CN206638706U - A kind of staged impedance transformer test fixture - Google Patents
A kind of staged impedance transformer test fixture Download PDFInfo
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- CN206638706U CN206638706U CN201720333945.4U CN201720333945U CN206638706U CN 206638706 U CN206638706 U CN 206638706U CN 201720333945 U CN201720333945 U CN 201720333945U CN 206638706 U CN206638706 U CN 206638706U
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- impedance transformer
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Abstract
The utility model discloses a kind of staged impedance transformer test fixture, can provide wide band impedance transform effect while actual size is effectively reduced, simple in construction, and convenient modeling and processing, smaller, cost is lower.A kind of staged impedance transformer test fixture, including：Earth plate (1), substrate (2) and end difference (3)；Substrate (2) is installed on the upper surface of earth plate (1), and end difference (3) is installed on the upper surface of substrate (2)；End difference (3) includes N number of the first wide microstrip line and N number of the second wide microstrip line, wherein, N is positive integer；First microstrip line and the second microstrip line alternately connect.
Description
Technical field
It the utility model is related to a kind of field of mechanical technique, more particularly to a kind of staged impedance transformer test fixture.
Background technology
It is also more and more diversified to the design requirement of base station power amplifier as mobile communications network marches toward the 4G epoch,
Required according to 3GPP, the down-link frequencies of FDD standards cover 0.45GHz to 2.7GHz frequency ranges.Wherein 1GHz frequencies
Following frequency range includes 462.5-467.5MHz, 734-746MHz, 869-894MHz, 925-960MHz etc., it is therefore necessary to pin
These specific frequency ranges are designed to power amplifier.
At present, use in a base station it is most be Doherty power amplifier, compared to traditional class ab ammplifier,
Doherty power amplifier can more efficiently work in back-off.Realizing the form of Dohery power amplifiers is
Various, one of which is exactly to be designed to push-pull power amplifier using two power tubes, this push-pull type power amplification
Main amplifier and peak amplifier of the device respectively as Doherty power amplifier.Two branch roads of push-pull amplifier are usual
To be synthesized using balun transformer, the output impedance of each branch is not 50 ohm, but 25 ohm, balun transformer
An impedance no-load voltage ratio is functioned as 1:2 transformer, two-way branch is synthesized into single channel output impedance it is 50 ohm and put
Big device.Because the output impedance of single branch is 25 ohm, and the port Impedance of conventional radio frequency test device is 50 ohm,
, it is necessary to judge that the working characteristics of single branch has to, by a test fixture, realize 25 ohm to 50 ohm before synthesis
Impedance conversion, the service behaviour of single branch could be tested out by measuring instrument, such as spectrum analyzer, power meter
Come.
Traditional Impedance taper is because it requires that electrical length is quarter-wave, therefore working frequency drops
It is low, the actual size of Impedance taper will certainly be caused excessive, be unfavorable for reducing cost.
Utility model content
A kind of staged impedance transformer test fixture in the utility model, can be while actual size be effectively reduced
Wide band impedance transform effect is provided, simple in construction, convenient modeling and processing, smaller, cost is lower.
A kind of staged impedance transformer test fixture in the utility model, including：
Earth plate 1, substrate 2 and end difference 3；
Substrate 2 is installed on the upper surface of earth plate 1, and end difference 3 is installed on the upper surface of substrate 2；
End difference 3 includes N number of the first wide microstrip line and N number of the second wide microstrip line, wherein, N is positive integer；
First microstrip line and the second microstrip line alternately connect.
Optionally,
First microstrip line and the second microstrip line are 6.
Optionally,
Earth plate 1 and substrate 2 are rectangle structure.
Optionally,
Test fixture covering frequency range is 0.45-3GHz.
Optionally,
Test fixture is applied to the frequency range below 1G frequency ranges under LTE FDD standards.
Optionally,
Earth plate 1 is metal material.
In the utility model, the staged impedance transformer test fixture is by end difference 3, substrate 2 and the three parts of earth plate 1
Installation is from top to bottom stacked, wherein, end difference 3 is replaced by N number of the first wide microstrip line and N number of the second wide microstrip line
It is connected in series, in actual use, two test fixtures is sub-packed in the input and output of power amplifier to be tested
End, also add radio-frequency signal generator before the test fixture of input, after the test fixture of output end connection power meter or
Person's spectrum analyzer all can be tested and debugged.The length of first microstrip line and the second microstrip line can be selected according to being actually needed
Appropriate size is selected, so as to provide wide band impedance conversion effect while test fixture actual size is effectively reduced
Fruit, overall structure is simple, and convenient modeling and processing, smaller, cost is lower.
Brief description of the drawings
Fig. 1 is a kind of structural representation of staged impedance transformer test fixture embodiment in the utility model；
Fig. 2 is a kind of top view of staged impedance transformer test fixture embodiment in the utility model；
Fig. 3 is a kind of explosive view of staged impedance transformer test fixture embodiment in the utility model.
Embodiment
A kind of staged impedance transformer test fixture embodiment provided by the utility model, reality can be reduced effective
Wide band impedance transform effect is provided while size, simple in construction, convenient modeling and processing, smaller, cost is lower.
The embodiment in the utility model is illustrated below in conjunction with the accompanying drawings.
A kind of staged impedance transformer test fixture embodiment provided by the utility model, including：Earth plate 1, substrate 2
With end difference 3；Substrate 2 is installed on the upper surface of earth plate 1, and end difference 3 is installed on the upper surface of substrate 2；End difference 3 includes
N number of the first wide microstrip line and N number of the second wide microstrip line, wherein, N is positive integer；First microstrip line and the second micro-strip
Line alternately connects.
