CN102981129A - Testing tool for power supply - Google Patents
Testing tool for power supply Download PDFInfo
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- CN102981129A CN102981129A CN2012105302136A CN201210530213A CN102981129A CN 102981129 A CN102981129 A CN 102981129A CN 2012105302136 A CN2012105302136 A CN 2012105302136A CN 201210530213 A CN201210530213 A CN 201210530213A CN 102981129 A CN102981129 A CN 102981129A
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Abstract
The invention discloses a testing tool for a power supply. The testing tool for the power supply comprises a PCB (printed circuit board) substrate (101;201), a connector (102;202), a direct-current isolation capacitor (103;203), a positive-electrode coating probe (104;204) and a negative-electrode coating probe (105;205) that are located on the PCB substrate (101;201), wherein the positive-electrode coating probe (104;204) is electrically connected with one end of the direct-current isolation capacitor (103;203); the other end of the direct-current isolation capacitor (103;203) is electrically connected with a positive electrode of the connector (102;202); the PCB substrate (101;201) is laid with copper and grounded; the negative-electrode coating probe (105;205) is electrically connected with a negative electrode of the connector (102;202) through a copper layer on the PCB substrate (101;201). The testing tool for the power supply is designed based on the PCB substrate, is small in testing loop, high in testing accuracy and convenient to use, and can improve the testing efficiency.
Description
Technical field
The present invention relates to the power supply test field, and more specifically, relate to the power supply test instrument.
Background technology
Power supply ripple and noise are one of most important parameter index of power supply, and qualified power supply makes veneer circuit and chip normal operation.Because chip integration is more and more higher, supply voltage is more and more lower, noise margin is more and more less, and is more and more higher to test request, and the interference in the test process is easy to cause test result defective.
Existing power supply Ripple Noise method of testing more and more is difficult to satisfy the requirement that testing efficiency and test accuracy satisfy simultaneously, needs to introduce the balance that new measuring technology solves testing efficiency and test accuracy.As use the method for welding coaxial cable test to expend the plenty of time complex operation, and use the passive probe test to introduce easily to disturb cause testing inaccurate.
Summary of the invention
The embodiment of the invention provides a kind of power supply test instrument, can improve testing efficiency.
First aspect provides a kind of power supply test instrument, comprising: printed circuit board (Printed Circuit Board, PCB) substrate 101,201; Be positioned at connector 102,202, DC-isolation electric capacity 103,203, anodal coating probe 104,204 and negative pole coating probe 105,205 on this PCB substrate 101,201; This positive pole coating probe 104,204 is electrically connected with an end of this DC-isolation electric capacity 103,203, and the positive pole of the other end of this DC-isolation electric capacity 103,203 and this connector 102,202 is electrically connected; These PCB substrate 101,201 upper berth copper ground connection, this negative pole coating probe 105,205 connects by the negative electricity of the copper layer on this PCB substrate 101,201 and this connector 102,202.
In the possible implementation of the first, this power supply test instrument also comprises a pair of probe 106,206, is welded on respectively on this positive pole coating probe 104,204 and this negative pole coating probe 105,205.
In the possible implementation of the second, in conjunction with the possible implementation of the first of first aspect or first aspect, these PCB substrate 101 1 sides have opening, and this positive pole coating probe 104 and this negative pole coating 105 symmetries of popping one's head in are positioned at this opening both sides.
In the third possible implementation, in conjunction with the possible implementation of the second of first aspect, these probe 106 Parallel Symmetrics distribute or are symmetrical in opposite directions.
In the 4th kind of possible implementation, in conjunction with the second or the third possible implementation of first aspect, this power supply test instrument also comprises handle installing hole 113, is positioned on this PCB substrate 101, is used for the mounting handle shell.
In the 5th kind of possible implementation, in conjunction with the possible implementation of the first of first aspect or first aspect, this PCB substrate 201 comprises a PCB substrate 2011 and the 2nd PCB substrate 2012, this positive pole coating probe 204, this DC-isolation electric capacity 203 and this connector 202 are positioned on the PCB substrate 2011, this negative pole coating probe 205 is positioned on the 2nd PCB substrate 2012, connects altogether by wire 207 between a PCB substrate 2011 and the 2nd PCB substrate 2012.
In the 6th kind of possible implementation, in conjunction with the 5th kind of possible implementation of first aspect, this power supply test instrument comprises that also support 208, the one PCB substrates 2011 and the 2nd PCB substrate 2012 are individually fixed in the both sides of this support 208.
