CN104407181A - Testing clamp - Google Patents
Testing clamp Download PDFInfo
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- CN104407181A CN104407181A CN201410837875.7A CN201410837875A CN104407181A CN 104407181 A CN104407181 A CN 104407181A CN 201410837875 A CN201410837875 A CN 201410837875A CN 104407181 A CN104407181 A CN 104407181A
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Abstract
The invention relates to the field of radio frequency microwave measurement and discloses a testing clamp, for solving the technical problem in the prior art that a testing clamp easily damages a tested part or the testing bandwidth is relatively narrow. The testing clamp comprises a first testing circuit, a first Stan transform taper microstrip line, a second Stan transform taper microstrip line and a second testing circuit, wherein the first testing circuit comprises a first 90-degree hybrid electric bridge and a second 90-degree hybrid electric bridge; the second testing circuit comprises a third 90-degree hybrid electric bridge and a fourth 90-degree hybrid electric bridge. Due to adoption of the four 90-degree hybrid electric bridges, a function of radio frequency open circuit is achieved, so that impedance mismatching is prevented, and meanwhile due to adoption of the four 90-degree hybrid electric bridges and the two Stan transform taper microstrip lines, a function of expanding the radio frequency bandwidth is achieved, so that the technical effect that the radio frequency bandwidth is widened is achieved while the security of the tested part is ensured.
Description
Technical field
The present invention relates to frequency microwave fields of measurement, particularly relate to a kind of test fixture.
Background technology
Test fixture belongs to a classification below tool, specially to a kind of tool that the function, the calibration of power, life-span, performance etc. of product are tested, tested.In prior art, can be tested Microwave Power Tubes by 50 Ω test fixtures, but this test fixture does not design impedance transformation function, and then its PA (Power Amplifier: power amplifier) also exists impedance severe mismatch problem, cause low-frequency oscillation, in this case, measured piece is easy to burn.
In order to solve the problem, in prior art, produce again a kind of test fixture being undertaken powering by biasing circuit, the power tube that in Load pull (load balance factor) system, test package is good can be applied to.This kind of Clamping Off-set circuit adopts 1/4 wave microstrip line to carry out radio frequency open circuit, along with the rising of frequency, 1/4 wave microstrip line under fixed plate changes, the effect of radio frequency open circuit can not be played, clamp strap is extended the deadline the narrow of system, greatly reduces the scope of application of fixture, cause test power tube that multiple fixture need be used to combine and just can complete, add calibration complicacy, testing cost will be multiplied in addition.
Summary of the invention
The invention provides a kind of test fixture, easily cause the damaged or narrower technical matters of test bandwidth of measured piece to solve test fixture in prior art.
The embodiment of the present invention provides a kind of test fixture, comprising: the first test circuit, first this smooth conversion gradual change microstrip line, second this smooth conversion gradual change microstrip line and second test circuit;
Described first test circuit comprises: rf inputs; One 90 ° of mixed electrical bridge, the input end of described one 90 ° of mixed electrical bridge is connected to described rf inputs; 2 90 ° of mixed electrical bridge,-90 ° of phase output of described 2 90 ° of mixed electrical bridge are connected to 0 ° of phase output of described one 90 ° of mixed electrical bridge, 0 ° of phase output of described 2 90 ° of mixed electrical bridge is connected to-90 ° of phase output of described one 90 ° of mixed electrical bridge, and the input end of described 2 90 ° of mixed electrical bridge is connected to the first end of described first this smooth conversion gradual change microstrip line; First power supply, the first end of described first power supply is connected to the isolation end of described one 90 ° of mixed electrical bridge, the second end ground connection of described first power supply; First resistance, the first end of described first resistance is connected to the isolation end of described 2 90 ° of mixed electrical bridge, the second end ground connection of described first resistance;
The impedance magnitude of described first this smooth conversion gradual change microstrip line is diminished gradually by first end to the second end;
The impedance magnitude of described second this smooth conversion gradual change microstrip line is increased gradually by first end to the second end;
Described second test circuit comprises: the 3 90 ° of mixed electrical bridge, and the input end of described 3 90 ° of mixed electrical bridge is connected to the second end of described second this smooth conversion gradual change microstrip line; 4 90 ° of mixed electrical bridge,-90 ° of phase output of described 4 90 ° of mixed electrical bridge are connected to 0 ° of phase output of described 3 90 ° of mixed electrical bridge, and 0 ° of phase output of described 4 90 ° of mixed electrical bridge is connected to-90 ° of phase output of described 3 90 ° of mixed electrical bridge; Second source, the first end of described second source is connected to the isolation end of described 4 90 ° of mixed electrical bridge, the second end ground connection of described second source; Second resistance, the first end of described second resistance is connected to the isolation end of described 3 90 ° of mixed electrical bridge, the second end ground connection of described second resistance; Radio-frequency (RF) output end, is connected to the input end of described 4 90 ° of mixed electrical bridge.
