CN104764942A - Automatic test equipment and control method thereof - Google Patents
Automatic test equipment and control method thereof Download PDFInfo
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- CN104764942A CN104764942A CN201410002072.XA CN201410002072A CN104764942A CN 104764942 A CN104764942 A CN 104764942A CN 201410002072 A CN201410002072 A CN 201410002072A CN 104764942 A CN104764942 A CN 104764942A
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Abstract
The invention provides a piece of automatic test equipment and a control method thereof. The automatic test equipment comprises a storage module, a multiplex module, a control module, and a digital-to-analog conversion module. The storage module is used for storing multiple data signals. The multiplex module is used for receiving multiple clock rate signals with different frequencies, selecting one clock rate signal from the multiple clock rate signals according to a control signal, and outputting the selected clock rate signal. The control module is used for generating a control signal, and selectively reading one of the multiple data signals. The digital-to-analog conversion module is used for generating a test signal according to the clock rate signal output by the multiplex module and the data signal read by the control module, and outputting the test signal to a device under test. Thus, multiple devices under test can be tested at a time by a single memory.
Description
Technical field
The present invention relates to a kind of ATE (automatic test equipment) and control method thereof, and in particular to a kind of ATE (automatic test equipment) and the control method thereof that are applicable to parallel testing framework.
Background technology
Current ATE (automatic test equipment) (automatic test equipment on the market, ATE) to test system (device under test, when DUT) carrying out the test of analog waveform (analog waveform), tester only need according to the data needed for testing requirement input and the parameter (frequency of such as analog waveform) of testing needed for it, ATE (automatic test equipment) can input analog waveform according to the data of above-mentioned input and parameter to test system, and receive the waveform that fed back by test system, using as simulation test purposes.
The producing method of above-mentioned this analog waveform is loaded into hardware memory body after the calculation by software and reaches, and this hardware memory body needs the data that write is corresponding in advance, and the data corresponding to parameter of one group of test only can be stored in a hardware memory body.
But, along with the progress of contemporary semiconductor technique, ATE (automatic test equipment) is gradually towards high density and the parallel testing architecture evolution of complexity, to meet the demand of high-density test passage, but current ATE (automatic test equipment) has the restriction of a lot of resource (test frequency between such as MTD from different site) for simulation test, these restrictions can make the ATE (automatic test equipment) of analog channel originally few in number more show awkward situation in use.
Summary of the invention
Because above problem, the object of the invention is to propose a kind of ATE (automatic test equipment) and control method thereof, it is by the design of multiplex module and control module, make ATE (automatic test equipment) only need single entity memory body can realize parallel testing framework, add the service efficiency of this entity memory body.
According to a kind of ATE (automatic test equipment) in one embodiment of the invention, this ATE (automatic test equipment) is for testing the first test system.This ATE (automatic test equipment) mainly comprises storage module, the first multiplex module, control module and the first digital-to-analogue conversion module, wherein control module is electrically connected storage module and the first multiplex module, and the first digital-to-analogue conversion module is electrically connected output terminal and the control module of the first multiplex module.Storage module is in order to store multiple data-signal.First multiplex module also selects one of them to export according to control signal by described multiple clock signal in order to receive multiple clock signals with different frequency.Control module in order to produce control signal, and optionally read described multiple data-signal in storage module one of them.First digital-to-analogue conversion module in order to the clock signal that exports according to the first multiplex module with produced the first test signal by the data-signal that control module reads, and export this first test signal to the first test system.
In an embodiment, ATE (automatic test equipment) is in time receiving the feedback signal that the first test system exports, first digital-to-analogue conversion module can at least according to described multiple clock signal, one of them samples feedback signal, and produces test result signal according to this.
According to a kind of ATE (automatic test equipment) control method in one embodiment of the invention, this ATE (automatic test equipment) control method is used for testing the first test system with ATE (automatic test equipment).The steps flow chart of this ATE (automatic test equipment) control method is as described below.Receive multiple clock signals with different frequency, and select one of them by described multiple clock signal.Optionally read multiple data-signals in ATE (automatic test equipment) one of them.Produce the first test signal according to by the clock signal selected with the data-signal be read, and export this first test signal to the first test system.
In an embodiment, ATE (automatic test equipment) is in time receiving the feedback signal that the first test system exports, and more at least according to described multiple clock signal, one of them samples this feedback signal this ATE (automatic test equipment), and produces test result signal according to this.
