CN103188014A - PON (passive optical network) ONU (optical network unit) BOB (BOSA-on-board) product with test loop - Google Patents
PON (passive optical network) ONU (optical network unit) BOB (BOSA-on-board) product with test loop Download PDFInfo
- Publication number
- CN103188014A CN103188014A CN2013101287678A CN201310128767A CN103188014A CN 103188014 A CN103188014 A CN 103188014A CN 2013101287678 A CN2013101287678 A CN 2013101287678A CN 201310128767 A CN201310128767 A CN 201310128767A CN 103188014 A CN103188014 A CN 103188014A
- Authority
- CN
- China
- Prior art keywords
- signal
- product
- bob
- optical network
- limiting amplifier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Abstract
The invention provides a PON (passive optical network) ONU (optical network unit) BOB (BOSA-on-board) product with a test loop. The product comprises an optical transceiver module interface module integrating a semiconductor laser and an optical receiving component, a laser driver, a limiting amplifier and a PON master chip, and also comprises a signal self loop route device. Due to the adoption of the signal self loop route device, an electrical signal recovered from an optical source signal and received by the limiting amplifier is input into a differential signal input end of the laser driver in a different signal form. The BOB product is simple in design is convenient to realize, is beneficial to improving the production efficiency of products, needs less auxiliary equipment to be invested for test and is low in cost.
Description
Technical field
The present invention relates to optical communication field, be specifically related to the network terminal product field, particularly a kind ofly realize the integrated products of BOSA optical assembly at passive optical network unit subscriber equipment veneer, this product is provided with test loop.
Background technology
Along with PON(Passive Optical Network EPON) popularization with popularize, for the formation scale and final realize that light advances the result that copper moves back, thus to ONU(Optical Network Unit optical-fiber network subscriber unit) terminal equipment low-cost require strong day by day.In the ONU equipment early, the optical signal transceiver machine is designed and is produced by second producer as a discrete device, be unfavorable for that the cost of realizing whole ONU equipment reduces, therefore just produced the circuit unit of the direct integrated optical signal transceiver machine of ONU equipment, to the ripe title of the form industry BOB product of entire product.Following optical module development trend is Integrated Solution on the plate (BOB), BOSA-on-Board just, adopt the BOSA-on-Board scheme, equipment vendors need not buy optical module, only need to buy upstream chip, optical device is made on the motherboard, not only save cost and plate space of planes, the more important thing is upstream chip directly with ONT(Optical Network Terminal Optical Network Terminal) equipment vendors dock, this system equipment manufacturer that desire is integrated the upstream and downstream resource is undoubtedly good news, and be no small impact concerning optical module manufacturer, particularly after this type of scheme large-scale application, impact is with self-evident.
In the present BOB product; no matter in development or in the test in producing; on the test item of receiver function unit; receiving sensitivity relies on the integrated Error Detector of PON master chip, and the CDR (Clock and Data ReCovery) of the integrated Error Detector of PON master chip can exist unusual at clock usually synchronously when the error rate is higher.On the test item of transmitter function unit, in the test to emission light signal eye pattern, need CDR of dependence to recover the clock synchronous with launching light signal and be Trigger, but the clock that the CDR of outside recovers out when instability appears in the clock of PON master chip is also shaken, very serious shake will take place in the eye pattern of oscilloscope test so, as the Marvell chip solution.Except the problem in this type of design, need do a pseudo-noise code generator and Error Detector at the PON chip, this clearly can increase the Products Development cycle.Increase on the testing equipment and increase the cost increase that Error Detector and pseudo-noise code generator etc. all can make product on CDR and the PON chip.
Summary of the invention
In order to overcome the above problems, the present invention arranges test loop at BOB equipment.
Technical scheme of the present invention is: a kind of PON ONU BOB product with test loop, comprise that semiconductor laser and light receiving element are in optical transceiver module interface module, laser driver, limiting amplifier and the EPON master chip of one, also comprise signal self loop line apparatus, described signal self loop line apparatus is realized the signal of telecommunication that light signal that described limiting amplifier receives reverts to and with the differential signal input of the form input laser driver of differential signal.
