CN103983424A - Solid laser service life testing device - Google Patents

Solid laser service life testing device Download PDF

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Publication number
CN103983424A
CN103983424A CN201410163461.0A CN201410163461A CN103983424A CN 103983424 A CN103983424 A CN 103983424A CN 201410163461 A CN201410163461 A CN 201410163461A CN 103983424 A CN103983424 A CN 103983424A
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laser
module
attemperating unit
power meter
solid state
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CN201410163461.0A
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CN103983424B (en
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路国光
谢少锋
郝明明
赖灿雄
黄云
恩云飞
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Fifth Electronics Research Institute of Ministry of Industry and Information Technology
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Fifth Electronics Research Institute of Ministry of Industry and Information Technology
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Abstract

The invention provides a solid laser service life testing device which comprises a first temperature control device used for controlling the temperature of a pumping source module of a solid laser, a second temperature control device used for controlling a laser module of the solid laser, a third temperature control device used for controlling an OPO module of the solid laser, a first reflecting mirror arranged between the pumping source module and the laser module, a second reflecting mirror arranged between the laser module and the OPO module, a first power meter used for monitoring the reflected light power of the first reflecting mirror, a second power meter used for monitoring the reflected light power of the second reflecting mirror, a third power meter used for monitoring the output power of the OPO module and temperature adjusting equipment for adjusting the first temperature control device, the second temperature control device and the third temperature control device. Accelerated life tests can be carried out on the solid laser, and the testing device is simple in structure and easy to operate and has great application prospect.

