CN103983424B - Solid state laser life test apparatus - Google Patents

Solid state laser life test apparatus Download PDF

Info

Publication number
CN103983424B
CN103983424B CN201410163461.0A CN201410163461A CN103983424B CN 103983424 B CN103983424 B CN 103983424B CN 201410163461 A CN201410163461 A CN 201410163461A CN 103983424 B CN103983424 B CN 103983424B
Authority
CN
China
Prior art keywords
solid state
module
attemperating unit
laser
state laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201410163461.0A
Other languages
Chinese (zh)
Other versions
CN103983424A (en
Inventor
路国光
谢少锋
郝明明
赖灿雄
黄云
恩云飞
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fifth Electronics Research Institute of Ministry of Industry and Information Technology
Original Assignee
Fifth Electronics Research Institute of Ministry of Industry and Information Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fifth Electronics Research Institute of Ministry of Industry and Information Technology filed Critical Fifth Electronics Research Institute of Ministry of Industry and Information Technology
Priority to CN201410163461.0A priority Critical patent/CN103983424B/en
Publication of CN103983424A publication Critical patent/CN103983424A/en
Application granted granted Critical
Publication of CN103983424B publication Critical patent/CN103983424B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Lasers (AREA)

Abstract

The invention provides a kind of solid state laser life test apparatus, comprise the first attemperating unit of the temperature of the pumping source module for controlling solid state laser, be used for the second attemperating unit of the laser module of controlling solid state laser, be used for the 3rd attemperating unit of the OPO module of controlling solid state laser, be arranged at the first speculum between pumping source module and laser module, be arranged at the second speculum between laser module and OPO module, be used for the first power meter of the reflected optical power of monitoring the first speculum, be used for the second power meter of the reflected optical power of monitoring the second speculum, be used for the 3rd power meter of the power output of monitoring OPO module, also comprise for regulating the first attemperating unit, the second attemperating unit, the temperature equipment of the 3rd attemperating unit, can carry out accelerated life test to solid state laser, experimental rig of the present invention is simple in structure, easy operating, has good application prospect.

