CN103424419B - 具有自适应扫描的扫描显微镜 - Google Patents
具有自适应扫描的扫描显微镜 Download PDFInfo
- Publication number
- CN103424419B CN103424419B CN201310181310.3A CN201310181310A CN103424419B CN 103424419 B CN103424419 B CN 103424419B CN 201310181310 A CN201310181310 A CN 201310181310A CN 103424419 B CN103424419 B CN 103424419B
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Classifications
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical, image processing or photographic arrangements associated with the tube
- H01J37/222—Image processing arrangements associated with the tube
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/261—Details
- H01J37/265—Controlling the tube; circuit arrangements adapted to a particular application not otherwise provided, e.g. bright-field-dark-field illumination
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N7/00—Television systems
- H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07K—PEPTIDES
- C07K14/00—Peptides having more than 20 amino acids; Gastrins; Somatostatins; Melanotropins; Derivatives thereof
- C07K14/415—Peptides having more than 20 amino acids; Gastrins; Somatostatins; Melanotropins; Derivatives thereof from plants
-
- C—CHEMISTRY; METALLURGY
- C12—BIOCHEMISTRY; BEER; SPIRITS; WINE; VINEGAR; MICROBIOLOGY; ENZYMOLOGY; MUTATION OR GENETIC ENGINEERING
- C12N—MICROORGANISMS OR ENZYMES; COMPOSITIONS THEREOF; PROPAGATING, PRESERVING, OR MAINTAINING MICROORGANISMS; MUTATION OR GENETIC ENGINEERING; CULTURE MEDIA
- C12N15/00—Mutation or genetic engineering; DNA or RNA concerning genetic engineering, vectors, e.g. plasmids, or their isolation, preparation or purification; Use of hosts therefor
- C12N15/09—Recombinant DNA-technology
- C12N15/63—Introduction of foreign genetic material using vectors; Vectors; Use of hosts therefor; Regulation of expression
- C12N15/79—Vectors or expression systems specially adapted for eukaryotic hosts
- C12N15/82—Vectors or expression systems specially adapted for eukaryotic hosts for plant cells, e.g. plant artificial chromosomes (PACs)
- C12N15/8241—Phenotypically and genetically modified plants via recombinant DNA technology
- C12N15/8242—Phenotypically and genetically modified plants via recombinant DNA technology with non-agronomic quality (output) traits, e.g. for industrial processing; Value added, non-agronomic traits
- C12N15/8243—Phenotypically and genetically modified plants via recombinant DNA technology with non-agronomic quality (output) traits, e.g. for industrial processing; Value added, non-agronomic traits involving biosynthetic or metabolic pathways, i.e. metabolic engineering, e.g. nicotine, caffeine
- C12N15/8247—Phenotypically and genetically modified plants via recombinant DNA technology with non-agronomic quality (output) traits, e.g. for industrial processing; Value added, non-agronomic traits involving biosynthetic or metabolic pathways, i.e. metabolic engineering, e.g. nicotine, caffeine involving modified lipid metabolism, e.g. seed oil composition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/26—Electron or ion microscopes
- H01J2237/28—Scanning microscopes
- H01J2237/2813—Scanning microscopes characterised by the application
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Microscoopes, Condenser (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/474176 | 2012-05-17 | ||
| US13/474,176 US9041793B2 (en) | 2012-05-17 | 2012-05-17 | Scanning microscope having an adaptive scan |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103424419A CN103424419A (zh) | 2013-12-04 |
