CN104122871A - Real-time monitoring system and real-time monitoring method of semiconductor test data - Google Patents
Real-time monitoring system and real-time monitoring method of semiconductor test data Download PDFInfo
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- CN104122871A CN104122871A CN201410363773.6A CN201410363773A CN104122871A CN 104122871 A CN104122871 A CN 104122871A CN 201410363773 A CN201410363773 A CN 201410363773A CN 104122871 A CN104122871 A CN 104122871A
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- 238000012544 monitoring process Methods 0.000 title claims abstract description 29
- 239000004065 semiconductor Substances 0.000 title claims abstract description 25
- 238000000034 method Methods 0.000 title claims abstract description 14
- 230000003993 interaction Effects 0.000 claims abstract description 10
- 238000004519 manufacturing process Methods 0.000 claims description 20
- 238000007596 consolidation process Methods 0.000 claims description 6
- 230000010354 integration Effects 0.000 claims description 6
- 238000012956 testing procedure Methods 0.000 claims description 4
- 238000004458 analytical method Methods 0.000 abstract description 2
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/30—Computing systems specially adapted for manufacturing
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Abstract
The invention relates to a real-time monitoring system and a real-time monitoring method of semiconductor test data. The real-time monitoring system comprises a client, a server and a display terminal, wherein the client is used for reading relevant data generated by a test machine and uploading the relevant data to the server; the server is used for reading the data uploaded by the client, carrying out analysis and comparison to obtain the operating state of the test machine and updating the data of the server; the display server is used for displaying new data after comparison of the server and the state of the test machine; the client, the server and the display terminal are connected through data interaction. After the technical scheme is adopted, the system can be compatible with various models of test machines, the data are free of man-made zero-clearing, and the data are rich in content. Due to the fact that all information of program of the test machine can be read, new hardware does not need to be added, and the input cost in earlier stage is reduced.
Description
Technical field
The present invention relates to semiconductor test data monitoring field, relate in particular to and a kind ofly can carry out to semiconductor test data supervisory system and the method for supervising thereof of in real time monitoring.
Background technology
In semiconductor test, data being monitored is at present mainly to adopt MES system, MES system is manufacturing execution system (manufacturing execution system, be called for short MES), MES can provide administration modules such as comprising Manufacturing Data Management, plan scheduling management, Production scheduling management, stock control, quality management, human resource management, work centre/equipment control, instrument tool management, purchasing management, cost management, project kanban system, production run control, bottom data integrated analysis, the integrated decomposition of upper layer data for enterprise.But MES system side focuses on the execution of Production Scheduling Problem, it is not come into contacts with production equipment itself, production status on embodiment device really, the i.e. information such as output, yield in real time.These situations are main or collect and gather to a tableland on equipment by personnel, and when summary sheet is received by upper management department, new variation may occur equipment state, and this just cannot accomplish the real-time monitoring to production status.
For what improve that MES system exists, cannot carry out the object of monitoring in real time to production status, the mode of normal part is set up hardware exactly, on every test machine, increase in addition a monitoring computer and a GPIB (General-Purpose Interface Bus general purpose interface bus) address card, by GPIB card, capture the sorting signals that test machine sends, then by there being special software to carry out accumulated counts to collecting signal on monitoring computer, after completing, again data are passed in database for gathering and analyzing by LAN (Local Area Network).
Adopt the mode that increases GPIB card to have following disadvantage:
1, bad adaptability: be only applicable to the test machine that GPIB agreement is carried out communication, poor compatibility.
2, data cannot automatic clear: whether system cannot automatic decision production status be changed, and data is continued cumulative, and needing people is zero clearing.
3, content is dull: because of the electric signal gathering, add up, cannot accomplish the monitoring to all data of test machine, such as: the title of product, which kind of test procedure, implementor name, operator job number can't detect these information by GPIP card.
4, early stage, hardware input cost was high: every test machine need newly be joined a computer and a GPIB card, has increased cost.
Summary of the invention
Control and measuring data and increase the problem that GPIB card is made troubles in real time when solving semiconductor test, the invention provides a kind of semiconductor test data real-time monitoring system and method for supervising thereof.
