CN102519709A - Semiconductor laser ageing/service life test real-time monitoring method and system - Google Patents
Semiconductor laser ageing/service life test real-time monitoring method and system Download PDFInfo
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- CN102519709A CN102519709A CN2011104546730A CN201110454673A CN102519709A CN 102519709 A CN102519709 A CN 102519709A CN 2011104546730 A CN2011104546730 A CN 2011104546730A CN 201110454673 A CN201110454673 A CN 201110454673A CN 102519709 A CN102519709 A CN 102519709A
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Abstract
The invention provides a semiconductor laser ageing/service life test real-time monitoring method and a semiconductor laser ageing/service life test real-time monitoring system. In the ageing/service life test process on a batch of semiconductor lasers, a light receiver is used for respectively receiving and guiding out light emitted out by each semiconductor lasers in set positions, a photoelectric detector is used for testing the power or the light intensity of the guided-out light, and if the power or the light intensity is abnormal in the guided-out light, the abnormity generation of the batch of semiconductor lasers in the service life aging test process is determined. The method and the system have the advantages that the whole-process monitoring of the semiconductor lasers in the whole aging service life test process can be realized, and the power or the light intensity of the tested lasers is monitored in real time.
Description
Technical field
The invention belongs to the semiconductor laser technical field of measurement and test, especially a kind of semiconductor laser life test method of real-time and system.
Background technology
High power semiconductor lasers is used widely in many fields such as communication, military affairs, medical treatment.Its reliability is more and more paid attention to by people as the important indicator of weighing the laser instrument product.This mainly due to:
(1), can judge the inefficacy mechanism of semiconductor laser accurately through the reliability consideration of semiconductor laser.
(2) the real work life time of measuring semiconductor laser instrument.
(3) the aging research for semiconductor laser provides foundation.
(4) for improving the reliability that designs and technology improve semiconductor laser.
Yet; Because the life test of high-power semiconductor laser often need be under the laser works state; Timing and the long-term multiple laser performance parameter of measurement not only need testing apparatus to have advantages of higher stability and repeatability, and need lot of data statistics and analysis.For many years, how tame unit does a lot of work in the semiconductor laser life test both at home and abroad.Wherein, the LRS-9420/LRS9422 type laser device reliability test macro of American I LX Light wave company Development and Production in 2003.The Range of measuring temp of this system is that 40 ℃ of-150 ℃ of temperature control accuracy are 0.5 ℃ of scholar for 1 ℃ of temperature stability of scholar; Maximum drive current 500mA; The laser wavelength scope of surveying is 600nm to 1800nm, and constant working current (ACC, constant optical power (APC), luminous power--electric current--voltage parameter test (LIV) three kinds of test patterns can be provided.The means of the life test of domestic laser instrument product and method also are in theoretical research stage especially.Utilize electric derivative method of testing like propositions such as Lee of Jilin University red rocks.Utilize electric derivative (V～I concerns the product of first order derivative and electric current I) can be used for studying the semiconductor laser structure parameter attribute, a voltage saturation characteristic etc., and according to life-span of these parameter prediction Laser Devices.
Yet existing laser life-span test macro is generally lower to the measured power scope of laser instrument, and great majority use still needs regularly manual measurement or theoretical derivation.The accuracy that this mode is difficult to guarantee to test is with stable, and when especially testing to powerful laser instrument, its data are difficult to reflect course of work true lifetime of laser instrument.
Summary of the invention
The present invention provides a kind of semiconductor laser ageing/life test method of real-time and system; To solve the technical matters that background technology exists; The whole aging life-span test process that makes it possible to noise spectra of semiconductor lasers carries out complete monitoring, monitors the power or the light intensity of measured laser device in real time.
Technical scheme of the present invention is following:
A kind of method of real-time of semiconductor laser ageing/life test; A collection of semiconductor laser is being worn out/process of life test in; Receive light and the derivation that each semiconductor laser sends, the power or the light intensity of testing the light of these derivation with photodetector respectively with optical receiver respectively at desired location; If in the light of these derivation, emergent power or light intensity are unusual, judge that then this batch semiconductor laser occurs in the life-span burn-in test unusually; Said desired location is for making the determined position that is in equal proportions of received luminous power of each semiconductor laser or light intensity.
