WO2017036065A1 - 显示面板组件的检测设备和显示面板组件的检测方法 - Google Patents

显示面板组件的检测设备和显示面板组件的检测方法 Download PDF

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Publication number
WO2017036065A1
WO2017036065A1 PCT/CN2016/070593 CN2016070593W WO2017036065A1 WO 2017036065 A1 WO2017036065 A1 WO 2017036065A1 CN 2016070593 W CN2016070593 W CN 2016070593W WO 2017036065 A1 WO2017036065 A1 WO 2017036065A1
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Prior art keywords
display panel
panel assembly
light
distance
substrate
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PCT/CN2016/070593
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English (en)
French (fr)
Inventor
刘俊国
孙盛林
郑康
李辉
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京东方科技集团股份有限公司
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Priority to US15/522,541 priority Critical patent/US20180003483A1/en
Publication of WO2017036065A1 publication Critical patent/WO2017036065A1/zh

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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1337—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers
    • G02F1/13378—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers by treatment of the surface, e.g. embossing, rubbing or light irradiation
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1337—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1303—Apparatus specially adapted to the manufacture of LCDs
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing

Definitions

  • the present application relates to the field of display, and in particular to a detection device for a display panel assembly and a detection method for the display panel assembly.
  • the liquid crystal display panel (TFT-LCD) has the advantages of high display quality, low power consumption, no radiation, etc. It has developed rapidly in recent years and has been widely used in various fields.
  • the existing liquid crystal display panel mainly includes an array substrate, a color filter substrate, and a liquid crystal layer. In the conventional liquid crystal display panel manufacturing process, it is necessary to apply an alignment film on the color filter substrate and the array substrate (TFT substrate), and form an alignment groove on the alignment film to align and rotate the liquid crystal molecules to perform light. Passing, thus achieving display.
  • the existing alignment film coating process mainly employs an APR plate transfer technique to apply an alignment liquid on a substrate.
  • an edge of the alignment liquid forms a region of uneven thickness.
  • the display area of the display film is larger than the preset distance (for example, 0.1 mm).
  • the conventional method for detecting the effect of the alignment film coating is specifically: measuring the distance of the edge of the alignment film by imaging on the display screen by an artificial moving lens under a microscope.
  • the above detection method mainly uses manual manual detection, automatic operation cannot be realized, which is disadvantageous for productivity improvement.
  • the present application provides a solution for achieving automated detection of an alignment film coating effect.
  • the technical solution of the present application provides a detection device for a display panel assembly, including:
  • a reflectivity measuring device for measuring a light reflectance of the display panel assembly along a preset path, the preset path passing through the first position and the second position;
  • a distance measuring device configured to acquire a distance between the first position and the second position according to the measurement data of the reflectance measuring device
  • the display panel assembly is a substrate having an alignment film and a display area, the first position is an edge of the display area, and the second position is an edge of the alignment film;
  • the reflectance measuring device comprises:
  • a light emitting unit configured to emit incident light to a position on the preset path
  • a light receiving unit configured to receive reflected light of the position on the preset path
  • a light analyzing unit configured to obtain a light reflectance of the position on the preset path according to the incident light and the reflected light.
  • the detecting device further comprises a microscope lens.
  • the light emitting unit is integrated in the microscope lens.
  • a moving mechanism is further included for controlling the movement of the substrate.
  • the distance measuring device comprises:
  • a timing unit for recording a first time and a second time, wherein the first time is a time when the first light reflectance is abruptly changed, and the second time is a time when the second light reflectance is detected to be abrupt ;
  • a first distance calculating unit configured to calculate a distance between the first position and the second position according to the first time, the second time, and a moving speed of the substrate.
  • the distance measuring device comprises:
  • the first coordinate position is a first coordinate position of the substrate when the first light reflectance is abruptly changed
  • the second coordinate position is a second coordinate position of the substrate when the second light reflectance is detected to be abrupt
  • a second distance calculating unit configured to calculate a distance between the first position and the second position according to the first coordinate position and the second coordinate position.
  • the detecting device further includes a data processing device, where the data processing device includes an information generating unit, where the information generating unit is configured to record different locations acquired by measuring data of different preset paths The distance and generate the corresponding data file.
  • the data processing device includes an information generating unit, where the information generating unit is configured to record different locations acquired by measuring data of different preset paths The distance and generate the corresponding data file.
  • the data processing device further includes an alarm unit, wherein the alarm unit is configured to alarm when the distance exceeds a preset value range.
  • the substrate is an array substrate
  • an edge of the display area is an edge of an outermost gate line on the array substrate facing away from a center of the array substrate or an outermost data line back on the array substrate To the edge of the center of the array substrate.
