CN104406775A - Spectroscopless measuring optical system - Google Patents

Spectroscopless measuring optical system Download PDF

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Publication number
CN104406775A
CN104406775A CN201410737215.1A CN201410737215A CN104406775A CN 104406775 A CN104406775 A CN 104406775A CN 201410737215 A CN201410737215 A CN 201410737215A CN 104406775 A CN104406775 A CN 104406775A
Authority
CN
China
Prior art keywords
graticule
optical system
lens group
spectroscope
visible
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201410737215.1A
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Chinese (zh)
Inventor
付新国
章明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Institute of Optics and Electronics of CAS
Original Assignee
Institute of Optics and Electronics of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Institute of Optics and Electronics of CAS filed Critical Institute of Optics and Electronics of CAS
Priority to CN201410737215.1A priority Critical patent/CN104406775A/en
Publication of CN104406775A publication Critical patent/CN104406775A/en
Pending legal-status Critical Current

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Abstract

The invention provides a spectroscopless measuring optical system which comprises a light source, a condenser, a reticle with a reflecting surface, a focusing lens group and a reflector. The system does not have a spectroscope of a common measuring optical system, can completely reflect light reflected from a measuring light path to a receiving system, the light energy loss only depends on the transmittance of a lens group and the reflectivity of a measured piece, and the energy loss is obviously reduced; in addition, the biggest benefit is that when the optical system is used in an infrared light path, the system can be adjusted by using visible light when being adjusted due to the fact that no spectroscope is arranged in the system, and great convenience is brought to assembly.

Description

A kind of without spectroscope measurement optical system
Technical field
The present invention relates to the technical field of optical system centering device and adjustment thereof, be specifically related to a kind of without spectroscope measurement optical system.
Background technology
For high-precision optical system, errors of centration can make the actual optical axis off-design optical axis of optical device, destroys the aberration correction state of optical design, thus has a strong impact on resolving power, the imaging performance such as distortion and contrast of optical system.
Measuring optical system without spectroscope is core light path in optical system centering device, is used to measure and the errors of centration of calibrating optical device.
If adopt beam splitter optical system, light path form is as Fig. 1, and the light that light source 1 sends is focused at through condenser 2 and is coated with on the graticule 3 of semi-transparent semi-reflecting film, arrives after measured lens group 6 be reflected back toward graticule 3 through focusing lens group 4, in final arrival recording geometry 5.There are two large major defects in which: one is due to semi-transparent semi-reflecting spectroscopical existence, have lost luminous energy greatly, the luminous energy especially after measured lens, makes observation graticule picture become very difficult; Two is which is difficult to be applicable in non-visible light path.
Summary of the invention
The technical problem to be solved in the present invention is: the optical system measuring light path providing a kind of practicality.
The object of the present invention is achieved like this: a kind of without spectroscope measurement optical system, comprises light source, condenser, graticule, focusing lens group and catoptron with reflecting surface; Light source illuminates graticule through condenser, and graticule picture after focusing lens group arrival measured lens is reflected, then through focusing lens group, reflexes to catoptron through graticule, after catoptron reflection in final arrival recording geometry.
Further, wherein with the non-visible light graticule that the graticule of reflecting surface is with reflectance coating, now this system is applicable in non-visible light path, or is the visible ray graticule with reflectance coating with the graticule of reflecting surface, is now applicable in Visible optical trains.
Further, described graticule lower surface is coated with reflectance coating, is bright crosshair in Visible optical trains; It is logical light aperture in non-visible light path.
Further, described catoptron is right cylinder.
The advantage that the present invention compared with prior art has is:
(1), the energy loss that present invention substantially reduces in light path advance process, therefore bring great convenience to observation;
(2), the present invention fundamentally solves the feasibility implementing light splitting in non-visible light path;
(3), the present invention is not only applicable to visible light optical system, is applicable to non-visible optical system yet.
Accompanying drawing explanation
Fig. 1 be prior art containing spectroscopical measurement optical system schematic diagram;
Fig. 2 is of the present invention without spectroscopical measurement optical system schematic diagram;
In figure, 1 be light source, 2 is condenser, 3 is be spectroscope with the graticule, 31 of reflecting surface, 32 be semi-transparent semi-reflecting film, 301 be non-visible light graticule, 302 be visible ray graticule, 303 be reflectance coating, 4 be focusing lens group, 5 be catoptron, 6 be recording geometry, 7 be measured lens.
Embodiment
Below in conjunction with accompanying drawing, the specific embodiment of the present invention is described in further detail.
As shown in Figure 2, of the present invention a kind of without spectroscope measurement optical system, comprise light source 1, condenser 2, graticule 3, focusing lens group 4 and catoptron 5 with reflecting surface.Graticule 3 with reflecting surface is the non-visible light graticule 301 with reflectance coating 303, or is the visible ray graticule 302 with reflectance coating 303.The light 1 that described light source sends converges on graticule 3 through condenser 2, the graticule target be illuminated changes vertical arrival measured lens 7 surface after light path convergence through focusing lens group 4, reflect Hou Yuan road through measured lens 7 and be back to graticule 3 lower surface, graticule 3 the most at last light path reflexes in recording geometry 6, in recording geometry by measuring reticle return picture draw circle amount adjustment is completed to measured lens group.
Non-elaborated part of the present invention belongs to the known technology of those skilled in the art.
Those of ordinary skill in the art will be appreciated that, above embodiment is only used to the present invention is described, and be not used as limitation of the invention, as long as in spirit of the present invention, change the above embodiment, modification all will drop in the scope of claims of the present invention.