In the 7th kind of possible implementation, in conjunction with the 5th kind or the 6th kind of possible implementation of first aspect, this wire 207 is compliant conductive metal or cable.
In the 8th kind of possible implementation, in conjunction with the 5th kind or the 6th kind or the 7th kind of possible implementation of first aspect, this support 208 also comprises spacing adjusting device 209, to regulate the spacing of this positive pole coating probe 204 and this negative pole coating probe 205.
In the 9th kind of possible implementation, in conjunction with any the possible implementation in the 5th to the eight kind of possible implementation of first aspect, this power supply test instrument also comprises alignment mounting hole 213, be positioned on a PCB substrate 2011 and the 2nd PCB substrate 2012, be used for alignment this positive pole coating probe 204 and this negative pole coating probe 205 are installed.
In the tenth kind of possible implementation, in conjunction with any the possible implementation in first to nine kind of possible implementation of first aspect or first aspect, this power supply test instrument also comprises near the polarity marks 110,210 that are positioned at this positive pole coating probe 104,204.
In the 11 kind of possible implementation, in conjunction with any the possible implementation in first to ten kind of possible implementation of first aspect or first aspect, this power supply test instrument comprises that also being positioned at this positive pole coating pops one's head in 104, near 204 anodal indication light diode (Light Emitting Diode, LED) 111,211.
In the 12 kind of possible implementation, in conjunction with the 11 kind of first aspect possible implementation, this power supply test instrument also comprises LED power supply 112,212, is used for to these positive pole indication LED 111,211 power supplies.
In the 13 kind of possible implementation, in conjunction with any the possible implementation in first to 12 kind of possible implementation of first aspect or first aspect, this positive pole coating probe 104,204 and this negative pole coating probe 105,205 are gold-plated probe.
In the 14 kind of possible implementation, in conjunction with any the possible implementation in first to 13 kind of possible implementation of first aspect, this probe 106,206 is telescopic probe.
In the 15 kind of possible implementation, in conjunction with any the possible implementation in first to 14 kind of possible implementation of first aspect, this probe 106,206 is gold-plated reed.
Based on technique scheme, the power supply test instrument of the embodiment of the invention is based on the PCB substrate design, negative pole coating probe is connected with the negative electricity of connector by the copper layer on the PCB substrate, thereby ground wire is short, test loop is little, and test accuracy is high, and uses the power supply test instrument of the embodiment of the invention not need welding, convenient test, thus testing efficiency can be improved.
Description of drawings
In order to be illustrated more clearly in the technical scheme of the embodiment of the invention, the below will do to introduce simply to the accompanying drawing of required use in the embodiment of the invention, apparently, accompanying drawing in the following describes only is some embodiments of the present invention, for those of ordinary skills, under the prerequisite of not paying creative work, can also obtain according to these accompanying drawings other accompanying drawing.
Fig. 1 is the schematic diagram according to the power supply test instrument of the embodiment of the invention.
Fig. 2 is the using method synoptic diagram according to the power supply test instrument of the embodiment of the invention.
Fig. 3 A and Fig. 3 B are the synoptic diagram according to the probe of the power supply test instrument of the embodiment of the invention.
Fig. 4 A and Fig. 4 B are another synoptic diagram according to the probe of the power supply test instrument of the embodiment of the invention.
Fig. 5 is the schematic diagram of power supply test instrument according to another embodiment of the present invention.
Fig. 6 is the using method synoptic diagram of according to another embodiment of the present invention power supply test instrument.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the invention, the technical scheme in the embodiment of the invention is clearly and completely described, obviously, described embodiment is a part of embodiment of the present invention, rather than whole embodiment.Based on the embodiment among the present invention, the every other embodiment that those of ordinary skills obtain under the prerequisite of not making creative work should belong to the scope of protection of the invention.
Fig. 1 is the schematic diagram according to the power supply test instrument 100 of the embodiment of the invention.As shown in Figure 1, this power supply test instrument 100 comprises:
Be positioned at connector 102, DC-isolation electric capacity 103, anodal coating probe 104 and negative pole coating probe 105 on this PCB substrate 101;
This positive pole coating probe 104 is electrically connected with an end of this DC-isolation electric capacity 103, and the other end of this DC-isolation electric capacity 103 is electrically connected with the positive pole of this connector 102;
These PCB substrate 101 upper berth copper ground connection, this negative pole coating probe 105 is connected with the negative electricity of this connector 102 by the copper layer on this PCB substrate 101.
