CN109459678B - Board card testing system and board card testing machine - Google Patents
Board card testing system and board card testing machine Download PDFInfo
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- CN109459678B CN109459678B CN201811176654.4A CN201811176654A CN109459678B CN 109459678 B CN109459678 B CN 109459678B CN 201811176654 A CN201811176654 A CN 201811176654A CN 109459678 B CN109459678 B CN 109459678B
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- 238000012360 testing method Methods 0.000 title claims abstract description 333
- 238000001514 detection method Methods 0.000 claims description 27
- 238000004891 communication Methods 0.000 claims description 23
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- 238000012544 monitoring process Methods 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- FGRBYDKOBBBPOI-UHFFFAOYSA-N 10,10-dioxo-2-[4-(N-phenylanilino)phenyl]thioxanthen-9-one Chemical compound O=C1c2ccccc2S(=O)(=O)c2ccc(cc12)-c1ccc(cc1)N(c1ccccc1)c1ccccc1 FGRBYDKOBBBPOI-UHFFFAOYSA-N 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
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- 238000011990 functional testing Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- 238000003032 molecular docking Methods 0.000 description 1
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- 230000003252 repetitive effect Effects 0.000 description 1
- 238000013522 software testing Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
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Abstract
The application discloses board test system includes: the test fixture comprises a test fixture body, a first module, a second module and a microprocessor, wherein the first module and the second module are arranged on the test fixture body; when the device works, the board card to be tested and the accompanying card are inserted into corresponding clamping grooves of the first module and the second module, and the microprocessor is connected with the first module through the CPU board card; the microprocessor transmits the input signal of the tested board card to the accompanying test card according to the signal channel and outputs an output signal; the microprocessor monitors and judges whether the output signals of the tested board card are consistent with the input signals respectively to determine whether the tested board card passes the test. The board card testing device based on the tested board card and the accompanying testing card and the CPU board card mutually tests, and can test boards of different types in a large batch in an automatic mode, so that the accuracy of testing the board card is improved, and the testing efficiency is improved.
Description
Technical Field
The application relates to the technical field of software testing, in particular to a board testing system, a board testing machine and a board testing system and a board testing machine.
Background
With the development of vehicle-mounted electronic system devices and acquisition technologies, vehicle-mounted reinforced modular control units are increasingly used. The vehicle-mounted equipment of a standard motor train unit is designed by adopting a front wire-outlet-based reinforced mode board card and a modularized chassis type core control unit on a large scale. The vehicle-mounted input/output card and the CPU card can be inserted into the bottom plate of the modularized case, and form a core control unit through communication and power supply buses in the bottom plate, and the CPU card controls the input/output card to work according to requirements, so that vehicle-mounted communication, control and acquisition are realized. In the production of these input-output and CPU cards, functional testing of each card is required to ensure that each channel of each board card is functioning properly. The existing technical means is to test the functions of the board in a manual mode, the test efficiency of the functions of the board in a manual mode is low, and because the yield of the board is huge, the consumption of manpower and material resources is high. Even so, the board test cannot be completed in time, and therefore, an automated batch test is required.
Disclosure of Invention
The application provides a board test system to solve prior art means and carry out the functional test of board through manual mode, manual mode carries out the lower problem of test efficiency to the function of board. The application also provides a board testing machine.
The application provides a board test system, include: the test fixture comprises a test fixture body, a first module, a second module and a microprocessor, wherein the first module and the second module are arranged on the test fixture body;
the first module and the second module are correspondingly provided with clamping grooves for inserting a board card to be tested and a card to be tested;
when the device works, the tested board card and the accompanying test card are inserted into corresponding clamping grooves of the first module and the second module, and the first module and the second module are placed oppositely; the microprocessor is connected to the first module; the microprocessor sends out a control signal, and transmits an input signal passing through the tested board card to the accompanying test card and outputs an output signal through a signal channel formed by connecting the first module, the second module, the tested board card and the accompanying test card; and respectively monitoring the input signal and the output signal through the microprocessor, and judging whether the output signal of the tested board card is consistent with the input signal or not to determine whether the tested board card passes the test or not.
Optionally, the method comprises the following steps: the CPU board card is arranged between the microprocessor and the first module; and the microprocessor sends out a control signal by controlling the CPU board card.
Optionally, the first module includes: the first spring needle is fixed on the first needle bed plate and connected with the first signal plate; the CPU board is inserted into the first signal board through the plug-in unit; the first signal board is internally provided with a communication bus, and the communication bus is connected with the first spring needle.
Optionally, the second module includes: a second signal plate, a second needle bed plate, and a second spring needle; the second spring needle is fixed on the second needle bed plate and connected with the second signal plate; a signal wire is arranged in the second signal plate and is connected to the second spring needle;
the signal channel formed by connecting the first module, the second module, the tested board card and the accompanying test card is specifically that when the tested board card and the accompanying test card are inserted in the corresponding clamping grooves, the tested board card and the accompanying test card are respectively abutted to the first spring needle and the second spring needle, the communication bus is communicated with the signal line to form the signal channel, and the signal channel is used for transmitting the control signal, the input signal and the output signal.
Optionally, the detected board card is a DI board card, and correspondingly, the accompanying board card is a DO board card;
the step of inserting the tested board card and the accompanying test card into the corresponding clamping grooves of the first module and the second module is specifically as follows:
taking a group of DO boards as accompany test boards, and inserting at least two groups of DI boards as tested boards into the corresponding clamping grooves of the first module and the second module;
or the detected clamping plate is an AI plate card, and correspondingly, the accompanying detection clamping plate is an AO plate card;
the step of inserting the tested board card and the accompanying test card into the corresponding clamping grooves of the first module and the second module is specifically as follows:
and taking one group of AO boards as an accompanying board card, and inserting at least two groups of AI boards as tested boards into the corresponding clamping grooves of the first module and the second module.
