CN103377103A - Stored data test method, device and system - Google Patents
Stored data test method, device and system Download PDFInfo
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- CN103377103A CN103377103A CN2012101336665A CN201210133666A CN103377103A CN 103377103 A CN103377103 A CN 103377103A CN 2012101336665 A CN2012101336665 A CN 2012101336665A CN 201210133666 A CN201210133666 A CN 201210133666A CN 103377103 A CN103377103 A CN 103377103A
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Abstract
The invention discloses a stored data test method, device and system. The method comprises steps of reading stored data of an IIC chip through an ARM tool; comparing the stored data with preset default data; generating a comparison report according to comparison results. By automatically reading the stored data of the IIC chip, comparing the stored data with the default data and generating the comparison report, intelligentialize of a stored data test is achieved, and the test efficiency and accuracy rate are improved.
Description
Technical field
The present invention relates to embedded automatic test field, in particular to a kind of storage data test method, Apparatus and system.
Background technology
All relate to the electronic product of program development at present, all face the problem of reliability, how to improve the quality of products, and reliable experiment test method validation must be arranged, and the IIC chip data are many, and validation difficulty is large.
Advanced method of testing is as follows at present: read the data of storing in the IIC chip with chip burn writing equipments such as ALL11, then save data manually is put in the Microsoft Excel to PC again, compares with known definition list and the data that need to preserve.Then the artificial nucleus checks than the result and generates comparison report.
The complete manually-operated of said method, the efficient of test data is low, and testing an IIC chip need 2 to 5 days (deciding according to data volume), and can not automatically go out the test comparison report.
Summary of the invention
The invention provides a kind of storage data test method, Apparatus and system, to solve at least in the correlation technique, the test of IIC chip-stored data is manually-operateds, inefficient problem.
According to an aspect of the present invention, provide a kind of storage data test method, having comprised: the storage data that read the IIC chip by the ARM frock; Storage data and the default data that sets in advance are compared; Generate comparison report according to comparing result.
Preferably, after generating comparison report according to comparing result, said method also comprises: when comparison report shows that there is mistake in the storage data, by the ARM frock default data is write in the IIC chip again.
Preferably, default data comprise following one of at least: ring compensation, protection value, defrost time in compressor operating frequency, inside and outside rotation speed of fan, the refrigerating/heating.
Preferably, comparison report comprise following one of at least: data name, data address, the default data that sets in advance, the storage data, abnormal data, the test result that read.
Preferably, described comparison report is the EXCEL form, comprising abnormal data is pointed out.
According to another aspect of the present invention, provide a kind of storage data test device, having comprised: read module, for the storage data that read the IIC chip by the ARM frock; The contrast module is used for storing data and compares with the default data that sets in advance; Generation module is used for generating comparison report according to comparing result.
Preferably, said apparatus also comprises: writing module is used for showing that in comparison report the storage data exist in the wrong situation, write default data in the IIC chip again by the ARM frock.
Preferably, default data comprise following one of at least: ring compensation, protection value, defrost time in compressor operating frequency, inside and outside rotation speed of fan, the refrigerating/heating.
Preferably, comparison report comprise following one of at least: data name, data address, the default data that sets in advance, the storage data, abnormal data, the test result that read.
Preferably, described comparison report is the EXCEL form, comprising abnormal data is pointed out.
According to a further aspect of the invention, a kind of storage data testing system is provided, comprise ARM frock, IIC chip and operating platform, wherein, operating platform is used for reading by the ARM frock storage data of IIC chip, storage data and the default data that sets in advance are compared, and generate comparison report according to comparing result.
Preferably, the aforesaid operations platform also is used for showing that in comparison report the storage data exist in the wrong situation, write default data in the IIC chip again by the ARM frock.
Preferably, operating platform is connected by the RS232 converter with the ARM frock, and the ARM frock is connected by order wire with the IIC chip.
Preferably, the aforesaid operations platform is the computer software operating platform.
The present invention is by automatically reading the storage data of IIC chip, and compares with default data, generates comparison report, thereby realized the intellectuality of storage data test, and improved testing efficiency and accuracy rate.
