CN102854455A - Integrated circuit testing system and control method for same - Google Patents
Integrated circuit testing system and control method for same Download PDFInfo
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- CN102854455A CN102854455A CN2012103542474A CN201210354247A CN102854455A CN 102854455 A CN102854455 A CN 102854455A CN 2012103542474 A CN2012103542474 A CN 2012103542474A CN 201210354247 A CN201210354247 A CN 201210354247A CN 102854455 A CN102854455 A CN 102854455A
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Abstract
The invention discloses an integrated circuit testing system which comprises control equipment, a tester, a load plate, an automatic test machine and a tested device. The tester is connected with the control equipment, the load plate is connected with the tester, the automatic test machine is connected with the load plate, and the tested device is connected with the automatic test machine. The invention further discloses a control method for the integrated circuit testing system. The integrated circuit testing system and the control method have the advantages that problems in the aspect of wire arrangement between the tester and the test load plate are solved, testing cost is lowered, and testing efficiency and accuracy of outputted testing results are improved.
Description
Technical field
The present invention relates to ic test technique, be specifically related to a kind of based on the wireless communication module integrated circuit test system and based on the control method of wireless communication module integrated circuit test system.
Background technology
Current traditional integrated circuit testing is divided into middle survey and becomes to survey two classes, the test macro comparing class seemingly, all adopt tester to receive the test vector code, and control probe station or mechanical arm mobile test load board, chip Die or the packaged chip of finished product on the contact wafer, test and receive test result, tester is connected the connection of mechanical arm and test load plate and is all adopted the mode of winding displacement with probe station.
Above-mentioned test macro uses winding displacement aspect communication, benefit is that cost is lower, but disadvantage is also arranged, and is embodied in every tester and adopts the serial testing process, only can dock separate unit probe station, mechanical arm or test load plate; And because tester winding displacement mouth is limited, can't adopt the multidiameter delay test for the more chip of pin during test; Because consider winding displacement electrical loss is arranged, length is generally shorter, puts near equipment such as probe stations so that tester is general, is unfavorable for space management, strengthens the wiring difficulty, and can't realize Long-distance Control.。
Summary of the invention
A kind of integrated circuit test system, comprise an opertaing device, one tester with wireless communication module that links to each other with described opertaing device, the one load board array with wireless communication module that links to each other with described tester with wireless communication module, one with the described automatic test machine array that links to each other with the load board array of wireless communication module, the one measured device array that links to each other with described automatic test machine array, described load board array with wireless communication module comprises N with the load board of wireless communication module, described automatic test machine array comprises N automatic test machine, described measured device array comprises N measured device, wherein N 〉=1.
In the tester main control chip of described tester with wireless communication module one first wireless communication module driver has been installed, has been used for controlling the wireless communication module work of described tester with wireless communication module.
The built-in load board main control chip of described load board with wireless communication module, and one second wireless communication module driver has been installed in described load board main control chip is used for controlling the wireless communication module work of described load board with wireless communication module; Described automatic test machine is that probe station, mechanical arm or other can be finished the equipment of autorun; Described measured device is that wafer, chip or other can be used for tested components and parts; Described with wireless communication module tester and described be the wireless communication module that GPRS, WIFI, CDMA etc. realize wireless communication functions with the built-in wireless communication module of the load board array of wireless communication module; Described load board with wireless communication module, described automatic test machine and described measured device be corresponding the series connection one by one.
A kind of control method of integrated circuit test system may further comprise the steps:
Power on and initialization to a tester with wireless communication module, a test load plate array with wireless communication module;
Whether the described corresponding described test load plate array with wireless communication module of tester inquiry with wireless communication module can carry out data transmission, is then to move for the 4th step, otherwise moves for the 3rd step;
Described tester with the wireless communication module signal that gives the alarm, but wait for described test load plate array communication with wireless communication module, and the operation second step;
Input instruction and control routine by an opertaing device to described tester with wireless communication module;
Described tester with wireless communication module sends to described test load plate array with wireless communication module by wireless communication signal after receiving described input instruction and described control routine and being translated into test vector;
Described test load plate array with wireless communication module receives the described information that transmits with the tester of wireless communication module, the described automatic test machine array of control carries out test job after resolving, and the result feeds back to described tester with wireless communication module by wireless communication signal;
Described tester with wireless communication module receives described test load plate array feedack with wireless communication module, is organized into information and the preservations such as test result, sends test to described opertaing device simultaneously and finishes information.
