CN104764942B - Automatic test equipment and its control method - Google Patents
Automatic test equipment and its control method Download PDFInfo
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Abstract
A kind of automatic test equipment of present invention invention and its control method, the automatic test equipment include storage module, multiplex module, control module and digital-to-analogue conversion module.Storage module is storing multiple data-signals.Multiplex module is to receive multiple clock signals with different frequency, and by selection in the multiple clock signal, one of them is exported according to control signal.Control module one of selectively reads the multiple data-signal to generate control signal.Digital-to-analogue conversion module generates test signal to the clock signal exported according to multiplex module with the data-signal read by control module, and exports test signal to test system.Thereby, the present invention only needs single a memory body that can once test multiple test systems.
Description
Technical field
The present invention relates to a kind of automatic test equipment and its control methods, and more particularly to a kind of suitable for parallel testing frame
The automatic test equipment and its control method of structure.
Background technology
Automatic test equipment (automatic test equipment, ATE) on the market is to test system at present
When (device under test, DUT) carries out the test of analog waveform (analog waveform), tester only need to be according to
Data needed for testing requirement input and its required parameter (such as frequency of analog waveform) tested, automatic test equipment
Analog waveform is inputted to test system with parameter according to the data of above-mentioned input, and receives the waveform fed back by test system,
Using as simulation test purposes.
The producing method of above-mentioned this analog waveform is to be loaded into hardware memory body after the calculation of software by reach, this is hard
Corresponding data need to be written in part memory body in advance, and the data corresponding to the parameter of one group of test are only capable of being stored in a hardware note
Recall in body.
However, with the progress of contemporary semiconductor technique, automatic test equipment is gradually towards the flat of high density and complexity
Row test structure evolution, to meet the demand in high-density test channel, but current automatic test equipment has for simulation test
The limitation (such as test frequency between test depth and different site) of many resources, these limitations can make to be to count not originally
The automatic test equipment of more analog channels more shows awkward situation in use.
Invention content
In view of above problem, it is an object of the invention to propose a kind of automatic test equipment and its control method,
Pass through the design of multiplex module and control module so that it is parallel that automatic test equipment only needs single a entity memory body that can realize
Test structure increases the service efficiency of this entity memory body.
According to a kind of automatic test equipment in one embodiment of the invention, this automatic test equipment is to be measured for testing first
Device.This automatic test equipment includes mainly storage module, the first multiplex module, control module and the first digital-to-analogue conversion
Module, wherein control module are electrically connected storage module and the first multiplex module, and the first digital-to-analogue conversion module is electrically connected
The output end and control module of first multiplex module.Storage module is storing multiple data-signals.First multiplex module to
Receive multiple clock signals with different frequency and according to control signal by selecting one of them in the multiple clock signal
Output.Control module selectively reads the multiple data-signal in storage module wherein to generate control signal
One of.First digital-to-analogue conversion module reads to the clock signal exported according to the first multiplex module with by control module
Data-signal generate the first test signal, and export this first test signal to the first test system.
In an embodiment, automatic test equipment is when receiving the feedback signal that the first test system is exported, and first
Digital-to-analogue conversion module can be sampled feedback signal depending at least on one of the multiple clock signal, and produce according to this
Raw test result signal.
According to a kind of automatic test equipment control method in one embodiment of the invention, this automatic test equipment control method
For testing the first test system with automatic test equipment.The step flow of this automatic test equipment control method is as described below.
Multiple clock signals with different frequency are received, and by selecting one of them in the multiple clock signal.Selectively read
Take one of multiple data-signals in automatic test equipment.According to selected clock signal and the data-signal being read
The first test signal is generated, and exports this first test signal to the first test system.
In an embodiment, for automatic test equipment when receiving the feedback signal that the first test system is exported, this is certainly
Dynamic test equipment is more sampled this feedback signal depending at least on one of the multiple clock signal, and generates survey according to this
Test result signal.