Comprehensive the above, the invention provides a kind of ATE (automatic test equipment) and control method thereof, this ATE (automatic test equipment) can select one of them to come to the characteristic of the digital-to-analogue conversion module of correspondence by multiple clock signal by multiplex module, make digital-to-analogue conversion module can according to multiple data-signals stored in the clock signal selected by multiplex module and storage module one of them to produce a kind of test signal being supplied to test system.On the other hand, when ATE (automatic test equipment) receives the feedback signal that test system exports, digital-to-analogue conversion module more can sample this feedback signal according to the clock signal selected by multiplex module, so that feedback signal solution is recalled to test result signal.
Describe the present invention below in conjunction with the drawings and specific embodiments, but not as a limitation of the invention.
Accompanying drawing explanation
Fig. 1 is the functional-block diagram of ATE (automatic test equipment) according to an embodiment of the invention;
Fig. 2 is the functional-block diagram of ATE (automatic test equipment) according to another embodiment of the present invention;
Fig. 3 is the flow chart of steps of ATE (automatic test equipment) control method according to an embodiment of the invention.
Wherein, Reference numeral
1,1 ' ATE (automatic test equipment)
100 storage modules
102,102a, 102b multiplex module
104 control modules
106,106a, 106b digital-to-analogue conversion module
108 handover modules
2,2a, 2b test system
S300 ~ S304 steps flow chart
Embodiment
Below detailed features of the present invention and advantage is described in embodiments in detail, its content is enough to make any relevant art of haveing the knack of understand technology contents of the present invention and implement according to this, and according to content, right and accompanying drawing that this instructions is invented, any relevant art of haveing the knack of can understand the object and advantage that the present invention is correlated with easily.Following embodiment further describes viewpoint of the present invention, but non-to limit category of the present invention anyways.
(embodiment of ATE (automatic test equipment))
Please refer to Fig. 1, Fig. 1 is the functional-block diagram of ATE (automatic test equipment) according to an embodiment of the invention.As shown in Figure 1, this ATE (automatic test equipment) 1 is for testing the first test system 2, this ATE (automatic test equipment) 1 mainly comprises storage module 100, first multiplex module 102, control module 104 and the first digital-to-analogue conversion module 106, wherein the first multiplex module 102 and the first digital-to-analogue conversion module 106 are electrically connected mutually, and storage module 100, first multiplex module 102 and the first digital-to-analogue conversion module 106 are all electrically connected with control module 104.To be described in detail with regard to each portion functional module in ATE (automatic test equipment) 1 respectively below.
Storage module 100 is in order to store multiple data-signal, and wherein this data-signal is the numerical data of ATE (automatic test equipment) 1 for testing the first test system 2.In practice, storage module 100 can be a kind of programmable read-only memory (programmable read-only memory, PROM), erasable programmable read-only memory (erasable programmable read-only memory, EPROM), erasable programmable read-only memory (electrically erasable programmable read-only memory, EEPROM), the non-volatility memories (non-volatilememory) such as fast flash memory bank (flash memory), or can be a kind of Dynamic Random Access Memory (dynamic random accessmemory, DRAM), SRAM (static random access memory, the volatility memory body (volatile memory) such as SRAM), the present invention is not limited at this.
First multiplex module 102 has multiple clock signals of different frequency in order to receive, and the control signal produced according to control module 104 and select one of them to export by described multiple clock signal.In practice, the first multiplex module 102 can be a kind of multiplexer (multiplexer, MUX), because multiplexer technology knows the knowledgeable institute conventional techniques usually for having in art, therefore repeats no longer especially at this.
In addition, ATE (automatic test equipment) 1 more can include time pulse generating module (not being illustrated in figure), this time pulse generating module is electrically connected the first multiplex module 102, and this time pulse generating module is in order to provide described multiple clock signal to the first multiplex module 102.In practice, time pulse generating module is a kind of oscillator (oscillator), and this oscillator can according to the actual demand of ATE (automatic test equipment) 1 setting of footpath row export frequency and the quantity of clock signal.
Control module 104 in order to produce above-mentioned control signal, and optionally read from storage module 100 described multiple data-signal one of them.In practice, control module can be that a kind of field can programmed logic gate array (field programmable gate array, FPGA), microcontroller (microcontroller, or central processing unit (central processing unit MCU), CPU), the present invention is not limited at this.
First digital-to-analogue conversion module 106 produces first test signal in order to the clock signal exported according to the first multiplex module 102 and the data-signal read by control module 104, and exports this first test signal to the first test system 2.In other words, first digital-to-analogue conversion module 106 carries out modulation in order to the frequency of clock signal that the first multiplex module 102 exported and the numerical data of data-signal that read by control module 104, and produce a kind of analog test signal according to this, and export this analog test signal to first test system 2, make the first test system 2 can carry out test procedure according to this analog test signal.
