CN103842800B - 幅材检测校准系统及相关方法 - Google Patents

幅材检测校准系统及相关方法 Download PDF

Info

Publication number
CN103842800B
CN103842800B CN201280048265.8A CN201280048265A CN103842800B CN 103842800 B CN103842800 B CN 103842800B CN 201280048265 A CN201280048265 A CN 201280048265A CN 103842800 B CN103842800 B CN 103842800B
Authority
CN
China
Prior art keywords
web
sensor
calibration
detection system
frequency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201280048265.8A
Other languages
English (en)
Chinese (zh)
Other versions
CN103842800A (zh
Inventor
贾斯汀·W·威廉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
3M Innovative Properties Co
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Publication of CN103842800A publication Critical patent/CN103842800A/zh
Application granted granted Critical
Publication of CN103842800B publication Critical patent/CN103842800B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/93—Detection standards; Calibrating baseline adjustment, drift correction
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2557/00—Means for control not provided for in groups B65H2551/00 - B65H2555/00
    • B65H2557/60—Details of processes or procedures
    • B65H2557/61—Details of processes or procedures for calibrating

Landscapes

  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
CN201280048265.8A 2011-09-30 2012-09-26 幅材检测校准系统及相关方法 Expired - Fee Related CN103842800B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/249,468 US8553228B2 (en) 2011-09-30 2011-09-30 Web inspection calibration system and related methods
US13/249,468 2011-09-30
PCT/US2012/057167 WO2013049090A1 (en) 2011-09-30 2012-09-26 Web inspection calibration system and related methods

Publications (2)

Publication Number Publication Date
CN103842800A CN103842800A (zh) 2014-06-04
CN103842800B true CN103842800B (zh) 2016-04-20

Family

ID=47143263

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201280048265.8A Expired - Fee Related CN103842800B (zh) 2011-09-30 2012-09-26 幅材检测校准系统及相关方法

Country Status (8)