Described tester and described load board array with wireless communication module with wireless communication module carries out data transmission by wireless communication module, described tester with wireless communication module uses built-in wireless communication module to send the described test load plate array with wireless communication module of instruction control, described test load buttress with wireless communication module is controlled the described measured device array of described automatic test machine array test according to order, and will detect information exchange and cross the wireless communication module that carries and feed back to described tester with wireless communication module, described tester with wireless communication module is analyzed rear storage with detection information.
Relative prior art, integrated circuit test system of the present invention and integrated circuit test system control method replace the transmission that traditional winding displacement carries out control information by wireless communication signal, has better dirigibility, avoid the decay mistake of high speed transmission of signals, improved the correctness of test result output.In addition, because can Long-distance Control, avoided the wiring difficulty brought because of test space, industrial building, also solved because the limited introducing of winding displacement pin can't a plurality of chips of concurrent testing problem, give full play to the high-level efficiency of test, saved greatly testing cost.
Description of drawings
Fig. 1 is the technical solution of the present invention block diagram.
Fig. 2 is process flow diagram of the present invention.
Fig. 3 is preferred embodiments block diagram of the present invention.
Fig. 4 is preferred embodiments process flow diagram of the present invention.
Embodiment
See also Fig. 3, integrated circuit test system preferred embodiments of the present invention comprise an opertaing device, a tester with the GPRS module that links to each other with this opertaing device, a load board array with the GPRS module that links to each other with this tester with the GPRS module, one with this mechanical arm array that links to each other with the load board array of GPRS module, a chip array that links to each other with this mechanical arm array, this load board array with the GPRS module comprises N with the load board of GPRS module, this mechanical arm array comprises N mechanical arm, this chip array comprises N chip, wherein N 〉=1.
In this tester main control chip with the tester of GPRS module one the one GPRS driver of modules has been installed, has been used for controlling this with the GPRS module work of the tester of GPRS module; The built-in load board main control chip of this load board with the GPRS module, and one the 2nd GPRS driver of modules has been installed in this load board main control chip, be used for controlling this with the GPRS module work of the load board of GPRS module; This mechanical arm can replace with the equipment that probe station etc. can be finished autorun; This chip can replace with wafer etc. can be used for tested components and parts; This tester with the GPRS module can replace with the wireless communication module that WIFI, CDMA etc. realize wireless communication functions with this with the built-in GPRS module of the load board array of GPRS module; This load board with the GPRS module, this mechanical arm and this chip be corresponding the series connection one by one.
Please referring to Fig. 4, the control method of a kind of integrated circuit test system of the present invention may further comprise the steps:
The first step, power on and initialization to a tester with the GPRS module, a test load plate array with the GPRS module;
Second step, this tester with the GPRS module are inquired about should whether carrying out data transmission with the test load plate array of GPRS module, are then to move for the 4th step, otherwise move for the 3rd step;
The 3rd step, this tester with GPRS module signal that gives the alarm, but wait for this with the test load plate array communication of GPRS module, and the operation second step;
The 4th step, by an opertaing device to this with the input instruction of tester of GPRS module and control routine;
The 5th step, this tester with the GPRS module send to this with the test load plate array of GPRS module by GPRS after receiving this input instruction and this control routine and being translated into test vector;
The 6th step, this test load plate array with the GPRS module receive the information that this transmits with the tester of GPRS module, and this mechanical arm array of control carries out test job after resolving, and the result feeds back to this with the tester of GPRS module by GPRS;
The 7th step, this tester with the GPRS module receive this with the test load plate array feedack of GPRS module, are organized into information and the preservations such as test result, send test to this opertaing device simultaneously and finish information.
This tester and this load board array with the GPRS module with the GPRS module carries out data transmission by the GPRS module, this tester with the GPRS module uses built-in GPRS module to send instruction and controls this with the test load plate array of GPRS module, this test load buttress with the GPRS module is controlled this this chip array of mechanical arm array test according to order, and will detect information exchange and cross the GPRS module that carries and feed back to this with the tester of GPRS module, this tester with the GPRS module is analyzed rear storage with detection information.
