CN104142503A - Optical frequency comb distance measuring device and method combining flight time with light intensity detection - Google Patents
Optical frequency comb distance measuring device and method combining flight time with light intensity detection Download PDFInfo
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- CN104142503A CN104142503A CN201410378653.3A CN201410378653A CN104142503A CN 104142503 A CN104142503 A CN 104142503A CN 201410378653 A CN201410378653 A CN 201410378653A CN 104142503 A CN104142503 A CN 104142503A
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- China
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- target mirror
- mirror
- beam splitter
- light intensity
- light
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
- G01S17/06—Systems determining position data of a target
- G01S17/08—Systems determining position data of a target for measuring distance only
Abstract
The invention discloses an optical frequency comb distance measuring device combining flight time with light intensity detection. The device comprises three equivalent Michelson interferometers. One Michelson interferometer detects the interference light intensity of an optical frequency comb, and the other two Michelson interferometers detect and record interference fringes of the optical frequency comb. Two light shielding plates S1 and S2 are arranged in the device so that mutual interference among pulses can be avoided; by the utilization of the interference light intensity, the distance measurement precision can be ensured to be at the nanometer order, the interference fringes are detected and recorded, the relative positions of the interference fringes are further determined, and the only distance measurement result can be determined. The invention discloses a corresponding distance measuring method, a light intensity detection method and a time flight method are combined, the non-ambiguous range of the light intensity detection method is improved, and the non-ambiguous range is expanded to the theoretical maximum value. The device is concise in method design, simple in structure and easy to adjust.
Description
Technical field
The present invention relates to a kind of flight time and light intensity and survey optical frequency com distance measuring equipment and the method for combination.
Background technology
Optical frequency com has the excellent specific property of the narrow pulsewidth of wide spectrum, and in time domain, optical frequency com is an equally spaced pulse train, is a series of equally spaced independent longitudinal modes in frequency domain.Optical frequency com has been realized optics frequency marking and has been connected with Microwave Frequency target, thereby the precision of metering can be very high.
For the ranging technology of optical frequency com, there are two of paramount importance technical indicators: precision and non-ambiguity scope.Non-ambiguity scope,, within the scope of this, can pass through the unique definite range finding result of range measurement system.In time domain, noncoherent time flight method can realize range finding in very wide finding range, but because the resolving power of photoelectric detection equipment limits, the distance accuracy of this method is very low; Although flight of relevant time method has improved the distance accuracy of time flight, its precision is still not high, and its actual finding range is very little.In frequency domain, the method distance accuracy of spectral interference is very high, and still, due to the resolution limit of spectral detection device, finding range is little.
Summary of the invention
For above-mentioned prior art, the invention provides a kind of flight time and light intensity and survey optical frequency com distance measuring equipment and the method for combination, in device, comprise three equivalent Michelson interferometers, wherein, a Michelson interferometer is surveyed the interference light intensity of optical frequency com, surveys the also interference fringe of recording optically frequency comb for all the other two.Utilize interference light intensity, can guarantee that distance accuracy is in nanometer scale.Survey and recording interference fringe, and then the relative position between definite interference fringe, can unique location survey really apart from result, simultaneously for the method, non-ambiguity scope is extended to theoretic maximal value.The method design is succinct, simple in structure, is easy to regulate.
A kind of flight time of the present invention and light intensity are surveyed the optical frequency com distance measuring equipment of combination, and this device comprises: optical frequency com, reference mirror M
r, beam splitter BS
1, beam splitter BS
2, target mirror M
t1, target mirror M
t2, shadow shield S
1, shadow shield S
2; Described reference mirror M
r, beam splitter BS
1, beam splitter BS
2, target mirror M
t1, target mirror M
t2three equivalent Michelson interferometers have been formed, described beam splitter BS
2be positioned at described beam splitter BS
1with target mirror M
t1between, wherein, by reference mirror M
r, beam splitter BS
1, beam splitter BS
2with target mirror M
t1form Michelson interferometer A, by reference mirror M
r, beam splitter BS
1, beam splitter BS
2with target mirror M
t2form Michelson interferometer B, by target mirror M
t1, B beam splitter S
2with target mirror M
t2form Michelson interferometer C; Described shadow shield S
1be positioned at beam splitter BS
2with target mirror M
t1between, described shadow shield S
2be positioned at beam splitter BS
2with target mirror M
t2between; On the output light path of described Michelson interferometer A and described Michelson interferometer B, be provided with lens and photoelectric detector PD
1, described Michelson interferometer A is for detection of a target mirror M
t1return to the relative space position of pulse, described Michelson interferometer B is for detection of a target mirror M
t2return to the relative space position of pulse; On the output light path of described Michelson interferometer C, be provided with photoelectric detector PD
2, described Michelson interferometer C is for detection of a target mirror M
t1with target mirror M
t2light intensity after the pulse interference of returning separately; Described reference mirror M
rbe located at a nanometer displacement platform PZT1 upper, described target mirror M
t1be located on a nanometer displacement platform PZT2; There is an oscillograph, for showing photoelectric detector PD
1and photoelectric detector PD
2output electrical signals.