Description

Solid state laser life test apparatus
Technical field
The present invention relates to light technical field, particularly relate to a kind of solid state laser life test apparatus.
Background technology
3~5 mu m wavebands are not only the minimum atmosphere infrared window of decay, and have also covered in this wave bandThe absworption peak of numerous atoms and molecule, so this wave band of laser is all in spectroscopy, remote sensing, medical treatment, environmental protection etc.Multi-field have very important using value and a prospect. This makes the research of 3~5 mu m waveband lasers becomeAt present very popular problem in the world.
At the output facet of solid mid-infrared laser, main optical parametric oscillation (OPO) technology that adopts at present,Utilize KNbO3、LiNbO3、KTP、KTA、AgGaS2、AgGaSe2、PPLN、ZnGeP2Deng brilliantBody has been realized Laser output by OPO technology effectively in middle-infrared band. Mid-infrared laser power output fromThe AgGaSe of the 1W level of phase early 1990s2OPO, to the PPLNOPO of 5W power, extremelyPhase late 1990s adopts ZnGeP2OPO mode power output breaks through 10W.
Along with the continuous lifting of middle infrared solid laser power output, its application is constantly expanded,Become the Primary Component that affects national economy, in the situation that device technology, material, performance are constantly progressive,For ensureing its application reliability, the life-span of device is proposed to urgent evaluation requirements.
Also do not carry out in the world the service life evaluation testing for solid state laser, more not corresponding relevant solidThe development report of the life test instrument of body laser, for evaluating the life-span of solid state laser, develops a set of symbolThe life test apparatus that closes application becomes a major issue that must solve.
Summary of the invention
The object of the present invention is to provide a kind of solid state laser life test apparatus, infrared in can be used for evaluatingThe life-span of solid state laser.
Object of the present invention is achieved through the following technical solutions:
A kind of solid state laser life test apparatus, comprises the pumping source mould for controlling described solid state laserThe first attemperating unit of the temperature of piece, for controlling second temperature control of laser module of described solid state laserDevice, for control described solid state laser OPO module the 3rd attemperating unit, be arranged at described pumpingThe first speculum between source module and described laser module, be arranged at described laser module and described inThe second speculum between OPO module, for monitoring first merit of reflected optical power of described the first speculumRate meter, for the second power meter of the reflected optical power of described monitoring the second speculum, for monitoring described OPOThe 3rd power meter of the power output of module, also comprises for regulating described the first attemperating unit, described secondThe temperature equipment of attemperating unit, described the 3rd attemperating unit. .
According to the solution of the present invention, the power output of pumping source module can be monitored by the first power meter,The power output of laser module can be monitored by the second power meter, and the power output of OPO module canTo monitor by the second power meter, realize simultaneously to pumping source module, laser module, OPO mouldThe monitoring of the luminous power of piece, can pass through again the first attemperating unit, the second attemperating unit, the 3rd temperature control simultaneouslyDevice, temperature equipment are realized pumping source module, laser module, the control of OPO module temperature, and realization addsSpeed life test. Meanwhile, experimental rig of the present invention is simple in structure, easy operating, has before good applicationScape.
Brief description of the drawings
Fig. 1 is solid state laser life test apparatus of the present invention structural representation in an embodiment thereinFigure;
Fig. 2 be solid state laser life test apparatus of the present invention therein the structure in another embodiment showIntention;
Fig. 3 be solid state laser life test apparatus of the present invention therein the structure in the 3rd embodiment showIntention.
Detailed description of the invention
Below in conjunction with embodiment and accompanying drawing, the present invention is further elaborated, but implementation of the present invention is not limitIn this.
The solid state laser of exporting for the mid-infrared laser that adopts optical parametric oscillation to realize wide tunable range,Its agent structure generally includes pumping source module (adopting 793nm diode-end-pumped source), laser diePiece (2 μ m solid state laser), 3 main modules of OPO module (3~5 μ m optics parametric oscillator (opo)),The life-span of the life-span of solid state laser and these 3 modules is closely bound up, realize the solid state laser life-spanAccurate evaluation needs can monitor the luminous power of 3 modules simultaneously, and luminous power based on 3 modules is commentedThe life-span of valency solid state laser. In order to realize the function of accelerated life test, require experimental rig to possess simultaneously3 modules are carried out to temperature controlled function. Below solid state laser life test apparatus of the present invention is enteredRow describes in detail.
Shown in Figure 1, be the structural representation of solid state laser life test apparatus embodiment of the present invention.Described solid state laser comprises pumping source module 101, laser module 102, OPO module 103, for thisThe solid state laser life test apparatus of embodiment, comprises of temperature for controlling pumping source module 101One attemperating unit 201, for controlling the second attemperating unit 202 of laser module 102, for controlling OPOThe 3rd attemperating unit 203 of module 103, be arranged between pumping source module 101 and laser module 102The first speculum 204, be arranged at the second speculum 205 between laser module 102 and OPO module 103,For monitor the first speculum reflected optical power the first power meter 206, for monitoring the anti-of the second speculumPenetrate the second power meter 207 of luminous power, for monitoring the 3rd power meter of power output of OPO module 103208, also comprise for regulating the first attemperating unit 201, the second attemperating unit 202, the 3rd attemperating unit 203Temperature equipment 209.
In the present embodiment, pumping source module 101 adopts 793nm diode-end-pumped source, is optical fiberCoupling output, output beam swashs the laser crystal in laser module 102 after collimating, expandingEncourage, its output wavelength is 790nm-795nm, and power output is greater than or equal to 40W; In actual tests mistakeCheng Zhong, pumping source module 101 is placed in the first attemperating unit 201, is controlled by this first attemperating unit 201The temperature of pumping source module 101.
Laser module 102 is 2 μ m laser instruments, and its operation material is YAP crystal, laser module 102Be placed in the second attemperating unit 202, controlled the temperature of laser module 102 by this second attemperating unit 202,Also just realized the control of the temperature to YAP crystal.
The nonlinear crystal of OPO module 103 is generally ZnGeP2, can be also KNbO3、LiNbO3、KTP、KTA、AgGaS2、AgGaSe2、PPLN、ZnGeP2In crystal; In actual tests process,OPO module 103 is placed in the 3rd attemperating unit 203, has also just realized non-linear to OPO module 103The control of the temperature of crystal.
The first attemperating unit 201, the second attemperating unit 202, the 3rd attemperating unit 203 connect respectively temperature adjustment and establishStandby 209, temperature equipment 209 according to test requirements document regulate the first attemperating unit 201, the second attemperating unit 202,The temperature of the 3rd attemperating unit 203, thus the reliability indexs such as accelerated life model can be obtained.