Optionally, the impedance magnitude of described first this smooth conversion gradual change microstrip line is converted into 4.2 ohm by 50 ohm.
Optionally, the impedance magnitude of described second this smooth conversion gradual change microstrip line is converted into 50 ohm by 4.2 ohm.
Optionally, described test fixture also comprises:
At least one first electric capacity, between the isolation end that the positive pole of each first electric capacity of at least one the first electric capacity is connected to described one 90 ° of mixed electrical bridge and described first power supply, the minus earth of each first electric capacity.
Optionally, described test fixture also comprises:
At least one second electric capacity, between the isolation end that the positive pole of each second electric capacity of at least one the second electric capacity is connected to described 4 90 ° of mixed electrical bridge and described second source, the minus earth of each second electric capacity.
Optionally, when testing measured piece, the first end of described measured piece is connected to the default impedance magnitude position of described first this smooth conversion gradual change microstrip line; Second end of described measured piece is connected to the described default impedance magnitude position of described second this smooth conversion gradual change microstrip line.
Optionally, described test fixture also comprises:
Support member, is arranged at bottom described first test circuit, described first this smooth conversion gradual change microstrip line, described second this smooth conversion gradual change microstrip line and described second test circuit.
Beneficial effect of the present invention is as follows:
Due in embodiments of the present invention, provide a kind of test fixture, comprise: the first test circuit, first this smooth conversion gradual change microstrip line, second this smooth conversion gradual change microstrip line and second test circuit, wherein the first test circuit comprises the one 90 ° of mixed electrical bridge and the 2 90 ° of mixed electrical bridge, second test circuit comprises the 3 90 ° of mixed electrical bridge and the 4 90 ° of mixed electrical bridge, wherein four 90 ° of mixed electrical bridges can either play the effect of polarization circuit, thus prevent impedance mismatching, the combination of four 90 ° of mixed electrical bridges and two these smooth conversion gradual change microstrip lines simultaneously can play again the effect of extensive radio frequency bandwidth, and then reach while the safety ensureing test measured piece, improve the technique effect of test bandwidth,
And, the scope of application of this test fixture is wider, pattern-band (below 1GHz), L-band (1GHz ~ 2GHz), S-band (2GHz-4GHz) just can be contained, so reduce testing cost by same test fixture frequency;
This test fixture can suppress power tube low-frequency oscillation very well in addition, accurately measures the characteristic of measured piece, thus provides reliable foundation for the design of later PA.
Accompanying drawing explanation
Fig. 1 is the structural drawing of test fixture in the embodiment of the present invention;
Fig. 2 is the structural drawing of the first test circuit in embodiment of the present invention test fixture;
Fig. 3 is the structural drawing of the second test circuit in embodiment of the present invention test fixture;
Fig. 4 is the structural drawing of support member in embodiment of the present invention test fixture;
Fig. 5 is test fixture in the embodiment of the present invention and the comparison diagram of two-port network insertion loss of test fixture of the prior art without polarization circuit;
Fig. 6 is test fixture in the embodiment of the present invention and the comparison diagram of two-port network insertion loss of test fixture of the prior art with polarization circuit.
Embodiment
The invention provides a kind of test fixture, easily cause the damaged or narrower technical matters of test bandwidth of measured piece to solve test fixture in prior art.
