CN104294206A - 一种半导体装备用抗高温蠕变接地基片的制备方法 - Google Patents
一种半导体装备用抗高温蠕变接地基片的制备方法 Download PDFInfo
- Publication number
- CN104294206A CN104294206A CN201410528539.4A CN201410528539A CN104294206A CN 104294206 A CN104294206 A CN 104294206A CN 201410528539 A CN201410528539 A CN 201410528539A CN 104294206 A CN104294206 A CN 104294206A
- Authority
- CN
- China
- Prior art keywords
- ground connection
- connection substrate
- preparation
- high temperature
- temperature creep
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 54
- 239000004065 semiconductor Substances 0.000 title claims abstract description 27
- 238000002360 preparation method Methods 0.000 title claims abstract description 23
- 239000011159 matrix material Substances 0.000 claims abstract description 42
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 40
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 40
- 238000000576 coating method Methods 0.000 claims abstract description 32
- 239000011248 coating agent Substances 0.000 claims abstract description 28
- 238000005507 spraying Methods 0.000 claims abstract description 24
- 238000000034 method Methods 0.000 claims abstract description 14
- 229910045601 alloy Inorganic materials 0.000 claims abstract description 10
- 239000000956 alloy Substances 0.000 claims abstract description 10
- 238000010288 cold spraying Methods 0.000 claims abstract description 9
- 238000010438 heat treatment Methods 0.000 claims abstract description 6
- 239000000843 powder Substances 0.000 claims description 35
- 239000004411 aluminium Substances 0.000 claims description 31
- 239000007789 gas Substances 0.000 claims description 25
- 239000007921 spray Substances 0.000 claims description 18
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 8
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 6
- 239000003570 air Substances 0.000 claims description 6
- 230000000740 bleeding effect Effects 0.000 claims description 6
- 230000008602 contraction Effects 0.000 claims description 6
- 230000005514 two-phase flow Effects 0.000 claims description 6
- 230000008569 process Effects 0.000 claims description 5
- 239000010935 stainless steel Substances 0.000 claims description 5
- 229910001220 stainless steel Inorganic materials 0.000 claims description 5
- 229910052757 nitrogen Inorganic materials 0.000 claims description 4
- 244000137852 Petrea volubilis Species 0.000 claims description 3
- 229910000831 Steel Inorganic materials 0.000 claims description 3
- 229960000935 dehydrated alcohol Drugs 0.000 claims description 3
- 238000003032 molecular docking Methods 0.000 claims description 3
- 239000002245 particle Substances 0.000 claims description 3
- 238000005498 polishing Methods 0.000 claims description 3
- 238000002203 pretreatment Methods 0.000 claims description 3
- 239000007787 solid Substances 0.000 claims description 3
- 239000010959 steel Substances 0.000 claims description 3
- 238000010792 warming Methods 0.000 claims description 3
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 2
- 229910052799 carbon Inorganic materials 0.000 claims description 2
- 239000001307 helium Substances 0.000 claims description 2
- 229910052734 helium Inorganic materials 0.000 claims description 2
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 claims description 2
- 229910052751 metal Inorganic materials 0.000 abstract description 3
- 239000002184 metal Substances 0.000 abstract description 3
- 238000005516 engineering process Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 230000007704 transition Effects 0.000 description 4
- 230000005855 radiation Effects 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 238000001259 photo etching Methods 0.000 description 2
- 238000012876 topography Methods 0.000 description 2
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 description 1
- 229910000990 Ni alloy Inorganic materials 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 238000003912 environmental pollution Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 229910021645 metal ion Inorganic materials 0.000 description 1
