CN103942605A - Optimization method suitable for automobile electronic component aging temperature and time - Google Patents
Optimization method suitable for automobile electronic component aging temperature and time Download PDFInfo
- Publication number
- CN103942605A CN103942605A CN201310720074.8A CN201310720074A CN103942605A CN 103942605 A CN103942605 A CN 103942605A CN 201310720074 A CN201310720074 A CN 201310720074A CN 103942605 A CN103942605 A CN 103942605A
- Authority
- CN
- China
- Prior art keywords
- electronic component
- aging
- time
- temperature
- value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/30—Computing systems specially adapted for manufacturing
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Tests Of Electronic Circuits (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Abstract
The invention discloses an optimization method suitable for automobile electronic component aging temperature and time. In the method, multiple aging temperature and time are set firstly, and a representative key parameter of an electronic component is measured and recorded behind each aging time under each aging temperature respectively; and a PPK value under each aging temperature is calculated by utilizing a PPK long-term process capability index, the optimized temperature point is confirmed in a way of being not lower than level A, the optimized aging time is judged between a time point, at which an aging monitoring point of the electronic component enters into the stable state, and a larger time point of two adjacent time points with the minimum stable state variation, and finally the maximum time point in the optimized time of each monitoring point is selected to act as the final optimized aging time. Electronic component aging temperature and time are optimized by utilizing the PPK long-term process capability index, and the aging time as short as possible and the suitable aging temperature are confirmed under the premise of ensuring quality of the electronic component so that aging effect and efficiency are enhanced and aging cost is reduced.
Description
Technical field
The present invention relates to a kind of optimization method that is applicable to automotive electronics component ageing temperature and time.
Background technology
In order to reach satisfied qualification rate, nearly all electronic component is all wanted first by aging before dispatching from the factory, ensureing to improve ageing efficiency under the reliable condition of electronic component, reducing and shorten cost and the time that ageing process is brought, is the problem that electronic component is aging faced.
In Automobile Electronic Industry, there are various arguements in the problem of aging of electronic component always.As other products, automotive electronics element/module at any time may break down because of a variety of causes, agingly makes defect occur at short notice by allowing electronic component work overloadingly exactly, avoids breaking down in early days in use.If not by aging, a lot of electronic components are because device and the reason such as complicacy of manufacturing processing procedure in use can produce a lot of problems.
Electronic component after bringing into use several hours is called initial failure to the defect occurring within these few days, and the electronic component after aging requires 100% elimination initial failure substantially.Conventionally the method for accurately determining aging temperature/time is degradation failure and the fault analysis statistics of collecting with reference in the past, and most of production firms wish reduce or cancel aging.
Ageing process must be able to guarantee that electronic component meets the requirement of user to reliability, and in addition, it also must be able to provide project data for use in the performance of improving product.In general, ageing process is carried out harsh test by working environment and electric property two aspects to product, so that fault occurs as early as possible.As shown in Figure 1, horizontal ordinate is the time, and ordinate is crash rate, and line segment 1 is decreasing failure rate, and line segment 2 is constant crash rate, and line segment 3 is loss failure rate, and as seen from the figure, major failure all appears at electronic component life cycle and starts and the last stage.Aging is exactly to accelerate the operational process of electronic component in initial part of its life-span, forces initial failure to occur within the shorter time, normally several hours.
Conventionally in ageing process, electronic component is put into aging chamber, adds that to burn-in board direct current (DC) bias implements static-aging, and the environment temperature that raises, tens or up to a hundred hours after electronic component is taken out and is tested.If still performance is intact after 100% test, just can ensures reliable product quality and send it to user.
This ageing process official hour is likely oversize or too short, and temperature is Tai Gao or too low likely, thereby affects aging effect, reduces ageing efficiency, and improves aging cost.
Summary of the invention
Technical matters to be solved by this invention is to provide a kind of optimization method that is applicable to automotive electronics component ageing temperature and time, this method utilizes the long-term process capability index of PPK to be optimized electronic component aging temperature and time, ensureing under the prerequisite of electronic component quality, determine short as far as possible digestion time and suitable as far as possible aging temperature, thereby improve aging effect and efficiency, and reduce aging cost.
