CN103926052A - Laser service life testing system - Google Patents
Laser service life testing system Download PDFInfo
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- CN103926052A CN103926052A CN201410180968.7A CN201410180968A CN103926052A CN 103926052 A CN103926052 A CN 103926052A CN 201410180968 A CN201410180968 A CN 201410180968A CN 103926052 A CN103926052 A CN 103926052A
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Abstract
The invention discloses a laser service life testing system which comprises a driving power source, a sample table, temperature control subsystems, temperature protection alarm subsystems, parameter testing subsystems and computer control subsystems. The sample table is provided with a plurality of laser clamps which are arranged on the temperature control subsystems, and the driving power source is electrically connected with the laser clamps and the temperature protection alarm subsystems. The temperature control subsystems, the temperature protection alarm subsystems and the parameter testing subsystems are respectively and electrically connected with the computer control subsystems. The temperature control subsystems are matched with the temperature protection alarm subsystems. The parameter testing subsystems are used for monitoring lasers installed in the laser clamps. According to the laser service life testing system, the evaluation precision can be improved, and safety accidents caused when the temperature of the lasers is excessively high during testing can be avoided.
Description
Technical field
The present invention relates to a kind of laser life-span pilot system.
Background technology
Experience the development of more than 40 year, semiconductor laser has become a member very important in optoelectronic device extended familys, by its extend Semiconductor Photonics growing up, the mainstay that integrated optoelectronics has become Information technology, and promoting fast development important front edge applications such as optical communication, optical information processing, light interconnection, photometry calculation.
The fast development of semiconductor laser and related industry thereof, promote the progress of reliability of semiconductor laser research, in order to ensure the engineering application of semiconductor laser, the many research institutions of recent domestic have carried out the life assessment technical research for high power semiconductor lasers.Be intended to obtain on the one hand degradation model and the Lifetime Distribution Model of high power semiconductor lasers, set up durability test and the evaluation method of high power semiconductor lasers; Carry out development work around carrier-durability test instrument of carrying out high power semiconductor lasers durability test on the other hand, emerged a collection of domestic and international research institutions such as ILX lightwave company, the LaRc of NASA (NASA) research centre, Nanofoot company, China University of Geosciences, Shandong Technology Univ, and existing commercial semiconductor laser durability test instrument comes out.
For high-power semiconductor laser, in long-term life-test process, existing durability test instrument adopts the mode of micro-channel heat sink water-cooled to carry out temperature control to test device conventionally, micro-channel heat sink adopts oxygen-free copper material more, in test of long duration process, exist microchannel corrosion to cause refrigerating efficiency to decline and cause the phenomenon of test device excess Temperature, can affect on the one hand the accuracy of the statistic analysis result of last durability test; Also can cause on the other hand device to burn because of overheated.
Summary of the invention
Based on this, the invention reside in the defect that overcomes prior art, a kind of laser life-span pilot system is provided, and this laser life-span pilot system can improve evaluation precision, and can avoid the laser device in test to cause security incident to occur because of temperature overheating.
Its technical scheme is as follows:
A kind of laser life-span pilot system, comprise driving power, sample stage, temperature control subsystem, temperature protection warning subsystem, parameter testing subsystem and computer control subsystem, described sample stage has multiple laser instrument fixtures, the plurality of laser instrument fixture is arranged in described temperature control subsystem, described driving power is electrically connected with described laser instrument fixture and temperature protection warning subsystem respectively, described temperature control subsystem, temperature protection warning subsystem and parameter testing subsystem are electrically connected with described computer control subsystem respectively, and described temperature control subsystem matches with described temperature protection warning subsystem, described parameter testing subsystem is for monitoring the laser instrument that is loaded into each laser instrument fixture.