  • the technical solution of the present application provides a method for detecting a display panel assembly, including:
  • the display panel assembly is a substrate coated with an alignment film
  • the first position is an edge of a display area on the substrate, and the second position is an edge of the alignment film.
  • providing a reflectance measuring device comprises:
  • the detecting method further includes providing a moving mechanism to control movement of the substrate.
  • the providing the distance measuring device comprises:
  • providing the distance measuring device further includes:
  • a second distance calculation unit to calculate a distance between the first position and the second position according to the first coordinate position and the second coordinate position.
  • the detecting method further includes providing a data processing device,
  • the data processing apparatus includes an information generating unit for recording the distances at different positions acquired by measurement results of different preset paths, and generating corresponding data files.
  • the data processing device further includes an alarm unit, wherein the alarm unit is configured to alarm when the distance exceeds a preset value range.
  • the substrate is an array substrate
  • an edge of the display area is an edge of an outermost gate line on the array substrate facing away from a center of the array substrate or an outermost data line back on the array substrate To the edge of the center of the array substrate.
  • the detecting device of the display panel assembly provided by the present application calculates the distance between the light reflectance change at the first position and the reflectance change at the second position, thereby not only realizing the automatic detection of the alignment film coating effect, but also improving the productivity. It can also improve the measurement accuracy and solve the error caused by human measurement.
  • FIG. 1 is a schematic diagram of a detecting device for a display panel assembly according to an embodiment of the present application
  • FIG. 2 is a schematic diagram of an array substrate provided by an embodiment of the present application.
  • Figure 3 is an enlarged schematic view of the inner portion of the broken line frame of Figure 2;
  • FIG. 4 is a schematic view showing alignment film coating detection of the array substrate of FIG. 3;
  • FIG. 5 is a schematic diagram showing changes in reflectance obtained by detecting the array substrate of FIG. 3;
  • FIG. 6 is a schematic diagram of a detecting device of a display panel assembly according to an embodiment of the present application.
  • FIG. 1 is a schematic diagram of a detecting device of a display panel assembly according to an embodiment of the present application.
  • the detecting device of the display panel assembly includes:
  • the reflectance measuring device 100 is configured to measure a light reflectance of the display panel assembly along a preset path, the preset path passing through the first position and the second position.
  • the first location and the second location are edges of the display area on the substrate and edges of the alignment film, respectively.
  • the distance measuring device 200 is configured to acquire a distance between the first position and the second position (in one embodiment, an edge of the display area and an edge of the alignment film) according to the measurement data of the reflectance measuring device.
  • the detecting device of the display panel assembly provided by the embodiment of the present application calculates the change in the light reflectance of the first position (for example, the edge of the display area) and the change of the reflectance of the second position (for example, the edge of the alignment film) Distance, not only can achieve automatic inspection of the coating effect of the alignment film Measurement, increase productivity, and improve measurement accuracy to solve the error caused by human measurement.
  • the display panel assembly is a substrate coated with an alignment film
  • the inspection device is an alignment film coating detecting device.
  • the display panel assembly is not limited to only the substrate coated with the alignment film, and may include other display panel assemblies.
  • the display panel assembly is exemplified as a substrate coated with an alignment film.
  • the reflectance measuring device 100 may select a path perpendicular to the edge of the display area as the measured preset path.
  • the edge is the edge of the outermost gate line facing away from the center of the array substrate and the outermost data line facing away from the center of the array substrate.
  • the gate line and the data line are usually made of a metal material having a light transmittance of almost zero such as aluminum, germanium or molybdenum, when the alignment film 320 is formed on the display region 310 of the array substrate 300 as shown in FIG. 2, the array can be formed in the array.
  • Three regions having a large difference in reflectance on the substrate are respectively a region where no metal wires (gate lines or data lines) are provided and which are not covered with an alignment film, and regions which are covered only with an alignment film but are not provided with metal wires, A region in which a metal wire is covered and covered with an alignment film is provided, and reflectances of the three regions are sequentially increased.
  • the distance between the edge of the display region 310 and the edge of the formed alignment film 320 can be measured by utilizing the difference in light reflectance of the above three regions.
  • the reflectance can be measured along the path 400 of the vertically outermost data line 311.
  • the measured starting point can be at a position on the data line 311, and the reflectivity of the plurality of locations on the path 400 can be measured by controlling the relative movement of the reflectance measuring device to the array substrate.
  • the reflectance measuring device may be placed above the outermost data line 311 to control the array substrate to move in a direction perpendicular to the data line 311 (eg, uniform speed).
  • the reflectance measuring device measures the reflectance and transmits the measured reflectance to the distance measuring device.
  • the array substrate is moved at a constant speed and the reflectance measuring device transmits data at equal time intervals.
  • the distance measuring device records the position of the array substrate corresponding to each reflectance data or the time of uniform motion.