Country Link
US (1) US8553228B2 (enExample)
EP (1) EP2761270A1 (enExample)
JP (1) JP6122015B2 (enExample)
KR (1) KR20140067162A (enExample)
CN (1) CN103842800B (enExample)
BR (1) BR112014007577A2 (enExample)
SG (1) SG11201401016YA (enExample)
WO (1) WO2013049090A1 (enExample)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2186624B1 (en) * 2008-11-18 2015-08-26 Tetra Laval Holdings & Finance S.A. Apparatus and method for detecting the position of application of a sealing strip onto a web of packaging material for food products
WO2014176626A1 (en) * 2013-05-01 2014-11-06 The University Of Sydney A system and a method for generating information indicative of an impairment of an optical signal
DE102013108485B4 (de) * 2013-08-06 2015-06-25 Khs Gmbh Vorrichtung und Verfahren zum Fehlertracking bei Bandmaterialien
US9910429B2 (en) * 2013-09-03 2018-03-06 The Procter & Gamble Company Systems and methods for adjusting target manufacturing parameters on an absorbent product converting line
WO2015065726A1 (en) 2013-10-31 2015-05-07 3M Innovative Properties Company Multiscale uniformity analysis of a material
US9151595B1 (en) * 2014-04-18 2015-10-06 Advanced Gauging Technologies, LLC Laser thickness gauge and method including passline angle correction
CN105329694B (zh) * 2014-07-22 2017-10-03 宁波弘讯科技股份有限公司 一种纠偏控制方法、控制器及纠偏控制系统
DE102015011013B4 (de) 2014-08-22 2023-05-04 Sigma Additive Solutions, Inc. Verfahren zur Überwachung von generativen Fertigungsprozessen
TWI559423B (zh) * 2014-11-04 2016-11-21 梭特科技股份有限公司 晶粒攝影裝置
US10786948B2 (en) 2014-11-18 2020-09-29 Sigma Labs, Inc. Multi-sensor quality inference and control for additive manufacturing processes
CN107428081B (zh) 2015-01-13 2020-07-07 西格马实验室公司 材料鉴定系统和方法
JP6475543B2 (ja) * 2015-03-31 2019-02-27 株式会社デンソー 車両制御装置、及び車両制御方法
US10207489B2 (en) 2015-09-30 2019-02-19 Sigma Labs, Inc. Systems and methods for additive manufacturing operations
US10067069B2 (en) * 2016-03-11 2018-09-04 Smart Vision Lights Machine vision systems incorporating polarized electromagnetic radiation emitters
EP3339845A3 (en) * 2016-11-30 2018-09-12 Sumitomo Chemical Company, Ltd Defect inspection device, defect inspection method, method for producing separator roll, and separator roll
JP6575824B2 (ja) * 2017-03-22 2019-09-18 トヨタ自動車株式会社 膜厚測定方法および膜厚測定装置
JP7262441B2 (ja) * 2017-08-04 2023-04-21 テトラ ラバル ホールディングス アンド ファイナンス エス エイ パッケージ材料のウェブに密封ストリップを付与するための方法及び装置
US10670745B1 (en) 2017-09-19 2020-06-02 The Government of the United States as Represented by the Secretary of the United States Statistical photo-calibration of photo-detectors for radiometry without calibrated light sources comprising an arithmetic unit to determine a gain and a bias from mean values and variance values
FR3074295B1 (fr) * 2017-11-30 2019-11-15 Saint-Gobain Glass France Procede de detection de defauts de laminage dans un verre imprime
TWI794400B (zh) * 2018-01-31 2023-03-01 美商3M新設資產公司 用於連續移動帶材的紅外光透射檢查
CN109060806B (zh) * 2018-08-29 2019-09-13 陈青 箱子底端材料类型辨识机构
US11926160B2 (en) * 2019-04-26 2024-03-12 Hewlett-Packard Development Company, L.P. Evaluating surfaces
CN114667537B (zh) * 2019-09-11 2025-08-22 西门子股份公司 利用标量值分析图像信息的方法和分析声学信息的方法
CN111993798B (zh) * 2020-08-12 2022-04-12 福建实达电脑设备有限公司 一种页缝传感器的自动校正方法
CN112800907B (zh) * 2021-01-19 2024-06-07 广州华望半导体科技有限公司 鼻梁条用料情况检测方法、系统、装置和存储介质
WO2022235411A1 (en) * 2021-05-06 2022-11-10 Applied Materials, Inc. Cross web tension measurement and control
EP4411317A4 (en) * 2021-09-27 2025-09-03 Toray Industries SHEET-LIKE MATERIAL IRREGULARITIES MEASURING DEVICE AND SHEET-LIKE MATERIAL IRREGULARITIES MEASURING METHOD
CN114862843B (zh) * 2022-06-06 2024-11-01 东北大学 一种基于滤波器融合的金属带材表面缺陷快速检测方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004003925A (ja) * 2002-03-29 2004-01-08 Mitsubishi Paper Mills Ltd 同時多点測定装置及び制御装置
US6850857B2 (en) * 2001-07-13 2005-02-01 Honeywell International Inc. Data fusion of stationary array sensor and scanning sensor measurements
CN101194199A (zh) * 2005-04-06 2008-06-04 加拿大柯达图形通信公司 用于修正成像规律图案的辉纹的方法和设备
CN102105781A (zh) * 2008-06-05 2011-06-22 3M创新有限公司 卷材检查校准系统及相关方法
CN102171549A (zh) * 2008-08-01 2011-08-31 霍尼韦尔阿斯卡公司 用于获得重合片材参数的基于时域频谱（tds）的方法和系统