Claims (4)

1. measure an optical system without spectroscope, it is characterized in that: comprise light source (1), condenser (2), graticule (3), focusing lens group (4) and catoptron (5) with reflecting surface; Light source (1) illuminates graticule (3) through condenser (2), graticule picture is after focusing lens group (4) arrival measured lens (7) is reflected, again through focusing lens group (4), reflex to catoptron (5) through graticule (3), finally arrive in recording geometry (6) after catoptron (5) reflection.
2. according to claim 1 without spectroscope measurement optical system, it is characterized in that: wherein with the non-visible light graticule (301) that the graticule (3) of reflecting surface is with reflectance coating (303), now this system is applicable in non-visible light path, or the graticule (3) with reflecting surface is the visible ray graticule (302) with reflectance coating (303), is now applicable in Visible optical trains.
3. according to claim 1 without spectroscope measurement optical system, it is characterized in that: described graticule (3) lower surface is coated with reflectance coating (303), be bright crosshair in Visible optical trains; It is logical light aperture in non-visible light path.
4. according to claim 1 without spectroscope measurement optical system, it is characterized in that: described catoptron (5) is right cylinder.
CN201410737215.1A 2014-12-04 2014-12-04 Spectroscopless measuring optical system Pending CN104406775A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201410737215.1A CN104406775A (en) 2014-12-04 2014-12-04 Spectroscopless measuring optical system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410737215.1A CN104406775A (en) 2014-12-04 2014-12-04 Spectroscopless measuring optical system

Publications (1)

Publication Number Publication Date
CN104406775A true CN104406775A (en) 2015-03-11

Family

ID=52644422

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201410737215.1A Pending CN104406775A (en) 2014-12-04 2014-12-04 Spectroscopless measuring optical system

Country Status (1)

Country Link
CN (1) CN104406775A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109445122A (en) * 2018-12-18 2019-03-08 长沙韶光铬版有限公司 A kind of reflection-type graticle and preparation method thereof
CN110413009A (en) * 2019-07-24 2019-11-05 中国工程物理研究院激光聚变研究中心 A kind of sighting system

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
邓仁杰等: "光学组件中心偏的自动测试", 《计量与测试技术》 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109445122A (en) * 2018-12-18 2019-03-08 长沙韶光铬版有限公司 A kind of reflection-type graticle and preparation method thereof
CN110413009A (en) * 2019-07-24 2019-11-05 中国工程物理研究院激光聚变研究中心 A kind of sighting system

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Application publication date: 20150311

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