In embodiments of the present invention, power supply test instrument 100 design is on a PCB substrate 101, and PCB substrate 101 1 sides have opening, and anodal coating probe 104 and negative pole coating 105 symmetries of popping one's head in are positioned at the opening both sides.Connector 102 is used for connecting oscillograph.Anodal coating probe 104, DC-isolation electric capacity 103 are connected with the positive pole of connector 102.PCB substrate 101 upper berth copper ground connection make negative pole coating probe 105 be connected with the negative electricity of connector 102.That is to say that PCB substrate 101 upper berth copper ground connection form the copper layer, negative pole coating probe 105 is connected with the negative electricity of connector 102 by the copper layer.Carry out impedance Control during PCB substrate 101 design, by impedance Control, make from probe to connector impedance continuously and and concentric cable or oscillograph input impedance be consistent, thereby guarantee that test result is accurate.
During testing single-board power supply ripple noise, connector 102 is connected oscillograph.For example, connector 102 can adopt coaxial cable connector.Connector 102 is connected oscillograph by concentric cable, and anodal coating probe 104 and negative pole coating probe 105 contact respectively the positive and negative power supply end (as shown in Figure 2) of tested power supply.Alternatively, anodal coating probe 104 and negative pole coating probe 105 can adopt gold-plated probe, to reduce contact impedance.The power supply ripple noise enters oscillograph by the concentric cable that links to each other with connector 102 and is used for signal testing through DC-isolation electric capacity 103.
In embodiments of the present invention, short based on the ground wire of PCB design, test loop is little, and test accuracy is high; By probe contact but not the mode of welding significantly reduce test setup time and environment and remove the time, and the repeatedly mounting or dismounting that can also avoid welding with environment move, and eliminate the veneer damage that causes because of pad stress, thereby greatly improve testing efficiency.
In embodiments of the present invention, as shown in Figure 1, alternatively, this power supply test instrument 100 also comprises a pair of probe 106, is welded on respectively on this positive pole coating probe 104 and the negative pole coating probe 105.During testing single-board power supply ripple noise, two probes 106 are contacted respectively the positive-negative power end of tested power supply, such as via hole or patch capacitor both positive and negative polarity, can contact better, convenient test and accuracy are high.Alternatively, probe 106 can be selected telescopic probe, can use spring also can use the flexible metal shell fragment, for example, gold-plated reed, gold-plated flexible sheet metal piece, gold-plated flexible metal probe and automatic on-line tester (In Circuit Tester, ICT) probe etc.
In embodiments of the present invention, alternatively, probe 106 can Parallel Symmetric distributes (shown in Fig. 3 A and Fig. 3 B), also can symmetrical in opposite directions (shown in Fig. 4 A and Fig. 4 B).In the embodiment that probe 106 Parallel Symmetrics distribute, the test spacing is fixed, and shown in Fig. 3 B, two probes can be inserted the via hole of tested power supply positive and negative terminal or contacts tested power supply positive and negative terminal during test.In the symmetrical in opposite directions embodiment of probe 106, the test gap variable, shown in Fig. 4 B, two probes can be contacted tested power supply positive and negative terminal during test, according to different test spacings, the different parts of two probes can be contacted tested power supply positive and negative terminal, for example, spacing hour can contact the tip of two probes tested power supply positive and negative terminal, when spacing is larger, the middle part of two probes can be contacted tested power supply positive and negative terminal.
In embodiments of the present invention, as shown in Figure 1, alternatively, this power supply test instrument 100 also comprises polarity mark 110, and polarity mark 110 is positioned near the anodal coating probe 104.Guarantee that by polarity mark 110 polarity is correct in order to avoid reverse polarity connection causes Damage by Short Circuit tested single board or instrument.
Should be understood that polarity mark also can be positioned near the negative pole coating probe, the sign negative pole, this equivalent transformation mode also should be encompassed in protection scope of the present invention.
In embodiments of the present invention, as shown in Figure 1, alternatively, this power supply test instrument 100 also comprises anodal indication LED 111, and anodal indication LED 111 is positioned near the anodal coating probe 104.During testing single-board power supply ripple noise, can sound out in advance the both positive and negative polarity of tested single board power supply by anodal coating probe 104, the power supply that represents to contact when anodal indication LED 111 lamps are bright is for anodal.
