CN102590763A - LED (light emitting diode) service life test system and test method thereof - Google Patents
LED (light emitting diode) service life test system and test method thereof Download PDFInfo
- Publication number
- CN102590763A CN102590763A CN2012100556314A CN201210055631A CN102590763A CN 102590763 A CN102590763 A CN 102590763A CN 2012100556314 A CN2012100556314 A CN 2012100556314A CN 201210055631 A CN201210055631 A CN 201210055631A CN 102590763 A CN102590763 A CN 102590763A
- Authority
- CN
- China
- Prior art keywords
- led
- aluminium base
- refrigerator
- integrating sphere
- mounting disc
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Landscapes
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses an LED (light emitting diode) service life test system, which comprises refrigerators, aluminum printed circuit boards (PCBs), a cold and hot two-region temperature box and an integrating sphere. An electric refrigerating plate and a subpanel of the refrigerator are fixedly installed on a radiator and the electric refrigerating plate is embedded into an opening of the subpanel. The aluminum PCB is fixed on the surface of the electric refrigerating plate. The cold and hot two-region temperature box comprises cold and hot boxes isolated by an insulation board. The insulation board and the integrating sphere are provided with installation holes for installing the refrigerators. When the refrigerators are respectively installed on the installation holes of the temperature box and the integrating sphere, the radiators are respectively placed outside the cold box and the integrating sphere while the aluminum PCBs are respectively placed inside the hot box and the integrating sphere. The refrigerators provided by the invention can move integrally without disassembling the LED, which facilitates the LED service life test greatly. In addition, each LED can be independently lighted by connecting a lead wire at the connection solder joint of the aluminum PCB to a switching circuit, thereby achieving the aim of testing the parameters of light, color and electricity of each LED independently.
Description
Technical field
The present invention relates to a kind of LED life-span test system and method for testing thereof, the particularly structure of the LED fixed part in the LED life-span test system, refrigerator, cold and hot two-region sweat box, and the method for testing relevant with the improvement of said structure.
Background technology
After single LEDs is produced, need do an assessment to its life-span.Relatively more current at present way is: in a collection of LED of same model; Extract certain LED sample; And aging thousands of hours (being not less than 6000 hours usually), the photochromic electrical quantity of each LEDs of elder generation's test before aging, and every interval certain hour is measured its photochromic electrical quantity in ageing process; Digestion time is long more, and the decay of LED light output is big more, preserve each result who measures, and the light output attenuatoin amount of LED after going out to wear out according to certain algorithm computation, thereby the LED life-span of extrapolating this model.
Existing LED life-span test system all is to adopt the aging support of strip when carrying out the LED burn-in test; When needs carry out photochromic electrical testing to single LEDs, just disassemble each LEDs, be installed on integrating sphere sidewall opening place and test; If burn-in test LED then needs a large amount of manual works to accomplish the dismantlement work of LED in batches; Test is accomplished, and aging support is installed back to each LEDs again, continues aging.So just bring several problems: the one, remove and install repeatedly, need a large amount of manual works and time, sharply increase aging cost, and lose time; The 2nd, remove and install repeatedly; Be very easy to damage LED; Increased the uncertainty of whole test, that is to say that the tester possibly can't judge that the damage of a certain LEDs is the human factor product quality problem that cause or LED itself in the unloading process, can't reach test objective; Moreover, in the process that removes and installs, be very easy to make the optical lens of LED to produce spot and cut, influence its light output characteristics, thereby influence measurement result, make and calculate that deviation appears in the result.
Particularly be directed to the relatively requirement of the recognized standard IES LM-80 of present industry, the variation range of LED ambient air temperature is T in ageing process
s℃ to (T
s-5) ℃, and the shell temperature variation range of LED is T
s℃ to (T
s-2) ℃.For tens degree even attend for the temperature of Baidu, more than both temperature can think roughly the same temperature.But because after LED lighted, temperature can sharply raise, thereby cause surface and surrounding air the huge temperature difference to occur.So how can control the LED ambient air temperature, can control its shell temperature T again
s, and both are controlled at just become the technical barrier that industry needs to be resolved hurrily in the temperature range much at one.
Summary of the invention
The objective of the invention is provides a kind of and can obtain than high measurement accuracy in order to solve above industry predicament, is convenient to the LED life-span test system that ambient air temperature and the shell temperature of LED in the ageing process are controlled again.
The technical scheme that the present invention adopts is: a kind of LED life-span test system; Comprise the aging subsystem that utilizes sweat box to wear out, utilize integrating sphere to carry out photochromic electrometric measurement subsystem, and aging data and measurement data are carried out the analyzing subsystem of confluence analysis;
Said LED life-span test system also comprises refrigerator and the aluminium base that is used to weld many LED to be measured, and said refrigerator comprises heating radiator, electric cold plate and mounting disc; Said electric cold plate and mounting disc all are fixedly installed on the heating radiator, and the middle part of said mounting disc has opening, and electric cold plate is embedded in the said opening, and make heating radiator be positioned at the side towards the mounting disc bottom surface; Said aluminium base is close on the surface of being fixed in electric cold plate, and makes aluminium base be used to weld one of LED pin to face up and expose; Said aluminium base has a plurality of installation positions that are used to connect LED, the LED positive and negative electrode of each installation position all with aluminium base on each installation position one to one the wiring solder joint be electrically connected;
Said sweat box is a cold and hot two-region sweat box, and said cold and hot two-region sweat box comprises through thermal insulation board isolates ice chest and the hot case that forms, and said thermal insulation board is provided with at least one sweat box mounting hole site that is used to install said refrigerator that runs through said thermal insulation board; The structural requirement of said sweat box mounting hole site satisfies: when said refrigerator is fixedly installed on the sweat box mounting hole site through its mounting disc, make said heating radiator place ice chest, and make the aluminium base on the electric cold plate place hot case;
The surface of said integrating sphere is provided with the integrating sphere mounting hole site that is used to install said refrigerator; The structural requirement of said integrating sphere mounting hole site satisfies: when said refrigerator is fixedly installed on the integrating sphere mounting hole site through its mounting disc; Make said heating radiator place integrating sphere outside, and make aluminium base on the electric cold plate place the inside of integrating sphere; And,
Said aging subsystem also comprise be used to aluminium base on corresponding each LED of each wiring solder joint provide independently burn-in test with the aging power supply unit of current source; The measurement power supply unit of said measurement subsystem comprise one measure with current source and make measurement with current source light separately according to the order of sequence or randomly with aluminium base on the switch switching circuit of the corresponding every LEDs of each wiring solder joint, with the photochromic electrical quantity of the corresponding every LEDs of each wiring solder joint on independent measurement and the aluminium base.