Temperature control mode is generally diversified, but in order to realize the stable control to test temperature, again canReduce equipment cost, therein in an embodiment, the first attemperating unit 201, the second attemperating unit 202 andThe 3rd attemperating unit 203 can be water-cooling channel, and this is to consider that the temperature of general water can be according to testRequirement regulates, and, can keep relative stability within a certain period of time, correspondingly, temperature equipment 209Can select water cooling unit, for example, select a high power recirculated water refrigeration machine, flow >=7L/min, temperature controlScope 20-65 DEG C.
In an embodiment, the first attemperating unit 201, the second attemperating unit 202 and the 3rd temperature control fill thereinPutting 203 can also be all micro-channel heat sinks, and micro-channel heat sink has that heavy volume is little, structure is tight, cooling capacityThe advantage such as strong, temperature equipment 209 also can be selected water cooling unit.
It should be noted that, temperature control mode is not limited to above-mentioned two kinds, for example, can also be undertaken by electric heaterThe mode of controlling, does not repeat them here.
It should be noted that the first attemperating unit 201, the second attemperating unit 202 and the 3rd attemperating unit 203Also can be that one of them or two are water-cooling channels, one of them or two be micro-channel heat sinks,Do not repeat them here.
Because the first attemperating unit 201, the second attemperating unit 202 and the 3rd attemperating unit 203 both need to beIn wide temperature range, carry out work, and wherein often need the medium such as water flowing, air, thereby easilyOxidized, in order to improve the reliability of device, the first attemperating unit 201, the second attemperating unit 202 and the 3rdAttemperating unit 203 can be oxygen-free copper material, and oxygen-free copper stability is high, and oxidation resistance is strong.
The first speculum 204 is arranged between pumping source module 101 and laser module 102, pumping sourceThe laser that module 101 is exported can some enter the first power meter after being reflected by the first speculum 204206, monitor its power by the first power meter 206, because reverberation is herein from pumping source module 101,Therefore the power output that, the first power meter 206 can Real-Time Monitoring pumping source module 101.
The second speculum 205 is arranged between laser module 102 and OPO module 103, laser dieThe laser that piece 102 is exported can some enter the second power meter 207 after being reflected by the second speculum 205,Monitor its power by the second power meter 207, because reverberation herein carrys out laser module 102, therefore, theTwo power meters 207 can Real-Time Monitoring laser module 102 power output.
The 3rd power meter 208 be placed in OPO module 103 after, for monitoring the defeated of OPO module 103Go out power.
Solid state laser life test apparatus of the present invention can be realized pumping source module 101, laser instrument simultaneouslyThe monitoring of the power output of module 102, OPO module 103 is the longevity of middle infrared solid laser on the one handLife evaluation provides equipment guarantee, has ensured the engineering application of middle infrared solid laser, on the other hand, and profitCan carry out online aging sieve by centering infrared solid laser with solid state laser life test apparatus of the present inventionSelect, can expose the weak link of device, for the reliability design of laser instrument provides technical support, accelerateLaser device reliability propagation process.
In an embodiment, as shown in Figure 2, solid state laser life test apparatus of the present invention also thereinCan comprise drive source 210, this drive source 210 is for driving pumping source module 101 to work, drive source 210Generally select constant current drive source, drive pumping source module 101 steady operations to realize.
Consider that between laser module 102 and OPO module 103, laser has mixed a certain amount of pumping source mouldThe pump light that piece 101 is exported, the impact for fear of this pump light on test data, generally need to be to pumpingLight filters, for this reason, therein in an embodiment, as Fig. 3 shows, the solid state laser longevity of the present inventionLife experimental rig can also comprise the filter of crossing being arranged between laser module 102 and the second speculum 205211, cross filter 211 for filtering pump light.
Consider that solid state laser life test apparatus of the present invention is mainly used in the longevity of middle infrared solid laserLife test, for this situation, in order to improve the accuracy of test, can be to the first speculum 204, secondSpeculum 205, mistake filter 211, the first power meter 206, the second power meter 207, the 3rd power meter 208Carry out type selecting. Below several specific embodiments are set forth.
Therein in an embodiment, cross that filter 211 is greater than the transmissivity of 1.9 μ m-2.1 μ m laser or etc.In 97%, to cross filter 211 reflectivity of 790nm-795nm laser is greater than or equal to 99%, this is to examineConsidering is 793nm to the operation wavelength of pumping source module 101, and mistake filter 211 is to 790nm-795nm laserReflectivity is greater than or equal to 99%, can substantially filter out described pump light, and laser module 102Output wavelength is 790nm-795nm, cross filter 211 transmissivity of 1.9 μ m-2.1 μ m laser is greater than orEqual 97%, the laser full impregnated that can substantially export laser module 102.
In an embodiment, the first speculum 204 is 99% to the transmissivity of 793nm laser, thereinApproximately there is 1% pump light to enter the first power meter 206 by the first speculum 204, on the one hand, can realizeMonitoring (need to convert according to transmissivity) to pumping source module 101 power outputs, on the other hand again notThe pumping of impact to laser module 102, can certainly be according to other transmissivities of actual requirement, but oneAs want 793nm laser realize high thoroughly; The second speculum 205 is 99% to the transmissivity of 2 μ m laser, like this,Can realize the monitoring (need to convert according to transmissivity) to laser module 102 power outputs on the one hand,Do not affect again on the other hand the power output of OPO module 103, can certainly according to actual requirement, other be saturatingPenetrate rate, but generally will realize 2 μ m laser thoroughly high.
Therein in an embodiment, the first power meter 206, the second power meter 207, the 3rd power meter 208Be thermoelectric type power meter, the response wave length scope of the first power meter 206 is 400nm-1100nm, firstThe power investigative range 10W-300W of power meter 206, the response wave length scope of the second power meter 207 is400nm-11 μ m, the power investigative range 10W-100W of the second power meter 207, the 3rd power meter 208Response wave length scope is 400nm-11 μ m, and the power investigative range 1W-50W of the 3rd power meter 208, canRealize the accurate monitoring to power data.
The above embodiment has only expressed several embodiment of the present invention, and it describes comparatively concrete and detailed,But can not therefore be interpreted as the restriction to the scope of the claims of the present invention. It should be pointed out that for this areaThose of ordinary skill, without departing from the inventive concept of the premise, can also make some distortion andImprove, these all belong to protection scope of the present invention. Therefore, the protection domain of patent of the present invention should be with appendedClaim is as the criterion.