For solving the problems of the technologies described above, the optimization method that the present invention is applicable to automotive electronics component ageing temperature and time comprises the steps:
The aging temperature of step 1, setting electronic component is respectively 45 DEG C, 55 DEG C, 65 DEG C, and digestion time is respectively 4 hours, 8 hours, 12 hours, 24 hours, 36 hours, 48 hours, 72 hours;
Step 2, the aging control point of electronic component is set, the representative key parameter of survey record electronic component after the each digestion time under each aging temperature respectively;
Step 3, utilize the long-term process capability index of PPK to analyze judgement, according to PPK permanent worker Process capabi l i ty 32 formula of index:
(AVE(M) tolerance under-LSL())/3* standard deviation (1)
(the upper tolerance of USL()-AVE(M))/3* standard deviation (2)
In formula (1) and formula (2): AVE(M) be the mean value of all sample datas of corresponding electronic component measurement parameter at each temperature, the upper tolerance of USL() be the maximal value of electronic component design key parameter, tolerance under LSL() be the minimum value of electronic component design key parameter, standard deviation is first each record data to be deducted to the absolute difference addition that mean value obtains, and then divided by the sample number recording
Utilize formula (1) and formula (2) to calculate respectively electronic component in PPK value at each temperature, and select two computing formula to obtain a value less in result;
Step 4, according to the PPK table of grading of following table, determine the temperature spot after optimizing to be not less than grade A,
| PPK grade | PPK value a |
| D | a＜0.67 |
| C | 1＞a≥0.67 |
| B | 1.33＞a≥1 |
| A | 1.67＞a≥1.33 |
| A+ | a≥1.67 |
When there being all corresponding grade A of PPK value of two or more temperature spots, select temperature spot that PPK value is larger as the aging temperature point of optimizing, if the PPK value of each temperature spot is identical, using minimum temperature spot as definite aging temperature point, if the PPK value of each temperature spot all lower than grade A, shows that electronic component is also not suitable for producing in batches;
Step 5, the digestion time of optimizing enter with the measurement data of electronic component key parameter control point under each aging temperature to be chosen larger time point in 2 of adjacent time point steady state (SS) variation minimum after steady state (SS) and judges;
Wherein: steady state (SS) is that the key parameter value that measures of each timing node and the key parameter value deviation after aging 72 hours are less than with reference to key parameter tolerance * 20%, is the design tolerance minimum value in the upper tolerance of representative key parameter and the difference of lower tolerance with reference to key parameter tolerance; The key parameter value that in 2 of adjacent time point steady state (SS) variation minimum, larger time point is adjacent time point is subtracted each other, and in the adjacent time point of institute's value minimum, chooses larger time point;
Finally from the optimization digestion time of each control point, selecting wherein maximum time point is final optimization digestion time.
Further, the representative key parameter of above-mentioned electronic component is output voltage or output current.
The optimization method that is applicable to automotive electronics component ageing temperature and time due to the present invention has adopted technique scheme, be that first this method sets some aging temperatures and time, the representative key parameter of survey record electronic component after the each digestion time under each aging temperature respectively; Utilize the long-term process capability index of PPK to calculate the PPK value under each aging temperature, and determine the temperature spot after optimizing to be not less than grade A, optimize digestion time and enter time point phase larger in the time point of steady state (SS) and adjacent time point steady state (SS) variation minimum 2 with the aging control point of electronic component and judge, last from the optimization time of each control point, to select wherein maximum time point be final optimization digestion time.This method utilizes the long-term process capability index of PPK to be optimized electronic component aging temperature and time, ensureing under the prerequisite of electronic component quality, determine short as far as possible digestion time and suitable as far as possible aging temperature, thereby improve aging effect and efficiency, and reduce aging cost.
Brief description of the drawings
Below in conjunction with drawings and embodiments, the present invention is described in further detail:
Fig. 1 is typical electronic component curve synoptic diagram in serviceable life;
Fig. 2 is the aging curve figure of electronic component 5V control point in this method;
Fig. 3 is the aging curve figure of electronic component 11V control point in this method.
