CN103852602A - Radio frequency asymmetrical low-impedance test fixture - Google Patents
Radio frequency asymmetrical low-impedance test fixture Download PDFInfo
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- CN103852602A CN103852602A CN201410102906.4A CN201410102906A CN103852602A CN 103852602 A CN103852602 A CN 103852602A CN 201410102906 A CN201410102906 A CN 201410102906A CN 103852602 A CN103852602 A CN 103852602A
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- radio frequency
- test fixture
- pcb board
- impedance
- transformation unit
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/045—Sockets or component fixtures for RF or HF testing
Abstract
The invention relates to the technical field of radio frequency microwave measurement, in particular to a radio frequency asymmetrical low-impedance test fixture. The test fixture comprises a PCB and a base board. A first impedance conversion unit is arranged on the left side of the PCB, a second impedance conversion unit is arranged on the right side of the PCB, and the first impedance conversion unit and the second impedance conversion unit are respectively composed of a set of tapered microstrip lines. All the microstrip lines in each set are the same in width, and the length of the microstrip lines in each set changes from small to large and then large to small in the ranking direction. The PCB is connected to the upper end of the base board. By the adoption of the radio frequency asymmetrical low-impedance test fixture, impedance real parts of transistors to be tested can be effectively increased, the oscillation source problem is solved, devices to be tested are prevented from being burnt down, and it can be guaranteed that radio frequency performance and microwave performance of the devices to be tested are brought into full play.
Description
Technical field
The present invention relates to frequency microwave field of measuring technique, particularly the asymmetric Low ESR test fixture of a kind of radio frequency.
Background technology
At present, conventionally use 50 Ω test fixtures to test large grid width, high-power PA (Power Amplifier, power amplifier), 50 Ω test fixtures are symmetric form test fixture, symmetric form test fixture refers to that input/output terminal is transformed into equal resistance value, because the input of tested equipment, output impedance is unequal, so test that the input impedance after existing 50 Ω test fixture conversion can not be mated tested equipment completely with output impedance, input impedance mismatch causes testing the high-power low-frequency oscillation that easily causes, burn device, output impedance mismatch causes measuring inaccurate.
Summary of the invention
Technical matters to be solved by this invention is to provide and a kind ofly can matches with the input, output-resistor of tested device, prevents from burning tested device, ensures the asymmetric Low ESR test fixture of radio frequency of tested device microwave property accuracy of measurement.
For solving the problems of the technologies described above, the invention provides the asymmetric Low ESR test fixture of a kind of radio frequency, comprising: pcb board and base plate; The left side of described pcb board is provided with the first impedance transformation unit, and the right side of described pcb board is provided with the second impedance transformation unit; Described the first impedance transformation unit and described the second impedance transformation unit are made up of the microstrip line of one group of gradual change respectively, the width of every microstrip line described in every group in microstrip line is identical, described in every group, the length of microstrip line is according to from small to large in orientation, rule more from big to small changes; On described pcb board, be also provided with fan-shaped electric capacity, power end and earth terminal, a pole plate of described fan-shaped electric capacity is connected with described the second impedance transformation unit and described power end, another pole plate ground connection of described fan-shaped electric capacity, and described earth terminal is for ground connection; Described pcb board is connected to the upper end of described base plate.
Further, on described pcb board, be also provided with louvre.
Further, also comprise screw; Described pcb board is arranged on described base plate by described screw.
Further, on described base plate, be provided with louvre.
Further, described in every group, in microstrip line, comprise 100 described microstrip lines.
The asymmetric Low ESR test fixture of radio frequency provided by the invention, convert respectively the impedance obtaining with tested device is inputted, output matches by the first impedance transformation unit and the second impedance transformation unit, can effectively improve the impedance real part of test transistor, solve the source problem of vibration, prevent from burning tested device, ensure tested device microwave measurement accuracy.
Brief description of the drawings
The pcb board structural representation that Fig. 1 provides for the embodiment of the present invention;
The base arrangement schematic diagram that Fig. 2 provides for the embodiment of the present invention.
Embodiment
Referring to Fig. 1 and Fig. 2, the asymmetric Low ESR test fixture of a kind of radio frequency that the embodiment of the present invention provides, comprising: pcb board 7, base plate 9 and screw.The left side of pcb board 7 is provided with the first impedance transformation unit 1, the right side of pcb board 7 is provided with the second impedance transformation unit 2, the first impedance transformation unit 1 and the second impedance transformation unit 2 are made up of the microstrip line (as Klopfenstein gradual change microstrip line) of one group of gradual change respectively, every group of microstrip line is made up of 100 microstrip lines, the width of every microstrip line in every group of microstrip line is identical, the length of every group of microstrip line is according to from small to large in orientation, rule more from big to small changes.On pcb board 7, be also provided with fan-shaped electric capacity 3, power end 4 and earth terminal 5, a pole plate of fan-shaped electric capacity 3 is connected with the second impedance transformation unit 2 and power end 4, another pole plate ground connection of fan-shaped electric capacity 3, earth terminal 5 is for ground connection, and is connected with needing the stomidium of ground connection on pcb board 7; Pcb board 7 is connected by screw in the upper end of base plate 9, and base plate 9 adopts copper coin, and the two ends of base plate 9 can arrange electrical connector according to actual needs, for being connected with outside electric elements.In the embodiment of the present invention, on pcb board 7, be also provided with louvre 6.On base plate 9, be provided with louvre.