  • the current measurement can be
  • the reflectance is compared with the last measured reflectance. If the difference between the two exceeds the preset value, a sudden change in reflectance can be considered.
  • the coordinate data obtained by recording the moving distance of the array substrate is as shown in FIG. 5.
  • the first reflectance mutation occurs when the moving distance is A
  • the second reflectance mutation occurs when the moving distance is B.
  • the position at which the reflectance is measured is the edge of the data line 311
  • the position at which the reflectance is measured is the edge of the alignment film.
  • the distance between the edge of the display region 310 at the position and the edge of the formed alignment film 320 can be obtained by subtracting A from the distance B.
  • the reflectance of the three straight line segments in FIG. 5 is merely exemplary, and the straight line segment may also be a non-linear segment including a reasonable fluctuation range.
  • the reflectance measuring device is configured to measure the light reflectivity on the substrate, which may include:
  • a light emitting unit configured to emit incident light to a position on the preset path
  • a light receiving unit configured to receive reflected light of the position on the preset path
  • a light analyzing unit configured to obtain a light reflectance of the position on the preset path according to the incident light and the reflected light
  • the light emitting unit may be a transmitting probe with a built-in light source, and the incident light is emitted by the light emitting unit, the light receiving unit receives the reflected light, and the light analyzing unit compares the reflected light with the incident light to obtain a light reflectance.
  • the above-described alignment film coating detecting apparatus further includes a microscope lens.
  • the reflectance measuring device and the microscope lens can be integrated into a combined lens in which the light emitting unit is integrated.
  • the relative reflectance can be controlled by controlling the reflectance measuring device or the array substrate to move relative to each other.
  • a moving mechanism can be provided by which the substrate (e.g., uniform velocity) motion is controlled to cause the reflectance measuring device to measure light reflectance at a plurality of locations on the predetermined path.
  • the distance measuring device can calculate the distance between the edge of the display area and the edge of the alignment film by collecting different types of data. For example, you can record each inverse of the measurement
  • a timing unit configured to record the first time and the second time, wherein the first time is a time when the first light reflectance is abruptly changed (ie, a time when the first position passes), and the second time is a second light reflection is measured The moment of the rate mutation (ie, the moment of passing the second position).
  • the first light reflectance mutation occurs at the edge of the display region and the second light reflectance mutation occurs at the edge of the oriented film.
  • the first distance calculating unit is configured to calculate a distance between an edge of the display area and an edge of the alignment film according to the first time, the second time, and a moving speed of the substrate (eg, a uniform speed).
  • the distance measuring device records the position of the array substrate corresponding to each reflectance data by establishing an (X, Y) coordinate system in advance, and the distance measuring device includes:
  • a position obtaining unit configured to record the first coordinate position and the second coordinate position, wherein the first coordinate position is a coordinate position of the substrate when the first light reflectance is abruptly changed, and the second coordinate position is a second light measured The coordinate position of the substrate when the reflectance is abrupt.
  • the first light reflectance mutation occurs at the edge of the display region and the second light reflectance mutation occurs at the edge of the oriented film.
  • a second distance calculating unit configured to calculate a distance between the first position and the second position according to the first coordinate position and the second coordinate position.
  • the second distance calculation unit is configured to calculate a distance between an edge of the display area and an edge of the alignment film.
  • FIG. 6 is a schematic diagram of a detecting apparatus for providing another display panel assembly according to an embodiment of the present application.
  • the detecting device of the display panel assembly includes:
  • the reflectance measuring device 100 is configured to measure the light reflectance along a preset path, and the preset path passes through the first position and the second position.
  • the reflectance measuring device 100 is configured to measure a light reflectivity on a predetermined path on a substrate coated with an alignment film, the predetermined path being perpendicular to an edge of the display region on the substrate and via the display The edge of the region and the edge of the oriented film.
  • the distance measuring device 200 is configured to obtain a distance between the first position and the second position according to the measurement data of the reflectance measuring device. In one embodiment, the distance measuring device 200 is configured to The light reflectance detected by the reflectance measuring device acquires the distance between the edge of the display region and the edge of the alignment film.
  • the data processing device 300 wherein the data processing device includes an information generating unit for recording a distance at different positions acquired by detecting a measurement result of the light reflectance on different preset paths, and generating a corresponding data file .
  • the data processing device includes an information generating unit for recording a distance at different positions acquired by detecting a measurement result of the light reflectance on different preset paths, and generating a corresponding data file .
  • the upper edge, the lower edge, the left edge, and the right edge may be respectively detected, and for each side edge, the detected preset path may be located on the array substrate. Near the center line.
  • the data processing device further includes an alarm unit for alarming when the distance exceeds a preset range of values.
  • the preset value range may be from 0.4 mm to 1.0 mm.
  • a preset numerical range is first set for each of the upper side edge, the lower side edge, the left side edge, and the right side edge, and then each side edge is separately detected.