Further, in the above-mentioned PON ONU BOB product with test loop: described signal self loop line apparatus is arranged on bridle wire apparatus between limiting amplifier output and the laser driver differential signal input line, and described route device comprises and limiting amplifier output being linked to each other with described laser driver differential signal input line or limiting amplifier is exported and laser driver differential signal input line inserts the EPON master chip respectively.
BOB product of the present invention, simplicity of design and convenient the realization, production efficiency of products is finished in favourable raising, and the auxiliary equipment that test drops into is few, and cost is low.By this method, can make debugging or test discrete come out from ONU of the light device for sending and receiving performance of ONU BOB product, utilize LA that the level signal input LDD modulation LD that the light signal of signal source transfers standard to is luminous, send to the receiver of signal source, form the ring certainly of signal.By the Error Detector of receiver to the Bit Error Code Statistics from ring signal.BOB sensitivity has determined signal from the sensitivity of ring, utilizes this method can be faster and the test that realize all parameters of optical module exactly, comprises sensitivity, the load capacity of optical receiver in the BOB product, the eye diagram quality of optical transmitter, transmission cost.
Below in conjunction with specific embodiment the present invention is done comparatively detailed description.
Description of drawings
Fig. 1 is the embodiment of the invention 1 schematic diagram.
Fig. 2 is the embodiment of the invention 2 schematic diagrams.
Embodiment
Embodiment 1, realizes test at subtest equipment as shown in Figure 1.Be the power supply of this product by external power source, realize test by the Error Detector subtest equipment of band optical transceiver is auxiliary.As Fig. 1, this BOB product contains with the lower part: PON master chip, by wire jumper pad Pad with encircle BOSA, the optical patchcord Fiber of IC, set laser device and the optical receiver one of bridle wire apparatus, limiting amplifier LA and laser driver LDD one that differential lines constitutes certainly.
Present embodiment respectively arranges two pads on the input line of the output line of LA and LDD, as figure on the LA Output DATA differential lines and the 2nd solder joint and the 3rd solder joint short circuit of pad Pad_A, Pad_B on the LDD Input Data differential lines, Pad_C, Pad_D open circuit with the formation of the 1st solder joint simultaneously.By difference wire jumper (Line) LA output Output data signal is transmitted, thereby the signal that LA recovers is out imported on the LDD differential signal input as modulation signal.
The Error Detector auxiliary equipment that has optical transceiver sends light and carries pseudo noise code as source signal.The Fiber of BOB product reaches the light receiving element of BOSA inside with source signal, finally has LA to quantize and amplitude limit output differential signal, this moment Pad 2, No. 3 pad short circuits or connect with capacitance resistance ware.The next differential signal of LA output will be input to LDD differential signal input like this, finally realizes the laser in the current-modulation BOSA, and laser is with the form output output light signal identical with source signal of light.The output light signal is finally received by the optical transceiver of auxiliary equipment Error Detector, and is carrying out Bit Error Code Statistics in inside by it, just can judge that according to the error rate optical transceiver is from the quality of ring signal.Being the sensitivity that detects BOB product optical receiver, also is the signal modulation quality that has detected BOB product optical transmitter.
Embodiment 2, and the constituted mode with bridle wire apparatus on the basis of embodiment 1 becomes SW and Line, as shown in Figure 2.By the inner integrated register of LA and LDD one IC is set, the SW switch is contacted with contact point 2 when carrying out product test, method of testing is identical with embodiment 1 with effect.Finish test back by configuration register with SW and contact point 1 short circuit.
Claims (2)
1. PON ONU BOB product with test loop, comprise that semiconductor laser and light receiving element are in optical transceiver module interface module, laser driver, limiting amplifier and the EPON master chip of one, it is characterized in that: also comprise signal self loop line apparatus, described signal self loop line apparatus is realized the signal of telecommunication that light signal that described limiting amplifier receives reverts to and with the differential signal input of the form input laser driver of differential signal.