Need to test the S parameter of large grid width LDMOS device different frequent points due to Low ESR test fixture and assess device frequency characteristic, therefore this impedance transformation pre-matching pcb board 7 must be broadband, adopts gradual change microstrip line to can be good at realizing.Simultaneously, in conjunction with problems such as tested device resistance, in the present invention, pcb board 7 adopts 100 joint Klopfenstein gradual change microstrip lines to realize, and sending-end impedance transforms to 10 ohm from 50 ohm, and output terminal impedance transforms to 3 ohm from 50 ohm.Fan-shaped electric capacity 3 plays isolation high-frequency signal and the effect of filter out power ripple, and two pins of tested device are connected to the head (i.e. two groups of one end that microstrip line is comparatively intensive) of the first impedance transformation unit and the second impedance transformation unit.The bandwidth of the asymmetric Low ESR test fixture of radio frequency that the embodiment of the present invention provides contains pattern-band, L-band, S-band, and the test scope of application is very wide, and can test out tested device unstable region.The asymmetric Low ESR test fixture of radio frequency that the embodiment of the present invention provides, can be for the device performance test of microwave radio power tube, but its use may be introduced test error, what utilize that vector network analyzer test obtains is the S parameter that comprises Low ESR test fixture and treat test tube entirety, and the error effect of asymmetric radio frequency Low ESR test fixture is got rid of and just can be obtained treating test tube S parameter accurately.Therefore be the theoretical premise of test to the calibration of Low ESR test fixture, the present embodiment can adopt TRL algorithm can realize the accurate calibration to Low ESR test fixture.
The asymmetric Low ESR test fixture of radio frequency that invention provides, divide 2 Bian Huan not obtain the impedance matching with tested device input, output by the first impedance transformation unit 1 and the second impedance transformation unit, can effectively improve to be tested during the impedance real part of (as transistor to be tested), solve the source problem of vibration, prevent from burning tested device, ensure tested device microwave measurement accuracy.
It should be noted last that, above embodiment is only unrestricted in order to technical scheme of the present invention to be described, although the present invention is had been described in detail with reference to example, those of ordinary skill in the art is to be understood that, can modify or be equal to replacement technical scheme of the present invention, and not departing from the spirit and scope of technical solution of the present invention, it all should be encompassed in the middle of claim scope of the present invention.
Claims (5)
1. the asymmetric Low ESR test fixture of radio frequency, is characterized in that, comprising: pcb board and base plate; The left side of described pcb board is provided with the first impedance transformation unit, and the right side of described pcb board is provided with the second impedance transformation unit; Described the first impedance transformation unit and described the second impedance transformation unit are made up of the microstrip line of one group of gradual change respectively, the width of every microstrip line described in every group in microstrip line is identical, described in every group, the length of microstrip line is according to from small to large in orientation, rule more from big to small changes; On described pcb board, be also provided with fan-shaped electric capacity, power end and earth terminal, a pole plate of described fan-shaped electric capacity is connected with described the second impedance transformation unit and described power end, another pole plate ground connection of described fan-shaped electric capacity, and described earth terminal is for ground connection; Described pcb board is connected to the upper end of described base plate.
2. the asymmetric Low ESR test fixture of radio frequency according to claim 1, is characterized in that, is also provided with louvre on described pcb board.
3. the asymmetric Low ESR test fixture of radio frequency according to claim 1, is characterized in that, also comprises screw; Described pcb board is arranged on described base plate by described screw.
4. the asymmetric Low ESR test fixture of radio frequency according to claim 1, is characterized in that, on described base plate, is provided with louvre.
