CN104483027A - Automatic laser pulse width measurement autocorrelator and measurement method - Google Patents
Automatic laser pulse width measurement autocorrelator and measurement method Download PDFInfo
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- CN104483027A CN104483027A CN201410735224.7A CN201410735224A CN104483027A CN 104483027 A CN104483027 A CN 104483027A CN 201410735224 A CN201410735224 A CN 201410735224A CN 104483027 A CN104483027 A CN 104483027A
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Abstract
The invention discloses an automatic laser pulse width measurement autocorrelator, which comprises a diaphragm, a beam splitter, reflectors, a frequency-doubling crystal, a linear array CCD (charge coupled device) and a processor, a laser pulse to be measured passes through the diaphragm, so that a standard pulse is obtained, and the standard pulse is then split into two beams of like pulses by the beam splitter; the two beams of pulses are respectively reflected to the frequency-doubling crystal by the two groups of reflectors and autocorrelated, the linear array CCD is utilized to detect the autocorrelated pulse and transmit detected intensity data to the processor, and the processor is utilized to work out laser pulse width. The automatic laser pulse width measurement autocorrelator directly reads intensity and delay data from the output signal of the linear array CCD, and then works out the laser pulse width, the precision of measurement is increased, operation is simple, and the structure of the device is simple and compact.
Description
Technical field
The present invention relates to femtosecond laser technology field, be specifically related to a kind of measurement laser pulse width autocorrelation function analyzer and measuring method automatically.
Background technology
In the past in time decades, the generation of ultrashort laser pulse obtains huge development with application.In physics, biology and chemical field, utilize femtosecond short laser pulse to observe various dynamic process and supper-fast phenomenon, become a kind of brand-new and effective research means, accordingly, the measurement of ultrashort pulse characteristic also seems particular importance.Often adopt correlation method at present, simply, having higher resolution and sensitivity, is that ultra-short pulse width measures the instrument generally adopted for autocorrelation function analyzer compact conformation, adjustment.
The measuring principle of autocorrelation function analyzer makes two identical pulse generation times poor, these two pulses are interacted in frequency-doubling crystal and produces frequency multiplication, adopt line array CCD collection signal again, and send the signal collected to oscillograph, read correlation parameter by oscillograph and then calculate pulse width.Adopting oscillograph to read data and just must there is error problem, in order to improve precision, calculating repeatedly average, but it fundamentally eliminates the measuring error that oscillograph brings.
Summary of the invention
For above defect and the Improvement requirement of prior art, the object of the present invention is to provide a kind of laser pulse width autocorrelation function analyzer device that can automatically measure and measuring method, it eliminates oscillograph, the array data of direct reading intensity, according to the minimum pulse width scale value obtained, choose most suitable from coherent point, and then calculate pulse width, avoid the measuring error that oscillograph brings, improve precision.
A kind of automatically measure laser pulse width autocorrelation function analyzer, comprising: diaphragm, beam splitter, first, second, third and fourth, five, six catoptrons, frequency-doubling crystal 9, line array CCD, processor, precise mobile platform;
Diaphragm, for being adjusted to full sized pules by testing laser pulse; Beam splitter, is placed in diaphragm front, for full sized pules being divided into two bundle identical pulse; First and second catoptron forms corner cube mirror, for the first former direction of beam pulse on its surface incident is turned back to the 3rd catoptron; 3rd catoptron, for reflexing to the 6th catoptron by the first beam pulse of incidence; 4th catoptron, for reflexing to the 5th catoptron by the second beam pulse; 5th catoptron, penetrates mirror for the second beam pulse of incidence is reflexed to the 6th; 6th catoptron, for reflexing to frequency-doubling crystal by two beam steering mirrors of incidence; Frequency-doubling crystal, is provided for two bundle identical pulse and produces frequency multiplication; Line array CCD, for gathering the pulse signal strength that frequency-doubling crystal exports; Precise mobile platform, for placing first and second catoptron, being moved by position and adjusting to first from coherent point and second from coherent point; Processor, calculates pulse width for the pulse signal strength gathered according to line array CCD.