Technical scheme in the embodiment of the present application is solve above-mentioned technical matters, and general thought is as follows:
Provide a kind of test fixture, comprise: the first test circuit, first this smooth conversion gradual change microstrip line, second this smooth conversion gradual change microstrip line and second test circuit, wherein the first test circuit comprises the one 90 ° of mixed electrical bridge and the 2 90 ° of mixed electrical bridge, second test circuit comprises the 3 90 ° of mixed electrical bridge and the 4 90 ° of mixed electrical bridge, wherein four 90 ° of mixed electrical bridges can either play the effect of polarization circuit, thus prevent impedance mismatching, the combination of four 90 ° of mixed electrical bridges and two these smooth conversion gradual change microstrip lines simultaneously can play again the effect of extensive radio frequency bandwidth, and then reach while the safety ensureing measured piece, improve the technique effect of test bandwidth,
And, the scope of application of this test fixture is wider, pattern-band (below 1GHz), L-band (1GHz ~ 2GHz), S-band (2GHz-4GHz) just can be contained, so reduce testing cost by same test fixture frequency;
This test fixture can suppress power tube low-frequency oscillation very well in addition, accurately measures the characteristic of measured piece, thus provides reliable foundation for the design of later PA.
In order to better understand technique scheme, below by accompanying drawing and specific embodiment, technical solution of the present invention is described in detail, the specific features being to be understood that in the embodiment of the present invention and embodiment is the detailed description to technical solution of the present invention, instead of the restriction to technical solution of the present invention, when not conflicting, the technical characteristic in the embodiment of the present invention and embodiment can combine mutually.
Embodiments provide a kind of test fixture, please refer to Fig. 1, comprise: this smooth conversion gradual change microstrip line 2, second of the first test circuit 1, first this smooth conversion gradual change microstrip line 3 and second test circuit 4, will be introduced above four element portion below.
1) please continue to refer to Fig. 1 with reference to figure 2, the first test circuit 1 comprises:
Rf inputs 10, the radiofrequency signal that rf inputs 10 supplies for Received signal strength source;
One 90 ° of mixed electrical bridge 11, the input end 11a of the one 90 ° of mixed electrical bridge 11 is connected to rf inputs 10;
2 90 ° of mixed electrical bridge 12,-90 ° of phase output 12a of the 2 90 ° of mixed electrical bridge 12 are connected to 0 ° of phase output 11c of the one 90 ° of mixed electrical bridge 11,0 ° of phase output 12c of the 2 90 ° of mixed electrical bridge 12 is connected to-90 ° of phase output 11d of the one 90 ° of mixed electrical bridge 11, the input end 12a of the 2 90 ° of mixed electrical bridge 12 is connected to the first end of first this smooth conversion gradual change microstrip line 1, and wherein the 2 90 ° of mixed electrical bridge 12 is equivalent to the one 90 ° of mixed electrical bridge 11 to turn clockwise 180 °;
The first end of the first power supply 13, first power supply 13 is connected to the isolation end 11b of the one 90 ° of mixed electrical bridge 11, the second end ground connection of the first power supply 13;
The first end of the first resistance 14, first resistance 14 is connected to the isolation end 12b of the 2 90 ° of mixed electrical bridge 12, the second end ground connection of the first resistance 14;
Wherein, the signal inputted by the input end of the one 90 ° of mixed electrical bridge 11 is converted to two paths of signals by the one 90 ° of mixed electrical bridge 11, one road signal is converted to 0 ° of phase output signal by 0 ° of phase output 11c of the one 90 ° of mixed electrical bridge, is then converted to-90 ° of phase signals by-90 ° of phase output 12d of the 2 90 ° of mixed electrical bridge 12; Another road signal is converted to-90 ° of phase output signal by-90 ° of phase output 11d of the one 90 ° of mixed electrical bridge 11, then be converted to 0 ° of phase signal by 0 ° of phase output 12c of the 2 90 ° of mixed electrical bridge 12, this two paths of signals is combined into a road signal at the 2 90 ° of mixed electrical bridge 12 and exports first this smooth conversion gradual change microstrip line 2 to by the input end 12a of the 2 90 ° of mixed electrical bridge 12;
The signal of isolation end 11b to the one 90 ° of mixed electrical bridge 11 of the one 90 ° of mixed electrical bridge 11 plays the effect of isolation, and anti-stop signal is through this port;
The signal of isolation end 12b to the 2 90 ° of mixed electrical bridge 12 of the 2 90 ° of mixed electrical bridge 12 plays the effect of isolation, and anti-stop signal is through this port;
But, because the isolation end 12b of the 2 90 ° of mixed electrical bridge 12 can not play the effect of isolation signals completely, still part signal is had to pass through this isolation end 12b, in order to prevent signal reflex from causing circuit oscillation, so absorbed the signal of the isolation end 12b through the 2 90 ° of mixed electrical bridge 12 by the first resistance 14.
