CN104392984B - A kind of electrostatic discharge protective circuit for being applied to power pin - Google Patents
A kind of electrostatic discharge protective circuit for being applied to power pin Download PDFInfo
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- CN104392984B CN104392984B CN201410757507.1A CN201410757507A CN104392984B CN 104392984 B CN104392984 B CN 104392984B CN 201410757507 A CN201410757507 A CN 201410757507A CN 104392984 B CN104392984 B CN 104392984B
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- drain electrode
- grid
- nmos tube
- pmos
- electrostatic
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- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Abstract
The invention discloses a kind of electrostatic discharge protective circuit for being applied to power pin.This circuit, to the response characteristic and metal-oxide-semiconductor gain characteristic quick response electrostatic of electrostatic, controls metal-oxide-semiconductor instantaneously to turn on by metal-oxide-semiconductor conducting resistance and electric capacity, opens electrostatic leakage path over the ground, completes electrostatic leakage, protects power pin not receive electrostatic damage.
Description
Technical field
The invention mainly relates to ESD Circuits Design for High field, a kind of electrostatic protection electricity for being applied to power pin is refered in particular to
Road.
Background technology
IC chip necessarily has electrostatic leakage with the interface in the external world(ESD:electrostatic discharge)
Problem.When the electrical body of a high potential touches the outer pin of circuit, electrostatic leakage phenomenon will occur.Because chip is every
Individual input or the electric capacity very little of output pin, so the voltage that ESD is produced is very big, the device that may be damaged on chip causes core
Piece fails.
In order to mitigate the problem of ESD, chip I/O would generally use esd protection circuit, and typically external charge is discharged pincers
VDD or GND is arrived in position, so as to limit the voltage being added on chip internal circuits.Because ESD circuit structures in itself are different,
Some serious problems are have also been introduced while protection circuit, one is esd protection circuit introduces phase and between VDD over the ground in node
When big electric capacity, the matching degree of operating rate and circuit input/output port is reduced;The second is ESD device can be by power supply and ground
Noise coupling on signal to circuit input, so as to have impact on the quality of signal;The third is if ESD circuit design is improper, can
Be able to can cause to cause cmos circuit that latch-up occurs in electrostatic leakage.
The content of the invention
The problem to be solved in the present invention is that:For the technical problem that prior art is present, propose that one kind is applied to electricity
The electrostatic discharge protective circuit of source capsule pin.
Solution proposed by the present invention is:This circuit passes through the response characteristic of metal-oxide-semiconductor conducting resistance and electric capacity to electrostatic
And metal-oxide-semiconductor gain characteristic, control metal-oxide-semiconductor instantaneously to turn on, electrostatic leakage path over the ground is opened, complete electrostatic leakage, protection
Power pin does not receive electrostatic damage.
Brief description of the drawings
Fig. 1 is circuit theory schematic diagram of the invention.
Specific embodiment
The present invention is described in further details below with reference to accompanying drawing and specific implementation.
As shown in Figure 1:
When VDD pins do not have electrostatic to attack
Phase inverter U1Input be high level, be output as low level, then M9Conducting;M3、M4、M5、M6、M7、M8Form one directly
Stream biasing so that M10Conducting, M11It is down that is, conducting resistance is very big, it is ensured that M than pipe11Drain electrode be high level, then M0Grid
It is low level, M0Cut-off, due to M5、M6、M7、M11Conducting resistance it is very big, so quiescent current can be ignored;
When VDD pins are subject to positive electrostatic to attack
VDD moments uprise, M5、M6、M7Forward bias voltage it is very big, conducting resistance very little, M8Grid be pulled low, M10
Grid uprise, M10Cut-off, M11Conducting causes M15Grid step-down, M0Grid uprise, M0Conducting, completes electrostatic leakage, M18
And M19Ensureing M0While can discharging, it is ensured that M0Grid voltage be unlikely to too high and puncture M0, cause tube failure;
When VDD pins are subject to negative electrostatic to attack
VDD moment step-downs, then it is now high level in logic that now the voltage of GND will be far above vdd voltage, i.e. GND;
M5、M6、M7Cut-off, due to electric capacity C1The characteristic that both end voltage will not be mutated so that M8Cut-off;M2Conducting causes phase inverter U1It is defeated
It is high level to enter, now U1Characteristic is no longer direction device, U1High level is output as, then M9Cut-off; M11Grid step-down, then M11Cut
Only;Now M17Turn on, then M15Grid be high level in logic, then M15Conducting, U2、U3Form voltage buffer, M18、M19
Cut-off, M0By M15Grid leak connection status is formed, electrostatic leakage path is formed, electric discharge is completed.
