CN102763215A - 垂直安装集成电路的方法 - Google Patents
垂直安装集成电路的方法 Download PDFInfo
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- 238000000034 method Methods 0.000 title claims abstract description 28
- 239000000758 substrate Substances 0.000 claims abstract description 15
- 230000005291 magnetic effect Effects 0.000 claims description 45
- 239000000126 substance Substances 0.000 claims description 15
- 229910000679 solder Inorganic materials 0.000 claims description 8
- 238000009434 installation Methods 0.000 claims description 6
- 238000005520 cutting process Methods 0.000 claims description 5
- 229910000510 noble metal Inorganic materials 0.000 claims 2
- 230000003647 oxidation Effects 0.000 claims 2
- 238000007254 oxidation reaction Methods 0.000 claims 2
- 239000003989 dielectric material Substances 0.000 abstract 1
- 238000005516 engineering process Methods 0.000 description 14
- 238000003466 welding Methods 0.000 description 10
- 230000008021 deposition Effects 0.000 description 9
- 239000004020 conductor Substances 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 7
- 229910052782 aluminium Inorganic materials 0.000 description 5
- 239000004411 aluminium Substances 0.000 description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 5
- 229910052802 copper Inorganic materials 0.000 description 5
- 239000010949 copper Substances 0.000 description 5
- 238000005538 encapsulation Methods 0.000 description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 4
- 229910052581 Si3N4 Inorganic materials 0.000 description 4
- 230000005290 antiferromagnetic effect Effects 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- 230000008878 coupling Effects 0.000 description 4
- 238000010168 coupling process Methods 0.000 description 4
- 238000005859 coupling reaction Methods 0.000 description 4
- 238000005530 etching Methods 0.000 description 4
- 230000005294 ferromagnetic effect Effects 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 238000001259 photo etching Methods 0.000 description 4
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 4
- 230000004044 response Effects 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 4
- 238000012360 testing method Methods 0.000 description 4