- 239000013528 metallic particle Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 125000002347 octyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 238000004062 sedimentation Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4821—Flat leads, e.g. lead frames with or without insulating supports
- H01L21/4835—Cleaning, e.g. removing of solder
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C24/00—Coating starting from inorganic powder
- C23C24/02—Coating starting from inorganic powder by application of pressure only
- C23C24/04—Impact or kinetic deposition of particles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C4/00—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge
- C23C4/12—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge characterised by the method of spraying
- C23C4/137—Spraying in vacuum or in an inert atmosphere
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Plasma & Fusion (AREA)
- Coating By Spraying Or Casting (AREA)
- Other Surface Treatments For Metallic Materials (AREA)
Abstract
Description
Claims (7)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410528539.4A CN104294206B (zh) | 2014-10-09 | 2014-10-09 | 一种半导体装备用抗高温蠕变接地基片的制备方法 |
US14/789,966 US20160102394A1 (en) | 2014-10-09 | 2015-07-01 | Method for preparing grounding substrate for semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410528539.4A CN104294206B (zh) | 2014-10-09 | 2014-10-09 | 一种半导体装备用抗高温蠕变接地基片的制备方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN104294206A true CN104294206A (zh) | 2015-01-21 |
CN104294206B CN104294206B (zh) | 2016-05-04 |
Family
ID=52314152
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201410528539.4A Active CN104294206B (zh) | 2014-10-09 | 2014-10-09 | 一种半导体装备用抗高温蠕变接地基片的制备方法 |
Country Status (2)
Country | Link |
---|---|
US (1) | US20160102394A1 (zh) |
CN (1) | CN104294206B (zh) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104928625A (zh) * | 2015-05-22 | 2015-09-23 | 沈阳富创精密设备有限公司 | 一种pvd制备半导体装备用抗高温蠕变接地基片的方法 |
CN108085674A (zh) * | 2016-11-23 | 2018-05-29 | 中国科学院金属研究所 | 一种发动机汽缸用铝合金材料的制备方法 |
WO2020168679A1 (zh) * | 2019-02-22 | 2020-08-27 | 沈阳富创精密设备有限公司 | 一种ic装备等离子体刻蚀腔防护涂层的制备方法 |
CN113555287A (zh) * | 2021-07-22 | 2021-10-26 | 吉林建筑大学 | 一种水分触发降解的p型瞬态薄膜晶体管制备方法 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5956053B2 (ja) * | 2013-02-14 | 2016-07-20 | 株式会社島津製作所 | 微細パターニング用表面化学処理装置 |
US11167864B2 (en) * | 2018-04-27 | 2021-11-09 | The Boeing Company | Applying cold spray erosion protection to an airfoil |
CN114799201A (zh) * | 2022-05-05 | 2022-07-29 | 广东省科学院新材料研究所 | 收缩-扩展喷嘴及其制备方法、增材制造设备和方法 |
Citations (5)
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CN101767080A (zh) * | 2008-12-26 | 2010-07-07 | 中国科学院金属研究所 | 一种金属与塑料粉末混合制备涂层的方法及装置 |
CN102021586A (zh) * | 2009-09-15 | 2011-04-20 | 鞍钢股份有限公司 | 一种单面镀层钢板生产方法及其单面镀层钢板 |
CN102059218A (zh) * | 2010-12-14 | 2011-05-18 | 北京科技大学 | 一种聚合物基复合材料表面金属化涂层的制备方法及装置 |
CN102154639A (zh) * | 2011-03-10 | 2011-08-17 | 上海交通大学 | 基于铝粒子的冷喷涂沉积制备涂层的方法 |
US20140272459A1 (en) * | 2013-03-12 | 2014-09-18 | Lam Research Corporation | Corrosion resistant aluminum coating on plasma chamber components |
Family Cites Families (11)
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US6007592A (en) * | 1996-11-14 | 1999-12-28 | Nissan Chemical Industries, Ltd. | Polishing composition for aluminum disk and polishing process therewith |
US6150009A (en) * | 1998-08-07 | 2000-11-21 | Surface Technologies, Inc. | Decorative structural panel |
US6277235B1 (en) * | 1998-08-11 | 2001-08-21 | Novellus Systems, Inc. | In situ plasma clean gas injection |
WO2003014234A1 (en) * | 2001-08-03 | 2003-02-20 | Florida State University Research Foundation, Inc. | Composite polyelectrolyte films for corrosion control |
US20040101620A1 (en) * | 2002-11-22 | 2004-05-27 | Elmoursi Alaa A. | Method for aluminum metalization of ceramics for power electronics applications |