Integrated circuit test system of the present invention and integrated circuit test system control method have been avoided the decay mistake of high speed transmission of signals, have improved the correctness of test result output.In addition, because can Long-distance Control, avoided the wiring difficulty brought because of test space, industrial building, also solved because the limited introducing of winding displacement pin can't a plurality of chips of concurrent testing problem, give full play to the high-level efficiency of test, saved greatly testing cost.
Claims (10)
1. integrated circuit test system, comprise an opertaing device, one tester with wireless communication module that links to each other with described opertaing device, the one load board array with wireless communication module that links to each other with described tester with wireless communication module, one with the described automatic test machine array that links to each other with the load board array of wireless communication module, the one measured device array that links to each other with described automatic test machine array, described load board array with wireless communication module comprises N with the load board of wireless communication module, described automatic test machine array comprises N automatic test machine, described measured device array comprises N measured device, wherein N 〉=1.
2. a kind of integrated circuit test system according to claim 1, it is characterized in that: in the tester main control chip of described tester with wireless communication module one first wireless communication module driver has been installed, has been used for controlling the wireless communication module work of described tester with wireless communication module.
3. a kind of integrated circuit test system according to claim 1, it is characterized in that: the built-in load board main control chip of described load board with wireless communication module, and one second wireless communication module driver has been installed in described load board main control chip, be used for controlling the wireless communication module work of described load board with wireless communication module.
4. a kind of integrated circuit test system according to claim 1 is characterized in that: described load board with wireless communication module, described automatic test machine and described measured device be corresponding the series connection one by one.
5. a kind of integrated circuit test system according to claim 1, it is characterized in that: described automatic test machine is probe station.
6. a kind of integrated circuit test system according to claim 1, it is characterized in that: described automatic test machine is mechanical arm.
7. a kind of integrated circuit test system according to claim 1, it is characterized in that: described measured device is wafer.
8. a kind of integrated circuit test system according to claim 1, it is characterized in that: described measured device is chip.
9. the control method of an integrated circuit test system may further comprise the steps:
Power on and initialization to a tester with wireless communication module, a test load plate array with wireless communication module;
Whether the described corresponding described test load plate array with wireless communication module of tester inquiry with wireless communication module can carry out data transmission, is then to move for the 4th step, otherwise moves for the 3rd step;
Described tester with the wireless communication module signal that gives the alarm, but wait for described test load plate array communication with wireless communication module, and the operation second step;
Input instruction and test code by an opertaing device to described tester with wireless communication module;
Described tester with wireless communication module sends to described test load plate array with wireless communication module by wireless telecommunications communication after receiving described input instruction and described test code and being translated into test vector;
Described test load plate array with wireless communication module receives the described information that transmits with the tester of wireless communication module, the described automatic test machine array of control carries out work after resolving, and the result gives described tester with wireless communication module by the wireless telecommunications communications feedback;
Described tester with wireless communication module receives described test load plate array feedack with wireless communication module, is organized into information and the preservations such as test result, sends test to described opertaing device simultaneously and finishes information.
10. the control method of a kind of integrated circuit test system according to claim 9, it is characterized in that: described tester and described load board array with wireless communication module with wireless communication module carries out data transmission by wireless communication module, described tester with wireless communication module uses built-in wireless communication module to send the described test load plate array with wireless communication module of instruction control, described test load buttress with wireless communication module is controlled the described measured device array of described automatic test machine array test according to order, and will detect information exchange and cross the wireless communication module that carries and feed back to described tester with wireless communication module, described tester with wireless communication module is analyzed rear storage with detection information.