Wherein, be coated with the heat-conducting silicone grease layer between said electric cold plate and the aluminium base.
Wherein, the surfaces coated that said aluminium base is close to electric cold plate is covered with the insullac layer, does not all conduct with electric cold plate with the copper sheet that guarantees any one via hole on the aluminium base.
Wherein, has hand-held handle on the bottom surface of said mounting disc.
Wherein, be provided with first sealing gasket of arranging around electric cold plate between said mounting disc and the heating radiator.
Wherein, the profile of said electric cold plate and opening have the appearance profile that is complementary, and electric cold plate is embedded in the said opening just.
Wherein, the cable-through hole that passes from the bottom surface of mounting disc of the said mounting disc extension line that is provided with each wiring solder joint on the confession aluminium base that runs through its end face and bottom surface.
Wherein, Said measurement power supply unit comprise respectively with aluminium base on each positive and negative electrode connection terminal of the corresponding one by one setting of positive and negative electrode wiring solder joint of each wiring solder joint; Each positive pole, negative terminals all are connected with positive pole, the negative electricity measured with power supply respectively; Each wiring solder joint on formation and the aluminium base is each feed circuit one to one, and said switch switching circuit comprises each controlled switch that is electrically connected on correspondingly on each feed circuit.
Another object of the present invention is the method for testing that a kind of above-mentioned LED life-span test system is provided to the improvement of LED shell temperature control part and LED fixed part.
The technical scheme that the present invention adopts is: the method for testing of above-mentioned LED life-span test system comprises the steps:
Step 1: one group of LED to be tested is welded on each installation position of aluminium base; Form a refrigerator that carries the LED aluminium base; Form the refrigerator that n carries the LED aluminium base altogether, wherein, n is more than or equal to 1 natural number smaller or equal to the quantity of sweat box mounting hole site;
Step 2: accomplish the burn-in test of above n group LED, be specially:
Step 21: the extension line of each aluminium base wiring solder joint caused through the cable-through hole in the mounting disc separately accomplishes wiring in the ice chest, be specially every LEDs of making on the aluminium base and with separately one to one burn-in test form each independent current supply circuit with current source;
Step 22: thermopair is pasted on the predetermined shell temperature test point of each LEDs; And thermocouple wire led to ice chest through the cable-through hole with corresponding mounting disc separately; In ice chest, dock again with external thermopair socket; Each thermocouple wire is connected with outside Temperature sampler, and formation temperature is measured the loop;
Step 23: the mounting disc of the refrigerator that n is carried the LED aluminium base through separately is fixedly installed in the sweat box of cold and hot two-region with separately one to one on the sweat box mounting hole site; Make the heating radiator of each refrigerator all place ice chest, and make the LED aluminium base on the refrigerator place hot case;
Step 24: start the aging test that aging subsystem is accomplished n group LED, reach the working time of setting when digestion time after, system preserves all test datas, and stops to wear out;
Step 3: according to step 31 to 34 accomplish n group LED in order photochromic electric parameter measurement;
Step 31: the refrigerator that will carry the LED aluminium base takes out from ice chest, and is installed on the sidewall of integrating sphere through the integrating sphere mounting hole site, makes said heating radiator place integrating sphere outside, and makes aluminium base on the electric cold plate place the inside of integrating sphere;
Step 32: connect to measure the extension line of the wiring solder joint of power supply unit and aluminium base, be specially: form with aluminium base on each LED comprise one to one and be in series with measurement each current supply circuit with a controlled switch of current source, LED and switch switching circuit;
Step 33: the CS commutation circuit, make measurement light the every LEDs on the aluminium base according to the order of sequence or randomly separately with current source, accomplish the photochromic electrical measurement of each LEDs;
Step 34: the whole refrigerator that carries the LED aluminium base that takes off from the integrating sphere, break off the extension line of wiring solder joint and being connected of measurement power supply unit of aluminium base.
Wherein, in the installation process of step 31, the end face of refrigerator mounting disc is close to through the outer peripheral sidewall of second sealing gasket and integrating sphere mounting hole site; In step 23, the end face of the mounting disc of refrigerator is close to through the thermal insulation board of second sealing gasket and sweat box mounting hole site periphery.
Beneficial effect of the present invention is: when using LED life-span test system of the present invention to carry out life test; Can directly be welded on plurality of LEDs on the aluminium base; Stube cable is connected to aluminium base wiring solder joint place according to the order of sequence through the peripheral cable-through hole of mounting disc; Refrigerator with the whole LED of carrying aluminium base is installed on the sweat box mounting hole site of cold and hot two-region sweat box again, carries out the aging of plurality of LEDs.Accomplish when aging, in the time of need carrying out the photochromic electrical measurement of each LEDs, only need whole refrigerator is taken apart in the sweat box of cold and hot two-region, be transplanted to the outer STH of integrating sphere together with LED and test, promptly be merely the dismounting of mounting disc in fact, very convenient.Because disassembly process need not operated LED, so can improve the security of LED, not fragile LED saves time and operating personnel's workload, improves testing efficiency greatly; In addition; Every LEDs on the aluminium base can be used current source supply by independent burn-in test, if a certain like this LEDs lost efficacy, can not influence the continuation test of other LED; Not only greatly improve the reliability and the continuity of test; Also can search the trouble spot easily, be convenient to analyze failure cause, improve the accuracy of life-span projection.
