CN104502063B - LED light source high temperature long term luminous flux maintenance rate detection method - Google Patents
LED light source high temperature long term luminous flux maintenance rate detection method Download PDFInfo
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- CN104502063B CN104502063B CN201410610367.5A CN201410610367A CN104502063B CN 104502063 B CN104502063 B CN 104502063B CN 201410610367 A CN201410610367 A CN 201410610367A CN 104502063 B CN104502063 B CN 104502063B
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Abstract
The invention relates to an LED light source high temperature long term luminous flux maintenance rate detection method. The LED light source high temperature long term luminous flux maintenance rate detection method comprises to-be-detected member mounting, environment temperature adjusting, to-be-detected member aging and luminous flux maintenance rate testing. According to the method, an active heat radiation structure is converted into a passive heat radiation structure, internal temperature of a test box is controlled in a real time by utilizing a temperature control system, a problem of test failure caused by stop of the active heat radiation structure in the prior art is eliminated, reliability of a detection process is improved, moreover, heat generated because of lighting of an LED can be reserved in the test box, heat generated by an LED light source in normal operation is utilized by the temperature control system to carry out heating, operation cost of a heat radiation system is reduced, required operation power is only 1/10-1/3 of power required through a method in the prior art, and thereby test cost and energy consumption are effectively reduced.
Description
Technical field
The present invention relates to a kind of LED light source life detecting method, the long-term lux maintenance of particularly a kind of LED light source high temperature
Detection method.
Background technology
LED is due to having that small volume, power consumption is low, sturdy and durable, long service life, safety low-voltage, low in calories, environmental protection
The advantages of, impacting traditional lighting market, every country also all implements the popularization that substantial amounts of preferential policy carries out energetically.
But the most important thing that the actual life of LED lamp, always industry are of interest, it is also LED determining in actual popularization
Qualitative place；Because LED lamp species is various, longer (testing time at least 6000 is little the life test time cycle in addition
When), if the LED lamp of each model will be carried out with the test in life-span, its cost is at a relatively high.
Study for this North America German Illuminating Engineeering Society (IESNA) and delivered two parts of standards of IESLM-80 and IESTM-21, LM-
80 indicate a kind of verification method of LED light source lux maintenance (6000-10000 hour), and TM-21 is then based on LM-80
Life-span of the longer-term to LED for the test data calculated (30,000 hours or even longer time).
Determine that the determiner that LED light declines is the junction temperature of LED chip, LM-80 test three Ts used (skin temperature,
Temperature on LED packaged light source contact point) temperature spot (55 DEG C, 85 DEG C, the 3rd are selected by manufacturer), substantially can cover
The actually used situation of LED, as long as actual measurement Ts value in actual light fixture for the LED, just can calculate that the light of the use of light fixture leads to and maintain
Rate.But after being lit due to LED, temperature can drastically raise, thus causing surface and surrounding air the huge temperature difference to occur, in light fixture
In test process, LED environment set temperature need to control in (Ts-5) DEG C, and the change of the shell temperature of LED controls at (Ts-2) DEG C, such as
What can control LED ambient air temperature, and Ts can be controlled to become the technological difficulties in this test again.
Existing test temperature controls adopt as described in patent announcement CN102590763B and CN203299341U more
Method, installs refrigerator or radiator fan in proof box, LED is lighted produced heat and discharges proof box with air,
Heat energy is provided to make proof box internal temperature control in scope needed for test by temperature control system completely again.Due to burn-in test
Time length (generally at 6000 hours about), if taking the initiative formula radiator structure, such as refrigerator or fan cooling, once radiating
Structure shuts down in test process, and test the temperature inside the box cannot will be discharged because LED lights produced heat, lead to Ts
Drastically raise, burning out LED light source makes test crash；Again because active radiator structure needs not stall radiating, and LED lights and is produced
Raw heat fails to be used effectively again, and the equipment rated output of every cubic metre of traditional experiment case needs 15kw, whole test process
Cost and huge energy consumption.
Content of the invention
The technical problem to be solved is to provide a kind of detection process more stable, and the LED light of environmental protection and energy saving
Source high temperature long-term lux maintenance detection means and method.
