CN103506927A - Polisher loading block - Google Patents
Polisher loading block Download PDFInfo
- Publication number
- CN103506927A CN103506927A CN201310516196.5A CN201310516196A CN103506927A CN 103506927 A CN103506927 A CN 103506927A CN 201310516196 A CN201310516196 A CN 201310516196A CN 103506927 A CN103506927 A CN 103506927A
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- CN
- China
- Prior art keywords
- material containing
- piece
- containing piece
- polishing machine
- sample
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B29/00—Machines or devices for polishing surfaces on work by means of tools made of soft or flexible material with or without the application of solid or liquid polishing agents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/06—Work supports, e.g. adjustable steadies
Abstract
The invention discloses a polisher loading block. The polisher loading block comprises a loading block body and a thickness regulating device which are connected with each other, wherein the thickness regulating device is used for quantitatively regulating the extended thicknesses of samples corresponding to the loading block body. The polisher loading block uses the thickness regulating device to quantitatively regulate the extended thicknesses of the samples corresponding to the loading block body, so that the purposes of synchronously polishing the samples with different thicknesses and quantitatively regulating the polishing thicknesses can be achieved; in addition, the treatment is simple before the samples are polished, and the heating and the cooling are needless, so that the time is saved, and the efficiency is improved.
Description
Technical field
The present invention relates to precise polished technical field, relate in particular to a kind of polishing machine material containing piece.
Background technology
Precise grinding polisher, as machine glazed finish, is the higher a kind of process technology of machining accuracy in various finishing methods.Precise finiss polishing adopts special material containing piece, in containing the polishing fluid of abrasive material, be pressed on workpiece, make workpiece do high speed rotary motion on grinding block surface, workpiece is driven and to be done traverse motion by workbench, makes the polished surface of workpiece form extremely complicated, even fine and closely woven movement locus again.But, in process of lapping, due to the effect of tonnage and frictional force, easily produce workpiece positioning, even cause disengaging grinding block.For this reason, need a kind of motive power can bear work time, and can fix the fixture of workpiece, to improve polishing stable, further improve crudy.On the other hand, in research work, the character such as the workpiece of the polished processing of many needs or the shape of sample, hardness, thickness are all had any different, and this just requires more meticulous to the material containing piece of polishing machine.
Conventional precise polished airborne material piece is cylindrical metal piece, and upper bottom surface is plane.During use, material containing piece and polished sample need to be heated to 80 ℃ of left and right simultaneously, then paraffin rod be coated in to material containing piece surface and polished sample is sticked together on its surface.After sample and fixture are cooled to room temperature, can be placed on polishing machine abrasive disk sample is carried out to polishing.Existing this material containing piece has following major defect: before (1), polishing, need heating and cooling material containing piece, bother and lose time.(2), this material containing piece can only process the sample that thickness is identical, otherwise will be not steady because of bottom surface, cause sample even depart from grinding block separated with material containing piece.(3), can not realize the quantitative adjusting of polishing thickness.
Summary of the invention
The present invention is directed to the complicated operation that exists in prior art, can not process and regulate the technical problem of the sample of different-thickness, thereby a kind of polishing machine material containing piece is provided.
Above-mentioned technical problem of the present invention is mainly solved by following technical proposals:
Polishing machine material containing piece of the present invention, comprises interconnective material containing piece main body and thickness adjusting apparatus, the thickness that described thickness adjusting apparatus stretches out with respect to described material containing piece main body for quantitative adjusting sample.
Further, described material containing piece main body comprises that described sample cell is being connected in described material containing piece base of piece activity admittedly, and form the first sample cell with described material containing piece base with the material containing piece base of middle guide hole and the solid piece of sample cell.
Further, on described material containing piece base side wall, be also provided with the first adjusting fixing hole.
Further, described material containing piece base consists of a stainless steel substrates and an aluminium flake, and described stainless steel substrates and aluminium flake are mutually permanently connected.
Further, the solid piece of described sample cell comprises the solid piece of large sample groove and the solid piece of small sample groove, and piece is inner admittedly for the described large sample groove that is connected in of the solid piece activity of described small sample groove, and forms the second sample cell with the solid piece of described large sample groove.
Further, described large sample Cao Gukuai top has depth adjustment hole, has the second adjusting fixing hole on its sidewall.