Description

Solid state laser life test apparatus
Technical field
The present invention relates to light technical field, particularly relate to a kind of solid state laser life test apparatus.
Background technology
3~5 mu m wavebands are not only the minimum atmosphere infrared window of decay, and in this wave band, also covered the absorption peak of numerous atoms and molecule, so this wave band of laser has very important using value and prospect at numerous areas such as spectroscopy, remote sensing, medical treatment, environmental protection.This makes the research of 3~5 mu m waveband lasers become at present very popular in the world problem.
At the output facet of solid mid-infrared laser, main optical parametric oscillation (OPO) technology that adopts, utilizes KNbO at present 3, LiNbO 3, KTP, KTA, AgGaS 2, AgGaSe 2, PPLN, ZnGeP 2in crystal, by OPO technology, in middle-infrared band, effectively realized Laser output.Mid-infrared laser output power is from the AgGaSe of the 1W level of phase early 1990s 2oPO, to the PPLN OPO of 5W power, to phase late 1990s employing ZnGeP 2oPO mode output power breaks through 10W.
Continuous lifting along with middle infrared solid laser output power, its application is constantly expanded, become the Primary Component that affects national economy, in the situation that device technology, material, performance are constantly progressive, for ensureing its application reliability, the life-span of device has been proposed to urgent evaluation requirements.
Also do not carry out in the world the service life evaluation testing for solid state laser, the development report that more there is no the durability test instrument of corresponding relevant solid state laser, for evaluating the life-span of solid state laser, developing a set of life test apparatus that meets application becomes a major issue that must solve.
Summary of the invention
The object of the present invention is to provide a kind of solid state laser life test apparatus, can be used for the life-span of infrared solid laser in evaluating.
Object of the present invention is achieved through the following technical solutions:
A kind of solid state laser life test apparatus, comprise for controlling first attemperating unit of temperature of the pumping source module of described solid state laser, for controlling the second attemperating unit of the laser module of described solid state laser, for controlling the 3rd attemperating unit of the OPO module of described solid state laser, be arranged at the first catoptron between described pumping source module and described laser module, be arranged at the second catoptron between described laser module and described OPO module, for monitoring the first power meter of the reflected optical power of described the first catoptron, the second power meter that is used for the reflected optical power of described monitoring the second catoptron, for monitoring the 3rd power meter of the output power of described OPO module, also comprise for regulating described the first attemperating unit, described the second attemperating unit, the temperature equipment of described the 3rd attemperating unit.。
According to the solution of the present invention, the output power of pumping source module can be monitored by the first power meter, the output power of laser module can be monitored by the second power meter, the output power of OPO module can be monitored by the second power meter, realized the monitoring to the luminous power of pumping source module, laser module, OPO module simultaneously, can realize pumping source module, laser module, OPO module temperature are controlled by the first attemperating unit, the second attemperating unit, the 3rd attemperating unit, temperature equipment again simultaneously, realize accelerated life test.Meanwhile, test unit of the present invention is simple in structure, easy operating, has good application prospect.
Accompanying drawing explanation
Fig. 1 is solid state laser life test apparatus of the present invention structural representation in an embodiment therein;
Fig. 2 is solid state laser life test apparatus of the present invention structural representation in another embodiment therein;
Fig. 3 is solid state laser life test apparatus of the present invention structural representation in the 3rd embodiment therein.
Embodiment
Below in conjunction with embodiment and accompanying drawing, the present invention is further elaborated, but implementation of the present invention is not limited to this.
For adopting optical parametric oscillation to realize the solid state laser of the mid-infrared laser output of wide tunable range, its agent structure generally includes pumping source module (adopting 793nm diode-end-pumped source), laser module (2 μ m solid state laser), 3 main modules of OPO module (3~5 μ m optics parametric oscillator (opo)), the life-span of the life-span of solid state laser and these 3 modules is closely bound up, realize the accurate evaluation to the solid state laser life-span, need can monitor the luminous power of 3 modules, and the luminous power based on 3 modules is evaluated the life-span of solid state laser simultaneously.In order to realize the function of accelerated life test, require test unit to possess 3 modules are carried out to temperature controlled function simultaneously.Below solid state laser life test apparatus of the present invention is elaborated.
Shown in Figure 1, be the structural representation of solid state laser life test apparatus embodiment of the present invention.Described solid state laser comprises pumping source module 101, laser module 102, OPO module 103, solid state laser life test apparatus for the present embodiment, comprise for controlling the first attemperating unit 201 of the temperature of pumping source module 101, for controlling the second attemperating unit 202 of laser module 102, for controlling the 3rd attemperating unit 203 of OPO module 103, be arranged at the first catoptron 204 between pumping source module 101 and laser module 102, be arranged at the second catoptron 205 between laser module 102 and OPO module 103, for monitoring the first power meter 206 of the reflected optical power of the first catoptron, for monitoring the second power meter 207 of the reflected optical power of the second catoptron, for monitoring the 3rd power meter 208 of the output power of OPO module 103, also comprise for regulating the first attemperating unit 201, the second attemperating unit 202, the temperature equipment 209 of the 3rd attemperating unit 203.
In the present embodiment, pumping source module 101 adopts 793nm diode-end-pumped source, is coupling fiber output, and output beam encourages the laser crystal in laser module 102 after collimating, expanding, its output wavelength is 790nm-795nm, and output power is greater than or equal to 40W; In actual tests process, pumping source module 101 is placed in the first attemperating unit 201, is controlled the temperature of pumping source module 101 by this first attemperating unit 201.
Laser module 102 is 2 μ m laser instruments, and its operation material is YAP crystal, and laser module 102 is placed in the second attemperating unit 202, is controlled the temperature of laser module 102 by this second attemperating unit 202, has also just realized the control to the temperature of YAP crystal.
The nonlinear crystal of OPO module 103 is generally ZnGeP 2, can be also KNbO 3, LiNbO 3, KTP, KTA, AgGaS 2, AgGaSe 2, PPLN, ZnGeP 2in crystal; In actual tests process, OPO module 103 is placed in the 3rd attemperating unit 203, has also just realized the control to the temperature of the nonlinear crystal of OPO module 103.
The first attemperating unit 201, the second attemperating unit 202, the 3rd attemperating unit 203 connect respectively temperature equipment 209, temperature equipment 209 regulates the temperature of the first attemperating unit 201, the second attemperating unit 202, the 3rd attemperating unit 203 according to testing requirements, thereby can obtain the reliability indexs such as accelerated life model.