Further, described processor, it comprises waveform half width scale value determination module, from coherent point parsing module and pulse width parsing module, waveform half width scale value determination module is used for from pulse signal strength, parse crest place pixel numerical value and peak intensity value, the absolute value calculating the difference of 1/2 peak intensity value place two pixel position is waveform half width scale value, by continuous mobile precise mobile platform adjustment first, two-mirror position, until determine a certain interval, the waveform half width scale value of this interval correspondence is minimum is designated as X, two interval end values respectively as first from coherent point and second from coherent point, be used for from coherent point parsing module resolving crest place pixel numerical value a1, a2, the precise mobile platform position s1 that record is corresponding, s2 in the pulse signal strength obtained from coherent point at first, second, pulse width parsing module, for calculating laser pulse width W=|2* (s2-s1) * 3333/ (a2-a1) | * X* β, β are testing laser pulse waveform coefficient.
Based on a pulse width measurement method for described laser pulse width autocorrelation function analyzer, be specially:
Adjust first and second reflector position by continuous mobile precise mobile platform, until determine a certain interval, the waveform half width scale value of this interval correspondence is minimum is designated as X; The account form of described waveform half width scale value is: processor parses crest place pixel numerical value and peak intensity value from the pulse signal strength that line array CCD collects, and the absolute value calculating the difference of 1/2 peak intensity value place two pixel position is waveform half width scale value;
Using two of interval end values as first from coherent point and second from coherent point;
Adjustment precise mobile platform position to the first is from coherent point, and processor resolves crest place pixel numerical value a1 from the pulse signal strength obtained from coherent point at first, and records precise mobile platform position s1;
Adjustment precise mobile platform position to the second is from coherent point, and processor resolves crest place pixel numerical value a2 from the pulse signal strength obtained from coherent point at second, and records precise mobile platform position s2;
Calculating laser pulse width W=|2* (s2-s1) * 3333/ (a2-a1) | * X* β, β are testing laser pulse waveform coefficient.
In general, the above technical scheme conceived by the present invention compared with prior art, because the present invention directly reads intensity and delay data from Output Signal of Linear CCD's, and have chosen best from coherent point, calculate laser pulse width, which obviate the error using oscillograph to bring, improve measuring accuracy, simple to operate, apparatus structure is simple and compact.
Accompanying drawing explanation
Fig. 1 is autocorrelation function analyzer structural drawing of the present invention;
Fig. 2 be the present invention test choose first position oscillogram;
Fig. 3 be the present invention test choose second point position oscillogram.
Embodiment
In order to make object of the present invention, technical scheme and advantage clearly understand, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein only in order to explain the present invention, be not intended to limit the present invention.In addition, if below in described each embodiment of the present invention involved technical characteristic do not form conflict each other and just can mutually combine.
Diaphragm 1, beam splitter 2, catoptron 3-8, frequency-doubling crystal 9, line array CCD 10 and processor 11, first testing laser pulse obtains full sized pules by diaphragm, then is divided into two bundle identical pulse by beam splitter.Two pulses reflexes on BBO frequency-doubling crystal respectively through catoptron 3,4,5,8 and catoptron 6,7,8 two light paths, after after the vertical axis of bbo crystal by line array CCD detect from coherent pulse, again the intensity data detected is passed to processor, calculate laser pulse width by processor.
At above-mentioned automatic measurement laser pulse width autocorrelation function analyzer device, all at grade, and described device is all fixed on the same face wrapper sheet the light beam of described device.
At the autocorrelation function analyzer device of automatic measurement laser pulse width of the present invention, catoptron 3,4 is fixed on same precise mobile platform, can transverse shifting.First is adjusted to from coherent point and second from coherent point by precise mobile platform.
At the autocorrelation function analyzer device of above-mentioned automatic measurement laser pulse width, BBO frequency-doubling crystal 9 is fixed on swing offset platform, and two bundle laser to converge on crystal completely, can be added filter plate simultaneously, obtain required frequency doubled light after frequency-doubling crystal.