2. a kind of PON ONU BOB product with test loop according to claim 1, it is characterized in that: described signal self loop line apparatus is arranged on bridle wire apparatus between limiting amplifier output and the laser driver differential signal input line, and described route device comprises and limiting amplifier output being linked to each other with described laser driver differential signal input line or limiting amplifier is exported and laser driver differential signal input line inserts the EPON master chip respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2013101287678A CN103188014A (en) | 2013-04-12 | 2013-04-12 | PON (passive optical network) ONU (optical network unit) BOB (BOSA-on-board) product with test loop |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2013101287678A CN103188014A (en) | 2013-04-12 | 2013-04-12 | PON (passive optical network) ONU (optical network unit) BOB (BOSA-on-board) product with test loop |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103188014A true CN103188014A (en) | 2013-07-03 |
Family
ID=48678994
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2013101287678A Pending CN103188014A (en) | 2013-04-12 | 2013-04-12 | PON (passive optical network) ONU (optical network unit) BOB (BOSA-on-board) product with test loop |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103188014A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103368641A (en) * | 2013-06-19 | 2013-10-23 | 中怡(苏州)科技有限公司 | Test equipment and test method for optical fiber network unit |
| CN103795485A (en) * | 2014-03-06 | 2014-05-14 | 上海贝岭股份有限公司 | High frequency dynamic error rate test system |
| CN107306151A (en) * | 2017-02-14 | 2017-10-31 | 深圳市双翼科技股份有限公司 | A kind of calibration method and its device of BOB equipment |
| WO2017215473A1 (en) * | 2016-06-17 | 2017-12-21 | 中兴通讯股份有限公司 | Data transmission method and device |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6549053B1 (en) * | 2001-07-26 | 2003-04-15 | Analog Devices, Inc. | Adjustable offset voltage circuit |
| CN1961506A (en) * | 2004-04-02 | 2007-05-09 | 菲尼萨公司 | Analog to digital signal conditioning in optoelectronic transceivers |
| CN2916724Y (en) * | 2006-04-27 | 2007-06-27 | 苏州市华芯微电子有限公司 | High precision voltage reference correcting circuit |
| CN101902280A (en) * | 2010-08-09 | 2010-12-01 | 索尔思光电（成都）有限公司 | Self-contained MAC Ethernet passive optical network terminal SFP |
| CN101997614A (en) * | 2009-08-18 | 2011-03-30 | 百维通（苏州）科技有限公司 | Integrated transceiver, optical network system as well as optical communication system and method |
| CN201830410U (en) * | 2010-10-27 | 2011-05-11 | 索尔思光电（成都）有限公司 | Passive optical network (PON) terminal |
| CN201985864U (en) * | 2011-04-18 | 2011-09-21 | 青岛海信宽带多媒体技术有限公司 | Optical network unit debugging system based on bosa on board (BOB) |
| CN102269599A (en) * | 2010-06-02 | 2011-12-07 | 新科实业有限公司 | Optical assembly and manufacturing method thereof |
| CN102707179A (en) * | 2012-06-15 | 2012-10-03 | 北京鼎汉技术股份有限公司 | Fault detection device for inverter |
| CN102723932A (en) * | 2012-06-15 | 2012-10-10 | 北京鼎汉技术股份有限公司 | Interlocking circuit and interlocking system comprising same |
-
2013
- 2013-04-12 CN CN2013101287678A patent/CN103188014A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6549053B1 (en) * | 2001-07-26 | 2003-04-15 | Analog Devices, Inc. | Adjustable offset voltage circuit |
| CN1961506A (en) * | 2004-04-02 | 2007-05-09 | 菲尼萨公司 | Analog to digital signal conditioning in optoelectronic transceivers |
| CN2916724Y (en) * | 2006-04-27 | 2007-06-27 | 苏州市华芯微电子有限公司 | High precision voltage reference correcting circuit |
| CN101997614A (en) * | 2009-08-18 | 2011-03-30 | 百维通（苏州）科技有限公司 | Integrated transceiver, optical network system as well as optical communication system and method |
