CN102854446A - Method for detecting service life of LED (light emitting diode) device, detection circuit and application thereof - Google Patents
Method for detecting service life of LED (light emitting diode) device, detection circuit and application thereof Download PDFInfo
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Abstract
The invention provides a method for detecting service life of an LED (light emitting diode) device. The method comprises the following steps of: establishing a curve diagram of a luminous flux change trend of the LED device under normal work current and a curve diagram of a voltage change trend of the LED device under test current, and obtaining a linear relationship between the two curve diagrams; providing aging current for the tested LED device, and switching to the test current when the time is aging time; detecting and recording voltage values at two ends of the tested LED device; switching the test current to the aging current again, and repeatedly detecting in different time points; providing multiple current to repeatedly detect; drawing the curve diagram of the voltage change trend of the LED device according to the detected voltage values; and deducing the curve diagram of the luminous flux change trend of the tested LED device, and evaluating the service life of the tested LED device. According to the invention, the detection period is short, the labor cost is saved; the affect of human factors on the aging detection result in the detection process is reduced, and the detection accuracy is improved.
Description
Technical field
The present invention relates to the LED technical field, a kind ofly specifically adopt the method for electric parameters testing LED device lifetime and the application of testing circuit and this testing circuit.
Background technology
LED (Light Emitting Diode) is a kind of solid-state semiconductor device, can convert electrical energy into luminous energy.Have that power consumption is little, spotlight effect good, reaction velocity is fast, controllability is strong, can bear the advantages such as high impact forces, long service life, environmental protection.LED just progressively substitutes conventional light source, become the 4th generation light source.
The production of LED device and research and development, the assessment in its serviceable life are together inevitable operations in the actual production process.At present, the LED life test of carrying out in the industry, with the time meta-luminous flux be changed to the main reference index.Namely, in specific environmental test chamber, it (is LED product running current that lasting or interval passes into aging current to the LED product, be generally 20mA～1000mA), along with passage of time, the luminous flux of LED product can descend gradually, drops to the 70% corresponding time of initial value when the luminous flux of LED product, is defined as the life-span of LED product.Because the theoretical life-span of LED product is very long, complete real-time measurement can't be used aborning; Therefore, also worked out the scheme of some accelerated agings tests in the industry, such as the method for testing standard of illumination association in North America for the LED product: LM80 and TM-21, infer LED product serviceable life by 3000～6000 hours LED product light flux variations.Detection time is longer, and up to the present, the testing scheme of all LED lives of product all is can only be to detect the optical parametrics such as luminous flux or brightness as estimating foundation.
Summary of the invention
In view of the problem and blemish of prior art, a wherein purpose of the present invention is to provide a kind of LED detection method device lifetime.
Another order of the present invention is to provide a kind of LED testing circuit device lifetime
An also order of the present invention is to provide a kind of application of LED testing circuit device lifetime.
In order to achieve the above object, the present invention has adopted following technical scheme:
A kind of LED detection method device lifetime may further comprise the steps:
A, set up the LED device under running current light flux variations trend and the LED device at the curve map of the change in voltage trend of measuring current, according to this curve map draw the LED device under running current light flux variations trend and the LED device in the linear relationship of the change in voltage trend of measuring current;
B, provide an aging current to tested LED device, make tested LED device continue to light aging; When digestion time arrives, aging current is switched to measuring current; At this moment, detect and record the magnitude of voltage at tested LED device two ends, finish once aging-test period; Then, measuring current is switched to aging current again, repeat above-mentioned detection action at different time points;
C, provide the measuring current of a plurality of different current values to repeat above-mentioned b step, corresponding detection is also recorded the magnitude of voltage at tested LED device two ends;
The magnitude of voltage that d, basis detect draws tested LED device at the curve map of the change in voltage trend of measuring current;
E, according to light flux variations trend and the LED device curve map of in the linear relationship of the change in voltage trend of measuring current deriving the light flux variations trend of tested LED device of LED device under running current, a suite line chart that mates the most take change in voltage trend and light flux variations trend is as foundation, the luminous flux of corresponding time point is compared with the initial luminous flux of tested LED device, assessed out the life-span of tested LED device.