In addition; The control section that LED life-span test system of the present invention carries out temperature control to LED shell temperature comprises the ice chest of refrigerator and cold and hot two-region sweat box; And the temperature of logical in a conventional manner superheated header control LED surrounding air; Be that the present invention can utilize different devices to control separately to the gentle LED surrounding air of LED shell, therefore, only need to reach the desired control target through the usual temperature control mode that adopts (like the closed-loop control system that adopts the PID controller to regulate) respectively.Moreover, adopt the structure of refrigerator and ice chest control LED shell temperature can make LED life-span test system of the present invention when carrying out the burn-in test of low-power LED, can only accomplish the temperature control target through refrigerator; And when carrying out the burn-in test of great power LED, just can take away the heat of heating radiator fast through ice chest, thus realize secondary refrigeration to LED, like this, both can effectively increase the refrigeration work consumption of refrigerator, reach the temperature control target, can prolong its serviceable life again; And the present invention is positioned over a metastable space of temperature with refrigerator, can reduce the undulate quantity of the residing environment temperature of refrigerator, thereby make its refrigeration temperature more stable, and the fluctuation degree is littler.
Description of drawings
Fig. 1 is the decomposing schematic representation according to the refrigerator of LED life-span test system of the present invention;
Fig. 2 is the structural representation of mounting disc among Fig. 1;
Fig. 3 is the upward view of mounting disc among Fig. 2;
Fig. 4 is the cross-sectional schematic of assembled relation that assembled relation and the refrigerator and the aluminium base of refrigerator shown in Fig. 1 are shown, wherein, and profile drawing line not among the figure;
Fig. 5 is the structural representation according to the ice chest of LED life-span test system of the present invention;
Fig. 6 shows the synoptic diagram of the package assembly of the refrigerator that carries the LED aluminium base and cold and hot two-region sweat box;
Fig. 7 shows the mounting structure of refrigerator and integrating sphere;
Fig. 8 shows a kind of enforcement structure of the measurement power supply unit of measurement subsystem.
Embodiment
LED life-span test system of the present invention comprises and utilizes aging subsystem that cold and hot two-region sweat box wears out and utilize integrating sphere to carry out photochromic electrometric measurement subsystem; Comprise that also refrigerator as shown in Figure 11 and as shown in Figure 4 being used to weld the aluminium base 3 of many LED to be tested; Shown in Fig. 1 to 4; This refrigerator 1 comprises mounting disc 101, electric cold plate 102 and heating radiator 104, and this electricity cold plate 102 all is fixedly installed on the heating radiator 104 with mounting disc 101, and the middle part of this mounting disc 101 has opening 101a; Electric cold plate 102 is embedded among the opening 101a (in the present embodiment; Electricity cold plate 102 can have the appearance profile that is complementary with opening 101a, and the former is embedded among the latter just), and make heating radiator 104 be positioned at bottom surface one side towards mounting disc 101; Promptly for the orientation shown in Fig. 1 and 4, heating radiator 104 is positioned at the below of the bottom surface of mounting disc 101.As shown in Figure 4, this aluminium base 3 is close on the surface of being fixed in electric cold plate 102, and make aluminium base 3 be used to weld one of LED pin and face up and expose, promptly the one side that is used to weld the LED pin of aluminium base 3 basically with the end face of mounting disc towards consistent.
For aluminium base 3 can effectively be dispelled the heat through refrigerator 1, can be between this electricity cold plate 102 and aluminium base 3 coated with thermally conductive silicone grease layer so that have high-termal conductivity between aluminium base 3 and the electric cold plate 102.
For mounting disc 101 and heating radiator 104 can closely be fitted, first sealing gasket of arranging around electric cold plate 102 105 can be set between mounting disc 101 and heating radiator 104, promptly electric cold plate 102 places first sealing gasket 105 of annular.To this; As shown in Figure 3; Can the ring groove 101c that is used for ccontaining first sealing gasket 105 that one circle caves inward be set around opening 101a on the bottom surface of this mounting disc 101; The heating radiator mounting hole that mounting disc 101 is fixedly installed on the heating radiator 104 can be arranged on this ring groove 101c, and also is provided with on first sealing gasket 105 and the corresponding through hole of heating radiator mounting hole, during installation; Make screw pass the corresponding through hole of the heating radiator mounting hole and first sealing gasket 105 in order, and make screw screw in the threaded hole on the heating radiator 104 and mounting disc 101 is fixedly installed on the heating radiator 104.
Above-mentioned aluminium base 3 has a plurality of installation positions that are used to weld LED; The LED positive and negative electrode of each installation position all for example be through on copper sheet and the aluminium base with each installation position one to one the wiring solder joint be electrically connected; In order to make wiring clean and tidy; Present embodiment all is arranged at each wiring solder joint on the both sides of the edge of aluminium base, and in the present embodiment, this aluminium base 3 provides the installation position of at least 20 LED.When carrying out the burn-in test of plurality of LEDs, need plurality of LEDs be welded on each installation position of aluminium base 3, form the LED aluminium base.
As shown in Figure 6; The cold and hot two-region sweat box 2 of above-mentioned aging subsystem comprises the ice chest 21 and hot case 22 that is provided with at interval through thermal insulation board; As illustrated in Figures 5 and 6, this thermal insulation board is provided with at least one sweat box mounting hole site 211 that is used to install refrigerator 1 that runs through thermal insulation board.When carrying out the burn-in test of LED; This refrigerator 1 is fixedly installed on the sweat box mounting hole site 211 through its mounting disc 101; Make heating radiator 104 place ice chest 21, and make aluminium base 3 on the electric cold plate 102 place the hot case 22 with the airtight isolation of ice chest to carry out burn-in test.