Optionally, the tested board card is a DO board card, and correspondingly, the accompanying test board card is a DI board card;
the step of inserting the tested board card and the accompanying test card into the corresponding clamping grooves of the first module and the second module is specifically as follows:
inserting the DI board card serving as a test accompanying board and the DO board card serving as a tested board card into a corresponding card slot of the first module and the second module to serve as test accompanying board cards, wherein the DI board card and the DO board card are the same in number and correspond to each other one by one;
Or alternatively
The detected board card is an AO board card, and the accompanying detection board card is an AI board card correspondingly;
the step of inserting the tested board card and the accompanying test card into the corresponding clamping grooves of the first module and the second module is specifically as follows:
and taking the AI board card as a test accompanying board and the AO board card as tested board cards to be inserted into the clamping grooves corresponding to the first module and the second module to be taken as test accompanying board cards, wherein the AI board card and the AO board card have the same quantity and are in one-to-one correspondence.
Optionally, the tested board card is a DO board card, and correspondingly, the accompanying test board card is a DI board card;
the step of inserting the tested board card and the accompanying test card into the corresponding clamping grooves of the first module and the second module is specifically as follows:
taking a group of DI boards as accompany test boards, and inserting at least two groups of DO boards as tested boards into the corresponding clamping grooves of the first module and the second module; the system comprises a plurality of DO boards, a plurality of DI boards, a plurality of DO boards and a plurality of selection circuits, wherein the DI boards are respectively connected with each DO board through the selection circuits so as to realize chip selection of the DO boards;
or,
the detected board card is an AO board card, and the accompanying detection board card is an AI board card correspondingly;
the step of inserting the tested board card and the accompanying test card into the corresponding clamping grooves of the first module and the second module is specifically as follows:
Taking a group of AI boards as accompany test boards, and inserting at least two groups of AO boards as tested boards into the corresponding clamping grooves of the first module and the second module; the AI board card is respectively connected with each AO board card through the selection circuit so as to realize the chip selection of the AO board card;
optionally, the method comprises the following steps: the first module and the second module are detachable structures and are used for replacing different types of the tested board cards and the accompanying test cards.
The application also provides a board testing machine, which comprises the board testing system.
The application also provides a board test system, comprising: the test fixture comprises a test fixture body, a first module, a second module and a microprocessor, wherein the first module and the second module are arranged on the test fixture body;
the first module and the second module are correspondingly provided with clamping grooves for inserting the tested board card; the accompanying test card is inserted into a card slot of the accompanying test card corresponding to the first module and is connected with the second module through a signal wire;
when the device works, the tested board card is inserted into corresponding clamping grooves of the first module and the second module, and the first module and the second module are placed oppositely; the microprocessor is connected with the first module through the accompanying test card; the microprocessor sends out a control signal, and transmits an input signal passing through the tested board card to the accompanying testing card and outputs an output signal through a signal channel formed by connecting the first module, the second module and the tested board card; and respectively monitoring the input signal and the output signal through the microprocessor, and judging whether the output signal of the tested board card is consistent with the input signal or not to determine whether the tested board card passes the test or not.
Optionally, the first module includes: the first spring needle is fixed on the first needle bed plate and connected with the first signal plate; the accompanying board card is connected with the first signal board; the first signal board is internally provided with a communication bus, and the communication bus is connected with the first spring needle.
Optionally, the second module includes: a second signal plate, a second needle bed plate, and a second spring needle; the second spring needle is fixed on the second needle bed plate and connected with the second signal plate; a signal wire is arranged in the second signal plate and is connected to the second spring needle; the accompanying board card is connected with the second signal board.
The application also provides a board testing machine, including: the board card test system is as described above.
Compared with the prior art, the application has the following advantages: the application provides a board test system, include: the test fixture comprises a test fixture body, a first module, a second module and a microprocessor, wherein the first module and the second module are arranged on the test fixture body, and the microprocessor is connected with the test fixture body through a CPU board card; when the device works, the tested board card and the accompanying test card are inserted into corresponding clamping grooves of the first module and the second module, and the first module and the second module are placed oppositely; the microprocessor is connected with the first module through a CPU board card; the microprocessor sends out a control signal, and transmits an input signal passing through the tested board card to the accompanying test card and outputs an output signal through a signal channel formed by connecting the first module, the second module, the tested board card and the accompanying test card; and respectively monitoring the input signal and the output signal through the microprocessor, and judging whether the output signal of the tested board card is consistent with the input signal or not to determine whether the tested board card passes the test or not. The board card testing device based on the tested board card and the accompanying testing card and the CPU board card mutually tests, and can test boards of different types in a large batch in an automatic mode, so that the accuracy of testing the board card is improved, and the testing efficiency is improved.
Drawings
Fig. 1 is a schematic structural diagram of a board testing system according to a first embodiment of the present application;
fig. 2 is a schematic structural diagram of a board testing system according to a second embodiment of the present application;
fig. 3 is a schematic flow chart of a working principle of a board card testing system according to a third embodiment of the present application;
fig. 4 is a schematic flow chart of a working principle of a board card testing system according to another embodiment of the present application.
The board card testing system 1 comprises a testing tool main body 2, a first module 3, a first spring needle 31, a first signal board 32 and a first needle bed board 33; a second module 4, a second pogo pin 41, a second signal board 42, a second needle bed board 43; a CPU board 5, signal lines, a communication bus and a field bus 8; the board card 9 to be tested, the accompanying test card 10 and the microprocessor 11.