As the preferred technical solution of the present invention: light flux variations trend and the LED device of described LED device under running current is expressed as in the linear relationship of the change in voltage trend of measuring current: Φ=k
2Ln (t)+b, V=k
1Ln (t)+a; Wherein, k
2=k
1
As the preferred technical solution of the present invention: described measuring current is current density≤31A/m
2Corresponding current value.
A kind of LED testing circuit device lifetime comprises LED device aging test circuit, and described LED device aging current input terminal is the measuring current input end that is provided with in parallel also, is provided with switching between this aging current input end and this measuring current input end.
As the preferred technical solution of the present invention: the measuring current of described measuring current input end input is current density≤31A/m
2Corresponding current value
As the preferred technical solution of the present invention: the electronic switch of described switch for automaticallying switch.
Above-mentioned testing circuit is applied to the LED lighting, the current input terminal parallel connection of this LED lighting be provided with the measuring current input end, be provided with switching between the current input terminal of LED lighting and this measuring current input end.
Compared with prior art, sense cycle of the present invention is short, saves labour turnover, and reduces human factor to the impact of aging test result in testing process, increases the degree of accuracy that LED detects device lifetime.
Description of drawings
Fig. 1 for the LED device set up under running current light flux variations trend and the LED device at the curve map of the change in voltage trend of measuring current.
Fig. 2 is the test philosophy figure of LED sample in the embodiment of the invention.
Fig. 3 is the change in voltage trend curve figure that the LED sample is set up under the measuring current of 0.002mA in the embodiment of the invention and the light flux variations trend curve figure that derives.
Fig. 4 is the change in voltage trend curve figure that the LED sample is set up under the measuring current of 0.0008mA in the embodiment of the invention and the light flux variations trend curve figure that derives.
Fig. 5 is the change in voltage trend curve figure that the LED sample is set up under the measuring current of 0.0002mA in the embodiment of the invention and the light flux variations trend curve figure that derives.
Fig. 6 is for being applied to the schematic diagram of LED lighting for test circuit among the present invention.
Embodiment
See also Fig. 1, for the LED device set up under running current light flux variations trend and the LED device at the curve map of the change in voltage trend of measuring current.
Described " light flux variations trend " is that the LED device is under running current, the optical parameter of different time points test, the running current of middle low power LED device is generally 10～150mA, and the running current of high power LED device is generally 300～1500mA.
Described measuring current is " minimum electric current ", and " minimum electric current " refers to that current density is less than 31A/m under the chip size
2Corresponding current value, current density is the ratio of LED electrical current and led chip size.Be of a size of 27milx11mil(1mil=25.4um with length and width) chip calculate, described " minimum electric current " is the electric current of current value≤6 μ A.
Under running current, the optical parameter of different time points and LED device are under " minimum electric current " according to the LED device, and the voltage data of different time points is set up the curve map such as Fig. 1; In the diagram, the LED device has identical variation tendency with the LED device at the luminous flax curve under the running current at the change in voltage curve of " minimum electric current ", and under the time logarithmic coordinate, what both linear relationships were similar to respectively is expressed as: V=k
1Ln (t)+a, Φ=k
2Ln (t)+b; Wherein, V is LED device when passing into " minimum electric current ", and the magnitude of voltage at its two ends, Φ are the luminous flux of LED device under running current, k
1Slope, k for the straight line (be positioned in the diagram below straight line) of expression voltage linear
2Be the slope of the straight line (being positioned at the straight line of top in the diagram) of expression luminous flux linearity, a, b are respectively the vertical intercept of coordinate, and ln (t) is logarithmic time (corresponding testing time).In the diagram, the straight line of expression voltage linear is approximate consistent with the straight line gradient of expression luminous flux linearity, therefore, and k
1With k
2Approximately equal.
The LED device is obtained corresponding k according to the variation of logarithmic time (or testing time), magnitude of voltage after passing into " minimum electric current "
1Value; Because k
1Be approximately equal to k
2, substitution Φ=k
2Ln (t)+b, namely can estimate the luminous flux of corresponding time point, the luminous flux of corresponding time point is compared with the initial luminous flux of LED device, just can assess out the life-span (luminous flux of LED product drops to the 70% corresponding time of initial value, is defined as the life-span of LED product) of LED device.
See also Fig. 2, be the test philosophy figure of tested LED sample.