To achieve these goals, the technical solution used in the present invention is: a kind of semiconductor test data real-time monitoring system, comprising: the related data that read test machine program produces the client of uploading.Read the data of client upload and analyze the service end contrasting.The display terminal that data after server contrast are shown.Described client, service end and display terminal are connected by data interaction.
Further, described client comprises read module, integrate module and sending module.Described read module reads the data of each website test machine software, the Data Integration that described integrate module reads read module is consolidation form, described sending module uploads to service end by integral data, and described read module, integration and sending module are connected by data interaction.
Further, described service end comprises memory module and contrast module.Described memory module is stored the data of client upload, and described contrast module is analyzed the data of client upload and last stored Data Comparison, and described memory module is connected by data interaction with documents.
Further, described display terminal adopts WEB form to show.
A kind of semiconductor test data are the method for monitoring in real time: comprise the steps:
Execution step S1, arranges the client described in claim 1 and service end, makes client have unique address in service end.
Execution step S2, resolves the information such as program name in test machine program, lot number, beginning production time, employee information, testing procedure by client.
Execution step S3, by the test data in the read test machine program of client interval.
Execution step S4, is converted into consolidation form by client by the data that collect and is uploaded to service end.
Execution step S5, service end contrasts the running status of rear judgement test machine by the data of reception and last stored to the data of memory module;
Execution step S6, the client data that service end receives it and through the test machine running status flag update that draws of judgement in memory module;
Execution step S7, data and test machine state after display terminal upgrades memory module are shown.
Adopt after semiconductor test data real-time monitoring system and method thereof: can bring following advantage:
1, compatible different types of machines: this programme does not need to increase new hardware, data acquisition is not being counted by gathering electric signal yet.But bring in by client the test data file that read test machine program produces, realize the monitoring to data.Therefore test type that can be compatible different.
2, without people, be zero clearing: the data that produce when test machine program change and are, client detects data and also can change, therefore be zero clearing without people, can accomplish that data unify in real time.
3, data content is abundant: due to client control be the data of test machine program, any data of test machine all can monitoredly arrive, such as information such as the name of product, the quantity of product, which kind of test procedure, implementor name, operator job numbers.
4, without extra hardware, drop into: client, directly according in test machine computer, does not need to increase new hardware, and what read is the data of test machine program, does not need GPIB card, has saved early investment cost.
Accompanying drawing explanation
Fig. 1 is the theory diagram of semiconductor test data real-time monitoring system.
Fig. 2 is the theory diagram of the method for semiconductor test data monitoring.
Embodiment
Below in conjunction with accompanying drawing, preferred embodiments of the present invention are further elaborated:
A semiconductor test data real-time monitoring system, comprising: the related data that read test machine program produces the client of uploading.Read the data of client upload and analyze the service end contrasting.The display terminal that data after server contrast are shown.Described client, service end and display terminal are connected by data interaction.
Client comprises read module, integrate module and sending module.Described read module reads the data of each website test machine software, the Data Integration that described integrate module reads read module is consolidation form, described sending module uploads to service end by integral data, and described read module, integration and sending module are connected by data interaction.In memory module as the mode service end being more preferably, be also provided with test machine IP database.
Below client is described in detail: under Windows system, need to write 2 programs, one is system service program, in order to reading of timing executing data file, another is that program is uploaded in data acquisition.These two programs are all more common, and those skilled in the art can write out.When under unix system, we utilize crontab to come this data acquisition of timing operation to upload program.
Below main explanation data acquisition upload program and how to work.First explanation a bit, the form of the real-time data file that different test machines generates is different, so will write different data acquisitions for different test machines, gather function, but last object is identical, will after data layout unification, uploads again exactly.Program reads the data a line a line in ephemeral data file, program name, lot number, beginning production time, employee information, testing procedure information etc. are recorded, again that the quantity of each product of test is constantly cumulative, and corresponding corresponding test name, so just obtained the quantity of all products of testing, non-defective unit quantity, the quantity that each test station was surveyed, and the quantity of each minute product, upload to again service end after being finally compiled into unified data layout.