Embodiment
The optimization method that the present invention is applicable to automotive electronics component ageing temperature and time comprises the steps:
The aging temperature of step 1, setting electronic component is respectively 45 DEG C, 55 DEG C, 65 DEG C, and digestion time is respectively 4 hours, 8 hours, 12 hours, 24 hours, 36 hours, 48 hours, 72 hours;
Step 2, the aging control point of electronic component is set, the representative key parameter of survey record electronic component after the each digestion time under each aging temperature respectively;
Step 3, utilize the long-term process capability index of PPK to analyze judgement, according to PPK permanent worker Process capabi l i ty 32 formula of index:
(AVE(M) tolerance under-LSL())/3* standard deviation (1)
(the upper tolerance of USL()-AVE(M))/3* standard deviation (2)
In formula (1) and formula (2): AVE(M) be the mean value of all sample datas of corresponding electronic component measurement parameter at each temperature, the upper tolerance of USL() be the maximal value of electronic component design key parameter, tolerance under LSL() be the minimum value of electronic component design key parameter, standard deviation is first each record data to be deducted to the absolute difference addition that mean value obtains, and then divided by the sample number recording
Utilize formula (1) and formula (2) to calculate respectively electronic component in PPK value at each temperature, and select two computing formula to obtain a value less in result;
Step 4, according to the PPK table of grading of following table, determine the temperature spot after optimizing to be not less than grade A,
| PPK grade | PPK value a |
| D | a＜0.67 |
| C | 1＞a≥0.67 |
| B | 1.33＞a≥1 |
| A | 1.67＞a≥1.33 |
| A+ | a≥1.67 |
When there being all corresponding grade A of PPK value of two or more temperature spots, select temperature spot that PPK value is larger as the aging temperature point of optimizing, if the PPK value of each temperature spot is identical, using minimum temperature spot as definite aging temperature point, if the PPK value of each temperature spot all lower than grade A, shows that electronic component is also not suitable for producing in batches;
Step 5, the digestion time of optimizing enter with the measurement data of electronic component key parameter control point under each aging temperature to be chosen larger time point in 2 of adjacent time point steady state (SS) variation minimum after steady state (SS) and judges;
Wherein: steady state (SS) is that the key parameter value that measures of each timing node and the key parameter value deviation after aging 72 hours are less than with reference to key parameter tolerance * 20%, is the design tolerance minimum value in the upper tolerance of representative key parameter and the difference of lower tolerance with reference to key parameter tolerance; The key parameter value that in 2 of adjacent time point steady state (SS) variation minimum, larger time point is adjacent time point is subtracted each other, and in the adjacent time point of institute's value minimum, chooses larger time point;
Finally from the optimization digestion time of each control point, selecting wherein maximum time point is final optimization digestion time.
Further, the representative key parameter of above-mentioned electronic component is output voltage or output current.
First aging temperature and time are Optimization Factor to this method, conventionally the design temperature scope of electronic component is-40～85 DEG C, aging relates to high-temperature part, general 0.7～0.8 times of selecting that the highest aging temperature is design temperature, therefore set 65 DEG C of the highest aging temperatures, too lowly can not reach aging effect, minimum aging temperature is set as 45 DEG C, chooses 55 DEG C of intermediate values simultaneously again; The longest digestion time is not more than 72 hours simultaneously, otherwise can greatly shorten the mean time between failures of electronic component, increase the risk of fault, the principle chosen of time is interval 4 hours in early stage, 12 hours, follow-up interval, is convenient to operation execution and the data analysis of burn-in operation; Data analysis adopts PPK long-term process capability index, determines the temperature spot after optimization after calculating respectively PPK value to be not less than grade A; Optimize digestion time and enter time point phase larger in the time point of steady state (SS) and adjacent time point variation minimum 2 with the aging control point of electronic component and judge, finally from the time of obtained each control point, select the digestion time that wherein maximum time point is final optimization pass.
Taking certain electronic component as example, optimize being defined as of aging temperature: be 40 at the actual sample size of choosing of each temperature spot, the selection of this quantity is according to the batch quantity of product, generally be not less than 10, data are unfavorable for analyzing very little, but can not be too many, otherwise can cause larger production cost.
1, the PPK value result at 45 DEG C:
The output voltage values that measures electronic component is respectively 4.99V, 4.96V, 4.97V, 4.98V, 4.99V, 4.98V, 4.96V, 4.95V ... have 40 data, calculate output voltage average value and be about 4.97V, get the data of two-decimal point herein, actual PPK preferably adopts its exact value while calculating, in order to avoid produce the error of can not ignore, according to PPK computing formula, obtain PPK value and be:
（4.97-4.95）/3*[（0.02+0.01+0+0.01+0.02+0.01+0.01+0.02……）/40]=0.53
According to PPK table of grading, corresponding grade D;
2, the PPK value result at 55 DEG C:
The output voltage values that measures electronic component is respectively 4.99V, 4.98V, 5.01V, 5V, 5.01V, 4.98V, 4.99V, 4.97V ... have 40 data, calculate output voltage average value and be about 4.99V, according to PPK computing formula, obtain PPK value and be: 0.96
According to PPK table of grading, corresponding grade C;
3, the PPK value result at 65 DEG C
Measure the output voltage values of electronic component, equally according to output voltage Value Data, calculate output voltage average value and be about 4.99V, according to PPK computing formula, obtaining PPK value is 1.55, according to PPK table of grading, and corresponding grade A.
