CN104253095B - 具有减小耦合的引线接合壁的半导体封装 - Google Patents

具有减小耦合的引线接合壁的半导体封装 Download PDF

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Publication number
CN104253095B
CN104253095B CN201410302261.9A CN201410302261A CN104253095B CN 104253095 B CN104253095 B CN 104253095B CN 201410302261 A CN201410302261 A CN 201410302261A CN 104253095 B CN104253095 B CN 104253095B
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amplifier
circuit
wire bonding
substrate
carrier
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CN104253095A (zh
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郭雄明
玛格丽特·希马诺夫斯基
保罗·哈特
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NXP USA Inc
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NXP USA Inc
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    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F1/00Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/02Modifications of amplifiers to raise the efficiency, e.g. gliding Class A stages, use of an auxiliary oscillation
    • H03F1/0205Modifications of amplifiers to raise the efficiency, e.g. gliding Class A stages, use of an auxiliary oscillation in transistor amplifiers
    • H03F1/0288Modifications of amplifiers to raise the efficiency, e.g. gliding Class A stages, use of an auxiliary oscillation in transistor amplifiers using a main and one or several auxiliary peaking amplifiers whereby the load is connected to the main amplifier using an impedance inverter, e.g. Doherty amplifiers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
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    • H01L23/04Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
    • H01L23/043Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having a conductive base as a mounting as well as a lead for the semiconductor body
    • H01L23/047Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having a conductive base as a mounting as well as a lead for the semiconductor body the other leads being parallel to the base
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    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F1/00Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/56Modifications of input or output impedances, not otherwise provided for
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
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    • H03F3/00Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/189High-frequency amplifiers, e.g. radio frequency amplifiers
    • H03F3/19High-frequency amplifiers, e.g. radio frequency amplifiers with semiconductor devices only
    • H03F3/195High-frequency amplifiers, e.g. radio frequency amplifiers with semiconductor devices only in integrated circuits
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F3/00Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/20Power amplifiers, e.g. Class B amplifiers, Class C amplifiers
    • H03F3/24Power amplifiers, e.g. Class B amplifiers, Class C amplifiers of transmitter output stages
    • H03F3/245Power amplifiers, e.g. Class B amplifiers, Class C amplifiers of transmitter output stages with semiconductor devices only
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    • H01L2224/45099Material
    • H01L2224/451Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45138Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
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CN201410302261.9A 2013-06-27 2014-06-27 具有减小耦合的引线接合壁的半导体封装 Active CN104253095B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/929,688 2013-06-27
US13/929,688 US9401342B2 (en) 2013-06-27 2013-06-27 Semiconductor package having wire bond wall to reduce coupling

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CN104253095A CN104253095A (zh) 2014-12-31
CN104253095B true CN104253095B (zh) 2018-04-10

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Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9312817B2 (en) * 2012-07-20 2016-04-12 Freescale Semiconductor, Inc. Semiconductor package design providing reduced electromagnetic coupling between circuit components
US9240390B2 (en) 2013-06-27 2016-01-19 Freescale Semiconductor, Inc. Semiconductor packages having wire bond wall to reduce coupling
US9450547B2 (en) 2013-12-12 2016-09-20 Freescale Semiconductor, Inc. Semiconductor package having an isolation wall to reduce electromagnetic coupling
CN107750478B (zh) * 2015-06-22 2021-06-01 瑞典爱立信有限公司 无埋块rf功率放大器
US10842028B2 (en) 2015-06-22 2020-11-17 Telefonaktiebolaget Lm Ericsson (Publ) Method for mounting a power amplifier (AP) assembly
US9607953B1 (en) * 2016-02-24 2017-03-28 Nxp Usa, Inc. Semiconductor package with isolation wall
US10249582B2 (en) 2016-12-19 2019-04-02 Nxp Usa, Inc. Radio frequency (RF) devices with resonant circuits to reduce coupling
JP2018107364A (ja) * 2016-12-28 2018-07-05 ルネサスエレクトロニクス株式会社 半導体装置
JP6852841B2 (ja) * 2016-12-28 2021-03-31 住友電工デバイス・イノベーション株式会社 半導体装置
WO2020039474A1 (ja) * 2018-08-20 2020-02-27 三菱電機株式会社 ドハティ増幅器
US10506704B1 (en) 2018-08-21 2019-12-10 Nxp Usa, Inc. Electromagnetically-shielded microelectronic assemblies and methods for the fabrication thereof
US10833238B2 (en) * 2018-08-27 2020-11-10 International Business Machines Corporation Wirebond cross-talk reduction for quantum computing chips
US10629518B2 (en) 2018-08-29 2020-04-21 Nxp Usa, Inc. Internally-shielded microelectronic packages and methods for the fabrication thereof
US11071197B2 (en) 2018-09-21 2021-07-20 International Business Machines Corporation Multilayer ceramic electronic package with modulated mesh topology and alternating rods
US11011813B2 (en) * 2019-07-12 2021-05-18 Nxp B.V. Power amplifier with shielded transmission lines
US11108361B2 (en) * 2019-08-15 2021-08-31 Nxp Usa, Inc. Integrated multiple-path power amplifier with interdigitated transistors
US11349438B2 (en) 2019-12-30 2022-05-31 Nxp Usa, Inc. Power amplifier packages containing multi-path integrated passive devices