Because when test; As shown in Figure 6, the LED aluminium base places hot case 22, and needs to be connected in and provide the extension line of measuring current to be connected to be arranged on the end of the interior connecting terminal block of ice chest 21 for each LEDs on the wiring solder joint of aluminium base 3; Therefore; For the ease of wiring, as shown in Figure 3, can in mounting disc 101, be provided with what run through its end face and bottom surface for example is the cable-through hole 101d in heating radiator 103 peripheries (perhaps be in aluminium base 3 peripheries) layout; Like this, just, can the extension line on the wiring solder joint that be connected in aluminium base 3 be caused in the ice chest 21 through cable-through hole 101d.At this, for example be corresponding wiring on the other end of the connecting terminal block on the mounting bracket 217 that is installed in the ice chest 21 that can be connected to switch board through the cable-through hole 213 of ice chest 21 with corresponding connection terminal that each burn-in test is electrically connected with current source on.
For the ease of refrigerator 1 is installed; Cold and hot two-region sweat box adopts upper and lower structure; And make ice chest 21 place the top of hot case 22, like this, the thermal insulation board that being used between ice chest 21 and the hot case 22 is provided with sweat box mounting hole site 211 is the base plate of ice chest 21 and the top board of hot case 22.During installation, whole refrigerator 1 is inverted (even heating radiator 104 is positioned at the top), installation personnel can be held two hand-held handle 101b that are provided with on the bottom surface of mounting disc 101 refrigerator 1 is positioned over sweat box mounting hole site 211 places.
Because each aluminium base 3 can weld plurality of LEDs (at this; The LED of welding is called one group of LED on each aluminium base 3); And in the cold and hot two-region sweat box 2 a plurality of refrigerators 1 can be installed simultaneously; Therefore, can to accomplish one group simultaneously for example be more than 20 LEDs and be the burn-in tests of many groups through refrigerator of the present invention 1, aluminium base 3 and cold and hot two-region sweat box 2.
Aging subsystem of the present invention is except that above-mentioned its specific structure design; Remaining for example is to be used to gather the gentle aluminium base temperature of LED shell; And gather the environment temperature of cold and hot two-region sweat box and the temperature and humidity collecting unit of humidity, all can carry out in a conventional manner with the data acquisition unit that forms closed-loop control system according to the requirement of LED burn-in test; In addition, control on the basis of relevant structural design with temperature of the present invention, those skilled in the art are easy to realize the control to LED ambient temperature and LED shell temperature respectively through conventional control algolithm.
Above-mentioned ice chest 21 is except that the structure relevant with refrigerator 1; Remaining for example is that the design of refrigeration system and air inner cycle channel all can be adopted the conventional design structure identical with normally used refrigeration case; Comprise operating room 216 and refrigeration pulpit (not shown) like this ice chest 21; The refrigeration system of ice chest is installed in the refrigeration pulpit; Operating room 216 and the dividing plate of refrigeration between the pulpit are provided with air outlet 212 and return air inlet 214, and this refrigeration system generally includes refrigeration compressor, evaporator and is used to accomplish the blower fan etc. of air circulation.Above-mentioned ice chest 21 also can be provided with the view window 218 that is used to observe its inner case.The design of hot case 22 then can be adopted the design of conventional aging temperature case.
For the ease of with refrigerator 1 integral installation on the sweat box of cold and hot two-region, as shown in Figure 3, the mounting disc mounting hole 101e that arranges in the periphery of heating radiator that runs through this mounting disc can be set in mounting disc 101.Like this; When needs carry out burn-in test; Refrigerator 1 integral body that only needs to be equipped with aluminium base 3 is utilized mounting disc mounting hole 101e to be installed on the thermal insulation board of cold and hot two-region sweat box and is got final product; When mounted, in order to guarantee the impermeability between ice chest 21 and the hot case 22, can between the thermal insulation board of the end face of mounting disc 101 and ice chest 21, one second sealing gasket 215 be set.
As shown in Figure 7; The surface of the integrating sphere 5 of measurement subsystem of the present invention is provided with the integrating sphere mounting hole site 501 that is used to install refrigerator 1; When being fixedly installed in integrating sphere mounting hole site on through its mounting disc 101 refrigerator 1; Make heating radiator 104 place integrating sphere outside; And make aluminium base 3 on the electric cold plate 102 place the inside of integrating sphere 5, at this, can the end face of mounting disc 101 and the sidewall that is positioned at integrating sphere mounting hole site 501 peripheries of integrating sphere 5 be close to through this second sealing gasket 215 equally.Like this, each LEDs on the aluminium base 3 just can be accomplished the measurement of photochromic electrical quantity in a conventional manner.
In order to accomplish the independent measurement of each LEDs on the aluminium base with above-mentioned mounting means; The measurement power supply unit of this measurement subsystem comprise one measure with current source and make measurement with current source light separately according to the order of sequence or randomly with aluminium base on the switch switching circuit of the corresponding every LEDs of each wiring solder joint, with the photochromic electrical quantity of the corresponding every LEDs of each wiring solder joint on independent measurement and the aluminium base.
The measurement power supply unit that satisfies above-mentioned condition for example be comprise respectively with aluminium base on each positive and negative electrode connection terminal of the corresponding one by one setting of positive and negative electrode wiring solder joint of each wiring solder joint; Each positive pole, negative terminals all are connected with positive pole, the negative electricity measured with power supply respectively; Each wiring solder joint on formation and the aluminium base is each feed circuit one to one, and said switch switching circuit comprises each controlled switch that is electrically connected on correspondingly on each feed circuit.Like this; When carrying out photochromic electrical measurement; Only need the extension line of each wiring solder joint and the corresponding electrical connection of positive and negative electrode connection terminal can be formed and each LEDs current supply circuit one to one, and measurement subsystem can each only be lighted the measurement of its photochromic electrical quantity of LEDs completion through the CS commutation circuit.As shown in Figure 8; As a kind of embodiment; One end of each controlled switch all is connected with the negative electricity of measuring with current source, the other end of each controlled switch respectively with the corresponding one by one electrical connection of each negative terminals, each positive terminal is sub all to be connected with the positive electrical of measurement with current source.Above-mentioned controlled switch can be relay, for example be the switching tube etc. of triode.
