CN102970077A - Error rate testing device and method for circuit board integrated optical component system - Google Patents
Error rate testing device and method for circuit board integrated optical component system Download PDFInfo
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- CN102970077A CN102970077A CN2012105412117A CN201210541211A CN102970077A CN 102970077 A CN102970077 A CN 102970077A CN 2012105412117 A CN2012105412117 A CN 2012105412117A CN 201210541211 A CN201210541211 A CN 201210541211A CN 102970077 A CN102970077 A CN 102970077A
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Abstract
The invention relates to an error rate testing device and method for a circuitboard integrated optical component system, and belongs to the technical field of PON (Passive Optical Network). The testing device comprises an error code detector including a PRBS code type generating unit. An ONT (Optical Network Terminal) of the circuitboard integrated optical component system is integrated with a PRBS code type transceiver. In the error rate testing method by using the testing device, the PRBS code type transceiver of the ONT can directly utilize a PRBS code type preset in the PRBS code type transceiver to be compared with another PRBS code type received from the error detector, so that the statistics on the current error rate can be carried out. Therefore, the error rate testing device and the method which can carry out statistics on the current error rate in ONT without adoption of additional OLT equipment and have the advantages of simple system structure and high accuracy rate are provided. In addition, the device and the method provided by the invention are simple in application and have a wider application range.
Description
Technical field
The present invention relates to the passive optical network technique field, particularly circuit board Integrated Light component system technical field specifically refers to a kind of error rate test device and method that is applied to circuit board Integrated Light component system.
Background technology
At the PON(EPON) in the production process of terminal equipment, need to measure the error rate that PON partly carries out down direction.
If the use optical module, as shown in Figure 1, optical module is received the PRBS(Pseudo-Random Binary Sequence that Error Detector sends over by optical fiber, pseudo-random binary sequence) pattern, be transformed into again the signal of telecommunication and be transmitted back to Error Detector by coaxial cable.The data that Error Detector arrives by comparing sending and receiving just can calculate current error rate size.In BOB system (circuit board Integrated Light component system), the PON part still can be received the descending PRBS pattern that Error Detector sends by optical fiber.But because the signal of telecommunication is directly received above the MAC interface of PON, can't directly be transmitted back to Error Detector.Solution commonly used is: use the OLT(optical line terminal) and the ONT(Optical Network Terminal) jointly build a system, judged whether error code by the method for testing packet loss.The defective of the method that this OLT is combined with ONT is that at first systematic comparison is complicated, increase OLT and test, different OLT corresponding to scheme possibility; Secondly packet loss may be subject to the impact of OLT, and is not accurate enough to the judgement of error code.
Summary of the invention
The objective of the invention is to have overcome above-mentioned shortcoming of the prior art, a kind of extra OLT equipment that do not need to increase is provided, just can directly count the current error rate in ONT inside, and system configuration is simple, accuracy rate is high, application mode is easy, and range of application comparatively is widely used in the error rate test device and method of circuit board Integrated Light component system.
In order to realize above-mentioned purpose, the error rate test device that is applied to circuit board Integrated Light component system of the present invention has following formation:
This error rate test device that is applied to circuit board Integrated Light component system comprises code error detecting instrument, described code error detecting instrument comprises pseudo-random binary sequence pattern generation unit, the Optical Network Terminal of described circuit board Integrated Light component system is integrated with pseudo-random binary sequence pattern transceiver, and described pseudo-random binary sequence pattern generation unit connects described pseudo-random binary sequence pattern transceiver by optical fiber.
This is applied in the error rate test device of circuit board Integrated Light component system, described pseudo-random binary sequence pattern transceiver comprises Transmit-Receive Unit, pseudo-random binary sequence pattern memory cell, synchronous control unit and error rate detecting unit, described error rate detecting unit connects respectively described Transmit-Receive Unit, pseudo-random binary sequence pattern memory cell and synchronous control unit, and described Transmit-Receive Unit connects described pseudo-random binary sequence pattern generation unit.
The present invention also provides a kind of test method for bit error rate that utilizes described device to realize circuit board Integrated Light component system, and the method may further comprise the steps:
(1) the pseudo-random binary sequence pattern generation unit of described code error detecting instrument generates the pseudo-random binary sequence pattern;
(2) described code error detecting instrument is sent to described pseudo-random binary sequence pattern by optical fiber the pseudo-random binary sequence pattern transceiver of described Optical Network Terminal;
(3) described pseudo-random binary sequence pattern transceiver pseudo-random binary sequence pattern that its inside is preset and the pseudo-random binary sequence pattern that receives from described code error detecting instrument are relatively added up the current error rate.