5. the asymmetric Low ESR test fixture of radio frequency according to claim 1, is characterized in that, comprises 100 described microstrip lines described in every group in microstrip line.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410102906.4A CN103852602B (en) | 2014-03-19 | 2014-03-19 | Radio frequency asymmetric Low ESR test fixture |
| PCT/CN2014/083056 WO2015139402A1 (en) | 2014-03-19 | 2014-07-25 | Radio-frequency asymmetrical low-impedance test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410102906.4A CN103852602B (en) | 2014-03-19 | 2014-03-19 | Radio frequency asymmetric Low ESR test fixture |
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| Publication Number | Publication Date |
|---|---|
| CN103852602A true CN103852602A (en) | 2014-06-11 |
| CN103852602B CN103852602B (en) | 2016-12-07 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201410102906.4A Active CN103852602B (en) | 2014-03-19 | 2014-03-19 | Radio frequency asymmetric Low ESR test fixture |
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| CN (1) | CN103852602B (en) |
| WO (1) | WO2015139402A1 (en) |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104407181A (en) * | 2014-12-25 | 2015-03-11 | 上海联星电子有限公司 | Testing clamp |
| WO2015081707A1 (en) * | 2013-12-05 | 2015-06-11 | 上海联星电子有限公司 | Improved low-impedance test fixture |
| WO2015081708A1 (en) * | 2013-12-05 | 2015-06-11 | 上海联星电子有限公司 | Improved low-impedance test fixture |
| WO2015139402A1 (en) * | 2014-03-19 | 2015-09-24 | 上海联星电子有限公司 | Radio-frequency asymmetrical low-impedance test fixture |
| CN106383251A (en) * | 2016-11-30 | 2017-02-08 | 中国电子科技集团公司第二十九研究所 | Broadband big power test clamp |
| CN106771389A (en) * | 2016-12-07 | 2017-05-31 | 中国科学院微电子研究所 | Fixture and load balance factor system for load balance factor system |
| CN107612572A (en) * | 2017-09-08 | 2018-01-19 | 上海斐讯数据通信技术有限公司 | A kind of radio-frequency match module, the radio system for mobile terminal |
| CN110398678A (en) * | 2019-06-11 | 2019-11-01 | 西安电子科技大学 | A kind of wide impedance ranges test method of large power semiconductor device |
| CN113593344A (en) * | 2021-08-06 | 2021-11-02 | 广东工业大学 | Simulation identification method and system for parameter oscillation of power amplifier |
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| CN103852602B (en) * | 2014-03-19 | 2016-12-07 | 上海联星电子有限公司 | Radio frequency asymmetric Low ESR test fixture |
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2014
- 2014-03-19 CN CN201410102906.4A patent/CN103852602B/en active Active
- 2014-07-25 WO PCT/CN2014/083056 patent/WO2015139402A1/en active Application Filing
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Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2015081707A1 (en) * | 2013-12-05 | 2015-06-11 | 上海联星电子有限公司 | Improved low-impedance test fixture |
| WO2015081708A1 (en) * | 2013-12-05 | 2015-06-11 | 上海联星电子有限公司 | Improved low-impedance test fixture |
| WO2015139402A1 (en) * | 2014-03-19 | 2015-09-24 | 上海联星电子有限公司 | Radio-frequency asymmetrical low-impedance test fixture |
| CN104407181A (en) * | 2014-12-25 | 2015-03-11 | 上海联星电子有限公司 | Testing clamp |
| CN104407181B (en) * | 2014-12-25 | 2017-06-30 | 上海联星电子有限公司 | A kind of test fixture |
| CN106383251A (en) * | 2016-11-30 | 2017-02-08 | 中国电子科技集团公司第二十九研究所 | Broadband big power test clamp |
| CN106383251B (en) * | 2016-11-30 | 2018-10-09 | 中国电子科技集团公司第二十九研究所 | A kind of wideband high-power test fixture |
| CN106771389A (en) * | 2016-12-07 | 2017-05-31 | 中国科学院微电子研究所 | Fixture and load balance factor system for load balance factor system |
| CN107612572A (en) * | 2017-09-08 | 2018-01-19 | 上海斐讯数据通信技术有限公司 | A kind of radio-frequency match module, the radio system for mobile terminal |
| CN110398678A (en) * | 2019-06-11 | 2019-11-01 | 西安电子科技大学 | A kind of wide impedance ranges test method of large power semiconductor device |
| CN113593344A (en) * | 2021-08-06 | 2021-11-02 | 广东工业大学 | Simulation identification method and system for parameter oscillation of power amplifier |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103852602B (en) | 2016-12-07 |
| WO2015139402A1 (en) | 2015-09-24 |
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Effective date of registration: 20230406 Address after: D2-501, China Sensor Network International Innovation Park, No. 200 Linghu Avenue, New District, Wuxi City, Jiangsu Province, 214000 Patentee after: JIANGSU ZHONGKE JUNSHINE TECHNOLOGY Co.,Ltd. Address before: Room 1513, Hongnan investment building, 939 Jinqiao Road, Pudong New Area, Shanghai, 200120 Patentee before: SHANGHAI LIANXING ELECTRONIC Co.,Ltd. |