Detailed Description
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present application. This application is, however, susceptible of embodiment in many other ways than those herein described and similar generalizations can be made by those skilled in the art without departing from the spirit of the application and the application is therefore not limited to the specific embodiments disclosed below.
A first embodiment of the present application provides a board test system, and fig. 1 is a schematic structural diagram of the board test system provided in the embodiment of the present application.
As shown in fig. 1, a board card testing system 1 provided in an embodiment of the present application includes: the test fixture comprises a test fixture body 2, a first module 3 and a second module 4 arranged on the test fixture body 2, and a microprocessor 11 connected with the test fixture body 2.
The test tool main body 2 is used for bearing a first module 3 and a second module 4, and the first module 3 and the second module 4 in the embodiment of the application are movable, and movable shafts, namely a first movable shaft connected with the first module 3 and a second movable shaft connected with the second module 4, are correspondingly arranged on the test tool main body 2 respectively; and the second movable shaft can drive the second module 4 to move towards the first module 3, and after the test is finished, the second movable shaft can drive the second module 4 to reset. Since the second module 4 is a displacement for the board to be tested 9 and the accompanying card 10 mounted on the first module 3 in cooperation with the first module 3, the second module 4 may be moved in the left-right direction (the left-right movement direction of the second module 4 is defined in one space based on the movement in the up-down direction) in order to achieve accurate docking. Similarly, the first module 3 can also move under the drive of the first movable shaft in the up, down, left and right directions, but considering that the first module 3 carries the board card 9 to be tested and the accompanying card 10, in order to make the test more stable, in general, the first module 3 does not move in the up, down and direction, and can be adjusted according to the actual situation, which is not limited in detail herein. Of course, in the embodiment of the present application, the test is not only directed to one type of board card, so in the embodiment of the present application, the first module 3 and the second module 4 are detachable structures to replace types corresponding to different board cards 9 and co-test cards 10 to be tested; that is, the corresponding components of the first module 3 and the second module 4 will vary, but it is within the scope of the present application to be able to carry and clamp the board card 9 to be tested and the accompanying card 10.
In the first embodiment of the present application, a first spring needle 31, a first signal board 32 and a first needle bed board 33 are specifically arranged on the first module 3; correspondingly, the second module 4 is specifically provided with a second spring needle 41, a second signal board 42 and a second needle bed board 43. Specifically, the test fixture main body 2 in the embodiment of the present application has the following structure:
as shown in fig. 1, the test fixture main body 2 includes a first module 3 and a second module 4, wherein the first module 3 is connected to a microprocessor 11 through a CPU board 5; the first module 3 and the second module 4 are oppositely arranged; the first module 3 and the second module 4 are correspondingly provided with clamping grooves for inserting the tested board card 9 and the accompanying test card 10.
Specifically, the first module 3 is specifically provided with a first spring needle 31, a first signal board 32 and a first needle bed board 33; the first signal board 32 is provided with a communication bus, (i.e., the bus is a public communication trunk line for transmitting information between various functional components of the microprocessor, and is a transmission harness formed by wires, according to the information type transmitted by the microprocessor, the bus of the microprocessor can be divided into a data bus, an address bus and a control bus for transmitting data, data addresses and control signals respectively; the CPU board card 5 is inserted on the first signal board 32 through the plug-in unit; the communication bus is connected to the first pogo pin 31. Correspondingly, the second module 4 is specifically provided with a second spring needle 41, a second signal board 42 and a second needle bed board 43, and the second spring needle 41 is fixed on the second needle bed board 43 and connected with the second signal board 42; the second signal plate 42 is provided with a signal line connected to the second pogo pin 41.
In the structure, clamping grooves for inserting a board card 9 to be tested and a accompanying test card 10 are correspondingly formed in the first module 3 and the second module 4; namely, the board card 9 to be tested and the accompanying test card 10 can be respectively connected with the first module 3 and the second module 4; that is, the board card 9 to be tested and the test card 10 provided on the first module 3 are simultaneously connected to the first pogo pins 31 on the first module 3 and the second pogo pins 41 on the second module 4. It should be noted that, the number of the card slots of the accompanying test card 10 is smaller than or equal to the number of the card slots of the tested board card 9, and correspondingly, the number of the detected accompanying test cards 10 is smaller than or equal to the number of the tested board card 9. It should be noted that, the CPU board 5 may be used as a board to be tested.
Further, in the embodiment of the present application, the board card testing system 1 is mainly used for mutual detection between the board card 9 under test and the accompanying test card 10. Specifically, for easy understanding and combining with the actual detected card situation, the cards that are mutually detected may be a DO (digital output) card and a DI (digital input) card, and an AO (Analog Out) card and an AI (Analog In) card, and the following manner is specifically included In the mutual detection between the detected card 9 and the accompanying card 10:
Mode one: when the DO board is used as the test accompanying card 10 and the di board is used as the test accompanying card 9 for detection, wherein the number of the test accompanying cards 10 can be in one-to-one correspondence with the number of the test accompanying cards 9, and the numbers of the clamping grooves corresponding to the test accompanying cards 9 and 10 arranged on the first module 3 and the second module 4 are in one-to-one correspondence; alternatively, a set of DO boards may be used as the accompanying test card 10, which may correspondingly detect that at least two sets of DI boards are inserted as the tested boards 9 into the card slots opposite to the first module 3 and the second module 4.