Description of drawings
Accompanying drawing described herein is used to provide a further understanding of the present invention, consists of the application's a part, and illustrative examples of the present invention and explanation thereof are used for explaining the present invention, do not consist of improper restriction of the present invention.In the accompanying drawings:
Fig. 1 is the process flow diagram according to the storage data test method of the embodiment of the invention;
Fig. 2 is the synoptic diagram according to the comparison report of the embodiment of the invention;
Fig. 3 is the structured flowchart according to the storage data test device of the embodiment of the invention;
Fig. 4 is the structured flowchart of storing according to the preferred embodiment of the invention data test device;
Fig. 5 is the structured flowchart according to the storage data testing system of the embodiment of the invention;
Fig. 6 is the connection diagram of storing according to the preferred embodiment of the invention data testing system;
Fig. 7 is the operational flowchart of Labview software according to the preferred embodiment of the invention;
Fig. 8 is the process flow diagram one of storing according to the preferred embodiment of the invention the data test method;
Fig. 9 is the flowchart 2 of storing according to the preferred embodiment of the invention the data test method;
Figure 10 is the flow chart 3 of storing according to the preferred embodiment of the invention the data test method.
Embodiment
Need to prove that in the situation of not conflicting, embodiment and the feature among the embodiment among the application can make up mutually.Describe below with reference to the accompanying drawings and in conjunction with the embodiments the present invention in detail.
In the correlation technique, the total man worker that tests of IIC chip-stored data operates, and efficient is low, and accuracy is low, and needs burn writing equipment, and cost is higher.So, need a kind of efficient high, intellectuality, measuring accuracy is high, the method for testing that cost is low.The embodiment of the invention provides a kind of storage data test method, and Fig. 1 is the process flow diagram according to the storage data test method of the embodiment of the invention, as shown in Figure 1, comprises that following step S102 is to step S106.
Step S102 reads the storage data of IIC chip by the ARM frock.
Step S104 compares storage data and the default data that sets in advance.
Step S106 generates comparison report according to comparing result.
In above-described embodiment, by automatically reading the storage data of IIC chip, and compare with default data, generate comparison report, thereby realized the intellectuality of storage data test, and improved testing efficiency and accuracy rate, and do not need burn writing equipment, saved cost.Above-mentioned default data is to write in advance ARM's.In the said method, read the storage data, known data and the storage data that read are compared, automatically generate the comparison report of EXCEL form, with the data automatic alarm that requires not conform to (for example, unusual with " ▲ ▲ ▲ " expression), what conform to given data does not point out.
The embodiment of the invention also provides a kind of preferred implementation, after above-mentioned steps S106, when comparison report shows that there is mistake in the storage data, by the ARM frock default data is write in the IIC chip again.There is wrong IIC chip in this preferred implementation to data, again writes, and has guaranteed to a certain extent the accuracy of its data.
The embodiment of the invention also provides another kind of storage data test method, namely, the data of predefined default data or test passes are write the IIC chip, the IIC chip of data writing is installed on the corresponding controller produces again, replaced original burn writing equipment.
Above-mentioned default data comprise following one of at least: ring compensation, protection value, defrost time in compressor operating frequency, inside and outside rotation speed of fan, the refrigerating/heating.Default data is provided by the developer, and for example IIC chip AT24C08A always has 1024 data.
Above-mentioned comparison report comprise following one of at least: data name, data address, the default data that sets in advance, the storage data, abnormal data, the test result that read.The synoptic diagram of comparison report as shown in Figure 2, delegation is 1 data, D row (known default data) compare with E row (storage data value), check known default data (developer provides) and whether store data value consistent.When default data and storage data value were in full accord, then comparing result did not show any content or demonstration " normally "; If data exception can be reminded by displaying symbol, for example among Fig. 2 12 row with " ▲ ▲ ▲ " expression data exception.
The embodiment of the invention also provides a kind of storage data test device, and this device can be used for realizing above-mentioned storage data test method.Fig. 3 is the structured flowchart according to the storage data test device of the embodiment of the invention, as shown in Figure 3, comprises read module 32, contrast module 34 and generation module 36.
Read module 32 is for the storage data that read the IIC chip by the ARM frock; Contrast module 34 is connected to read module 32, is used for the storage data that read module 32 is read and compares with the default data that sets in advance, and wherein the above-mentioned default data that sets in advance is to write in advance among the ARM; Generation module 36 is connected to contrast module 34, is used for generating comparison report according to the comparing result of contrast module 34.
As shown in Figure 4, said apparatus also comprises: writing module 38, be connected to generation module 36, and be used for showing that in the comparison report that generation module 36 generates the storage data exist in the wrong situation, write default data in the IIC chip again by the ARM frock.