In summary, a kind of automatic test equipment of present invention offer and its control method, this automatic test equipment are logical
Crossing multiplex module can select one of them come the characteristic to corresponding digital-to-analogue conversion module by multiple clock signals so that
Digital-to-analogue conversion module can be believed according to multiple data stored in the selected clock signal of multiplex module and storage module
Number one of them generate a kind of test signal being supplied to test system.On the other hand, it receives and waits in automatic test equipment
When surveying the feedback signal that device is exported, digital-to-analogue conversion module can more be come according to the selected clock signal of multiplex module
This feedback signal is sampled, feedback signal solution is recalled into test result signal.
Below in conjunction with the drawings and specific embodiments, the present invention will be described in detail, but not as a limitation of the invention.
Description of the drawings
Fig. 1 is the functional-block diagram according to the automatic test equipment of one embodiment of the invention；
Fig. 2 is the functional-block diagram according to the automatic test equipment of another embodiment of the present invention；
Fig. 3 is the step flow chart according to the automatic test equipment control method of one embodiment of the invention.
Wherein, reference numeral
1,1 ' automatic test equipment
100 storage modules
102,102a, 102b multiplex module
104 control modules
106,106a, 106b digital-to-analogue conversion module
108 handover modules
2,2a, 2b test system
S300~S304 steps flow charts
Specific implementation mode
The detailed features and advantage of the narration present invention in detail in embodiments below, content are enough to make any to be familiar with
Content, the claim that relevant art understands the technology contents of the present invention and implements according to this, and invented according to this specification
Range and attached drawing, it is any to be familiar with relevant art and be readily understood upon the relevant purpose of the present invention and advantage.Embodiment below
It is the viewpoint that present invention be described in more detail, but non-anyways to limit scope of the invention.
(embodiment of automatic test equipment)
Fig. 1 is please referred to, Fig. 1 is the functional-block diagram according to the automatic test equipment of one embodiment of the invention.Such as Fig. 1 institutes
Show, this automatic test equipment 1 includes mainly storage module 100, for testing the first test system 2, this automatic test equipment 1
One multiplex module 102, control module 104 and the first digital-to-analogue conversion module 106, wherein the first multiplex module 102 and
One digital-to-analogue conversion module 106 is electrically connected mutually, and storage module 100, the first multiplex module 102 and the first digital mould
Quasi- conversion module 106 is all electrically connected with control module 104.It below will be respectively with regard to each portion's function mould in automatic test equipment 1
Block is described in detail.
For storage module 100 to store multiple data-signals, wherein this data-signal is intended to for automatic test equipment 1
The numerical data that one test system 2 is tested.In in practice, storage module 100 can be a kind of programmable reading memory
Body (programmable read-only memory, PROM), erasable programmable read-only memory (erasable
Programmable read-only memory, EPROM), erasable programmable read-only memory (electrically
Erasable programmable read-only memory, EEPROM), fast flash memory bank (flash memory) etc. is non-waves
Hair property memory body (non-volatile memory), or can be a kind of Dynamic Random Access Memory (dynamic
Random access memory, DRAM), static random access memory (static random access memory,
The volatile memories (volatile memory) such as SRAM), the present invention does not limit herein.
First multiplex module 102 is to receive multiple clock signals with different frequency, and according to 104 institute of control module
The control signal of generation and by the multiple clock signal select one of them output.In in practice, the first multiplex module 102
Can be a kind of multiplexer (multiplexer, MUX), since multiplexer technology has been to have usually to know in technical field
The knowledgeable institute conventional techniques, therefore no longer especially repeat herein.
In addition, automatic test equipment 1 more may include having time pulse generating module (not being illustrated in figure), this clock pulse generates mould
Block is electrically connected the first multiplex module 102, and when this time pulse generating module to the first multiplex module 102 to provide the multiple
Arteries and veins signal.In in practice, time pulse generating module is a kind of oscillator (oscillator), and this oscillator can be surveyed according to automatic
Try the frequency and quantity of the actual demand of equipment 1 and the exported clock signal of diameter row setting.
Control module 104 is selectively read from storage module 100 described more to generate above-mentioned control signal
One of a data-signal.In in practice, control module can be that a kind of field can programmed logic gate array (field
Programmable gate array, FPGA), microcontroller (microcontroller, MCU) or central processing unit
(central processing unit, CPU), the present invention does not limit herein.