Above-mentioned laser life-span pilot system is mainly applicable to the durability test of single tube high power semiconductor lasers.When use, each laser instrument is loaded into respectively in corresponding laser instrument fixture, each laser instrument is electrically connected in series, then tested for each laser instrument provides drive current by laser instrument fixture by driving power.In process of the test: temperature control subsystem, on the one hand for durability test provides stable external environment condition, reduces the impact of variation of ambient temperature on test evaluation result, on the other hand for the working temperature of Control experiment laser instrument; Parameter testing subsystem is for monitoring sensitive parameter-output power information over time of laser instrument, and this change information is transferred to computer control subsystem carries out record; Temperature protection warning subsystem can be under the cooperation of computer control subsystem Real-Time Monitoring and judge pilot system in every working temperature of testing laser instrument; in the time finding that the temperature of certain laser instrument exceedes setting value; can automatically cut off driving power and send alerting signal; thereby can find in time the abnormal device of temperature overheating, avoid the generation of the accidents such as test device burns.Wherein, driving power, temperature control subsystem, parameter testing subsystem can be laser life-span evaluation with coordinating of computer control subsystem, the tests such as burn-in screen provide basic equipment guarantee, and driving power, cooperation between temperature protection warning subsystem and computer control subsystem, make carrying out in batch ticket tube device durability test process, can guarantee the homogeneity of temperature between test device, improve evaluation precision, simultaneously also can be to there is thermal anomaly device enforcement protection in process of the test and reporting to the police, avoid that device is overheated to be burnt or the generation of the accident such as fire.
In an embodiment, described sample stage is the platform that multiple described laser instrument fixture combinations form therein.Thereby this sample stage can provide carrier for the above-mentioned laser instrument of testing, and can realize being electrically connected in series of Laser Devices that needs test.
Therein in an embodiment; described temperature control subsystem comprises multiple water-cooling channels; described temperature protection warning subsystem comprises temperature overheating warning device and multiple temperature sensor; described laser instrument fixture is arranged on corresponding water-cooling channel; described temperature sensor is arranged between laser instrument fixture and water-cooling channel, and this temperature sensor and described driving power respectively with described temperature overheating warning device electrical connection.Thereby temperature control subsystem can be carried out by water-cooling channel the working temperature of Control experiment laser instrument; The working temperature of every test laser instrument during temperature protection warning subsystem can be carried out Real-Time Monitoring and be judged pilot system by temperature sensor under the cooperation of computer control subsystem.
In an embodiment, between two adjacent water-cooling channels, connect by heat conductive isolation sheet therein, make series connection between each water-cooling channel form loop.Thereby each water-cooling channel can work alone, for the laser instrument being placed in above it provides guarantee and the control in temperature.
In an embodiment, the quantity of described laser instrument fixture, water-cooling channel and temperature sensor is consistent therein.Thereby each water-cooling channel can carry out the control in temperature to corresponding laser instrument separately, temperature alarming protected subsystem can be by the working temperature of every test laser instrument of temperature sensor monitors.
In an embodiment, described temperature control subsystem comprises recirculated water cooling machine therein, this recirculated water cooling machine and the electrical connection of described computer control subsystem, and be connected with described water-cooling channel.Thereby what water-cooling channel can be by recirculated water cooling machine is used for realizing temperature control.
In an embodiment, described temperature control subsystem also comprises environment temperature control box therein, this environment temperature control box and the electrical connection of described computer control subsystem.This environment temperature control box is mainly used in controlling the external environment temperature of above-mentioned durability test.
In an embodiment, described temperature protection warning subsystem also comprises flow sensor therein, and this flow sensor is arranged between recirculated water cooling machine and water-cooling channel, and realizes electrical connection between flow sensor and described temperature overheating warning device.Thereby, can detect the discharge in water-cooling channel by flow sensor, and then can make water-cooling channel realize temperature control by controlling flow.
In an embodiment, described parameter testing subsystem comprises proving installation and drive unit therein, and proving installation is arranged on described drive unit, and proving installation and drive unit respectively with described computer control subsystem electrical connection.Thereby proving installation can be under the driving of drive unit, to the laser instrument on each station in other words every test laser instrument carry out sensitive parameter-output power over time information monitor, and this change information is passed to computer recording.
Therein in an embodiment, described proving installation comprises photodetector and integrating sphere, and described drive unit is stepper motor, and integrating sphere is arranged on this stepper motor, photodetector is arranged on integrating sphere, and photodetector and described computer control subsystem realization electrical connection.Thereby, integrating sphere and corresponding photodetector can carry out cycle detection to the laser device on station under the drive of stepper motor, and photodetector and corresponding sensing circuit can be converted to above-mentioned change information output power value and send computer control subsystem to and carry out record.Compared with the mode of the corresponding laser device of integrating sphere in existing proving installation, the present invention is owing to having adopted above-mentioned drive unit, therefore only need to use an integrating sphere, this is conducive to reduce the complexity of system, and is conducive to improve the reliability of test.