- MWUXSHHQAYIFBG-UHFFFAOYSA-N Nitric oxide Chemical compound O=[N] MWUXSHHQAYIFBG-UHFFFAOYSA-N 0.000 description 3
- 230000004888 barrier function Effects 0.000 description 3
- 239000004642 Polyimide Substances 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- NCMAYWHYXSWFGB-UHFFFAOYSA-N [Si].[N+][O-] Chemical compound [Si].[N+][O-] NCMAYWHYXSWFGB-UHFFFAOYSA-N 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- 229910052715 tantalum Inorganic materials 0.000 description 2
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 2
- MZLGASXMSKOWSE-UHFFFAOYSA-N tantalum nitride Chemical compound [Ta]#N MZLGASXMSKOWSE-UHFFFAOYSA-N 0.000 description 2
- 229910005811 NiMnSb Inorganic materials 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000003302 ferromagnetic material Substances 0.000 description 1
- 238000013100 final test Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 230000001939 inductive effect Effects 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 230000005415 magnetization Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 229910052762 osmium Inorganic materials 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 229910052702 rhenium Inorganic materials 0.000 description 1
- 229910052703 rhodium Inorganic materials 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
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Abstract
在电路板(300、700)或第二集成电路(706)上安装第一集成电路(102、500、704)的方法,该第一集成电路(102、500、704)形成在衬底(104)之上且具有背对衬底(104)的表面(119)以及与表面(119)基本正交的侧面(122、530、930),并包括耦接到电路(102、500、704)且形成在电介质材料(120、518)中的导电元件(116、117、118、522、524、526、528、528'、528"),该电路板或该第二集成电路包括接触点(304、306、314),该方法包括切割(1104)该第一集成电路以在侧面(222、630、1030)上暴露导电元件(116、117、118、522、524、526、528、528'、528"),以及通过对准暴露于该侧面的导电元件以产生电接触,将该第一集成电路安装(1108)在电路板或第二集成电路上。
Description
技术领域
本发明总体上涉及集成电路封装方法和结构,更特别地,涉及垂直安装集成电路(诸如薄膜磁场传感器)的方法。
背景技术
许多集成电路安装方法已经随时间而进化,包括,仅举几例,用于双列直插式封装(DIP)、引脚网格阵列(PGA)、球栅阵列(BGA)、无引线芯片载具(LCC)和小外形集成电路(SOIC)的安装方法。对集成电路进行封装有助于将集成电路安装在电路板上,与其它集成电路电隔离以及保护集成电路免于暴露到环境。集成电路包含多个电接触焊盘,电接触焊盘例如通过焊接在电接触焊盘与电路板上的引线之间的导线耦接到电路板上的引线。集成电路通常安装(水平地)得衬底邻近电路板,且被包封在塑料或陶瓷中。
特定集成电路执行的一些功能要求将集成电路安装得垂直于电路板(垂直地)。例如,感测磁场的集成电路要求三个垂直轴(x、y、z方向)的感测。轴中的两个(x和y)可以通过对于每个轴将传感器(或多个传感器)水平安装在电路板上来被感测。第三轴(z)可以通过垂直地安装传感器(或多个传感器)来被感测。
