CN104101789B - The measuring equipment and method of ATE - Google Patents
The measuring equipment and method of ATE Download PDFInfo
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- CN104101789B CN104101789B CN201310122280.9A CN201310122280A CN104101789B CN 104101789 B CN104101789 B CN 104101789B CN 201310122280 A CN201310122280 A CN 201310122280A CN 104101789 B CN104101789 B CN 104101789B
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Abstract
Measuring equipment and method of the present invention with regard to a kind of ATE, wherein measuring equipment are included：Multiple pin parameter measurement units, each pin parameter measurement unit to measure a pin to be measured, to produce a measurement signal；One analog-digital converter, is converted to a readings signal will measure signal；And a control unit, analog-digital converter is electrically connected at, to select one of the plurality of pin parameter measurement unit, and analog-digital converter is controlled and is changed to receive readings signal.Thus, the present invention can the multiple pins to be measured of rapid measuring, and and then reach shorten the testing time purpose.
Description
Technical field
The invention relates to a kind of measuring equipment and method, the measuring equipment of its espespecially a kind of ATE and side
Method.
Background technology
In the manufacture process of all electronic devices (Device), the needs eliminated the false and retained the true all are there are, it is this to need reality
It is exactly a test process on border.Realize that this process needs various test equipments, this kind equipment is exactly so-called automatic test
Equipment (Automatic Test Equipment, ATE).And in field of automatic testing, how to shorten the testing time is always
Very important problem, testing time shortening are that the cost of representative products is reduced.
Fig. 1 is referred to, which is the circuit diagram of the ATE of known technology.As illustrated, known automatic test sets
Standby to include multiple TCH test channel CH1, CH2 ... CHn-1, CHn, the plurality of TCH test channel CH1, CH2 ... CHn-1, CHn are connected to
One parameter measurement unit (Parametric Measurement Unit, PMU), and each TCH test channel includes a pin parameter
Measurement unit (Per Pin Parametric Measurement Unit, PPMU).Parameter measurement unit PMU is to provide essence
Accurate four-quadrant measures (VFIM, IFVM, VMM), but has the disadvantage that quantity is few, and usual 64 TCH test channels can only be assigned to a ginseng
Number measurement unit PMU, make multiple to be measured pin PIN1, PIN2 ... PINn-1s of the parameter measurement unit PMU in turn to determinand,
PINn is measured, therefore can be taken excessive time.And the plurality of pin parameter measurement unit PPMU can be measured respectively simultaneously
The plurality of pin PIN1, PIN2 ... PINn-1, PINn to be measured, but can only by it is measured to measurement signal MS export to one and compare
Device, and compare measurement signal MS and do and pass through/do not measured by (GO/NO-GO), that is to say, that the plurality of pin parameter is measured singly
Whether the determinand that first PPMU is only capable of testing in each TCH test channel can use, and cannot read actual test value,
So also less precisely, therefore parameter measurement unit PMU and pin parameter measurement unit PPMU respectively has pluses and minuses.
From the foregoing, parameter measurement unit PMU can provide accurately four-quadrant measure, but parameter measurement unit PMU numbers
Amount is few, measures overlong time, and the plurality of pin parameter measurement unit PPMU can measure each TCH test channel simultaneously, measure speed
Hurry up, but the rough measurement for passing through/not passing through can only be provided.Therefore, with known automatic test equipment and be unable to reach both precisely and
Fireballing measurement mode.
Furthermore, when usual ATE measures TCH test channel, it is to assign measurement instruction through a bus by a main frame
To ATE, when needing to measure multiple TCH test channels or need the different components of measurement determinand simultaneously, main frame exists
The instruction of Close All must be all assigned before testing each TCH test channel, the instruction of unlatching is then assigned again to open requirement survey
TCH test channel, therefore the more TCH test channels of measurement or component must then assign more measurement instructions, so, above-mentioned software control
Mode when many TCH test channels or component is measured has and measures the excessively slow problem of speed, and aforesaid way can take bus mistake
Many resources.
Further, since parameter measurement unit PMU's is relatively costly, if therefore increase the quantity of parameter measurement unit PMU, i.e.,
The cost of overall auto-measuring equipment can be increased.