Determine the temperature spot after optimizing to be not less than grade A, therefore determine 65 DEG C of aging temperatures for optimizing.
Optimize being defined as of digestion time: the control point that the aging interval scale key parameter of electronic component is set is respectively output voltage 5V and 11V, the reference voltage tolerance of known this electronic component is 0.1V, reference voltage tolerance * 20%=0.02V, after aging 72 hours, the average voltage level of the actual measurement of 5V control point is 5.12V, therefore its steady state (SS) is 5.10V～5.14V; The average voltage level of 11V control point actual measurement is 10.92V, therefore its steady state (SS) is 10.90V～10.94V;
In ageing process, as shown in Figure 2,5V control point entered steady state (SS) 5.10V～5.14V interval after 8 hours, and 2 that choose adjacent time point steady state (SS) variation minimum is 12～24 hours, to choose larger time point as principle, the digestion time of 5V control point is 24 hours;
As shown in Figure 3,11V control point entered steady state (SS) 10.90V～10.94V interval after 8 hours, 2 that choose adjacent time point steady state (SS) variation minimum is 8～12 hours, and to choose larger time point as principle, the electronic digestion time in 11V control point is 12 hours;
In the digestion time of each control point, selecting wherein maximum time point, is that 12 hours and 5V control point are that in 24 hours, to choose maximum time point be 24 hours in 11V control point, chooses 24 hours for optimizing digestion time.
The digestion time that finally obtains this electronic component the best is that 24 hours, aging temperature are 65 DEG C.
This method, compared to traditional aging techniques, has improved 50% production capacity, and has saved corresponding testing cost for technique.
Claims (2)
1. be applicable to an optimization method for automotive electronics component ageing temperature and time, it is characterized in that this method comprises the steps:
The aging temperature of step 1, setting electronic component is respectively 45 DEG C, 55 DEG C, 65 DEG C, and digestion time is respectively 4 hours, 8 hours, 12 hours, 24 hours, 36 hours, 48 hours, 72 hours;
Step 2, the control point of the aging interval scale key parameter of electronic component is set, the representative key parameter of survey record electronic component after the each digestion time under each aging temperature respectively;
Step 3, utilize the long-term process capability index of PPK to analyze judgement, according to PPK permanent worker Process capabi l i ty 32 formula of index:
(AVE(M) tolerance under-LSL())/3* standard deviation (1)
(the upper tolerance of USL()-AVE(M))/3* standard deviation (2)
In formula (1) and formula (2): AVE(M) be the mean value of all sample datas of corresponding electronic component measurement parameter at each temperature, the upper tolerance of USL() be the maximal value of electronic component design key parameter, tolerance under LSL() be the minimum value of electronic component design key parameter, standard deviation be first each record data is deducted mean value obtain difference absolute value be added, and then divided by the sample number recording
Utilize formula (1) and formula (2) to calculate respectively electronic component in PPK value at each temperature, and select two computing formula to obtain a value less in result;
Step 4, according to the PPK table of grading of following table, determine the temperature spot after optimizing to be not less than grade A,
When there being all corresponding grade A of PPK value of two or more temperature spots, select temperature spot that PPK value is larger as the aging temperature point of optimizing, if the PPK value of each temperature spot is identical, using minimum temperature spot as definite aging temperature point, if the PPK value of each temperature spot all lower than grade A, shows that electronic component is also not suitable for producing in batches;
Step 5, the digestion time of optimizing enter with the measurement data of electronic component key parameter control point under each aging temperature to be chosen larger time point in 2 of adjacent time point steady state (SS) variation minimum after steady state (SS) and judges;
Wherein: steady state (SS) is that the key parameter value that measures of each timing node and the key parameter value deviation after aging 72 hours are less than with reference to key parameter tolerance * 20%, is the design tolerance minimum value in the upper tolerance of representative key parameter and the difference of lower tolerance with reference to key parameter tolerance; The key parameter value that in 2 of adjacent time point steady state (SS) variation minimum, larger time point is adjacent time point is subtracted each other, and in the adjacent time point of institute's value minimum, chooses larger time point;
Finally from the optimization digestion time of each control point, selecting wherein maximum time point is final optimization digestion time.