In addition, when ATE (automatic test equipment) 1 receives feedback signal (signal produced when namely the first test system 2 carries out test procedure according to the first test signal) that the first test system 2 exports, to I haven't seen you for ages, according to described multiple clock signal, one of them samples above-mentioned feedback signal first digital-to-analogue conversion module 106, and produces a test result signal according to this.In other words, when ATE (automatic test equipment) 1 receives the feedback signal that the first test system 2 exports, first digital-to-analogue conversion module 106 can according to one of them frequency of described multiple clock signal, the feedback signal belonging to simulating signal is sampled, above-mentioned feedback signal to be demodulated into the test result signal with multiple sampling spot.In practice, first digital-to-analogue conversion module 106 can be a kind of digital analog converter (digital to analog converter, DAC) combinational circuit formed with analog-digital converter (analog to digital converter, ADC).
In the operation of reality, the first digital-to-analogue conversion module 106 is more come to be electrically connected with the first test system 2 by probe (probe) or other transmit pories, and the present invention is not limited at this.In addition, after feedback signal solution is recalled to test result signal by the first digital-to-analogue conversion module 106, the test result signal belonging to digital signal more can write in storage module 100 by control module 104, or directly this test result signal being supplied to tester in the mode of image, numerical value or sound, the present invention is not limited at this.
Therefore, ATE (automatic test equipment) 1 more can include reminding module (not being illustrated in graphic), this reminding module is electrically connected control module 104, this reminding module is in order to produce one group of cue according to above-mentioned test result signal, and this cue is in order to indicate the information in test result signal.In practice, reminding module can be a kind of display module (electronic display elements such as such as light emitting diode, display panel, seven-segment display) or sounding module (such as the electronic sound such as loudspeaker, hummer element), and the present invention is not limited at this.If reminding module is display module, then cue presents to tester with the pattern of image or light; If reminding module is sounding module, then cue presents to tester with the pattern of sound.
(another embodiment of ATE (automatic test equipment))
Please refer to Fig. 2, Fig. 2 is the functional-block diagram of ATE (automatic test equipment) according to another embodiment of the present invention.As shown in Figure 2, this ATE (automatic test equipment) 1 ' is for testing the first test system 2a and the second test system 2b, this ATE (automatic test equipment) 1 ' mainly comprises storage module 100, first multiplex module 102a, second multiplex module 102b, control module 104, first digital-to-analogue conversion module 106a, second digital-to-analogue conversion module 106b and handover module 108, wherein the first multiplex module 102a and the first digital-to-analogue conversion module 106a is electrically connected mutually, second multiplex module 102b and the second digital-to-analogue conversion module 106b is electrically connected mutually, handover module 108 is electrically connected between the first digital-to-analogue conversion module 106a and the second digital-to-analogue conversion module 106b, and storage module 100, first multiplex module 102a, second multiplex module 102b and handover module 108 are all electrically connected with control module 104.
Because the most functional module of the ATE (automatic test equipment) 1 ' of the present embodiment is identical with the ATE (automatic test equipment) 1 of previous embodiment, its essential difference is only that the number of functional module is different, such as, the first multiplex module 102a in the ATE (automatic test equipment) 1 ' of the present embodiment and the second multiplex module 102b is all same as the first multiplex module 102 of the ATE (automatic test equipment) 1 of previous embodiment, the first digital-to-analogue conversion module 106a in the ATE (automatic test equipment) 1 ' of the present embodiment and the second digital-to-analogue conversion module 106b is all same as the first digital-to-analogue conversion module 106 of the ATE (automatic test equipment) 1 of previous embodiment, therefore the present embodiment no longer repeated identical functional module at this make flowing mode.
With the ATE (automatic test equipment) 1 of previous embodiment unlike, the ATE (automatic test equipment) 1 ' of the present embodiment more includes handover module 108, this handover module 108 is controlled by control module 101, and makes handover module 108 can the path optionally between conducting storage module 100 and the first digital-to-analogue conversion module 106a or the path between storage module 100 and the second digital-to-analogue conversion module 106b.
