模拟的方法和装置 |
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| JP7052643B2 (ja) * | 2018-08-29 | 2022-04-12 | 住友金属鉱山株式会社 | 試料分析方法 |
| CN109596657A (zh) * | 2018-11-29 | 2019-04-09 | 石家庄铁道大学 | 高速动车组走行部运动部件早期缺陷扩展诊断方法 |
| JP7198078B2 (ja) * | 2018-12-27 | 2022-12-28 | 株式会社堀場製作所 | 分析装置、分析方法、及びプログラム |
| CN109632854B (zh) * | 2019-01-14 | 2022-10-11 | 东华理工大学 | 一种双探测结构的块状铀矿多元素在线x荧光分析仪 |
| JP7234821B2 (ja) * | 2019-02-13 | 2023-03-08 | 住友金属鉱山株式会社 | 粉末試料の分析方法、ｘ線ｃｔ測定用試料の作製方法およびｘ線ｃｔ測定用試料 |
| JP7150638B2 (ja) * | 2019-02-27 | 2022-10-11 | キオクシア株式会社 | 半導体欠陥検査装置、及び、半導体欠陥検査方法 |
| KR102628712B1 (ko) * | 2019-05-08 | 2024-01-25 | 주식회사 히타치하이테크 | 패턴 계측 장치 및 계측 방법 |
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| JP7286485B2 (ja) * | 2019-09-06 | 2023-06-05 | 株式会社ミツトヨ | 計測用ｘ線ｃｔ装置 |
| US12082956B2 (en) * | 2019-09-09 | 2024-09-10 | Universidad De La Frontera | Integral systems of orthovoltage sources that induce ionizing radiation |
| US11604152B2 (en) * | 2019-10-09 | 2023-03-14 | Baker Hughes Oilfield Operations Llc | Fast industrial computed tomography for large objects |
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| CN111751394B (zh) | 2020-04-17 | 2021-08-27 | 山东大学 | 基于图像与xrf矿物反演的岩性识别方法及系统 |
| CN111624218B (zh) * | 2020-06-30 | 2022-01-04 | 中国科学院南京地质古生物研究所 | 非破坏性立体化石及文物表面化学元素分布特征分析方法 |
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| US12474283B2 (en) | 2020-11-21 | 2025-11-18 | Bar Ilan University | System and method for mapping chemical elements in a sample |
| CN113418949B (zh) * | 2020-12-16 | 2024-02-23 | 中航复合材料有限责任公司 | 复合材料x射线测试的标准尺寸样品制备方法及测试方法 |
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| JP7499194B2 (ja) * | 2021-01-27 | 2024-06-13 | 大成建設株式会社 | 分析方法および分析装置 |
| WO2022266779A1 (en) | 2021-06-25 | 2022-12-29 | Enersoft Inc. | Laser induced breakdown spectroscopy for geological analysis |
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| EP4430386A4 (en) | 2021-11-08 | 2024-12-04 | Shenzhen Xpectvision Technology Co., Ltd. | X-RAY FLUORESCENCE IMAGING APPARATUS AND METHOD |
| CN114813798B (zh) * | 2022-05-18 | 2023-07-07 | 中国工程物理研究院化工材料研究所 | 用于表征材料内部结构及成分的ct检测装置和成像方法 |
| CN115420764A (zh) * | 2022-09-30 | 2022-12-02 | 苏州锂影科技有限公司 | 基于长方形x射线光束的二维掠入射x射线散射测试装置 |
| CN115656238B (zh) * | 2022-10-17 | 2023-05-12 | 中国科学院高能物理研究所 | 一种微区xrf元素分析与多维成像方法及系统 |
| CN116678909A (zh) * | 2023-06-08 | 2023-09-01 | 深圳综合粒子设施研究院 | 一种共聚焦荧光实验装置、荧光信号的探测方法 |
| US12444099B2 (en) * | 2023-06-15 | 2025-10-14 | Baker Hughes Holdings Llc | Systems and methods for computed tomography inaccuracy compensation |
| WO2025054226A1 (en) | 2023-09-05 | 2025-03-13 | Schlumberger Technology Corporation | Xrf and calcimetry evaluation of multiphase oilfield fluids |
| US12436123B2 (en) * | 2023-09-06 | 2025-10-07 | Schlumberger Technology Corporation | XRF measurements of multiphase oilfield fluids |
| CN119091600B (zh) * | 2024-08-02 | 2025-05-16 | 山东盛泰矿业科技有限公司 | 一种钛铁矿下料报警装置 |
| CN118837396B (zh) * | 2024-08-16 | 2025-11-28 | 天津大学 | 一种三维图像辅助xrf光谱分析的磨粒颗粒度效应校正方法 |
| CN121350324B (zh) * | 2025-12-18 | 2026-03-20 | 四川省自然资源实验测试研究中心(四川省核应急技术支持中心) | 一种基于三维建模的矿石元素分布可视化方法及系统 |
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| JP2009261456A (ja) * | 2008-04-22 | 2009-11-12 | Toshiba Corp | Ｘ線ｃｔ装置 |
| CN201417256Y (zh) * | 2008-10-20 | 2010-03-03 | 北京师范大学 | 毛细管x光透镜共聚焦微区x射线荧光谱仪 |
| CN101862200A (zh) * | 2010-05-12 | 2010-10-20 | 中国科学院上海应用物理研究所 | 一种快速x射线荧光ct方法 |
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2013
- 2013-09-06 JP JP2015531228A patent/JP6353450B2/ja active Active
- 2013-09-06 WO PCT/US2013/058464 patent/WO2014039793A1/en not_active Ceased
- 2013-09-06 US US14/020,180 patent/US9488605B2/en active Active
- 2013-09-06 EP EP13763415.0A patent/EP2893331B1/en active Active
- 2013-09-06 CN CN201380056545.8A patent/CN104769422B/zh active Active
- 2013-09-06 US US14/425,573 patent/US9739729B2/en active Active
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| JP2009261456A (ja) * | 2008-04-22 | 2009-11-12 | Toshiba Corp | Ｘ線ｃｔ装置 |
| CN201417256Y (zh) * | 2008-10-20 | 2010-03-03 | 北京师范大学 | 毛细管x光透镜共聚焦微区x射线荧光谱仪 |
| CN101862200A (zh) * | 2010-05-12 | 2010-10-20 | 中国科学院上海应用物理研究所 | 一种快速x射线荧光ct方法 |
Non-Patent Citations (1)
| Title |
|---|
| A compact MicroCT/MicroXRF scanner for non-destructive 3D chemical analysis;Alexander Sasov et al.;《Proc. of SPIE》;20081231;第7078卷;70780R-2至70780R-6页，2. MATERIALS AND METHODS和3.1 Phantom study，图1、图3和图5 * |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2015531480A (ja) | 2015-11-02 |
| US9488605B2 (en) | 2016-11-08 |
| US20140072095A1 (en) | 2014-03-13 |
| US20150253263A1 (en) | 2015-09-10 |
| CN104769422A (zh) | 2015-07-08 |
| JP6353450B2 (ja) | 2018-07-04 |
| WO2014039793A1 (en) | 2014-03-13 |
| US9739729B2 (en) | 2017-08-22 |
| EP2893331A1 (en) | 2015-07-15 |
| EP2893331B1 (en) | 2020-01-15 |
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