Further, described thickness adjusting apparatus comprises trimmer, connecting rod and micrometer, described connecting rod is also connected with described trimmer, micrometer respectively through the middle guide hole of described material containing piece base, and wherein, described micrometer is fixed on described material containing piece base.
Further, the connected mode of described trimmer and connecting rod is detachable.
Further, the material of described trimmer is lucite, and it is shaped as circle.
Compared with prior art, the invention has the advantages that: the thickness that utilizes thickness adjusting apparatus quantitative adjusting sample to stretch out with respect to material containing piece main body, to reach the sample of the different-thickness of polishing simultaneously, and can quantitatively regulate the object of polishing thickness, meanwhile, simple in sample polishing pre-treatment, do not need heating and cooling, save the time, improved efficiency.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, to the accompanying drawing of required use in embodiment or description of the Prior Art be briefly described below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skills, do not paying under the prerequisite of creative work, can also obtain according to these accompanying drawings other accompanying drawing.
Fig. 1 is the structural representation of polishing machine material containing piece of the present invention;
Fig. 2 is the structural representation of the material containing piece main body of polishing machine material containing piece of the present invention;
Fig. 3 be polishing machine material containing piece of the present invention material containing piece base partly cut open figure;
Fig. 4 is the structural representation of the solid piece of sample cell of polishing machine material containing piece of the present invention.
The specific embodiment
Below in conjunction with accompanying drawing, the preferred embodiments of the present invention are described in detail, thereby so that advantages and features of the invention can be easier to be it will be appreciated by those skilled in the art that, protection scope of the present invention are made to more explicit defining.
Consult shown in Fig. 1-3, polishing machine material containing piece provided by the invention, comprises interconnective material containing piece main body and thickness adjusting apparatus, the thickness that thickness adjusting apparatus stretches out with respect to material containing piece main body for quantitative adjusting sample.Wherein, material containing piece main body comprises that sample cell is being connected in described material containing piece base 3 of piece 2 activities admittedly with the material containing piece base 3 of middle guide hole 32 and the solid piece 2 of sample cell, and forms the first sample cells 31 with material containing piece base 3.For the ease of quick adjustment and increasing work efficiency, preferred, the quantity of the first sample cell 31 is four, and is uniformly distributed in a circumferential direction.On material containing piece base 3 sidewalls, be also provided with the first adjusting fixing hole 34.Its quantity is corresponding one by one with the quantity of the first sample cell 31.The solid piece 2 of sample cell is adjusted behind position in material containing piece base 3, by a screw, through first, regulates the solid piece 2 of 34 pairs of sample cells of fixing hole to be fixed.Material containing piece base 3 consists of a stainless steel substrates and an aluminium flake, and stainless steel substrates and aluminium flake pass hole 33 by screw and be fixed connection.
Consult shown in Fig. 4, the solid piece 2 of sample cell comprises the solid piece 21 of large sample groove and the solid piece 22 of small sample groove, solid piece 22 activities of small sample groove be connected in the solid piece of large sample groove 21 inside.Preferably, the solid piece of large sample groove 21 crown center positions have depth adjustment hole 24, have the second adjusting fixing hole 23 on its sidewall.Utilize iron wire or screw etc. to adjust the solid piece 22 of small sample groove with respect to the height of the solid piece 21 of large sample groove by depth adjustment hole 24, and through second, regulate the solid piece 22 of 23 pairs of small sample grooves of fixing hole to carry out fastening by a screw.It is in order to form the second different sample cell 25 of another diameter with the solid piece 22 of small sample groove that the solid piece 21 of large sample groove is set, and the polishing that is applicable to different size sample is ground.
Thickness adjusting apparatus of the present invention comprises trimmer 4, connecting rod 5 and micrometer 1, and connecting rod 5 is also connected with trimmer 4, micrometer 1 respectively through the middle guide hole 32 of material containing piece base 3, and wherein, micrometer 1 is fixed on material containing piece base 3.The connected mode of trimmer 4 and connecting rod 5 is detachable.Preferably, connecting rod 5 and trimmer 4 are threaded connection.For the ease of observing the state of sample, the material of trimmer 4 is lucite, and its shape matches with the shape of material containing piece base 3, all adopts circle.