| CN103424419B true CN103424419B (zh) | 2019-08-06 |
Family
ID=48366268
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310181310.3A Active CN103424419B (zh) | 2012-05-17 | 2013-05-16 | 具有自适应扫描的扫描显微镜 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US9041793B2 (enExample) |
| EP (1) | EP2665083A3 (enExample) |
| JP (1) | JP6479303B2 (enExample) |
| CN (1) | CN103424419B (enExample) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102007045897A1 (de) * | 2007-09-26 | 2009-04-09 | Carl Zeiss Microimaging Gmbh | Verfahren zur mikroskopischen dreidimensionalen Abbildung einer Probe |
| CN104641222A (zh) * | 2012-05-29 | 2015-05-20 | 麦考瑞大学 | 用于发光显微成像的双向扫描 |
| EP2879156A1 (en) * | 2013-12-02 | 2015-06-03 | Fei Company | Charged-particle microscopy with enhanced electron detection |
| US9502211B1 (en) | 2015-05-03 | 2016-11-22 | Fei Company | Adaptive scanning for particle size using directed beam signal analysis |
| US10535131B2 (en) * | 2015-11-18 | 2020-01-14 | Kla-Tencor Corporation | Systems and methods for region-adaptive defect detection |
| JP6522535B2 (ja) * | 2016-02-29 | 2019-05-29 | 富士フイルム株式会社 | 細胞観察装置および方法 |
| WO2018089839A1 (en) | 2016-11-10 | 2018-05-17 | The Trustees Of Columbia University In The City Of New York | Rapid high-resolution imaging methods for large samples |
| WO2019078813A1 (en) * | 2017-10-16 | 2019-04-25 | Hewlett-Packard Development Company, L.P. | 3D PRINTER |
| EP3598474A1 (en) | 2018-07-19 | 2020-01-22 | FEI Company | Adaptive specimen image acquisition using an artificial neural network |
| US20200118786A1 (en) * | 2018-10-15 | 2020-04-16 | Applied Materials, Inc. | System and method for selective autofocus |
| US11164721B2 (en) | 2019-03-28 | 2021-11-02 | Massachusetts Institute Of Technology | System and method for learning-guided electron microscopy |
| CN113804918B (zh) * | 2021-08-30 | 2023-12-26 | 广州大学 | 基于感兴趣区域的电化学扫描成像方法、装置及介质 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102207472A (zh) * | 2010-03-31 | 2011-10-05 | Fei公司 | 用于观察特征的自动化片状铣削 |
Family Cites Families (34)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0340351A (ja) * | 1989-07-05 | 1991-02-21 | Nippon Steel Corp | 析出物の解析方法および装置 |
| JP3037006B2 (ja) * | 1992-12-25 | 2000-04-24 | 日本電子株式会社 | 走査電子顕微鏡における自動画像調整方法 |
| US5435850A (en) | 1993-09-17 | 1995-07-25 | Fei Company | Gas injection system |
| US5851413A (en) | 1996-06-19 | 1998-12-22 | Micrion Corporation | Gas delivery systems for particle beam processing |
| JPH1092367A (ja) * | 1996-07-24 | 1998-04-10 | Jeol Ltd | 走査電子顕微鏡 |
| US6579653B1 (en) * | 1999-03-03 | 2003-06-17 | Matsushita Electric Industrial Co., Ltd. | Binding resin for toner, toner, and electrophotograph |
| JP2001304842A (ja) * | 2000-04-25 | 2001-10-31 | Hitachi Ltd | パターン検査方法及びその装置並びに基板の処理方法 |
| JP3943022B2 (ja) * | 2000-12-01 | 2007-07-11 | 株式会社荏原製作所 | 基板検査装置 |
| AU2002312182A1 (en) * | 2001-05-30 | 2002-12-09 | Nptest, Inc. | Sub-resolution alignment of images |
| EP1425729B1 (en) | 2001-08-23 | 2014-06-11 | Fei Company | Graphical automated machine control and metrology |
| WO2004013658A2 (en) * | 2002-07-30 | 2004-02-12 | Deutsches Krebsforschungszentrum | Method and apparatus for multiple labeling detection and evaluation of a plurality of particles |
| JP4249453B2 (ja) * | 2002-09-25 | 2009-04-02 | 大日本印刷株式会社 | Sem画像における特徴量算出方法 |
| WO2004044596A2 (en) * | 2002-11-12 | 2004-05-27 | Fei Company | Defect analyzer |