US7534301B2 (en) * | 2004-09-21 | 2009-05-19 | Applied Materials, Inc. | RF grounding of cathode in process chamber |
US20060121187A1 (en) * | 2004-12-03 | 2006-06-08 | Haynes Jeffrey D | Vacuum cold spray process |
DE102006023483A1 (de) * | 2006-05-18 | 2007-11-22 | Linde Ag | Vorrichtung zum Kaltgasspritzen |
US10441962B2 (en) * | 2012-10-29 | 2019-10-15 | South Dakota Board Of Regents | Cold spray device and system |
KR102126275B1 (ko) * | 2013-05-03 | 2020-06-25 | 삼성디스플레이 주식회사 | 기판정렬장치 및 이를 이용한 기판절단장치 |
US9663870B2 (en) * | 2013-11-13 | 2017-05-30 | Applied Materials, Inc. | High purity metallic top coat for semiconductor manufacturing components |
-
2014
- 2014-10-09 CN CN201410528539.4A patent/CN104294206B/zh active Active
-
2015
- 2015-07-01 US US14/789,966 patent/US20160102394A1/en not_active Abandoned
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101767080A (zh) * | 2008-12-26 | 2010-07-07 | 中国科学院金属研究所 | 一种金属与塑料粉末混合制备涂层的方法及装置 |
CN102021586A (zh) * | 2009-09-15 | 2011-04-20 | 鞍钢股份有限公司 | 一种单面镀层钢板生产方法及其单面镀层钢板 |
CN102059218A (zh) * | 2010-12-14 | 2011-05-18 | 北京科技大学 | 一种聚合物基复合材料表面金属化涂层的制备方法及装置 |
CN102154639A (zh) * | 2011-03-10 | 2011-08-17 | 上海交通大学 | 基于铝粒子的冷喷涂沉积制备涂层的方法 |
US20140272459A1 (en) * | 2013-03-12 | 2014-09-18 | Lam Research Corporation | Corrosion resistant aluminum coating on plasma chamber components |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104928625A (zh) * | 2015-05-22 | 2015-09-23 | 沈阳富创精密设备有限公司 | 一种pvd制备半导体装备用抗高温蠕变接地基片的方法 |
TWI567212B (zh) * | 2015-05-22 | 2017-01-21 | Shenyang Fortune Precision Equipment Co Ltd | A Method for Preparing High Temperature Creep Grounding Substrate for Semiconductor Equipment by PVD |
CN104928625B (zh) * | 2015-05-22 | 2017-06-16 | 沈阳富创精密设备有限公司 | 一种pvd制备半导体装备用抗高温蠕变接地基片的方法 |
KR101873633B1 (ko) * | 2015-05-22 | 2018-08-02 | 선양 포춘 프리시전 이큅먼트 컴퍼니., 리미티드. | Pvd를 이용한 반도체 장비용 내열 크리프 접지칩 제조방법 |
CN108085674A (zh) * | 2016-11-23 | 2018-05-29 | 中国科学院金属研究所 | 一种发动机汽缸用铝合金材料的制备方法 |
CN108085674B (zh) * | 2016-11-23 | 2020-01-03 | 中国科学院金属研究所 | 一种发动机汽缸用铝合金材料的制备方法 |
WO2020168679A1 (zh) * | 2019-02-22 | 2020-08-27 | 沈阳富创精密设备有限公司 | 一种ic装备等离子体刻蚀腔防护涂层的制备方法 |
CN113555287A (zh) * | 2021-07-22 | 2021-10-26 | 吉林建筑大学 | 一种水分触发降解的p型瞬态薄膜晶体管制备方法 |
CN113555287B (zh) * | 2021-07-22 | 2022-05-24 | 吉林建筑大学 | 一种水分触发降解的p型瞬态薄膜晶体管制备方法 |
Also Published As
Publication number | Publication date |
---|---|
US20160102394A1 (en) | 2016-04-14 |
CN104294206B (zh) | 2016-05-04 |
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Inventor after: Xiong Tianying Inventor after: Tang Weidong Inventor after: Han Xuecheng Inventor after: Gu Xinhai Inventor after: Liu Weijie Inventor after: Wu Jie Inventor after: Wang Jiqiang Inventor after: Shen Yanfang Inventor after: Cui Xinyu Inventor after: Mao Tianliang Inventor after: Li Ming Inventor after: Wu Minjie Inventor after: Li Maocheng Inventor before: Wu Jie Inventor before: Tang Weidong Inventor before: Han Xuecheng Inventor before: Gu Xinhai Inventor before: Liu Weijie Inventor before: Wang Jiqiang Inventor before: Xiong Tianying Inventor before: Shen Yanfang Inventor before: Cui Xinyu Inventor before: Mao Tianliang Inventor before: Li Ming Inventor before: Wu Minjie Inventor before: Li Maocheng |
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Free format text: CORRECT: INVENTOR; FROM: WU JIE WANG JIQIANG XIONG TIANYING SHEN YANFANG CUI XINYU MAO TIANLIANG LI MING WU MINJIE LI MAOCHENG TANG WEIDONG HAN XUECHENG GU XINHAI LIU WEIJIE TO: XIONG TIANYING WU JIE WANG JIQIANG SHEN YANFANG CUI XINYU MAO TIANLIANG LI MING WU MINJIE LI MAOCHENG TANG WEIDONG HAN XUECHENG GU XINHAI LIU WEIJIE |
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Address after: No.18a-1, Feiyun Road, Hunnan District, Shenyang City, Liaoning Province Patentee after: Shenyang fuchuang precision equipment Co.,Ltd. Address before: 110168 no.18a-1, Feiyun Road, Hunnan New District, Shenyang City, Liaoning Province Patentee before: Shenyang Fortune Precision Equipment Co.,Ltd. |