A kind of flight time of the present invention and light intensity are surveyed the optical frequency com distance-finding method of combination, adopt above-mentioned flight time and light intensity to survey the optical frequency com distance measuring equipment of combination, and comprise the following steps:
Step 1, mobile nanometer displacement platform PZT2, making the range difference of two arms of described Michelson interferometer C is testing distance L;
Step 2, record light intensity value: open shadow shield S
1with shadow shield S
2, the light that light source sends is through shadow shield BS
1be divided into two bundles, a branch of referenced mirror M
rreflection, another bundle is divided into again two bundles through beam splitter BS2, and what separate again is a branch of by target mirror M
t2reflection, another is restrainted by target mirror M
t1reflection, photoelectric detector PD
2collect target mirror M
t1with target mirror M
t2the interference of light signal being reflected back, thus obtain that streamer is strong always;
Step 3, utilize time flight method to determine target mirror M
t1with target mirror M
t2the space relative distance of the light being reflected back:
Close shadow shield S
1, and nanometer displacement platform PZT1 is scanning mode, the light that light source sends is through beam splitter BS
1be divided into two bundles, a branch of referenced mirror M
rreflection, another bundle is divided into again two bundles through beam splitter BS2, and what separate again is a branch of by target mirror M
t2reflection, another is restrainted by shadow shield S
1block photoelectric detector PD
1collect reference mirror M
rwith target mirror M
t2the interference of light signal being reflected back, obtains interference fringe; The drive voltage signal of nanometer displacement platform PZT1 of take is benchmark, determines target mirror M
t2relative position with respect to nanometer displacement platform PZT1 drive voltage signal;
Open shadow shield S
1, close shadow shield S
2, the light that light source sends is through beam splitter BS
1be divided into two bundles, a branch of referenced mirror M
rreflection, another bundle is divided into again two bundles through beam splitter BS2, a branch of by target mirror M
t1reflection, another is restrainted by shadow shield S
2block photoelectric detector PD
1collect reference mirror M
rwith target mirror M
t1the interference of light signal being reflected back, obtains interference fringe; The drive voltage signal of nanometer displacement platform PZT1 of take is benchmark, determines target mirror M
t1relative position with respect to nanometer displacement platform PZT1 drive voltage signal;
According to target mirror M
t2relative position and target mirror M with respect to nanometer displacement platform PZT1 drive voltage signal
t1relative position with respect to nanometer displacement platform PZT1 drive voltage signal, obtains target mirror M
t1with target mirror M
t2the space relative distance of the light being reflected back;
The interference fringe of step 4, the direct current light intensity obtaining according to step 2 and ideal pulse model obtains one group of testing distance just value of counting, from the described one group target mirror M just selecting the value of counting with step 3 acquisition
t1with target mirror M
t2the immediate numerical value of space relative distance of the light being reflected back is the numerical value of testing distance L.
Further, in step 4, described ideal pulse model is any in desirable Gauss pulse model, hyperbolic secant model, asymmetric Gauss pulse model, asymmetric hyperbolic secant model.
One group of one group of distance value corresponding to point that just value of counting intensity in the interference fringe of ideal pulse model is equal with direct current light intensity forms.
