CN104280693A - Life curve testing device for LED lamp and testing method thereof - Google Patents

Life curve testing device for LED lamp and testing method thereof Download PDF

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Publication number
CN104280693A
CN104280693A CN201410441153.XA CN201410441153A CN104280693A CN 104280693 A CN104280693 A CN 104280693A CN 201410441153 A CN201410441153 A CN 201410441153A CN 104280693 A CN104280693 A CN 104280693A
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China
Prior art keywords
led lamp
luminous flux
integrating sphere
life curve
constant
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CN201410441153.XA
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Chinese (zh)
Inventor
许国永
黄德中
阮峰
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ZHEJIANG TIANEN SOLAR ENERGY TECHNOLOGY Co Ltd
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ZHEJIANG TIANEN SOLAR ENERGY TECHNOLOGY Co Ltd
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Priority to CN201410441153.XA priority Critical patent/CN104280693A/en
Publication of CN104280693A publication Critical patent/CN104280693A/en
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Abstract

The invention discloses a life curve testing device for an LED lamp and a testing method of the life curve testing device for the LED lamp. The life curve testing device for the LED lamp comprises a computer, a spectrograph, an integrating sphere, a constant-current power supply and a PID temperature controller. A constant-temperature box is installed on one side of the integrating sphere. The LED lamp, an electric heating tube and a thermocouple temperature sensor are installed in the constant-temperature box. The PID temperature controller is connected with the electric heating tube and the thermocouple temperature sensor. The constant-current power source is connected with the LED lamp through a circuit. A baffle is installed on one other side of the integrating sphere. A luminous flux sensor is installed on the side, with the baffle, of the integrating sphere. The luminous flux sensor is connected with the spectrograph. The spectrograph is connected with the computer. According to the life curve testing device for the LED lamp and the testing method of the life curve testing device for the LED lamp, the structure is simple, operation is convenient, the luminous flux is tested through different currents, and therefore the service life of the LED lamp can be accurately and comprehensively measured.

Description

A kind of LED lamp life curve proving installation and method of testing thereof
Technical field
The present invention relates to a kind of LED lamp life curve proving installation and method of testing thereof.
Background technology
LED lamp has the advantages such as energy-conservation, the life-span is long, is commercially widely used.The energy consumption of white LED lamp is only 1/10 of incandescent lamp, and namely under equal-wattage, brightness is 10 times of incandescent lamp, than traditional incandescent lamp node more than 80%.And the energy consumption of white LED lamp is 1/4 of electricity-saving lamp, namely under equal-wattage, brightness is 4 times of electricity-saving lamp.The LED life-span can reach more than 100,000 hours, is more than 50 times of traditional tungsten lamp, and LED uses the serviceable life that can have more than 10 years in 24 hours.
Life-span of LED is generally defined as the time that 5O% that output light flux decays to initial value experiences.Have the patent of multiple test LED performance at present, the such as patent No. is CN201320194588.X, and patent name is LED endurance testing device; The patent No. is CN201220078560.5, and patent name is the patents such as a kind of LED life test LED stationary installation.But these patents all do not measure luminous flux with integrating sphere, luminous flux is the major parameter of LED, measures all not accurate enough.The such as patent No. is CN201210055631.4, and patent name is a kind of LED life-span test system and method for testing thereof, and it not to get off test light flux with different electric current, makes each test not comprehensive too.
Summary of the invention
For solving the problem, the object of the present invention is to provide a kind of LED lamp life curve proving installation and method of testing thereof, its structure is simple, easy to operate, and by different testing current luminous flux, thus accurately, comprehensively measure serviceable life of LED lamp.
The present invention reaches above-mentioned object, and the present invention adopts following technical scheme:
A kind of LED lamp life curve proving installation, comprise computing machine, spectrometer, integrating sphere, constant-current supply, PID temperature controller, in wherein said integrating sphere, side is provided with constant temperature oven, LED lamp, electric heating tube, thermocouple temperature sensor is separately installed with in described constant temperature oven, described PID temperature controller is connected with electric heating tube, thermocouple temperature sensor circuit respectively, and described constant-current supply is connected with LED lamp circuit; In described integrating sphere, opposite side is provided with baffle plate; The described integrating sphere being provided with baffle plate side is provided with luminous flux sensor, and described luminous flux sensor is connected with spectrometer, and described spectrometer is connected with computing machine.
Described PID temperature controller adopts temperature to be 30-80 PID temperature controllers of spending.
In described integrating sphere, side is provided with mounting bracket, and described mounting bracket is provided with constant temperature oven.
Described integrating sphere is provided with handle.
Described luminous flux sensor is connected with spectrometer by optical fiber.
A detection method for LED lamp life curve proving installation, comprises the steps: the power switch first opening LED lamp; Then set reference current value by stabilized power source, PID temperature controller is by the temperature in electric heating tube, thermocouple temperature sensor setting constant temperature oven; Then the light of LED lamp is launched in integrating sphere, and utilizing emitted light is transported to computing machine by baffle plate, luminous flux sensor, spectrometer successively, after computing machine accepts and the time that to measure luminous flux be normal value when being 50%; Then reference current value is increased by stabilized power source, the time that when different reference current value measured respectively by computing machine, the luminous flux of LED lamp is normal value when being 50%; Time when be normal value being finally 50% according to reference current value and luminous flux draw LED life-span-current curve.
Beneficial effect of the present invention is: the invention provides a kind of LED lamp life curve proving installation and method of testing thereof, and its structure is simple, easy to operate, and by different testing current luminous flux, thus accurately, comprehensively measure serviceable life of LED lamp.
Accompanying drawing explanation
Fig. 1 is structural representation of the present invention.
Embodiment
Embodiment 1
As shown in Figure 1, the present embodiment provides a kind of LED lamp life curve proving installation, comprises computing machine 1, spectrometer 2, integrating sphere 5, constant-current supply 12, PID temperature controller.In described integrating sphere 5, side is provided with mounting bracket 15, and described mounting bracket 15 is provided with constant temperature oven 8.LED lamp 9, electric heating tube 10, thermocouple temperature sensor 14 is separately installed with in described constant temperature oven 8, described PID temperature controller is connected with electric heating tube 10, thermocouple temperature sensor 14 circuit respectively, and described constant-current supply 12 is connected with LED lamp 9 circuit.In described integrating sphere 5, opposite side is provided with baffle plate 6.The described integrating sphere 5 being provided with baffle plate 6 side is provided with luminous flux sensor 4, and described luminous flux sensor 4 is connected with spectrometer 2 by optical fiber 3, and described spectrometer 2 is connected with computing machine 1.Described PID temperature controller adopts temperature to be 30-80 PID temperature controllers 13 of spending.Described integrating sphere 5 is provided with handle 7.
A detection method for LED lamp life curve proving installation, comprises the steps: the power switch first opening LED lamp 9; Then set reference current value by stabilized power source 12, PID temperature controller 13 sets the temperature in constant temperature oven 8 by electric heating tube 10, thermocouple temperature sensor 14; Then the light of LED lamp 9 is launched in integrating sphere 5, and utilizing emitted light is transported to computing machine 1 by baffle plate 6, luminous flux sensor 4, spectrometer 2 successively, after computing machine 1 accepts and the time that to measure luminous flux be normal value when being 50%; Then reference current value is increased by stabilized power source 12, the time that when different reference current value measured respectively by computing machine 1, the luminous flux of LED lamp 9 is normal value when being 50%; Time when be normal value being finally 50% according to reference current value and luminous flux draw LED life-span-current curve.
A kind of LED lamp life curve proving installation described in the present embodiment and method of testing thereof, its structure is simple, easy to operate, and by different testing current luminous flux, thus accurately, comprehensively measure serviceable life of LED lamp.