By this, in the operation of reality, the ATE (automatic test equipment) 1 ' of the present embodiment can carry out the action of parallel testing to the first test system 2a and the second test system 2b by handover module 108.For example, feedback signal that the first test system 2a exports is received and in the process that the first digital-to-analogue conversion module 106a is sampled this feedback signal in ATE (automatic test equipment) 1 ', handover module 108 can path between conducting storage module 100 and the second digital-to-analogue conversion module 106b, the clock signal that the second digital-to-analogue conversion module 106b can be exported according to the second multiplex module 102b and the data-signal read by control module 104 and produce second test signal.Then, export in the process of the second test signal to the second test system 2b in the second digital-to-analogue conversion module 106b, path between handover module 108 meeting conducting storage module 100 and the first digital-to-analogue conversion module 106b, to make control module 104 the test result signal that first digital-to-analogue conversion module 106a produces can be write to storage module 100, or test result signal is supplied to tester in the mode of image, numerical value or sound.
In addition, although the ATE (automatic test equipment) 1 ' of the present embodiment is for having two multiplex module (i.e. the first multiplex module 102a and the second multiplex module 102b) and two digital simulation modular converters (i.e. the first digital-to-analogue conversion module 106a and the second digital-to-analogue conversion module 106b), but the present invention is not limited the number of multiplex module in ATE (automatic test equipment) and digital-to-analogue conversion module at this, in art have usually know the knowledgeable can according to for the number of test system of testing simultaneously and footpath row designs rational structure.
It should be noted that, because the ATE (automatic test equipment) 1 ' of the embodiment of the present invention can be used for reaching the Resourse Distribute of storage module 100 by control module 104 and handover module 108, make the storage module 100 of the embodiment of the present invention can be a kind of single memory body, this single memory body has multiple memory region (memory block), each memory region store described multiple data-signal one of them.In addition, in some cases, test result signal can write in one of them memory region in storage module 100 by control module 104.
(one of ATE (automatic test equipment) control method embodiment)
Please Fig. 3, Fig. 3 be the flow chart of steps of ATE (automatic test equipment) control method according to an embodiment of the invention.As shown in Figure 3, this ATE (automatic test equipment) control method is applicable to ATE (automatic test equipment) 1 that Fig. 1 illustrates or the ATE (automatic test equipment) 1 ' that Fig. 2 illustrates.To be described in detail with regard to each steps flow chart in ATE (automatic test equipment) control method respectively below.
In step S300, ATE (automatic test equipment) 1 (or ATE (automatic test equipment) 1 ') can receive multiple clock signals with different frequency, and selects one of them by these clock signals.In step s 302, ATE (automatic test equipment) 1 (or ATE (automatic test equipment) 1 ') can optionally read multiple data-signals in ATE (automatic test equipment) 1 (or ATE (automatic test equipment) 1 ') one of them.In step s 304, ATE (automatic test equipment) 1 (or ATE (automatic test equipment) 1 ') can produce first test signal according to by the clock signal selected with the data-signal be read, and exports this first test signal to the first test system 2 (or first test system 2a).
It should be noted that, the ATE (automatic test equipment) control method of the present embodiment is at the sequencing of this not conditioning step S300 and step S302 in addition, in other words, before step S302 can be executed in step S300, or step S300 and step S302 can simultaneously together be performed.In addition, the memory body number in ATE (automatic test equipment) 1 (or ATE (automatic test equipment) 1 ') only has an entity memory body, and this entity memory body has multiple memory region, this memory region store described multiple data-signal one of them.
In addition, ATE (automatic test equipment) 1 (or ATE (automatic test equipment) 1 ') is in time receiving the feedback signal that the first test system 2 (or first test system 2a) exports, more at least according to described multiple clock signal, one of them samples this feedback signal ATE (automatic test equipment) 1 (or ATE (automatic test equipment) 1 '), and produces a test result signal according to this.In some cases, above-mentioned test result signal can be written in the entity memory body of ATE (automatic test equipment) 1 (or ATE (automatic test equipment) 1 ').
Accept above-mentioned, feedback signal that the first test system 2a exports is received and in the step that feedback signal is sampled in ATE (automatic test equipment) 1 ', ATE (automatic test equipment) 1 ' more can produce second test signal according to the clock signal selected by the second multiplex module 102b and the data-signal be read, and exports this second test signal to the second test system 2b.