The present invention solves above-mentioned technical problem and be employed technical scheme comprise that：
A kind of long-term lux maintenance detection means of LED light source high temperature, its structure includes proof box, power-supply controller, LED
Temperature measuring device, life-span tester and temperature control system；It is provided with test position, test is provided with radiating on position in described proof box
Plate, described LED temperature tester is connected with test position, and described life-span tester is connected with proof box by power-supply controller, institute
State temperature control system to be made up of the ambient temperature detection device being arranged in proof box and heater；In detection process, institute
Stating proof box is in air-tight state.By arranging close test case in detection process, LED light source is tested by when institute by heat sink
The energy producing is radiated in proof box thus controlling Ts temperature, and active radiator structure is changed into passive heat radiation structure,
Using temperature control system real-time control proof box internal temperature, eliminate and cause because of existing active heat radiation structure stall to test
The probability of failure, improves the reliability of detection means；And LED lights produced heat and can be retained in proof box
Interior, temperature control system carries out heating work on the basis of the heat energy using LED light source normal work, eliminates cooling system
Operating cost, this plant running power demand only needs the 1/10～1/3 of existing equipment, effectively reduces testing cost and power consumption.
Preferably, described heat sink is provided with temperature-uniforming plate.High thermal conductivity coefficient based on temperature-uniforming plate can be by LED light source
Heat diffuses into face rapidly by putting, and with effective control Ts temperature, then by heat sink, quickly heat can be delivered in the air, make ring
Border temperature-detecting device can the case internal temperature of reaction test in time, heater adjusts in time thus ensureing environment set temperature
Control in excursion with Ts, improve detection reliability.
Preferably, described heat sink is provided with one of convection holes or fin or two kinds.Convection holes or fin
Setting can make that the heat of LED light source is more rapid to be delivered in the air, enable ambient temperature detection device reaction test in time
Case internal temperature, heater adjusts in time thus ensureing that environment set temperature and Ts control in excursion, carries further
High detection reliability.
Preferably, described test position is evenly distributed in proof box.Being uniformly distributed of position of test can make LED light source radiation
Heat to proof box is more uniformly distributed, and Ts both can have been made to be easier to control, be more uniformly distributed heating by making the temperature in proof box
More easy to control.
Preferably, described heater is evenly distributed in proof box.On the premise of test position is uniformly distributed uniformly
It is more easy to control that distribution heater makes the temperature in proof box heat.
Preferably, being provided with timing chip in described life-span tester.The setting of timing chip makes life-span tester have
Power-off preserves function, can will not be led to test accuracy because of accident power-off, be carried with the make-and-break time of accurate recording LED light source
High detection reliability.
Preferably, described proof box is made using adiabator, heat conductivity is less than or equal to 0.15W/ (m k).When
When proof box heat conductivity is less than or equal to 0.15W/ (m k), proof box can ensure that in whole test process, proof box is in perseverance
In temperature state, reduce peripheral environment and impact for proof box build-in test temperature, also can reduce energy produced by heater
Consume.
Preferably, described proof box is made up of with withdrawing part fixed part, described withdrawing part is arranged in fixed part and leads to
Cross slide to connect.Fixed part makes proof box can adapt to the LED light source of varying number and size with the setting of withdrawing part, when
Test negligible amounts and when LED light source is less, during by reducing detection space to reduce detection near fixed part and withdrawing part
Energy dissipation；When test quantity is more or LED light source is larger, expand detection space to adapt to not by pulling out withdrawing part
Congener test request.
Preferably, being provided with keeper between described fixed part and withdrawing part.The setting of keeper makes solid in test process
The position determining portion with withdrawing part keeps being relatively fixed, and makes heating process more easy to control, and then improves detection reliability.
A kind of long-term lux maintenance detection method of LED light source high temperature, comprises the following steps：
S1) part to be measured is installed：LED light source to be measured is inserted the test position being provided with heat sink in proof box, close after installation
Close proof box, start to test；
S2) ambient temperature adjustment：After LED light source normal work to be measured, by the ambient temperature in temperature control system
Detection means detects proof box internal temperature, and after internal temperature reaches and stablizes, the heater in temperature control system starts
Work, progressively heating detection proof box internal temperature is to environment set temperature；
S3) part to be measured is aging：After ambient temperature adjustment, maintain this environment set temperature setting in ageing time；
S4) lux maintenance test：After setting ageing time arrival, take out LED light source to be measured from proof box, carry out
Lux maintenance is tested.
In detection process, described proof box is in air-tight state.By arranging close test case in detection process, by dissipating
Hot plate when LED light source is tested produced energy be radiated in proof box thus controlling Ts temperature, by active radiator structure
It is changed into passive heat radiation structure, using temperature control system real-time control proof box internal temperature, eliminate because of existing active
Radiator structure stall and cause the probability of test crash, improve the reliability of detection process；And LED lights produced
Heat can be retained in proof box, and temperature control system carries out adding on the basis of the heat energy using LED light source normal work
Thermal technology makees, and eliminates the operating cost of cooling system, and running power demand only needs the 1/10～1/3 of existing method, effectively reduces
Testing cost and power consumption.