First power supply 13 is for powering to the first test circuit 1.
As further preferred embodiment, please continue to refer to Fig. 1, test fixture also comprises:
At least one first electric capacity 15, the positive pole of each first electric capacity 15 of at least one the first electric capacity 15 is connected between the isolation end 11b of the one 90 ° of mixed electrical bridge 11 and the first power supply 13, the minus earth of each first electric capacity 15.
At least one first electric capacity 15 is for filter out power ripple, thus reduction low-frequency oscillation, wherein, if only need filtering low-frequency power ripple, the first less electric capacity 15 then can be set, such as: arrange 1, if need the power supply ripple of filtering low frequency and high frequency, should according to contained Frequency Band Selection multiple corresponding first electric capacity 15, such as: 3,4 etc., specifically comprise several for the first electric capacity 15, the embodiment of the present invention no longer itemizes, and is not restricted.
2) impedance magnitude of first this smooth conversion gradual change microstrip line 2 is diminished gradually by first end to the second end;
As further preferred embodiment, first this smooth conversion gradual change microstrip line 1 is made up of more piece microstrip line, and the impedance magnitude of this more piece microstrip line is converted into 4.2 ohm gradually by 50 ohm.Also namely, the impedance magnitude of first end is 50 ohm, and the impedance magnitude of the second end is 4.2 ohm, and wherein the input end 12a of the 2 90 ° of mixed electrical bridge 12 is connected to 50 ohm of places of first this smooth conversion gradual change microstrip line 2.
3) impedance magnitude of second this smooth conversion gradual change microstrip line 3 is increased gradually by first end to the second end;
As further preferred embodiment, second this smooth conversion gradual change microstrip line 3 is made up of more piece microstrip line, and the impedance magnitude of this more piece microstrip line is converted into 50 ohm gradually by 4.2 ohm.Also namely, the impedance magnitude of first end is 4.2 ohm, and the impedance magnitude of the second end is 50 ohm, and wherein the second end of second this smooth conversion gradual change microstrip line 3 is connected to the input end 40a of the 3 90 ° of mixed electrical bridge 40 of the second test circuit 4.
4) the second test circuit 4, please continue to refer to Fig. 1 also with reference to figure 3, comprising:
3 90 ° of mixed electrical bridge 40, the input end 40a of the 3 90 ° of mixed electrical bridge 40 is connected to the second end of second this smooth conversion gradual change microstrip line 3;
4 90 ° of mixed electrical bridge 41,-90 ° of phase output 41d of the 4 90 ° of mixed electrical bridge 41 are connected to 0 ° of phase output 40c of the 3 90 ° of mixed electrical bridge 40, and 0 ° of phase output 41c of the 4 90 ° of mixed electrical bridge 41 is connected to-90 ° of phase output 40d of the 3 90 ° of mixed electrical bridge 40;
Second source 42, the first end of second source 42 is connected to the isolation end 41b of the 4 90 ° of mixed electrical bridge 41, the second end ground connection of second source 42;
The first end of the second resistance 43, second resistance 43 is connected to the isolation end 40b of the 3 90 ° of mixed electrical bridge 40, the second end ground connection of the second resistance 43;
Radio-frequency (RF) output end 44, is connected to the input end 41a of the 4 90 ° of mixed electrical bridge 41, and output terminal connects power meter port, and then passes through the output characteristics of the watt level determination measured piece detected by power meter.