  • the detection process for each side edge, when the measured data does not exceed the corresponding preset value range, the other edges are continuously detected; if the measured data exceeds the corresponding preset value range, the alarm is passed.
  • the unit performs an alarm and then continues to detect other edges after the user confirms the reset.
  • the corresponding data file is generated. For example, an EXCEL document can be generated.
  • the application provides a detecting device of a display panel assembly and a detecting method of the display panel assembly.
  • the display panel is a liquid crystal display panel
  • the display panel assembly is a substrate coated with an alignment film.
  • This embodiment provides an alignment film coating detecting device using light reflectance change and alignment film at the edge of the display region. The change of the reflectance of the edge calculates the distance between the two, which not only can automatically detect the coating effect of the alignment film, improve the productivity, but also improve the measurement accuracy and solve the error caused by the human measurement.
  • the display panel assembly of the present application includes not only substrates coated with an alignment film but also other display panel assemblies.

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Abstract

一种显示面板组件的检测设备和显示面板组件的检测方法，该显示面板组件的检测设备包括：反射率测量装置（100），用于沿着预设路径（400）测量显示面板组件的光反射率，所述预设路径（400）经过第一位置和第二位置；距离测量装置（200），用于根据所述反射率测量装置（100）的测量数据获取所述第一位置与所述第二位置之间的距离，其中，在所述第一位置和所述第二位置分别有光反射率突变。

Description

显示面板组件的检测设备和显示面板组件的检测方法
相关申请的交叉引用
本申请要求于2015年08月28日递交的中国专利申请第201510543412.4号的优先权，在此全文引用上述中国专利申请公开的内容以作为本申请的一部分。
技术领域
本申请涉及显示领域，尤其涉及一种显示面板组件的检测设备和显示面板组件的检测方法。
背景技术
液晶显示面板(TFT-LCD)具有显示质量高、功耗低、无辐射等优点，近几年发展十分迅速，并在各个领域得到了广泛的应用。现有的液晶显示面板主要包括阵列基板、彩膜基板和液晶层。在现有的液晶显示面板制作工艺中，需要在彩膜基板以及阵列基板(TFT基板)上涂敷一层取向膜，并在取向膜上形成取向沟槽来使液晶分子取向、旋转而进行光的传递，从而实现显示。
现有的取向膜涂敷工艺主要采取APR版转印技术将取向液涂敷在基板上。然而，在取向液的固化过程中，取向液边缘会形成一层厚度不均的区域。为了确保基板上显示区域厚度一致和图像显示质量，在涂敷完成后，需要人工对涂敷效果进行测试，要保证面板的有效区域全部涂敷取向膜，并使厚度不均的区域距离基板上的显示区域大于预设距离(如0.1mm)，传统的取向膜涂敷效果检测方法具体为：在显微镜下通过人为的移动镜头，通过在显示屏的成像来测量取向膜边缘的距离，。然而，由于上述检测方法主要采用人工手动进行检测，无法实现自动化作业，不利于产能的提高。