Preferably, in described step S1, LED light source to be measured is connected with heat sink by temperature-uniforming plate.Based on temperature-uniforming plate
The heat of LED light source can be diffused into face rapidly by putting by high thermal conductivity coefficient, can be with effective control Ts temperature, then will by heat sink
Heat is quickly delivered in the air, enables ambient temperature detection device in time reaction test case internal temperature, heater and
When, adjust thus ensureing that environment set temperature and Ts control in excursion, raising detection reliability.
Preferably, in described step S3, LED light source skin temperature to be measured is detected by LED temperature tester, when to be measured
When LED light source skin temperature is less than shell design temperature, this LED light source to be measured of labelling is abnormal, is controlled to be measured by abnormal rate
Part ageing process.The setting of LED temperature tester, increased the monitoring function of lighting to LED light source to be measured, energy in test process
React the working condition of LED light source in time, test can be controlled to carry out by abnormal rate；And can exclude improper in step S4
The impact to test for the work LED light source, improves the accuracy of lux maintenance test.
Preferably, when abnormal rate is more than or equal to 30%, exiting detection.When abnormal rate is more than or equal to 30%, test
The probability that environment is not inconsistent test request increases, and should stop detection in time and carry out environmental testing inspection.
Preferably, progressively heating detection proof box internal temperature, to environment set temperature, enters first in described step S2
The positive heating of row, single-candidate increases heater power, until proof box internal temperature equals or exceeds environment set temperature, if examination
Tryoff internal temperature is equal to environment set temperature, stops increasing power；If proof box internal temperature exceedes environment set temperature, take
Last power, as upper limit end points, takes arbitrary power between initial power and last power as lower limit end points, to adjust by two way classification
Whole power, until proof box internal temperature is equal to environment set temperature.Positive heating after input low-power, can prevent because of work(first
Rate is too high to lead to steep increasing of proof box temperature to burn out part to be measured；Because heater power and test the temperature inside the box are in that the linear increase of class is closed
System, single-candidate increases heater power makes temperature adjustment process more easy to control；Adjusted by two way classification and both can precisely determine heating
Device input power, can quickly carry out testing the temperature inside the box adjustment again.
Preferably, maintaining this environment set temperature in described step S3, when proof box internal temperature is less than environment set
During temperature, single-candidate increases heater power, until proof box internal temperature equals or exceeds environment set temperature, if proof box
Internal temperature is equal to environment set temperature, stops increasing power；If proof box internal temperature exceedes environment set temperature, take last
Power, as upper limit end points, takes arbitrary power between initial power and last power as lower limit end points, to adjust work(by two way classification
Rate, until proof box internal temperature is equal to environment set temperature；When proof box internal temperature is higher than environment set temperature, take
Power, as upper limit end points, takes arbitrary power between initial power and last power as lower limit end points, to adjust by two way classification afterwards
Power, until proof box internal temperature is equal to environment set temperature.Adjusted by two way classification and both can precisely determine that heater was defeated
Enter power, can quickly carry out testing the temperature inside the box adjustment again, so that test the temperature inside the box is maintained in mobility scale.
Preferably, during two way classification adjustment, the front power taking last power is as lower limit end points.Take last work(
A front power of rate can make adjustment process more rapid as lower limit end points, and it is less so that test the temperature inside the box is floated.
Preferably, described LED light source to be measured is in test process, normal work skin temperature be respectively set as 55 DEG C,
85 DEG C and 105 DEG C.105 DEG C of selection meets LED light source actual working state, in the case of ensureing LED light source normal work
Accelerate burn-in test process.
Preferably, in described step S2, the initial power of heater is 1kw, and it is 0.5kw that single-candidate increases power.Just
When beginning power is 1kw, test the temperature inside the box is closer to 55 DEG C, and 85 DEG C and 105 DEG C are distributed near 3.5kw and 5kw, single-candidate
Increasing power can make temperature adjustment in proof box more accurately quick for 0.5kw.