Therefore, the present invention provides one kind for the problems referred to above and sequentially selects multiple pin parameters measurements using control unit
Unit, makes the plurality of pin parameter measurement unit sequentially measure multiple pins to be measured, thus, the present invention is using the hard of control unit
Part circuit is measured and reaches the measuring equipment and method of the ATE of the plurality of pin to be measured of rapid measuring.
The content of the invention
One purpose of the present invention, is the measuring equipment and method for providing a kind of ATE, and which is by a control
The hardware circuit of unit and sequentially select multiple pin parameter measurement units, the plurality of pin parameter measurement unit is sequentially measured
Multiple pins to be measured, with the plurality of pin to be measured of rapid measuring, and then reach the purpose for shortening the testing time.
In order to reach above-mentioned censured each purpose and effect, present invention is disclosed a kind of measurement dress of ATE
Put, which includes multiple pin parameter measurement units, an analog-digital converter and a control unit.The plurality of pin parameter is measured
Each pin parameter measurement unit in unit to measure a pin to be measured, to produce a measurement signal, Analog-digital Converter
Device is converted to a readings signal will measure signal, and control unit is electrically connected at analog-digital converter, to select this
One of multiple pin parameter measurement units, and control analog-digital converter and changed to receive readings signal.Thus, this
It is bright sequentially to select the plurality of pin parameter measurement unit by control unit, the plurality of pin parameter measurement unit is sequentially measured
Multiple pins to be measured, with the plurality of pin to be measured of rapid measuring, and then reach the purpose for shortening the testing time.
The present invention more discloses a kind of method for measurement of ATE, is applied to a measuring equipment and is electrically connected with automatically
The step of multiple pin parameter measurement units of test equipment, method for measurement, includes：Signal is selected to select the plurality of connecing according to one
One of pin parameter measurement unit；Order about selected pin parameter measurement unit and measure a corresponding pin to be measured, to produce one
Measure signal；And the measurement signal that selected pin parameter measurement unit is exported is converted to into a readings signal.
Enforcement the beneficial effect comprise that：The present invention connects by the output end in multiple pin parameter measurement units
An analog-digital converter is connect, the measurement signal that the plurality of pin parameter measurement unit is exported is converted to into readings signal, and
The plurality of pin parameter measurement unit of requirement survey one of is selected by a control unit sequentially, to reach quick and accurately measure
Survey the purpose of multiple pins to be measured.
Description of the drawings
Fig. 1：Which is the circuit diagram of the ATE of known technology；
Fig. 2：Which is the circuit diagram of the measuring equipment of the ATE of the first embodiment of the present invention；
Fig. 3：Which is the schematic diagram of the measuring equipment of the ATE of the first embodiment of the present invention；
Fig. 4：Which is the block diagram of the control unit of the present invention；
Fig. 5：Which is the circuit diagram of the correcting circuit of the present invention；
Fig. 6：Which is the block diagram of the correction memory circuit of the present invention；
Fig. 7：Which is the schematic diagram of the measuring equipment of the ATE of the second embodiment of the present invention；
Fig. 8：Which is the flow chart of the method for measurement of the ATE of the present invention；And
Fig. 9：Which is the state diagram of the method for measurement of the ATE of the present invention.