Beneficial effect of the present invention is:
(1) laser life-span pilot system of the present invention can improve evaluation precision, and can avoid the laser device in test to cause security incident to occur because of temperature overheating.
(2) laser life-span pilot system of the present invention can provide equipment guarantee for the life assessment of single-tube laser, burn-in screen, is conducive to ensure the engineering application of laser instrument.
(3) laser life-span test system architecture of the present invention is relatively simple, and testing reliability is high.
Brief description of the drawings
Fig. 1 is the piece electrical structural representation of the laser life-span pilot system described in the embodiment of the present invention.
Fig. 2 is the electrical structure schematic diagram between temperature protection warning subsystem and the temperature control subsystem described in the embodiment of the present invention.
Description of reference numerals:
10, driving power; 20, sample stage, 21, laser instrument fixture, 30, temperature control subsystem; 31, recirculated water cooling machine; 32, water-cooling channel, 40, temperature protection warning subsystem, 41, temperature overheating warning device; 42, flow sensor; 43, temperature sensor, 50, parameter testing subsystem, 60, computer control subsystem.
Embodiment
Below embodiments of the invention are elaborated:
As depicted in figs. 1 and 2, a kind of laser life-span pilot system, comprise driving power 10, sample stage 20, temperature control subsystem 30, temperature protection warning subsystem 40, parameter testing subsystem 50 and computer control subsystem 60, described sample stage 20 has multiple laser instrument fixtures 21, the plurality of laser instrument fixture 21 is arranged in described temperature control subsystem 30, described driving power 10 is electrically connected with described laser instrument fixture 21 and temperature protection warning subsystem 40 respectively, described temperature control subsystem 30, temperature protection warning subsystem 40 and parameter testing subsystem 50 are electrically connected with described computer control subsystem 60 respectively, and described temperature control subsystem 30 matches with described temperature protection warning subsystem 40, described parameter testing subsystem 50 is for monitoring the laser instrument that is loaded into each laser instrument fixture 21.
Wherein, above-mentioned driving power 10 comprises 2 cover continuous current sources, can be used for driving 60 station single-tube lasers, and the drive current of every cover current source is 0-64A, self-adaptation in voltage 100V, and current source can be controlled by above-mentioned computer control subsystem 60.The platform that above-mentioned sample stage 20 is combined to form for multiple copper C-M0unt or F-M0unt encapsulation single-tube laser fixture 21, and laser instrument fixture 21 on this sample stage can carry out dismounting and change.
Above-mentioned temperature control subsystem 30 comprises recirculated water cooling machine 31, environment temperature control box and multiple water-cooling channel 32, between two adjacent water-cooling channels 32, connects by heat conductive isolation sheet, makes each water-cooling channel 32 series connection form loop; 40 of temperature protection warning subsystems comprise temperature overheating warning device 41, flow sensor 42 and multiple temperature sensor 43; Above-mentioned laser instrument fixture 21 is arranged on corresponding water-cooling channel 32,43 of temperature sensors are arranged between laser instrument fixture 21 and water-cooling channel 32, and this temperature sensor 43 and described driving power 10 are electrically connected with temperature overheating warning device 41 respectively, and laser instrument fixture 21, water-cooling channel 32 are consistent with the quantity of temperature sensor 43; Recirculated water cooling machine 31 and environment temperature control box are electrically connected with described computer control subsystem 60 respectively, and recirculated water cooling machine 31 is connected with water-cooling channel 32; 42 of flow sensors are arranged between recirculated water cooling machine 31 and water-cooling channel 32, and this flow sensor 42 also and between described temperature overheating warning device 41 is realized and being electrically connected.
Above-mentioned parameter testing subsystem 50 comprises proving installation and drive unit, and proving installation is arranged on described drive unit, and proving installation and drive unit are electrically connected with described computer control subsystem 60 respectively.This drive unit can be stepper motor; Proving installation is mainly used in sensitive parameter-output power information over time of monitoring test laser instrument, this proving installation comprises photodetector, integrating sphere and sensing circuit, integrating sphere is arranged on stepper motor, photodetector is arranged on this integrating sphere, and this photodetector and described computer control subsystem 60 are realized electrical connection.