The present invention compared with the existing technology has advantages below and effect：1st, active radiator structure is changed into passive type
Radiator structure, using temperature control system real-time control proof box internal temperature, eliminates because of existing active heat radiation structure stall
And cause the probability of test crash, improve the reliability of detection means；2nd, temperature control system is normal using LED light source
Carry out heating work on the basis of the heat energy of work, eliminate the operating cost of cooling system, this plant running power demand only needs
The 1/10～1/3 of existing equipment method, effectively reduces testing cost and power consumption；3rd, optimize method for regulating temperature, make proof box
Internal temperature is more easy to control, can quickly carry out testing the temperature inside the box adjustment, so that test the temperature inside the box is maintained in mobility scale, lead to
Cross control LED ambient air temperature and control Ts；4th, real-time monitoring is carried out to detection process, can at-once monitor LED light source to be measured send out
Light state and on/off state, improve the accuracy of lux maintenance test.
Brief description
In order to be illustrated more clearly that the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing
Have technology description in required use accompanying drawing be briefly described it should be apparent that, drawings in the following description be only this
Some embodiments of invention, for those of ordinary skill in the art, without having to pay creative labor, also may be used
So that other accompanying drawings are obtained according to these accompanying drawings.
Fig. 1 is the cross section view of the present invention.
Fig. 2 is the non-stretched longitudinal section sectional view of the present invention.
Fig. 3 is the longitudinal section sectional view after present invention stretching.
Fig. 4 tests the structural representation of position for the present invention.
Fig. 5 is the structural representation of heat sink of the present invention.
Label declaration：
LED light source 0 to be measured proof box 1
Heat sink 11 convection holes 111
Fin 112 temperature-uniforming plate 12
Fixed part 13 withdrawing part 14
Handle 141 guide rail 15
Projection 151 spacing hole 152
Control key 153 power-supply controller 2
LED temperature tester 3 life-span tester 4
Temperature control system 5 heater 51
Specific embodiment
With reference to embodiment, the present invention is described in further detail, following examples be explanation of the invention and
The invention is not limited in following examples.
Embodiment 1：
As shown in figure 1, the present embodiment is by proof box 1, power-supply controller 2, LED temperature tester 3, life-span tester 4 and
Temperature control system 5 forms, and proof box 1 is made up of fixed part 13 and withdrawing part 14, uniformly sets in fixed part 13 and withdrawing part 14
There is test position, test is provided with heat sink 11 on position, is slidably connected by guide rail 15 between fixed part 13 and withdrawing part 14, guide rail 15
On be provided with projection 151 and spacing hole 152, projection 151 together can slide with withdrawing part 14 on guide rail 15, and can be clamped on limit
Thus positioning to fixed part 13 and withdrawing part 14 in position hole 152, withdrawing part 14 is provided with the end face away from fixed part 13
Handle 141, handle 141 is provided with control key 153, and control key 153 can control the height of projection of projection 151 thus discharging projection
151 clampings in spacing hole 152.With reference to Fig. 2 and Fig. 3, after withdrawing part 14 pulls out in fixed part 13, test volume can
Expand to 2 times before stretching, test position also increases 1 times, such that it is able to adapt to different types of test request.Referring to Fig. 1, supply
The power supply break-make of electric controller 2 Control experiment case 1 connection lifetime tester 4, have in life-span tester 4 timing chip in order to
The on/off time in record proof box 1；LED temperature tester 3 is connected with test position, and LED temperature tester 3 is in order to detect
Ts temperature；Temperature control system 5 is by the ambient temperature detection device (in figure does not mark) being uniformly arranged in proof box 1 and heating
Device 51 forms.In detection process, described proof box 1 is in air-tight state, because proof box 1 is in temperature constant state in test process
In, for reducing the impact of heat losses and peripheral environment temperature, proof box 1 is by high temperature resistant, high thermal insulation rock wool rustless steel color steel
Make, interior surface scribbles flat black paint, heat conductivity is 0.15W/ (m k).
As shown in Figures 4 and 5, heat sink 11 is provided with temperature-uniforming plate 12, LED light source 0 to be measured is connected to by temperature-uniforming plate 12
On heat sink 11, it is welded to connect by way of Reflow Soldering by tin cream between temperature-uniforming plate 12 and heat sink 11, the heat conduction of temperature-uniforming plate 12
Coefficient is 5000w/ (m k), thus ensureing that the heat producing during LED light source 0 work to be measured can be transmitted to rapidly heat sink 11
On, and heat sink 11 material used by high-power LED light source test mostly is extruded signing panel material or the copper of high heat conduction, and area requirements exist
13000cm2It is ensured that the heat on heat sink 11 can quickly be delivered in the air, heat sink 11 is additionally provided with convection holes 111 He
Fin 112 helps radiating, thus ensureing to be placed in examination by the system that LED light source 0 to be measured, heat sink 11 and temperature-uniforming plate 12 are formed
Tryoff 1, can reach LED light source 0 skin temperature excursion to be measured and control in (set Ts-2) DEG C, the internal temperature of proof box 1 as far as possible
Degree controls in (set Ts-5) DEG C.