| US7496228B2 (en) * | 2003-06-13 | 2009-02-24 | Landwehr Val R | Method and system for detecting and classifying objects in images, such as insects and other arthropods |
| JP4587742B2 (ja) * | 2004-08-23 | 2010-11-24 | 株式会社日立ハイテクノロジーズ | 荷電粒子線顕微方法及び荷電粒子線応用装置 |
| US7348556B2 (en) | 2005-07-19 | 2008-03-25 | Fei Company | Method of measuring three-dimensional surface roughness of a structure |
| US20070031043A1 (en) * | 2005-08-02 | 2007-02-08 | Perz Cynthia B | System for and method of intelligently directed segmentation analysis for automated microscope systems |
| JP5600371B2 (ja) * | 2006-02-15 | 2014-10-01 | エフ・イ−・アイ・カンパニー | 荷電粒子ビーム処理のための保護層のスパッタリング・コーティング |
| JP4734148B2 (ja) * | 2006-03-14 | 2011-07-27 | 株式会社日立ハイテクノロジーズ | 試料観察方法,画像処理装置、及び荷電粒子線装置 |
| JP5147327B2 (ja) * | 2007-07-31 | 2013-02-20 | 株式会社日立ハイテクノロジーズ | 荷電粒子ビーム照射装置 |
| US8064678B2 (en) * | 2007-10-22 | 2011-11-22 | Genetix Corporation | Automated detection of cell colonies and coverslip detection using hough transforms |
| JP5296413B2 (ja) * | 2008-05-15 | 2013-09-25 | 株式会社日立ハイテクサイエンス | 複合荷電粒子ビーム装置を用いた断面画像取得方法および複合荷電粒子ビーム装置 |
| US20090296073A1 (en) * | 2008-05-28 | 2009-12-03 | Lam Research Corporation | Method to create three-dimensional images of semiconductor structures using a focused ion beam device and a scanning electron microscope |
| JP5066056B2 (ja) * | 2008-10-31 | 2012-11-07 | 株式会社日立ハイテクノロジーズ | 試料観察方法、及び電子顕微鏡 |
| EP2433293B1 (en) * | 2009-05-20 | 2013-09-04 | Carl Zeiss Microscopy, LLC | Scan method |
| US9123502B2 (en) * | 2009-05-20 | 2015-09-01 | Carl Zeiss Microscopy, Llc | Scan method |
| JP5739119B2 (ja) * | 2009-09-15 | 2015-06-24 | 株式会社日立ハイテクサイエンス | 断面加工観察装置 |
| JP5292348B2 (ja) * | 2010-03-26 | 2013-09-18 | 株式会社日立ハイテクノロジーズ | 複合荷電粒子線装置 |
| JP2011233466A (ja) * | 2010-04-30 | 2011-11-17 | Jeol Ltd | 電子顕微鏡の分解能評価方法、プログラム、及び情報記憶媒体 |
| JP5690086B2 (ja) * | 2010-07-02 | 2015-03-25 | 株式会社キーエンス | 拡大観察装置 |
| EP2416165A1 (en) | 2010-08-04 | 2012-02-08 | FEI Company | Method of forming a 3D reconstruction of a sample using a scanning probe microscope |
| JP5396350B2 (ja) * | 2010-08-31 | 2014-01-22 | 株式会社日立ハイテクノロジーズ | 画像形成装置、及びコンピュータプログラム |
| US9275441B2 (en) * | 2011-04-12 | 2016-03-01 | Tripath Imaging, Inc. | Method for preparing quantitative video-microscopy and associated system |
| EP2584362A1 (en) | 2011-10-18 | 2013-04-24 | FEI Company | Scanning method for scanning a sample with a probe |
-
2012
- 2012-05-17 US US13/474,176 patent/US9041793B2/en active Active
-
2013
- 2013-05-07 JP JP2013097243A patent/JP6479303B2/ja active Active
- 2013-05-16 EP EP13167952.4A patent/EP2665083A3/en not_active Withdrawn
- 2013-05-16 CN CN201310181310.3A patent/CN103424419B/zh active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102207472A (zh) * | 2010-03-31 | 2011-10-05 | Fei公司 | 用于观察特征的自动化片状铣削 |
Non-Patent Citations (1)
| Title |
|---|
| The role of cold work and applied stress on surface oxidation of 304 stainless steel;Sergio Lozano-Perez et al.;《Corrosion Science》;20111211;第56卷;第1-3页 |
Also Published As
| Publication number | Publication date |
|---|---|
| US9041793B2 (en) | 2015-05-26 |
| EP2665083A3 (en) | 2016-04-06 |
| JP6479303B2 (ja) | 2019-03-06 |
| US20130307957A1 (en) | 2013-11-21 |
| EP2665083A2 (en) | 2013-11-20 |
| CN103424419A (zh) | 2013-12-04 |
| JP2013243128A (ja) | 2013-12-05 |
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| GR01 | Patent grant | ||
| GR01 | Patent grant |