The course of work below in conjunction with polishing machine material containing piece is further introduced the present invention:
First the sample thin slice of well cutting is fixed on to glass wafer (conform to the first sample cell 31 sizes, can buy) surface with epoxy resin or other cementing agent, and by a side of the mother glass sheet n.s preparing in the first sample cell 31.Trimmer 4 is screwed in to the screwed side of connecting rod 5, regulates trimmer 4 apart from the distance of material containing piece base 3 afterwards by micrometer 1, this distance is the thickness of sample polishing.The lucite adopting due to trimmer 4 is transparent, whether naked eyes can contact plexiglass cover by confirmatory sample, thus, control the consistency of thickness that the sample in four the first sample cells 31 exposes, effectively prevent material containing piece shakiness and sample positioning in polishing process, because the first sample cell 31 itself has certain depth, a sheet glass water that is stained with sample just can be attached in the first sample cell 31, can not come off.
Adjust after sample exposes thickness, tighten the screw in the first adjusting fixing hole 34, the solid piece 2 of fastening sample cell.And back out trimmer 4, by regulating micrometer 1 that connecting rod 5 is screwed back in material containing piece base 1 and can carry out polishing.While utilizing the different sample of the second sample cell 25 polishing diameters, its work engineering with adopt the mode of the first sample cell 31 basic identical, repeat no more herein.
In sum, this material containing piece can be realized and process 4 samples simultaneously, has greatly improved the operating efficiency of polishing machine.Its adjustable sample exposes the function of material containing piece body thickness, not only can realize the sample of simultaneously processing different physical properties, and has greatly improved the stability of polishing.Meanwhile, the polishing that two kinds of sample cell internal diameters can be realized the different different size samples that need is ground.
The above, be only the specific embodiment of the present invention, but protection scope of the present invention is not limited to this, and any variation of expecting without creative work or replacement, within all should being encompassed in protection scope of the present invention.Therefore, protection scope of the present invention should be as the criterion with the protection domain that claims were limited.
Claims (9)
1. a polishing machine material containing piece, is characterized in that: comprise interconnective material containing piece main body and thickness adjusting apparatus, the thickness that described thickness adjusting apparatus stretches out with respect to described material containing piece main body for quantitative adjusting sample.
2. polishing machine material containing piece according to claim 1, it is characterized in that: described material containing piece main body comprises with the material containing piece base (3) of middle guide hole (32) and the solid piece (2) of sample cell, movable being connected in described material containing piece base (3) of the solid piece (2) of described sample cell, and form the first sample cell (31) with described material containing piece base (3).
3. polishing machine material containing piece according to claim 2, is characterized in that: on described material containing piece base (3) sidewall, be also provided with the first adjusting fixing hole (34).
4. according to the polishing machine material containing piece described in claim 2 or 3 any one, it is characterized in that: described material containing piece base (3) consists of a stainless steel substrates and an aluminium flake, and described stainless steel substrates and aluminium flake are mutually permanently connected.
5. polishing machine material containing piece according to claim 2, it is characterized in that: the solid piece (2) of described sample cell comprises the solid piece (21) of large sample groove and the solid piece (22) of small sample groove, the described large sample groove that is connected in that it is movable that described small sample groove is consolidated piece (22) is consolidated piece (21) inside, and forms the second sample cell (25) with the solid piece (21) of described large sample groove.
6. polishing machine material containing piece according to claim 5, is characterized in that: the solid piece (21) of described large sample groove top has depth adjustment hole (24), has the second adjusting fixing hole (23) on its sidewall.
7. polishing machine material containing piece according to claim 2, it is characterized in that: described thickness adjusting apparatus comprises trimmer (4), connecting rod (5) and micrometer (1), described connecting rod (5) is also connected with described trimmer (4), micrometer (1) respectively through the middle guide hole (32) of described material containing piece base (3), wherein, described micrometer (1) is fixed on described material containing piece base (3).
8. polishing machine material containing piece according to claim 7, is characterized in that: the connected mode of described trimmer (4) and connecting rod (5) is detachable.