Claims (9)

1. a solid state laser life test apparatus, is characterized in that, comprises for controlling described solid and swashingThe first attemperating unit of the temperature of the pumping source module of light device, for controlling the laser instrument of described solid state laserThe second attemperating unit of module, for control described solid state laser OPO module the 3rd attemperating unit,Be arranged at the first speculum between described pumping source module and described laser module, be arranged at described laserThe second speculum between device module and described OPO module, for monitoring the reverberation of described the first speculumThe first power meter of power, for monitoring the second power meter, the use of reflected optical power of described the second speculumIn the 3rd power meter of power output of the described OPO module of monitoring, also comprise for regulating described the first temperature controlThe temperature equipment of device, described the second attemperating unit, described the 3rd attemperating unit.
2. according to the solid state laser life test apparatus shown in claim 1, it is characterized in that, also compriseDrive source, described drive source is used for driving the work of described pumping source module.
3. according to the solid state laser life test apparatus shown in claim 1, it is characterized in that, also compriseBe arranged on the filter of crossing between described laser module and described the second speculum.
4. according to the solid state laser life test apparatus shown in claim 3, it is characterized in that described mistakeFilter is greater than or equal to 97% to the transmissivity of 1.9 μ m-2.1 μ m laser, the described filter pair of crossingThe reflectivity of 790nm-795nm laser is greater than or equal to 99%.
5. according to the solid state laser life test apparatus shown in claim 1, it is characterized in that described tuneTemperature equipment is water cooling unit, described the first attemperating unit, described the second attemperating unit and described the 3rd attemperating unitBe water-cooling channel.
6. according to the solid state laser life test apparatus shown in claim 1, it is characterized in that described tuneTemperature equipment is water cooling unit, described the first attemperating unit, described the second attemperating unit and described the 3rd attemperating unitBe micro-channel heat sink.
7. according to the solid state laser life test apparatus shown in claim 1, it is characterized in that describedOne attemperating unit, described the second attemperating unit and described the 3rd attemperating unit are oxygen-free copper material.
8. according to the solid state laser life test apparatus shown in claim 1, it is characterized in that describedOne speculum is 99% to the transmissivity of 793nm laser, the transmissivity of described the second speculum to 2 μ m laserBe 99%.
9. according to the solid state laser life test apparatus shown in claim 1, it is characterized in that describedOne power meter, described the second power meter, described the 3rd power meter are thermoelectric type power meter, described firstThe response wave length scope of power meter is 400nm-1100nm, the power investigative range of described the first power meter10W-300W, the response wave length scope of described the second power meter is 400nm-11 μ m, described the second power meterPower investigative range 10W-100W, the response wave length scope of described the 3rd power meter is 400nm-11 μ m,The power investigative range 1W-50W of described the 3rd power meter.
CN201410163461.0A 2014-04-22 2014-04-22 Solid state laser life test apparatus Active CN103983424B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201410163461.0A CN103983424B (en) 2014-04-22 2014-04-22 Solid state laser life test apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410163461.0A CN103983424B (en) 2014-04-22 2014-04-22 Solid state laser life test apparatus

