CN103123324B - 图像处理设备和图像处理方法 - Google Patents

图像处理设备和图像处理方法 Download PDF

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Publication number
CN103123324B
CN103123324B CN201210468601.6A CN201210468601A CN103123324B CN 103123324 B CN103123324 B CN 103123324B CN 201210468601 A CN201210468601 A CN 201210468601A CN 103123324 B CN103123324 B CN 103123324B
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image
image processing
topography
data
parameter
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CN103123324A (zh
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名越敬祐
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Keyence Corp
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Keyence Corp
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection

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  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Image Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Studio Devices (AREA)
  • Processing Or Creating Images (AREA)
CN201210468601.6A 2011-11-18 2012-11-19 图像处理设备和图像处理方法 Active CN103123324B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2011-252905 2011-11-18
JP2011252905A JP5826612B2 (ja) 2011-11-18 2011-11-18 画像処理装置、画像処理方法及びコンピュータプログラム

Publications (2)

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CN103123324A CN103123324A (zh) 2013-05-29
CN103123324B true CN103123324B (zh) 2017-03-01

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CN201210468601.6A Active CN103123324B (zh) 2011-11-18 2012-11-19 图像处理设备和图像处理方法

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US (1) US9336586B2 (enExample)
EP (1) EP2595113B1 (enExample)
JP (1) JP5826612B2 (enExample)
CN (1) CN103123324B (enExample)

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DE102015203628A1 (de) * 2014-03-31 2015-10-01 Heidelberger Druckmaschinen Ag Verfahren zur automatischen Prüfparameterwahl eines Bildinspektionssystems
JP7271306B2 (ja) * 2019-05-16 2023-05-11 株式会社キーエンス 画像検査装置及び画像検査装置の設定方法
EP4115328A1 (en) * 2020-03-03 2023-01-11 Telefonaktiebolaget Lm Ericsson (Publ) A system, an arrangement, a computer software module arrangement, a circuitry arrangement and a method for improved image processing utilzing two entities
JP7613996B2 (ja) 2021-04-16 2025-01-15 株式会社キーエンス 画像検査装置、画像検査装置用制御ユニット、画像検査方法、画像検査プログラム及びコンピュータで読取可能な記録媒体並びに記録した機器
KR20240098274A (ko) * 2022-12-20 2024-06-28 삼성디스플레이 주식회사 광학 검사 시스템 및 광학 검사 방법
WO2025109709A1 (ja) * 2023-11-22 2025-05-30 三菱電機株式会社 検査画像保存システム及び検査画像保存方法

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CN1713712A (zh) * 2004-06-24 2005-12-28 国际商业机器公司 图像压缩及展开装置及其方法、图像处理系统
CN101102497A (zh) * 2007-07-25 2008-01-09 北京中星微电子有限公司 一种图像处理装置和方法
US7522664B1 (en) * 2003-09-10 2009-04-21 Krishnamurthy Bhaskar Remote live video inspection

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JP2630923B2 (ja) * 1994-12-05 1997-07-16 日本アイ・ビー・エム株式会社 画像認識方法及び装置
KR100465289B1 (ko) 2002-04-22 2005-01-13 삼성전자주식회사 휴대용 단말기의 소화면 표시장치 및 방법
JP4218446B2 (ja) 2003-07-03 2009-02-04 株式会社ニコン 電子カメラ
WO2005104552A1 (ja) 2004-04-23 2005-11-03 Sumitomo Electric Industries, Ltd. 動画像データの符号化方法、復号化方法、これらを実行する端末装置、及び双方向対話型システム
US20060007318A1 (en) 2004-07-09 2006-01-12 Omron Corporation Monitoring system center apparatus, monitoring-system-center program, and recording medium having recorded monitoring-system-center program
JP2006300775A (ja) * 2005-04-21 2006-11-02 Olympus Corp 外観検査装置
US8170322B2 (en) * 2006-03-22 2012-05-01 Jadak Llc Optical imaging system and method using a reflective background
JP2007278928A (ja) * 2006-04-10 2007-10-25 Olympus Corp 欠陥検査装置
JP2009063365A (ja) 2007-09-05 2009-03-26 Nikon Corp 検査装置及び検査方法
CA2701603A1 (en) * 2007-10-03 2009-04-09 Kabushiki Kaisha Toshiba Visual inspection apparatus and visual inspection method
JP2009260818A (ja) * 2008-04-18 2009-11-05 Nec Corp サーバ装置とコンテンツ配信方法とプログラム
JP5071231B2 (ja) 2008-05-09 2012-11-14 オムロン株式会社 部品実装基板の外観検査用画像の保存方法および復元方法、ならびに画像保存処理装置
JP2010151606A (ja) * 2008-12-25 2010-07-08 Ricoh Co Ltd 画像検査装置、画像検査方法及びプログラム
JP4860739B2 (ja) 2009-09-03 2012-01-25 パナソニック株式会社 画像処理装置及び画像処理方法
JP5452392B2 (ja) * 2009-12-16 2014-03-26 株式会社日立ハイテクノロジーズ 欠陥観察方法及び欠陥観察装置
JP2011151515A (ja) * 2010-01-20 2011-08-04 Nec Corp 撮像機能付き電子機器、カメラ機能付き携帯電話機、画像データの表示方法、及び画像データの表示プログラム
US8463016B2 (en) * 2010-02-05 2013-06-11 Luminescent Technologies, Inc. Extending the field of view of a mask-inspection image
JP5479190B2 (ja) * 2010-04-01 2014-04-23 キヤノン株式会社 撮像装置及び撮像装置の制御方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7522664B1 (en) * 2003-09-10 2009-04-21 Krishnamurthy Bhaskar Remote live video inspection
CN1713712A (zh) * 2004-06-24 2005-12-28 国际商业机器公司 图像压缩及展开装置及其方法、图像处理系统
CN101102497A (zh) * 2007-07-25 2008-01-09 北京中星微电子有限公司 一种图像处理装置和方法

Also Published As

Publication number Publication date
EP2595113A2 (en) 2013-05-22
US9336586B2 (en) 2016-05-10
US20130129183A1 (en) 2013-05-23
CN103123324A (zh) 2013-05-29
EP2595113A3 (en) 2017-05-24
EP2595113B1 (en) 2018-07-04
JP5826612B2 (ja) 2015-12-02
JP2013108799A (ja) 2013-06-06

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