Claims (6)

1. a LED lamp life curve proving installation, it is characterized in that: comprise computing machine (1), spectrometer (2), integrating sphere (5), constant-current supply (12), PID temperature controller, wherein said integrating sphere (5) interior side is provided with constant temperature oven (8), LED lamp (9) is separately installed with in described constant temperature oven (8), electric heating tube (10), thermocouple temperature sensor (14), described PID temperature controller respectively with electric heating tube (10), thermocouple temperature sensor (14) circuit is connected, described constant-current supply (12) is connected with LED lamp (9) circuit, described integrating sphere (5) interior opposite side is provided with baffle plate (6), the described integrating sphere (5) being provided with baffle plate (6) side is provided with luminous flux sensor (4), and described luminous flux sensor (4) is connected with spectrometer (2), and described spectrometer (2) is connected with computing machine (1).
2. a kind of LED lamp life curve proving installation according to claim 1, is characterized in that: described PID temperature controller adopts temperature to be 30-80 PID temperature controllers (13) of spending.
3. a kind of LED lamp life curve proving installation according to claim 1, is characterized in that: described integrating sphere (5) interior side is provided with mounting bracket (15), described mounting bracket (15) is provided with constant temperature oven (8).
4. a kind of LED lamp life curve proving installation according to claim 1, is characterized in that: described integrating sphere (5) is provided with handle (7).
5. a kind of LED lamp life curve proving installation according to claim 1, is characterized in that: described luminous flux sensor (4) is connected with spectrometer (2) by optical fiber (3).
6. the detection method of a kind of LED lamp life curve proving installation according to claim 1, is characterized in that the power switch comprising the steps: first to open LED lamp (9); Then by stabilized power source (12) setting reference current value, PID temperature controller (13) is by the temperature in electric heating tube (10), thermocouple temperature sensor (14) setting constant temperature oven (8); Then the light of LED lamp (9) is launched in integrating sphere (5), utilizing emitted light is transported to computing machine (1) by baffle plate (6), luminous flux sensor (4), spectrometer (2) successively, after computing machine (1) accepts and the time that to measure luminous flux be normal value when being 50%; Then reference current value is increased by stabilized power source (12), the time that when different reference current value measured respectively by computing machine (1), the luminous flux of LED lamp (9) is normal value when being 50%; Time when be normal value being finally 50% according to reference current value and luminous flux draw LED life-span-current curve.
CN201410441153.XA 2014-09-02 2014-09-02 Life curve testing device for LED lamp and testing method thereof Pending CN104280693A (en)