【Figure number is to as directed】
10 analog-digital converter, 20 control unit
21 lookup unit 23 selects control unit
25 correction memory circuit, 251 first flip-flop
252 selector, 253 second flip-flop
254 gain mnemon 255 compensates mnemon
The 4th flip-flop of 256 the 3rd flip-flop 257
27 correcting circuit, 271 multiplier
273 adder, 29 storage element
40 main frame, 60 select unit
CH1 TCH test channel CH2 TCH test channels
CHn-1 TCH test channel CHn TCH test channels
Gain gain parameters MS measure signal
Offset compensating parameters PIN1 pin to be measured
PIN2 pin PINn-1 to be measured pins to be measured
PINn pin PMU parameter measurement units to be measured
PPMU pin parameter measurement units R_add reads address
S_add storage address RWD read-write signals
SP selection parameters SS select signal
The actual readings signals of VAL readings signal VAL '
Specific embodiment
In order that the architectural feature of the present invention and the effect reached have a better understanding and awareness, it is special with preferably
Embodiment and cooperation detailed description, are described as follows：
First, Fig. 2 is referred to, which is the circuit of the measuring equipment of the ATE of the first embodiment of the present invention
Figure.As illustrated, the measuring equipment of the present invention comprising multiple pin parameter measurement unit PPMU, an analog-digital converter 10 with
And a control unit 20.The plurality of pin parameter measurement unit PPMU is respectively arranged at multiple TCH test channel CH1, CH2 ... CHn-
1st, CHn, and connect pin PIN1, PIN2 ... PINn-1, PINn to be measured of determinand respectively, and measure the plurality of pin to be measured
PIN1, PIN2 ... PINn-1, PINn are to produce a measurement signal MS respectively, wherein the plurality of pin PIN1, PIN2 ... to be measured
PINn-1, PINn can be the pin of the pin or respectively multiple determinands of same determinand.Analog-digital converter 10 connects
In the output end of the plurality of pin parameter measurement unit PPMU, and a readings signal VAL is converted to signal MS will be measured.Control
Unit processed 20 is electrically connected at analog-digital converter 10, and transmits a selection signal SS to the plurality of pin parameter measurement unit
PPMU, to select one of the plurality of pin parameter measurement unit PPMU, with selected pin parameter measurement unit PPMU to which
Corresponding pin to be measured (one of PIN1, PIN2 ... PINn-1, PINn) is measured, and analog-digital converter 10 is to pin
The measurement signal MS of parameter measurement unit PPMU outputs is converted to readings signal VAL.
Based on above-mentioned, as the present invention sequentially selects the plurality of pin parameter to measure using the hardware circuit of control unit 20
Unit PPMU, makes the plurality of pin parameter measurement unit PPMU sequentially measure the plurality of TCH test channel CH1, CH2 ... CHn-1, CHn
Pin to be measured, with the determinand of rapid measuring the plurality of TCH test channel CH1, CH2 ... CHn-1, CHn, so reach shortening survey
The purpose of examination time.
Typically there is bus B US as communication transfer between the two between measuring equipment Tester and main frame 40, however, always
The communication time of line BUS can change with the load of the central processor CPU of main frame 40, so, if being measured using software
Then it is possible to further affect measurement.Furthermore, due to cannot determine end to be measured computer hardware why, the best way is
Whole measuring program is controlled by the hardware circuit of control unit 20 itself completely, and may insure that measurement is not total by main frame 40
The speed of line BUS communication times affects.
In addition, the present invention is not account for main frame using another benefit of the hardware circuit control measuring program of control unit 20
40 resource, during analog-digital converter 10 is measured, software still can pass through main frame 40 with bus B US simultaneously to other groups
Part is set, for example, access memory or carry out detecting etc. behavior to temperature or voltage, so can shorten test and setting when
Between.
Additionally, control unit 20 more can produce an actual readings signal VAL ' after being corrected to readings signal VAL, for
One main frame 40 reads.
Fig. 3 is seen also, which is the schematic diagram of the measuring equipment of the ATE of the first embodiment of the present invention.
As illustrated, the analog-digital converter 10 of the present invention can connect any number of pin parameter measurement unit PPMU simultaneously.Control
Unit processed 20 is connected to the plurality of pin parameter measurement unit PPMU, and exports selection signal SS to selected pin parameter amount
Unit PPMU is surveyed, to make selected pin parameter measurement unit PPMU measure corresponding pin (PIN1, PIN2 ... to be measured
One of PINn-1, PINn) and produce and measure signal MS, and measurement signal MS is transmitted to analog-digital converter 10 to carry out turning
Change.