Above-mentioned desired location is the fixed position that corresponds respectively to each semiconductor laser light-emitting zone, corresponding to the center of each semiconductor laser light-emitting zone.
Above-mentioned optical receiver preferably adopts optical patchcord or photoconductive tube.
Above-mentioned optical receiver number is identical with the semiconductor laser number, all is fixed in said desired location separately;
Perhaps above-mentioned optical receiver is an optical patchcord or photoconductive tube, is installed on the moving guide rail; Optical receiver moves on guide rail, receives light and the derivation that corresponding semiconductor laser sends at each desired location successively.
A kind of real-time monitoring system of semiconductor laser ageing/life test; Comprise optical receiver, extinction plate, photodetector and a plurality of semiconductor lasers to be measured; The extinction plate is positioned at the rear that optical receiver receives end face, and the light that optical receiver will receive exports to and is positioned on the outside said photodetector of extinction plate; Its special character is: the optical receiver number is identical with the semiconductor laser number, all is fixedly set on the extinction plate, corresponds respectively to the luminous center of each semiconductor laser, is used for the part that the collection semiconductor laser instrument sends light.
Best optical patchcord of above-mentioned optical receiver or photoconductive tube.
The output terminal proper alignment of above-mentioned optical receiver is fixed; Photodetector is arranged on the guide rail, photodetector; On this guide rail, be set with detecting location corresponding to the output terminal of each optical receiver.
The real-time monitoring system of another kind of semiconductor laser ageing/life test; Comprise optical receiver, extinction plate, photodetector and a plurality of semiconductor lasers to be measured; The extinction plate is positioned at the rear that optical receiver receives end face, and the light that optical receiver will receive exports to and is positioned at the outside said photodetector of extinction plate; Its special character is: inboard at light extinction plate, be provided with a guide rail, and optical receiver is installed on and makes the optical receiver can be along guide rail movement on this guide rail; On this guide rail, be set with photodetector, be used to survey the part that each semiconductor laser sends the same ratio of light.Prior art uses optical receiver just as the light dustbin.
Above-mentioned optical receiver is preferably optical patchcord or photoconductive tube.If common optical receiver can be provided with fixed support, to be easily installed on the guide rail.
The output terminal and the photodetector of above-mentioned optical receiver join, and perhaps the detection end face of the output end face of optical receiver and photodetector is oppositely arranged.
The present invention has following beneficial effect:
Implementation method of the present invention is simple, and cost is low, and the present invention can monitor the power or the light intensity of laser instrument in real time in laser ageing/life test, monitors the abnormal conditions that laser instrument occurs in aging/life test in real time.
The monitoring system of prior art can only be carried out under the environment of room temperature greatly because of volume, can not under high low temperature round-robin condition, use.And structure of the present invention is simple and clear, and volume is little, can in high low temperature circulatory stove, use.
High low temperature circulation carrying out life test can the accelerated semiconductor laser instrument dead speed; Thereby the life time through relatively shorter can be calculated into real life length; Utilize high low temperature circulatory stove to carry out and can carry out life test according to the condition noise spectra of semiconductor lasers of semiconductor laser real work simultaneously, the result of test has more authenticity
Description of drawings
Fig. 1 is the structural representation of the embodiment of the invention one;
Fig. 2 is the structural representation of the embodiment of the invention two;
Wherein: 1 testing laser device; 2 optical receivers; 3 photodetectors; 4 light absorption plates; 5 flat shape guide rails.
Embodiment
Below in conjunction with accompanying drawing the present invention is done and to describe in further detail:
Embodiment 1
Referring to Fig. 1, laser life-span test macro of the present invention comprises a plurality of testing laser device 1, optical receiver 2, extinction plate 4, photodetector 3, flat shape guide rail 5;
The number of described testing laser device 1 is a plurality of;
Described optical receiver 2 can be optical patchcord or photoconductive tube;
Described optical receiver 2 numbers are identical with testing laser device number;
Each optical receiver 2 input end is fixed in the luminous center position of testing laser device 1, is used to collect the part light that testing laser device 1 sends;
The extinction plate is used to absorb the unnecessary light that laser instrument sends, to reduce light pollution.
Photodetector 3 is installed on the flat shape guide rail 5, and photodetector 3 can move on flat shape guide rail 5, can survey optical receiver output terminal luminous power or light intensity through moving of control photodetector.The concrete form of flat shape guide rail 5 can be a motorized precision translation stage.