在其它显示面板领域，也存在类似的组件检测的问题。
发明内容
本申请提供了实现取向膜涂敷效果的自动化检测的方案。
在一个方面，本申请的技术方案提供了一种显示面板组件的检测设备，包括：
反射率测量装置，用于沿着预设路径测量显示面板组件的的光反射率，所述预设路径经过第一位置和第二位置；
距离测量装置，用于根据所述反射率测量装置的测量数据获取所述第一位置和所述第二位置之间的距离；
其中，在所述第一位置和所述第二位置分别有光反射率突变。
在一种实施例方式中，所述显示面板组件为具有取向膜和显示区域的基板，所述第一位置为所述显示区域的边缘，所述第二位置为所述取向膜的边缘；
可选地，所述反射率测量装置包括：
光发射单元，用于向所述预设路径上的位置发射入射光；
光接收单元，用于接收所述预设路径上的所述位置的反射光；
光分析单元，用于根据所述入射光和所述反射光得到所述预设路径上的所述位置的光反射率。
可选地，所述检测设备还包括显微镜镜头。
可选地，所述光发射单元集成在所述显微镜镜头中。
可选地，还包括移动机构，用于控制所述基板的运动。
可选地，所述距离测量装置包括：
计时单元，用于记录第一时刻和第二时刻，所述第一时刻为测量到第一光反射率突变时的时刻，所述第二时刻为测量到发生第二光反射率突变时的时刻；
第一距离计算单元，用于根据所述第一时刻、所述第二时刻以及所述基板的运动速度计算所述第一位置与所述第二位置之间的距离。
可选地，所述距离测量装置包括：
位置获取单元，用于记录第一坐标位置和第二坐标位置，并且其中， 所述第一坐标位置为测量到第一光反射率突变时的基板的第一坐标位置，第二坐标位置为测量到第二光反射率突变时的所述基板的第二坐标位置；
第二距离计算单元，用于根据所述第一坐标位置和所述第二坐标位置计算所述第一位置与所述第二位置之间的距离。
可选地，所述检测设备还包括数据处理装置，所述数据处理装置包括信息生成单元，所述信息生成单元用于记录通过在不同的所述预设路径的测量数据从而获取的不同位置处的所述距离，并生成相应的数据文件。
可选地，所述数据处理装置还包括报警单元，所述报警单元用于当所述距离超出预设数值范围时报警。
可选地，所述基板为阵列基板，所述显示区域的边缘为所述阵列基板上最外侧的栅线背向所述阵列基板中心的边缘或者为所述阵列基板上最外侧的数据线背向所述阵列基板中心的边缘。
在另一个方面，本申请的技术方案提供了一种显示面板组件的检测方法，包括：
提供反射率测量装置；
沿着预设路径测量显示面板组件的光反射率，所述预设路径经过第一和第二位置；
提供距离测量装置；
根据所述反射率测量装置的测量数据获取所述第一位置和所述第二位置之间的距离；
其中，在所述第一位置和所述第二位置分别有光反射率突变。
在一种实施方式中，所述显示面板组件为涂敷有取向膜的基板，
所述第一位置为所述基板上的显示区域的边缘，所述第二位置为所述取向膜的边缘。
可选地，提供反射率测量装置包括：
提供光发射单元，以向所述预设路径上的位置发射入射光；
提供光接收单元，以接收所述预设路径上的所述位置的反射光；
提供光分析单元，以根据所述入射光和所述反射光得到所述预设路径 上的所述位置的光反射率。
可选地，所述检测方法，还包括提供移动机构，以控制所述基板的运动。
可选地，其中提供距离测量装置包括：
提供计时单元，以记录第一时刻和第二时刻，所述第一时刻为测量到第一光反射率突变的时刻，所述第二时刻为测量到第二光反射率突变的时刻；
提供第一距离计算单元，以根据所述第一时刻、所述第二时刻以及所述基板的运动速度计算所述第一位置与所述第二位置之间的距离。
可选地，提供距离测量装置还包括：
提供位置获取单元，以记录第一坐标位置和第二坐标位置，并且其中，所述第一坐标位置为测量到第一光反射率突变时的所述基板的坐标位置，第二坐标位置为测量到第二光反射率突变时的所述基板的坐标位置；
第二距离计算单元，以根据所述第一坐标位置和所述第二坐标位置计算所述第一位置与所述第二位置之间的距离。
可选地，所述检测方法，还包括提供数据处理装置，
所述数据处理装置包括信息生成单元，所述信息生成单元用于记录通过在不同的所述预设路径的测量结果从而获取的不同位置处的所述距离，并生成相应的数据文件。
可选地，所述数据处理装置还包括报警单元，所述报警单元用于当所述距离超出预设数值范围时报警。
可选地，所述基板为阵列基板，所述显示区域的边缘为所述阵列基板上最外侧的栅线背向所述阵列基板中心的边缘或者为所述阵列基板上最外侧的数据线背向所述阵列基板中心的边缘。
本申请提供的显示面板组件的检测设备，利用第一位置的光反射率变化和第二位置的反射率变化计算两者之间的距离，不但能够实现取向膜涂敷效果的自动检测，提高产能，还能提高测量精度，解决人为测量带来的误差。