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102281707A (zh) * 2010-06-11 2011-12-14 株式会社村田制作所 电路模块

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5668408A (en) 1996-04-12 1997-09-16 Hewlett-Packard Company Pin grid array solution for microwave multi-chip modules
US7525813B2 (en) 1998-07-06 2009-04-28 Renesas Technology Corp. Semiconductor device
US6072211A (en) 1998-08-03 2000-06-06 Motorola, Inc. Semiconductor package
US6261868B1 (en) 1999-04-02 2001-07-17 Motorola, Inc. Semiconductor component and method for manufacturing the semiconductor component
US7446411B2 (en) 2005-10-24 2008-11-04 Freescale Semiconductor, Inc. Semiconductor structure and method of assembly
US7429790B2 (en) 2005-10-24 2008-09-30 Freescale Semiconductor, Inc. Semiconductor structure and method of manufacture
JP4703391B2 (ja) * 2005-12-19 2011-06-15 株式会社東芝 高周波電力増幅器
US7445967B2 (en) 2006-01-20 2008-11-04 Freescale Semiconductor, Inc. Method of packaging a semiconductor die and package thereof
US8228123B2 (en) * 2007-08-29 2012-07-24 Nxp B.V. Integrated Doherty amplifier
US20090181329A1 (en) * 2008-01-08 2009-07-16 Seiko Epson Corporation Method for manufacturing a liquid jet head, a liquid jet head, and a liquid jet apparatus
US8030763B2 (en) 2008-06-26 2011-10-04 Freescale Semiconductor, Inc. Semiconductor package with reduced inductive coupling between adjacent bondwire arrays
US8564091B2 (en) 2009-07-06 2013-10-22 Marvell World Trade Ltd. Die-to-die electrical isolation in a semiconductor package
KR101141381B1 (ko) 2010-08-16 2012-07-13 삼성전기주식회사 크로스토크 저감을 위한 통신 회로
JP2012222491A (ja) * 2011-04-06 2012-11-12 Hitachi Metals Ltd モジュール
US9419566B2 (en) * 2011-04-20 2016-08-16 Freescale Semiconductor, Inc. Amplifiers and related integrated circuits
JP2013074249A (ja) * 2011-09-29 2013-04-22 Oki Electric Ind Co Ltd 半導体パッケージ、及び半導体パッケージの製造方法
US9312817B2 (en) * 2012-07-20 2016-04-12 Freescale Semiconductor, Inc. Semiconductor package design providing reduced electromagnetic coupling between circuit components
EP2747134B1 (en) * 2012-12-18 2021-09-01 Ampleon Netherlands B.V. Amplifier device
US9240390B2 (en) 2013-06-27 2016-01-19 Freescale Semiconductor, Inc. Semiconductor packages having wire bond wall to reduce coupling
US9450547B2 (en) * 2013-12-12 2016-09-20 Freescale Semiconductor, Inc. Semiconductor package having an isolation wall to reduce electromagnetic coupling

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102281707A (zh) * 2010-06-11 2011-12-14 株式会社村田制作所 电路模块

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US9401342B2 (en) 2016-07-26
US20150002226A1 (en) 2015-01-01
CN104253095A (zh) 2014-12-31
JP6530893B2 (ja) 2019-06-12
JP2015012609A (ja) 2015-01-19

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