Because the temporary file of some test machine can be very large, and data in file are constantly cumulative, and when the type of test is more, file will be larger.For improving the reading efficiency of client, our customer end adopted the method for resuming studies, client can record read which last time, while carrying out specifically, directly from this row, started to read, and then the quantity of quantity and last time was added up.After completing, re-use socket socket, utilize ICP/IP protocol, data are sent to service end.
Service end comprises memory module and contrast module.Described memory module is stored the data of client upload, and described contrast module is analyzed the data of client upload and last stored Data Comparison, and described memory module is connected by data interaction with documents.As the mode being more preferably, as the mode being more preferably, can also make the data of database in factory backup to high in the clouds, Web monitoring and all kinds of customized form are provided beyond the clouds.Adopt the mode in high in the clouds also to there is following advantage: 1, high in the clouds data backup: database data schedule backup, in the database of high in the clouds, has improved data security.2, high in the clouds data processing: client can utilize the large form of high in the clouds deal with data amount, does not take local computing resource, can automatically form be issued to client after system completes.3, high in the clouds comparing: same client can be utilized the information such as the different subcontractors' of high in the clouds comparing production efficiency, yield, balance production capacity.4, multi-platform access: owing to using WEB technology, see through internet, user can pass through PC, panel computer, smart mobile phone is monitored in real time and is produced the line condition of production as placed oneself in the midst of the environment of plant.
Below service end is described in detail: service end adopts other module, it utilizes POE(Perl Object Environment) write, with it, create and monitor socket socket and receive IP and the data from client.Because we have set the database of test machine and corresponding IP in advance, we just can be mapped the data of reception and corresponding equipment one by one like this, and then these data are saved in the memory module of service end, when next time, new data arrived, contrast module will be analyzed new data and previous data, this contrast is mainly the conversion of seeing test quantity, if quantity invariant representation equipment is not being produced, if it is large that quantity becomes, be illustrated in production, we change this by numeral 1 and 2 and represent, after having contrasted, 1 and 2 combine and form one new 1 and upgrade into database.As for product information data, we are also saved in them in an interim tables of data, and carry out real-time update.
Described display terminal adopts WEB form to show.
Below display terminal is described in detail: after service end successfully gets the data of client and contrasts by analysis, just need to display it by terminal, here the mode that the display terminal that we adopt is WEB, form by WEB shows the data after comparative analysis, for relevant responsible official, understand and grasp the real-time status of diverse location test machine, use WEB as the benefit of display terminal to be: to upgrade without carrying out to client, as long as direct update service end, is about to web page files newly-generated after contrast module and upgrades.Adopt second benefit of mode of WEB to be convenient to exactly safeguard.The 3rd benefit is can also be by open-ended, and user can just directly conduct interviews by internet like this, and user is at the real time status of understanding production scene that thousands of miles away just can be real-time like this.To can make in time corresponding decision-making.
A kind of semiconductor test data in real time method of monitoring are to realize by following mode, and execution step S1, arranges the client described in claim 1 and service end, makes client have unique address in service end.Owing to can generate a real-time data file in the test process of semiconductor test machine,
Execution step S2, is brought in regularly and is carried out and read and resolve the real time data file that test machine program produces by client.The information such as the program name in client parsing test machine program, lot number, beginning production time, employee information, testing procedure.
Execution step S3, by the test data in the read test machine program of client interval, execution step S3 adopts the mode of resuming studies, and reading information starts to read from last registration while carrying out, and reading out data is added up.Described execution step S3 is also provided with interim guide look tables of data, and this tables of data per minute upgrades a secondary data.
Execution step S4, is extracted the data that collect arrange then and be converted into after consolidation form according to established form by client, and then data file is sent to service end by network.
Execution step S5, service end contrasts the running status of rear judgement test machine by the data of reception and last stored to the data of memory module.Be that before and after the contrast module contrast of service end, the situation of twice data file determines equipment and producing, shutting down and the conclusion such as knot batch, and these data and conclusion are saved in database.
Execution step S6, the client data that service end receives it and through the test machine running status flag update that draws of judgement in memory module.