By taking 64 TCH test channels as an example, an analog-digital converter is responsible for the measurement of 16 TCH test channels, first mould
Intend digital quantizer and be responsible for TCH test channel CH1-CH16, second analog-digital converter is responsible for TCH test channel CH17-CH32, the
Three analog-digital converters are responsible for TCH test channel CH33-CH48, and the 4th analog-digital converter is responsible for TCH test channel CH49-
CH64, and the corresponding control unit of first analog-digital converter is set as measuring TCH test channel CH1,3,5, second simulation
The corresponding control unit of digital quantizer is set as measuring TCH test channel CH19,25,27, the 3rd analog-digital converter correspondence
Control unit be set as measuring TCH test channel CH35,40,44, the corresponding control unit setting of the 4th analog-digital converter
To measure when TCH test channel CH49,52,64, the time is measured in first, first analog-digital converter measures TCH test channel
CH1, second analog-digital converter measure TCH test channel CH19, and the 3rd analog-digital converter measures TCH test channel
CH35, the 4th analog-digital converter measure TCH test channel CH49, and second and third measures the time then by that analogy.
From the foregoing, above-mentioned framework can measure 4 TCH test channels simultaneously, to increase the speed of ATE measurement
Degree.However, the present invention is not limited to above-mentioned TCH test channel quantity or analog-digital converter quantity.For example, multiple tests
Passage can be responsible for being measured by 1 to n analog-digital converter, and n is the sum of the plurality of TCH test channel.
Fig. 4 is seen also, which is the block diagram of the control unit of the present invention.As illustrated, control unit 20 includes one
Lookup unit 21, one selects control unit 23, a correction memory circuit 25 and a correcting circuit 27.Lookup unit 21 stores many
Individual selection parameter SP, the plurality of selection parameter SP correspond to the plurality of pin parameter measurement unit PPMU.Select control unit 23
Lookup unit 21 is electrically connected at, and one is produced according to the plurality of selection parameter SP and select signal SS, select signal SS to select
One of the plurality of pin parameter measurement unit PPMU is selected, and makes selected pin parameter measurement unit PPMU measure corresponding treating
Pin (one of PIN1, PIN2 ... PINn-1, PINn) is surveyed, and this selects signal SS to can be considered an enable signal, to enable institute
The pin parameter measurement unit PPMU of selection.
Correction memory circuit 25 is electrically connected at lookup unit 21, and to store multiple gain parameters Gain with multiple benefits
Repay parameter Offset, the plurality of gain parameter Gain the plurality of selection parameter SP corresponding with the plurality of compensating parameter Offset,
That is, each TCH test channel includes multiple measuring ranges, and each measuring range all has gain parameter Gain
With compensating parameter Offset, the quantity of wherein measuring range is decided by the specification of pin parameter measurement unit PPMU.
Lookup unit 21 is read and write signal RWD according to main frame 40 is exported one and produces a reading address R_add, reads address R_
The selected pin parameter measurement unit PPMU of add corresponding selection signal SS, and correction memory circuit 25 is according to reading address R_
Gain parameter Gain and compensating parameter Offset of the selected pin parameter measurement unit PPMU of add output correspondences.Correction electricity
Road 27 is electrically connected at correction memory circuit 25 and analog-digital converter 10, and correcting circuit 27 uses correction memory circuit 25
Gain parameter Gain of output corrects readings signal VAL, and the actual readings signal after output calibration with compensating parameter Offset
VAL ' is to main frame 40.
For example, when the plurality of pin parameter that lookup unit 21 stores correspondence TCH test channel CH1, CH10 and CH16 measures list
During selection parameter SP of first PPMU, select control unit 23 that correspondence TCH test channel is sequentially transmitted according to the plurality of selection parameter SP
The selection signal SS of the plurality of pin parameter measurement unit PPMU of CH1, CH10 and CH16, measures the plurality of pin parameter single
First PPMU sequentially measures pin PIN1, PIN10 and PIN16 to be measured respectively, when the pin parameter measurement unit of TCH test channel CH1
When PPMU measures pin PIN1 to be measured and produces readings signal VAL, correction memory circuit 25 is according to reading address R_add now
Gain parameter Gain of output correspondence TCH test channel CH1 makes correcting circuit 27 with compensating parameter Offset to correcting circuit 27
With readings signal VAL of this gain parameter Gain with the correction of compensating parameter Offset now, TCH test channel is then sequentially performed
The measurement of CH10 and CH16, and measurement mode is then arranged with this and is pushed away, and is repeated no more.