Wherein, the signal inputted by second this smooth conversion gradual change microstrip line 3 inputs the 3 90 ° of mixed electrical bridge 40 by the input end 40a of the 3 90 ° of mixed electrical bridge 40, then be converted to 0 ° of phase signal by 0 ° of phase output 40c of the 3 90 ° of mixed electrical bridge 40, be converted to-90 ° of phase signals by-90 ° of phase output 40d of the 3 90 ° of mixed electrical bridge 40;-90 ° of phase output 41d of 0 ° of phase signal input the 4 90 ° of mixed electrical bridge 41 of 0 ° of phase output 40c output of the 3 90 ° of mixed electrical bridge 40, and then be converted to-90 ° of phase signals, 0 ° of phase output 41c of-90 ° of phase signals inputs the 4 90 ° of mixed electrical bridge 41 of-90 ° of phase output 40d outputs of the 3 90 ° of mixed electrical bridge 40, and then be converted to 0 ° of phase signal, then synthesize a road signal by the 4 90 ° of mixed electrical bridge 41, and export radio-frequency (RF) output end 44 to by the input end 41a of the 4 90 ° of mixed electrical bridge 41.
The isolation end 40b of the 3 90 ° of mixed electrical bridge 40 is used for the effect signal of the 3 90 ° of mixed electrical bridge 40 being played to isolation, and anti-stop signal is through this port;
But, because the isolation end 40b of the 3 90 ° of mixed electrical bridge 40 can not play the effect of isolation signals completely, still part signal is had to pass through this isolation end 40b, in order to anti-stop signal radiation causes circuit oscillation, so absorb the signal of the isolation end 40b through the 3 90 ° of mixed electrical bridge 40 by the second resistance 43.
The isolation end 41b of the 4 90 ° of mixed electrical bridge 41 is used for the effect signal of the 4 90 ° of mixed electrical bridge 41 being played to isolation, and anti-stop signal is through this port.
Second source 42 is powered for giving the second test circuit 4.
As further preferred embodiment, radio frequency test circuit also comprises:
At least one second electric capacity 45, between the isolation end 41b that the positive pole of each second electric capacity 45 of at least one the second electric capacity 45 is connected to the 4 90 ° of mixed electrical bridge 41 and second source 42, the minus earth of each second electric capacity 45.
At least one second electric capacity 45 is same for filter out power ripple, thus reduction low-frequency oscillation, wherein, if only need filtering low-frequency power ripple, the second less electric capacity 45 then can be set, such as: arrange 1, if need the power supply ripple of filtering low frequency and high frequency, should according to contained Frequency Band Selection multiple corresponding second electric capacity 45, such as: 3,4 etc., specifically comprise several for the second electric capacity 45, the embodiment of the present invention no longer itemizes, and is not restricted.
As further preferred embodiment, please refer to Fig. 4, this radio frequency test circuit also comprises:
Support member 5, is arranged at bottom this smooth conversion gradual change microstrip line 3 of this smooth conversion gradual change microstrip line 2, second of the first test circuit 1, first and the second test circuit 4.
Wherein, the first test circuit 1 is arranged at support member 5 left side, and rf inputs 10 is positioned at 50, and the second test circuit 4 is arranged on the right of support member 5, and radio-frequency (RF) output end 44 is positioned at 51.
When testing measured piece, the first end of measured piece is connected to the default impedance magnitude position of first this smooth conversion gradual change microstrip line 2; Second end of measured piece is connected to the default impedance magnitude position of second this smooth conversion gradual change microstrip line 3.
Wherein, according to the difference of measured piece, default impedance magnitude is also different, and such as: if measured piece output power is more than hectowatt magnitude, then presetting impedance magnitude is less than 5 ohm; If measured piece is several watts of magnitudes, then presetting impedance magnitude is more than 10 ohm etc.