The method of testing of LED life-span test system of the present invention comprises the steps:
Step 1: one group of LED to be tested is welded on each installation position of aluminium base 3; Form a refrigerator 1 that carries LED aluminium base (being the aluminium base that is welded with plurality of LEDs); At this common composition for example is 9 refrigerators that carry the LED aluminium base (in this embodiment, cold and hot two-region sweat box be provided with 9 sweat box mounting hole site).
Step 2: accomplish the burn-in test of above 9 groups of LED simultaneously, be specially:
Step 21: the extension line of the wiring solder joint of each aluminium base caused through the cable-through hole in the mounting disc separately accomplishes wiring in the ice chest, be specially every LEDs of making on the aluminium base by with separately one to one burn-in test supply power separately with current source;
Step 22: thermopair is pasted on the predetermined shell temperature test point of each LEDs; And thermocouple wire led to ice chest through the cable-through hole with corresponding mounting disc separately; In ice chest, dock again with external thermopair socket; Each thermocouple wire is connected with outside Temperature sampler, and formation temperature is measured the loop; Wherein, can on aluminium base, be designed for thermocouple wire is carried out spacing fixedly via hole;
Step 23: with the mounting disc of 9 refrigerators that carry the LED aluminium base through separately be fixedly installed in cold and hot two-region sweat box with separately one to one on the sweat box mounting hole site; Make the heating radiator of each refrigerator all place ice chest, and make the LED aluminium base on the refrigerator place hot case;
Step 24: start the aging test that aging subsystem carries out 9 groups of LED, reach the working time of setting when digestion time after, system preserves all test datas, and stops to wear out; After stopping to wear out, aging subsystem can carry out alarm, and the notifying operation personnel carry out photochromic electrical testing;
Carry out in the process of aging test of LED in step 24, according to the requirement of aging test, need be to carrying out shell temperature, voltage, electric current, the working time of each LEDs monitoring record; If in ageing process, certain LEDs breaks down, and system at first can write down time, voltage, electric current, the temperature that breaks down automatically, and reports to the police, the notice manual intervention; In addition, if in ageing process, principal computer breaks down, and will start automatically from computing machine; Take over the control of whole subsystem,, and receive all monitor datas of preservation all peripheral hardware sending controling instructions; At this moment, should become principal computer, when the principal computer fault is got rid of from computing machine; After putting into operation, it becomes from computing machine again, and principal computer is played the backup effect.
Step 3: the photochromic electric parameter measurement of 9 groups of LED more than accomplishing in order to 34 according to step 31;
Step 31: the refrigerator that will carry the LED aluminium base is installed on the sidewall of integrating sphere through the integrating sphere mounting hole site, makes said heating radiator place integrating sphere outside, and makes aluminium base on the electric cold plate place the inside of integrating sphere;
Step 32: the extension line that connects the wiring solder joint of measuring power supply unit and aluminium base; For embodiment as shown in Figure 8; The extension line that is about to the wiring solder joint is connected on corresponding positive pole, negative terminals, is specially: form with aluminium base on each LED comprise one to one and be in series with each current supply circuit of measuring with the controlled switch of current source, a LED and a switch switching circuit;
Step 33: CS commutation circuit; Make measurement light each LEDs on the aluminium base according to the order of sequence or randomly separately, to measure the photochromic electrical quantity of each LEDs, at this with current source; After lighting single LEDs, adopt existing method to accomplish the photochromic electric parameter measurement and the record of this LEDs;
Step 34: the whole refrigerator 1 that carries the LED aluminium base that takes off from the integrating sphere, break off the extension line of wiring solder joint and being connected of measurement power supply unit of aluminium base.
The analyzing subsystem of LED life-span test system of the present invention carries out confluence analysis according to aging data and measurement data that above-mentioned method of testing is obtained according to existing computing method, forms test report.
The above is merely preferred implementation of the present invention, is not to be used for limiting practical range of the present invention, and the equivalence of in protection scope of the present invention, being done in every case changes and modifies, and all should think to have fallen in protection scope of the present invention.
Claims (10)
1. LED life-span test system is characterized in that: comprise the aging subsystem that utilizes sweat box to wear out, utilize integrating sphere to carry out photochromic electrometric measurement subsystem, and aging data and measurement data are carried out the analyzing subsystem of confluence analysis; It is characterized in that: said LED life-span test system also comprises refrigerator and the aluminium base that is used to weld many LED to be measured, and said refrigerator comprises heating radiator, electric cold plate and mounting disc; Said electric cold plate and mounting disc all are fixedly installed on the heating radiator, and the middle part of said mounting disc has opening, and electric cold plate is embedded in the said opening, and make heating radiator be positioned at the side towards the mounting disc bottom surface; Said aluminium base is close on the surface of being fixed in electric cold plate, and makes aluminium base be used to weld one of LED pin to face up and expose; Said aluminium base has a plurality of installation positions that are used to connect LED, the LED positive and negative electrode of each installation position all with aluminium base on each installation position one to one the wiring solder joint be electrically connected;
Said sweat box is a cold and hot two-region sweat box, and said cold and hot two-region sweat box comprises through thermal insulation board isolates ice chest and the hot case that forms, and said thermal insulation board is provided with at least one sweat box mounting hole site that is used to install said refrigerator that runs through said thermal insulation board; The structural requirement of said sweat box mounting hole site satisfies: when said refrigerator is fixedly installed on the sweat box mounting hole site through its mounting disc, make said heating radiator place ice chest, and make the aluminium base on the electric cold plate place hot case;
The surface of said integrating sphere is provided with the integrating sphere mounting hole site that is used to install said refrigerator; The structural requirement of said integrating sphere mounting hole site satisfies: when said refrigerator is fixedly installed on the integrating sphere mounting hole site through its mounting disc; Make said heating radiator place integrating sphere outside, and make aluminium base on the electric cold plate place the inside of integrating sphere; And,
Said aging subsystem also comprise be used to aluminium base on corresponding each LED of each wiring solder joint provide independently burn-in test with the aging power supply unit of current source; The measurement power supply unit of said measurement subsystem comprise one measure with current source and make measurement with current source light separately according to the order of sequence or randomly with aluminium base on the switch switching circuit of the corresponding every LEDs of each wiring solder joint, with the photochromic electrical quantity of the corresponding every LEDs of each wiring solder joint on independent measurement and the aluminium base.