Compared with prior art, the invention has the beneficial effects as follows:
The present invention is that method and time flight method that light intensity is surveyed combine, and has improved the non-ambiguity scope of light intensity probe method (being the content of step 2 in the present invention), has improved the measuring accuracy of time flight method; Two shadow shield S in the present invention
1and S
2application can avoid the phase mutual interference between pulse, if shadow shield is not set, cannot obtain respectively two target mirror MT
2and MT
1corresponding interference fringe, and then cannot obtain two target mirror MT
2and MT
1relative distance.
Accompanying drawing explanation
Fig. 1 is the optical frequency com distance measuring equipment schematic diagram that flight time of the present invention and light intensity are surveyed combination;
Figure 2 shows that two relative distance bigness scale figure between interference fringe.
Embodiment
Below in conjunction with the drawings and specific embodiments, technical solution of the present invention is described in further detail.
As shown in Figure 1, a kind of flight time of the present invention and light intensity are surveyed the optical frequency com distance measuring equipment of combination, comprising: optical frequency com, reference mirror M
r, beam splitter BS
1, beam splitter BS
2, target mirror M
t1, target mirror M
t2, shadow shield S
1, shadow shield S
2.
Described reference mirror M
r, beam splitter BS
1, beam splitter BS
2, target mirror M
t1, target mirror M
t2three equivalent Michelson interferometers have been formed, described beam splitter BS
2be positioned at described beam splitter BS
1with target mirror M
t1between, wherein:
By reference mirror M
r, beam splitter BS
1, beam splitter BS
2with target mirror M
t1form Michelson interferometer A,
By reference mirror M
r, beam splitter BS
1, beam splitter BS
2with target mirror M
t2form Michelson interferometer B;
By target mirror M
t1, B beam splitter S
2with target mirror M
t2form Michelson interferometer C.
Described shadow shield S
1be positioned at beam splitter BS
2with target mirror M
t1between, described shadow shield S
2be positioned at beam splitter BS
2with target mirror M
t2between.
On the output light path of described Michelson interferometer A and described Michelson interferometer B, be provided with lens and photoelectric detector PD
1, described Michelson interferometer A is for detection of a target mirror M
t1return to the relative space position of pulse, described Michelson interferometer B is for detection of a target mirror M
t2return to the relative space position of pulse.
On the output light path of described Michelson interferometer C, be provided with photoelectric detector PD
2, described Michelson interferometer C is for detection of a target mirror M
t1with target mirror M
t2light intensity after the pulse interference of returning separately.
Described reference mirror M
rbe located at a nanometer displacement platform PZT1 upper, described target mirror M
t1be located on a nanometer displacement platform PZT2.
There is an oscillograph, for showing photoelectric detector PD
1and photoelectric detector PD
2output electrical signals.
The optical frequency com distance measuring equipment that utilizes above-mentioned flight time and light intensity to survey combination is found range, and comprises the following steps:
Step 1, mobile nanometer displacement platform PZT2 (precision of PZT2 nanometer displacement platform is 1nm), making the range difference of two arms of described Michelson interferometer C is testing distance L;
Step 2, record light intensity value PD
2the light intensity detecting is-0.34645, opens shadow shield S
1with shadow shield S
2, the light that light source sends is through shadow shield BS
1be divided into two bundles, a branch of referenced mirror M
rreflection, another bundle is divided into again two bundles through beam splitter BS2, and what separate again is a branch of by target mirror M
t2reflection, another is restrainted by target mirror M
t1reflection, photoelectric detector PD
1the interference fringe collecting does not have reference value, photoelectric detector PD
2collect target mirror M
t1with target mirror M
t2the interference of light signal being reflected back, thus obtain that streamer is strong always; Utilize light intensity detection method, according to the relation between light intensity and distance, can determine a series of range information, so only rely on direct current light intensity cannot uniquely determine tested distance.
