CN103646923A - 一种晶圆级基板微通孔电镀方法 - Google Patents

一种晶圆级基板微通孔电镀方法 Download PDF

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CN103646923A
CN103646923A CN201310706420.7A CN201310706420A CN103646923A CN 103646923 A CN103646923 A CN 103646923A CN 201310706420 A CN201310706420 A CN 201310706420A CN 103646923 A CN103646923 A CN 103646923A
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hole
substrate
micro
wafer scale
plating method
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王莉
谢海忠
刘志强
伊晓燕
郭恩卿
王军喜
李晋闽
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76838Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
    • H01L21/76877Filling of holes, grooves or trenches, e.g. vias, with conductive material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76838Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
    • H01L21/76841Barrier, adhesion or liner layers
    • H01L21/76871Layers specifically deposited to enhance or enable the nucleation of further layers, i.e. seed layers
    • H01L21/76873Layers specifically deposited to enhance or enable the nucleation of further layers, i.e. seed layers for electroplating
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76838Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
    • H01L21/76877Filling of holes, grooves or trenches, e.g. vias, with conductive material
    • H01L21/76883Post-treatment or after-treatment of the conductive material
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D7/00Electroplating characterised by the article coated
    • C25D7/12Semiconductors

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  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Electroplating Methods And Accessories (AREA)
  • Electrodes Of Semiconductors (AREA)

Abstract

本发明公开了一种晶圆级基板微通孔电镀方法,包括:化学清洗并高温酸洗带微通孔的基板;其中基板上带有通孔,高温酸洗后过PI和无水乙醇;晶圆级基板一面蒸镀金属引导层;金属引导层表面粘贴绝缘层;外电源阳极与金属引导层相连接后,将所述基板放入硫酸铜溶液,直到基板背面通孔顶部冒出为止;去掉绝缘层,并将去掉绝缘层的面与陶瓷盘固定,减薄机抛光突出部分;去除陶瓷盘,完成微通孔电镀。

Description

一种晶圆级基板微通孔电镀方法
技术领域
本发明属于半导体技术领域,特别是一种晶圆级基板微通孔电镀方法。
背景技术
半导体发光二极管照明是新一代固体冷光源,具有低能耗、寿命长、易控制、安全环保等特点,是理想的节能环保产品,适用各种照明场所。半导体发光二极管封装向轻、薄、短、微型化的发展趋势,要求封装基板、封装材料的空间、体积向更小型化发展,晶圆级封装技术已经成为发展的必然趋势。半导体发光二极管封装后的功能、可靠性很大程度上取决于直接金属化、微盲填充及通孔金属化的品质。电镀填充微通孔、盲孔是一种简单实用的技术。电镀是指在含有欲镀金属的盐类溶液中,以被镀基体金属为阴极,通过电解作用,使镀液中欲镀金属的阳离子在基体金属表面沉积出来,形成镀层的一种表面加工方法。镀层性能不同于基体金属,具有新的特征。根据镀层的功能分为防护性镀层,装饰性镀层及其它功能性镀层。
发明内容
本发明的主要目的在于提供一种晶圆级基板微通孔电镀方法,其是在发光二极管芯片工艺制作中,对氮化镓基发光二极管衬底用激光加工成横向光子晶体,可以大大提高出光效率,使得发光二极管外量子效率提升,特别适合大尺寸功率型晶粒的制作。
为达到上述目的,本发明提供一种晶圆级基板微通孔电镀方法,包括一下步骤:
步骤1:化学清洗并高温酸洗带微通孔的基板;其中基板上带有通孔,高温酸洗后过PI和无水乙醇;
步骤2:晶圆级基板一面蒸镀金属引导层;
步骤3:金属引导层表面粘贴绝缘层;
步骤3:外电源阳极与金属引导层相连接后,将所述基板放入硫酸铜溶液,直到基板背面通孔顶部冒出为止;
步骤4:去掉绝缘层,并将去掉绝缘层的面与陶瓷盘固定,减薄机抛光突出部分;
步骤5:去除陶瓷盘,完成微通孔电镀。
本发明通过引进一层绝缘覆盖层,覆盖在金属上方,引导在电镀过程中,电镀液的金属离子附着在通孔内壁。常规做法是,在通孔内壁溅射金属层,然后使电镀液的金属离子附着在侧壁金属的表面,从而使通孔内有金属。本发明简单,成本低,操作工艺灵活,提高了劳动生产率。
附图说明
图1是本发明提出的晶圆级基板微通孔电镀方法的流程图;
图2是本发明中晶圆级基板的结构剖面图。
具体实施方式
为使本发明的目的、技术方案和优点更加清楚明白,以下结合具体实施例,并参照附图,对本发明作进一步的详细说明。
请参阅图1、图2及所示,本发明提供了一种晶圆级基板微通孔电镀方法,包括一下步骤:
步骤1:化学清洗并高温酸洗带微通孔的晶圆级基板21;其中基板21上带有通孔22,高温酸洗后过PI和无水乙醇;其中基板21的材料为蓝宝石、Si、SiC、GaAs、GaN衬底、有机塑料或玻璃,其中通孔22的形状为圆柱形、倒锥形、V形或矩形通孔,通孔22的深度与基板厚度相同。一种晶圆级基板微通孔电镀方法,其中高温酸的温度范围是100度-400度,酸的成分是浓硫酸:浓磷酸=3:1。
步骤2:晶圆级基板21一面蒸镀金属引导层23;其中金属引导层可以是镍、银、铂、铬、钛等金属材料,厚度可以是100纳米至2微米。
步骤3:金属引导层23表面粘贴绝缘层24;其中绝缘层可以是氧化硅、氮化硅、或者氧化硅和氮化硅的复合层,还可以是聚酰亚胺、塑料薄膜、陶瓷等绝缘材料。厚度是20微米至2毫米。本发明通过引进一层绝缘覆盖层,覆盖在金属上方,引导在电镀过程中,电镀液的金属离子附着在通孔内壁。常规做法是,在通孔内壁溅射金属层,然后使电镀液的金属离子附着在侧壁金属的表面,从而使通孔内有金属,常规工艺需要一台单独的溅射设备制作通孔内璧的金属层,溅射设备价格昂贵且工艺复杂。本发明不需要溅射金属引导层,并且制作方法简单,成本低,操作工艺灵活,提高了劳动生产率。
步骤3:外电源阳极与金属引导层23相连接;基板放入硫酸铜溶液,直到基板背面通孔顶部冒出为止;
步骤4:去掉绝缘层24,将去掉绝缘层24的面与陶瓷盘固定,减薄机抛光突出部分;
步骤5:去除陶瓷盘,完成微通孔电镀;
以上所述的具体实施例,对本发明的目的、技术方案和有益效果进行了进一步详细说明,应理解的是,以上所述仅为本发明的具体实施例而已,并不用于限制本发明,凡在本发明的精神和原则之内,所做的任何修改、等同替换、改进等,均应包含在本发明的保护范围之内。