2. LED life-span test system according to claim 1 is characterized in that: be coated with the heat-conducting silicone grease layer between said electric cold plate and the aluminium base.
3. the LED stationary installation is used in LED life test according to claim 1; It is characterized in that: the surfaces coated that said aluminium base is close to electric cold plate is covered with the insullac layer, does not all conduct with electric cold plate with the copper sheet that guarantees any one via hole on the aluminium base.
4. LED life-span test system according to claim 1 is characterized in that: have hand-held handle on the bottom surface of said mounting disc.
5. LED life-span test system according to claim 1 is characterized in that: be provided with first sealing gasket of arranging around electric cold plate between said mounting disc and the heating radiator.
6. LED life-span test system according to claim 1 is characterized in that: the profile of said electric cold plate and opening have the appearance profile that is complementary, and electric cold plate is embedded in the said opening just.
7. LED life-span test system according to claim 1 is characterized in that: the cable-through hole that the extension line that said mounting disc is provided with each wiring solder joint on the confession aluminium base that runs through its end face and bottom surface passes from the bottom surface of mounting disc.
8. LED life-span test system according to claim 1; It is characterized in that: said measurement power supply unit comprise respectively with aluminium base on each positive and negative electrode connection terminal of the corresponding one by one setting of positive and negative electrode wiring solder joint of each wiring solder joint; Each positive pole, negative terminals all are connected with positive pole, the negative electricity measured with power supply respectively; Each wiring solder joint on formation and the aluminium base is each feed circuit one to one, and said switch switching circuit comprises each controlled switch that is electrically connected on one to one on each feed circuit.
9. according to the method for testing of each described LED life-span test system in the claim 1 to 8, it is characterized in that: comprise the steps:
Step 1: one group of LED to be tested is welded on each installation position of aluminium base; Form a refrigerator that carries the LED aluminium base; Form the refrigerator that n carries the LED aluminium base altogether, wherein, n is more than or equal to 1 natural number smaller or equal to the quantity of sweat box mounting hole site;
Step 2: accomplish the burn-in test of above n group LED simultaneously, be specially:
Step 21: the extension line of each aluminium base wiring solder joint caused through the cable-through hole in the mounting disc separately accomplishes wiring in the ice chest, be specially every LEDs of making on the aluminium base and with separately one to one burn-in test form each independent current supply circuit with current source;
Step 22: thermopair is pasted on the predetermined shell temperature test point of each LEDs; And thermocouple wire led to ice chest through the cable-through hole with corresponding mounting disc separately; In ice chest, dock again with external thermopair socket; Each thermocouple wire is connected with outside Temperature sampler, and formation temperature is measured the loop;
Step 23: the mounting disc of the refrigerator that n is carried the LED aluminium base through separately is fixedly installed in the sweat box of cold and hot two-region with separately one to one on the sweat box mounting hole site; Make the heating radiator of each refrigerator all place ice chest, and make the LED aluminium base on the refrigerator place hot case;
Step 24: start the aging test that aging subsystem is accomplished n group LED, reach the working time of setting when digestion time after, system preserves all test datas, and stops to wear out;
Step 3: according to step 31 to 34 accomplish n group LED in order photochromic electric parameter measurement;
Step 31: the refrigerator that will carry the LED aluminium base takes out from ice chest, and is installed on the sidewall of integrating sphere through the integrating sphere mounting hole site, makes said heating radiator place integrating sphere outside, and makes aluminium base on the electric cold plate place the inside of integrating sphere;
Step 32: connect to measure the extension line of the wiring solder joint of power supply unit and aluminium base, be specially: form with aluminium base on each LED comprise one to one and be in series with measurement each current supply circuit with a controlled switch of current source, LED and switch switching circuit;
Step 33: the CS commutation circuit, make measurement light the every LEDs on the aluminium base according to the order of sequence or randomly separately with current source, accomplish the photochromic electrical measurement of each LEDs;
Step 34: the whole refrigerator that carries the LED aluminium base that takes off from the integrating sphere, break off the extension line of wiring solder joint and being connected of measurement power supply unit of aluminium base.