Similarly, when the AO board card is used as the accompanying test card 10 and the ai board card is used as the tested board card 9 for detection, the number of the accompanying test cards 10 may be in one-to-one correspondence with the number of the tested board cards 9, and the numbers of the clamping grooves corresponding to the tested board cards 9 and the accompanying test cards 10 arranged on the first module 3 and the second module 4 are in one-to-one correspondence; optionally, one group of AO boards is taken as a co-test card 10, which can correspondingly detect that at least two groups of AI boards are taken as tested boards 9 to be inserted into the corresponding clamping grooves of the first module 3 and the second module 4;
mode two: when the DI board card is used as the accompanying test card 10 and the DO board card is used as the tested board card 9 for detection, the number of the accompanying test cards 10 corresponds to the number of the tested board cards 9 one by one; the number of the clamping grooves corresponding to the tested board card 9 and the accompanying test card 10 arranged on the first module 3 and the second module 4 is one-to-one correspondence.
Similarly, when the AI board is used as the accompanying test card 10 and the ao board is used as the tested board 9 for detection, the number of the accompanying test cards 10 corresponds to the number of the tested boards 9 one by one; the number of the clamping grooves corresponding to the tested board card 9 and the accompanying test card 10 arranged on the first module 3 and the second module 4 is one-to-one correspondence.
It should be noted that, in the above two mutual measurement methods, whether the DO board is used as the co-test card 10 to detect the DI board of the tested board 9, or the DI board is used as the co-test card 10 to detect the DO board of the tested board 9, the detection is that the microprocessor 11 sends out the control signal, and the tested board 9 and the co-test card 10 determine whether the tested board 9 can pass the test according to whether the corresponding input signal (or output signal) and the corresponding output signal (or input signal) are consistent. The AI board and AO board are the same.
It can be seen that the mutual test between the tested board card 9 and the accompanying test card 10 is performed by selecting a detected route according to the control of the CPU board card 5 by the microprocessor 11. Of course, the mutual test between the tested board card 9 and the accompanying test card 10 can correspondingly change the positions of the tested board card 9 and the accompanying test card 10 inserted in the corresponding card slots while selecting the detection route according to the control of the CPU board card 5 by the microprocessor 11, so as to realize the test of the board card test system 1 on a large number of different types of board cards.
A first embodiment of the present application provides a board test system 1, including: the test fixture comprises a test fixture body 2, a first module 3 and a second module 4 which are arranged on the test fixture body 2, and a microprocessor 11 which is connected with the test fixture body 2 through a CPU board 5; during operation, the board card 9 to be tested and the accompanying card 10 are inserted into corresponding clamping grooves of the first module 3 and the second module 4, and the first module 3 and the second module 4 are placed oppositely; the microprocessor 11 is connected to the first module 3 through the CPU board 5; the microprocessor 11 sends out control signals, and transmits input signals passing through the tested board card 9 to the accompanying test card 10 and outputs output signals through a signal channel formed by connecting the first module 3, the second module 4, the tested board card 9 and the accompanying test card 10; the microprocessor 11 monitors the input signal and the output signal respectively, and judges whether the output signal of the board card 9 to be tested is consistent with the input signal to determine whether the board card 9 to be tested passes the test. The board card testing device based on the tested board card and the accompanying testing card and the CPU board card mutually tests, and can test boards of different types in a large batch in an automatic mode, so that the accuracy of testing the board card is improved, and the testing efficiency is improved.
The first embodiment of the application also provides a board testing machine, comprising: such as the board card test system 1 described above. The board card tester can be used for batch operation of a production line. Based on the characteristics that the board card testing machine possesses board card test system 1, so the board card testing machine is based on the board card that is surveyed and accompany to survey card and CPU board card and test each other, can test different types of board card in batches through automatic mode, and improved the rate of accuracy of test board card to the efficiency of test has been improved.
A second embodiment of the present application provides a board testing system, and fig. 2 is a schematic structural diagram of the board testing system provided in the embodiment of the present application.
As shown in fig. 2, the test fixture main body 2 includes a first module 3 and a second module 4, and the first module 3 is connected to the microprocessor 11; the first module 3 and the second module 4 are oppositely arranged; the first module 3 and the second module 4 are correspondingly provided with clamping grooves for inserting a board card 9 to be tested and a test accompanying card 10;
specifically, the first module 3 is specifically provided with a first spring needle 31, a first signal board 32 and a first needle bed board 33; the first signal board 32 is provided with a communication bus, and the first spring needle 31 is fixed on the first needle bed board 33 and connected with the first signal board 32; the CPU board card 5 is inserted on the first signal board 32 through an inserting piece; the communication bus is connected to the first pogo pin 31.
Correspondingly, the second module 4 is specifically provided with a second spring needle 41, a second signal board 42 and a second needle bed board 43, and the second spring needle 41 is fixed on the second needle bed board 43 and connected with the second signal board 42; the second signal board 42 is provided with a signal line (the signal line mainly means a line for transmitting sensing information and control information in the electric control circuit), and the signal line is connected to the second pogo pin 41.
Wherein, in the structure, the card slot of the test card 10 is arranged on the first module 3, the test card 10 can be connected with the first signal board 32 on the first module 3, and the number of the card slots of the test card 10 can be one or at least more than one; correspondingly, the first module 3 and the second module 4 are correspondingly provided with clamping grooves for inserting the tested board card 9, namely the tested board card 9 can be respectively connected with the first module 3 and the second module 4, and the number of the clamping grooves of the tested board card 9 is at least one; that is, the test card 10 provided on the first module 3 is connected to the first pogo pin 31, but is not directly connected to the second pogo pin 41; the board card 9 to be tested arranged on the first module 3 is simultaneously connected to the first spring pins 31 on the first module 3 and to the second spring pins 41 on the second module 4.