Claims (5)

1.一种晶圆级基板微通孔电镀方法,包括一下步骤:
步骤1:化学清洗并高温酸洗带微通孔的基板;其中基板上带有通孔,高温酸洗后过PI和无水乙醇;
步骤2:晶圆级基板一面蒸镀金属引导层;
步骤3:金属引导层表面粘贴绝缘层;
步骤3:外电源阳极与金属引导层相连接后,将所述基板放入硫酸铜溶液,直到基板背面通孔顶部冒出为止;
步骤4:去掉绝缘层,并将去掉绝缘层的面与陶瓷盘固定,减薄机抛光突出部分;
步骤5:去除陶瓷盘,完成微通孔电镀。
2.根据权利要求1所述的一种晶圆级基板微通孔电镀方法,其中基板的材料为蓝宝石、Si、SiC、GaAs、GaN衬底、有机塑料或玻璃,其中通孔的形状为圆柱形、倒锥形、V形或矩形通孔,通孔的深度与基板厚度相同。
3.根据权利要求1所述的一种晶圆级基板微通孔电镀方法,其中高温酸的温度范围是100度-400度,酸的成分是浓硫酸:浓磷酸=3:1。
4.根据权利要求1所述的一种晶圆级基板微通孔电镀方法,其中金属引导层是镍、银、铂、铬或钛,厚度是100纳米至2微米。
5.根据权利要求1所述的一种晶圆级基板微通孔电镀方法,其中绝缘层是聚酰亚胺、塑料薄膜、陶瓷、氧化硅、氮化硅、或者氧化硅和氮化硅的复合层,厚度是20微米至2毫米。
CN201310706420.7A 2013-12-19 2013-12-19 一种晶圆级基板微通孔电镀方法 Pending CN103646923A (zh)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105428504A (zh) * 2015-12-23 2016-03-23 陕西华经微电子股份有限公司 一种led光源封装用厚膜陶瓷支架的制备方法
CN110634792A (zh) * 2019-09-26 2019-12-31 上海航天电子通讯设备研究所 一种电气互连基板制造方法

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* Cited by examiner, † Cited by third party
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US6375823B1 (en) * 1999-02-10 2002-04-23 Kabushiki Kaisha Toshiba Plating method and plating apparatus
US20050077630A1 (en) * 2003-10-09 2005-04-14 Kirby Kyle K. Methods of plating via interconnects
US20110284936A1 (en) * 2010-05-18 2011-11-24 Samsung Electronics Co., Ltd Semiconductor device and method of fabricating the same
CN103258810A (zh) * 2013-05-10 2013-08-21 江苏物联网研究发展中心 一种减少硅通孔电镀铜后晶圆表面过电镀的方法
US20130260556A1 (en) * 2012-03-27 2013-10-03 International Business Machines Corporation Bottom-up plating of through-substrate vias

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6375823B1 (en) * 1999-02-10 2002-04-23 Kabushiki Kaisha Toshiba Plating method and plating apparatus
US20050077630A1 (en) * 2003-10-09 2005-04-14 Kirby Kyle K. Methods of plating via interconnects
US20110284936A1 (en) * 2010-05-18 2011-11-24 Samsung Electronics Co., Ltd Semiconductor device and method of fabricating the same
US20130260556A1 (en) * 2012-03-27 2013-10-03 International Business Machines Corporation Bottom-up plating of through-substrate vias
CN103258810A (zh) * 2013-05-10 2013-08-21 江苏物联网研究发展中心 一种减少硅通孔电镀铜后晶圆表面过电镀的方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105428504A (zh) * 2015-12-23 2016-03-23 陕西华经微电子股份有限公司 一种led光源封装用厚膜陶瓷支架的制备方法
CN105428504B (zh) * 2015-12-23 2017-12-29 陕西华经微电子股份有限公司 一种led光源封装用厚膜陶瓷支架的制备方法
CN110634792A (zh) * 2019-09-26 2019-12-31 上海航天电子通讯设备研究所 一种电气互连基板制造方法

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Application publication date: 20140319