| CN102269599A (en) * | 2010-06-02 | 2011-12-07 | 新科实业有限公司 | Optical assembly and manufacturing method thereof |
| CN101902280A (en) * | 2010-08-09 | 2010-12-01 | 索尔思光电（成都）有限公司 | Self-contained MAC Ethernet passive optical network terminal SFP |
| CN201830410U (en) * | 2010-10-27 | 2011-05-11 | 索尔思光电（成都）有限公司 | Passive optical network (PON) terminal |
| CN201985864U (en) * | 2011-04-18 | 2011-09-21 | 青岛海信宽带多媒体技术有限公司 | Optical network unit debugging system based on bosa on board (BOB) |
| CN102707179A (en) * | 2012-06-15 | 2012-10-03 | 北京鼎汉技术股份有限公司 | Fault detection device for inverter |
| CN102723932A (en) * | 2012-06-15 | 2012-10-10 | 北京鼎汉技术股份有限公司 | Interlocking circuit and interlocking system comprising same |
Non-Patent Citations (2)
| Title |
|---|
| 刘征宇 主编: "《线性放大器应用手册》", 31 May 2005, 福建科学技术出版社 * |
| 陈达民主编: "《电力通信线路》", 31 January 1999, 中国电力出版社 * |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103368641A (en) * | 2013-06-19 | 2013-10-23 | 中怡(苏州)科技有限公司 | Test equipment and test method for optical fiber network unit |
| CN103795485A (en) * | 2014-03-06 | 2014-05-14 | 上海贝岭股份有限公司 | High frequency dynamic error rate test system |
| WO2017215473A1 (en) * | 2016-06-17 | 2017-12-21 | 中兴通讯股份有限公司 | Data transmission method and device |
| CN107306151A (en) * | 2017-02-14 | 2017-10-31 | 深圳市双翼科技股份有限公司 | A kind of calibration method and its device of BOB equipment |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6665498B1 (en) | High-speed optical data links | |
| CN104601244B (en) | A kind of 400Gb/s hot plugs High Speeding Optical Transmitter-receiver Circuit | |
| US20130188963A1 (en) | Applying controlled impedance to improve optical transceiver bandwidth | |
| CN101442385B (en) | Test device of digital communication error rate | |
| CN101902280B (en) | Self-contained MAC Ethernet passive optical network terminal SFP | |
| CN104320184A (en) | High-speed optical module for fiber channel | |
| CN103188014A (en) | PON (passive optical network) ONU (optical network unit) BOB (BOSA-on-board) product with test loop | |
| CN101110641A (en) | Loopback optical receiving-transmitting module and its testing device and method | |
| US6950972B2 (en) | Multi-purpose BER tester (MPBERT) for very high RZ and NRZ signals | |
| CN205693674U (en) | The multichannel debugging system of integrating device on a kind of bi-directional light device board | |
| CN104519419A (en) | Optical signal processing method, optical module and optical line terminal | |
| CN117055178A (en) | Inner packaging type photoelectric module | |
| CN103259599A (en) | Passive optical network and double-system optical line terminal optical module | |
| US8145059B2 (en) | Circuit topologies for high speed, low cost optical transceiver components | |
| CN102023345B (en) | Optical module, equipment main board and passive optical network equipment | |
| JP4703452B2 (en) | Optical transceiver | |
| CN103812555B (en) | Active network monitoring system and monitoring method thereof | |
| CN201830410U (en) | Passive optical network (PON) terminal | |
| CN113346954A (en) | Local side equipment used in passive optical network with power of over 50G | |
| CN102664674A (en) | Test device of communication equipment and use method of test device | |
| CN208433971U (en) | A kind of 56G BIDI 40km SFP-DD optical module | |
| CN208299802U (en) | A kind of 100G 10km QSFP28 optical module | |
| CN202818298U (en) | Embedded optical time domain reflectometer and optical network system | |
| CN204190773U (en) | A kind of optical module | |
| CN206878836U (en) | Wavelength division multiplexing transmission apparatus and system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C12 | Rejection of a patent application after its publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20130703 |