First digital-to-analogue conversion module 106 to the clock signal that is exported according to the first multiplex module 102 with it is controlled
Data-signal that molding block 104 is read and generate first test signal, and export this first test signal to first to be measured
Device 2.In other words, the first digital-to-analogue conversion module 106 is to the clock signal that is exported the first multiplex module 102
Frequency and the numerical data of the data-signal read by control module 104 carry out modulation, and generate a kind of simulation test according to this
Signal, and this analog test signal is exported to the first test system 2 so that the first test system 2 can be surveyed according to this simulation
Trial signal carries out test program.
In addition, when automatic test equipment 1 receives feedback signal (the i.e. first dress to be measured that the first test system 2 is exported
Generated signal when setting 2 according to the first test signal progress test program) when, the first digital-to-analogue conversion module 106 is at least
Above-mentioned feedback signal can be sampled according to one of the multiple clock signal, and generate a test result according to this
Signal.In other words, when automatic test equipment 1 receives the feedback signal that the first test system 2 is exported, the first digital mould
Quasi- conversion module 106 can be according to one of the multiple clock signal frequency, will belong to the feedback signal of analog signal into
Row sampling, the test result signal with multiple sample points is demodulated by above-mentioned feedback signal.In in practice, first is digital
Analog conversion module 106 can be a kind of digital analog converter (digital to analog converter, DAC) and mould
The combinational circuit that quasi- digital quantizer (analog to digital converter, ADC) is formed.
In actual operation, the first digital-to-analogue conversion module 106 can more pass through probe (probe) or other transmission
Port to be electrically connected with the first test system 2, and the present invention does not limit herein.In addition, when the first digital-to-analogue conversion mould
After feedback signal solution is recalled to test result signal by block 106, control module 104 can will more belong to the test result of digital signal
Signal is written into storage module 100, or is directly supplied to this test result signal in a manner of image, numerical value or sound
Tester, the present invention do not limit herein.
Therefore, automatic test equipment 1 more may include there is reminding module (not being illustrated in schema), this reminding module is electrically connected
Control module 104, this reminding module according to above-mentioned test result signal to generate one group of standby signal, this standby signal
To indicate the information in test result signal.In in practice, reminding module can be a kind of display module (such as light-emitting diodes
The electronic display elements such as pipe, display panel, seven-segment display) or sound module (such as the electronic sounds member such as loudspeaker, buzzer
Part), the present invention does not limit herein.If if reminding module is display module, standby signal is with image or light
Pattern be presented to tester；If if reminding module is sound module, standby signal is presented to the pattern of sound
Tester.
(another embodiment of automatic test equipment)
Fig. 2 is please referred to, Fig. 2 is the functional-block diagram according to the automatic test equipment of another embodiment of the present invention.Such as Fig. 2 institutes
Show, for this automatic test equipment 1 ' for testing the first test system 2a and the second test system 2b, this automatic test equipment 1 ' is main
To include storage module 100, the first multiplex module 102a, the second multiplex module 102b, control module 104, the first digital simulation
Conversion module 106a, the second digital-to-analogue conversion module 106b and handover module 108, wherein the first multiplex module 102a and
One digital-to-analogue conversion module 106a is electrically connected mutually, the second multiplex module 102b and the second digital-to-analogue conversion module 106b
It is electrically connected mutually, handover module 108 is electrically connected at the first digital-to-analogue conversion module 106a and the second digital-to-analogue conversion
Between module 106b, and storage module 100, the first multiplex module 102a, the second multiplex module 102b and handover module 108 are all
It is electrically connected with control module 104.
Due to the most function module of the automatic test equipment 1 ' of the present embodiment and the automatic test of previous embodiment
Equipment 1 is identical, and essential difference is only that the number of function module is different, such as in the automatic test equipment 1 ' of the present embodiment
First multiplex module 102a and the second multiplex module 102b is all identical to the first multiplexing of the automatic test equipment 1 of previous embodiment
Module 102, the first digital-to-analogue conversion module 106a and the second digital simulation in the automatic test equipment 1 ' of the present embodiment turn
Mold changing block 106b is all identical to the first digital-to-analogue conversion module 106 of the automatic test equipment 1 of previous embodiment, therefore this implementation
What example was not repeated here identical function module herein makees flowing mode.