The present embodiment test process：
S1) part to be measured is installed：LED light source 0 to be measured is inserted the survey being provided with heat sink 11 and temperature-uniforming plate 12 in proof box 1
Examination position, close test case 1 after installation, start to test, active radiator structure is changed into heat sink 11 and temperature-uniforming plate 12 is passive
Formula radiator structure, eliminates and causes the probability of test crash because of existing active heat radiation structure stall；
S2) ambient temperature adjustment：After LED light source 0 normal work to be measured, by the environment temperature in temperature control system 5
Degree detection means detection proof box 1 internal temperature, after internal temperature reaches and stablizes, the heater in temperature control system 5
51 start working, and as needed for test, Ts temperature is 105 DEG C, then environment set temperature is adjusted to 100 DEG C, and heater 51 is initially defeated
Entering power is 1kw, and then single-candidate increases power 0.5kw, until proof box 1 internal temperature equals or exceeds 100 DEG C, if proof box
1 internal temperature is equal to 100 DEG C, stops increasing power；If proof box 1 internal temperature is more than 100 DEG C, take last power as the upper limit
End points is generally 5kw, and the front power taking last power is 4.5kw as lower limit end points, finds environment by two way classification and sets
Constant temperature degree power demand, until proof box 1 internal temperature is equal to 100 DEG C；
S3) part to be measured is aging：After ambient temperature adjustment, proof box 1 internal temperature was maintained to be equal to 100 in 6000 hours
DEG C, when proof box 1 internal temperature is less than 100 DEG C, adjusted inside same way Adjustment Tests case 1 by step S2 ambient temperature
Temperature；When proof box 1 internal temperature is higher than 100 DEG C, takes last power to be generally 5kw as upper limit end points, take last power
A front power be 4.5kw as lower limit end points, by two way classification find environment set temperature power demand, until proof box
1 internal temperature is equal to 100 DEG C, and because the whole ageing process testing time is long, and proof box 1 internal temperature adjustment time is short, and then
Whole burn-in test and the test impact of final lux maintenance can be ignored；Simultaneously in ageing process, surveyed by LED temperature
LED light source 0 skin temperature Ts to be measured monitored by examination instrument 3, and when measured Ts is less than (proof box 1 internal temperature+3) DEG C, labelling should
LED light source 0 to be measured is abnormal, when abnormal rate is more than or equal to 30%, exits detection；
S4) lux maintenance test：After reaching within 6000 hours, take out LED light source to be measured from proof box, exclude labelling
After abnormal LED light source to be measured 0, carry out lux maintenance test.
Furthermore, it is necessary to explanation, the specific embodiment described in this specification, the shape of its parts and components, it is named
Title etc. can be different.All equivalent or simple change done according to the construction described in inventional idea of the present invention, feature and principle, all wrap
Include in the protection domain of patent of the present invention.Those skilled in the art can be embodied as to described
Example is made various modifications or is supplemented or substituted using similar mode, the structure without departing from the present invention or surmount this
Scope as defined in the claims, all should belong to protection scope of the present invention.
Claims (7)
1. a kind of long-term lux maintenance detection method of LED light source high temperature, comprises the following steps：
S1) part to be measured is installed：LED light source to be measured is inserted the test position being provided with heat sink in proof box, airtight examination after installation
Tryoff, starts to test；
S2) ambient temperature adjustment：After LED light source normal work to be measured, by the ambient temperature detection in temperature control system
Device detects proof box internal temperature, and after internal temperature reaches and stablizes, the heater in temperature control system is started working,
Progressively heating detection proof box internal temperature, to environment set temperature, carries out positive heating first, and single-candidate increases heater work(
Rate, until proof box internal temperature equals or exceeds environment set temperature, if proof box internal temperature is equal to environment set temperature,
Stop increasing power；If proof box internal temperature exceedes environment set temperature, take last power as upper limit end points, take last work(
A front power of rate, as lower limit end points, adjusts power by two way classification, until proof box internal temperature is equal to environment set
Temperature；
S3) part to be measured is aging：After ambient temperature adjustment, maintain this environment set temperature setting in ageing time；
S4) lux maintenance test：After setting ageing time arrival, take out LED light source to be measured from proof box, carry out light and lead to
Sustainment rate is tested.