Line array CCD passes to described processor after detecting auto-correlation intensive parameter, and its course of work is:
1) adjust first and second catoptron (3,4) position by continuous mobile precise mobile platform, until determine a certain interval, the waveform half width scale value of this interval correspondence is minimum is designated as X; The account form of described waveform half width scale value is: processor parses crest place pixel numerical value and peak intensity value from the pulse signal strength that line array CCD collects, and the absolute value calculating the difference of 1/2 peak intensity value place two pixel position is waveform half width scale value;
2) using two of interval end values as first from coherent point and second from coherent point;
3) selected first from coherent point, processor resolves crest place pixel numerical value a1 from the pulse signal strength obtained from coherent point at first, records now moving displacement platform registration s1, unit: mm;
3) regulate by catoptron 3,4,5,8 light path light path, two light path generation times are made to be delayed to second from coherent point, processor resolves crest place pixel numerical value a2 from the pulse signal strength obtained from coherent point at second, and records precise mobile platform position s2; Unit: mm;
4) surveyed laser pulse width W=|2* (s2-s1) * 3333/ (a2-a1) is automatically calculated according to input data | * X* β, unit: femtosecond.
Below lift an instantiation:
Measure a branch of near infrared Gauss femto-second laser pulse, use line array CCD chip model for Toshiba TCD1304AP, pixel size is 8 μm × 200 μm.Use chip for FTD2XX, adopting Labview, write and be issued as can installation procedure.Then can determine that now form factor is β=0.707, half width scale value is X=24.Fig. 2 gives the oscillogram of selected first, and readable must laser crest place pixel be now a1=2407, input displacement platform registration s1=2.650 now.Regulate moving displacement platform, two-beam road is produced optical path delayed, Fig. 3 gives selected second point.Read now laser crest pixel be a2=2192, now displacement platform registration is s2=2.743.
According to pulsewidth computing formula W=|2* (s2-s1) * 3333/ (a2-a1) | * X* β, then obtaining surveyed laser pulse width is 48.9fs.
Those skilled in the art will readily understand; the foregoing is only preferred embodiment of the present invention; not in order to limit the present invention, all any amendments done within the spirit and principles in the present invention, equivalent replacement and improvement etc., all should be included within protection scope of the present invention.
Claims (3)
1. automatically measure laser pulse width autocorrelation function analyzer for one kind, it is characterized in that, comprise: diaphragm (1), beam splitter (2), first, second, third and fourth, five, six catoptrons (3,4,5,6,7,8), frequency-doubling crystal (9), line array CCD (10), processor (11), precise mobile platform;
Diaphragm (1), for being adjusted to full sized pules by testing laser pulse; Beam splitter (2), is placed in diaphragm (1) front, for full sized pules being divided into two bundle identical pulse; First and second catoptron (3,4) forms corner cube mirror, for the first former direction of beam pulse on its surface incident is turned back to the 3rd catoptron (5); 3rd catoptron (5), for reflexing to the 6th catoptron (8) by the first beam pulse of incidence; 4th catoptron (6), for reflexing to the 5th catoptron (7) by the second beam pulse; 5th catoptron (7), penetrates mirror (8) for the second beam pulse of incidence is reflexed to the 6th; 6th catoptron (8), for reflexing to frequency-doubling crystal (9) by two beam steering mirrors of incidence; Frequency-doubling crystal (9), is provided for two bundle identical pulse and produces frequency multiplication; Line array CCD (10), for gathering the pulse signal strength that frequency-doubling crystal (9) exports; Precise mobile platform, for placing first and second catoptron (3,4), being moved by position and adjusting to first from coherent point and second from coherent point; Processor (11), calculates pulse width for the pulse signal strength gathered according to line array CCD (10).