(possible effect of embodiment)
Comprehensive the above, the embodiment of the present invention provides a kind of ATE (automatic test equipment) and control method thereof, this ATE (automatic test equipment) can select one of them to come to the characteristic of the digital-to-analogue conversion module of correspondence by multiple clock signal by multiplex module, make digital-to-analogue conversion module can according to multiple data-signals stored in the clock signal selected by multiplex module and storage module one of them to produce a kind of test signal being supplied to test system.On the other hand, when ATE (automatic test equipment) receives the feedback signal that test system exports, digital-to-analogue conversion module more can sample this feedback signal according to the clock signal selected by multiplex module, so that feedback signal solution is recalled to test result signal.By this, the ATE (automatic test equipment) of the embodiment of the present invention and control method thereof can carry out efficient Resourse Distribute to storage module, storage module is made only to need single memory body can reach the parallel testing framework once testing multiple test system, except the manufacturing cost of ATE (automatic test equipment) can be reduced and reduce except the PCB total area in design, more can increase the service efficiency of memory body, extremely there is practicality.
Certainly; the present invention also can have other various embodiments; when not deviating from the present invention's spirit and essence thereof; those of ordinary skill in the art are when making various corresponding change and distortion according to the present invention, but these change accordingly and are out of shape the protection domain that all should belong to the claim appended by the present invention.
Claims (10)
1. an ATE (automatic test equipment), for testing one first test system, it is characterized in that, this ATE (automatic test equipment) comprises:
One storage module, in order to store multiple data-signal;
One first multiplex module, in order to receive multiple clock signals with different frequency, and selects one of them to export according to a control signal by those clock signals;
One control module, is electrically connected this storage module and this first multiplex module, in order to produce this control signal, and optionally read those data-signals one of them; And
One first digital-to-analogue conversion module, be electrically connected output terminal and this control module of this first multiplex module, in order to this clock signal of exporting according to this first multiplex module with produced one first test signal by this data-signal that this control module reads, and export this first test signal to this first test system.
2. ATE (automatic test equipment) according to claim 1, it is characterized in that, this ATE (automatic test equipment) is in time receiving the feedback signal that this first test system exports, at least according to those clock signals, one of them samples this feedback signal this first digital-to-analogue conversion module, and produces a test result signal according to this.
3. ATE (automatic test equipment) according to claim 2, is characterized in that, this ATE (automatic test equipment) more comprises:
One second multiplex module, is electrically connected this control module, in order to receive those clock signals, and selects one of them to export according to this control signal by those clock signals; And
One second digital-to-analogue conversion module, be electrically connected output terminal and this control module of this second multiplex module, this feedback signal that this first test system exports is received and in the process that this first digital-to-analogue conversion module is sampled this feedback signal in this ATE (automatic test equipment), this clock signal that this second digital-to-analogue conversion module exports according to this second multiplex module with produced one second test signal by this data-signal that this control module reads, and export this second test signal to one second test system.
4. ATE (automatic test equipment) according to claim 3, it is characterized in that, this ATE (automatic test equipment) more comprises a handover module, this handover module is electrically connected at this control module, between this first digital-to-analogue conversion module and this second digital-to-analogue conversion module, this handover module is in order to the path optionally between this storage module of conducting and this first digital-to-analogue conversion module or the path between this storage module and this second digital-to-analogue conversion module.
5. ATE (automatic test equipment) according to claim 1, is characterized in that, this ATE (automatic test equipment) more comprises a time pulse generating module, and this time pulse generating module is electrically connected this first multiplex module, and this time pulse generating module is in order to provide those clock signals.
6. ATE (automatic test equipment) according to claim 1, is characterized in that, this storage module is a single memory body, and this single memory body has multiple memory region, each this memory region store those data-signals one of them.
7. an ATE (automatic test equipment) control method, for testing one first test system with an ATE (automatic test equipment), it is characterized in that, this ATE (automatic test equipment) control method comprises:
Receive multiple clock signals with different frequency, and select one of them by those clock signals;
Optionally read multiple data-signals in this ATE (automatic test equipment) one of them; And
Produce one first test signal according to by this clock signal selected with this data-signal be read, and export this first test signal to this first test system.
8. ATE (automatic test equipment) control method according to claim 7, it is characterized in that, this ATE (automatic test equipment) is in time receiving the feedback signal that this first test system exports, more at least according to those clock signals, one of them samples this feedback signal this ATE (automatic test equipment), and produces a test result signal according to this.
9. ATE (automatic test equipment) control method according to claim 8, it is characterized in that, this feedback signal that this first test system exports is received and in the step that this feedback signal is sampled in this ATE (automatic test equipment), more comprise and produce one second test signal according to by this clock signal selected with this data-signal be read, and export this second test signal to one second test system.
10. ATE (automatic test equipment) control method according to claim 7, is characterized in that, has a single memory body in this ATE (automatic test equipment), and this single memory body has multiple memory region, each this memory region store those data-signals one of them.
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| CN104764942B (en) | 2018-08-14 |
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