It should be noted that, in the test tool main body 2 having the above structure, the second module 4 can move toward the first module 3 on the test tool main body 2, and move to the contact position with the board card 9 (or the accompanying test card 10) to be tested in cooperation with the first module 3; the second spring needle 41 of the second module 4 is abutted with the abutting position of the upper end of the tested board card 9 (or the accompanying test card 10), and the first spring needle 31 of the first module 3 is abutted with the abutting position of the lower end of the tested board card 9 (or the accompanying test card 10); after the test is finished, the first module 3 and the second module 4 are reset. The abutment position is set according to the actual situation, for example, the sizes of the volumes of the tested board card 9 and the accompanying test card 10, and the specific positions of the tested board card 9 and the accompanying test card 10 which are clamped in the clamping grooves (more than one); when the first module 3 and the second module 4 reach the abutting position, the second module 4 needs to move continuously towards the first module 3, so that the abutting part of the second spring needle 41 can be abutted with the abutting position of the upper end of the board card 9 to be tested and the abutting position of the upper end of the accompanying card 10; so that the abutting portion of the first spring pin 31 abuts against the abutting position of the lower end of the board card 9 under test and abuts against the abutting position of the lower end of the accompanying card 10.
It should be noted that, in the embodiment of the present application, the test accompanying card 10 is a board card with no fault and good function, that is, on the premise that the test accompanying card 10 functions normally, the test accompanying card is used for testing whether the function of the tested board card 9 is normal.
Further, in the embodiment of the present application, the board card testing system 1 is mainly used for mutual detection between the board card 9 under test and the accompanying test card 10. Specifically, in order to facilitate understanding and combine with the actual detection card situation, the cards that mutually detect may be a DO card and a DI card, and an AO card and an AI card, and then the mutual detection between the tested card 9 and the accompanying card 10 specifically includes the following ways:
mode one: when the DO board is used as the test accompanying card 10 and the di board is used as the test accompanying card 9 for detection, wherein the number of the test accompanying cards 10 can be in one-to-one correspondence with the number of the test accompanying cards 9, and the numbers of the clamping grooves corresponding to the test accompanying cards 9 and 10 arranged on the first module 3 and the second module 4 are in one-to-one correspondence; in the preferred embodiment, a set of DO boards is used as a test accompanying card 10, which can correspondingly detect that at least two sets of DI boards are used as tested boards 9 to be inserted into the corresponding card slots of the first module 3 and the second module 4; namely, the DO board card is detected through a one-to-many relationship, and correspondingly, only a corresponding group of clamping grooves for accompanying test cards 10 and at least two groups of clamping grooves for tested boards 9 are arranged on the first module 3 and the second module 4. Or a group of clamping grooves for the accompanying test card 10 are arranged on the first module 3, the accompanying test card 10 is respectively connected with the first signal board 32 and the second signal board 42, and a plurality of clamping grooves for the tested board cards 9 are correspondingly arranged on the first module 3 and the second module 4.
Similarly, when the AO board card is used as the accompanying test card 10 and the ai board card is used as the tested board card 9 for detection, the number of the accompanying test cards 10 may be in one-to-one correspondence with the number of the tested board cards 9, and the numbers of the clamping grooves corresponding to the tested board cards 9 and the accompanying test cards 10 arranged on the first module 3 and the second module 4 are in one-to-one correspondence; in the preferred embodiment, a group of AO boards is taken as a co-test card 10, which can correspondingly detect that at least two groups of AI boards are taken as tested boards 9 to be inserted into the corresponding card slots of the first module 3 and the second module 4; namely, the AI board card is detected by the AO board card through a one-to-many relationship, and correspondingly, only a corresponding group of clamping grooves for accompanying test cards 10 and at least two groups of clamping grooves for tested board cards 9 are arranged on the first module 3 and the second module 4. Or a group of clamping grooves for accompanying test cards 10 are formed in the first module 3, the accompanying test cards 10 are respectively connected to the first signal board 32 and the second signal board 42, and a plurality of clamping grooves for tested board cards 9 are correspondingly formed in the first module 3 and the second module 4.
Mode two: when the DI board card is used as the accompanying test card 10 and the DO board card is used as the tested board card 9 for detection, the microprocessor controls the CPU board card to carry out chip selection, one group of DI board cards are used as the accompanying test board card 10, and at least two groups of DO board cards are used as the tested board card 9 to be inserted into the corresponding card slots of the first module 3 and the second module 4; the system also comprises a selection circuit (not shown), and the DI board card is respectively connected with each DO board card through the selection circuit so as to realize the chip selection of the DO board cards. Correspondingly, only a group of corresponding clamping grooves for accompanying test cards 10 are formed in the first module 3 and the second module 4, and a plurality of groups of clamping grooves for tested boards 9 are formed in the first module 3 and the second module 4 correspondingly; or a clamping groove of the accompanying test card 10 is arranged on the first module 3, the accompanying test card 10 is respectively connected with the first signal board 32 and the second signal board 42, and a plurality of clamping grooves of the tested board cards 9 are correspondingly arranged on the first module 3 and the second module 4.
Similarly, when the AI board card is used as the accompanying test card 10 and the AO board card is used as the tested board card 9 for detection, the microprocessor controls the CPU board card to perform chip selection, and then one group of AI board cards are used as the accompanying test board card 10, and at least two groups of AO board cards are used as the tested board card 9 to be inserted into the corresponding card slots of the first module 3 and the second module 4; the AI board card is respectively connected with each AO board card through the selection circuit so as to realize the chip selection of the AO board card. Correspondingly, only a group of corresponding clamping grooves for accompanying test cards 10 are formed in the first module 3 and the second module 4, and a plurality of groups of clamping grooves for tested boards 9 are formed in the first module 3 and the second module 4 correspondingly; or a clamping groove of the accompanying test card 10 is arranged on the first module 3, the accompanying test card 10 is respectively connected with the first signal board 32 and the second signal board 42, and a plurality of clamping grooves of the tested board cards 9 are correspondingly arranged on the first module 3 and the second module 4.
