TW592303U - Multi functions automatic testing system for high-frequency device - Google Patents

Multi functions automatic testing system for high-frequency device

Info

Publication number
TW592303U
TW592303U TW92201497U TW92201497U TW592303U TW 592303 U TW592303 U TW 592303U TW 92201497 U TW92201497 U TW 92201497U TW 92201497 U TW92201497 U TW 92201497U TW 592303 U TW592303 U TW 592303U
Authority
TW
Taiwan
Prior art keywords
testing system
frequency device
automatic testing
multi functions
functions automatic
Prior art date
Application number
TW92201497U
Other languages
Chinese (zh)
Inventor
Wen-Chung Liu
Guan-Wu Wang
Yi-Jeng Yang
Original Assignee
Nutex Comm Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nutex Comm Corp filed Critical Nutex Comm Corp
Priority to TW92201497U priority Critical patent/TW592303U/en
Publication of TW592303U publication Critical patent/TW592303U/en

Links

TW92201497U 2003-01-28 2003-01-28 Multi functions automatic testing system for high-frequency device TW592303U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW92201497U TW592303U (en) 2003-01-28 2003-01-28 Multi functions automatic testing system for high-frequency device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW92201497U TW592303U (en) 2003-01-28 2003-01-28 Multi functions automatic testing system for high-frequency device

Publications (1)

Publication Number Publication Date
TW592303U true TW592303U (en) 2004-06-11

Family

ID=34059839

Family Applications (1)

Application Number Title Priority Date Filing Date
TW92201497U TW592303U (en) 2003-01-28 2003-01-28 Multi functions automatic testing system for high-frequency device

Country Status (1)

Country Link
TW (1) TW592303U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104764942A (en) * 2014-01-02 2015-07-08 致茂电子股份有限公司 Automatic test equipment and control method thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104764942A (en) * 2014-01-02 2015-07-08 致茂电子股份有限公司 Automatic test equipment and control method thereof
CN104764942B (en) * 2014-01-02 2018-08-14 致茂电子股份有限公司 Automatic test equipment and its control method

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Legal Events

Date Code Title Description
MK4K Expiration of patent term of a granted utility model