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| CN104175313A (en) * | 2013-05-27 | 2014-12-03 | 富泰华工业（深圳）有限公司 | Circuit board test monitoring system and method |
| CN105467256A (en) * | 2015-05-14 | 2016-04-06 | 华润赛美科微电子(深圳)有限公司 | Chip testing and sorting method |
| CN106526362A (en) * | 2016-10-25 | 2017-03-22 | 上海移远通信技术股份有限公司 | Test system of wireless communication module |
| CN106771959A (en) * | 2016-11-16 | 2017-05-31 | 上海华岭集成电路技术股份有限公司 | A kind of wafer test system |
| CN107271889A (en) * | 2017-08-18 | 2017-10-20 | 苏州佳风网络科技有限公司 | A kind of remote control test board electrifying device |
| CN107800445A (en) * | 2016-09-06 | 2018-03-13 | 三菱电机株式会社 | Transmitter, integrated circuit, the test method of test section and integrated circuit |
| CN109406984A (en) * | 2018-09-14 | 2019-03-01 | 上海华岭集成电路技术股份有限公司 | The full ecological chain intelligent test analyzing method of integrated circuit |
| CN109726234A (en) * | 2018-09-14 | 2019-05-07 | 上海华岭集成电路技术股份有限公司 | Integrated circuit testing Information Management System based on industry internet |
| CN110262434A (en) * | 2019-07-10 | 2019-09-20 | 浙江省邮电工程建设有限公司 | A kind of intelligent building project monitor and control management system |
| CN111564383A (en) * | 2020-05-16 | 2020-08-21 | 南京宏泰半导体科技有限公司 | Method for improving productivity of semiconductor test system and semiconductor test system |
| CN113179495A (en) * | 2021-03-31 | 2021-07-27 | 德氪微电子(深圳)有限公司 | Testing device and method adopting millimeter wave communication and storage medium |
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Cited By (17)
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| CN104175313A (en) * | 2013-05-27 | 2014-12-03 | 富泰华工业（深圳）有限公司 | Circuit board test monitoring system and method |
| CN104175313B (en) * | 2013-05-27 | 2018-04-17 | 深圳市精捷能电子有限公司 | Circuit board testing monitoring system and method |
| CN105467256A (en) * | 2015-05-14 | 2016-04-06 | 华润赛美科微电子(深圳)有限公司 | Chip testing and sorting method |
| CN107800445A (en) * | 2016-09-06 | 2018-03-13 | 三菱电机株式会社 | Transmitter, integrated circuit, the test method of test section and integrated circuit |
| CN107800445B (en) * | 2016-09-06 | 2020-01-14 | 三菱电机株式会社 | Transmitter, integrated circuit, detection unit, and method for testing integrated circuit |
| CN106526362A (en) * | 2016-10-25 | 2017-03-22 | 上海移远通信技术股份有限公司 | Test system of wireless communication module |
| CN106771959A (en) * | 2016-11-16 | 2017-05-31 | 上海华岭集成电路技术股份有限公司 | A kind of wafer test system |
| CN107271889A (en) * | 2017-08-18 | 2017-10-20 | 苏州佳风网络科技有限公司 | A kind of remote control test board electrifying device |
| CN109726234A (en) * | 2018-09-14 | 2019-05-07 | 上海华岭集成电路技术股份有限公司 | Integrated circuit testing Information Management System based on industry internet |
| CN109406984A (en) * | 2018-09-14 | 2019-03-01 | 上海华岭集成电路技术股份有限公司 | The full ecological chain intelligent test analyzing method of integrated circuit |
| CN109406984B (en) * | 2018-09-14 | 2021-11-02 | 上海华岭集成电路技术股份有限公司 | Intelligent test analysis method for integrated circuit full ecological chain |
| CN109726234B (en) * | 2018-09-14 | 2023-10-17 | 上海华岭集成电路技术股份有限公司 | Integrated circuit test informatization management system based on industrial Internet |
| CN110262434A (en) * | 2019-07-10 | 2019-09-20 | 浙江省邮电工程建设有限公司 | A kind of intelligent building project monitor and control management system |
| CN110262434B (en) * | 2019-07-10 | 2020-10-09 | 浙江省邮电工程建设有限公司 | Building intelligent engineering monitoring management system |
| CN111564383A (en) * | 2020-05-16 | 2020-08-21 | 南京宏泰半导体科技有限公司 | Method for improving productivity of semiconductor test system and semiconductor test system |
| CN111564383B (en) * | 2020-05-16 | 2021-01-05 | 南京宏泰半导体科技有限公司 | Method for improving productivity of semiconductor test system and semiconductor test system |
| CN113179495A (en) * | 2021-03-31 | 2021-07-27 | 德氪微电子(深圳)有限公司 | Testing device and method adopting millimeter wave communication and storage medium |
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