In sum, due to increased M3~M8And M14So that circuit can be to the electric discharge of electrostatic quick response simultaneously, circuit
Normal operating conditions can quickly be recovered, and due to increased M18、M19, greatly strengthen the reliability of circuit, i.e. this hair
It is bright to be rapidly completed electrostatic leakage, it is reliable to protect power pin not receive electrostatic damage.
Claims (1)
1. a kind of electrostatic discharge protective circuit for being applied to power pin, it is characterised in that:
Power pin signal VDD is connected to PMOS M1、M3、M4、M9、M13Source electrode and NMOS tube M0Drain electrode and electric capacity C1、
C2One end;Earth signal GND is connected to NMOS tube M2、M7、M8、M11、M15、M17、M19Source electrode and PMOS M16Drain electrode,
PMOS M1With NMOS tube M2Grounded-grid, drain electrode be connected to phase inverter U1Input, phase inverter U1Output be connected to PMOS
Pipe M9Grid;PMOS M3And M4Grid and PMOS M3Drain electrode and NMOS tube M5Drain electrode connection, NMOS tube M5、
M6、M7Grid be connected to power supply, M5Source electrode is connected to M6Drain electrode, M6Source electrode be connected to M7Drain electrode and NMOS tube M8's
Grid and electric capacity C1The other end;PMOS M4Drain electrode and NMOS tube M8Drain electrode be connected to PMOS M10Grid;PMOS
M9Drain electrode and PMOS M10Source electrode connection, M10Drain electrode and NMOS tube M11Drain electrode and NMOS tube M17Drain electrode be connected to
PMOS M13、M14Grid and NMOS tube M15Grid and electric capacity C2The other end, and M11It is down than pipe;NMOS tube M17's
Grounded-grid;PMOS M13Drain electrode be connected to PMOS M14、M16Source electrode, M14Drain electrode be connected to M15Drain electrode and M16
Grid and phase inverter U2Input, U2Output is connected to phase inverter U3Input, U3Output be connected to NMOS tube M18Grid
Pole and drain electrode and NMOS tube M0Grid, NMOS tube M18Source electrode be connected to NMOS tube M19Grid and drain electrode.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201410757507.1A CN104392984B (en) | 2014-12-12 | 2014-12-12 | A kind of electrostatic discharge protective circuit for being applied to power pin |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410757507.1A CN104392984B (en) | 2014-12-12 | 2014-12-12 | A kind of electrostatic discharge protective circuit for being applied to power pin |
Publications (2)
Publication Number | Publication Date |
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CN104392984A CN104392984A (en) | 2015-03-04 |
CN104392984B true CN104392984B (en) | 2017-05-31 |
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CN201410757507.1A Active CN104392984B (en) | 2014-12-12 | 2014-12-12 | A kind of electrostatic discharge protective circuit for being applied to power pin |
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Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103001205A (en) * | 2012-11-02 | 2013-03-27 | 长沙景嘉微电子股份有限公司 | Electrostatic protection circuit applied to power supply pin |
CN103022996A (en) * | 2011-09-21 | 2013-04-03 | 中芯国际集成电路制造(北京)有限公司 | Electronic static discharge protection circuit and electronic static discharge protection method |
CN103078305A (en) * | 2013-01-09 | 2013-05-01 | 北京大学 | Anti-false-triggering power supply clamp ESD (Electro-Static Discharge) protection circuit |
CN103219718A (en) * | 2012-01-18 | 2013-07-24 | 三星电子株式会社 | Electrostatic discharge protection circuit |
CN103646945A (en) * | 2013-12-03 | 2014-03-19 | 北京中电华大电子设计有限责任公司 | Integrated circuit power supply esd protection circuit |
-
2014
- 2014-12-12 CN CN201410757507.1A patent/CN104392984B/en active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103022996A (en) * | 2011-09-21 | 2013-04-03 | 中芯国际集成电路制造(北京)有限公司 | Electronic static discharge protection circuit and electronic static discharge protection method |
CN103219718A (en) * | 2012-01-18 | 2013-07-24 | 三星电子株式会社 | Electrostatic discharge protection circuit |
CN103001205A (en) * | 2012-11-02 | 2013-03-27 | 长沙景嘉微电子股份有限公司 | Electrostatic protection circuit applied to power supply pin |
CN103078305A (en) * | 2013-01-09 | 2013-05-01 | 北京大学 | Anti-false-triggering power supply clamp ESD (Electro-Static Discharge) protection circuit |
CN103646945A (en) * | 2013-12-03 | 2014-03-19 | 北京中电华大电子设计有限责任公司 | Integrated circuit power supply esd protection circuit |
Also Published As
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CN104392984A (en) | 2015-03-04 |
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