Alternatively, this power supply test instrument 100 also comprises LED power supply 112, is used for to anodal indication LED 111 power supplies.That is to say that anodal indication LED 111 only requires that tested power supply does voltage and judge and to be not used in driving LED, and independently-powered with LED power supply 112, does not affect like this one-board power supply test result.
The implementation of electric power polarity indication LED can have multiple, as reach the purpose of micro-loading driving LED indication by methods such as small current driving mos field effect transistor (metal-oxid-semiconductor, MOS), triode even simple door circuit.
The both positive and negative polarity of veneer electric power network is identified and confirmed to the power supply test instrument of the embodiment of the invention by anodal indication LED and polarity mark, can guarantee can not connect the anti-short circuit that causes by both positive and negative polarity.
In embodiments of the present invention, as shown in Figure 1, alternatively, this power supply test instrument 100 also comprises handle installing hole 113, is positioned on the PCB substrate 101, is used for the mounting handle shell.The quantity of mounting hole 113 can be determined according to needs are installed.The optional metal material electromagnetic screen of shell internal layer, and be electrically connected the maskable external interference with PCB ground end.That is to say that shell not only can handled easily, also can effectively shield external disturbance, thereby improve test accuracy.
The power supply test instrument of the embodiment of the invention is based on the PCB substrate design, negative pole coating probe is connected with the negative electricity of connector by the copper layer on the PCB substrate, thereby ground wire is short, test loop is little, test accuracy is high, and the power supply test instrument that uses the embodiment of the invention do not need welding, convenient test, thus can improve testing efficiency.
Above in conjunction with Fig. 1 to Fig. 4, describe first embodiment of the power supply test instrument of the embodiment of the invention in detail, below in conjunction with Fig. 5 and Fig. 6, describe second embodiment of the power supply test instrument of the embodiment of the invention in detail.
Fig. 5 is the schematic diagram according to the power supply test instrument 200 of the embodiment of the invention.As shown in Figure 2, this power supply test instrument 200 comprises:
Be positioned at connector 202, DC-isolation electric capacity 203, anodal coating probe 204 and negative pole coating probe 205 on this PCB substrate 201;
This positive pole coating probe 204 is electrically connected with an end of this DC-isolation electric capacity 203, and the other end of this DC-isolation electric capacity 203 is electrically connected with the positive pole of this connector 202;
These PCB substrate 201 upper berth copper ground connection, this negative pole coating probe 205 is connected with the negative electricity of this connector 202 by the copper layer on this PCB substrate 201.
In embodiments of the present invention, 200 designs of power supply test instrument are on two PCB substrates, be that PCB substrate 201 comprises a PCB substrate 2011 and the 2nd PCB substrate 2012, anodal coating probe 204, DC-isolation electric capacity 203 and connector 202 are positioned on the PCB substrate 2011, negative pole coating probe 205 is positioned on the 2nd PCB substrate 2012, connects altogether by wire 207 between two.Connector 202 is used for connecting oscillograph.PCB substrate 201 upper berth copper ground connection, form the copper layer, like this, anodal coating probe 204, DC-isolation electric capacity 203 are electrically connected with the positive pole of connector 202, and negative pole coating probe 205 is connected with the negative electricity of connector 202 by copper layer and wire 207 on the PCB substrate 201.Carry out impedance Control during 201 design of PCB substrate, wire 207 can be selected high bandwidth cable or compliant conductive metal, for example, soft coaxial cable, soft PCB, soft arranging wire etc. can make ground wire short like this, test loop is little, test accuracy is high, and both positive and negative polarity coating probe lays respectively on two PCB substrates, can adjust probe spacing, to satisfy the requirement of different test spacings.
In embodiments of the present invention, as shown in Figure 5, alternatively, this power supply test instrument 200 also comprises support 208, the one PCB substrate 2011 and the 2nd PCB substrate 2012 are individually fixed in the both sides of support 208, and it is 205 symmetrical that anodal coating probe 204 and negative pole coating are popped one's head in.The support 208 double operation handles of doing are individually fixed in the both sides of support 208, convenient operation with two PCB substrates 201.Alternatively, support 208 also comprises spacing adjusting device 209, by spacing regulating device 209 spacing of anodal coating probe 204 and negative pole coating probe 205 is changed, to satisfy the requirement of different test scenes.Alternatively, this power supply test instrument 200 also comprises alignment mounting hole 213, is positioned on a PCB substrate 2011 and the 2nd PCB substrate 2012, is used for alignment anodal coating probe 204 and negative pole coating probe 205 are installed.For example, the alignment mounting hole 213 on a PCB substrate 2011 and the 2nd PCB substrate 2012 can be symmetrical arranged, be convenient to alignment and install.Anodal coating probe 204 and 205 alignment of negative pole coating probe are installed with convenient test.