Above-mentioned default data comprise following one of at least: ring compensation, protection value, defrost time in compressor operating frequency, inside and outside rotation speed of fan, the refrigerating/heating.
Above-mentioned comparison report comprises: data name, data address, the default data that sets in advance, the storage data, abnormal data, the test result that read.
Preferably, described comparison report is the EXCEL form, comprising abnormal data is pointed out.
Need to prove that the storage data test device of describing among the device embodiment is corresponding to above-mentioned embodiment of the method, its concrete implementation procedure had been carried out detailed description in embodiment of the method, do not repeat them here.
In addition, the embodiment of the invention also provides a kind of storage data testing system, as shown in Figure 5, this system comprises ARM frock 52, IIC chip 54 and operating platform 56, wherein operating platform 56 is used for reading by ARM frock 52 the storage data of IIC chip 54, storage data and the default data that sets in advance are compared, and wherein the above-mentioned default data that sets in advance is to write among the ARM in advance, and generates comparison report according to comparing result.
Preferably, aforesaid operations platform 56 also is used for showing that in comparison report the storage data exist in the wrong situation, write default data in the IIC chip 54 again by ARM frock 52.
Operating platform 56 is connected by RS232 converter 58 with ARM frock 52, and ARM frock 52 and IIC chip 54 are connected by order wire.Be contained on the controller board in the non-detachable situation at IIC chip 54, ARM frock 52 is connected with IIC chip 54 corresponding pins.
Preferably, aforesaid operations platform 56 is computer software operating platforms.
The below is take Labview software as example, implementation procedure of the present invention is described in detail to process flow diagram shown in Figure 10 in conjunction with system's connection diagram shown in Figure 6 and Fig. 8.
As shown in Figure 6, the available communication line is connected between software and the frock.Labview software (on PC) is connected with converter (RS232 turns 485) by order wire, and converter is connected with the ARM frock by two core order wires, and the ARM frock is connected with IIC chip carrier frock by the four-core order wire.
Fig. 7 is the operational flowchart of Labview software according to the preferred embodiment of the invention, as shown in Figure 7, at first open Labview software, select type, select known definition list (namely to store the address of data, data content, known default data), then read the storage data, comparing result is derived test result automatically.Wherein, Labview software platform on the PC compares known data and the data that read, automatically generate EXCEL form comparison report, with the data automatic alarm that requires not conform to (band " ▲ ▲ ▲ " expression is unusual), what conform to given data does not point out.
The embodiment of the invention provides three kinds of concrete schemes, and is as follows:
Scheme one (as shown in Figure 8):
Step S802 is connected Labview software with two core order wires with the ARM frock, the ARM frock is connected with IIC chip carrier frock.
Step S804 writes default data or qualified data among the ARM, opens Labview software, and the ARM frock powers on.
Step S806, function software can read the storage data in the IIC chip automatically.
Step S808 carries out comparing with known default data and going out test report with the storage data that read.
Scheme two (as shown in Figure 9):
Step S902 is connected Labview software with two core order wires with the ARM frock, the ARM frock is connected with IIC chip carrier frock.
Step S904 opens Labview software, and the ARM frock powers on.
Step S906 carries out in the Labview software platform after the data test, and the data of test passes are write in the IIC chip.
Step S908, the IIC chip of the data writing controller production of packing into.
This programme can write the data of test passes in the IIC chip, and produces, and replaces original burn writing equipment.
Scheme three (as shown in figure 10):
Step S1002 is connected Labview software with two core order wires with the ARM frock, the ARM frock is connected with IIC chip carrier frock.
Step S1004, the ARM frock is connected with the corresponding pin of tested controller IIC chip.
Step S1006 opens Labview software, ARM frock power on (synchronous or asynchronous all can).
Step S1008, function software can read or write the storage data automatically in the IIC chip, if read the storage data, can compare and go out test report with known default data.
It is synchronous or asynchronous to it should be noted that in above-mentioned three kinds of schemes that Labview software and ARM frock power on, and on not impact of test result, strictly connects on request between the three, and any mode can operate, without drawback.If the IIC chip need to be installed to controller verification storage data, then will by concrete testing authentication, manually go out test report.
From the above, whole scheme is divided three parts: Labview software platform, ARM frock, IIC chip carrier frock.Wherein, IIC chip carrier frock can test patch IIC chip and dual inline type (Dual inline-pin Package is referred to as DIP) packaged chip.The present invention is applicable to be equipped with on all controllers the storage data test of the control panel (as: IC24C02 of the manufacturer production such as ST and ATMEL, IC24C08 etc.) of IIC chip.