Step 3, utilize time flight method to determine target mirror M
t1with target mirror M
t2the space relative distance of the light being reflected back:
Close shadow shield S
1, and nanometer displacement platform PZT1 is scanning mode, the light that light source sends is through beam splitter BS
1be divided into two bundles, a branch of referenced mirror M
rreflection, another bundle is divided into again two bundles through beam splitter BS2, and what separate again is a branch of by target mirror M
t2reflection, another is restrainted by shadow shield S
1block photoelectric detector PD
2the direct current light intensity collecting does not have reference value, photoelectric detector PD
1collect reference mirror M
rwith target mirror M
t2the interference of light signal being reflected back, obtains interference fringe; The drive voltage signal of nanometer displacement platform PZT1 of take is benchmark, determines target mirror M
t2relative position with respect to nanometer displacement platform PZT1 drive voltage signal;
Open shadow shield S
1, close shadow shield S
2, the light that light source sends is through beam splitter BS
1be divided into two bundles, a branch of referenced mirror M
rreflection, another bundle is divided into again two bundles through beam splitter BS2, a branch of by target mirror M
t1reflection, another is restrainted by shadow shield S
2block photoelectric detector PD
1collect reference mirror M
rwith target mirror M
t1the interference of light signal being reflected back, obtains interference fringe; The drive voltage signal of nanometer displacement platform PZT1 of take is benchmark, determines target mirror M
t1relative position with respect to nanometer displacement platform PZT1 drive voltage signal;
According to target mirror M
t2relative position and target mirror M with respect to nanometer displacement platform PZT1 drive voltage signal
t1relative position with respect to nanometer displacement platform PZT1 drive voltage signal, obtains target mirror M
t1with target mirror M
t2the space relative distance of the light being reflected back is 5 μ m, as shown in Figure 2.
The interference fringe of step 4, the direct current light intensity obtaining according to step 2 and desirable Gauss pulse model obtain one group of testing distance just the value of counting be: 3.478,4.246,4.996,5.803,6.624,7.334,8.047 and 8.868 μ m, at the beginning of this group, the value of counting intensity in the interference fringe of desirable Gauss pulse model one group distance value corresponding to point equal with direct current light intensity forms; From this group, just the value of counting, select the target mirror M obtaining with step 3
t1with target mirror M
t2the numerical value that the immediate numerical value of space relative distance of the light being reflected back is testing distance L is 4.996 μ m.The direct current light intensity that certainly, can also obtain according to step 2 in step 4 of the present invention and the interference fringe of hyperbolic secant model (or asymmetric Gauss pulse model or asymmetric secant model) obtain the value of counting at the beginning of this group.
In the present invention, time flight method is partly just surveyed screening conditions is provided for light intensity, the method of being surveyed by light intensity can be determined a series of distance value, by time flight method, come assisting sifting to go out a distance value again, just can realize unique definite testing distance L, according to analysis before, the method measuring error that light intensity is surveyed is in 4nm left and right.
In addition, three Michelson interferometers are not worked simultaneously, and the pulse quality of sending due to light source is not that perfectly interference fringe is very wide, and is not to only have a peak value, and only have peak-peak to have reference significance, remaining peak value to measurement, is all noise.Introduce two shadow shield S
1and S
2, between two interference fringes can avoiding two interferometers of Michelson interferometer A and B to form, interact.In experiment, if two shadow shield S are not set
1and S
2, result shows, and impact is very large, and even striped only has a peak point.So, two shadow shield S
1and S
2necessary.
Distance measuring equipment of the present invention and method have two advantages: the one, and method and time flight method that light intensity is surveyed combine, improve the non-ambiguity scope of light intensity probe method (being the content of step 2 in the present invention), improved the measuring accuracy of time flight method; Two is two shadow shield S
1and S
2application can avoid the phase mutual interference between pulse, if shadow shield is not set, cannot obtain respectively two target mirror MT
2and MT
1corresponding interference fringe, and then cannot obtain two target mirror MT
2and MT
1relative distance.
Although invention has been described by reference to the accompanying drawings above; but the present invention is not limited to above-mentioned embodiment; above-mentioned embodiment is only schematic; rather than restrictive; those of ordinary skill in the art is under enlightenment of the present invention; in the situation that not departing from aim of the present invention, can also make a lot of distortion, within these all belong to protection of the present invention.