Temperature control mode is generally diversified, but in order to realize the stable control to test temperature, can reduce equipment cost again, therein in an embodiment, the first attemperating unit 201, the second attemperating unit 202 and the 3rd attemperating unit 203 can be water-cooling channel, this is that the temperature of considering general water can regulate according to testing requirements, and, can keep relative stability within a certain period of time, correspondingly, temperature equipment 209 can be selected water cooling unit, for example, select a high power recirculated water refrigeration machine, flow >=7L/min, temperature controlling range 20-65 ℃.
Therein in an embodiment, the first attemperating unit 201, the second attemperating unit 202 and the 3rd attemperating unit 203 can also be all micro-channel heat sinks, micro-channel heat sink has the advantages such as heavy volume is little, structure is tight, cooling power is strong, and temperature equipment 209 also can be selected water cooling unit.
It should be noted that, temperature control mode is not limited to above-mentioned two kinds, and for example, the mode that can also control by electric heater, does not repeat them here.
It should be noted that, the first attemperating unit 201, the second attemperating unit 202 and the 3rd attemperating unit 203 can be also that one of them or two are water-cooling channels, and one of them or two are micro-channel heat sinks, do not repeat them here.
Because the first attemperating unit 201, the second attemperating unit 202 and the 3rd attemperating unit 203 both need to carry out work in wider temperature range, and wherein often need the media such as water flowing, air, thereby easily oxidized, in order to improve the reliability of device, the first attemperating unit 201, the second attemperating unit 202 and the 3rd attemperating unit 203 can be oxygen-free copper material, oxygen-free copper stability is high, and oxidation resistance is strong.
The first catoptron 204 is arranged between pumping source module 101 and laser module 102, the laser of pumping source module 101 output can some enter the first power meter 206 after by the first catoptron 204 reflections, by first power meter 206 its power of monitoring, because reflected light is herein from pumping source module 101, therefore the output power that, the first power meter 206 can Real-Time Monitoring pumping source module 101.
The second catoptron 205 is arranged between laser module 102 and OPO module 103, the laser of laser module 102 output can some enter the second power meter 207 after by the second catoptron 205 reflections, by second power meter 206 its power of monitoring, because reflected light herein carrys out laser module 102, therefore the output power that, the second power meter 207 can Real-Time Monitoring laser module 102.
The 3rd power meter 208 be placed in OPO module 103 after, for monitoring the output power of OPO module 103.
Solid state laser life test apparatus of the present invention can be realized pumping source module 101 simultaneously, laser module 102, the monitoring of the output power of OPO module 103, life assessment for middle infrared solid laser provides equipment guarantee on the one hand, ensured the engineering application of middle infrared solid laser, on the other hand, utilize solid state laser life test apparatus of the present invention to carry out online burn-in screen by centering infrared solid laser, can expose the weak link of device, for the reliability design of laser instrument provides technical support, accelerate laser device reliability propagation process.
Therein in an embodiment, as shown in Figure 2, solid state laser life test apparatus of the present invention can also comprise drive source 210, and this drive source 210 is for driving 101 work of pumping source module, drive source 210 is generally selected constant current drive source, to realize, drives pumping source module 101 steady operations.
Consider that between laser module 102 and OPO module 103, laser has mixed the pump light that a certain amount of pumping source module 101 is exported, impact for fear of this pump light on test figure, generally need to filter pump light, for this reason, therein in an embodiment, as Fig. 3 shows, solid state laser life test apparatus of the present invention can also comprise the filter 211 being excessively arranged between laser module 102 and the second catoptron 205, crosses filter 211 for filtering pump light.
Consider that solid state laser life test apparatus of the present invention is mainly used in the life test of middle infrared solid laser, for this situation, in order to improve the accuracy of test, can carry out type selecting to the first catoptron 204, the second catoptron 205, mistake filter 211, the first power meter 206, the second power meter 207, the 3rd power meter 208.Below several specific embodiments are set forth.
Therein in an embodiment, the transmissivity of crossing 211 pairs of 1.9 μ m-2.1 μ m laser of filter is greater than or equal to 97%, the reflectivity of crossing 211 pairs of 790nm-795nm laser of filter is greater than or equal to 99%, this is to consider that the operation wavelength of pumping source module 101 is 793nm, the reflectivity of crossing 211 pairs of 790nm-795nm laser of filter is greater than or equal to 99%, can substantially filter out described pump light, and laser module 102 output wavelengths are 790nm-795nm, the transmissivity of crossing 211 pairs of 1.9 μ m-2.1 μ m laser of filter is greater than or equal to 97%, the laser full impregnated that can substantially export laser module 102.
Therein in an embodiment, the transmissivity of 204 pairs of 793nm laser of the first catoptron is 99%, approximately there is 1% pump light to enter the first power meter 206 by the first catoptron 204, on the one hand, can realize the monitoring of pumping source module 101 output powers (need to convert according to transmissivity), do not affect again on the other hand the pumping to laser module 102, can certainly, according to other transmissivities of actual requirement, still generally want 793nm laser to realize thoroughly high; The transmissivity of the second 205 pairs of catoptrons, 2 μ m laser is 99%, like this, can realize the monitoring of laser module 102 output powers (need to convert according to transmissivity) on the one hand, do not affect again on the other hand the output power of OPO module 103, can certainly, according to other transmissivities of actual requirement, still generally to realize 2 μ m laser thoroughly high.
Therein in an embodiment, the first power meter 206, the second power meter 207, the 3rd power meter 208 are thermoelectric type power meter, the response wave length scope of the first power meter 206 is 400nm-1100nm, the power investigative range 10W-300W of the first power meter 206, the response wave length scope of the second power meter 207 is 400nm-11 μ m, the power investigative range 10W-100W of the second power meter 207, the response wave length scope of the 3rd power meter 208 is 400nm-11 μ m, the power investigative range 1W-50W of the 3rd power meter 208, can realize the accurate monitoring to power data.
The above embodiment has only expressed several embodiment of the present invention, and it describes comparatively concrete and detailed, but can not therefore be interpreted as the restriction to the scope of the claims of the present invention.It should be pointed out that for the person of ordinary skill of the art, without departing from the inventive concept of the premise, can also make some distortion and improvement, these all belong to protection scope of the present invention.Therefore, the protection domain of patent of the present invention should be as the criterion with claims.