附图说明
图1是本申请实施方式提供的一种显示面板组件的检测设备的示意图；
图2是本申请实施方式提供的一种阵列基板的示意图；
图3是图2中虚线框内部分的放大示意图；
图4是对图3中阵列基板进行取向膜涂敷检测的示意图；
图5是对图3中阵列基板进行检测得到的反射率变化示意图；
图6是本申请实施方式提供的一种显示面板组件的检测设备的示意图。
具体实施方式
下面结合附图和实施例，对本申请的具体实施方式作进一步详细描述。以下实施例用于说明本申请，但不用来限制本申请的范围。应当知道，以下描述的附图仅仅涉及本公开的一些实施例，而非对本公开的限制。对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获得其他的附图。
图1是根据本申请实施方式提供的一种显示面板组件的检测设备的示意图。该显示面板组件的检测设备包括：
反射率测量装置100，用于沿着预设路径测量显示面板组件的光反射率，所述预设路径经过第一位置和第二位置。在一个实施例中，第一位置和第二位置分别为基板上显示区域的边缘和取向膜的边缘。
距离测量装置200，用于根据所述反射率测量装置的测量数据获取第一位置和第二位置(在一个实施例中，显示区域的边缘和所述取向膜的边缘)之间的距离。
本申请实施方式提供的显示面板组件的检测设备，利用第一位置(例如，显示区域边缘)的光反射率变化和第二位置(例如，取向膜边缘)的反射率变化计算两者之间的距离，不但能够实现取向膜涂敷效果的自动检 测，提高产能，还能提高测量精度，解决人为测量带来的误差。
在一个实施例中，显示面板组件为涂敷有取向膜的基板，该检测设备为取向膜涂敷检测设备。需要指出，显示面板组件并非仅限制于涂敷有取向膜的基板，也可包括其它显示面板组件。以下以显示面板组件为涂敷有取向膜的基板进行示例性说明。
可选地，反射率测量装置100可以选取垂直于显示区域的边缘的路径作为测量的预设路径。
例如，对于阵列基板，其上设置有多条纵横交错的栅线和数据线，通过该多条纵横交错的栅线和数据线在阵列基板上形成显示区域。因此，对于阵列基板上用于显示的显示区域，其边缘即为位于最外侧的栅线背向阵列基板中心的边缘以及最外侧的数据线背向阵列基板中心的边缘。并且由于栅线和数据线通常采用铝、钕或钼等光透过率几乎为零的金属材料，当如图2所示在阵列基板300的显示区域310上形成取向膜320后，能够在阵列基板上形成反射率差异较大的三种区域，分别为未设置有金属线(栅线或数据线)且未覆盖有取向膜的区域、仅覆盖有取向膜但未设置有金属线的区域、设置有金属线且覆盖有取向膜的区域，且三种区域的反射率依次增大。通过利用上述三种区域的光反射率不同可以测量显示区域310的边缘与形成的取向膜320的边缘之间的距离。
图3是图2中虚线框330内的放大示意图。如图3所示，可以沿垂直最外侧的数据线311的路径400测量反射率。测量的起始点可以在数据线311上的位置，通过控制反射率测量装置与阵列基板的相对移动，从而测量路径400上多个位置的反射率。例如，可以如图4所示，将反射率测量装置放置于最外侧数据线311的上方，控制阵列基板沿垂直于数据线311的方向(例如，匀速)运动。在运动过程中，反射率测量装置(例如，可以等时间间隔)测量反射率，并将测量的反射率发送至距离测量装置。
以下，以阵列基板匀速运动、反射率测量装置以等时间间隔发送数据为例子进行示例性说明。距离测量装置记录测量每一反射率数据所对应的阵列基板的位置或者匀速运动的时间。在测量的过程中，可以将当前测得 的反射率与上次测得的反射率进行比较，若两者之间的差值超过预设值，则可认为发生反射率突变。例如，通过记录阵列基板的移动距离而得到的坐标数据如图5所示。
如图5所示，在阵列基板的运动过程中，在移动距离为A时发生了第一次反射率突变，在移动距离为B时发生了第二次反射率突变。通过上述分析可知，当阵列基板移动距离为A时，其测量反射率的位置为数据线311的边缘，当移动距离为B时，其测量反射率的位置为取向膜的边缘。通过将距离B减去A从而能够得到该位置处显示区域310的边缘与形成的取向膜320的边缘之间的距离。需要说明，图5中反射率为三条直线段仅是示例性的，直线段也可以为包括合理波动范围的非直线段。
其中，在本实施方式中，反射率测量装置用于测量基板上的光反射率，其可以包括：
光发射单元，用于向所述预设路径上的位置发射入射光；
光接收单元，用于接收所述预设路径上的所述位置的反射光；
光分析单元，用于根据所述入射光和所述反射光得到所述预设路径上的所述位置的光反射率；
例如，上述光发射单元可以为内置光源的发射探头，通过光发射单元发出入射光，光接收单元接受反射光，再由光分析单元将反射光和入射光对比，从而能够得到光反射率。
可选地，为了还能方便人为控制测试反射率的位置，上述取向膜涂敷检测设备还包括显微镜镜头。例如，可以将反射率测量装置与显微镜镜头集成为综合镜头，将光发射单元集成在该显微镜镜头中。