Additionally, in this embodiment, control unit 20 further includes a storage element 29, for receiving and storing after correction
Actual readings signal VAL ', so that main frame 40 reads.
If in addition, need storage gain parameter Gain with compensating parameter Offset in correction memory circuit 25 before measurement
When, correction memory circuit 25 is judged as storing state, therefore correction memory circuit 25 according to a storage place according to read-write signal RWD
Gain parameter Gain that now main frame 40 is transmitted is stored to corresponding address by location S_add with compensating parameter Offset.Its
In, storage address S_add is produced by main frame 40.For example, when main frame 40 transmits the read-write signal RWD of storing state to list of tabling look-up
Unit 21 and correction memory circuit 25, and main frame 40 also sequentially transmits the storage address S_ of correspondence TCH test channel CH1, CH10 and CH16
When add is to correction memory circuit 25, correction memory circuit 25 switchs to store shape according to the read-write signal RWD of correspondence storing state
State, and when the storage address S_add of correspondence TCH test channel CH1 is sent to correction memory circuit 25, correction memory circuit 25 will
Gain parameter Gain that the now transmission of main frame 40 comes is stored with compensating parameter Offset to the storage address of corresponding TCH test channel CH1
S_add, then sequentially performs the storage work of TCH test channel CH10 and CH16, and remaining is then arranged with this and is pushed away, and is repeated no more.
Fig. 5 is seen also, which is the circuit diagram of the correcting circuit of the present invention.As illustrated, correcting circuit 27 includes one
Multiplier 271 and an adder 273.Multiplier 271 is electrically connected at analog-digital converter 10 and correction memory circuit 25, connects
Gain parameter Gain and readings signal VAL are received, and gain parameter Gain is carried out exporting after multiplying with readings signal VAL.
Adder 273 is electrically connected at the output end of multiplier 271, receives compensating parameter Offset and the readings signal after multiplying
VAL, and actual readings signal VAL ' is produced after carrying out add operation.
Fig. 6 is seen also, which is the block diagram of the correction memory circuit of the present invention.As illustrated, correction memory circuit
25 include one first flip-flop 251, a selector 252, one second flip-flop 253, the compensation note of a gain mnemon 254, one
Recall unit 255, one the 3rd flip-flop 256 and one the 4th flip-flop 257.First flip-flop 251 is electrically connected at lookup unit
21, and reading address R_add and output are obtained according to read-write signal RWD.Selector 252 can be a multiplexer, and which electrically connects
The first flip-flop 251 is connected to, and to learn be now write mode or read mode according to read-write signal RWD, and select one to store
Address S_add reads one of address R_add outputs.Second flip-flop 253 is electrically connected at selector 252, obtains selector
The storage address S_add of 252 outputs reads address R_add and exports.
Gain mnemon 254 is electrically connected at the second flip-flop 253, to store or read the plurality of gain parameter
Gain, that is to say, that gain mnemon 254 is according to received storage address S_add, the gain ginseng that main frame 40 is exported
Number Gain stores into gain mnemon 254 address of correspondence storage address S_add, or according to received reading address
R_add, output are stored in gain parameter Gain of the address of correspondence reading address R_add in gain mnemon 254.Compensation note
Recall unit 255 and be electrically connected at the second flip-flop 253, to store or read the plurality of compensating parameter Offset, that is to say, that
Compensation mnemon 255 according to received storage address S_add, by compensating parameter Offset that main frame 40 is exported store to
The address of correspondence storage address S_add in compensation mnemon 255, or according to received reading address R_add, output storage
It is stored in compensating parameter Offset of the address of correspondence reading address R_add in compensation mnemon 255.
3rd flip-flop 256 is electrically connected at gain mnemon 254, and will be received according to read-write signal RWD
Gain parameter Gain is exported to multiplier 271.4th flip-flop 257 is electrically connected at compensation mnemon 255, and according to read-write
Signal RWD exports received compensating parameter Offset to adder 273.Wherein, reading and writing signal RWD can be by list of tabling look-up
Produced by unit 21 or main frame 40.