Advantage or the principle of the present embodiment are specific as follows:
1, above-mentioned laser life-span pilot system is mainly applicable to the durability test of single tube high power semiconductor lasers.When use, each laser instrument is loaded into respectively in corresponding laser instrument fixture 21, and each laser instrument is electrically connected in series, then tested for each laser instrument provides drive current by laser instrument fixture 21 by driving power 10; In process of the test: temperature control subsystem 30, on the one hand for durability test provides stable external environment condition, reduces the impact of variation of ambient temperature on test evaluation result, carrys out on the other hand the working temperature of Control experiment laser instrument by cooling device; Parameter testing subsystem 50 is for monitoring sensitive parameter-output power information over time of laser instrument, and this change information is transferred to computer control subsystem 60 carries out record; The working temperature of every test laser instrument during temperature protection warning subsystem 40 can be carried out Real-Time Monitoring and be judged pilot system by temperature sensor 43 under the cooperation of computer control subsystem 60; in the time finding that the temperature of certain laser instrument exceedes setting value; can automatically cut off driving power 10 and send alerting signal; thereby can find in time the abnormal device of temperature overheating, avoid the generation of the security incidents such as test device burns.Wherein, coordinating of driving power 10, temperature control subsystem 30, parameter testing subsystem 50 and computer control subsystem 60 can be for the tests such as laser life-span evaluation, burn-in screen provide basic equipment guarantee, thereby be conducive to ensure the engineering application of laser instrument; And cooperation between driving power 10, temperature protection warning subsystem 40 and computer control subsystem 60; make carrying out in batch ticket tube device durability test process; the homogeneity of temperature between can guaranteeing between test device; improve evaluation precision; simultaneously also can be to occurring in process of the test that thermal anomaly device implemented protection and report to the police, avoid that device is overheated to be burnt or the generation of the security incident such as fire.
2, above-mentioned sample stage 20 can provide carrier for the above-mentioned laser instrument of testing, and can realize being electrically connected in series of the Laser Devices tested.
3, between two adjacent water-cooling channels 32, connect by heat conductive isolation sheet, make series connection between each water-cooling channel 32 form loop.Thereby each water-cooling channel 32 can work alone, for the laser instrument being placed in above it provides guarantee and the control in temperature.
4, laser instrument fixture 21, water-cooling channel 32 are consistent with the quantity of temperature sensor 43.Thereby each water-cooling channel 32 can carry out the control in temperature to corresponding laser instrument separately, temperature alarming protected subsystem can be monitored by temperature sensor 43 working temperature of every test laser instrument.
5, recirculated water cooling machine 31 is electrically connected with computer control subsystem 60, and is connected with water-cooling channel 32.Thereby what water-cooling channel 32 can be by recirculated water cooling machine 31 is used for realizing temperature control.
6, environment temperature control box and computer control subsystem 60 are electrically connected.This environment temperature control box is mainly used in controlling the external environment temperature of above-mentioned durability test.
7, flow sensor 42 is arranged between recirculated water cooling machine 31 and water-cooling channel 32, and realizes electrical connection between flow sensor 42 and described temperature overheating warning device 41.Thereby, can detect the discharge in water-cooling channel 32 by flow sensor 42, and then can make water-cooling channel 32 realize temperature control by controlling flow.
8, proving installation is arranged on described drive unit, and proving installation and drive unit are electrically connected with described computer control subsystem 60 respectively.Thereby proving installation can be under the driving of drive unit, to the laser instrument on each station in other words every test laser instrument carry out sensitive parameter-output power over time information monitor, and this change information is passed to computer recording.
9, proving installation comprises photodetector and integrating sphere, and integrating sphere is arranged on stepper motor, and photodetector is arranged on this integrating sphere, and this photodetector is realized and being electrically connected with computer control subsystem 60.Thereby, integrating sphere and corresponding photodetector can carry out cycle detection to the laser device on station under the drive of stepper motor, and photodetector and corresponding sensing circuit can be converted to above-mentioned change information output power value and send computer control subsystem 60 to and carry out record; Compared with the mode of the corresponding laser device of integrating sphere in existing proving installation, the present embodiment is owing to having adopted above-mentioned drive unit, therefore only need to use an integrating sphere, this is conducive to reduce the complexity of system, and is conducive to improve the reliability of test.