10. the method for testing of LED life-span test system according to claim 9 is characterized in that: in the installation process of step 31, the end face of refrigerator mounting disc is close to through the outer peripheral sidewall of second sealing gasket and integrating sphere mounting hole site; In step 23, the end face of the mounting disc of refrigerator is close to through the thermal insulation board of second sealing gasket and sweat box mounting hole site periphery.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210055631.4A CN102590763B (en) | 2012-03-05 | 2012-03-05 | LED (light emitting diode) service life test system and test method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210055631.4A CN102590763B (en) | 2012-03-05 | 2012-03-05 | LED (light emitting diode) service life test system and test method thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102590763A true CN102590763A (en) | 2012-07-18 |
| CN102590763B CN102590763B (en) | 2014-10-08 |
Family
ID=46479682
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201210055631.4A Expired - Fee Related CN102590763B (en) | 2012-03-05 | 2012-03-05 | LED (light emitting diode) service life test system and test method thereof |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102590763B (en) |
Cited By (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102890249A (en) * | 2012-10-18 | 2013-01-23 | 桂林电子科技大学 | Accelerated test method of LED (light emitting diode) lighting lamp based on subsystem decomposition |
| CN102901618A (en) * | 2012-09-11 | 2013-01-30 | 彩虹集团公司 | Testing fixture for LED (Light-Emitting Diode) chips with multiple structures |
| CN102998632A (en) * | 2012-12-13 | 2013-03-27 | 青海天普太阳能科技有限公司 | Service life estimation method of light-emitting diode (LED) lamp |
| CN103245923A (en) * | 2013-04-25 | 2013-08-14 | 上海大学 | Quick batch test device for light, color and electricity performance of LED |
| CN103292982A (en) * | 2013-06-05 | 2013-09-11 | 桂林电子科技大学 | Accelerated degradation testing method for LED lamp based on step stress |
| CN103472817A (en) * | 2013-09-04 | 2013-12-25 | 深圳雷曼光电科技股份有限公司 | Handheld timing data reader, LED display screen service life monitoring system and method |
| CN103487735A (en) * | 2013-09-30 | 2014-01-01 | 金华市华强电子科技有限公司 | Method for drawing thermal cycle load test thermal fatigue life curve of vehicle diode |
| CN103837763A (en) * | 2012-11-27 | 2014-06-04 | 深圳市海洋王照明工程有限公司 | Circuit and method for testing service life of lamp |
| CN103942605A (en) * | 2013-12-23 | 2014-07-23 | 上海大郡动力控制技术有限公司 | Optimization method suitable for automobile electronic component aging temperature and time |
| CN104280693A (en) * | 2014-09-02 | 2015-01-14 | 浙江天恩太阳能科技有限公司 | Life curve testing device for LED lamp and testing method thereof |
| CN104457249A (en) * | 2014-11-18 | 2015-03-25 | 东莞华科东尼仪器有限公司 | LED ageing oven of improved structure |
| CN104502063A (en) * | 2014-11-03 | 2015-04-08 | 浙江中博光电科技有限公司 | LED light source high temperature long term luminous flux maintenance rate detection method |
| CN105388332A (en) * | 2015-12-14 | 2016-03-09 | 江阴乐圩光电股份有限公司 | LED aging tester |
| CN105974230A (en) * | 2016-05-10 | 2016-09-28 | 倍科质量技术服务（东莞）有限公司 | LM-80 aging test system based on semiconductor refrigeration device and control method of system |
| CN107238734A (en) * | 2017-04-18 | 2017-10-10 | 深圳市帝晶光电科技有限公司 | A kind of reliability testing system board protector |
| CN107450006A (en) * | 2017-08-14 | 2017-12-08 | 杭州可靠性仪器厂 | A kind of metal-oxide-semiconductor, diode power batch run device |
| CN108508341A (en) * | 2018-03-08 | 2018-09-07 | 佛山市顺德区蚬华多媒体制品有限公司 | LED ageing testers |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6597195B1 (en) * | 2000-07-28 | 2003-07-22 | Labsphere, Inc. | Method of and cassette structure for burn-in and life testing of multiple LEDs and the like |
| CN201607524U (en) * | 2009-12-31 | 2010-10-13 | 重庆四联启蓝半导体照明有限公司 | System for testing service life of LED luminaire |
| CN201611377U (en) * | 2009-09-27 | 2010-10-20 | 宜准科技股份有限公司 | Service life test device of high-brightness light-emitting diode |
| JP2011179937A (en) * | 2010-03-01 | 2011-09-15 | Hirayama Seisakusho:Kk | Led life testing method and apparatus |
-
2012
- 2012-03-05 CN CN201210055631.4A patent/CN102590763B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6597195B1 (en) * | 2000-07-28 | 2003-07-22 | Labsphere, Inc. | Method of and cassette structure for burn-in and life testing of multiple LEDs and the like |
| CN201611377U (en) * | 2009-09-27 | 2010-10-20 | 宜准科技股份有限公司 | Service life test device of high-brightness light-emitting diode |
| CN201607524U (en) * | 2009-12-31 | 2010-10-13 | 重庆四联启蓝半导体照明有限公司 | System for testing service life of LED luminaire |
| JP2011179937A (en) * | 2010-03-01 | 2011-09-15 | Hirayama Seisakusho:Kk | Led life testing method and apparatus |
Cited By (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102901618A (en) * | 2012-09-11 | 2013-01-30 | 彩虹集团公司 | Testing fixture for LED (Light-Emitting Diode) chips with multiple structures |
| CN102890249A (en) * | 2012-10-18 | 2013-01-23 | 桂林电子科技大学 | Accelerated test method of LED (light emitting diode) lighting lamp based on subsystem decomposition |
| CN103837763A (en) * | 2012-11-27 | 2014-06-04 | 深圳市海洋王照明工程有限公司 | Circuit and method for testing service life of lamp |
| CN102998632A (en) * | 2012-12-13 | 2013-03-27 | 青海天普太阳能科技有限公司 | Service life estimation method of light-emitting diode (LED) lamp |
| CN103245923A (en) * | 2013-04-25 | 2013-08-14 | 上海大学 | Quick batch test device for light, color and electricity performance of LED |
| CN103292982B (en) * | 2013-06-05 | 2015-06-03 | 桂林电子科技大学 | Accelerated degradation testing method for LED lamp based on step stress |