Fig. 7 is referred to, which is the schematic diagram of the measuring equipment of the ATE of the second embodiment of the present invention.This reality
The difference that example is applied with first embodiment is that the plurality of pin parameter measurement unit PPMU of the present embodiment passes through a select unit
60 are connected to analog-digital converter 10, and remaining repeats no more, and its detailed description is as described below.
As illustrated, the plurality of pin parameter measurement unit PPMU is electrically connected with the multiple inputs in select unit 60
End, an output end of select unit 60 are electrically connected with analog-digital converter 10, and a control end of select unit 60 is then electrical
Connection control unit 20, and to select the plurality of pin parameter measurement unit according to the selection signal SS of the output of control unit 20
One of PPMU, measures signal MS to analog-digital converter 10 to export, that is to say, that control unit 20 sends selection signal SS
To select unit 60, the plurality of pin parameter measurement unit PPMU is sequentially selected to measure with control selections unit 60 corresponding to be measured
Pin (one of PIN1, PIN2 ... PINn-1, PINn), i.e., sequentially select pin PIN1 to be measured, pin PIN2 ... to be measured is to be measured connects
Pin PINn-1 and pin PINn to be measured, is changed to analog-digital converter 10 with sequentially transmitting measurement signal MS.Wherein,
The select unit 60 of the present embodiment can be a multiplexer.
Fig. 8 is seen also, which is the flow chart of the method for measurement of the ATE of the present invention.The present invention's is automatic
The method for measurement of test equipment is applied to a measurement circuit, and measurement circuit is connected to the plurality of pin parameter measurement unit PPMU,
Measurement circuit includes analog-digital converter 10 and control unit 20.The method for measurement of the present invention is first carried out step S10, stores
, with multiple compensating parameters Offset in correction memory circuit 25, the plurality of gain parameter Gain is more with this for multiple gain parameters Gain
Individual compensating parameter Offset.Then, execution step S20, stores multiple selection parameters SP in lookup unit 21, the plurality of to select ginseng
The plurality of pin parameter measurement unit PPMU of number SP correspondences, selects control unit 23 sequentially to produce according to the plurality of selection parameter SP
Multiple selection signal SS.
Then execution step S30, sequentially selects the plurality of pin parameter measurement unit according to the plurality of selection signal SS
PPMU.Then execution step S40, orders about selected pin parameter measurement unit PPMU and measures a corresponding pin to be measured
(one of PIN1 ... PINn), to produce corresponding measurement signal MS.Then execution step S50, analog-digital converter 10 is by institute
The measurement signal MS of the pin parameter measurement unit PPMU outputs of selection is converted to readings signal VAL.
Then execution step S60, according to read-write signal RWD, the generation reading address R_add of lookup unit 21, reads address
The selected pin parameter measurement unit PPMU of R_add correspondences, correction memory circuit 25 are corresponding according to address R_add outputs are read
Gain parameter Gain of selected pin parameter measurement unit PPMU and compensating parameter Offset.Then execution step S70, school
Positive circuit 27 corrects readings signal that Jing step S50 produce with compensating parameter Offset using selected gain parameter Gain
VAL, is read for main frame 40 with producing actual readings signal VAL '.
Wherein, in step S70, readings signal VAL is first taken advantage of by correcting circuit 27 with selected gain parameter Gain
After method computing, then add operation is carried out with selected compensating parameter Offset, to produce actual readings signal VAL '.Additionally,
More obtain according to the read-write signal RWD of the output of main frame 40 in step S70 and reading address R_add is exported to selector 252, and according to
Selector 252 is ordered about according to read-write signal RWD to select storage address S_add or read address R_add to export, storage place is then obtained
Location S_add reads address R_add and exports to correction memory circuit 25, makes correction memory circuit 25 according to storage address S_
Add writes gain parameter Gain, compensating parameter Offset, or foundation reading address R_add orders about correction memory circuit 25 and exports
Selected gain parameter Gain, compensating parameter Offset.