霍尔传感器一般响应于垂直于衬底表面的离面场分量,而薄膜磁致电阻传感器响应于面内施加的磁场。利用这些响应轴,小占用面积的三轴感测方案的开发通常包括多芯片模块,一个或更多芯片定位得彼此成直角。对于磁致电阻传感器,正交的面内分量可以通过精心的传感器设计来获得,但是离面响应一般通过利用电接触垂直地安装的第二芯片来获取,该电接触通过某些类型的垂直焊接来制成,诸如跨过正交接触的焊料回流。由于垂直焊接芯片的尺寸一般由接触焊盘的尺寸和节距支配,这样的技术导致所完成的封装的大垂直尺度,增加了管芯和装配成本,并使得芯片级封装变得困难和昂贵。由于磁传感器能利用磁隧道结技术以非常小的占用面积便宜地制造,所以封装和最终测试成为总体成本的显著贡献者。
描述于美国专利7,494,920中的一种已知方法将集成电路安装在印刷电路板上且将集成电路上的焊盘耦接到印刷电路板上的引线。印刷电路板被切割以暴露印刷电路板中的通路。该结构被垂直安装,所暴露的通路接触另一印刷电路板上的接触点。然而,该垂直安装增加了器件的物理尺寸和制造复杂度。
因此,需要改善的设计和制造工艺以用于直接在印刷电路板上或者直接在另一集成电路上垂直地安装集成电路。还需要三轴磁场传感器,其能高效且便宜地构造为在移动应用中使用的集成电路结构。还需要改善的磁场传感器和制造以克服本领域中的问题,诸如上面概述的问题。此外,本发明的其它期望特征和特性将从后面结合附图和本背景技术的详细说明以及所附权利要求变得显然。
发明内容
一种将第一集成电路安装于电路板或第二集成电路之一上的方法,该第一集成电路形成于衬底之上且具有背对该衬底的表面以及与该表面基本正交的侧面,并包括耦接到电路且形成在电介质材料中的导电元件,电路板或第二集成电路的所述之一包括接触点,该方法包括切割该第一集成电路以在该侧面上暴露该导电元件,以及通过对准暴露在该侧面上的导电元件以产生与该接触点的电接触,将该第一集成电路安装在电路板或第二集成电路的所述之一上。
附图说明
在下文中将结合下面的附图来描述本发明,附图中相似的附图标记表示相似的元件,且
图1是已知集成电路的横截面图;
图2是根据第一示范性实施例,被切割以暴露接触焊盘的图1的集成电路的横截面图;
图3是已知电路板的俯视图;
图4是根据第一示范性实施例,垂直安装在图3的电路板上的图2的集成电路的俯视图;
图5是磁隧道结器件和多个接触焊盘的横截面图;
图6是根据第一示范性实施例,被切割以暴露多个接触焊盘的图5的磁隧道结器件的横截面图;
图7是具有设置于其上的第一、第二和第三集成电路的电路板的俯视图,第一和第三集成电路以已知方式安装,第二集成电路垂直地安装;
图8是根据第一示范性实施例的图7的安装于第三集成电路上的第二集成电路的俯视图;
图9是图5的磁隧道结器件和通路的横截面图;
图10是根据第二示范性实施例,被切割以暴露多个通路的图9的磁隧道结器件的横截面图;以及
图11是示范性实施例的步骤的流程图。
具体实施方式
下面的具体实施方式本质上仅是示范性的且无意限制本发明或者本发明的应用和使用。此外,无意被前面的技术领域、背景技术、发明内容或者下面的具体实施方式中给出的任何明确的或者暗示的理论所束缚。
在这里教导的第一示范性实施例中,第一集成电路,例如展现隧穿磁致电阻的磁隧道结(MTJ)传感器,被切割以暴露耦接到第一集成电路的电路的至少一个导电焊盘的侧面。然后第一集成电路垂直安装在电路板或者第二集成电路上,使得第一集成电路的该至少一个暴露的导电焊盘接触电路板或第二集成电路上的至少一个接触点。焊料块在安装之前置于导电焊盘或接触点上且在安装之后被回流。
在第二示范性实施例中,第一集成电路,例如MTJ传感器,被切割以暴露耦接到该传感器的多个通路。然后第一集成电路垂直安装在电路板或第二集成电路上,从而多个通路中的每个都唯一地耦接到电路板或第二集成电路上的至少一个接触点。焊料块在安装之前置于通路或接触点上且在安装之后被回流。
这些示范性实施例简化了集成电路装配且提供小封装,消除了垂直芯片对键接导线的需要,消除了垂直芯片对90度焊接的需要,并使垂直芯片能用焊盘对焊盘块技术来焊接,该技术能采用比头两个选项更小的焊盘和更小的焊盘间距。对于具有多个焊盘的小芯片,诸如磁场感测电路,减小焊盘面积能显著减小总芯片面积和垂直芯片的总高度。垂直芯片可以直接焊接到另一芯片或印刷电路板上,最小化了封装占用的面积,并且该垂直芯片被预期具有比先前已知的方案更佳的垂直轴取向重复性。
参照图1,第一示范性实施例包括形成在衬底104上的集成电路102。在集成电路102的制造期间,每个接连层顺序地沉积或者以其它方式形成,每个电路元件可以利用半导体工业已知的任何技术通过选择性沉积、光刻处理、蚀刻等来限定。虽然仅示出一个电路元件,即晶体管106,但是通常在单个集成电路中有数百或数千电路元件。晶体管106具有在漏极110和源极112之间间隔开的栅极108,它们都以公知方式设置在电介质层113上。源极112通过导电线114耦接到焊盘116。另外的焊盘117和118耦接到集成电路102中另外的电路元件(未示出)。虽然焊盘116、117、118示为与电介质材料120的表面平齐,但是焊盘116、117、118可以替代地设置在电介质材料120内且与表面119间隔开。