In embodiments of the present invention, alternatively, anodal coating probe 204 and negative pole coating probe 205 can adopt gold-plated probe, to reduce contact impedance.As shown in Figure 5, alternatively, this power supply test instrument 200 also comprises a pair of probe 206, is welded on respectively on anodal coating probe 204 and the negative pole coating probe 205.During testing single-board power supply ripple noise, two probes 206 are contacted respectively the positive-negative power end of tested power supply, such as via hole or patch capacitor both positive and negative polarity, can contact better, convenient test and accuracy are high.Alternatively, probe 206 can be selected telescopic probe, can use spring also can use the flexible metal shell fragment, for example, and gold-plated reed, gold-plated flexible sheet metal piece, gold-plated flexible metal probe and ICT probe etc.
Fig. 6 is for using the synoptic diagram of power supply test instrument 200.During test, connector 202 is connected oscillograph.For example, connector 202 can adopt coaxial cable connector.Concentric cable is linked to each other with oscillograph, and the other end links to each other with the connector of power supply test instrument, directly tests at test position with the power supply testing tool.Do not need extra power supply DC-isolation plate, do not need concentric cable is welded on the tested veneer yet.
In embodiments of the present invention, as shown in Figure 5, alternatively, this power supply test instrument 200 also comprises polarity mark 210, and polarity mark 210 is positioned near the anodal coating probe 204.Guarantee that by polarity mark 210 polarity is correct in order to avoid reverse polarity connection causes Damage by Short Circuit tested single board or instrument.
Should be understood that polarity mark also can be positioned near the negative pole coating probe, the sign negative pole, this equivalent transformation mode also should be encompassed in protection scope of the present invention.
In embodiments of the present invention, as shown in Figure 5, alternatively, this power supply test instrument 200 also comprises anodal indication LED 211, and anodal indication LED 211 is positioned near the anodal coating probe 204.During testing single-board power supply ripple noise, can sound out in advance the both positive and negative polarity of tested single board power supply by anodal coating probe 104, the power supply that represents to contact when anodal indication LED 211 lamps are bright is for anodal.
Alternatively, this power supply test instrument 200 also comprises LED power supply 212, is used for to anodal indication LED 211 power supplies.That is to say that anodal indication LED 211 only requires that tested power supply does voltage and judge and to be not used in driving LED, and independently-powered with LED power supply 212, does not affect like this one-board power supply test result.
The implementation of electric power polarity indication LED can have multiple, as reach the purpose of micro-loading driving LED indication by methods such as small current driving MOS, triode even simple door circuit.
Identify and confirm the both positive and negative polarity of veneer electric power network by anodal indication LED and polarity mark, can guarantee can not connect the anti-short circuit that causes by both positive and negative polarity.
The power supply test tool design of the embodiment of the invention is on two PCB substrates, and two PCB substrates connect altogether, and ground wire is short, and test loop is little, test accuracy is high, and probe spacing can be regulated, can satisfy the requirement of different test spacings, convenient test, thus can improve testing efficiency.
Those of ordinary skills can recognize, unit and the algorithm steps of each example of describing in conjunction with embodiment disclosed herein, can realize with electronic hardware, computer software or the combination of the two, for the interchangeability of hardware and software clearly is described, composition and the step of each example described in general manner according to function in the above description.These functions are carried out with hardware or software mode actually, depend on application-specific and the design constraint of technical scheme.The professional and technical personnel can specifically should be used for realizing described function with distinct methods to each, but this realization should not thought and exceeds scope of the present invention.
The those skilled in the art can be well understood to, and for the convenience described and succinct, the specific works process of the system of foregoing description, device and unit can with reference to the corresponding process among the preceding method embodiment, not repeat them here.