The above embodiment has only expressed the specific embodiment of the present invention, and it describes comparatively concrete and detailed, but can not therefore be interpreted as the restriction to the scope of the claims of the present invention.It should be pointed out that for the person of ordinary skill of the art, without departing from the inventive concept of the premise, can also make some distortion and improvement, these all belong to protection scope of the present invention.
Claims (10)
1. a laser life-span pilot system, it is characterized in that, comprise driving power, sample stage, temperature control subsystem, temperature protection warning subsystem, parameter testing subsystem and computer control subsystem, described sample stage has multiple laser instrument fixtures, the plurality of laser instrument fixture is arranged in described temperature control subsystem, described driving power is electrically connected with described laser instrument fixture and temperature protection warning subsystem respectively, described temperature control subsystem, temperature protection warning subsystem and parameter testing subsystem are electrically connected with described computer control subsystem respectively, and described temperature control subsystem matches with described temperature protection warning subsystem, described parameter testing subsystem is for monitoring the laser instrument that is loaded into each laser instrument fixture.
2. laser life-span pilot system according to claim 1, is characterized in that, described sample stage is the platform that multiple described laser instrument fixture combinations form.
3. laser life-span pilot system according to claim 1; it is characterized in that; described temperature control subsystem comprises multiple water-cooling channels; described temperature protection warning subsystem comprises temperature overheating warning device and multiple temperature sensor; described laser instrument fixture is arranged on corresponding water-cooling channel; described temperature sensor is arranged between laser instrument fixture and water-cooling channel, and this temperature sensor and described driving power respectively with described temperature overheating warning device electrical connection.
4. laser life-span pilot system according to claim 3, is characterized in that, between two adjacent water-cooling channels, connects by heat conductive isolation sheet, makes each water-cooling channel series connection form loop.
5. laser life-span pilot system according to claim 3, is characterized in that, the quantity of described laser instrument fixture, water-cooling channel and temperature sensor is consistent.
6. laser life-span pilot system according to claim 3, is characterized in that, described temperature control subsystem comprises recirculated water cooling machine, this recirculated water cooling machine and the electrical connection of described computer control subsystem, and be connected with described water-cooling channel.
7. laser life-span pilot system according to claim 6; it is characterized in that; described temperature protection warning subsystem also comprises flow sensor; this flow sensor is arranged between recirculated water cooling machine and water-cooling channel, and realizes electrical connection between flow sensor and described temperature overheating warning device.
8. according to the laser life-span pilot system described in claim 1 to 7 any one, it is characterized in that, described temperature control subsystem also comprises environment temperature control box, this environment temperature control box and the electrical connection of described computer control subsystem.
9. according to the laser life-span pilot system described in claim 1 to 7 any one, it is characterized in that, described parameter testing subsystem comprises proving installation and drive unit, proving installation is arranged on described drive unit, and proving installation and drive unit respectively with described computer control subsystem electrical connection.
10. laser life-span pilot system according to claim 9, it is characterized in that, described proving installation comprises photodetector and integrating sphere, described drive unit is stepper motor, integrating sphere is arranged on this stepper motor, photodetector is arranged on integrating sphere, and photodetector and described computer control subsystem realization electrical connection.