在示范性实施例中,电介质材料120可以是硅氧化物、硅氮化物(SiN)、硅氮氧化物(SiON)、聚酰亚胺、或者它们的组合。导电线114和焊盘116、117、118可以是铜、钽、钽氮化物、银、金、铝、铂、或者其它合适的导电材料。栅极108、漏极110和源极112可以包括前述导电材料中的任何一种。
在集成电路102的制造期间,每个接连层顺序地沉积或者以其它方式形成,电路元件106可以利用半导体工业已知的任何技术通过选择性沉积、光刻处理、蚀刻等来限定。
结构100的侧面122被切割(通常称为锯片法)以沿新侧面222(见图2)暴露焊盘116、117、118。
参照图3,电路板300包括分别通过迹线308和310耦接到接触点304和306的第一集成电路302。第二集成电路312通过迹线316耦接到接触点314。结构200的侧面222(图2)通过对准焊盘116、117、118以分别接触接触点304、306、314而安装(图4)在电路板300上(侧面223面朝远离电路板300)。
图5和6示出磁隧道结(MTJ)传感器集成电路可以如何被切割以在集成电路的用于安装在另一集成电路或印刷电路板上的侧面上暴露接触焊盘。传感器广泛用于现代系统中以测量或检测物理参数,诸如位置、动作、力、加速度、温度、压强等。不昂贵的低磁场传感器诸如电子罗盘和其它类似的磁感测应用已经可利用MTJ技术获得。MTJ传感器提供小的传感器尺寸和成本。
参照图5,集成电路102是形成在电介质材料518中的集成MTJ器件500且包括通过隧道障垒506分隔开的铁磁感测层502和固定铁磁区域504。在集成磁隧道器件500的制造期间,每个接连层顺序地沉积或以其它方式形成,每个电路元件可以利用半导体工业已知的任何技术通过选择性沉积、光刻处理、蚀刻等来限定。虽然仅示出一个集成磁隧道器件500,但是通常在单个集成电路中有数百或数千这样的传感器。感测层502通过通路510耦接到第一导电线508,固定区域504通过通路514耦接到第二导电线512。稳定线(电流传输线)516位于磁隧道器件500的相反两侧在感测层502和固定区域504二者附近。电流方向515由“×”515表示为进入页面,由“点”513表示为从页面出来,但是方向可以相反。尽管根据优选实施例,稳定线516示为在感测层502和固定区域504二者附近,但是应理解,它可以位于磁隧道器件500的仅一侧,在感测层502或固定区域504附近。
固定磁区域504在本领域是公知的,且通常包括设置于隧道障垒和反铁磁耦合间隔层(未示出)之间的固定层(未示出)。反铁磁耦合间隔层由任何合适的非磁材料形成,例如元素Ru、Os、Re、Cr、Rh、Cu或它们的组合中的至少一种。被钉扎层(未示出)设置于反铁磁耦合间隔层与可选的钉扎层之间。感测层502和固定层可以由任何合适的铁磁材料形成,诸如元素Ni、Fe、Co、B或者它们的合金以及所谓的半金属铁磁体诸如NiMnSb、PtMnSb、Fe3O4或CrO2中的至少一种。隧道障垒506可以是绝缘体材料,诸如AlOx、MgOx、RuOx、HfOx、ZrOx、TiOx或者这些元素的氮化物和氮氧化物。
铁磁固定层和被钉扎层每个都具有磁矩矢量,该磁矩矢量通常通过反铁磁耦合间隔层而保持反平行,导致不能自由旋转且用作参考层的所得磁矩矢量532。感测层502具有在存在磁场时自由旋转的磁矩矢量534。在没有施加磁场时,磁矩矢量534沿感测层的各向异性易轴取向。
自测试线520设置于稳定线516上方且通过电介质材料518与之分隔开。自测试线520是金属层,优选铝,其在电流从其经过时产生磁场。自测试线520可以在沉积接触焊盘522时沉积,由此节省工艺步骤。接触焊盘522通常是铝。与集成磁隧道结传感器500相邻的另一集成磁隧道结传感器(未示出)耦接到接触焊盘522'。另外的接触焊盘可以耦接到MTJ传感器500中的其它元件,但是为了图示的简明而未示出。
在另一实施例中,自测试线可以按与先前提及的稳定线类似的形式在两个单独的金属层上延伸,由此电流在这两个不同层上沿相反方向移动。通路(未示出)可以将电流传输线526连接到较低的金属水平。
电介质材料518可以是硅氧化物、硅氮化物(SiN)、硅氮氧化物(SiON)、聚酰亚胺或者它们的组合。导电线508、512,通路510、514、521,稳定线516,电流传输线526和焊盘522优选是铜,但是将理解,它们可以是其它材料,诸如钽、钽氮化物、银、金、铝、铂或者其它合适的导电材料。
在磁隧道器件500的制造期间,每个接连层顺序地沉积或者以其它方式形成,每个磁隧道器件500可以利用半导体工业已知的任何技术通过选择性沉积、光刻处理、蚀刻等来限定。在至少铁磁传感器502和固定区域504的沉积期间,提供磁场以设定优选的各向异性易轴(诱导的内禀各向异性)。所提供的磁场为磁矩矢量532、534产生优选的各向异性易轴。除了内禀各向异性之外,具有大于一的长宽比的感测元件可以具有形状各向异性,形状和内禀各向异性的组合限定优选与感测元件的长轴平行的易轴。该易轴也可以选择为与参考磁化532成约30至90度角。在没有磁通集中器的桥实施例中,这优选在约45度角。
集成电路结构500的侧面530被切割以沿新侧面630暴露接触焊盘522、522'(见图6)。集成电路500然后可以旋转九十度以用于将侧面630和接触焊盘522、522'安装到与图4所示的印刷电路板类似的印刷电路板上。注意,图1、2和4的包括图5、6的MTJ 500的集成电路102可以安装到另一集成电路而不是印刷电路板上,如对于这里在后面描述的第二示范性实施例所示的那样。
参照图7,先前已知的电路板700包括第一集成电路702(诸如X-Y轴MTJ传感器)、第二集成电路704(诸如Z轴MTJ传感器(垂直于电路板700安装))、以及第三集成电路(诸如处理器芯片)。第三集成电路706通过迹线708耦接到第一集成电路706且通过迹线710耦接到第二集成电路。图8示出根据集成电路600切割的第二集成电路704可以如何安装到第三集成电路706上,由此简化集成电路装配并提供小封装,消除垂直芯片对键接导线的需要,消除垂直芯片对90度焊接的需要,并使得垂直芯片能用焊盘对焊盘块(bump)技术来焊接,该技术能采用比头两个选择更小的焊盘和更小的焊盘间距。当仅需要两个芯片时,可以通过将垂直芯片直接焊接在另一芯片上而消除印刷电路板。此外,第一和第三集成电路可以单片组合到单个芯片上,第二垂直集成电路可以垂直安装于其上。
参照图9,根据第二示范性实施例,集成电路(诸如先前参照图5描述的MTJ传感器500)具有与焊盘124同时沉积的稳定线116。接触焊盘122一般是铜焊盘124的端子金属,例如铝。铜焊盘124可以例如通过通路128耦接到电流传输线126。结构1000的侧面830被切割以沿新侧面1030暴露通路828、828'、828″(见图10)。结构1000然后可以旋转以将侧面1030以及通路528、528'和528″置于印刷电路板或另一集成电路上。
图11是将集成电路垂直安装于印刷电路板上的步骤的流程图,包括在衬底上形成1102第一集成电路,该第一集成电路包括导电焊盘和导电通路中的至少一种且具有背对衬底的表面,且具有侧面。该集成电路被切割1104以暴露导电焊盘的一部分(原始侧面或新侧面)。提供1106具有接触点的电路板或第二集成电路且将集成电路安装1108在电路板或第二集成电路上,其中暴露的导电焊盘或通路定位得与接触点电接触。
虽然在前面的具体实施方式中已经给出了至少一个示范性实施例,但是应意识到,存在大量的变型。还应意识到,示范性实施例仅是例子,无意以任何方式限制本发明的范围、应用或配置。而是,前面的具体实施方式将向本领域技术人员提供实施示范性实施例的快捷路线图,将理解,可以在功能和布置中进行各种改变而不偏离所附权利要求及其法律等价物所阐述的本发明的范围。
Claims (20)
1.一种将第一集成电路安装于电路板或第二集成电路之一上的方法,该第一集成电路形成于衬底上且具有背对该衬底的表面和与该表面基本正交的侧面,并包括耦接到电路且形成在电介质材料中的导电元件,电路板或第二集成电路的所述之一包括接触点,该方法包括:
切割该第一集成电路以在该侧面上暴露该导电元件;以及
通过将在该侧面上暴露的该导电元件对准以与该接触点电接触,将该第一集成电路安装在电路板或第二集成电路的所述之一上。
2.如权利要求1所述的方法,其中该导电元件包括通路。
3.如权利要求1所述的方法,其中该导电元件是接触焊盘。
4.如权利要求1所述的方法,还包括:
将焊料置于每个该导电元件和该接触点之间;以及
使该焊料回流。
5.如权利要求1所述的方法,其中该第一集成电路包括磁致电阻传感器。
6.如权利要求1所述的方法,其中该第一集成电路包括多个磁隧道结器件。
7.如权利要求1所述的方法,还包括,在所述切割步骤之后且在该安装步骤之前,将贵金属镀到暴露的所述导电元件上从而产生良好的表面能和免于氧化的稳定性以用于最佳的焊料回流。
8.一种将第一集成电路安装于电路板或第二集成电路之一上的方法,该第一集成电路包括多个电路元件,每个电路元件耦接到多个导电元件之一,该电路元件和导电元件形成在电介质材料中,该电路板或该第二集成电路包括多个导电接触点,该方法包括:
在与衬底的平面正交的侧面上切割该第一集成电路以暴露该导电元件的每个的至少一部分;以及
通过将该导电元件的所述暴露部分的每一个与所述多个导电接触点之一对准,将所述第一集成电路安装在该电路板或该第二集成电路上。
9.如权利要求8所述的方法,其中每个该导电元件包括通路。
10.如权利要求8所述的方法,其中每个该导电元件是接触焊盘。
11.如权利要求8所述的方法,其中该第一集成电路包括磁致电阻传感器。
12.如权利要求8所述的方法,其中该第一集成电路包括多个磁隧道结器件。
13.如权利要求8所述的方法,还包括,在该切割步骤之后且在该安装步骤之前:
将贵金属镀到暴露的所述导电元件上从而产生良好的表面能和免于氧化的稳定性以用于最佳的焊料回流。
14.一种电子电路,包括:
印刷电路板或第一集成电路之一,其包括多个导电接触点;以及
第二集成电路,包括:
衬底;
电介质材料,形成在该衬底上且具有背对该衬底的表面和与
该表面基本正交的侧面;
多个电路元件,形成在该电介质材料中;
多个导电元件,形成在该电介质材料中,每个该导电元件耦接到该电路元件之一,其中该导电元件在该电介质材料的所述侧面处暴露,所述第二集成电路的侧面安装在该印刷电路板或该第一集成电路之一上,每一个该导电元件对准且电耦接到该导电接触点之一。