2. a kind of long-term lux maintenance detection method of LED light source high temperature according to claim 1 it is characterised in that：Institute
State in step S1, LED light source to be measured is connected with heat sink by temperature-uniforming plate.
3. a kind of long-term lux maintenance detection method of LED light source high temperature according to claim 1 it is characterised in that：Institute
State in step S3, LED light source skin temperature to be measured is detected by LED temperature tester, when LED light source skin temperature to be measured is less than
During shell design temperature, this LED light source to be measured of labelling is abnormal, controls part ageing process to be measured by abnormal rate.
4. a kind of long-term lux maintenance detection method of LED light source high temperature according to claim 3 it is characterised in that：When
When abnormal rate is more than or equal to 30%, exit detection.
5. a kind of long-term lux maintenance detection method of LED light source high temperature according to claim 1 it is characterised in that：Institute
State and in step S3, maintain this environment set temperature, when proof box internal temperature is less than environment set temperature, single-candidate increases heating
Rating of set, until proof box internal temperature equals or exceeds environment set temperature, if proof box internal temperature sets equal to environment
Constant temperature degree, stops increasing power, if proof box internal temperature exceedes environment set temperature, takes last power as upper limit end points,
The front power taking last power, as lower limit end points, adjusts power by two way classification, until proof box internal temperature is equal to
Environment set temperature；When proof box internal temperature is higher than environment set temperature, take last power as upper limit end points, take last
A front power of power, as lower limit end points, adjusts power by two way classification, until proof box internal temperature sets equal to environment
Constant temperature degree.
6. according to a kind of arbitrary described long-term lux maintenance detection method of LED light source high temperature of claim 1 to 5, its feature
It is：In test process, normal work skin temperature is respectively set as 55 DEG C, 85 DEG C and 105 DEG C to described LED light source to be measured.
7. a kind of long-term lux maintenance detection method of LED light source high temperature according to claim 6 it is characterised in that：Institute
State in step S2, the initial power of heater is 1kw, and it is 0.5kw that single-candidate increases power.
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| CN105974230A (en) * | 2016-05-10 | 2016-09-28 | 倍科质量技术服务（东莞）有限公司 | LM-80 aging test system based on semiconductor refrigeration device and control method of system |
| CN108037398B (en) * | 2018-01-16 | 2023-12-05 | 苏州精濑光电有限公司 | Aging test device and aging test method for display module |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102004181A (en) * | 2010-09-17 | 2011-04-06 | 上海北京大学微电子研究院 | Method and system for testing leakage current of light-emitting diode (LED) |
| CN102590763A (en) * | 2012-03-05 | 2012-07-18 | 深圳市迈昂科技有限公司 | LED (light emitting diode) service life test system and test method thereof |
| CN102980747A (en) * | 2012-11-27 | 2013-03-20 | 北京半导体照明科技促进中心 | Method and device for accelerated detection of lumen maintenance of lighting device |
| CN103542300A (en) * | 2013-10-29 | 2014-01-29 | 路旺培 | LED (light-emitting diode) lamp |
| CN203858347U (en) * | 2014-04-17 | 2014-10-01 | 深圳Tcl新技术有限公司 | Aging test box for LED light bars |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03188383A (en) * | 1989-12-19 | 1991-08-16 | Fujitsu Ltd | Heating tester for semiconductor element |
| TW201230910A (en) * | 2011-01-11 | 2012-07-16 | Hon Hai Prec Ind Co Ltd | The method of manufacturing the LED lightbar and the equipment thereof |
-
2014
- 2014-11-03 CN CN201410610367.5A patent/CN104502063B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102004181A (en) * | 2010-09-17 | 2011-04-06 | 上海北京大学微电子研究院 | Method and system for testing leakage current of light-emitting diode (LED) |
| CN102590763A (en) * | 2012-03-05 | 2012-07-18 | 深圳市迈昂科技有限公司 | LED (light emitting diode) service life test system and test method thereof |
| CN102980747A (en) * | 2012-11-27 | 2013-03-20 | 北京半导体照明科技促进中心 | Method and device for accelerated detection of lumen maintenance of lighting device |
| CN103542300A (en) * | 2013-10-29 | 2014-01-29 | 路旺培 | LED (light-emitting diode) lamp |
| CN203858347U (en) * | 2014-04-17 | 2014-10-01 | 深圳Tcl新技术有限公司 | Aging test box for LED light bars |
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