CN104414667A - 去除残余电荷的方法、使用其的x射线成像方法和装置 - Google Patents

去除残余电荷的方法、使用其的x射线成像方法和装置 Download PDF

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Publication number
CN104414667A
CN104414667A CN201410448597.6A CN201410448597A CN104414667A CN 104414667 A CN104414667 A CN 104414667A CN 201410448597 A CN201410448597 A CN 201410448597A CN 104414667 A CN104414667 A CN 104414667A
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CN
China
Prior art keywords
voltage
ray
photoconductor material
photoconductor
control unit
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Pending
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CN201410448597.6A
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English (en)
Chinese (zh)
Inventor
金暎
金善日
朴宰彻
李彊昈
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Samsung Electronics Co Ltd
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Samsung Electronics Co Ltd
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Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of CN104414667A publication Critical patent/CN104414667A/zh
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H05G1/30—Controlling
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G15/00—Apparatus for electrographic processes using a charge pattern
    • G03G15/22—Apparatus for electrographic processes using a charge pattern involving the combination of more than one step according to groups G03G13/02 - G03G13/20
    • G03G15/221—Machines other than electrographic copiers, e.g. electrophotographic cameras, electrostatic typewriters
    • G03G15/222—Machines for handling xeroradiographic images, e.g. xeroradiographic processors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/191—Photoconductor image sensors
    • H10F39/195—X-ray, gamma-ray or corpuscular radiation imagers

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  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Toxicology (AREA)
  • Engineering & Computer Science (AREA)
  • Medical Informatics (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Optics & Photonics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Biomedical Technology (AREA)
  • Biophysics (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Solid State Image Pick-Up Elements (AREA)
CN201410448597.6A 2013-09-04 2014-09-04 去除残余电荷的方法、使用其的x射线成像方法和装置 Pending CN104414667A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR20130106307A KR20150027636A (ko) 2013-09-04 2013-09-04 잔류 전하 제거 방법, 이 방법을 이용한 엑스선 영상 촬영 방법 및 장치
KR10-2013-0106307 2013-09-04

Publications (1)

Publication Number Publication Date
CN104414667A true CN104414667A (zh) 2015-03-18

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CN201410448597.6A Pending CN104414667A (zh) 2013-09-04 2014-09-04 去除残余电荷的方法、使用其的x射线成像方法和装置

Country Status (5)

Country Link
US (1) US9961754B2 (https=)
EP (1) EP2846199A1 (https=)
KR (1) KR20150027636A (https=)
CN (1) CN104414667A (https=)
IN (1) IN2014DE02527A (https=)

Cited By (1)

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CN105655364A (zh) * 2015-12-28 2016-06-08 上海奕瑞光电子科技有限公司 一种基于行间重叠的电荷补偿方法

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KR102116321B1 (ko) * 2013-12-04 2020-05-28 주식회사 레이언스 엑스선 디텍터 및 이를 이용한 엑스선 영상장치와 이의 구동방법
KR20160047314A (ko) * 2014-10-22 2016-05-02 삼성전자주식회사 방사선 검출기 및 방사선 검출기 구동 방법
CN111107285B (zh) * 2018-10-29 2022-04-12 和鑫光电股份有限公司 X光探测器以及使用x光探测器拍摄影像的方法
CN113710495B (zh) 2019-04-03 2023-05-09 株式会社理光 液体排出装置和液体排出设备
US11245860B2 (en) * 2019-12-13 2022-02-08 Varian Medical Systems International Ag Reduction of image lag in an X-ray detector panel
KR102874593B1 (ko) * 2020-09-17 2025-10-22 엘지디스플레이 주식회사 디지털 엑스레이 검출기 및 그의 구동 방법
WO2025080048A1 (ko) * 2023-10-13 2025-04-17 주식회사 레이언스 엑스선 디텍터
KR20250177182A (ko) * 2024-06-14 2025-12-23 주식회사 레이언스 X선 디텍터
KR20250179393A (ko) * 2024-06-21 2025-12-30 세심광전자기술(주) 이종 광도전부를 포함하는 액정 엑스선 검출기 및 이를 이용한 엑스선 검출방법

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US5969360A (en) * 1997-11-26 1999-10-19 Direct Radiography Corp. Readout sequence for residual image elimination in a radiation detection panel
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KR100361470B1 (ko) 1999-12-31 2002-11-21 엘지.필립스 엘시디 주식회사 엑스-선 이미지 촬영장치 및 그 구동방법
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105655364A (zh) * 2015-12-28 2016-06-08 上海奕瑞光电子科技有限公司 一种基于行间重叠的电荷补偿方法
CN105655364B (zh) * 2015-12-28 2018-09-25 上海奕瑞光电子科技股份有限公司 一种基于行间重叠的电荷补偿方法

Also Published As

Publication number Publication date
KR20150027636A (ko) 2015-03-12
EP2846199A1 (en) 2015-03-11
IN2014DE02527A (https=) 2015-06-26
US20150063544A1 (en) 2015-03-05
US9961754B2 (en) 2018-05-01

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Application publication date: 20150318