Unlike the automatic test equipment 1 of previous embodiment, the automatic test equipment 1 ' of the present embodiment has further included
Handover module 108, this handover module 108 is controlled by control module 101, and handover module 108 is selectively turned on
Path or storage module 100 and the second digital simulation between storage module 100 and the first digital-to-analogue conversion module 106a turn
Change the mold the path between block 106b.
Thereby, in actual operation, the automatic test equipment 1 ' of the present embodiment can be by handover module 108 to first
Test system 2a and the second test system 2b carries out the action of parallel testing.For example, it is received in automatic test equipment 1 '
Feedback signal that first test system 2a is exported and so that the first digital-to-analogue conversion module 106a is taken this feedback signal
During sample, the path between storage module 100 and the second digital-to-analogue conversion module 106b can be connected in handover module 108,
Allow the clock signal that the second digital-to-analogue conversion module 106b is exported according to the second multiplex module 102b with controlled
Module 104 read data-signal and generate second test signal.Then, defeated in the second digital-to-analogue conversion module 106b
During going out the second test signal to the second test system 2b, storage module 100 and the first number can be connected in handover module 108
Path between analog conversion module 106b, so that control module 104 can be produced the first digital-to-analogue conversion module 106a
Raw test result signal is written to storage module 100, or test result signal is carried in a manner of image, numerical value or sound
Supply tester.
In addition, although the automatic test equipment 1 ' of the present embodiment is that there are two multiplex module (i.e. the first multiplex modules for tool
102a and the second multiplex module 102b) with two digital simulation conversion modules (i.e. the first digital-to-analogue conversion module 106a and the
Two digital-to-analogue conversion module 106b), but the present invention is in this multiplex module in not limiting automatic test equipment and number
The number of analog conversion module, in technical field, tool usually intellectual can be according to the test system for being intended to test simultaneously
Number and diameter row designs rational structure.
Significantly, since the automatic test equipment 1 ' of the embodiment of the present invention can by control module 104 with cut
The resource allocation of storage module 100 is reached in the effect of mold changing block 108 so that the storage module 100 of the embodiment of the present invention can be with
For a kind of single memory body, this single memory body has multiple memory regions (memory block), the storage of each memory region
There is one of the multiple data-signal.In addition, in some cases, test result signal can be written for control module 104
Into memory region one of in storage module 100.
(one of automatic test equipment control method embodiment)
Please Fig. 3, Fig. 3 is the step flow chart according to the automatic test equipment control method of one embodiment of the invention.Such as Fig. 3
Shown, this automatic test equipment control method is suitable for the automatic test equipment 1 depicted in Fig. 1 or the automatic survey depicted in Fig. 2
Try equipment 1 '.Each steps flow chart in automatic test equipment control method will be described in detail respectively below.
In step S300, automatic test equipment 1 (or automatic test equipment 1 ') can be received with the multiple of different frequency
Clock signal, and by selecting one of them in these clock signals.In step s 302, (or the automatic test of automatic test equipment 1
Equipment 1 ') understand one of the multiple data-signals selectively read in automatic test equipment 1 (or automatic test equipment 1 ').
In step s 304, automatic test equipment 1 (or automatic test equipment 1 ') according to selected clock signal and can be read
Data-signal generates first test signal, and exports this first test signal (or first is to be measured to the first test system 2
Device 2a).
It is worth noting that, the automatic test equipment control method of the present embodiment is not subject to conditioning step S300 and step herein
The sequencing of rapid S302, in other words, step S302 can be implemented in before step S300 or step S300 and step
S302 can be performed together simultaneously.In addition, the memory body number in automatic test equipment 1 (or automatic test equipment 1 ') only has
There are one entity memory body, there are this entity memory body multiple memory regions, this memory region to store the multiple data letter
One of number.
In addition to this, automatic test equipment 1 (or automatic test equipment 1 ') is in receiving the first test system 2 (or first
Test system 2a) exported feedback signal when, automatic test equipment 1 (or automatic test equipment 1 ') is more depending at least on described more
One of a clock signal is sampled this feedback signal, and generates a test result signal according to this.In certain situations
Under, above-mentioned test result signal can be written into the entity memory body of automatic test equipment 1 (or automatic test equipment 1 ').
