CN103917896B - 用于构建大探测器的无缝铺排 - Google Patents

用于构建大探测器的无缝铺排 Download PDF

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Publication number
CN103917896B
CN103917896B CN201280054828.4A CN201280054828A CN103917896B CN 103917896 B CN103917896 B CN 103917896B CN 201280054828 A CN201280054828 A CN 201280054828A CN 103917896 B CN103917896 B CN 103917896B
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CN
China
Prior art keywords
detector
pack
connection opening
pixel
ray
Prior art date
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Expired - Fee Related
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CN201280054828.4A
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English (en)
Chinese (zh)
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CN103917896A (zh
Inventor
T·普尔特
R·德克尔
V·A·亨内肯
N·J·A·范费恩
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Koninklijke Philips NV
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Koninklijke Philips Electronics NV
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Publication of CN103917896A publication Critical patent/CN103917896A/zh
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Expired - Fee Related legal-status Critical Current
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20182—Modular detectors, e.g. tiled scintillators or tiled photodiodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/243—Modular detectors, e.g. arrays formed from self contained units
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/011—Manufacture or treatment of image sensors covered by group H10F39/12
    • H10F39/026—Wafer-level processing

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
CN201280054828.4A 2011-11-08 2012-11-06 用于构建大探测器的无缝铺排 Expired - Fee Related CN103917896B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161556870P 2011-11-08 2011-11-08
US61/556,870 2011-11-08
PCT/IB2012/056176 WO2013068912A1 (en) 2011-11-08 2012-11-06 Seamless tiling to build a large detector

Publications (2)

Publication Number Publication Date
CN103917896A CN103917896A (zh) 2014-07-09
CN103917896B true CN103917896B (zh) 2017-08-15

Family

ID=47226243

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201280054828.4A Expired - Fee Related CN103917896B (zh) 2011-11-08 2012-11-06 用于构建大探测器的无缝铺排

Country Status (6)

Country Link
US (1) US9513384B2 (https=)
EP (1) EP2745142B1 (https=)
JP (1) JP6100791B2 (https=)
CN (1) CN103917896B (https=)
IN (1) IN2014CN03499A (https=)
WO (1) WO2013068912A1 (https=)

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Publication number Priority date Publication date Assignee Title
JP6478538B2 (ja) * 2014-09-10 2019-03-06 キヤノン株式会社 放射線撮像装置および放射線撮像システム
CZ306067B6 (cs) 2015-05-12 2016-07-20 Advacam S.R.O. Modul detektoru ionizujícího záření
KR102624385B1 (ko) * 2015-09-24 2024-01-11 프리스매틱 센서즈 에이비 모듈식 x선 검출기(modular x-ray detector)
EP3346296B1 (en) * 2017-01-10 2021-10-27 Oxford Instruments Technologies Oy A semiconductor radiation detector
US20190353805A1 (en) * 2018-05-21 2019-11-21 General Electric Company Digital x-ray detector having polymeric substrate
DE102020213171B4 (de) 2020-10-19 2025-08-28 Siemens Healthineers Ag Röntgendetektormodul und Verfahren zur Bereitstellung eines Röntgendetektormoduls
US11647973B2 (en) * 2021-05-04 2023-05-16 Siemens Medical Solutions Usa, Inc. Three-dimensional tileable gamma ray detector
CN115144417A (zh) * 2022-06-08 2022-10-04 北京纳米维景科技有限公司 一种柔性ct探测器及其静态ct系统
EP4330730B1 (en) * 2022-07-15 2025-09-17 Shanghai United Imaging Healthcare Co., Ltd. Detector module

Citations (4)

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Publication number Priority date Publication date Assignee Title
US6057552A (en) * 1995-02-21 2000-05-02 Advanced Scientific Concepts, Inc. High speed crystallography detector
EP1237141A2 (en) * 2001-02-20 2002-09-04 Eastman Kodak Company Light-producing high aperture display having aligned tiles
CN1503004A (zh) * 2002-11-26 2004-06-09 小面积像素电极直接平板x－线探测器
CN102445703A (zh) * 2010-10-12 2012-05-09 上海生物医学工程研究中心 基于无缝拼接的光电传感探测器及制备方法

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US4891522A (en) * 1988-10-11 1990-01-02 Microtronics Associates, Inc. Modular multi-element high energy particle detector
US6204087B1 (en) * 1997-02-07 2001-03-20 University Of Hawai'i Fabrication of three-dimensional architecture for solid state radiation detectors
WO2003083944A1 (en) 2002-03-03 2003-10-09 Interon As Pixel sensor array and method of manufacture thereof
US7170049B2 (en) 2003-12-30 2007-01-30 Dxray, Inc. Pixelated cadmium zinc telluride based photon counting mode detector
US20050286682A1 (en) 2004-06-29 2005-12-29 General Electric Company Detector for radiation imaging systems
US20060192087A1 (en) * 2005-02-28 2006-08-31 Real Time Radiography Ltd. Two-dimensional CMOS-based flat panel imaging sensor
JP5070637B2 (ja) * 2005-12-07 2012-11-14 株式会社アクロラド 放射線画像検出モジュール
JP5172267B2 (ja) * 2007-10-09 2013-03-27 富士フイルム株式会社 撮像装置
JP4808760B2 (ja) * 2008-11-19 2011-11-02 浜松ホトニクス株式会社 放射線検出器の製造方法
RU2510520C2 (ru) 2008-11-21 2014-03-27 Трикселль Способ сборки ячеистого радиационного детектора
JP2011163868A (ja) * 2010-02-08 2011-08-25 Hitachi Cable Ltd 放射線検出モジュール

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6057552A (en) * 1995-02-21 2000-05-02 Advanced Scientific Concepts, Inc. High speed crystallography detector
EP1237141A2 (en) * 2001-02-20 2002-09-04 Eastman Kodak Company Light-producing high aperture display having aligned tiles
CN1503004A (zh) * 2002-11-26 2004-06-09 小面积像素电极直接平板x－线探测器
CN102445703A (zh) * 2010-10-12 2012-05-09 上海生物医学工程研究中心 基于无缝拼接的光电传感探测器及制备方法

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
用CCD阵列组成的高分辨X射线探测器;叶青 等;《核技术》;20000229;第23卷(第2期);第110-115页 *

Also Published As

Publication number Publication date
US9513384B2 (en) 2016-12-06
CN103917896A (zh) 2014-07-09
JP2015506117A (ja) 2015-02-26
JP6100791B2 (ja) 2017-03-22
EP2745142B1 (en) 2021-03-17
IN2014CN03499A (https=) 2015-10-09
WO2013068912A1 (en) 2013-05-16
EP2745142A1 (en) 2014-06-25
US20140307850A1 (en) 2014-10-16

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