15.如权利要求14所述的电子电路,其中该导电元件包括:
通路。
16.如权利要求14所述的电子电路,其中该导电元件包括:
接触焊盘。
17.如权利要求14所述的电子电路,其中该第二集成电路包括磁致电阻传感器。
18.如权利要求14所述的电子电路,其中该多个电路元件中的每个都包括:
磁场传感器,包括:
第一和第二电流传输线,形成在该电介质材料中;
稳定线,形成在该电介质材料中;
第一磁隧道结感测元件,耦接在该第一和第二电流传输线之间,且邻近该稳定线;以及
磁场生成线,定位得邻近该第一磁隧道结感测元件;
其中在该集成电路的侧面上暴露的每个该导电元件耦接到该第一和第二电流传输线之一。
19.如权利要求14所述的电子电路,其中该第一磁隧道结感测元件包括:
磁隧道结元件的阵列。
20.如权利要求14所述的电子电路,还包括:
第二、第三和第四磁隧道结感测元件,与该第一磁隧道结感测元件一起配置为惠斯通桥。
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CN102762951A (zh) * | 2010-01-08 | 2012-10-31 | 艾沃思宾技术公司 | 用于测试和校准磁场感测器件的方法和结构 |
CN108139450A (zh) * | 2015-07-03 | 2018-06-08 | 泰连感应德国有限公司 | 电气结构构件和用于制造这种电气结构构件的制造方法 |
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CN102385043B (zh) * | 2011-08-30 | 2013-08-21 | 江苏多维科技有限公司 | Mtj三轴磁场传感器及其封装方法 |
CN102426344B (zh) * | 2011-08-30 | 2013-08-21 | 江苏多维科技有限公司 | 三轴磁场传感器 |
DE102012205268A1 (de) * | 2012-03-30 | 2013-10-02 | Robert Bosch Gmbh | Verfahren zum Herstellen von zumindest einer Kontaktierungsfläche eines Bauelementes und Sensor zum Aufnehmen einer Richtungskomponente einer gerichteten Messgröße |
US20180175284A1 (en) * | 2016-12-19 | 2018-06-21 | Globalfoundries Singapore Pte. Ltd. | Integrated circuits and methods for fabricating integrated circuits with magnetic tunnel junction (mtj) structures |
US11791083B2 (en) * | 2021-05-26 | 2023-10-17 | Globalfoundries Singapore Pte. Ltd. | Tunnel magneto-resistive (TMR) sensor with perpendicular magnetic tunneling junction (p-MTJ) structures |
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- 2010-12-21 EP EP10840063.1A patent/EP2517238A4/en not_active Withdrawn
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CN102762951A (zh) * | 2010-01-08 | 2012-10-31 | 艾沃思宾技术公司 | 用于测试和校准磁场感测器件的方法和结构 |
CN102762951B (zh) * | 2010-01-08 | 2015-11-25 | 艾沃思宾技术公司 | 用于测试和校准磁场感测器件的方法和结构 |
CN108139450A (zh) * | 2015-07-03 | 2018-06-08 | 泰连感应德国有限公司 | 电气结构构件和用于制造这种电气结构构件的制造方法 |
Also Published As
Publication number | Publication date |
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EP2517238A4 (en) | 2013-12-04 |
WO2011079121A1 (en) | 2011-06-30 |
US20110147867A1 (en) | 2011-06-23 |
EP2517238A1 (en) | 2012-10-31 |
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