Claims (4)
1. flight time and light intensity are surveyed an optical frequency com distance measuring equipment for combination, it is characterized in that, comprising: optical frequency com, reference mirror M
r, beam splitter BS
1, beam splitter BS
2, target mirror M
t1, target mirror M
t2, shadow shield S
1, shadow shield S
2; Described reference mirror M
r, beam splitter BS
1, beam splitter BS
2, target mirror M
t1, target mirror M
t2three equivalent Michelson interferometers have been formed, described beam splitter BS
2be positioned at described beam splitter BS
1with target mirror M
t1between, wherein, by reference mirror M
r, beam splitter BS
1, beam splitter BS
2with target mirror M
t1form Michelson interferometer A, by reference mirror M
r, beam splitter BS
1, beam splitter BS
2with target mirror M
t2form Michelson interferometer B, by target mirror M
t1, B beam splitter S
2with target mirror M
t2form Michelson interferometer C; Described shadow shield S
1be positioned at beam splitter BS
2with target mirror M
t1between, described shadow shield S
2be positioned at beam splitter BS
2with target mirror M
t2between;
On the output light path of described Michelson interferometer A and described Michelson interferometer B, be provided with lens and photoelectric detector PD
1, described Michelson interferometer A is for detection of a target mirror M
t1return to the relative space position of pulse, described Michelson interferometer B is for detection of a target mirror M
t2return to the relative space position of pulse;
On the output light path of described Michelson interferometer C, be provided with photoelectric detector PD
2, described Michelson interferometer C is for detection of a target mirror M
t1with target mirror M
t2light intensity after the pulse interference of returning separately;
Described reference mirror M
rbe located at a nanometer displacement platform PZT1 upper, described target mirror M
t1be located on a nanometer displacement platform PZT2;
There is an oscillograph, for showing photoelectric detector PD
1and photoelectric detector PD
2output electrical signals.
2. flight time and light intensity are surveyed an optical frequency com distance-finding method for combination, it is characterized in that, adopt flight time as claimed in claim 1 and light intensity to survey the optical frequency com distance measuring equipment of combination, and comprise the following steps:
Step 1, mobile nanometer displacement platform PZT2, making the range difference of two arms of described Michelson interferometer C is testing distance L;
Step 2, record light intensity value: open shadow shield S
1with shadow shield S
2, the light that light source sends is through shadow shield BS
1be divided into two bundles, a branch of referenced mirror M
rreflection, another bundle is divided into again two bundles through beam splitter BS2, and what separate again is a branch of by target mirror M
t2reflection, another is restrainted by target mirror M
t1reflection, photoelectric detector PD
2collect target mirror M
t1with target mirror M
t2the interference of light signal being reflected back, thus obtain that streamer is strong always;
Step 3, utilize time flight method to determine target mirror M
t1with target mirror M
t2the space relative distance of the light being reflected back:
Close shadow shield S
1, and nanometer displacement platform PZT1 is scanning mode, the light that light source sends is through beam splitter BS
1be divided into two bundles, a branch of referenced mirror M
rreflection, another bundle is divided into again two bundles through beam splitter BS2, and what separate again is a branch of by target mirror M
t2reflection, another is restrainted by shadow shield S
1block photoelectric detector PD
1collect reference mirror M
rwith target mirror M
t2the interference of light signal being reflected back, obtains interference fringe; The drive voltage signal of nanometer displacement platform PZT1 of take is benchmark, determines target mirror M
t2relative position with respect to nanometer displacement platform PZT1 drive voltage signal;
Open shadow shield S
1, close shadow shield S
2, the light that light source sends is through beam splitter BS
1be divided into two bundles, a branch of referenced mirror M
rreflection, another bundle is divided into again two bundles through beam splitter BS2, a branch of by target mirror M
t1reflection, another is restrainted by shadow shield S
2block photoelectric detector PD
1collect reference mirror M
rwith target mirror M
t1the interference of light signal being reflected back, obtains interference fringe; The drive voltage signal of nanometer displacement platform PZT1 of take is benchmark, determines target mirror M
t1relative position with respect to nanometer displacement platform PZT1 drive voltage signal;
According to target mirror M
t2relative position and target mirror M with respect to nanometer displacement platform PZT1 drive voltage signal
t1relative position with respect to nanometer displacement platform PZT1 drive voltage signal, obtains target mirror M
t1with target mirror M
t2the space relative distance of the light being reflected back;
The interference fringe of step 4, the direct current light intensity obtaining according to step 2 and ideal pulse model obtains one group of testing distance just value of counting, from the described one group target mirror M just selecting the value of counting with step 3 acquisition
t1with target mirror M
t2the immediate numerical value of space relative distance of the light being reflected back is the numerical value of testing distance L.