Measured laser device 1 is being carried out in the process of burn-in test; Be used to collect the part light that testing laser device 1 sends in each measured laser device 1 luminous center installation with optical receiver 2; After the part light that the testing laser device 1 that optical receiver 2 is collected sends is derived through output terminal; Survey the power or the light intensity of this part light with photodetector 3; In the life-span burn-in test, occur unusually at measured laser device 1 if photodetector 3 detects the power or the light intensity of this a part of light, explain that then this measured laser device 1 occurs unusual.
When initial, optical receiver 2 is collected the part light that testing laser device 1 is sent in the S place in the position, and power or the light intensity of surveying this part light with photodetector 3 are designated as W; The real-time power of this part light that sent of monitoring testing laser device in S place in the position, if the presence of this department's light or light intensity be during less than initial W, it is unusual to explain that then measured laser device 1 occurs.
Referring to Fig. 2, laser life-span test macro of the present invention,, comprise a plurality of testing laser device 1, optical receiver 2, extinction plate 4, photodetector 3, flat shape guide rail 5;
The number of described testing laser device 1 is a plurality of;
Described optical receiver 2 can be optical patchcord or photoconductive tube;
Described optical receiver 2 numbers are 1;
The extinction plate is used to absorb the unnecessary light that laser instrument sends, to reduce light pollution.
Photodetector 3 is used to survey optical receiver output terminal luminous power or light intensity;
Measured laser device 1 is being carried out in the process of burn-in test; Optical receiver 2 is installed on the flat shape guide rail; Optical receiver 2 can move on flat shape guide rail; On flat shape guide rail, the shift position can be collected in the part laser that each measured laser device 1 is sent through control optical receiver 2, after the part light that the testing laser device 1 that optical receiver 2 is collected sends is derived through output terminal, survey the power or the light intensity of this part light with photodetector 3; In the life-span burn-in test, occur unusually at measured laser device 1 if photodetector 3 detects the power or the light intensity of this a part of light, explain that then this measured laser device 1 occurs unusual.
In sum, this system can carry out long-time Automatic parameter test to the laser instrument product of different encapsulated types, different capacity and quantity.The needs that can satisfy the different temperatures condition of work are that analysis of laser instrument product failure and research provide foundation.
Claims (10)
1. the method for real-time of a semiconductor laser ageing/life test is characterized in that:
A collection of semiconductor laser is being worn out/process of life test in, receive the light that each semiconductor laser sends respectively and derive the power or the light intensity of testing the light of these derivation with photodetector respectively at desired location with optical receiver; If in the light of these derivation, emergent power or light intensity are unusual, judge that then this batch semiconductor laser occurs in the life-span burn-in test unusually;
Said desired location is for making the determined position that is in equal proportions of received luminous power of each semiconductor laser or light intensity.
2. method of real-time according to claim 1 is characterized in that: said desired location is the fixed position that corresponds respectively to each semiconductor laser light-emitting zone, can be corresponding to the center of each semiconductor laser light-emitting zone.
3. method of real-time according to claim 1 is characterized in that: said optical receiver is optical patchcord or photoconductive tube.
4. method of real-time according to claim 1 is characterized in that:
Described optical receiver number is identical with the semiconductor laser number, all is fixed in said desired location separately;
Perhaps said optical receiver is an optical patchcord or photoconductive tube, is installed on the moving guide rail; Optical receiver moves on guide rail, receives light and the derivation that corresponding semiconductor laser sends at each desired location successively.
5. the real-time monitoring system of a semiconductor laser ageing/life test; Comprise optical receiver, extinction plate, photodetector and a plurality of semiconductor lasers to be measured; The extinction plate is positioned at the rear that optical receiver receives end face, and the light that optical receiver will receive exports to and is positioned on the outside said photodetector of extinction plate; It is characterized in that: the optical receiver number is identical with the semiconductor laser number, all is fixedly set on the extinction plate, corresponds respectively to the luminous center of each semiconductor laser, is used for the part that the collection semiconductor laser instrument sends light.
6. real-time monitoring system according to claim 5 is characterized in that: said optical receiver is optical patchcord or photoconductive tube.