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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106501702A (en) * 2016-12-31 2017-03-15 上海复展智能科技股份有限公司 The gentle radioactivity detection, identificationm, and computation of VUV LED junction based on integrating sphere
CN107544037A (en) * 2016-06-28 2018-01-05 广州固佳灯具科技有限公司 A kind of LED lamp light decay fast calculates mode
CN108132552A (en) * 2018-02-09 2018-06-08 国网江苏省电力有限公司电力科学研究院 A kind of Online and how to use test device of liquid crystal display device temperature performance
CN108663178A (en) * 2017-04-01 2018-10-16 厦门通士达照明有限公司 A kind of lamps and lanterns air leakage detection system
CN111220295A (en) * 2018-11-26 2020-06-02 中国科学院长春光学精密机械与物理研究所 Automatic detection equipment and measurement method for non-contact measurement of junction temperature of LED lamp
CN112114271A (en) * 2020-08-24 2020-12-22 厦门多彩光电子科技有限公司 Method for evaluating quality of LED chip

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010073785A1 (en) * 2008-12-24 2010-07-01 浜松ホトニクス株式会社 Spectrometer
CN201607524U (en) * 2009-12-31 2010-10-13 重庆四联启蓝半导体照明有限公司 System for testing service life of LED luminaire
CN102590763A (en) * 2012-03-05 2012-07-18 深圳市迈昂科技有限公司 LED (light emitting diode) service life test system and test method thereof
CN102829890A (en) * 2012-08-07 2012-12-19 陕西科技大学 Device and method for measuring junction temperature of LED (light emitting diode)
CN103267588A (en) * 2013-06-05 2013-08-28 常州工学院 Junction temperature testing device and junction temperature testing method based on temperature variation of LED (light-emitting diode) relative spectrum
CN203299341U (en) * 2013-04-15 2013-11-20 邓俊慎 LED lifetime testing device

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010073785A1 (en) * 2008-12-24 2010-07-01 浜松ホトニクス株式会社 Spectrometer
CN201607524U (en) * 2009-12-31 2010-10-13 重庆四联启蓝半导体照明有限公司 System for testing service life of LED luminaire
CN102590763A (en) * 2012-03-05 2012-07-18 深圳市迈昂科技有限公司 LED (light emitting diode) service life test system and test method thereof
CN102829890A (en) * 2012-08-07 2012-12-19 陕西科技大学 Device and method for measuring junction temperature of LED (light emitting diode)
CN203299341U (en) * 2013-04-15 2013-11-20 邓俊慎 LED lifetime testing device
CN103267588A (en) * 2013-06-05 2013-08-28 常州工学院 Junction temperature testing device and junction temperature testing method based on temperature variation of LED (light-emitting diode) relative spectrum

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
HUANG DEZHONG等: "Test Systems for Life of LED Light Based on Junction Temperature", 《ADVANCED MATERIALS RESEARCH》 *
张伟等: "LED照明产品寿命测试评价方法研究进展", 《照明工程学报》 *

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107544037A (en) * 2016-06-28 2018-01-05 广州固佳灯具科技有限公司 A kind of LED lamp light decay fast calculates mode
CN106501702A (en) * 2016-12-31 2017-03-15 上海复展智能科技股份有限公司 The gentle radioactivity detection, identificationm, and computation of VUV LED junction based on integrating sphere
CN106501702B (en) * 2016-12-31 2023-08-01 上海复展智能科技股份有限公司 Vacuum ultraviolet LED junction temperature and radiation measurement system based on integrating sphere
CN108663178A (en) * 2017-04-01 2018-10-16 厦门通士达照明有限公司 A kind of lamps and lanterns air leakage detection system
CN108663178B (en) * 2017-04-01 2023-09-29 厦门通士达照明有限公司 Lamp air leakage detection system
CN108132552A (en) * 2018-02-09 2018-06-08 国网江苏省电力有限公司电力科学研究院 A kind of Online and how to use test device of liquid crystal display device temperature performance
CN108132552B (en) * 2018-02-09 2023-11-24 国网江苏省电力有限公司电力科学研究院 Online testing device for temperature performance of liquid crystal display device and using method
CN111220295A (en) * 2018-11-26 2020-06-02 中国科学院长春光学精密机械与物理研究所 Automatic detection equipment and measurement method for non-contact measurement of junction temperature of LED lamp
CN112114271A (en) * 2020-08-24 2020-12-22 厦门多彩光电子科技有限公司 Method for evaluating quality of LED chip

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Application publication date: 20150114