Publications (2)

Publication Number Publication Date
CN103983424A CN103983424A (en) 2014-08-13
CN103983424B true CN103983424B (en) 2016-05-11

Family

ID=51275484

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201410163461.0A Active CN103983424B (en) 2014-04-22 2014-04-22 Solid state laser life test apparatus

Country Status (1)

Country Link
CN (1) CN103983424B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107024336A (en) * 2016-01-29 2017-08-08 波士顿科学国际有限公司 Medical treatment device and application method
CN110364916A (en) * 2019-07-29 2019-10-22 昂纳信息技术(深圳)有限公司 A kind of high power pump source ageing system and fiber optic protecting method based on high power pump source ageing system

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001230479A (en) * 2000-02-14 2001-08-24 Shimadzu Corp Solid-state laser excited by semiconductor laser
CN102062675B (en) * 2010-12-16 2013-03-20 西安炬光科技有限公司 Device for testing life of semiconductor laser
CN102590723A (en) * 2011-09-05 2012-07-18 工业和信息化部电子第五研究所 Service life test online monitoring system for kilowatt large-power laser diode array
CN102519709B (en) * 2011-12-20 2014-10-08 西安炬光科技有限公司 Semiconductor laser ageing/service life test real-time monitoring method and system
CN102520336A (en) * 2011-12-20 2012-06-27 西安炬光科技有限公司 Protection system for aging and life test of semiconductor laser

Also Published As

Publication number Publication date
CN103983424A (en) 2014-08-13

Similar Documents

Publication Publication Date Title
Dubietis et al. Ultrafast supercontinuum generation in bulk condensed media (Invited Review)
Yu et al. Spontaneous pulse formation in edgeless photonic crystal resonators
Anderson et al. Observations of spatiotemporal instabilities of temporal cavity solitons
Ravi et al. Pulse sequences for efficient multi-cycle terahertz generation in periodically poled lithium niobate
Jankowski et al. Dispersion-engineered nanophotonics: a flexible tool for nonclassical light
US7113325B1 (en) Wavelength conversion method with improved conversion efficiency
Yu et al. Gigahertz acousto-optic modulation and frequency shifting on etchless lithium niobate integrated platform
Petrov et al. High repetition rate traveling wave optical parametric generator producing nearly bandwidth limited 50 fs infrared light pulses
CN103983424B (en) Solid state laser life test apparatus
US7978319B2 (en) Optical switching method and optical switch
CN104498677A (en) Rapid thermal processing equipment for high-throughput microcells and thermal processing method of rapid thermal processing equipment
Wu et al. Biaxial crystal β-BaTeMo 2 O 9: theoretical analysis and the feasibility as high-efficiency acousto-optic Q-switch
Welch et al. Long-wave infrared picosecond parametric amplifier based on Raman shifter technology
Sośnicki et al. Interface between picosecond and nanosecond quantum light pulses
Ren et al. Intramolecular Vibration Energy-Transfer-Driven Cascaded Stimulated Raman Scattering and Four-Wave Mixing in Benzene Series
CN102841480A (en) All-optical wavelength converter based on photonic crystal optical fiber four-wave frequency mixing effect
CN106019642A (en) Electro-optical modulation device
Zhu et al. Wide-range tunable wavelength filter in periodically poled lithium niobate
CN113984339A (en) Laser power calibration method, device, equipment and computer readable storage medium
Qu et al. Improving photon antibunching with two dipole-coupled atoms in whispering-gallery-mode microresonators
CN109375448B (en) Polarization controller based on frequency up-conversion technology and working method thereof
CN104283105A (en) Method for compensating for phase mismatching caused by temperature variation through harmonic wave conversion device
Bailey et al. Surface damage of (−) 2-(α-methylbenzylamino)-5-nitropyridine single crystals induced by pulsed laser radiation
US9778543B1 (en) Parametric mixer having tunable gain bands and method for tuning the same
CN108155553B (en) Fine adjustable optical parametric oscillator with fast gain band switching

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant