CN103366656A - 非远心电压成像光学系统(ntvios) - Google Patents

非远心电压成像光学系统(ntvios) Download PDF

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Publication number
CN103366656A
CN103366656A CN2013100846595A CN201310084659A CN103366656A CN 103366656 A CN103366656 A CN 103366656A CN 2013100846595 A CN2013100846595 A CN 2013100846595A CN 201310084659 A CN201310084659 A CN 201310084659A CN 103366656 A CN103366656 A CN 103366656A
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CN
China
Prior art keywords
checkout facility
facility according
telecentric lens
modulator
electrooptic modulator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2013100846595A
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English (en)
Chinese (zh)
Inventor
托马斯·H·贝利
劳埃德·琼斯
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Photon Dynamics Inc
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Photon Dynamics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Photon Dynamics Inc filed Critical Photon Dynamics Inc
Publication of CN103366656A publication Critical patent/CN103366656A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Microscoopes, Condenser (AREA)
CN2013100846595A 2012-03-27 2013-03-15 非远心电压成像光学系统(ntvios) Pending CN103366656A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201261616335P 2012-03-27 2012-03-27
US61/616,335 2012-03-27

Publications (1)

Publication Number Publication Date
CN103366656A true CN103366656A (zh) 2013-10-23

Family

ID=49367889

Family Applications (2)

Application Number Title Priority Date Filing Date
CN201320120733.XU Expired - Lifetime CN203588644U (zh) 2012-03-27 2013-03-15 用于对受测试电子装置进行电气检查的设备
CN2013100846595A Pending CN103366656A (zh) 2012-03-27 2013-03-15 非远心电压成像光学系统(ntvios)

Family Applications Before (1)

Application Number Title Priority Date Filing Date
CN201320120733.XU Expired - Lifetime CN203588644U (zh) 2012-03-27 2013-03-15 用于对受测试电子装置进行电气检查的设备

Country Status (4)

Country Link
JP (1) JP3185906U (ko)
KR (1) KR200477847Y1 (ko)
CN (2) CN203588644U (ko)
TW (1) TWM467880U (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104618665A (zh) * 2013-11-05 2015-05-13 德尔福技术有限公司 多个成像器的车辆光学传感器系统

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWM467880U (zh) * 2012-03-27 2013-12-11 Photon Dynamics Inc 用於對受測試電子器件進行電氣檢驗之裝置及包含電光調變器及調變器底座之電光調變器總成

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5124635A (en) * 1990-02-15 1992-06-23 Photon Dynamics, Inc. Voltage imaging system using electro-optics
US5212374A (en) * 1991-12-04 1993-05-18 Photon Dynamics, Inc. Method and apparatus for positioning and biasing an electro-optic modulator of an electro-optic imaging system
US5459410A (en) * 1991-06-17 1995-10-17 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing an active matrix LCD panel
WO1999015932A1 (en) * 1997-09-19 1999-04-01 Colorado Microdisplay, Inc. Method and apparatus for illuminating a display device
US6084703A (en) * 1999-01-11 2000-07-04 Texas Instruments Incorporated Illumination system for high resolution display systems
US6211991B1 (en) * 1998-06-16 2001-04-03 Photon Dynamics, Inc. Modulator manufacturing process and device
US6529018B1 (en) * 1998-08-28 2003-03-04 International Business Machines Corporation Method for monitoring defects in polysilicon gates in semiconductor devices responsive to illumination by incident light
CN102037371A (zh) * 2008-05-21 2011-04-27 光子动力学公司 使用前侧照射增强显示面板的缺陷检测
CN203588644U (zh) * 2012-03-27 2014-05-07 飞腾动力公司 用于对受测试电子装置进行电气检查的设备

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3961134B2 (ja) * 1998-11-05 2007-08-22 フォトン・ダイナミクス・インコーポレーテッド 液晶駆動基板の検査装置及び方法
KR100716472B1 (ko) * 2005-07-20 2007-05-10 (주)미래컴퍼니 기판 결함 수정장치 및 방법

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5124635A (en) * 1990-02-15 1992-06-23 Photon Dynamics, Inc. Voltage imaging system using electro-optics
US5459410A (en) * 1991-06-17 1995-10-17 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing an active matrix LCD panel
US5212374A (en) * 1991-12-04 1993-05-18 Photon Dynamics, Inc. Method and apparatus for positioning and biasing an electro-optic modulator of an electro-optic imaging system
WO1999015932A1 (en) * 1997-09-19 1999-04-01 Colorado Microdisplay, Inc. Method and apparatus for illuminating a display device
US6211991B1 (en) * 1998-06-16 2001-04-03 Photon Dynamics, Inc. Modulator manufacturing process and device
US6529018B1 (en) * 1998-08-28 2003-03-04 International Business Machines Corporation Method for monitoring defects in polysilicon gates in semiconductor devices responsive to illumination by incident light
US6084703A (en) * 1999-01-11 2000-07-04 Texas Instruments Incorporated Illumination system for high resolution display systems
CN102037371A (zh) * 2008-05-21 2011-04-27 光子动力学公司 使用前侧照射增强显示面板的缺陷检测
CN203588644U (zh) * 2012-03-27 2014-05-07 飞腾动力公司 用于对受测试电子装置进行电气检查的设备

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104618665A (zh) * 2013-11-05 2015-05-13 德尔福技术有限公司 多个成像器的车辆光学传感器系统
CN104618665B (zh) * 2013-11-05 2019-12-10 安波福技术有限公司 多个成像器的车辆光学传感器系统

Also Published As

Publication number Publication date
KR200477847Y1 (ko) 2015-07-28
TWM467880U (zh) 2013-12-11
CN203588644U (zh) 2014-05-07
KR20130005847U (ko) 2013-10-08
JP3185906U (ja) 2013-09-12

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