It should be noted that, in the above three mutual measurement methods, whether the DO board is used as the co-test card 10 to detect the DI board of the tested board 9, or the DI board is used as the co-test card 10 to detect the DO board of the tested board 9, the detection is that the microprocessor 11 sends out the control signal, and the tested board 9 and the co-test card 10 determine whether the tested board 9 can pass the test according to whether the corresponding input signal (or output signal) and the corresponding output signal (or input signal) are consistent. The AI board and AO board are the same.
It can be seen that the mutual test between the tested board card 9 and the accompanying test card 10 is performed by selecting a detected route according to the control of the CPU board card 5 by the microprocessor 11. Of course, the mutual test between the tested board card 9 and the accompanying test card 10 can correspondingly change the positions of the tested board card 9 and the accompanying test card 10 inserted in the corresponding card slots while selecting the detection route according to the control of the CPU board card 5 by the microprocessor 11, so as to realize the test of the board card test system 1 on a large number of different types of board cards.
It can be understood that taking the mutual detection between the board card 9 under test and the accompanying card 10 in the test fixture body 2 of the first embodiment as an example:
the tested board 9 and the accompanying test card 10 are inserted between the first module 3 and the second module 4, and are connected through the first spring pin 31 and the second spring pin 41, the microprocessor 11 is connected to the first module 3 through the CPU board 5, the communication bus is communicated with the signal line to form a signal channel and communicated with the signal channel, the signal channel is used for transmitting control signals, input signals and output signals, namely, the microprocessor 11 sends out control signals, and the CPU board 5 transmits the control signals, the input signals and the output signals through the communication bus and the signal line; the input signal of the tested board card 9 is transmitted to the accompanying test card 10 and output an output signal; the microprocessor 11 reads the input signal and the output signal respectively, and judges that the input signal is consistent with the output signal, and the tested board card 9 passes the test; otherwise, it does not pass.
In the embodiment of the application, the CPU board 5 is disposed between the microprocessor 11 and the first module 3. The microprocessor 11 is connected with the CPU board 5 through the field bus 8 (the transmission of the traditional 4-20mA analog signal and the common switching value signal is replaced by digital communication, and the transmission is an all-digital, two-way and multi-station communication system for connecting the intelligent field device and an automation system). The microprocessor 11 is connected to the first module 3 through the CPU board 5, and the microprocessor 11 sends out a control signal by controlling the CPU board 5. The CPU board 5 may be tested as a card to be tested.
Further, taking mutual detection between the board card 9 under test and the accompanying card 10 in the test fixture body 2 of the second embodiment as an example:
the accompanying test card 10 is inserted on the first module 3 and connected with the first signal board 32, the tested board 9 connects the first module 3 and the second module 4, so that a signal channel is formed by communicating the communication bus and the signal line and is communicated, and the microprocessor 11 sends out control signals and transmits control signals, input signals and output signals through the communication bus and the signal line; transmitting the input signal passing through the board card 9 to be tested to the accompanying test card 10 and outputting an output signal; the microprocessor 11 reads the input signal and the output signal respectively, and judges that the input signal is consistent with the output signal, and the tested board card 9 passes the test; otherwise, it does not pass.
It should be noted that, in order to identify which input signal of the tested board 9 corresponds to which output signal of the accompanying test card 10, the function of the control logic module of the microprocessor 11 is needed to be implemented, specifically, the number of the tested boards 9 is larger than the number of the accompanying test cards 10, the microprocessor 11 sends out control signals by controlling the CPU board 5 to respectively read the feedback input signals of each tested board 9, and simultaneously read the output signal of one accompanying test card 10, and compare whether the input signals are consistent with the output signals, so as to determine whether the functions of the tested boards 9 are good; and based on that each tested card 9 input signal has a corresponding mark, the microprocessor 11 can clearly distinguish which tested card 9 corresponding to the tested card 9 input signal channel has a problem (the accompanying test card 10 has good function, and the board card with the same model as the tested card 9 is preferably selected).
The same principle is also true when the number of board cards 9 to be tested is equal to the number of accompanying cards 10, and a repetitive description will not be made here.
In order to further explain the operation principle of the microprocessor 11 in the board test system 1, the following description will be made in detail with reference to the third embodiment.
In the third embodiment of the present application, referring to fig. 3, step S301 scans and reads two-dimensional code information of the co-test card 10 and the board card 9 to be tested in batch; the microprocessor 11 acquires the corresponding accompanying test card 10 and the tested board card 9 according to the two-dimension code information.
Step S302, sending an instruction for reading the quantity of the accompanying test card 10 and the tested board card 9; wherein, based on the different required numbers of the accompanying test card 10 and the tested board card 9 in the board card testing system 1, the instructions for sending and reading the numbers of the accompanying test card 10 and the tested board card 9 are also different.
After the number of the test accompanying cards 10 and the number of the tested boards 9 are read, respectively judging whether the number of the test accompanying cards 10 and the number of the tested boards 9 are consistent with the number of the test accompanying cards 10 and the number of the tested boards 9 which are actually installed in the board test system 1 according to the step S303; if so, executing step S304; if the numbers of the accompanying test cards 10 and the tested board cards 9 are inconsistent, the number of the accompanying test cards 10 and the tested board cards 9 can be further judged manually, and the manual judgment is only to ensure that the numbers of the accompanying test cards 10 and the tested board cards 9 are consistent, so that the accuracy is improved.