This is realized in the test method for bit error rate of circuit board Integrated Light component system, described pseudo-random binary sequence pattern transceiver comprises Transmit-Receive Unit, pseudo-random binary sequence pattern memory cell, synchronous control unit and error rate detecting unit, described error rate detecting unit connects respectively described Transmit-Receive Unit, pseudo-random binary sequence pattern memory cell and synchronous control unit, described Transmit-Receive Unit connects described pseudo-random binary sequence pattern generation unit, and described step (3) specifically may further comprise the steps:
(31) described Transmit-Receive Unit receives the pseudo-random binary sequence pattern from described code error detecting instrument;
(32) described lock unit arrives described code error detecting instrument with speed and the Phase synchronization of described pseudo-random binary sequence pattern transceiver;
(33) described error rate detecting unit compares according to the pseudo-random binary sequence pattern of storing in the described pseudo-random binary sequence pattern memory cell with from the pseudo-random binary sequence pattern that described code error detecting instrument receives, and adds up the current error rate.
Adopted the error rate test device that is applied to circuit board Integrated Light component system of this invention to comprise code error detecting instrument, code error detecting instrument comprises PRBS pattern generation unit, and the ONT of circuit board Integrated Light component system is integrated with PRBS pattern transceiver.Utilize in the test method for bit error rate of this device, the PRBS pattern transceiver of ONT can directly utilize PRBS pattern that its inside presets and the PRBS pattern that receives from code error detecting instrument relatively, add up the current error rate.Thereby provide a kind of extra OLT equipment that do not need to increase, just can directly count the current error rate in ONT inside, and system configuration is simple, the error rate test device and method that accuracy rate is high, simultaneously, the application mode of the error rate test device and method that is applied to circuit board Integrated Light component system of the present invention is easy, and range of application is comparatively extensive.
Description of drawings
Fig. 1 is the structural representation of optical module error rate test device of the prior art.
Fig. 2 is the structural representation that is applied to the error rate test device of circuit board Integrated Light component system of the present invention.
Embodiment
In order more clearly to understand technology contents of the present invention, describe in detail especially exemplified by following examples.
See also shown in Figure 2ly, be the structural representation that is applied to the error rate test device of circuit board Integrated Light component system of the present invention.
In one embodiment, the error rate test device that is applied to circuit board Integrated Light component system comprises code error detecting instrument, described code error detecting instrument comprises pseudo-random binary sequence pattern generation unit, the Optical Network Terminal of described circuit board Integrated Light component system is integrated with pseudo-random binary sequence pattern transceiver, and described pseudo-random binary sequence pattern generation unit connects described pseudo-random binary sequence pattern transceiver by optical fiber.
May further comprise the steps at the test method for bit error rate that utilizes the described device realization of this execution mode circuit board Integrated Light component system:
(1) the pseudo-random binary sequence pattern generation unit of described code error detecting instrument generates the pseudo-random binary sequence pattern;
(2) described code error detecting instrument is sent to described pseudo-random binary sequence pattern by optical fiber the pseudo-random binary sequence pattern transceiver of described Optical Network Terminal;
(3) described pseudo-random binary sequence pattern transceiver pseudo-random binary sequence pattern that its inside is preset and the pseudo-random binary sequence pattern that receives from described code error detecting instrument are relatively added up the current error rate.
A kind of preferred embodiment in, described pseudo-random binary sequence pattern transceiver comprises Transmit-Receive Unit, pseudo-random binary sequence pattern memory cell, synchronous control unit and error rate detecting unit, described error rate detecting unit connects respectively described Transmit-Receive Unit, pseudo-random binary sequence pattern memory cell and synchronous control unit, and described Transmit-Receive Unit connects described pseudo-random binary sequence pattern generation unit.
Utilize this preferred embodiment described device realize that described step (3) specifically may further comprise the steps in the test method for bit error rate of circuit board Integrated Light component system:
(31) described Transmit-Receive Unit receives the pseudo-random binary sequence pattern from described code error detecting instrument;
(32) described lock unit arrives described code error detecting instrument with speed and the Phase synchronization of described pseudo-random binary sequence pattern transceiver;
(33) described error rate detecting unit compares according to the pseudo-random binary sequence pattern of storing in the described pseudo-random binary sequence pattern memory cell with from the pseudo-random binary sequence pattern that described code error detecting instrument receives, and adds up the current error rate.
In the production test of the BOB of reality system is used, at the inner integrated PRBS pattern transceiver of ONT.When receiving the PRBS pattern that Error Detector sends by light signal, the transceiver of ONT inside with oneself speed and Phase synchronization to Error Detector.Then, the PRBS pattern that presets according to inside more just can directly count the current error rate in ONT inside, carries out the error code testing of down direction.Thereby do not need to increase extra OLT equipment, realize to error code it being direct measurement, can judge more accurately the error rate compared to prior art.