9. polishing machine material containing piece according to claim 7, is characterized in that: the material of described trimmer (4) is lucite, and it is shaped as circle.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310516196.5A CN103506927B (en) | 2013-10-28 | 2013-10-28 | A kind of polishing machine material containing block |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310516196.5A CN103506927B (en) | 2013-10-28 | 2013-10-28 | A kind of polishing machine material containing block |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103506927A true CN103506927A (en) | 2014-01-15 |
| CN103506927B CN103506927B (en) | 2015-12-02 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310516196.5A Expired - Fee Related CN103506927B (en) | 2013-10-28 | 2013-10-28 | A kind of polishing machine material containing block |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103506927B (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105223060A (en) * | 2015-10-29 | 2016-01-06 | 西北工业大学 | A kind of simple and easy grinding tool |
| CN105606422A (en) * | 2016-01-26 | 2016-05-25 | 西北工业大学 | Multifunctional grinding tool |
| WO2019100461A1 (en) * | 2017-11-23 | 2019-05-31 | 北京创昱科技有限公司 | Multi-chip thickness compensation device for single-sided polishing, and grinding device, and grinding method |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02131864A (en) * | 1988-11-14 | 1990-05-21 | Toshiba Corp | Fitting jig for polishing work |
| US20070228628A1 (en) * | 2005-01-11 | 2007-10-04 | Mitsubishi Electric Corporation | Semiconductor Manufacturing Apparatus |
| CN201237566Y (en) * | 2008-06-20 | 2009-05-13 | 北京科技大学 | Metallographic specimen clamper capable of saving polishing liquid |
| CN201537844U (en) * | 2009-07-01 | 2010-08-04 | 中国科学院物理研究所 | Manual precise grinding polisher for preparing TEM sample |
| CN102519778A (en) * | 2011-12-26 | 2012-06-27 | 北京工业大学 | Device convenient for grinding and polishing transmission electron microscope sample |
| CN202770690U (en) * | 2012-09-02 | 2013-03-06 | 大连理工大学 | Grinding clamp controllable in grinding amount |
| CN103231305A (en) * | 2013-05-09 | 2013-08-07 | 苏州金牛精密机械有限公司 | Plunger grinding fixture |
| CN203696722U (en) * | 2013-10-28 | 2014-07-09 | 中国科学院地球化学研究所 | Loading block of polishing machine |
-
2013
- 2013-10-28 CN CN201310516196.5A patent/CN103506927B/en not_active Expired - Fee Related
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02131864A (en) * | 1988-11-14 | 1990-05-21 | Toshiba Corp | Fitting jig for polishing work |
| US20070228628A1 (en) * | 2005-01-11 | 2007-10-04 | Mitsubishi Electric Corporation | Semiconductor Manufacturing Apparatus |
| CN201237566Y (en) * | 2008-06-20 | 2009-05-13 | 北京科技大学 | Metallographic specimen clamper capable of saving polishing liquid |
| CN201537844U (en) * | 2009-07-01 | 2010-08-04 | 中国科学院物理研究所 | Manual precise grinding polisher for preparing TEM sample |
| CN102519778A (en) * | 2011-12-26 | 2012-06-27 | 北京工业大学 | Device convenient for grinding and polishing transmission electron microscope sample |
| CN202770690U (en) * | 2012-09-02 | 2013-03-06 | 大连理工大学 | Grinding clamp controllable in grinding amount |
| CN103231305A (en) * | 2013-05-09 | 2013-08-07 | 苏州金牛精密机械有限公司 | Plunger grinding fixture |
| CN203696722U (en) * | 2013-10-28 | 2014-07-09 | 中国科学院地球化学研究所 | Loading block of polishing machine |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105223060A (en) * | 2015-10-29 | 2016-01-06 | 西北工业大学 | A kind of simple and easy grinding tool |
| CN105223060B (en) * | 2015-10-29 | 2018-01-09 | 西北工业大学 | A kind of simple grinding tool |
| CN105606422A (en) * | 2016-01-26 | 2016-05-25 | 西北工业大学 | Multifunctional grinding tool |
| WO2019100461A1 (en) * | 2017-11-23 | 2019-05-31 | 北京创昱科技有限公司 | Multi-chip thickness compensation device for single-sided polishing, and grinding device, and grinding method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103506927B (en) | 2015-12-02 |
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| CF01 | Termination of patent right due to non-payment of annual fee |