When being tested measured piece by this test fixture, first the first test circuit 1 is connected to 50 ohmage places of first this smooth conversion gradual change microstrip line 2, second test circuit 4 is connected to 50 ohmage places of second this smooth conversion gradual change microstrip line 3, the first end of measured piece is connected to the corresponding ohmage of first this smooth conversion gradual change microstrip line 2 (according to the difference of measured piece, link position is also different) place, the second end of measured piece is connected to the corresponding ohmage place of second this smooth conversion gradual change microstrip line 3.Then, the PCB of this smooth conversion gradual change microstrip line 3 of this smooth conversion gradual change microstrip line 2, second of formation first test circuit 1, first and the second test circuit 4 is fixed on support member 5, just be assembled into test fixture, measured piece is screwed above just can be tested at printed circuit board (PCB).
Verify to the beneficial effect of this test fixture below.As shown in Figure 5, the curve of test fixture of the present invention is 52, and test fixture of the prior art is 53 without the curve of biasing circuit, and as can be seen from test result, the bandwidth of the two below 7GHz is substantially suitable;
As shown in Figure 6, the curve of test fixture of the present invention is 61, the curve that test fixture of the prior art adds biasing circuit is 51, as can be seen from test result, after test fixture of the prior art adds biasing circuit, after 2.82.8GHz bandwidth, vibration clearly, so its applicable bandwidth obviously narrows down to 2.8GHz, contrast obviously.
Experiment shows, broadband test fixture of the present invention is owing to adding special biasing networks, can effectively suppress transistor low-frequency oscillation, and its bandwidth can contain pattern-band (below 1GHz), L-band (1GHz-2GHz), S-band (2GHz-4GHz), the test scope of application is very wide, has good stability and broadband property.
The one or more embodiment of the present invention, at least has following beneficial effect:
Due in embodiments of the present invention, provide a kind of test fixture, comprise: the first test circuit, first this smooth conversion gradual change microstrip line, second this smooth conversion gradual change microstrip line and second test circuit, wherein the first test circuit comprises the one 90 ° of mixed electrical bridge and the 2 90 ° of mixed electrical bridge, second test circuit comprises the 3 90 ° of mixed electrical bridge and the 4 90 ° of mixed electrical bridge, wherein four 90 ° of mixed electrical bridges can either play the effect of polarization circuit, thus prevent impedance mismatching, the combination of four 90 ° of mixed electrical bridges and two these smooth conversion gradual change microstrip lines simultaneously can play again the effect of extensive radio frequency bandwidth, and then reach while the safety ensureing measured piece, improve the technique effect of test bandwidth,
And, the scope of application of this test fixture is wider, pattern-band (below 1GHz), L-band (1GHz ~ 2GHz), S-band (2GHz-4GHz) just can be contained, so reduce testing cost by same test fixture frequency;
This test fixture can suppress power tube low-frequency oscillation very well in addition, accurately measures the characteristic of measured piece, thus provides reliable foundation for the design of later PA.
Although measured piece describes the preferred embodiments of the present invention, those skilled in the art once obtain the basic creative concept of cicada, then can make other change and amendment to these embodiments.So claims are intended to be interpreted as comprising preferred embodiment and falling into all changes and the amendment of the scope of the invention.
Obviously, those skilled in the art can carry out various change and modification to the present invention and not depart from the spirit and scope of the present invention.Like this, if these amendments of the present invention and modification belong within the scope of the claims in the present invention and equivalent technologies thereof, then the present invention is also intended to comprise these change and modification.