2. the optimization method that is applicable to automotive electronics component ageing temperature and time according to claim 1, is characterized in that: the representative key parameter of described electronic component is output voltage or output current.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310720074.8A CN103942605B (en) | 2013-12-23 | 2013-12-23 | Optimization method suitable for automobile electronics aging temperature and time |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310720074.8A CN103942605B (en) | 2013-12-23 | 2013-12-23 | Optimization method suitable for automobile electronics aging temperature and time |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103942605A true CN103942605A (en) | 2014-07-23 |
| CN103942605B CN103942605B (en) | 2019-09-13 |
Family
ID=51190267
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310720074.8A Active CN103942605B (en) | 2013-12-23 | 2013-12-23 | Optimization method suitable for automobile electronics aging temperature and time |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103942605B (en) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6858103B2 (en) * | 2002-01-10 | 2005-02-22 | Ford Global Technologies, Llc | Method of optimizing heat treatment of alloys by predicting thermal growth |
| CN102590763A (en) * | 2012-03-05 | 2012-07-18 | 深圳市迈昂科技有限公司 | LED (light emitting diode) service life test system and test method thereof |
| CN102854446A (en) * | 2012-08-14 | 2013-01-02 | 蚌埠德豪光电科技有限公司 | Method for detecting service life of LED (light emitting diode) device, detection circuit and application thereof |
| CN103323785A (en) * | 2013-06-24 | 2013-09-25 | 深圳市迪比科电子科技有限公司 | Aging method of lithium ion battery |
-
2013
- 2013-12-23 CN CN201310720074.8A patent/CN103942605B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6858103B2 (en) * | 2002-01-10 | 2005-02-22 | Ford Global Technologies, Llc | Method of optimizing heat treatment of alloys by predicting thermal growth |
| CN102590763A (en) * | 2012-03-05 | 2012-07-18 | 深圳市迈昂科技有限公司 | LED (light emitting diode) service life test system and test method thereof |
| CN102854446A (en) * | 2012-08-14 | 2013-01-02 | 蚌埠德豪光电科技有限公司 | Method for detecting service life of LED (light emitting diode) device, detection circuit and application thereof |
| CN103323785A (en) * | 2013-06-24 | 2013-09-25 | 深圳市迪比科电子科技有限公司 | Aging method of lithium ion battery |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103942605B (en) | 2019-09-13 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103608690B (en) | Testing apparatus is calibrated | |
| CN102650678B (en) | Multi-channel calibration and checking method for power management ICs (integrated circuits) | |
| CN102033182A (en) | Method for predicting life of solid tantalum electrolytic capacitor | |
| CN108254250B (en) | Heat engine multi-axis stress-strain relation determination method considering dynamic strain aging | |
| CN102313866B (en) | Method for carrying out scanning test on minimum output voltage drop by two step lengths | |
| CN105628218A (en) | Optical module chip temperature calibration method | |
| US8102180B2 (en) | CPU voltage testing system and method thereof | |
| CN113406502B (en) | Defective battery screening method, apparatus and medium based on machine learning | |
| CN103942605A (en) | Optimization method suitable for automobile electronic component aging temperature and time | |
| US7359813B2 (en) | Outlier screening technique | |
| CN102478842B (en) | Measurement process optimization method and device | |
| CN113624506A (en) | Method for verifying service life of automobile part product | |
| CN103837755A (en) | Refrigerator component fault detection method and system | |
| CN103698639A (en) | System and method for automatically measuring waveform parameters of crystal oscillator | |
| CN109308395A (en) | Wafer scale space measurement abnormal parameters recognition methods based on LOF-KNN algorithm | |
| CN115684869A (en) | Chip testing system and method based on power management | |
| CN110851936A (en) | Through hole welding spot reliability evaluation test method and device | |
| CN113835016B (en) | DDR chip limit performance test method, test device, equipment and storage medium | |
| CN102539986A (en) | Method for improving production efficiency of compensation type crystal oscillator | |
| CN100501424C (en) | Device and method for testing clock or signal driving load capacity | |
| CN109375121B (en) | Automatic test system and method | |
| CN107340487A (en) | A kind of method checked test system and be in actual processing ability under stable state | |
| CN106918798A (en) | Electrical energy meter fault method of testing | |
| Lu et al. | Application research of highly accelerated life test on civil aircraft airborne equipment | |
| CN103943151A (en) | Memory test method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |