CN104236725B - A kind of device and method of accurate measurement optical maser wavelength - Google Patents
A kind of device and method of accurate measurement optical maser wavelength Download PDFInfo
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- CN104236725B CN104236725B CN201410512204.3A CN201410512204A CN104236725B CN 104236725 B CN104236725 B CN 104236725B CN 201410512204 A CN201410512204 A CN 201410512204A CN 104236725 B CN104236725 B CN 104236725B
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Abstract
The present invention relates to wavelength measurement technology, specifically a kind of device and method of accurate measurement optical maser wavelength.A kind of device of accurate measurement optical maser wavelength, the PPLN crystal, photonic crystal fiber, the first convex lens, the first attenuator and the first half-wave plate including femtosecond pulse laser, sequentially on femtosecond pulse laser emitting light path；Also include diaphragm, the second attenuator, the second half-wave plate, the first polarization beam apparatus, the 3rd half-wave plate and the second polarization beam apparatus being sequentially located in testing laser light path；The emitting light path of the second polarization beam apparatus is provided with reflecting grating, is sequentially provided with the second convex lens, optical filter, the 3rd convex lens, the 3rd attenuator and avalanche diode detector on the reflected light path of reflecting grating；The signal output part of avalanche diode detector is connected with frequency spectrograph.Whole device and method have the advantages that simple structure, easy to operate, can easily be accommodated, external interference is little, stability is strong, accuracy is high.
Description
Technical field
The present invention relates to wavelength measurement technology, specifically a kind of device and method of accurate measurement optical maser wavelength.
Background technology
With the development of modern science and technology, the measurement of optical maser wavelength is led in meterological, information science, communication, astronomy etc.
Increasingly consequence, the always focus of concern both at home and abroad are occupied in domain, and raising laser wavelength measurement accuracy has very
Important meaning.Optical maser wavelength is widely used in length, angle, flatness, linearity and perpendicularity as measuring basis value
Deng measurement, be the important measurement standard of precision optical machinery and microelectronics industry, and accurately measure the size of wavelength and steady
The qualitative key for being to ensure measurement accuracy and magnitude tracing.Therefore, the research of laser wavelength measurement equipment has extensive suitable
With property and development prospect, the raising of laser wavelength measurement precision is also by the precision of art associated for lifting.Meanwhile, section
Requirement more and more higher of the development of technology to the accuracy of optical maser wavelength standard.Therefore, on the basis of prior art means,
The accuracy for improving wavelength measurement is extremely urgent.At present both at home and abroad for the mainly following several sides of laser wavelength measurement technology
Method.
The first is the measurement of the optical maser wavelength based on harmonic wave optical frequency chain.The principle of the method is from Cs atom microwave frequency marking
A series of microwave harmonic oscillators for keeping PGC demodulation and particular laser is begun to pass through, by tested optical frequency and Microwave Frequency
Rate standard is coupled together, so as to realize the accurate measurement of optical maser wavelength.But as although this method achieves optical frequency
Absolute measurement, rather than direct measurement, and the gap in actual measurement process if in chain between optical frequency is excessive (exceedes
10GHz), to determine that contacting between known optical frequency and arbitrary unknown optical frequency is highly difficult.So the survey of this optical maser wavelength
Amount method is difficult to realize.
It is for second the optical frequency measurement based on crossover rate chain in optical frequency interval.Nineteen ninety, Telle et al. are proposed and are used optical frequency
It is spaced dichotomy to measure optical frequency.Its general principle be based on three laser instruments, using nonlinear crystal by its
In a laser instrument frequency f1 frequency multiplication, and be locked in remaining two laser frequency and frequency signal center (f2+f3)/2,
Optical frequency interval in point laser instrument is constituted.If taking n above-mentioned one point process to the optical frequency interval for newly being formed, that
The optical frequency interval for finally obtaining only has f/2n, this frequency interval can be with direct measurement.But in order to there is suitable Microwave Frequency
Rate standard carries out beat frequency measurement as reference, and the last optical frequency interval of this technical requirements is sufficiently small.One can cover microwave section
To in the optical frequency interval of hundreds of THz of optical frequencies, crossover rate chain is extremely complex and is difficult to.
The third is the measuring method of the optical maser wavelength based on principle of interference.Laser wavelength measurement is former based on interfering mostly
Reason, typical commercialization wavelength measurement instrument（Wavemeter）There are Michelson interference type, cloud tints rope interference-type and F-P interference-types.Step
Ke Erxun types wavemeter is suitable for measurement continuous laser wavelength, and certainty of measurement reaches as high as 10-7.Fizeau interference is a kind of double light of film
Beam interferometer, striking rope type wavemeter simple structure are not required to built-in reference laser instrument, but certainty of measurement are less than Michaelson and F-P
Type wavemeter, the Fizeau interference type wavemeter of New Focus companies of U.S. production, precision is 10-5.F-P interference-type wavemeters are
The phenomenon for producing multiple-beam interference when being plated with the certain glass plate of high reflectance, spacing using light beam by two pieces carries out to be measured swashing
The measurement of optical wavelength.But wavemeter is adapted for the preliminary surveying of wavelength mostly, the precision which measures is not high（Common wavelengths meter
The precision that reaches of accuracy be 30-60MHz magnitudes）, error is larger, and is affected also than larger by external environment.
Content of the invention
The present invention is in order to the accuracy that solves interior laser wavelength measurement at this stage is low, error is big, the stability difference of measurement etc.
A kind of technical problem, there is provided device and method of accurate measurement optical maser wavelength.
A kind of device of accurate measurement optical maser wavelength of the present invention employs the following technical solutions realization：A kind of accurate
The device of measurement optical maser wavelength, the PPLN including femtosecond pulse laser, sequentially on femtosecond pulse laser emitting light path
Crystal, photonic crystal fiber, the first convex lens, the first attenuator and the first half-wave plate；Also include sequentially being located at testing laser light
Diaphragm, the second attenuator, the second half-wave plate, the first polarization beam apparatus, the 3rd half-wave plate and the second polarization beam apparatus on road；The
One polarization beam apparatus are also located on the emitting light path of the first half-wave plate；Should protect the position of the first half-wave plate and the first polarization beam apparatus
The light path after being reflected through the first polarization beam apparatus and the laser by the second half-wave plate outgoing is demonstrate,proved by the laser of the first half-wave plate outgoing
Coincide through the light path after the first polarization beam apparatus transmission；The emitting light path of the second polarization beam apparatus is provided with reflecting grating, instead
Penetrate
Detector；The signal output part of avalanche diode detector is connected with frequency spectrograph.
Based on the pluses and minuses of existing several wavelength measurement methods, present applicant proposes a kind of using femtosecond pulse laser and
Testing laser is concerned with, and realizes the device of accurate measurement to optical maser wavelength.Femtosecond pulse laser small volume, light, and there is height
Reliability and high stability, the spot light of its just near ideal for exporting, the circularity and intensity distribution of output beam are easier to
Obtain and be close to preferable high-quality output beam.What femtosecond pulse laser was exported is the grade frequency difference of 100MHz to 1GHz
Pulse, after PPLN crystal and photonic crystal fiber, light beam is broadened, and its total frequency bandspread arrives 100THz 1.In frequency
Super continuous spectrum in domain after broadening is that a series of equally spaced frequency contents are combined, and its side frequency is at intervals of pulse
Repetition rate, zero point correction frequency are offset frequency.So the continuous spectrum after broadening can be considered one have high accuracy and
The laser frequency scale that can be traced to the source, can be used to measure the optical maser wavelength in any coverage, also can be locked by offset frequency
Determine the frequency that mode locks operating laser, measurement result is traced to the source to frequency reference as bridge by which.
Through femtosecond pulse laser and target（To be measured）The Laser coherent combining of laser instrument, can obtain target laser
Optical maser wavelength.By the repetition rate and offset frequency of locking femtosecond mode-locked laser to microwave frequency benchmark, obtain in time domain
The stable femtosecond pulse of repetition rate, obtains the stable laser frequency comb of frequency interval on frequency domain.Gathered by detection
Interference signal, the signal for collecting are shown that the spectral line profile with regard to different frequency on frequency spectrograph, can by frequency spectrograph
To read the frequency difference of testing laser and femtosecond laser coherent signal, according to the frequency values of the relevant femtosecond laser of testing laser
Obtain the exact value of testing laser frequency.
Further, the emitting light path of the femtosecond pulse laser is provided with first completely reflecting mirror；The PPLN
Crystal is located on the reflected light path of the first completely reflecting mirror；It is additionally provided between first attenuator and the first half-wave plate and is totally reflected by second
The beam collimation structure of mirror, the 3rd completely reflecting mirror and the 4th completely reflecting mirror composition；Also include positioned at the second polarization beam apparatus outgoing
The 5th speculum in light path；The reflecting grating is located on the reflected light path of the 5th completely reflecting mirror.
Beam collimation structure is used for by the laser alignment after expanding and being incident to the first half-wave plate, while making whole device institute
Take up space reduction；First completely reflecting mirror and the 5th speculum are also used for the collimation of laser, while optimize device being taken up space.
Further, also include the cavity that first through hole and the second through hole is provided with a shell；3rd total reflection
Mirror, the second attenuator, diaphragm, the second half-wave plate, the first polarization beam apparatus, avalanche diode detector, frequency spectrograph, the 3rd decay
Piece, the 3rd convex lens, optical filter, the second convex lens, grating, the 5th completely reflecting mirror, the second polarization beam apparatus, the 3rd half-wave plate,
First half-wave plate, the 4th completely reflecting mirror, the first completely reflecting mirror, PPLN crystal, photonic crystal fiber, the first convex lens, first declines
Subtract piece, the second completely reflecting mirror is respectively positioned in cavity；The laser of femtosecond pulse laser outgoing is injected positioned at cavity by first through hole
On the first interior completely reflecting mirror；Testing laser is incident on diaphragm through the second through hole；Avalanche diode detector by BNC lines with
Frequency spectrograph is connected.
During work, cavity plays a part of insulation blocking.All parts can make one after position is fixed by cavity
Intensive portable device, is moved easily, while eliminating the complicated procedures of forming of assembling, has saved the time.
A kind of method of accurate measurement optical maser wavelength of the present invention adopts the following technical scheme that realization：A kind of essence
Really the method for measurement optical maser wavelength, comprises the following steps：（a）, femtosecond pulse laser transmitting laser through PPLN crystal and
After photonic crystal fiber realize expand, the laser after expanding after the first convex lens focus, through the first attenuator and through light
Beam collimating structure reaches the first half-wave plate, adjusts through the first half-wave plate after laser polarization direction, enters the first polarization beam apparatus, then
The 3rd half-wave plate is exported after the reflection of the first polarization beam apparatus；The laser of testing laser device output simultaneously passes through diaphragm, transmission
Second attenuator, adjusts through the second half-wave plate after laser polarization direction, enters the first polarization beam apparatus；Meet the first polarization beam splitting
The laser output of device polarization direction adjusts the femtosecond pulse laser for inputing to which and swashs to the 3rd half-wave plate through the 3rd half-wave plate
Behind the polarization direction of light and testing laser device laser, export to the second polarization beam apparatus；（b）, above-mentioned two light beam incide second
After polarization beam apparatus, meet the polarization light output of the second polarization beam apparatus outbound course and complete optics coherence tomography；（c）, synthesis light
Incide in reflecting grating after the reflection of the 5th completely reflecting mirror, reflected optical grating diffraction after reflecting, then gathered by the second convex lens
Jiao is into continuous spectrum band；Continuous spectrum band incides the 3rd convex lens through after optical filter, and light beam is through the 3rd convex lens focus
Afterwards, through the 3rd attenuator, avalanche diode detector is incided；（d）, avalanche diode detector is by the optical signal for collecting
Corresponding electric signal is converted into, and is input to frequency spectrograph；According to shown testing laser on frequency spectrograph and femtosecond laser
The frequency values of the frequency difference of coherent signal and the femtosecond laser relevant with testing laser can obtain the frequency of testing laser.
During work, avalanche diode detector is acquired to spectral signal, and collection signal input can be entered to frequency spectrograph
Row is further analyzed and processed.It is shown in Fig. 2 using the relevant experimental result for measuring optical maser wavelength and notional result comparison diagram.Such as
Measurement gained optical maser wavelength accuracy shown in Fig. 2 is very high, if measurement is repeated several times can to obtain more coincideing with actual wavelength
Test result.In above-mentioned test system, the laser instrument of subtest is femtosecond pulse laser（Laser frequency is
1560nm）.After ultra-short pulse laser frequency is broadened, its spectral coverage is 300-1200nm, common equivalent to countless
The combination of single-mode laser, by the screening of optical filter, the frequency band needed for can obtaining.In time-domain, locked mode femtosecond
Pulse laser is output as a series of equally spaced ultrashort pulses, and pulse width is a few to tens of femtoseconds, and repetition rate is several
Hundred MHz to several GHz；In frequency domain, the light comb that its spectrum is made up of the equally spaced continuous wave spectrum line of series of rules, per
Interval between individual comb is exactly equal to the pulse recurrence frequency of femto-second laser.Based on above some, the present invention is effectively solved
Determined interior laser wavelength measurement at this stage accuracy low, error is big, the stability difference of measurement the problems such as.
The invention provides a kind of based on the simple structure of femtosecond laser, easy to operate, can easily be accommodated, external interference is little,
Stability is strong, the experimental provision that accuracy is high and method, and the device and method are based on the only of the pulse laser of locked mode
Special advantage, the accuracy for efficiently solving interior laser wavelength measurement at this stage is low, error is big, measurement stability is poor, efficiency
Low problem.Whole device and method have simple structure, easy to operate, can easily be accommodated, external interference is little, stability is strong, smart
The high advantage of exactness.
Description of the drawings
Fig. 1 is the structural representation of device of the present invention.
Fig. 2 is laser wavelength measurement experiment and theoretical comparison diagram.
The signal graph that the coherent light obtained by Fig. 3 frequency spectrographs of the present invention is produced.
In figure：The 3rd completely reflecting mirrors of 1-, the second attenuators of 2-, 3- diaphragms, the second through holes of 4-, the second half-wave plates of 5-, 6-
One polarization beam apparatus, 7- avalanche diode detectors, 8-BNC lines, 9- frequency spectrographs, the 3rd attenuators of 10-, the 3rd convex lens of 11-,
12- optical filters, the second convex lens of 13-, 14- reflecting gratings, the 5th completely reflecting mirrors of 15-, the second polarization beam apparatus of 16-, 17- the 3rd
Half-wave plate, the first half-wave plates of 18-, the 4th completely reflecting mirrors of 19-, the first completely reflecting mirrors of 20-, 21- first through hole, 22-PPLN crystal,
23- photonic crystal fibers, the first convex lens of 24-, the first attenuators of 25-, the second completely reflecting mirrors of 26-, 27- cavitys, 28- femtosecond arteries and veins
Rush laser instrument.
Specific embodiment
A kind of device of accurate measurement optical maser wavelength, including femtosecond pulse laser 28, sequentially positioned at femtosecond pulse
PPLN crystal 22, photonic crystal fiber 23, the first convex lens 24, the first attenuator 25 and the first half-wave on 28 emitting light path of device
Piece 18；Also include sequentially be located at testing laser light path on diaphragm 3, the second attenuator 2, the second half-wave plate 5, the first polarization beam splitting
Device 6, the 3rd half-wave plate 17 and the second polarization beam apparatus 16；First polarization beam apparatus 6 are also located at the emergent light of the first half-wave plate 18
Lu Shang；The position of the first half-wave plate 18 and the first polarization beam apparatus 6 should ensure that laser by 18 outgoing of the first half-wave plate through first
Light path after the reflection of polarization beam apparatus 6 is with the laser by 5 outgoing of the second half-wave plate through the light path after 6 transmission of the first polarization beam apparatus
Coincide；The emitting light path of the second polarization beam apparatus 16 is provided with reflecting grating 14, on the reflected light path of reflecting grating 14 sequentially
It is provided with the second convex lens 13, optical filter 12, the 3rd convex lens 11, the 3rd attenuator 10 and avalanche diode detector 7；Snowslide two
The signal output part of pole pipe detector 7 is connected with frequency spectrograph 9.
The emitting light path of the femtosecond pulse laser 28 is provided with first completely reflecting mirror 20；The PPLN crystal
On 22 reflected light paths for being located at the first completely reflecting mirror 20；It is additionally provided between first attenuator 25 and the first half-wave plate 18 complete by second
The beam collimation structure of speculum 26, the 3rd completely reflecting mirror 1 and the 4th completely reflecting mirror 19 composition；Also include positioned at the second polarization point
The 5th speculum 15 on 16 emitting light path of beam device；The reflecting grating 14 is located on the reflected light path of the 5th completely reflecting mirror 15.
Also include the cavity 27 that first through hole 21 and the second through hole 4 is provided with a shell；3rd completely reflecting mirror 1,
Second attenuator 2, diaphragm 3, the second half-wave plate 5, the first polarization beam apparatus 6, avalanche diode detector 7, frequency spectrograph 9, the 3rd
Attenuator 10, the 3rd convex lens 11, optical filter 12, the second convex lens 13, grating 14, the 5th completely reflecting mirror 15, the second polarization point
Beam device 16, the 3rd half-wave plate 17, the first half-wave plate 18, the 4th completely reflecting mirror 19, the first completely reflecting mirror 20, PPLN crystal 22, light
Photonic crystal fiber 23, the first convex lens 24, the first attenuator 25, the second completely reflecting mirror 26 are respectively positioned in cavity 27；Femtosecond pulse
The laser of 28 outgoing of laser instrument is injected by first through hole 21 on the first completely reflecting mirror 20 in cavity 27；Testing laser is through
Two through holes 4 are incident on diaphragm 3；Avalanche diode detector 7 is connected with frequency spectrograph 9 by BNC lines 8.
A kind of method of accurate measurement optical maser wavelength, comprises the following steps：（a）, femtosecond pulse laser 28 transmitting swash
Light after PPLN crystal 22 and photonic crystal fiber 23 is realized expanding, and the laser after expanding is focused on through the first convex lens 24
Afterwards, through the first attenuator 25 and through beam collimation structure the first half-wave plate 18 of arrival, inclined through the adjustment laser of the first half-wave plate 18
Shake behind direction, enter the first polarization beam apparatus 6, then the 3rd half-wave plate 17 is exported after reflecting through the first polarization beam apparatus 6；Simultaneously
The laser of testing laser device output adjusts laser polarization direction by diaphragm 3, through the second attenuator 2 through the second half-wave plate 5
Afterwards, the first polarization beam apparatus 6 are entered；The laser output of 6 polarization direction of the first polarization beam apparatus is met to the 3rd half-wave plate 17, warp
After 3rd half-wave plate 17 adjusts the polarization direction of the femtosecond pulse laser laser and testing laser device laser for inputing to which, defeated
Go out to the second polarization beam apparatus 16；（b）, after above-mentioned two light beam incides the second polarization beam apparatus 16, meet the second polarization beam splitting
The polarization light output of 16 outbound course of device simultaneously completes optics coherence tomography；（c）, synthesis light through the 5th completely reflecting mirror 15 reflection after incide
In reflecting grating 14,14 diffraction of reflected grating after reflecting, then continuous spectrum band is focused into by the second convex lens 13；Continuous light
After bands of a spectrum pass through optical filter 12, the 3rd convex lens 11 are incided, after light beam is through the focusing of the 3rd convex lens 11, through the 3rd attenuator
10, incide avalanche diode detector 7；（d）, the optical signal for collecting is converted into accordingly by avalanche diode detector 7
Electric signal, and it is input to frequency spectrograph 9；According to shown testing laser on frequency spectrograph 9 and femtosecond laser coherent signal frequency
The frequency values of difference and the femtosecond laser relevant with testing laser can obtain the frequency of testing laser.
1. it is and 4. the coherent signal between femtosecond laser comb in Fig. 3, is 2. and 3. laser to be measured and femtosecond
The signal of laser coherence.The frequency of testing laser can be measured according to this.
When being embodied as, the laser instrument for being used is to mix bait laser instrument FC1500.The first described completely reflecting mirror 20, second
Completely reflecting mirror 26, the 3rd completely reflecting mirror 1, the 4th completely reflecting mirror 19, the 5th completely reflecting mirror 15 are the completely reflecting mirror of plating high-reflecting film.
First convex lens 24, the second convex lens 13, the 3rd convex lens 11 are the convex lens of plating anti-reflection film.Avalanche diode is detected
7 model APD210 of device.Frequency spectrograph can also connect computer, gained frequency spectrum is analyzed by computer, analyze speed
Hurry up, as a result accurately.
Claims (5)
1. a kind of device of accurate measurement optical maser wavelength, it is characterised in that including femtosecond pulse laser（28）, sequentially be located at fly
Pulse per second (PPS) laser instrument（28）PPLN crystal on emitting light path（22）, photonic crystal fiber (23), the first convex lens（24）, first
Attenuator（25）With the first half-wave plate（18）；Also include the diaphragm being sequentially located in testing laser light path（3）, the second attenuator
（2）, the second half-wave plate（5）, the first polarization beam apparatus（6）, the 3rd half-wave plate（17）With the second polarization beam apparatus（16）；First is inclined
Shake beam splitter（6）It is also located at the first half-wave plate（18）Emitting light path on；First half-wave plate（18）With the first polarization beam apparatus（6）
Position should ensure that by the first half-wave plate（18）The laser of outgoing is through the first polarization beam apparatus（6）Light path after reflection with by second
Half-wave plate（5）The laser of outgoing is through the first polarization beam apparatus（6）Light path after transmission coincides；Second polarization beam apparatus（16）'s
Emitting light path is provided with reflecting grating（14), reflecting grating（14) the second convex lens are sequentially provided with reflected light path（13）, filter
Mating plate（12）, the 3rd convex lens（11）, the 3rd attenuator（10）With avalanche diode detector（7）；Avalanche diode detector
（7）Signal output part be connected with frequency spectrograph（9）；Femtosecond pulse laser（28）The laser of transmitting is through PPLN crystal（22）With
Photonic crystal fiber (23) is realized expanding afterwards, and the laser after expanding is through the first convex lens（24）After focusing, through the first decay
Piece（25）And the first half-wave plate is reached through beam collimation structure（18）, through the first half-wave plate（18）After adjustment laser polarization direction,
Enter the first polarization beam apparatus（6）, then through the first polarization beam apparatus（6）The 3rd half-wave plate is exported after reflection（17）；Treat simultaneously
The laser for surveying laser instrument output passes through diaphragm（3）, pass through the second attenuator（2）, through the second half-wave plate（5）Adjustment laser polarization side
Backward, the first polarization beam apparatus are entered（6）；Meet the first polarization beam apparatus（6）The laser of polarization direction is exported to the 3rd half-wave
Piece（17）, through the 3rd half-wave plate（17）The femtosecond pulse laser laser that inputs to which of adjustment and testing laser device laser inclined
Shake behind direction, export to the second polarization beam apparatus（16）；Above-mentioned two light beam is femtosecond pulse laser laser and testing laser device
Laser light incident is to the second polarization beam apparatus（16）Afterwards, the second polarization beam apparatus are met（16）The polarization light output of outbound course is simultaneously complete
Into optics coherence tomography.
2. a kind of device of accurate measurement optical maser wavelength as claimed in claim 1, it is characterised in that the femtosecond pulse
Device（28）Emitting light path be provided with first completely reflecting mirror (20)；The PPLN crystal（22）It is located at the first completely reflecting mirror
(20) on reflected light path；First attenuator（25）With the first half-wave plate（18）Between be additionally provided with by the second completely reflecting mirror (26),
The beam collimation structure that 3rd completely reflecting mirror (1) and the 4th completely reflecting mirror (19) are constituted；Also include positioned at the second polarization beam apparatus
（16）The 5th speculum on emitting light path（15）；The reflecting grating（14）It is located at the 5th completely reflecting mirror（15）Reflected light path
On.
3. a kind of device of accurate measurement optical maser wavelength as claimed in claim 2, it is characterised in that also include on a shell
It is provided with first through hole（21）With the second through hole（4）Cavity（27）；3rd completely reflecting mirror（1）, the second attenuator（2）, light
Door screen（3）, the second half-wave plate（5）, the first polarization beam apparatus（6）, avalanche diode detector（7）, frequency spectrograph（9）, the 3rd decay
Piece（10）, the 3rd convex lens（11）, optical filter（12）, the second convex lens（13）, grating（14）, the 5th completely reflecting mirror（15）, the
Two polarization beam apparatus（16）, the 3rd half-wave plate（17）, the first half-wave plate（18）, the 4th completely reflecting mirror（19）, the first completely reflecting mirror
（20）, PPLN crystal（22）, photonic crystal fiber（23）, the first convex lens（24）, the first attenuator（25）, the second total reflection
Mirror（26）It is respectively positioned on cavity（27）Interior；Femtosecond pulse laser（28）The laser of outgoing is by first through hole（21）Inject positioned at cavity
（27）On interior the first completely reflecting mirror (20)；Testing laser is through the second through hole（4）It is incident to diaphragm（3）On；Avalanche diode is visited
Survey device（7）By BNC lines（8）With frequency spectrograph（9）It is connected.