In step S304, a control command is sent according to the different types of the tested boards 9, where the different types of the tested boards 9 are different, for example, the tested boards 9 may be DO boards or DI boards, AO boards and AI boards, and the like, and then the sent control commands are different.
Step S305, a read command is sent. Step S306, decoding according to the requirement of the tested board card 9.
After the decoding is completed, the algorithm is judged according to step S307. Wherein, the algorithm judgment in the step mainly comprises the judgment of signals; and if the algorithm is correct, executing step S308; if the algorithm is incorrect, step S309 is performed.
Step S308, the board 9 to be tested passes, and step S310 is performed.
Step S309, record the problem channel, and execute step S310. This step S309 can clearly know which board 9 to be tested has a problem, so as to repair the problem board 9 in time.
Step S310, forming and recording a report, executing step S311, judging whether the next batch of the tested board cards 9 are tested, and returning to execute step S301. The report includes the information of the passing tested board card 9 and the information of the failed tested board card 9.
Further, in other embodiments, considering that the microprocessor 11 of the board card testing system 1 may also cooperate with the CPU board card 5 to test the board card 9 under test, the specific explanation will be described with reference to fig. 4.
In step S401, the information of the corresponding co-test card 10 and the tested board card 9 on the bus is read.
Step S402, receives a control instruction sent by the microprocessor 11. And performs step S403.
Step S403, determining whether to control the output command, wherein the control output is mainly a signal, i.e. the input signal for controlling the board card 9 to be tested is transmitted to the accompanying card 10 and the output signal is outputted. If the control output needs to be issued, step S404 is executed, and if the control output does not need to be issued, step S405 is executed.
Step S404, a control output instruction is issued.
Step S405, judging whether to read the input instruction, if the input instruction is required to be read, executing step S406, and if the input instruction is not required to be read, executing step S408, and reading the instruction of the information of the accompanying test card 10 and the tested board card 9; and returns to step S401.
In step S406, the input is read. Step S407, and reads the content of the signal.
The operation principle of the board card testing system 1 for detecting the board card 9 to be tested is clearly explained by describing the operation principle of the microprocessor 11 and the CPU board card 5 in the board card testing system 1.
A second embodiment of the present application provides a board test system 1, including: a test fixture body 2, a first module 3 and a second module 4 arranged on the test fixture body 2, and a microprocessor 11 connected with the test fixture body 2; the first module 3 and the second module 4 are correspondingly provided with clamping grooves for inserting the board card 9 to be tested; the accompanying test card 10 is inserted into a card slot of the accompanying test card 10 corresponding to the first module 3 and is connected with the second module 4 through a signal wire; during operation, the board card 9 to be tested is inserted into corresponding clamping grooves of the first module 3 and the second module 4, and the first module 3 and the second module 4 are placed oppositely; the microprocessor 11 is connected to the first module 3 through a companion test card 10; the microprocessor 11 sends out control signals, and transmits input signals passing through the tested board card 3 to the accompanying test card 10 and outputs output signals through a signal channel formed by connecting the first module 3, the second module 4 and the tested board card 3; the microprocessor 11 monitors the input signal and the output signal respectively, and judges whether the output signal of the board card 9 to be tested is consistent with the input signal to determine whether the board card 9 to be tested passes the test.
The second embodiment of the present application further provides a board card testing machine, including: such as the board card test system 1 described above. The board card tester can be used for batch operation of a production line. The board cards of different types can be tested in a large batch in an automatic mode, the accuracy of testing the board cards is improved, and the testing efficiency is improved.
Although the second embodiment is disclosed, it is not intended to limit the present application, and any person skilled in the art can make possible variations and modifications without departing from the spirit and scope of the present application, so the scope of protection of the present application shall be subject to the scope defined by the claims of the present application.
Claims (10)
1. A board test system, comprising: the test fixture comprises a test fixture body, a first module, a second module and a microprocessor, wherein the first module and the second module are arranged on the test fixture body;
the first module and the second module are correspondingly provided with clamping grooves for inserting a tested board card and a test accompanying card, and the tested board card and the test accompanying card arranged on the first module are simultaneously connected with a first spring needle on the first module and a second spring needle on the second module; the mutual test between the tested board card and the accompanying test card can correspondingly change the positions of the tested board card and the accompanying test card inserted in the corresponding card slot when the CPU board card is controlled by the microprocessor to select a detection route so as to realize the test of the board card test system on different types of board cards;
When the device works, the tested board card and the accompanying test card are inserted into corresponding clamping grooves of the first module and the second module, and the first module and the second module are placed oppositely; the microprocessor is connected to the first module; the microprocessor sends out a control signal, and transmits an input signal passing through the tested board card to the accompanying test card and outputs an output signal through a signal channel formed by connecting the first module, the second module, the tested board card and the accompanying test card; the microprocessor monitors the input signal and the output signal respectively, and judges whether the output signal of the tested board card is consistent with the input signal or not to determine whether the tested board card passes the test or not;
the CPU board card is arranged between the microprocessor and the first module; the microprocessor sends out a control signal by controlling the CPU board card;
the first module includes: the first spring needle is fixed on the first needle bed plate and connected with the first signal plate; the CPU board is inserted into the first signal board through the plug-in unit; a communication bus is arranged in the first signal board and is connected with the first spring needle;
The second module includes: a second signal plate, a second needle bed plate, and a second spring needle; the second spring needle is fixed on the second needle bed plate and connected with the second signal plate; a signal wire is arranged in the second signal plate and is connected to the second spring needle;
the signal channel formed by the connection of the first module, the second module, the tested board card and the accompanying test card is specifically that when the tested board card and the accompanying test card are inserted in the corresponding clamping grooves, the tested board card is abutted with the first spring needle and the second spring needle, and the accompanying test card is abutted with the first spring needle and the second spring needle; the communication bus is communicated with the signal line to form the signal channel, and the signal channel is used for transmitting the control signal, the input signal and the output signal.
