CN103380479B - 飞行时间型质量分析装置 - Google Patents

飞行时间型质量分析装置 Download PDF

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Publication number
CN103380479B
CN103380479B CN201180068055.0A CN201180068055A CN103380479B CN 103380479 B CN103380479 B CN 103380479B CN 201180068055 A CN201180068055 A CN 201180068055A CN 103380479 B CN103380479 B CN 103380479B
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ion
reflector
potential
time
electric field
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CN103380479A (zh
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绢川亨
古桥治
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Shimadzu Corp
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Shimadzu Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/40Time-of-flight spectrometers
    • H01J49/405Time-of-flight spectrometers characterised by the reflectron, e.g. curved field, electrode shapes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/40Time-of-flight spectrometers
    • H01J49/403Time-of-flight spectrometers characterised by the acceleration optics and/or the extraction fields

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
CN201180068055.0A 2010-12-20 2011-12-20 飞行时间型质量分析装置 Active CN103380479B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2010-283187 2010-12-20
JP2010283187 2010-12-20
PCT/JP2011/079471 WO2012086630A1 (ja) 2010-12-20 2011-12-20 飛行時間型質量分析装置

Publications (2)

Publication Number Publication Date
CN103380479A CN103380479A (zh) 2013-10-30
CN103380479B true CN103380479B (zh) 2016-01-20

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CN201180068055.0A Active CN103380479B (zh) 2010-12-20 2011-12-20 飞行时间型质量分析装置

Country Status (5)

Country Link
US (1) US8772708B2 (enExample)
EP (2) EP2669930B1 (enExample)
JP (2) JP5629928B2 (enExample)
CN (1) CN103380479B (enExample)
WO (1) WO2012086630A1 (enExample)

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2908329B1 (en) * 2012-10-10 2022-01-12 Shimadzu Corporation Time-of-flight mass spectrometer
JP6292319B2 (ja) * 2014-12-24 2018-03-14 株式会社島津製作所 飛行時間型質量分析装置
US10621042B2 (en) * 2014-12-31 2020-04-14 Pure Storage, Inc. Vault transformation within a dispersed storage network
GB201507363D0 (en) 2015-04-30 2015-06-17 Micromass Uk Ltd And Leco Corp Multi-reflecting TOF mass spectrometer
GB201520130D0 (en) 2015-11-16 2015-12-30 Micromass Uk Ltd And Leco Corp Imaging mass spectrometer
GB201520134D0 (en) 2015-11-16 2015-12-30 Micromass Uk Ltd And Leco Corp Imaging mass spectrometer
GB201520540D0 (en) 2015-11-23 2016-01-06 Micromass Uk Ltd And Leco Corp Improved ion mirror and ion-optical lens for imaging
JP2017098142A (ja) 2015-11-26 2017-06-01 株式会社島津製作所 イオン照射装置及び該装置を用いた表面分析装置
JP6468370B2 (ja) * 2016-01-12 2019-02-13 株式会社島津製作所 飛行時間型質量分析装置
JP6346973B2 (ja) * 2016-04-19 2018-06-20 亨 絹川 飛行時間型質量分析装置
GB201613988D0 (en) 2016-08-16 2016-09-28 Micromass Uk Ltd And Leco Corp Mass analyser having extended flight path
GB2558221B (en) * 2016-12-22 2022-07-20 Micromass Ltd Ion mobility separation exit transmission control
GB2567794B (en) 2017-05-05 2023-03-08 Micromass Ltd Multi-reflecting time-of-flight mass spectrometers
GB2563571B (en) 2017-05-26 2023-05-24 Micromass Ltd Time of flight mass analyser with spatial focussing
US11817303B2 (en) 2017-08-06 2023-11-14 Micromass Uk Limited Accelerator for multi-pass mass spectrometers
US11049712B2 (en) 2017-08-06 2021-06-29 Micromass Uk Limited Fields for multi-reflecting TOF MS
US11081332B2 (en) 2017-08-06 2021-08-03 Micromass Uk Limited Ion guide within pulsed converters
WO2019030472A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov IONIC MIRROR FOR MULTI-REFLECTION MASS SPECTROMETERS
US11211238B2 (en) 2017-08-06 2021-12-28 Micromass Uk Limited Multi-pass mass spectrometer
WO2019030476A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov INJECTION OF IONS IN MULTI-PASSAGE MASS SPECTROMETERS
EP3662502A1 (en) 2017-08-06 2020-06-10 Micromass UK Limited Printed circuit ion mirror with compensation
GB2568354B (en) * 2017-09-28 2022-08-10 Bruker Daltonics Gmbh & Co Kg Wide-range high mass resolution in reflector time-of-flight mass spectrometers
GB201806507D0 (en) * 2018-04-20 2018-06-06 Verenchikov Anatoly Gridless ion mirrors with smooth fields
GB201807626D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
GB201807605D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
US11295945B2 (en) 2018-05-16 2022-04-05 Shimadzu Corporation Time-of-flight mass spectrometer
GB201808459D0 (en) * 2018-05-23 2018-07-11 Thermo Fisher Scient Bremen Gmbh Ion front tilt correction for time of flight(tof) mass spectrometer
GB201808530D0 (en) 2018-05-24 2018-07-11 Verenchikov Anatoly TOF MS detection system with improved dynamic range
GB201810573D0 (en) 2018-06-28 2018-08-15 Verenchikov Anatoly Multi-pass mass spectrometer with improved duty cycle
GB201901411D0 (en) 2019-02-01 2019-03-20 Micromass Ltd Electrode assembly for mass spectrometer
GB201903779D0 (en) 2019-03-20 2019-05-01 Micromass Ltd Multiplexed time of flight mass spectrometer
JP7322650B2 (ja) * 2019-10-11 2023-08-08 株式会社島津製作所 マルチターン型飛行時間型質量分析装置及びその製造方法
JP7533393B2 (ja) 2021-07-21 2024-08-14 株式会社島津製作所 直交加速飛行時間型質量分析装置
CN118862313B (zh) * 2024-09-24 2024-12-06 中国空气动力研究与发展中心计算空气动力研究所 一种飞行器流场等离子体环境收敛判别方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6365892B1 (en) * 1997-11-24 2002-04-02 Robert J. Cotter Method and apparatus for correction of initial ion velocity in a reflectron time-of-flight mass spectrometer
JP2003151487A (ja) * 2001-11-09 2003-05-23 Shimadzu Corp 飛行時間型質量分析装置
CN101366097A (zh) * 2005-10-11 2009-02-11 莱克公司 具有正交加速的多次发射飞行时间质谱仪

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60119067A (ja) 1983-11-30 1985-06-26 Shimadzu Corp 飛行時間型質量分析装置
US5300774A (en) * 1991-04-25 1994-04-05 Applied Biosystems, Inc. Time-of-flight mass spectrometer with an aperture enabling tradeoff of transmission efficiency and resolution
DE4322101C2 (de) * 1993-07-02 1995-06-14 Bergmann Thorald Ionenquelle für Flugzeit-Massenspektrometer
US5464985A (en) 1993-10-01 1995-11-07 The Johns Hopkins University Non-linear field reflectron
AU2622195A (en) * 1994-05-31 1995-12-21 University Of Warwick Tandem mass spectrometry apparatus
US5942758A (en) * 1997-09-10 1999-08-24 Bruker Daltronics, Inc. Shielded lens
US6518569B1 (en) * 1999-06-11 2003-02-11 Science & Technology Corporation @ Unm Ion mirror
DE10005698B4 (de) * 2000-02-09 2007-03-01 Bruker Daltonik Gmbh Gitterloses Reflektor-Flugzeitmassenspektrometer für orthogonalen Ioneneinschuss
CA2405047C (en) * 2000-06-28 2007-03-27 The Johns Hopkins University Time-of-flight mass spectrometer array instrument
DE10156604A1 (de) * 2001-11-17 2003-05-28 Bruker Daltonik Gmbh Raumwinkelfokussierender Reflektor für Flugzeitmassenspektrometer
US6900431B2 (en) * 2003-03-21 2005-05-31 Predicant Biosciences, Inc. Multiplexed orthogonal time-of-flight mass spectrometer
US6998607B1 (en) * 2004-08-31 2006-02-14 Thermo Finnigan Llc Temperature compensated time-of-flight mass spectrometer
US20080290269A1 (en) * 2005-03-17 2008-11-27 Naoaki Saito Time-Of-Flight Mass Spectrometer
US7589319B2 (en) * 2007-05-01 2009-09-15 Virgin Instruments Corporation Reflector TOF with high resolution and mass accuracy for peptides and small molecules
JP5777062B2 (ja) * 2009-03-27 2015-09-09 国立大学法人大阪大学 イオン源、およびそれを備える質量分析装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6365892B1 (en) * 1997-11-24 2002-04-02 Robert J. Cotter Method and apparatus for correction of initial ion velocity in a reflectron time-of-flight mass spectrometer
JP2003151487A (ja) * 2001-11-09 2003-05-23 Shimadzu Corp 飛行時間型質量分析装置
CN101366097A (zh) * 2005-10-11 2009-02-11 莱克公司 具有正交加速的多次发射飞行时间质谱仪

Also Published As

Publication number Publication date
EP2669930A4 (en) 2015-12-23
WO2012086630A1 (ja) 2012-06-28
JP5924387B2 (ja) 2016-05-25
EP2669930B1 (en) 2018-02-14
CN103380479A (zh) 2013-10-30
JP5629928B2 (ja) 2014-11-26
EP3306640A1 (en) 2018-04-11
EP3306640B1 (en) 2024-04-10
EP2669930A1 (en) 2013-12-04
US8772708B2 (en) 2014-07-08
US20140054456A1 (en) 2014-02-27
JP2014241298A (ja) 2014-12-25
JPWO2012086630A1 (ja) 2014-05-22

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