| CN103292982A (en) * | 2013-06-05 | 2013-09-11 | 桂林电子科技大学 | Accelerated degradation testing method for LED lamp based on step stress |
| CN103472817A (en) * | 2013-09-04 | 2013-12-25 | 深圳雷曼光电科技股份有限公司 | Handheld timing data reader, LED display screen service life monitoring system and method |
| CN103487735A (en) * | 2013-09-30 | 2014-01-01 | 金华市华强电子科技有限公司 | Method for drawing thermal cycle load test thermal fatigue life curve of vehicle diode |
| CN103487735B (en) * | 2013-09-30 | 2016-03-23 | 金华市华强电子科技有限公司 | The method for drafting of thermal cycle load test thermal fatigue life curve of vehicle diode |
| CN103942605A (en) * | 2013-12-23 | 2014-07-23 | 上海大郡动力控制技术有限公司 | Optimization method suitable for automobile electronic component aging temperature and time |
| CN104280693A (en) * | 2014-09-02 | 2015-01-14 | 浙江天恩太阳能科技有限公司 | Life curve testing device for LED lamp and testing method thereof |
| CN104502063B (en) * | 2014-11-03 | 2017-02-15 | 浙江中博光电科技有限公司 | LED light source high temperature long term luminous flux maintenance rate detection method |
| CN104502063A (en) * | 2014-11-03 | 2015-04-08 | 浙江中博光电科技有限公司 | LED light source high temperature long term luminous flux maintenance rate detection method |
| CN104457249B (en) * | 2014-11-18 | 2016-06-22 | 东莞华科东尼仪器有限公司 | A kind of structure improved LED ageing oven |
| CN104457249A (en) * | 2014-11-18 | 2015-03-25 | 东莞华科东尼仪器有限公司 | LED ageing oven of improved structure |
| CN105388332A (en) * | 2015-12-14 | 2016-03-09 | 江阴乐圩光电股份有限公司 | LED aging tester |
| CN105388332B (en) * | 2015-12-14 | 2018-12-04 | 广州达测仪器有限公司 | LED aging tester |
| CN105974230A (en) * | 2016-05-10 | 2016-09-28 | 倍科质量技术服务（东莞）有限公司 | LM-80 aging test system based on semiconductor refrigeration device and control method of system |
| CN107238734A (en) * | 2017-04-18 | 2017-10-10 | 深圳市帝晶光电科技有限公司 | A kind of reliability testing system board protector |
| CN107238734B (en) * | 2017-04-18 | 2019-11-05 | 深圳市帝晶光电科技有限公司 | A kind of reliability test system board protective device |
| CN107450006A (en) * | 2017-08-14 | 2017-12-08 | 杭州可靠性仪器厂 | A kind of metal-oxide-semiconductor, diode power batch run device |
| CN108508341A (en) * | 2018-03-08 | 2018-09-07 | 佛山市顺德区蚬华多媒体制品有限公司 | LED ageing testers |
| CN108508341B (en) * | 2018-03-08 | 2020-11-24 | 佛山市顺德区蚬华多媒体制品有限公司 | LED aging test device |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102590763B (en) | 2014-10-08 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102590763B (en) | LED (light emitting diode) service life test system and test method thereof | |
| CN113917273B (en) | Electrified reliability test system for electronic component | |
| CN104331108A (en) | Dehumidifier and control method thereof | |
| CN103453941A (en) | Real-time monitor system for box-type substation | |
| CN103398738A (en) | System and method of real-time monitoring of accelerated aging of electric light source | |
| CN109916454A (en) | A kind of battery system thermal runaway simulator | |
| CN104850042A (en) | Box type switching station monitoring and control system | |
| CN104614687A (en) | Light emitting diode (LED) environmental test chamber and test method | |
| CN103926052A (en) | Laser service life testing system | |
| CN112345965A (en) | Novel LED lamp testing device and testing method thereof | |
| CN205103369U (en) | COB -LED strikes aging testing device | |
| CN105319500B (en) | A kind of disconnecting switch on-line monitoring system and its method based on stay-supported sensor | |
| CN203025324U (en) | Service life tester of temperature-controlled switch | |
| CN202494769U (en) | LED fixing device for LED life test | |
| CN204462357U (en) | LED environmental test chamber | |
| CN110363951A (en) | Intelligent safety monitor of telecommunication suitable for switchgear | |
| CN206609956U (en) | A kind of LED lamp aging equipment | |
| CN215575498U (en) | Monitoring system for aging test of chip | |
| CN202494938U (en) | LED casing temperature control device for LED aging test | |
| CN204899692U (en) | Emergency exits with LED heat source warning device | |
| CN210123583U (en) | Intelligent safety monitoring device suitable for switch cabinet | |
| CN204256563U (en) | Dehumidifier | |
| CN208722001U (en) | A kind of air-conditioning real-time monitoring system with automatic control function | |
| CN215419204U (en) | Temperature measurement monitoring system for wind energy converter | |
| CN206696380U (en) | A kind of adjustable paper oil insulation discharge test device of temperature |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| ASS | Succession or assignment of patent right |
Owner name: SHENZHEN MANYOUNG TECHNOLOGY CO., LTD. Free format text: FORMER OWNER: CHANGZHOU PRODUCT QUALITY INSPECTION AND SUPERVISION INSTITUTE Effective date: 20130506 Owner name: CHANGZHOU PRODUCT QUALITY INSPECTION AND SUPERVISI Free format text: FORMER OWNER: SHENZHEN MANYOUNG TECHNOLOGY CO., LTD. Effective date: 20130506 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: 518000 SHENZHEN, GUANGDONG PROVINCE TO: 213001 CHANGZHOU, JIANGSU PROVINCE |
|
| TA01 | Transfer of patent application right |
Effective date of registration: 20130506 Address after: 213001 Jiangsu province Changzhou City Tianning Lanling Road No. 520 Applicant after: CHANGZHOU PRODUCT QUALITY INSPECTION AND SUPERVISION INSTITUTE Applicant after: SHENZHEN MANYOUNG TECHNOLOGY Co.,Ltd. Address before: The comprehensive building of Tsinghua Nanshan District Keyuan Road Shenzhen city Guangdong province 518000 8 807 Applicant before: Shenzhen Manyoung Technology Co.,Ltd. Applicant before: Changzhou Product Quality Inspection and Supervision Institute |
|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20141008 |