Such scheme has following beneficial effect: easy to connect, simple to operate; Labview software can generate comparison report automatically, and no matter data volume is much, and 20 minutes test periods can go out comparison report automatically; Software contrasts automatically, guarantees that each data can test; The equipment that does not need the outsourcing costliness is saved cost; Carry out Data Comparison, can judge whether consistent the storage data that write require with logic.
Need to prove, can in the computer system such as one group of computer executable instructions, carry out in the step shown in the process flow diagram of accompanying drawing, and, although there is shown logical order in flow process, but in some cases, can carry out step shown or that describe with the order that is different from herein.
In sum, according to the abovementioned embodiments of the present invention, a kind of storage data test method, Apparatus and system are provided.The present invention is by automatically reading the storage data of IIC chip, and compares with default data, generates comparison report, thereby realized the intellectuality of storage data test, and improved testing efficiency and accuracy rate.
Obviously, those skilled in the art should be understood that, above-mentioned each module of the present invention or each step can realize with general calculation element, they can concentrate on the single calculation element, perhaps be distributed on the network that a plurality of calculation elements form, alternatively, they can be realized with the executable program code of calculation element, thereby, they can be stored in the memory storage and be carried out by calculation element, perhaps they are made into respectively each integrated circuit modules, perhaps a plurality of modules in them or step are made into the single integrated circuit module and realize.Like this, the present invention is not restricted to any specific hardware and software combination.
The above is the preferred embodiments of the present invention only, is not limited to the present invention, and for a person skilled in the art, the present invention can have various modifications and variations.Within the spirit and principles in the present invention all, any modification of doing, be equal to replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (14)
1. store the data test method for one kind, it is characterized in that comprising:
Read the storage data of IIC chip by the ARM frock;
Described storage data and the default data that sets in advance are compared;
Generate comparison report according to comparing result.
2. method according to claim 1 is characterized in that, after generating comparison report according to comparing result, described method also comprises:
When described comparison report shows that there is mistake in described storage data, by described ARM frock described default data is write in the described IIC chip again.
3. method according to claim 1 and 2 is characterized in that, described default data comprise following one of at least: ring compensation, protection value, defrost time in compressor operating frequency, inside and outside rotation speed of fan, the refrigerating/heating.
4. method according to claim 1 and 2 is characterized in that, described comparison report comprise following one of at least: data name, data address, the default data that sets in advance, the storage data, abnormal data, the test result that read.
5. method according to claim 1 and 2 is characterized in that, described comparison report is the EXCEL form, comprising abnormal data is pointed out.
6. store data test device for one kind, it is characterized in that comprising:
Read module is for the storage data that read the IIC chip by the ARM frock;
The contrast module is used for described storage data and the default data that sets in advance are compared;
Generation module is used for generating comparison report according to comparing result.
7. device according to claim 6 is characterized in that, described device also comprises:
Writing module is used for showing that in described comparison report described storage data exist in the wrong situation, write described default data in the described IIC chip again by described ARM frock.
8. according to claim 6 or 7 described devices, it is characterized in that, described default data comprise following one of at least: ring compensation, protection value, defrost time in compressor operating frequency, inside and outside rotation speed of fan, the refrigerating/heating.
9. according to claim 6 or 7 described devices, it is characterized in that, described comparison report comprise following one of at least: data name, data address, the default data that sets in advance, the storage data, abnormal data, the test result that read.
10. according to claim 6 or 7 described devices, it is characterized in that described comparison report is the EXCEL form, comprising abnormal data is pointed out.
11. storage data testing system, it is characterized in that, comprise ARM frock, IIC chip and operating platform, wherein, described operating platform, be used for reading by described ARM frock the storage data of described IIC chip, described storage data and the default data that sets in advance compared, and generate comparison report according to comparing result.
12. system according to claim 11 is characterized in that, described operating platform also is used for showing that in described comparison report described storage data exist in the wrong situation, write described default data in the described IIC chip again by described ARM frock.
13. according to claim 11 or 12 described systems, it is characterized in that described operating platform is connected by the RS232 converter with described ARM frock, described ARM frock is connected by order wire with described IIC chip.
14. according to claim 11 or 12 described systems, it is characterized in that described operating platform is the computer software operating platform.
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