其中，为了能够测试预设路径上多个位置的光反射率，可以通过控制反射率测量装置或者阵列基板移动，从而使两者发生相对运动。例如，可以设置移动机构，通过该移动机构控制所述基板(例如，匀速)运动以使所述反射率测量装置测量所述预设路径上多个位置的光反射率。
其中，在本申请中，距离测量装置可以通过采集不同类型的数据计算显示区域的边缘与取向膜的边缘之间的距离。例如，可以记录测量每一反 射率数据所对应的阵列基板(例如，匀速)运动的时间，该距离测量装置包括：
计时单元，用于记录第一时刻和第二时刻，其中第一时刻为测量到第一光反射率突变的时刻(即，经过第一位置的时刻)，第二时刻为测量到第二光反射率突变的时刻(即，经过第二位置的时刻)。在一个实施例中，第一光反射率突变发生在显示区域的边缘，第二光反射率突变发生在取向膜的边缘。
第一距离计算单元，用于根据第一时刻、第二时刻以及基板的(例如，匀速)运动速度计算所述显示区域的边缘与所述取向膜的边缘之间的距离。
此外，还可以通过预先建立(X，Y)坐标系，使距离测量装置记录测量每一反射率数据所对应的阵列基板的位置，该距离测量装置包括：
位置获取单元，用于记录第一坐标位置和第二坐标位置，其中，第一坐标位置为测量到第一光反射率突变时的基板的坐标位置，时第二坐标位置为测量到第二光反射率突变时的基板的坐标位置。在一个实施例中，第一光反射率突变发生在显示区域的边缘，第二光反射率突变发生在取向膜的边缘。
第二距离计算单元，用于根据第一坐标位置和第二坐标位置来计算第一位置和第二位置的距离。在一个实施例中，第二距离计算单元用于计算所述显示区域的边缘与所述取向膜的边缘之间的距离。
参见图6，图6是本申请实施方式的提供了另一种显示面板组件的检测设备的示意图。该显示面板组件的检测设备包括：
反射率测量装置100，用于沿着预设路径测量光反射率，预设路径经过第一位置和第二位置。在一个实施例中，反射率测量装置100用于测量涂敷有取向膜的基板上预设路径上的光反射率，所述预设路径垂直所述基板上显示区域的边缘且经所述显示区域的边缘和所述取向膜的边缘。
距离测量装置200，用于根据反射率测量装置的测量数据获取第一位置和第二位置之间的距离。在一个实施例中，距离测量装置200用于根据 反射率测量装置检测的光反射率获取显示区域的边缘与取向膜的边缘之间的距离。
数据处理装置300，其中，数据处理装置包括信息生成单元，信息生成单元用于记录通过在不同的预设路径检测光反射率的测量结果从而获取的不同位置处的距离，并生成相应的数据文件。例如，对于图2所示的阵列基板，可以对其上侧边缘、下侧边缘、左侧边缘及右侧边缘分别进行检测，并且对于每一侧边缘，检测的预设路径可以位于阵列基板的中线附近。
可选地，所述数据处理装置还包括报警单元，用于当所述距离超出预设数值范围时报警。例如，对于阵列基板，该预设数值范围可以为0.4mm～1.0mm。
例如，对于图2所示的阵列基板，首先对上侧边缘、下侧边缘、左侧边缘及右侧边缘中的每一侧边缘设置预设数值范围，而后分别对每一侧边缘进行检测。在检测过程中，对于每一个侧边缘，当其测量的数据未超出对应的预设数值范围时，继续对其他边缘进行检测；若其测量的数据超出对应的预设数值范围时，则通过报警单元进行报警，再通过用户确认复位后继续对其他边缘进行检测。待所有边缘的数据测试完毕后生成相应的数据文件，例如，可以生成EXCEL文档。
本申请提供一种显示面板组件的检测设备和显示面板组件的检测方法。在一种实施方式中，显示面板为液晶显示面板，显示面板组件为涂敷有取向膜的基板，该实施方式提供取向膜涂敷检测设备，利用显示区域边缘处的光反射率变化和取向膜边缘的反射率变化计算两者之间的距离，不但能够实现取向膜涂敷效果的自动检测，提高产能，还能提高测量精度，解决人为测量带来的误差。本领域技术人员可以知晓，本申请的显示面板组件不仅仅包括涂敷有取向膜的基板，也包括其它显示面板组件。
以上实施方式仅用于说明本申请，而并非对本申请的限制，有关技术领域的普通技术人员，在不脱离本申请的精神和范围的情况下，还可以做出各种变化和变型，因此所有等同的技术方案也属于本申请的范畴，本申 请的专利保护范围应由权利要求限定。

Claims (20)

  1. 一种显示面板组件的检测设备，包括：
    反射率测量装置，用于沿着预设路径测量显示面板组件的光反射率，所述预设路径经过第一位置和第二位置；
    距离测量装置，用于根据所述反射率测量装置的测量数据获取所述第一位置和所述第二位置之间的距离；
    其中，在所述第一位置和所述第二位置分别有光反射率突变。
  2. 根据权利要求1所述的检测设备，其中，所述显示面板组件为具有有取向膜和显示区域的基板，所述第一位置为所述显示区域的边缘，所述第二位置为所述取向膜的边缘。
  3. 根据权利要求2所述的显示面板组件的检测设备，其中，所述反射率测量装置包括：