Fig. 9 is seen also, which is the state diagram of the method for measurement of the ATE of the present invention.This state diagram is represented
The state of control unit 20, as illustrated, control unit 20 is in idle state ST10 before measuring, when control unit 20 is received
During to the next triggering signal of the transmission of main frame 40, then inspection state ST20 is converted to.When inspection state ST20, control unit 20
The plurality of TCH test channel CH1-CHn is checked according to lookup unit 21, and determines it is now which TCH test channel CH1-CHn will quilt
Measure, after having checked, be converted to setting state ST30.
When state ST30 of setting, the transmission of control unit 20 selects signal SS to TCH test channel now to be measured
Pin parameter measurement unit PPMU corresponding to (one of CH1-CHn), or the TCH test channel that transmission correspondence is now to be measured
The selection signal SS of (one of CH1-CHn) makes analog-digital converter 10 connect correct pin parameter amount to select unit 60
Unit PPMU is surveyed, stable state ST40 after the completion of setting, is then converted to.Stable state ST40 is used to postpone a period of time, with stable
In the setting carried out by setting state ST30.
Then, reading state ST50 is converted to, control unit 20 transmits a reading signal to simulation numeral when this state
Converter 10, makes analog-digital converter 10 start to read the value for measuring signal MS, and is converted to readings signal VAL, read
Correcting state ST60 is converted to into after.When correcting state ST60, control unit 20 is by gain parameter Gain, compensating parameter
Offset is exported after being corrected to readings signal VAL, and correction is then converted to judgement state ST70 after terminating.In judging state
During ST70, control unit 20 determines whether the measurement for completing all TCH test channel CH1-CHn, if completing, converts back
Idle state ST10, if not completing, is converted to inspection state ST20, and control unit 20 continues checking for the plurality of TCH test channel
CH1-CHn, to determine the TCH test channel (one of CH1-CHn) of now requirement survey.
In sum, the measuring equipment and method of ATE of the invention, by the measurement of multiple pin parameters
The output end of unit connects an analog-digital converter, the measurement signal conversion that the plurality of pin parameter measurement unit is exported
For readings signal, and one of the plurality of pin parameter measurement unit that requirement surveys sequentially is selected by a control unit, to reach
Purpose that is quick and accurately measuring multiple pins to be measured.
Above is only presently preferred embodiments of the present invention, not for limit the present invention enforcement scope, Fan Yibenfa
The impartial change carried out by shape, construction, feature and spirit described in bright right and modification, all should be included in the present invention
Right in.
Claims (8)
1. a kind of measuring equipment of ATE, it is characterised in which includes：
Multiple pin parameter measurement units, each pin parameter measurement unit to measure a pin to be measured, to produce a measurement
Signal；
One analog-digital converter, the measurement signal is converted to a readings signal；And
One control unit, is electrically connected at the analog-digital converter, to select one of the plurality of pin parameter measurement unit,
And control the analog-digital converter and changed to receive the readings signal；
Wherein the control unit is included：
One lookup unit, to store multiple selection parameters, the corresponding the plurality of pin parameter measurement unit of the plurality of selection parameter；
One selects control unit, is electrically connected at the lookup unit, selects signal to produce one according to the plurality of selection parameter
To select one of the plurality of pin parameter measurement unit；
One correction memory circuit, is electrically connected at the lookup unit, to store multiple gain parameters and multiple compensating parameters, should
Multiple gain parameters the plurality of selection parameter corresponding with the plurality of compensating parameter, the lookup unit are read and write signal according to one and produce one
Address is read, the selected pin parameter measurement unit of reading address correspondence, the correction memory circuit is according to the reading ground
Location exports the gain parameter and the compensating parameter；And
One correcting circuit, is electrically connected at the correction memory circuit and the analog-digital converter, and using the correction memory electricity
The gain parameter of road output corrects the readings signal with the compensating parameter.
2. the measuring equipment as described in claim 1, it is characterised in that further include：
One multiplexer, with a control end, an output end and multiple inputs, the control end is electrically connected with the control unit,
The output end is electrically connected with the analog-digital converter, and the plurality of input is then electrically connected with the plurality of pin parameter amount
Unit is surveyed, and is controlled by the control unit and is selected one of the plurality of pin parameter measurement unit, to export the measurement signal extremely
The analog-digital converter.