2. The board card testing system of claim 1, wherein the board card under test is a DI board card, and the accompanying board card is a DO board card;
the step of inserting the tested board card and the accompanying test card into the corresponding clamping grooves of the first module and the second module is specifically as follows:
taking a group of DO boards as accompany test boards, and inserting at least two groups of DI boards as tested boards into opposite clamping grooves of the first module and the second module;
Or the detected clamping plate is an AI plate card, and correspondingly, the accompanying detection clamping plate is an AO plate card;
the step of inserting the tested board card and the accompanying test card into the corresponding clamping grooves of the first module and the second module is specifically as follows:
and taking one group of AO boards as accompany test boards, and inserting at least two groups of AI boards as tested boards into opposite clamping grooves of the first module and the second module.
3. The board card testing system of claim 1, wherein the board card under test is a DO board card, and the accompanying board card is a DI board card;
the step of inserting the tested board card and the accompanying test card into the corresponding clamping grooves of the first module and the second module is specifically as follows:
inserting the DI board card serving as a test accompanying board and the DO board card serving as a tested board card into a corresponding card slot of the first module and the second module to serve as test accompanying board cards, wherein the DI board card and the DO board card are the same in number and correspond to each other one by one;
or alternatively
The detected board card is an AO board card, and the accompanying detection board card is an AI board card correspondingly;
the step of inserting the tested board card and the accompanying test card into the corresponding clamping grooves of the first module and the second module is specifically as follows:
and taking the AI board card as a test accompanying board and the AO board card as tested board cards to be inserted into the clamping grooves corresponding to the first module and the second module to be taken as test accompanying board cards, wherein the AI board card and the AO board card have the same quantity and are in one-to-one correspondence.
4. The board card testing system of claim 1, wherein the board card under test is a DO board card, and the accompanying board card is a DI board card;
the step of inserting the tested board card and the accompanying test card into the corresponding clamping grooves of the first module and the second module is specifically as follows:
taking a group of DI boards as accompany test boards, and inserting at least two groups of DO boards as tested boards into the corresponding clamping grooves of the first module and the second module; the system comprises a DO board card, a plurality of DO board cards and a selection circuit, wherein the DI board card is connected with each DO board card through the selection circuit so as to realize chip selection of the DO board card;
or,
the detected board card is an AO board card, and the accompanying detection board card is an AI board card correspondingly;
the step of inserting the tested board card and the accompanying test card into the corresponding clamping grooves of the first module and the second module is specifically as follows:
taking a group of AI boards as accompany test boards, and inserting at least two groups of AO boards as tested boards into the corresponding clamping grooves of the first module and the second module; the AI board card is respectively connected with each AO board card through the selection circuit so as to realize the chip selection of the AO board card.
5. The board card testing system of claim 1, comprising: the first module and the second module are detachable structures and are used for replacing different types of the tested board cards and the accompanying test cards.
6. A board card testing machine, characterized by comprising: the board card testing system of any of claims 1-5.
7. A board test system, comprising: the test fixture comprises a test fixture body, a first module, a second module and a microprocessor, wherein the first module and the second module are arranged on the test fixture body;
the first module and the second module are correspondingly provided with clamping grooves for inserting the tested board card; the accompanying test card is inserted into a card slot of the accompanying test card corresponding to the first module and is connected with the second module through a signal wire; the mutual test between the tested board card and the accompanying test card can correspondingly change the positions of the tested board card and the accompanying test card inserted in the corresponding card slot when the CPU board card is controlled by the microprocessor to select a detection route so as to realize the test of the board card test system on different types of board cards;
when the device works, the tested board card is inserted into corresponding clamping grooves of the first module and the second module, and the first module and the second module are placed oppositely; the microprocessor is connected with the first module through a accompany test card; the microprocessor sends out a control signal, and transmits an input signal passing through the tested board card to the accompanying testing card and outputs an output signal through a signal channel formed by connecting the first module, the second module and the tested board card; and respectively monitoring the input signal and the output signal through the microprocessor, and judging whether the output signal of the tested board card is consistent with the input signal or not to determine whether the tested board card passes the test or not.
8. The board card testing system of claim 7, wherein the first module comprises: the first spring needle is fixed on the first needle bed plate and connected with the first signal plate; the accompanying board card is connected with the first signal board; the first signal board is internally provided with a communication bus, and the communication bus is connected with the first spring needle.
9. The board card testing system of claim 8, wherein the second module comprises: a second signal plate, a second needle bed plate, and a second spring needle; the second spring needle is fixed on the second needle bed plate and connected with the second signal plate; a signal wire is arranged in the second signal plate and is connected to the second spring needle; the accompanying board card is connected with the second signal board.
10. A board card testing machine, characterized by comprising: the board card testing system of any of claims 7-9.
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| CN201811176654.4A CN109459678B (en) | 2018-10-10 | 2018-10-10 | Board card testing system and board card testing machine |
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| CN111239584A (en) * | 2019-12-31 | 2020-06-05 | 视航机器人（佛山）有限公司 | Mainboard testing device, system and method applied to unmanned forklift |
| WO2021134384A1 (en) * | 2019-12-31 | 2021-07-08 | 视航机器人（佛山）有限公司 | Main board test device, system and method applied to unmanned forklift |
| CN113391196B (en) * | 2021-06-15 | 2022-07-26 | 卡斯柯信号有限公司 | Self-checking method for train-mounted speed measurement positioning board card |
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