3. flight time and light intensity are surveyed the optical frequency com distance-finding method of combination according to claim 2, it is characterized in that, in step 4, described ideal pulse model is any in desirable Gauss pulse model, hyperbolic secant model, asymmetric Gauss pulse model, asymmetric hyperbolic secant model.
4. flight time and light intensity are surveyed the optical frequency com distance-finding method of combination according to claim 2, it is characterized in that, in step 4, one group of one group of distance value corresponding to point that just value of counting intensity in the interference fringe of ideal pulse model is equal with direct current light intensity forms.
Priority Applications (1)
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|---|---|---|---|
| CN201410378653.3A CN104142503B (en) | 2014-07-31 | 2014-07-31 | Optical frequency com range unit that flight time and light intensity detection combine and method |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410378653.3A CN104142503B (en) | 2014-07-31 | 2014-07-31 | Optical frequency com range unit that flight time and light intensity detection combine and method |
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| CN104142503B CN104142503B (en) | 2016-08-24 |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107764388A (en) * | 2017-09-28 | 2018-03-06 | 天津大学 | A kind of high-precision sound velocity in seawater measuring method based on acoustooptical effect |
| CN108037311A (en) * | 2017-12-18 | 2018-05-15 | 天津大学 | A kind of high-precision seawater velocity measuring method based on acoustooptical effect |
| CN109031335A (en) * | 2017-09-08 | 2018-12-18 | 北醒（北京）光子科技有限公司 | A kind of optical distance measurement apparatus |
| CN110530257A (en) * | 2019-09-26 | 2019-12-03 | 深圳市威富视界有限公司 | Femto-second laser distribution interferometer system |
| CN110895339A (en) * | 2019-11-01 | 2020-03-20 | 清华大学 | Double-optical-comb multi-pulse distance measuring system and application thereof |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103197322A (en) * | 2013-04-10 | 2013-07-10 | 清华大学 | Ranging method and ranging system of femtosecond laser frequency comb synthesis wave interference |
| CN103196419A (en) * | 2013-04-01 | 2013-07-10 | 中国科学院光电研究院 | Femtosecond laser frequency comb ranging device and method |
-
2014
- 2014-07-31 CN CN201410378653.3A patent/CN104142503B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103196419A (en) * | 2013-04-01 | 2013-07-10 | 中国科学院光电研究院 | Femtosecond laser frequency comb ranging device and method |
| CN103197322A (en) * | 2013-04-10 | 2013-07-10 | 清华大学 | Ranging method and ranging system of femtosecond laser frequency comb synthesis wave interference |
Non-Patent Citations (3)
| Title |
|---|
| HANZHONG WU ET AL.: ""Absolute distance measurement by intensity detection using a mode-locked femtosecond pulse laser"", 《OPTICS EXPRESS》 * |
| 吴翰钟 等: ""一种光学频率梳绝对测距的新方法"", 《物理学报》 * |
| 邢书剑 等: ""飞秒光频梳的任意长绝对测距"", 《物理学报》 * |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109031335A (en) * | 2017-09-08 | 2018-12-18 | 北醒（北京）光子科技有限公司 | A kind of optical distance measurement apparatus |
| CN107764388A (en) * | 2017-09-28 | 2018-03-06 | 天津大学 | A kind of high-precision sound velocity in seawater measuring method based on acoustooptical effect |
| CN107764388B (en) * | 2017-09-28 | 2020-01-03 | 天津大学 | High-precision seawater sound velocity measurement method based on acousto-optic effect |
| CN108037311A (en) * | 2017-12-18 | 2018-05-15 | 天津大学 | A kind of high-precision seawater velocity measuring method based on acoustooptical effect |
| CN108037311B (en) * | 2017-12-18 | 2020-01-03 | 天津大学 | High-precision seawater flow velocity measurement method based on acousto-optic effect |
| CN110530257A (en) * | 2019-09-26 | 2019-12-03 | 深圳市威富视界有限公司 | Femto-second laser distribution interferometer system |
| CN110895339A (en) * | 2019-11-01 | 2020-03-20 | 清华大学 | Double-optical-comb multi-pulse distance measuring system and application thereof |
| CN110895339B (en) * | 2019-11-01 | 2022-02-25 | 清华大学 | Double-optical-comb multi-pulse distance measuring system and application thereof |
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|---|---|
| CN104142503B (en) | 2016-08-24 |
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