CN103681707A - 具有固定电位输出晶体管的图像传感器 - Google Patents
具有固定电位输出晶体管的图像传感器 Download PDFInfo
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- CN103681707A CN103681707A CN201310168391.3A CN201310168391A CN103681707A CN 103681707 A CN103681707 A CN 103681707A CN 201310168391 A CN201310168391 A CN 201310168391A CN 103681707 A CN103681707 A CN 103681707A
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
- H01L27/14612—Pixel-elements with integrated switching, control, storage or amplification elements involving a transistor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14641—Electronic components shared by two or more pixel-elements, e.g. one amplifier shared by two pixel elements
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/50—Control of the SSIS exposure
- H04N25/53—Control of the integration time
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/50—Control of the SSIS exposure
- H04N25/53—Control of the integration time
- H04N25/531—Control of the integration time by controlling rolling shutters in CMOS SSIS
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/50—Control of the SSIS exposure
- H04N25/53—Control of the integration time
- H04N25/532—Control of the integration time by controlling global shutters in CMOS SSIS
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N25/771—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising storage means other than floating diffusion
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- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Abstract
Description
Claims (19)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/599,343 US8817154B2 (en) | 2012-08-30 | 2012-08-30 | Image sensor with fixed potential output transistor |
US13/599,343 | 2012-08-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN103681707A true CN103681707A (zh) | 2014-03-26 |
CN103681707B CN103681707B (zh) | 2016-12-28 |
Family
ID=50187069
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201310168391.3A Active CN103681707B (zh) | 2012-08-30 | 2013-05-09 | 具有固定电位输出晶体管的图像传感器 |
Country Status (3)
Country | Link |
---|---|
US (1) | US8817154B2 (zh) |
CN (1) | CN103681707B (zh) |
TW (1) | TWI507039B (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108288623A (zh) * | 2017-01-09 | 2018-07-17 | 三星电子株式会社 | 图像传感器 |
Families Citing this family (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2009133967A2 (en) * | 2008-05-02 | 2009-11-05 | Canon Kabushiki Kaisha | Solid-state imaging apparatus |
JP5984018B2 (ja) * | 2013-02-21 | 2016-09-06 | ソニー株式会社 | 固体撮像素子、および撮像装置 |
US9293500B2 (en) | 2013-03-01 | 2016-03-22 | Apple Inc. | Exposure control for image sensors |
US9276031B2 (en) | 2013-03-04 | 2016-03-01 | Apple Inc. | Photodiode with different electric potential regions for image sensors |
US9741754B2 (en) | 2013-03-06 | 2017-08-22 | Apple Inc. | Charge transfer circuit with storage nodes in image sensors |
US9549099B2 (en) | 2013-03-12 | 2017-01-17 | Apple Inc. | Hybrid image sensor |
US9319611B2 (en) | 2013-03-14 | 2016-04-19 | Apple Inc. | Image sensor with flexible pixel summing |
US9369648B2 (en) * | 2013-06-18 | 2016-06-14 | Alexander Krymski | Image sensors, methods, and pixels with tri-level biased transfer gates |
US9596423B1 (en) | 2013-11-21 | 2017-03-14 | Apple Inc. | Charge summing in an image sensor |
US9596420B2 (en) | 2013-12-05 | 2017-03-14 | Apple Inc. | Image sensor having pixels with different integration periods |
US9473706B2 (en) | 2013-12-09 | 2016-10-18 | Apple Inc. | Image sensor flicker detection |
US10285626B1 (en) | 2014-02-14 | 2019-05-14 | Apple Inc. | Activity identification using an optical heart rate monitor |
US9232150B2 (en) | 2014-03-12 | 2016-01-05 | Apple Inc. | System and method for estimating an ambient light condition using an image sensor |
US9277144B2 (en) | 2014-03-12 | 2016-03-01 | Apple Inc. | System and method for estimating an ambient light condition using an image sensor and field-of-view compensation |
US9584743B1 (en) | 2014-03-13 | 2017-02-28 | Apple Inc. | Image sensor with auto-focus and pixel cross-talk compensation |
TWI643500B (zh) * | 2014-03-31 | 2018-12-01 | 日商新力股份有限公司 | 攝像元件、攝像方法及電子機器 |