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| CN201410180968.7A CN103926052A (en) | 2014-04-30 | 2014-04-30 | Laser service life testing system |
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104483100A (en) * | 2014-12-22 | 2015-04-01 | 工业和信息化部电子第五研究所 | Embedded overall control system for laser service life test instrument |
| CN105651489A (en) * | 2016-03-01 | 2016-06-08 | 工业和信息化部电子第五研究所 | Laser-device life testing system |
| CN106597263A (en) * | 2017-01-20 | 2017-04-26 | 深圳清华大学研究院 | Test system of semiconductor laser chip |
| CN106597264A (en) * | 2017-01-20 | 2017-04-26 | 深圳清华大学研究院 | Testing system for semiconductor laser chip |
| CN108106873A (en) * | 2017-12-14 | 2018-06-01 | 中国电子产品可靠性与环境试验研究所 | The method and system of servo-drive system reliability test evaluation |
| CN111044872A (en) * | 2019-12-12 | 2020-04-21 | 苏州长光华芯光电技术有限公司 | Semiconductor laser device testing device |
| CN111089438A (en) * | 2020-03-24 | 2020-05-01 | 常州纵慧芯光半导体科技有限公司 | Semiconductor laser test fixture |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0436630A (en) * | 1990-05-31 | 1992-02-06 | Hitachi Ltd | Life testing device |
| CN102062675A (en) * | 2010-12-16 | 2011-05-18 | 西安炬光科技有限公司 | Device for testing life of semiconductor laser |
| CN102520336A (en) * | 2011-12-20 | 2012-06-27 | 西安炬光科技有限公司 | Protection system for aging and life test of semiconductor laser |
| CN102519709A (en) * | 2011-12-20 | 2012-06-27 | 西安炬光科技有限公司 | Semiconductor laser ageing/service life test real-time monitoring method and system |
| CN102590723A (en) * | 2011-09-05 | 2012-07-18 | 工业和信息化部电子第五研究所 | Service life test online monitoring system for kilowatt large-power laser diode array |
| CN103245486A (en) * | 2013-04-26 | 2013-08-14 | 中国科学院苏州生物医学工程技术研究所 | Aging and life testing system for QCW semiconductor laser |
| CN103698106A (en) * | 2014-01-07 | 2014-04-02 | 工业和信息化部电子第五研究所 | Detection system for semiconductor laser |
| CN103712776A (en) * | 2014-01-03 | 2014-04-09 | 工业和信息化部电子第五研究所 | Fixing clamp for laser service life testing |
-
2014
- 2014-04-30 CN CN201410180968.7A patent/CN103926052A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0436630A (en) * | 1990-05-31 | 1992-02-06 | Hitachi Ltd | Life testing device |
| CN102062675A (en) * | 2010-12-16 | 2011-05-18 | 西安炬光科技有限公司 | Device for testing life of semiconductor laser |
| CN102590723A (en) * | 2011-09-05 | 2012-07-18 | 工业和信息化部电子第五研究所 | Service life test online monitoring system for kilowatt large-power laser diode array |
| CN102520336A (en) * | 2011-12-20 | 2012-06-27 | 西安炬光科技有限公司 | Protection system for aging and life test of semiconductor laser |
| CN102519709A (en) * | 2011-12-20 | 2012-06-27 | 西安炬光科技有限公司 | Semiconductor laser ageing/service life test real-time monitoring method and system |
| CN103245486A (en) * | 2013-04-26 | 2013-08-14 | 中国科学院苏州生物医学工程技术研究所 | Aging and life testing system for QCW semiconductor laser |
| CN103712776A (en) * | 2014-01-03 | 2014-04-09 | 工业和信息化部电子第五研究所 | Fixing clamp for laser service life testing |
| CN103698106A (en) * | 2014-01-07 | 2014-04-02 | 工业和信息化部电子第五研究所 | Detection system for semiconductor laser |
Non-Patent Citations (1)
| Title |
|---|
| 雷志锋等: "高功率半导体激光器的可靠性与寿命评价", 《应用光学》, vol. 29, no. 1, 31 January 2008 (2008-01-31) * |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104483100A (en) * | 2014-12-22 | 2015-04-01 | 工业和信息化部电子第五研究所 | Embedded overall control system for laser service life test instrument |
| CN105651489A (en) * | 2016-03-01 | 2016-06-08 | 工业和信息化部电子第五研究所 | Laser-device life testing system |
| CN106597263A (en) * | 2017-01-20 | 2017-04-26 | 深圳清华大学研究院 | Test system of semiconductor laser chip |
| CN106597264A (en) * | 2017-01-20 | 2017-04-26 | 深圳清华大学研究院 | Testing system for semiconductor laser chip |
| CN108106873A (en) * | 2017-12-14 | 2018-06-01 | 中国电子产品可靠性与环境试验研究所 | The method and system of servo-drive system reliability test evaluation |
| CN108106873B (en) * | 2017-12-14 | 2020-01-31 | 中国电子产品可靠性与环境试验研究所 | Method and system for evaluating reliability test of servo system |
| CN111044872A (en) * | 2019-12-12 | 2020-04-21 | 苏州长光华芯光电技术有限公司 | Semiconductor laser device testing device |
| CN111089438A (en) * | 2020-03-24 | 2020-05-01 | 常州纵慧芯光半导体科技有限公司 | Semiconductor laser test fixture |
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