In several embodiment that the application provides, should be understood that disclosed system, apparatus and method can realize by another way.For example, device embodiment described above only is schematic, for example, the division of described unit, only be that a kind of logic function is divided, during actual the realization other dividing mode can be arranged, for example a plurality of unit or assembly can in conjunction with or can be integrated into another system, or some features can ignore, or do not carry out.In addition, the shown or coupling each other discussed or direct-coupling or communication connection can be indirect coupling or the communication connections by some interfaces, device or unit, also can be electric, machinery or other form connect.
Described unit as separating component explanation can or can not be physically to separate also, and the parts that show as the unit can be or can not be physical locations also, namely can be positioned at a place, perhaps also can be distributed on a plurality of network element.Can select according to the actual needs wherein some or all of unit to realize the purpose of embodiment of the invention scheme.
In addition, each functional unit in each embodiment of the present invention can be integrated in the processing unit, also can be that the independent physics of unit exists, and also can be that two or more unit are integrated in the unit.Above-mentioned integrated unit both can adopt the form of hardware to realize, also can adopt the form of SFU software functional unit to realize.
If described integrated unit is realized with the form of SFU software functional unit and during as independently production marketing or use, can be stored in the computer read/write memory medium.Based on such understanding, the part that technical scheme of the present invention contributes to prior art in essence in other words, perhaps all or part of of this technical scheme can embody with the form of software product, this computer software product is stored in the storage medium, comprise that some instructions are with so that a computer equipment (can be personal computer, server, the perhaps network equipment etc.) carry out all or part of step of the described method of each embodiment of the present invention.And aforesaid storage medium comprises: the various media that can be program code stored such as USB flash disk, portable hard drive, ROM (read-only memory) (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), magnetic disc or CD.
The above; it only is the specific embodiment of the present invention; but protection scope of the present invention is not limited to this; anyly be familiar with those skilled in the art in the technical scope that the present invention discloses; can expect easily modification or the replacement of various equivalences, these modifications or replacement all should be encompassed within protection scope of the present invention.Therefore, protection scope of the present invention should be as the criterion with the protection domain of claim.
Claims (16)
1. a power supply test instrument is characterized in that, comprising:
Printing board PCB substrate (101; 201);
Be positioned at described PCB substrate (101; 201) connector (102 on; 202), DC-isolation electric capacity (103; 203), anodal coating probe (104; 204) and negative pole coating probe (105; 205);
Described anodal coating probe (104; 204) with described DC-isolation electric capacity (103; 203) a end is electrically connected, described DC-isolation electric capacity (103; 203) the other end and described connector (102; 202) positive pole is electrically connected;
Described PCB substrate (101; 201) upper berth copper ground connection, described negative pole coating probe (105; 205) by described PCB substrate (101; 201) the copper layer on and described connector (102; 202) negative electricity connects.
2. power supply test instrument according to claim 1 is characterized in that, described power supply test instrument also comprises a pair of probe (106; 206), be welded on respectively described anodal coating probe (104; 204) and described negative pole coating probe (105; 205) on.
3. power supply test instrument according to claim 1 and 2 is characterized in that, described PCB substrate (101) one sides have opening, and described anodal coating probe (104) and described negative pole coating probe (105) symmetry are positioned at described opening both sides.
4. power supply test instrument according to claim 3 is characterized in that, described probe (106) Parallel Symmetric distributes or be symmetrical in opposite directions.
5. according to claim 3 or 4 described power supply test instruments, it is characterized in that described power supply test instrument also comprises handle installing hole (113), be positioned on the described PCB substrate (101), be used for the mounting handle shell.
6. power supply test instrument according to claim 1 and 2, it is characterized in that, described PCB substrate (201) comprises a PCB substrate (2011) and the 2nd PCB substrate (2012), described anodal coating probe (204), described DC-isolation electric capacity (203) and described connector (202) are positioned on the described PCB substrate (2011), described negative pole coating probe (205) is positioned on described the 2nd PCB substrate (2012), connects altogether by wire (207) between a described PCB substrate (2011) and described the 2nd PCB substrate (2012).
7. power supply test instrument according to claim 6, it is characterized in that, described power supply test instrument also comprises support (208), and a described PCB substrate (2011) and described the 2nd PCB substrate (2012) are individually fixed in the both sides of described support (208).
8. according to claim 6 or 7 described power supply test instruments, it is characterized in that described wire (207) is compliant conductive metal or cable.
9. each described power supply test instrument in 8 according to claim 6 is characterized in that described support (208) also comprises spacing adjusting device (209), to regulate the pop one's head in spacing of (205) of described anodal coating probe (204) and described negative pole coating.