3. the measuring equipment as described in claim 1, it is characterised in that wherein the correcting circuit is included：
One multiplier, is electrically connected at the analog-digital converter and the correction memory circuit, to by the gain parameter with should
Readings signal carries out multiplying；And
One adder, is electrically connected at the multiplier, the output of the multiplier and the compensating parameter are carried out add operation.
4. the measuring equipment as described in claim 3, it is characterised in that wherein the correction memory circuit is further included：
One first flip-flop, is electrically connected at the lookup unit, to obtain according to the read-write signal and export the reading address；
One selector, is electrically connected at first flip-flop, to select one to store address or the reading according to the read-write signal
Address exports；
One second flip-flop, is electrically connected at the selector, to the storage address or the reading for obtaining the selector output
Address, and the storage address or the reading address are exported to a gain mnemon and a compensation mnemon, to write or read
Take the gain parameter or the compensating parameter；
One the 3rd flip-flop, is electrically connected at the gain mnemon, to export the corresponding gain according to the read-write signal
Parameter is to the multiplier；And
One the 4th flip-flop, is electrically connected at the compensation mnemon, to export the corresponding compensation according to the read-write signal
Parameter is to the adder.
5. the measuring equipment as described in claim 3, it is characterised in that wherein the control unit is further included：
One storage element, to store the readings signal after the multiplier is corrected with the adder, so that a main frame reads.
6. a kind of method for measurement of ATE, it is characterised in that the method for measurement is applied to a measurement circuit, the measurement
The step of circuit is electrically connected with multiple pin parameter measurement units of the ATE, the method for measurement includes：
Multiple selection parameters are stored in a lookup unit, the corresponding the plurality of pin parameter measurement unit of the plurality of selection parameter, with
One is produced according to the plurality of selection parameter and selects signal；
Multiple gain parameters are stored with multiple compensating parameters in a correction memory circuit, the plurality of gain parameter and the plurality of compensation
The plurality of selection parameter of parameter correspondence；
One of the plurality of pin parameter measurement unit is selected according to the selection signal；
Order about the selected pin parameter measurement unit and measure a corresponding pin to be measured, to produce a measurement signal；
The measurement signal of the selected pin parameter measurement unit output is converted to into a readings signal；
Signal is read and write according to one, the lookup unit produces one and reads address, the selected pin parameter of reading address correspondence
Measurement unit, the correction memory circuit export the gain parameter and the compensating parameter according to the reading address；And
The readings signal is corrected using the selected gain parameter and the compensating parameter.
7. the method for measurement as described in claim 6, it is characterised in that wherein in using the selected gain parameter with should
In the step of compensating parameter corrects the readings signal, comprising：
The gain parameter and the readings signal are carried out into multiplying；And
The compensating parameter is carried out into add operation with the readings signal after multiplying is carried out.
8. the method for measurement as described in claim 6, it is characterised in that wherein in using the selected gain parameter with should
In the step of compensating parameter corrects the readings signal, comprising：
The reading address is obtained and is exported according to the read-write signal to a selector；
The selector is ordered about according to the read-write signal selects one to store address or reading address output；And
The storage address or the reading address of the selector output are obtained, and is exported the storage address or the reading address and extremely should
Correction memory circuit, to according to the storage address write the gain parameter and the compensating parameter in the correction memory circuit or according to
The selected gain parameter of the correction memory circuit output and the compensating parameter are ordered about according to address is read.
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| US10451653B2 (en) * | 2014-12-19 | 2019-10-22 | Teradyne, Inc. | Controlling a per-pin measurement unit |
| CN109212307B (en) * | 2017-06-30 | 2020-12-18 | 致茂电子(苏州)有限公司 | Signal measurement device and signal measurement method |
| CN116299125B (en) * | 2023-03-31 | 2024-04-05 | 深圳市辰卓科技有限公司 | Parameter calibration method, device and system of ATE equipment |
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