Adopted the error rate test device that is applied to circuit board Integrated Light component system of this invention to comprise code error detecting instrument, code error detecting instrument comprises PRBS pattern generation unit, and the ONT of circuit board Integrated Light component system is integrated with PRBS pattern transceiver.Utilize in the test method for bit error rate of this device, the PRBS pattern transceiver of ONT can directly utilize PRBS pattern that its inside presets and the PRBS pattern that receives from code error detecting instrument relatively, add up the current error rate.Thereby provide a kind of extra OLT equipment that do not need to increase, just can directly count the current error rate in ONT inside, and system configuration is simple, the error rate test device and method that accuracy rate is high, simultaneously, the application mode of the error rate test device and method that is applied to circuit board Integrated Light component system of the present invention is easy, and range of application is comparatively extensive.
In this specification, the present invention is described with reference to its specific embodiment.But, still can make various modifications and conversion obviously and not deviate from the spirit and scope of the present invention.Therefore, specification and accompanying drawing are regarded in an illustrative, rather than a restrictive.
Claims (4)
1. error rate test device that is applied to circuit board Integrated Light component system, it is characterized in that, described device comprises code error detecting instrument, described code error detecting instrument comprises pseudo-random binary sequence pattern generation unit, the Optical Network Terminal of described circuit board Integrated Light component system is integrated with pseudo-random binary sequence pattern transceiver, and described pseudo-random binary sequence pattern generation unit connects described pseudo-random binary sequence pattern transceiver by optical fiber.
2. the error rate test device that is applied to circuit board Integrated Light component system according to claim 1, it is characterized in that, described pseudo-random binary sequence pattern transceiver comprises Transmit-Receive Unit, pseudo-random binary sequence pattern memory cell, synchronous control unit and error rate detecting unit, described error rate detecting unit connects respectively described Transmit-Receive Unit, pseudo-random binary sequence pattern memory cell and synchronous control unit, and described Transmit-Receive Unit connects described pseudo-random binary sequence pattern generation unit.
3. test method for bit error rate that utilizes device claimed in claim 1 to realize circuit board Integrated Light component system is characterized in that described method may further comprise the steps:
(1) the pseudo-random binary sequence pattern generation unit of described code error detecting instrument generates the pseudo-random binary sequence pattern;
(2) described code error detecting instrument is sent to described pseudo-random binary sequence pattern by optical fiber the pseudo-random binary sequence pattern transceiver of described Optical Network Terminal;
(3) described pseudo-random binary sequence pattern transceiver pseudo-random binary sequence pattern that its inside is preset and the pseudo-random binary sequence pattern that receives from described code error detecting instrument are relatively added up the current error rate.
4. the test method for bit error rate of realization circuit board Integrated Light component system according to claim 3, it is characterized in that, described pseudo-random binary sequence pattern transceiver comprises Transmit-Receive Unit, pseudo-random binary sequence pattern memory cell, synchronous control unit and error rate detecting unit, described error rate detecting unit connects respectively described Transmit-Receive Unit, pseudo-random binary sequence pattern memory cell and synchronous control unit, described Transmit-Receive Unit connects described pseudo-random binary sequence pattern generation unit, and described step (3) specifically may further comprise the steps:
(31) described Transmit-Receive Unit receives the pseudo-random binary sequence pattern from described code error detecting instrument;
(32) described lock unit arrives described code error detecting instrument with speed and the Phase synchronization of described pseudo-random binary sequence pattern transceiver;
(33) described error rate detecting unit compares according to the pseudo-random binary sequence pattern of storing in the described pseudo-random binary sequence pattern memory cell with from the pseudo-random binary sequence pattern that described code error detecting instrument receives, and adds up the current error rate.
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| CN105703840A (en) * | 2016-01-22 | 2016-06-22 | 盛科网络（苏州）有限公司 | Method for quickly selecting pre-emphasis parameter of high-speed serdes |
| CN105846893A (en) * | 2016-03-22 | 2016-08-10 | 武汉电信器件有限公司 | Active optical cable bit error rate detection method and system |
| CN107135033A (en) * | 2017-05-27 | 2017-09-05 | 烽火通信科技股份有限公司 | A kind of optical link fault diagnosis system and method based on PRBS |
| CN108923850A (en) * | 2018-06-14 | 2018-11-30 | 烽火通信科技股份有限公司 | Parallel multi-channel optical module test device for 40Gbs, 100Gbs, 120Gbs |
| CN111313993A (en) * | 2019-11-19 | 2020-06-19 | 四川安迪科技实业有限公司 | Method and system for monitoring idle spectrum resources of satellite |
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Application publication date: 20130313 |