WO2015153806A1 (en) | 2014-04-01 | 2015-10-08 | Dartmouth College | Cmos image sensor with pump gate and extremely high conversion gain |
US9497397B1 (en) | 2014-04-08 | 2016-11-15 | Apple Inc. | Image sensor with auto-focus and color ratio cross-talk comparison |
US9538106B2 (en) | 2014-04-25 | 2017-01-03 | Apple Inc. | Image sensor having a uniform digital power signature |
US9686485B2 (en) | 2014-05-30 | 2017-06-20 | Apple Inc. | Pixel binning in an image sensor |
KR102275711B1 (ko) * | 2014-11-17 | 2021-07-09 | 삼성전자주식회사 | 이미지 센서 및 이미지 센서의 데이터 출력 방법 |
KR102363433B1 (ko) | 2015-01-15 | 2022-02-16 | 삼성전자주식회사 | 이미지 센서 |
US10103187B2 (en) * | 2015-12-17 | 2018-10-16 | Omnivision Technologies, Inc. | Image sensor color correction |
US9912883B1 (en) | 2016-05-10 | 2018-03-06 | Apple Inc. | Image sensor with calibrated column analog-to-digital converters |
US10438987B2 (en) | 2016-09-23 | 2019-10-08 | Apple Inc. | Stacked backside illuminated SPAD array |
US10656251B1 (en) | 2017-01-25 | 2020-05-19 | Apple Inc. | Signal acquisition in a SPAD detector |
CN110235024B (zh) | 2017-01-25 | 2022-10-28 | 苹果公司 | 具有调制灵敏度的spad检测器 |
US10962628B1 (en) | 2017-01-26 | 2021-03-30 | Apple Inc. | Spatial temporal weighting in a SPAD detector |
US10622538B2 (en) | 2017-07-18 | 2020-04-14 | Apple Inc. | Techniques for providing a haptic output and sensing a haptic input using a piezoelectric body |
US10440301B2 (en) | 2017-09-08 | 2019-10-08 | Apple Inc. | Image capture device, pixel, and method providing improved phase detection auto-focus performance |
US11019294B2 (en) | 2018-07-18 | 2021-05-25 | Apple Inc. | Seamless readout mode transitions in image sensors |
US10848693B2 (en) | 2018-07-18 | 2020-11-24 | Apple Inc. | Image flare detection using asymmetric pixels |
JP7333562B2 (ja) * | 2018-08-23 | 2023-08-25 | 国立大学法人東北大学 | 光センサ及びその信号読み出し方法並びに光エリアセンサ及びその信号読み出し方法 |
US11233966B1 (en) | 2018-11-29 | 2022-01-25 | Apple Inc. | Breakdown voltage monitoring for avalanche diodes |
US11563910B2 (en) | 2020-08-04 | 2023-01-24 | Apple Inc. | Image capture devices having phase detection auto-focus pixels |
US11546532B1 (en) | 2021-03-16 | 2023-01-03 | Apple Inc. | Dynamic correlated double sampling for noise rejection in image sensors |
CN115567791A (zh) * | 2022-08-02 | 2023-01-03 | 中国电子科技集团公司第四十四研究所 | 一种大阵列高速读出帧转移ccd图像传感器 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070272828A1 (en) * | 2006-05-24 | 2007-11-29 | Micron Technology, Inc. | Method and apparatus providing dark current reduction in an active pixel sensor |
US20100013972A1 (en) * | 2008-07-16 | 2010-01-21 | Adkisson James W | Pixel sensor cell with frame storage capability |
CN102224730A (zh) * | 2008-12-08 | 2011-10-19 | 索尼公司 | 像素电路、固态摄像器件和相机系统 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7728896B2 (en) * | 2005-07-12 | 2010-06-01 | Micron Technology, Inc. | Dual conversion gain gate and capacitor and HDR combination |
US20070035649A1 (en) * | 2005-08-10 | 2007-02-15 | Micron Technology, Inc. | Image pixel reset through dual conversion gain gate |
-
2012
- 2012-08-30 US US13/599,343 patent/US8817154B2/en active Active
-
2013
- 2013-04-18 TW TW102113841A patent/TWI507039B/zh active
- 2013-05-09 CN CN201310168391.3A patent/CN103681707B/zh active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070272828A1 (en) * | 2006-05-24 | 2007-11-29 | Micron Technology, Inc. | Method and apparatus providing dark current reduction in an active pixel sensor |
US20100013972A1 (en) * | 2008-07-16 | 2010-01-21 | Adkisson James W | Pixel sensor cell with frame storage capability |
CN102224730A (zh) * | 2008-12-08 | 2011-10-19 | 索尼公司 | 像素电路、固态摄像器件和相机系统 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108288623A (zh) * | 2017-01-09 | 2018-07-17 | 三星电子株式会社 | 图像传感器 |
CN108288623B (zh) * | 2017-01-09 | 2023-05-09 | 三星电子株式会社 | 图像传感器 |
Also Published As
Publication number | Publication date |
---|---|
US8817154B2 (en) | 2014-08-26 |
TWI507039B (zh) | 2015-11-01 |
US20140063304A1 (en) | 2014-03-06 |
TW201410021A (zh) | 2014-03-01 |
CN103681707B (zh) | 2016-12-28 |
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