In burn in test circuit, the parallel connection of LED device aging current input terminal a measuring current input end is set, and the electronic switch K that adding can be changed automatically between aging current input end and measuring current input end, electronic switch K at first connects aging circuit, provide Iburn in(aging current, i.e. the running current of LED device) make LED continue to light aging; When digestion time arrives, electronic switch K will automatically switch to test circuit, and the Itest(measuring current is provided, i.e. minimum electric current) give LED; Wherein, Itest≤6 μ A; At this moment, detect and record the magnitude of voltage at LED two ends.So far once aging-test period finishes.Then, measuring current is switched to aging current again, repeat above-mentioned detection action at different time points.
Above-mentioned test action need be adopted the measuring current repeated test of a plurality of different current values, to set up the change in voltage trend curve figure of LED sample under each measuring current, derive the curve map of light flux variations trend, thereby find out the suite line chart that change in voltage trend and light flux variations trend are mated the most.
See also following tabulation, be the corresponding different I test(measuring current of this LED sample (length and width are of a size of 27milx11mil)), the VF(forward voltage of different test durations) value:
Draw tested LED device at the curve map of the change in voltage trend of measuring current according to the magnitude of voltage that detects.
Then, according to the LED device under running current light flux variations trend and the LED device at the linear relationship (V=k of the change in voltage trend of measuring current
1Ln (t)+a, Φ=k
2Ln (t)+b; k
1=k
2) derive the curve map of the light flux variations trend of tested LED device, a suite line chart that mates the most take change in voltage trend and light flux variations trend is as foundation, the luminous flux of corresponding time point is compared with the initial luminous flux of tested LED device, assessed out the life-span of tested LED device.
Wherein, measuring current is 0.006mA when above, and the curve map of the curve map of change in voltage trend and light flux variations trend coupling is not obvious.
See also Fig. 3 to Fig. 5, be respectively the change in voltage trend curve figure that specimen sets up and the light flux variations trend curve figure that derives under the measuring current of 0.002mA, 0.0008mA, 0.0002mA.Point in oval among Fig. 3 to Fig. 5 is not match point, and when measuring current is 0.0008mA, the curve map of the curve map of change in voltage trend and light flux variations trend does not only have coupling, other point all meet LED device that Fig. 1 expresses under running current light flux variations trend and the LED device in the linear relationship of the change in voltage trend of measuring current.
The luminous flux parameter testing list of sample:
Above-mentioned data are luminous flux data that specimen adopts the classic method test, compare with the luminous flux data among Fig. 5, and both conform at the luminous flux data of test.
See also Fig. 6, it is very important that the LED lighting is kept stable light output, at the current input terminal of a LED lighting measuring current input end in parallel, switches by Automatic Electronic Switch K between current input terminal and this measuring current input end; When the LED lighting is worked, regularly add the Itest(measuring current, Itest≤6 μ A wherein) test out magnitude of voltage corresponding to different time points, draw the change in voltage trend curve, by the relation of voltage and luminous flux, infer the optical attenuation degree again, then regulate Iop(point light current), make luminous flux maintain a definite value, thereby make the light output of LED lighting relatively stable.
The above is preferred embodiment of the present invention only, is not to limit practical range of the present invention; Every equivalence of doing according to the present invention changes and revises, and is all covered by the scope of claims of the present invention.
Claims (7)
1. LED detection method device lifetime is characterized in that, may further comprise the steps:
A, set up the LED device under running current light flux variations trend and the LED device at the curve map of the change in voltage trend of measuring current, according to this curve map draw the LED device under running current light flux variations trend and the LED device in the linear relationship of the change in voltage trend of measuring current;
B, provide an aging current to tested LED device, make tested LED device continue to light aging; When digestion time arrives, aging current is switched to measuring current; At this moment, detect and record the magnitude of voltage at tested LED device two ends, finish once aging-test period; Then, measuring current is switched to aging current again, repeat above-mentioned detection action at different time points;
C, provide the measuring current of a plurality of different current values to repeat above-mentioned b step, corresponding detection is also recorded the magnitude of voltage at tested LED device two ends;
The magnitude of voltage that d, basis detect draws tested LED device at the curve map of the change in voltage trend of measuring current;
E, according to light flux variations trend and the LED device curve map of in the linear relationship of the change in voltage trend of measuring current deriving the light flux variations trend of tested LED device of LED device under running current, a suite line chart that mates the most take change in voltage trend and light flux variations trend is as foundation, the luminous flux of corresponding time point is compared with the initial luminous flux of tested LED device, assessed out the life-span of tested LED device.