    光发射单元，用于向所述预设路径上的位置发射入射光；
    光接收单元，用于接收所述预设路径上的所述位置的反射光；
    光分析单元，用于根据所述入射光和所述反射光得到所述预设路径上的所述位置的光反射率。
  4. 根据权利要求3所述的显示面板组件的检测设备，还包括显微镜镜头。
  5. 根据权利要求4所述的显示面板组件的检测设备，其中，所述光发射单元集成在所述显微镜镜头中。
  6. 根据权利要求2所述的显示面板组件的检测设备，其中，还包括移动机构，用于控制所述基板的运动。
  7. 根据权利要求6所述的显示面板组件的检测设备，其中，所述距离测量装置包括：
    计时单元，用于记录第一时刻和第二时刻，所述第一时刻为测量到第一光反射率突变的时刻，所述第二时刻为测量到第二光反射率突变的时刻；
    第一距离计算单元，用于根据所述第一时刻、所述第二时刻以及所述 基板的运动速度计算所述第一位置与所述第二位置之间的距离。
  8. 根据权利要求6所述的显示面板组件的检测设备，其中，所述距离测量装置包括：
    位置获取单元，用于记录第一坐标位置和第二坐标位置，并且其中，所述第一坐标位置为测量到第一光反射率突变时的所述基板的坐标位置，第二坐标位置为测量到第二光反射率突变时的所述基板的坐标位置；
    第二距离计算单元，用于根据所述第一坐标位置和所述第二坐标位置计算所述第一位置与所述第二位置之间的距离。
  9. 根据权利要求2所述的显示面板组件的检测设备，还包括数据处理装置，所述数据处理装置包括信息生成单元，所述信息生成单元用于记录通过在不同的所述预设路径的测量数据从而获取的不同位置处的所述距离，并生成相应的数据文件。
  10. 根据权利要求9所述的显示面板组件的检测设备，其中，所述数据处理装置还包括报警单元，所述报警单元用于当所述距离超出预设数值范围时报警。
  11. 根据权利要求2-10中的任一所述的显示面板组件的检测设备，其中，所述基板为阵列基板，所述显示区域的边缘为所述阵列基板上最外侧的栅线背向所述阵列基板中心的边缘或者为所述阵列基板上最外侧的数据线背向所述阵列基板中心的边缘。
  12. 一种显示面板组件的检测方法，包括：
    提供反射率测量装置；
    沿着预设路径测量显示面板组件的光反射率，所述预设路径经过第一和第二位置；
    提供距离测量装置；
    根据所述反射率测量装置的测量数据获取所述第一位置和所述第二位置之间的距离；
    其中，在所述第一位置和所述第二位置分别有光反射率突变。
  13. 根据权利要求12所述的检测方法，其中，
    所述显示面板组件为涂敷有取向膜的基板，
    所述第一位置为所述基板上的显示区域的边缘，所述第二位置为所述取向膜的边缘。
  14. 根据权利要求13所述的检测方法，其中提供反射率测量装置包括：
    提供光发射单元，以向所述预设路径上的位置发射入射光；
    提供光接收单元，以接收所述预设路径上的所述位置的反射光；
    提供光分析单元，以根据所述入射光和所述反射光得到所述预设路径上的所述位置的光反射率。
  15. 根据权利要求14所述的检测方法，还包括提供移动机构，以控制所述基板的运动。
  16. 根据权利要求15所述的检测方法，其中提供距离测量装置包括：
    提供计时单元，以记录第一时刻和第二时刻，所述第一时刻为测量到第一光反射率突变的时刻，所述第二时刻为测量到第二光反射率突变的时刻；
    提供第一距离计算单元，以根据所述第一时刻、所述第二时刻以及所述基板的运动速度计算所述第一位置与所述第二位置之间的距离。
  17. 根据权利要求16所述的检测方法，其中提供距离测量装置还包括：
    提供位置获取单元，以记录第一坐标位置和第二坐标位置，并且其中，所述第一坐标位置为测量到第一光反射率突变时的所述基板的坐标位置，第二坐标位置为测量到第二光反射率突变时的所述基板的坐标位置；
    第二距离计算单元，以根据所述第一坐标位置和所述第二坐标位置计算所述第一位置与所述第二位置之间的距离。
  18. 根据权利要求17所述的检测方法，还包括提供数据处理装置，
    所述数据处理装置包括信息生成单元，所述信息生成单元用于记录通过在不同的所述预设路径的测量结果从而获取的不同位置处的所述距离，并生成相应的数据文件。
  19. 根据权利要求18所述的检测方法，其中所述数据处理装置还包括报警单元，所述报警单元用于当所述距离超出预设数值范围时报警。
  20. 根据权利要求13-10中的任一项所述的检测方法，其中，所述基板为阵列基板，所述显示区域的边缘为所述阵列基板上最外侧的栅线背向所述阵列基板中心的边缘或者为所述阵列基板上最外侧的数据线背向所述阵列基板中心的边缘。
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