Claims (9)

1. a solid state laser life test apparatus, it is characterized in that, comprise for controlling first attemperating unit of temperature of the pumping source module of described solid state laser, for controlling the second attemperating unit of the laser module of described solid state laser, for controlling the 3rd attemperating unit of the OPO module of described solid state laser, be arranged at the first catoptron between described pumping source module and described laser module, be arranged at the second catoptron between described laser module and described OPO module, for monitoring the first power meter of the reflected optical power of described the first catoptron, the second power meter that is used for the reflected optical power of described monitoring the second catoptron, for monitoring the 3rd power meter of the output power of described OPO module, also comprise for regulating described the first attemperating unit, described the second attemperating unit, the temperature equipment of described the 3rd attemperating unit.
2. according to the solid state laser life test apparatus shown in claim 1, it is characterized in that, also comprise drive source, described drive source is used for driving the work of described pumping source module.
3. according to the solid state laser life test apparatus shown in claim 1, it is characterized in that, also comprise the filter of crossing being arranged between described laser module and described the second catoptron.
4. according to the solid state laser life test apparatus shown in claim 3, it is characterized in that, the described filter of crossing is greater than or equal to 97% to the transmissivity of 1.9 μ m-2.1 μ m laser, and the described filter of crossing is greater than or equal to 99% to the reflectivity of 790nm-795nm laser.
5. according to the solid state laser life test apparatus shown in claim 1, it is characterized in that, described temperature equipment is water cooling unit, and described the first attemperating unit, described the second attemperating unit and described the 3rd attemperating unit are water-cooling channel.
6. according to the solid state laser life test apparatus shown in claim 1, it is characterized in that, described temperature equipment is water cooling unit, and described the first attemperating unit, described the second attemperating unit and described the 3rd attemperating unit are micro-channel heat sink.
7. according to the solid state laser life test apparatus shown in claim 1, it is characterized in that, described the first attemperating unit, described the second attemperating unit and described the 3rd attemperating unit are oxygen-free copper material.
8. according to the solid state laser life test apparatus shown in claim 1, it is characterized in that, described the first catoptron is 99% to the transmissivity of 793nm laser, and described the second catoptron is 99% to the transmissivity of 2 μ m laser.
9. according to the solid state laser life test apparatus shown in claim 1, it is characterized in that, described the first power meter, described the second power meter, described the 3rd power meter is thermoelectric type power meter, the response wave length scope of described the first power meter is 400nm-1100nm, the power investigative range 10W-300W of described the first power meter, the response wave length scope of described the second power meter is 400nm-11 μ m, the power investigative range 10W-100W of described the second power meter, the response wave length scope of described the 3rd power meter is 400nm-11 μ m, the power investigative range 1W-50W of described the 3rd power meter.
CN201410163461.0A 2014-04-22 2014-04-22 Solid state laser life test apparatus Active CN103983424B (en)

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CN110364916A (en) * 2019-07-29 2019-10-22 昂纳信息技术(深圳)有限公司 A kind of high power pump source ageing system and fiber optic protecting method based on high power pump source ageing system

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Cited By (3)

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CN107024336A (en) * 2016-01-29 2017-08-08 波士顿科学国际有限公司 Medical treatment device and application method
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CN110364916A (en) * 2019-07-29 2019-10-22 昂纳信息技术(深圳)有限公司 A kind of high power pump source ageing system and fiber optic protecting method based on high power pump source ageing system

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