In the present embodiment, the staged impedance transformer test fixture by end difference 3, substrate 2 and the three parts of earth plate 1 by
Installation is up to stacked down, wherein, end difference 3 is alternately gone here and there by N number of the first wide microstrip line and N number of the second wide microstrip line
Connection is formed by connecting, and in actual use, two test fixtures are sub-packed in the input and output side of power amplifier to be tested,
Radio-frequency signal generator is also added before the test fixture of input, power meter or frequency are connected after the test fixture of output end
Spectrum analyzer all can be tested and debugged.The length of first microstrip line and the second microstrip line can be suitable according to selection is actually needed
When size, so as to effectively reduce test fixture actual size while wide band impedance transform effect is provided, it is whole
Body is simple in construction, and convenient modeling and processing, smaller, cost is lower.
It should be noted that the first microstrip line and the second microstrip line are 6, i.e., 12 micro-strips are shared in the test fixture
Line, ensure also to meet testing requirement while reducing entire length, wherein, microstrip line is that length is required for going to count by software
Calculate, can suitably reduce length variable number in the hope of efficiently reducing the time required during using software progress parameter optimization, can
So that length meets L1=L12, L2=L11, L3=L10, L4=L9, L5=L8, L6=L7；If the time is enough, actually
Also it can not make this limitation to length, this 12 length can be allowed to differ during optimization.
A kind of staged impedance transformer test fixture embodiment provided by the utility model is described further below,
Earth plate 1 and substrate 2 are rectangle structure.
In the present embodiment, the staged impedance transformer test fixture main body is rectangular PCB, the certain situation of width
Under, to save resource, the electrical length of impedance transformer is reduced, reduces overall actual size.
It should be noted that test fixture covering frequency range is 0.45-3GHz.
Test fixture is applied to the frequency range below 1G frequency ranges under LTE FDD standards.
In the present embodiment, 50 ohm to 25 ohm Broadband Matchings in 0.45-3GHz frequency ranges are realized.Due to LTE
FDD standards have part working frequency range to be located in 0.45-1GHz frequency ranges, and the utility model can be used in aiding in 0.45-1GHz
The actual debugging of push-pull amplifier in frequency range.
It is apparent to those skilled in the art that for convenience and simplicity of description, the device of foregoing description
Specific work process, may be referred to the corresponding process in preceding method embodiment, will not be repeated here.Provided herein
Several embodiments in, it should be understood that disclosed device can be realized by another way.
Above example is only to illustrate the technical solution of the utility model, rather than its limitations；Although with reference to foregoing reality
Example is applied the utility model is described in detail, it will be understood by those within the art that：It still can be to preceding
State the technical scheme described in each embodiment to modify, or equivalent substitution is carried out to which part technical characteristic；And these
Modification is replaced, and the essence of appropriate technical solution is departed from the spirit and model of various embodiments of the utility model technical scheme
Enclose.
Claims (6)
- A kind of 1. staged impedance transformer test fixture, it is characterised in that including：Earth plate (1), substrate (2) and end difference (3)；The substrate (2) is installed on the upper surface of the earth plate (1), and the end difference (3) is installed on the substrate (2) Upper surface；The end difference (3) includes N number of the first wide microstrip line and N number of the second wide microstrip line, wherein, N is positive integer；First microstrip line and second microstrip line alternately connect.
- 2. staged impedance transformer test fixture according to claim 1, it is characterised in thatFirst microstrip line and second microstrip line are 6.
- 3. staged impedance transformer test fixture according to claim 1, it is characterised in thatThe earth plate (1) and the substrate (2) are rectangle structure.
- 4. staged impedance transformer test fixture according to claim 1, it is characterised in thatThe test fixture covering frequency range is 0.45-3GHz.
- 5. staged impedance transformer test fixture according to claim 1, it is characterised in thatThe test fixture is applied to the frequency range below 1G frequency ranges under LTE FDD standards.
- 6. staged impedance transformer test fixture according to claim 1, it is characterised in thatThe earth plate (1) is metal material.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720333945.4U CN206638706U (en) | 2017-03-31 | 2017-03-31 | A kind of staged impedance transformer test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720333945.4U CN206638706U (en) | 2017-03-31 | 2017-03-31 | A kind of staged impedance transformer test fixture |
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| Publication Number | Publication Date |
|---|---|
| CN206638706U true CN206638706U (en) | 2017-11-14 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201720333945.4U Active CN206638706U (en) | 2017-03-31 | 2017-03-31 | A kind of staged impedance transformer test fixture |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110398678A (en) * | 2019-06-11 | 2019-11-01 | 西安电子科技大学 | A kind of wide impedance ranges test method of large power semiconductor device |
-
2017
- 2017-03-31 CN CN201720333945.4U patent/CN206638706U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110398678A (en) * | 2019-06-11 | 2019-11-01 | 西安电子科技大学 | A kind of wide impedance ranges test method of large power semiconductor device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20190809 Address after: 510700 Guangzhou High-tech Industrial Development Zone, Guangdong Province, No. 162 Science Avenue, B2 402 Patentee after: Guangzhou Wave Communication Technology Co., Ltd. Address before: 510670 Guangzhou science and Technology Development Zone, Guangdong 402, science Avenue 162, B2 Patentee before: Guangzhou whole world communication technology Co., Ltd. |
|
| TR01 | Transfer of patent right |