Execution step S7, data and test machine state after display terminal upgrades memory module are shown.Be display terminal by web technology by the data display after comparative analysis to user.Here we can utilize wire frame representation equipment, the state of the color indication equipment in wire frame, and numeral yield, shows intuitively; When user moves on to mouse on concrete wire frame, by Ajax technology, the details of storing in database are shown.
The foregoing is only embodiments of the invention; not thereby limit the scope of the claims of the present invention; everyly utilize the equivalent transformation of making in technical scheme of the present invention, or be directly or indirectly used in associated technical field, all drop in the protection domain of technical solution of the present invention.
Claims (9)
1. a semiconductor test data real-time monitoring system, is characterized in that: comprising: the related data that read test machine program produces the client of uploading; Read the data of client upload and analyze the service end contrasting;
The display terminal that data after server contrast are shown;
Described client, service end and display terminal are connected by data interaction.
2. semiconductor test data real-time monitoring system according to claim 1, is characterized in that: described client comprises read module, integrate module and sending module;
Described read module reads the data of each website test machine software;
The Data Integration that described integrate module reads read module is consolidation form;
Described sending module uploads to service end by integral data;
Described read module, integration and sending module are connected by data interaction.
3. semiconductor test data real-time monitoring system according to claim 1, is characterized in that: described service end comprises memory module and contrast module; Described memory module is stored the data of client upload; Described contrast module is analyzed the data of client upload and last stored Data Comparison; Described memory module is connected by data interaction with documents.
4. semiconductor test data real-time monitoring system according to claim 1, is characterized in that: described display terminal adopts WEB form to show.
5. semiconductor test data real-time monitoring system according to claim 1, is characterized in that: the corresponding IP database of the equipment that is provided with in the memory module in described service end.
6. semiconductor test data real-time monitoring system according to claim 1, is characterized in that: the memory module of described service end backups to high in the clouds by storage data by the set time.
7. the method that semiconductor test data are monitored in real time: it is characterized in that: comprise the steps: to perform step a S1, the client described in claim 1 and service end are set, make client have unique address in service end;
Execution step S2, resolves the information such as program name in test machine program, lot number, beginning production time, employee information, testing procedure by client; Execution step S3, by the test data in the read test machine program of client interval; Execution step S4, is converted into consolidation form by client by the data that collect and is uploaded to service end;
Execution step S5, service end contrasts the running status of rear judgement test machine by the data of reception and last stored to the data of memory module;
Execution step S6, the client data that service end receives it and through the test machine running status flag update that draws of judgement in memory module;
Execution step S7, data and test machine state after display terminal upgrades memory module are shown.
8. the method that semiconductor test data according to claim 7 are monitored in real time, is characterized in that: described execution step S3 adopts the mode of resuming studies, and reading information starts to read from last registration while carrying out, and reading out data is added up.
9. the method that semiconductor test data according to claim 7 are monitored in real time, is characterized in that: described execution step S3 is also provided with interim guide look tables of data, and this tables of data per minute upgrades a secondary data.
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| CN109286683A (en) * | 2018-11-16 | 2019-01-29 | 四川长虹电器股份有限公司 | Multithreading information collection report method based on MES system |
| CN111856249A (en) * | 2020-07-24 | 2020-10-30 | 安测半导体技术(江苏)有限公司 | Chip test monitoring method, client and system |
| CN111880079A (en) * | 2020-07-24 | 2020-11-03 | 安测半导体技术(江苏)有限公司 | Chip test monitoring method and server |
| CN113140479A (en) * | 2020-01-17 | 2021-07-20 | 无锡芯享信息科技有限公司 | Monitoring system and method for semiconductor device preparation process |
| CN113297157A (en) * | 2020-02-24 | 2021-08-24 | 长鑫存储技术有限公司 | Machine file processing method and system |
| CN113960453A (en) * | 2021-11-02 | 2022-01-21 | 上海御渡半导体科技有限公司 | Test device and test method for rapidly generating STDF (standard test definition distribution) data |
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| CN113960453A (en) * | 2021-11-02 | 2022-01-21 | 上海御渡半导体科技有限公司 | Test device and test method for rapidly generating STDF (standard test definition distribution) data |
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| CN104122871B (en) | 2017-02-15 |
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