2. automatic measurement laser pulse width autocorrelation function analyzer according to claim 1, it is characterized in that, described processor (11), it comprises waveform half width scale value determination module, from coherent point parsing module and pulse width parsing module, waveform half width scale value determination module is used for from pulse signal strength, parse crest place pixel numerical value and peak intensity value, the absolute value calculating the difference of 1/2 peak intensity value place two pixel position is waveform half width scale value, by continuous mobile precise mobile platform adjustment first, two-mirror (3, 4) position, until determine a certain interval, the waveform half width scale value of this interval correspondence is minimum is designated as X, two interval end values respectively as first from coherent point and second from coherent point, be used for from coherent point parsing module resolving crest place pixel numerical value a1, a2, the precise mobile platform position s1 that record is corresponding, s2 in the pulse signal strength obtained from coherent point at first, second, pulse width parsing module, for calculating laser pulse width W=|2* (s2-s1) * 3333/ (a2-a1) | * X* β, β are testing laser pulse waveform coefficient.
3., based on a pulse width measurement method for laser pulse width autocorrelation function analyzer according to claim 1, it is characterized in that, be specially:
Adjust first and second catoptron (3,4) position by continuous mobile precise mobile platform, until determine a certain interval, the waveform half width scale value of this interval correspondence is minimum is designated as X; The account form of described waveform half width scale value is: processor parses crest place pixel numerical value and peak intensity value from the pulse signal strength that line array CCD collects, and the absolute value calculating the difference of 1/2 peak intensity value place two pixel position is waveform half width scale value;
Using two of interval end values as first from coherent point and second from coherent point;
Adjustment precise mobile platform position to the first is from coherent point, and processor resolves crest place pixel numerical value a1 from the pulse signal strength obtained from coherent point at first, and records precise mobile platform position s1;
Adjustment precise mobile platform position to the second is from coherent point, and processor resolves crest place pixel numerical value a2 from the pulse signal strength obtained from coherent point at second, and records precise mobile platform position s2;
Calculating laser pulse width W=|2* (s2-s1) * 3333/ (a2-a1) | * X* β, β are testing laser pulse waveform coefficient.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105953930A (en) * | 2016-05-11 | 2016-09-21 | 深圳市杰普特光电股份有限公司 | Picosecond-level narrow pulse width testing device |
| CN107436197A (en) * | 2017-06-17 | 2017-12-05 | 河南省启封新源光电科技有限公司 | Big bandwidth, the autocorrelation function analyzer of microminiature single-shot automatic measurement femtosecond laser pulsewidth |
| CN110398196A (en) * | 2019-07-19 | 2019-11-01 | 陕西威尔机电科技有限公司 | A kind of LVDT sensor signal processing method and system for accurate measurement |
| CN114740274A (en) * | 2022-04-02 | 2022-07-12 | 南通探维光电科技有限公司 | Pulse width measuring method, device and system for laser ranging signal |
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| CN103808417A (en) * | 2014-03-05 | 2014-05-21 | 河南师范大学 | Measurement device for femtosecond laser pulse width |
| CN204269233U (en) * | 2014-12-04 | 2015-04-15 | 华中科技大学 | A kind of laser pulse width of measurement automatically autocorrelation function analyzer |
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| CN2515663Y (en) * | 2001-12-26 | 2002-10-09 | 中国科学院上海光学精密机械研究所 | Optical pulse information measurer capable of measuring and calibrating at same time |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105953930A (en) * | 2016-05-11 | 2016-09-21 | 深圳市杰普特光电股份有限公司 | Picosecond-level narrow pulse width testing device |
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| CN107436197A (en) * | 2017-06-17 | 2017-12-05 | 河南省启封新源光电科技有限公司 | Big bandwidth, the autocorrelation function analyzer of microminiature single-shot automatic measurement femtosecond laser pulsewidth |
| CN110398196A (en) * | 2019-07-19 | 2019-11-01 | 陕西威尔机电科技有限公司 | A kind of LVDT sensor signal processing method and system for accurate measurement |
| CN114740274A (en) * | 2022-04-02 | 2022-07-12 | 南通探维光电科技有限公司 | Pulse width measuring method, device and system for laser ranging signal |
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