Accept it is above-mentioned, in automatic test equipment 1 ' receive the feedback signal that the first test system 2a is exported and to feedback
In the step of signal is sampled, automatic test equipment 1 ' can more be believed according to by the selected clock pulses of the second multiplex module 102b
Number second test signal is generated with the data-signal that is read, and exports this second test signal to the second test system
2b。
(possibility effect of embodiment)
In summary, a kind of automatic test equipment of offer of the embodiment of the present invention and its control method, this automatic test
Equipment can select one of them come the spy to corresponding digital-to-analogue conversion module by multiplex module by multiple clock signals
Property so that digital-to-analogue conversion module can according to the selected clock signal of multiplex module with it is stored multiple in storage module
One of data-signal generates a kind of test signal being supplied to test system.On the other hand, it is connect in automatic test equipment
When receiving the feedback signal that test system is exported, digital-to-analogue conversion module more can be according to the selected clock pulse of multiplex module
Signal is sampled this feedback signal, and feedback signal solution recalled to test result signal.Thereby, the embodiment of the present invention
Automatic test equipment and its control method can carry out efficient resource allocation to storage module so that storage module only needs list
One memory body can reach the parallel testing framework for once testing multiple test systems, in addition to that can reduce automatic test equipment
Manufacturing cost with reduce outside the PCB gross areas in design, can more increase the service efficiency of memory body, very there is practicality
Property.
Certainly, the invention may also have other embodiments, without deviating from the spirit and substance of the present invention, ripe
It knows those skilled in the art and makes various corresponding change and deformations, but these corresponding changes and change in accordance with the present invention
Shape should all belong to the protection domain of appended claims of the invention.
Claims (6)
1. a kind of automatic test equipment, for testing one first test system and one second test system, which is characterized in that should be certainly
Dynamic test equipment includes：
One storage module, to store multiple data-signals；
One first multiplex module to receive multiple clock signals with different frequency, and controls signal by those according to one
One of them output of selection in clock signal；
One control module is electrically connected the storage module and first multiplex module, to generate the control signal, and it is selective
Read one of those data-signals in ground；
One first digital-to-analogue conversion module is electrically connected the output end of first multiplex module and the control module, to according to
The clock signal exported according to first multiplex module generates one first with the data-signal read by the control module and surveys
Trial signal, and export first test signal to first test system, the automatic test equipment are first to be measured in receiving this
When the feedback signal that device is exported, the first digital-to-analogue conversion module is right depending at least on one of those clock signals
The feedback signal is sampled, and generates a test result signal according to this；
One second multiplex module, is electrically connected the control module, to receive those clock signals, and according to the control signal by
One of them output of selection in those clock signals；And
One second digital-to-analogue conversion module is electrically connected the output end and the control module of second multiplex module, certainly in this
Dynamic test equipment receives the feedback signal that first test system is exported and makes the first digital-to-analogue conversion module pair
During the feedback signal is sampled, which is somebody's turn to do according to what second multiplex module was exported
Clock signal generates one second test signal with the data-signal read by the control module, and exports second test signal
To second test system.
2. automatic test equipment according to claim 1, which is characterized in that the automatic test equipment further includes all mold changings
Block, the handover module are electrically connected at the control module, the first digital-to-analogue conversion module and second digital-to-analogue conversion
Between module, the handover module is selectively turning on the road between the storage module and the first digital-to-analogue conversion module
Path between diameter or the storage module and the second digital-to-analogue conversion module.
3. automatic test equipment according to claim 1, which is characterized in that the automatic test equipment further includes clock pulse production
Raw module, the time pulse generating module are electrically connected first multiplex module, which believes to provide those clock pulses
Number.
4. automatic test equipment according to claim 1, which is characterized in that the storage module is a single memory body, should
There are single memory body multiple memory regions, each memory region to store one of those data-signals.