Claims (7)
1. a test fixture, is characterized in that, comprising: the first test circuit, first this smooth conversion gradual change microstrip line, second this smooth conversion gradual change microstrip line and second test circuit;
Described first test circuit comprises: rf inputs; One 90 ° of mixed electrical bridge, the input end of described one 90 ° of mixed electrical bridge is connected to described rf inputs; 2 90 ° of mixed electrical bridge,-90 ° of phase output of described 2 90 ° of mixed electrical bridge are connected to 0 ° of phase output of described one 90 ° of mixed electrical bridge, 0 ° of phase output of described 2 90 ° of mixed electrical bridge is connected to-90 ° of phase output of described one 90 ° of mixed electrical bridge, and the input end of described 2 90 ° of mixed electrical bridge is connected to the first end of described first this smooth conversion gradual change microstrip line; First power supply, the first end of described first power supply is connected to the isolation end of described one 90 ° of mixed electrical bridge, the second end ground connection of described first power supply; First resistance, the first end of described first resistance is connected to the isolation end of described 2 90 ° of mixed electrical bridge, the second end ground connection of described first resistance;
The impedance magnitude of described first this smooth conversion gradual change microstrip line is diminished gradually by first end to the second end;
The impedance magnitude of described second this smooth conversion gradual change microstrip line is increased gradually by first end to the second end;
Described second test circuit comprises: the 3 90 ° of mixed electrical bridge, and the input end of described 3 90 ° of mixed electrical bridge is connected to the second end of described second this smooth conversion gradual change microstrip line; 4 90 ° of mixed electrical bridge,-90 ° of phase output of described 4 90 ° of mixed electrical bridge are connected to 0 ° of phase output of described 3 90 ° of mixed electrical bridge, and 0 ° of phase output of described 4 90 ° of mixed electrical bridge is connected to-90 ° of phase output of described 3 90 ° of mixed electrical bridge; Second source, the first end of described second source is connected to the isolation end of described 4 90 ° of mixed electrical bridge, the second end ground connection of described second source; Second resistance, the first end of described second resistance is connected to the isolation end of described 3 90 ° of mixed electrical bridge, the second end ground connection of described second resistance; Radio-frequency (RF) output end, is connected to the input end of described 4 90 ° of mixed electrical bridge.
2. test fixture as claimed in claim 1, it is characterized in that, the impedance magnitude of described first this smooth conversion gradual change microstrip line is converted into 4.2 ohm by 50 ohm.
3. test fixture as claimed in claim 1, it is characterized in that, the impedance magnitude of described second this smooth conversion gradual change microstrip line is converted into 50 ohm by 4.2 ohm.
4. test fixture as claimed in claim 1, it is characterized in that, described test fixture also comprises:
At least one first electric capacity, between the isolation end that the positive pole of each first electric capacity of at least one the first electric capacity is connected to described one 90 ° of mixed electrical bridge and described first power supply, the minus earth of each first electric capacity.
5. test fixture as claimed in claim 1, it is characterized in that, described test fixture also comprises:
At least one second electric capacity, between the isolation end that the positive pole of each second electric capacity of at least one the second electric capacity is connected to described 4 90 ° of mixed electrical bridge and described second source, the minus earth of each second electric capacity.
6. the test fixture as described in as arbitrary in claim 1-5, it is characterized in that, when testing measured piece, the first end of described measured piece is connected to the default impedance magnitude position of described first this smooth conversion gradual change microstrip line; Second end of described measured piece is connected to the described default impedance magnitude position of described second this smooth conversion gradual change microstrip line.
7. the test fixture as described in as arbitrary in claim 1-5, it is characterized in that, described test fixture also comprises:
Support member, is arranged at bottom described first test circuit, described first this smooth conversion gradual change microstrip line, described second this smooth conversion gradual change microstrip line and described second test circuit.
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Cited By (5)
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| CN105116175A (en) * | 2015-08-31 | 2015-12-02 | 合肥工业大学 | General broadband microwave component text fixture based on adaptive pressing sheet |
| CN106383251A (en) * | 2016-11-30 | 2017-02-08 | 中国电子科技集团公司第二十九研究所 | Broadband big power test clamp |
| CN106771389A (en) * | 2016-12-07 | 2017-05-31 | 中国科学院微电子研究所 | Clamp for load traction system and load traction system |
| CN110286251A (en) * | 2019-04-30 | 2019-09-27 | 中国电子科技集团公司第十三研究所 | A kind of transistor load pull test fixture |
| CN113219216A (en) * | 2021-04-23 | 2021-08-06 | 华南理工大学 | Gallium nitride microwave transistor test fixture and working method thereof |
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| CN105116175A (en) * | 2015-08-31 | 2015-12-02 | 合肥工业大学 | General broadband microwave component text fixture based on adaptive pressing sheet |
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| CN110286251A (en) * | 2019-04-30 | 2019-09-27 | 中国电子科技集团公司第十三研究所 | A kind of transistor load pull test fixture |
| CN113219216A (en) * | 2021-04-23 | 2021-08-06 | 华南理工大学 | Gallium nitride microwave transistor test fixture and working method thereof |
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