2. LED detection method device lifetime according to claim 1, it is characterized in that: light flux variations trend and the LED device of described LED device under running current is expressed as in the linear relationship of the change in voltage trend of measuring current: Φ=k
2Ln (t)+b, V=k
1Ln (t)+a; Wherein, k
2=k
1
3. LED detection method device lifetime according to claim 1, it is characterized in that: described measuring current is current density≤31A/m
2Corresponding current value.
4. LED testing circuit device lifetime, comprise LED device aging test circuit, it is characterized in that: described LED device aging current input terminal is the measuring current input end that is provided with in parallel also, is provided with switching between this aging current input end and this measuring current input end.
5. LED testing circuit device lifetime according to claim 4 is characterized in that: the measuring current of described measuring current input end input is current density≤31A/m
2Corresponding current value
6. LED testing circuit device lifetime according to claim 4 is characterized in that: the electronic switch of described switch for automaticallying switch.
7. each described LED testing circuit device lifetime according to claim 4-6, it is characterized in that: described testing circuit is applied to the LED lighting, the current input terminal parallel connection of this LED lighting be provided with the measuring current input end, be provided with switching between the current input terminal of LED lighting and this measuring current input end.
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103942605A (en) * | 2013-12-23 | 2014-07-23 | 上海大郡动力控制技术有限公司 | Optimization method suitable for automobile electronic component aging temperature and time |
| CN105004981A (en) * | 2015-07-30 | 2015-10-28 | 电子科技大学中山学院 | LED chip service life accelerated estimation method |
| CN105137369A (en) * | 2015-10-14 | 2015-12-09 | 上海斐讯数据通信技术有限公司 | LED string lamp operation state monitoring method and system |
| CN107544037A (en) * | 2016-06-28 | 2018-01-05 | 广州固佳灯具科技有限公司 | A kind of LED lamp light decay fast calculates mode |
| CN106061076B (en) * | 2015-04-17 | 2018-07-06 | 西特科照明有限公司 | For determining the method, apparatus and LED module of the service life information of LED module |
| CN109946581A (en) * | 2019-04-14 | 2019-06-28 | 苏州科技大学 | A kind of LED test automatic control system |
| CN112114271A (en) * | 2020-08-24 | 2020-12-22 | 厦门多彩光电子科技有限公司 | Method for evaluating quality of LED chip |
| CN114333708A (en) * | 2021-11-30 | 2022-04-12 | 北京德为智慧科技有限公司 | Display brightness obtaining method, automatic adjusting method and related equipment |
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| CN104391237B (en) * | 2014-11-26 | 2017-04-12 | 电子科技大学中山学院 | LED (light-emitting diode) chip life quick estimation method |
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Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103942605A (en) * | 2013-12-23 | 2014-07-23 | 上海大郡动力控制技术有限公司 | Optimization method suitable for automobile electronic component aging temperature and time |
| CN106061076B (en) * | 2015-04-17 | 2018-07-06 | 西特科照明有限公司 | For determining the method, apparatus and LED module of the service life information of LED module |
| CN105004981A (en) * | 2015-07-30 | 2015-10-28 | 电子科技大学中山学院 | LED chip service life accelerated estimation method |
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| CN105137369A (en) * | 2015-10-14 | 2015-12-09 | 上海斐讯数据通信技术有限公司 | LED string lamp operation state monitoring method and system |
| CN107544037A (en) * | 2016-06-28 | 2018-01-05 | 广州固佳灯具科技有限公司 | A kind of LED lamp light decay fast calculates mode |
| CN109946581A (en) * | 2019-04-14 | 2019-06-28 | 苏州科技大学 | A kind of LED test automatic control system |
| CN112114271A (en) * | 2020-08-24 | 2020-12-22 | 厦门多彩光电子科技有限公司 | Method for evaluating quality of LED chip |
| CN114333708A (en) * | 2021-11-30 | 2022-04-12 | 北京德为智慧科技有限公司 | Display brightness obtaining method, automatic adjusting method and related equipment |
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