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2517330A (en) 1949-09-07 1950-08-01 Johns Manville Apparatus for measuring the thickness of semiopaque material
US4247204A (en) * 1979-02-26 1981-01-27 Intec Corporation Method and apparatus for a web edge tracking flaw detection system
US4570074A (en) * 1982-09-29 1986-02-11 Q-Val Incorporated Flying spot scanner system
DE3504368A1 (de) 1985-02-08 1986-08-14 Hitachi, Ltd., Tokio/Tokyo Verfahren und vorrichtung zum gewinnen von inertgas
DE3882905T2 (de) * 1987-05-27 1994-03-10 Nippon Sheet Glass Co Ltd Fühler zur unterscheidung von fehlern in lichtdurchlassendem bahnförmigem material.
US5101828A (en) * 1991-04-11 1992-04-07 Rutgers, The State University Of Nj Methods and apparatus for nonivasive monitoring of dynamic cardiac performance
US5506407A (en) 1993-12-21 1996-04-09 Minnesota Mining & Manufacturing Company High resolution high speed film measuring apparatus and method
US6647140B1 (en) * 1999-05-18 2003-11-11 Bank One Spectrum inverter apparatus and method
US6452679B1 (en) * 1999-12-29 2002-09-17 Kimberly-Clark Worldwide, Inc. Method and apparatus for controlling the manufacturing quality of a moving web
JP2004309215A (ja) 2003-04-03 2004-11-04 Mitsubishi Rayon Co Ltd 膜厚測定装置および膜厚測定方法
EP2171500B1 (en) * 2007-07-06 2011-08-31 Schlumberger Technology B.V. Methods and systems for processing microseismic data
US20110141269A1 (en) * 2009-12-16 2011-06-16 Stephen Michael Varga Systems And Methods For Monitoring On-Line Webs Using Line Scan Cameras
US8270701B2 (en) * 2010-01-08 2012-09-18 3M Innovative Properties Company Optical web-based defect detection using intrasensor uniformity correction

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6850857B2 (en) * 2001-07-13 2005-02-01 Honeywell International Inc. Data fusion of stationary array sensor and scanning sensor measurements
JP2004003925A (ja) * 2002-03-29 2004-01-08 Mitsubishi Paper Mills Ltd 同時多点測定装置及び制御装置
CN101194199A (zh) * 2005-04-06 2008-06-04 加拿大柯达图形通信公司 用于修正成像规律图案的辉纹的方法和设备
CN102105781A (zh) * 2008-06-05 2011-06-22 3M创新有限公司 卷材检查校准系统及相关方法
CN102171549A (zh) * 2008-08-01 2011-08-31 霍尼韦尔阿斯卡公司 用于获得重合片材参数的基于时域频谱（tds）的方法和系统

Also Published As

Publication number Publication date
WO2013049090A1 (en) 2013-04-04
US20130083324A1 (en) 2013-04-04
BR112014007577A2 (pt) 2017-04-11
JP6122015B2 (ja) 2017-04-26
JP2014528579A (ja) 2014-10-27
US8553228B2 (en) 2013-10-08
EP2761270A1 (en) 2014-08-06
KR20140067162A (ko) 2014-06-03
CN103842800A (zh) 2014-06-04
SG11201401016YA (en) 2014-04-28

Similar Documents

Publication Publication Date Title
CN103842800B (zh) 幅材检测校准系统及相关方法
CN102105781B (zh) 卷材检查校准系统及相关方法
KR102549058B1 (ko) 광학 측정 장치 및 광학 측정 방법
KR101342410B1 (ko) 주기적인 회절 구조를 포함하는 층을 갖는 샘플을 측정하는시스템
US6381009B1 (en) Elemental concentration measuring methods and instruments
US20060289790A1 (en) Apparatus and method for enhanced critical dimension scatterometry
US20150316490A1 (en) Removing process-variation-related inaccuracies from scatterometry measurements
TWI867591B (zh) 用於使用物理模型化及機器學習進行多個信號來源之混合計量的方法和系統以及利用其之電腦系統
JP2018205295A (ja) 光学測定装置および光学測定方法
US7869050B2 (en) Systems and methods for comparative interferogram spectrometry
US10480935B2 (en) Thickness mapping using multispectral imaging
US7202958B1 (en) Modeling a sample with an underlying complicated structure
US20140240720A1 (en) Linewidth measurement system
Johnson Defect and thickness inspection system for cast thin films using machine vision and full-field transmission densitometry
US12442774B2 (en) Substrate inspecting apparatus and operating method thereof
US12449351B1 (en) Method of determining absorption and extinction coefficient of prism shaped material
US20240111256A1 (en) Composite data for device metrology
TW202534306A (zh) 單晶圓定向工具引發偏移清潔

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20160420

Termination date: 20200926