5. a kind of automatic test equipment control method, for testing one first test system and one second with an automatic test equipment
Test system, which is characterized in that the automatic test equipment control method includes：
Multiple clock signals with different frequency are received, and by selecting one of them in those clock signals；
Selectively read one of multiple data-signals in the automatic test equipment；
Generate one first test signal according to the selected clock signal and the data-signal that is read, and export this first
Test signal is to first test system；
For the automatic test equipment when receiving the feedback signal that first test system is exported, the automatic test equipment is more
The feedback signal is sampled depending at least on one of those clock signals, and generates a test result signal according to this；With
And one second test signal is generated according to the selected clock signal and the data-signal being read, and export second survey
Trial signal is to second test system.
6. automatic test equipment control method according to claim 5, which is characterized in that have in the automatic test equipment
There are multiple memory regions, each memory region to store those data-signals wherein for one single memory body, the single memory body
One of.
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| CN106803776B (en) * | 2017-01-19 | 2020-07-10 | 环旭电子股份有限公司 | Radio frequency front end testing device and radio frequency front end testing method |
| US11656270B2 (en) * | 2019-05-09 | 2023-05-23 | Ase Test, Inc. | Apparatus and method of testing electronic components |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW463356B (en) * | 1999-01-11 | 2001-11-11 | Hyundai Electronics Ind | Anti-fuse circuitry for post-package DRAM repair |
| TW592303U (en) * | 2003-01-28 | 2004-06-11 | Nutex Comm Corp | Multi functions automatic testing system for high-frequency device |
| CN1937196A (en) * | 2005-09-23 | 2007-03-28 | 矽统科技股份有限公司 | Test system and method for judging integrated circuit processing speed |
| CN2909278Y (en) * | 2005-05-09 | 2007-06-06 | 明基电通股份有限公司 | Device for simultaneous testing multiple determinand |
| EP1612572B1 (en) * | 2003-03-19 | 2007-08-01 | Advantest Corporation | Test device and setting method |
| TW200729738A (en) * | 2005-12-08 | 2007-08-01 | Teradyne Inc | Calibration circuitry |
| CN101515008A (en) * | 2009-04-08 | 2009-08-26 | 辽宁省电力有限公司抚顺供电公司 | Automatic test instrument for high-frequency cable and measurement method thereof |
| CN103176120A (en) * | 2011-12-22 | 2013-06-26 | 英业达股份有限公司 | Signal simulating device and signal recording and simulating test method |
| CN103185847A (en) * | 2011-12-29 | 2013-07-03 | 英业达股份有限公司 | Auxiliary test device |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3674156B2 (en) * | 1996-06-25 | 2005-07-20 | 株式会社明電舎 | Analog monitoring and automatic adjustment of digital relay |
| US6519103B2 (en) * | 2001-05-25 | 2003-02-11 | Infineon Technologies Ag | View DAC feedback inside analog front circuit |
-
2014
- 2014-01-02 CN CN201410002072.XA patent/CN104764942B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW463356B (en) * | 1999-01-11 | 2001-11-11 | Hyundai Electronics Ind | Anti-fuse circuitry for post-package DRAM repair |
| TW592303U (en) * | 2003-01-28 | 2004-06-11 | Nutex Comm Corp | Multi functions automatic testing system for high-frequency device |
| EP1612572B1 (en) * | 2003-03-19 | 2007-08-01 | Advantest Corporation | Test device and setting method |
| CN2909278Y (en) * | 2005-05-09 | 2007-06-06 | 明基电通股份有限公司 | Device for simultaneous testing multiple determinand |
| CN1937196A (en) * | 2005-09-23 | 2007-03-28 | 矽统科技股份有限公司 | Test system and method for judging integrated circuit processing speed |
| TW200729738A (en) * | 2005-12-08 | 2007-08-01 | Teradyne Inc | Calibration circuitry |
| CN101515008A (en) * | 2009-04-08 | 2009-08-26 | 辽宁省电力有限公司抚顺供电公司 | Automatic test instrument for high-frequency cable and measurement method thereof |
| CN103176120A (en) * | 2011-12-22 | 2013-06-26 | 英业达股份有限公司 | Signal simulating device and signal recording and simulating test method |
| CN103185847A (en) * | 2011-12-29 | 2013-07-03 | 英业达股份有限公司 | Auxiliary test device |
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