4. a kind of device of accurate measurement optical maser wavelength as claimed in claim 2 or claim 3, it is characterised in that described first is all-trans
Penetrate mirror（20）, the second completely reflecting mirror（26）, the 3rd completely reflecting mirror（1）, the 4th completely reflecting mirror（19）, the 5th completely reflecting mirror（15）?
For plating the completely reflecting mirror of high-reflecting film；First convex lens（24）, the second convex lens（13）, the 3rd convex lens（11）It is plating to increase
The convex lens of permeable membrane.
5. a kind of method using device accurate measurement optical maser wavelength as claimed in claim 2, it is characterised in that including following step
Suddenly：（a）, femtosecond pulse laser（28）The laser of transmitting is through PPLN crystal（22）Realize afterwards expanding with photonic crystal fiber (23)
Beam, the laser after expanding is through the first convex lens（24）After focusing, through the first attenuator（25）And arrive through beam collimation structure
Up to the first half-wave plate（18）, through the first half-wave plate（18）After adjustment laser polarization direction, the first polarization beam apparatus are entered（6）, then
Through the first polarization beam apparatus（6）The 3rd half-wave plate is exported after reflection（17）；The laser of testing laser device output simultaneously passes through light
Door screen（3）, pass through the second attenuator（2）, through the second half-wave plate（5）After adjustment laser polarization direction, the first polarization beam apparatus are entered
（6）；Meet the first polarization beam apparatus（6）The laser of polarization direction is exported to the 3rd half-wave plate（17）, through the 3rd half-wave plate（17）
After adjusting the polarization direction of the femtosecond pulse laser laser and testing laser device laser for inputing to which, the second polarization is exported
Beam splitter（16）；（b）, above-mentioned two light beam be femtosecond pulse laser laser and testing laser device laser light incident to the second polarization point
Beam device（16）Afterwards, the second polarization beam apparatus are met（16）The polarization light output of outbound course simultaneously completes optics coherence tomography；（c）, synthesis
Light is through the 5th completely reflecting mirror（15）Reflecting grating is incided after reflection（14）On, reflected grating（14）Diffraction after reflecting, then
By the second convex lens（13）It is focused into continuous spectrum band；Continuous spectrum band passes through optical filter（12）Afterwards, the 3rd convex lens are incided
（11）, light beam is through the 3rd convex lens（11）After focusing, through the 3rd attenuator（10）, incide avalanche diode detector（7）；
（d）, avalanche diode detector（7）The optical signal for collecting is converted into corresponding electric signal, and is input to frequency spectrograph
（9）；According to frequency spectrograph（9）Upper shown testing laser and frequency difference and and the testing laser of femtosecond laser frequency coherent signal
The frequency values of relevant femtosecond laser can obtain the frequency of testing laser.
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| CN111289124B (en) * | 2020-03-31 | 2021-03-05 | 北京科益虹源光电技术有限公司 | Laser wavelength measuring device and method |
| CN111609999B (en) * | 2020-05-12 | 2021-10-22 | 浙江理工大学 | Beat frequency signal detection device and method for wide wavelength range in laser offset frequency locking |
| CN113686453B (en) * | 2021-09-08 | 2022-09-16 | 中国矿业大学(北京) | Radio wave wavelength measuring device and radio wave wavelength measuring method |
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| JP2007256365A (en) * | 2006-03-20 | 2007-10-04 | Sumitomo Electric Ind Ltd | Optical frequency comb generation device |
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| EP2239620A1 (en) * | 2008-01-28 | 2010-10-13 | National Institute of Information and Communication Technology | Super flat optical frequency comb signal generator |
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| JPH08101066A (en) * | 1994-09-30 | 1996-04-16 | Anritsu Corp | Optical spectrum measuring apparatus |
| JP2007256365A (en) * | 2006-03-20 | 2007-10-04 | Sumitomo Electric Ind Ltd | Optical frequency comb generation device |
| EP2239620A1 (en) * | 2008-01-28 | 2010-10-13 | National Institute of Information and Communication Technology | Super flat optical frequency comb signal generator |
| CN101858822A (en) * | 2010-05-14 | 2010-10-13 | 西安电子科技大学 | He-Ne laser frequency stability measuring system and measuring method thereof |
| CN103439010A (en) * | 2013-08-29 | 2013-12-11 | 浙江理工大学 | Wavelength measurement method and device based on laser synthesized wavelength interference principle |
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