10. each described power supply test instrument in 9 according to claim 6, it is characterized in that, described power supply test instrument also comprises alignment mounting hole (213), be positioned on a described PCB substrate (2011) and described the 2nd PCB substrate (2012), be used for alignment described anodal coating probe (204) and described negative pole coating probe (205) are installed.
11. each described power supply test instrument in 10 is characterized in that according to claim 1, described power supply test instrument also comprises and is positioned at described anodal coating probe (104; 204) near the polarity mark (110; 210).
12. each described power supply test instrument in 11 is characterized in that according to claim 1, described power supply test instrument also comprises and is positioned at described anodal coating probe (104; 204) near the anodal indication LED (111; 211).
13. power supply test instrument according to claim 12 is characterized in that, described power supply test instrument also comprises LED power supply (112; 212), be used for to described anodal indication LED (111; 211) power supply.
14. each described power supply test instrument in 13 is characterized in that according to claim 1, described anodal coating probe (104; 204) and described negative pole coating probe (105; 205) be gold-plated probe.
15. each described power supply test instrument in 14 is characterized in that described probe (106 according to claim 2; 206) be telescopic probe.
16. each described power supply test instrument in 15 is characterized in that described probe (106 according to claim 2; 206) be gold-plated reed.
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| CN201210530213.6A CN102981129B (en) | 2012-12-11 | 2012-12-11 | Testing tool for power supply |
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| CN201210530213.6A CN102981129B (en) | 2012-12-11 | 2012-12-11 | Testing tool for power supply |
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| CN102981129B CN102981129B (en) | 2015-01-21 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104076210A (en) * | 2013-03-25 | 2014-10-01 | 深圳市祈飞科技有限公司 | Ripple wave noise testing device |
| CN104569858A (en) * | 2015-02-11 | 2015-04-29 | 山东诺安诺泰信息系统有限公司 | Direct-current power supply quality visual detector |
| CN104749403A (en) * | 2013-12-31 | 2015-07-01 | 旺矽科技股份有限公司 | Probe module |
| CN105301515A (en) * | 2015-09-24 | 2016-02-03 | 浪潮电子信息产业股份有限公司 | Design method convenient for switching power supply test |
| CN106019169A (en) * | 2016-05-11 | 2016-10-12 | 深圳市优必选科技有限公司 | Testing probe and testing method for ripples and noises of power supply |
| CN107329144A (en) * | 2017-08-16 | 2017-11-07 | 深圳市杰普特光电股份有限公司 | A kind of miniature laser range finder module and range unit |
| CN113589058A (en) * | 2021-06-24 | 2021-11-02 | 苏州浪潮智能科技有限公司 | Ripple noise test system and method |
| CN115607161A (en) * | 2022-09-26 | 2023-01-17 | 武汉中科科理光电技术有限公司 | Single-needle bipolar microprobe and detection system thereof |
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| CN104076210A (en) * | 2013-03-25 | 2014-10-01 | 深圳市祈飞科技有限公司 | Ripple wave noise testing device |
| CN104749403A (en) * | 2013-12-31 | 2015-07-01 | 旺矽科技股份有限公司 | Probe module |
| CN104569858A (en) * | 2015-02-11 | 2015-04-29 | 山东诺安诺泰信息系统有限公司 | Direct-current power supply quality visual detector |
| CN105301515A (en) * | 2015-09-24 | 2016-02-03 | 浪潮电子信息产业股份有限公司 | Design method convenient for switching power supply test |
| CN106019169A (en) * | 2016-05-11 | 2016-10-12 | 深圳市优必选科技有限公司 | Testing probe and testing method for ripples and noises of power supply |
| CN107329144A (en) * | 2017-08-16 | 2017-11-07 | 深圳市杰普特光电股份有限公司 | A kind of miniature laser range finder module and range unit |
| CN113589058A (en) * | 2021-06-24 | 2021-11-02 | 苏州浪潮智能科技有限公司 | Ripple noise test system and method |
| CN115607161A (en) * | 2022-09-26 | 2023-01-17 | 武汉中科科理光电技术有限公司 | Single-needle bipolar microprobe and detection system thereof |
| CN115607161B (en) * | 2022-09-26 | 2024-02-23 | 武汉中科科理光电技术有限公司 | Single-needle bipolar microprobe and detection system thereof |
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