CN103339929B - 识别图像中的异常的方法 - Google Patents

识别图像中的异常的方法 Download PDF

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Publication number
CN103339929B
CN103339929B CN201180066278.3A CN201180066278A CN103339929B CN 103339929 B CN103339929 B CN 103339929B CN 201180066278 A CN201180066278 A CN 201180066278A CN 103339929 B CN103339929 B CN 103339929B
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CN
China
Prior art keywords
candidate
anomalies
image
candidate anomalies
anomaly
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Expired - Fee Related
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CN201180066278.3A
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English (en)
Chinese (zh)
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CN103339929A (zh
Inventor
大卫·克利夫顿
克雷格·罗伯逊
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Optos PLC
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Optos PLC
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Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/30—Determination of transform parameters for the alignment of images, i.e. image registration
    • G06T7/33—Determination of transform parameters for the alignment of images, i.e. image registration using feature-based methods
    • G06T7/337—Determination of transform parameters for the alignment of images, i.e. image registration using feature-based methods involving reference images or patches
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
    • H04N1/40—Picture signal circuits
    • H04N1/409—Edge or detail enhancement; Noise or error suppression
    • H04N1/4097—Removing errors due external factors, e.g. dust, scratches
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/80—Camera processing pipelines; Components thereof
    • H04N23/81—Camera processing pipelines; Components thereof for suppressing or minimising disturbance in the image signal generation
    • H04N23/811—Camera processing pipelines; Components thereof for suppressing or minimising disturbance in the image signal generation by dust removal, e.g. from surfaces of the image sensor or processing of the image signal output by the electronic image sensor
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30004—Biomedical image processing
    • G06T2207/30041—Eye; Retina; Ophthalmic
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30168—Image quality inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30242—Counting objects in image

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Quality & Reliability (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Eye Examination Apparatus (AREA)
  • Facsimile Image Signal Circuits (AREA)
CN201180066278.3A 2010-12-03 2011-10-24 识别图像中的异常的方法 Expired - Fee Related CN103339929B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1020530.0 2010-12-03
GBGB1020530.0A GB201020530D0 (en) 2010-12-03 2010-12-03 Method of identifying anomalies in images
PCT/GB2011/052061 WO2012072995A1 (en) 2010-12-03 2011-10-24 Method of identifying anomalies in images

Publications (2)

Publication Number Publication Date
CN103339929A CN103339929A (zh) 2013-10-02
CN103339929B true CN103339929B (zh) 2017-05-24

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201180066278.3A Expired - Fee Related CN103339929B (zh) 2010-12-03 2011-10-24 识别图像中的异常的方法

Country Status (6)

Country Link
US (1) US9141869B2 (enExample)
EP (1) EP2647194A1 (enExample)
JP (2) JP2013546084A (enExample)
CN (1) CN103339929B (enExample)
GB (1) GB201020530D0 (enExample)
WO (1) WO2012072995A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6055224B2 (ja) * 2012-07-27 2016-12-27 クラリオン株式会社 レンズ洗浄装置
DK3668369T3 (da) 2017-08-14 2021-05-03 Optos Plc Nethindepositionssporing
CN110954758A (zh) * 2018-09-26 2020-04-03 珠海格力电器股份有限公司 电器的故障确定方法及装置
CN112419261B (zh) * 2020-11-19 2022-11-15 江汉大学 具有异常点去除功能的视觉采集方法及装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101324713A (zh) * 2007-05-30 2008-12-17 日本麦可罗尼克斯股份有限公司 液晶面板检查方法以及装置
CN101622861A (zh) * 2007-07-24 2010-01-06 佳能株式会社 摄像设备及其控制方法和程序
CN101656841A (zh) * 2004-09-13 2010-02-24 佳能株式会社 图像感测设备及其控制方法

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5218648A (en) 1990-12-17 1993-06-08 Hughes Aircraft Company Constellation matching system and method
US5436979A (en) 1992-08-21 1995-07-25 Eastman Kodak Company Process for detecting and mapping dirt on the surface of a photographic element
US6122397A (en) * 1997-07-03 2000-09-19 Tri Path Imaging, Inc. Method and apparatus for maskless semiconductor and liquid crystal display inspection
JPH1145919A (ja) * 1997-07-24 1999-02-16 Hitachi Ltd 半導体基板の製造方法
US6035072A (en) * 1997-12-08 2000-03-07 Read; Robert Lee Mapping defects or dirt dynamically affecting an image acquisition device
US6233364B1 (en) * 1998-09-18 2001-05-15 Dainippon Screen Engineering Of America Incorporated Method and system for detecting and tagging dust and scratches in a digital image
JP4179079B2 (ja) * 2002-08-30 2008-11-12 株式会社ニコン 電子カメラ及びその制御プログラム
US7355690B2 (en) 2003-07-21 2008-04-08 Applied Materials, Israel, Ltd. Double inspection of reticle or wafer
JP4419479B2 (ja) * 2003-08-29 2010-02-24 株式会社ニコン 画像処理装置および画像処理プログラム
IES20040604A2 (en) * 2003-09-30 2005-06-15 Fotonation Vision Ltd Statistical self-calibrating detection and removal of blemishes in digital images based on multiple occurrences of dust in images
US7369712B2 (en) 2003-09-30 2008-05-06 Fotonation Vision Limited Automated statistical self-calibrating detection and removal of blemishes in digital images based on multiple occurrences of dust in images
US7394534B1 (en) 2003-11-19 2008-07-01 Kla-Tencor Corporation Process excursion detection
JP4464731B2 (ja) * 2004-04-08 2010-05-19 オリンパス株式会社 画像処理プログラム、画像処理方法、画像処理装置
US20060242706A1 (en) * 2005-03-11 2006-10-26 Ross Robert B Methods and systems for evaluating and generating anomaly detectors
US8337405B2 (en) * 2007-06-08 2012-12-25 Raytheon Company System and method for automatic detection of anomalies in images
US8270733B2 (en) * 2009-08-31 2012-09-18 Behavioral Recognition Systems, Inc. Identifying anomalous object types during classification

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101656841A (zh) * 2004-09-13 2010-02-24 佳能株式会社 图像感测设备及其控制方法
CN101324713A (zh) * 2007-05-30 2008-12-17 日本麦可罗尼克斯股份有限公司 液晶面板检查方法以及装置
CN101622861A (zh) * 2007-07-24 2010-01-06 佳能株式会社 摄像设备及其控制方法和程序

Also Published As

Publication number Publication date
CN103339929A (zh) 2013-10-02
JP6139002B2 (ja) 2017-05-31
US9141869B2 (en) 2015-09-22
JP2016185337A (ja) 2016-10-27
JP2013546084A (ja) 2013-12-26
US20130301927A1 (en) 2013-11-14
EP2647194A1 (en) 2013-10-09
GB201020530D0 (en) 2011-01-19
WO2012072995A1 (en) 2012-06-07

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