7. real-time monitoring system according to claim 6 is characterized in that: the output terminal proper alignment of said optical receiver is fixed; Photodetector is arranged on the guide rail, photodetector; On this guide rail, be set with detecting location corresponding to the output terminal of each optical receiver.
8. the real-time monitoring system of a semiconductor laser ageing/life test; Comprise optical receiver, extinction plate, photodetector and a plurality of semiconductor lasers to be measured; The extinction plate is positioned at the rear that optical receiver receives end face, and the light that optical receiver will receive exports to and is positioned at the outside said photodetector of extinction plate; It is characterized in that: inboard at light extinction plate, be provided with a guide rail, optical receiver is installed on and makes the optical receiver can be along guide rail movement on this guide rail; On this guide rail, be set with photodetector, be used to survey the part that each semiconductor laser sends the same ratio of light.
9. real-time monitoring system according to claim 8 is characterized in that: said optical receiver is optical patchcord or photoconductive tube.
10. real-time monitoring system according to claim 9 is characterized in that: the output terminal and the photodetector of said optical receiver join, and perhaps the detection end face of the output end face of optical receiver and photodetector is oppositely arranged.
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103926052A (en) * | 2014-04-30 | 2014-07-16 | 工业和信息化部电子第五研究所 | Laser service life testing system |
| CN103940586A (en) * | 2014-04-24 | 2014-07-23 | 工业和信息化部电子第五研究所 | Service life detecting method for intermediate infrared solid laser |
| CN103983424A (en) * | 2014-04-22 | 2014-08-13 | 工业和信息化部电子第五研究所 | Solid laser service life testing device |
| CN104330652A (en) * | 2014-09-30 | 2015-02-04 | 武汉锐科光纤激光器技术有限责任公司 | Semiconductor laser device aging tool |
| CN105467291A (en) * | 2015-12-30 | 2016-04-06 | 中国科学院西安光学精密机械研究所 | Semiconductor laser chip test fixing device and method thereof |
| CN114079221A (en) * | 2020-08-12 | 2022-02-22 | 武汉锐晶激光芯片技术有限公司 | Laser chip aging test system and method |
| CN115078887A (en) * | 2022-07-20 | 2022-09-20 | 度亘激光技术（苏州）有限公司 | Semiconductor laser aging test method and device |
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| CN102279096A (en) * | 2011-07-08 | 2011-12-14 | 西安炬光科技有限公司 | On-line test method and on-line test system for service life of laser device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105467291A (en) * | 2015-12-30 | 2016-04-06 | 中国科学院西安光学精密机械研究所 | Semiconductor laser chip test fixing device and method thereof |
| CN105467291B (en) * | 2015-12-30 | 2018-06-26 | 中国科学院西安光学精密机械研究所 | Semiconductor laser chip test fixing device and method thereof |
| CN114079221A (en) * | 2020-08-12 | 2022-02-22 | 武汉锐晶激光芯片技术有限公司 | Laser chip aging test system and method |
| CN114079221B (en) * | 2020-08-12 | 2024-05-14 | 武汉锐晶激光芯片技术有限公司 | Laser chip aging test system and method |
| CN115078887A (en) * | 2022-07-20 | 2022-09-20 | 度亘激光技术（苏州）有限公司 | Semiconductor laser aging test method and device |
| CN115078887B (en) * | 2022-07-20 | 2022-11-25 | 度亘激光技术（苏州）有限公司 | Semiconductor laser aging test method and device |
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Address after: 710077 high power semiconductor laser Industrial Park, Shaanxi, Xi'an, Shaanxi Province, No. 86, No. 56 Patentee after: FOCUSLIGHT TECHNOLOGIES INC. Address before: 710119 high tech Zone, Shaanxi, Xi'an new industrial park information Avenue, building 17, building three, floor 10 Patentee before: Xi'an Focuslight Technology Co., Ltd. |
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Denomination of invention: Semiconductor laser ageing/service life test real-time monitoring method and system Effective date of registration: 20190222 Granted publication date: 20141008 Pledgee: Xi'an investment and financing Company limited by guarantee Pledgor: FOCUSLIGHT TECHNOLOGIES INC. Registration number: 2019610000039 |
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Date of cancellation: 20210420 Granted publication date: 20141008 Pledgee: Xi'an investment and financing Company limited by guarantee Pledgor: Focuslight Technologies Inc. Registration number: 2019610000039 |