CN102759703B - Testing method and related device for reliability of circuit - Google Patents
Testing method and related device for reliability of circuit Download PDFInfo
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- CN102759703B CN102759703B CN201210239194.1A CN201210239194A CN102759703B CN 102759703 B CN102759703 B CN 102759703B CN 201210239194 A CN201210239194 A CN 201210239194A CN 102759703 B CN102759703 B CN 102759703B
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Abstract
The embodiment of the invention discloses a testing method and a related device for the reliability of a circuit, which is used for simplifying the testing process of the circuit, can rapidly find the hidden danger of the circuit and reduces the testing cost. The testing method disclosed by the embodiment of the invention comprises the following steps of: placing a first linkage knife blade on a first pin and a second pin of the circuit, wherein the circuit comprises the first pin, the second pin, a third pin and a fourth pin, and when the first pin is communicated with the second pin through the first linkage knife blade and simultaneously the third pin is communicated with the fourth pin through a second linkage knife blade, the circuit works at a first mode; and carrying out reliability test on the circuit, the first pin and the second pin of which are communicated through the first linkage knife blade.
Description
Technical field
The present invention relates to circuit field, particularly relate to a kind of method of testing and relevant apparatus of circuit reliability.
Background technology
Lawn lamp series of products are provided with two kinds of mode of operations usually: 6 hours patterns (6h) and 10 hours patterns (10h), and can freely change between these two kinds of patterns, it mainly through arranging the pin of connection two kinds of patterns respectively and connecting the switch realization that each pin carries out conversion and control on the circuit of this product, this circuit working is under 6 hours patterns when on the pin that this switch is connected to 6 hours patterns, under when this switch is transformed into the pin of 10 hours patterns from the pin of 6 hours patterns, this circuit is just operated in 10 hours patterns, when this switch cuts out, whole circuit is in closedown (OFF) pattern.Two kinds of patterns of circuit working and the Kai Heguan of power supply also carry out synchro control by this switch, therefore, this switch is referred to as third gear ganged switch again usually, can realize " 6h-OFF-10h " power and energy.
In order to circuit when the circuit testing this series products is changed between this Three models reliability how, whether namely need test to change between this Three models can cause circuit to generate heat, the multiple bad phenomenon such as damage, the way of prior art is connected on this circuit one by one with a large amount of third gear ganged switches, then third gear ganged switch is allowed to change between three patterns, observe circuit and whether occur bad phenomenon, the present inventor finds: this method of being tested one by one by a large amount of third gear ganged switches often uses a third gear ganged switch all to need to be connected to separately on this circuit, test process is quite numerous and diverse, can not the discovery circuit hidden danger that may exist fast, and third gear ganged switch is the element connected in circuit, use third gear ganged switch to do the method for testing can test out circuit to there is the possibility of hidden danger also very little.Owing to needing a large amount of third gear ganged switches and repeatedly testing the life-span affecting third gear ganged switch too, make testing cost also higher.
Summary of the invention
Embodiments provide a kind of method of testing and relevant apparatus of circuit reliability, for simplifying the test process of circuit, can the hidden danger of discovery circuit fast, reduce testing cost.
For solving the problems of the technologies described above, the embodiment of the present invention provides following technical scheme:
On the one hand, the embodiment of the present invention provides a kind of method of testing of circuit reliability, comprising:
On the first pin first blade being placed in circuit and the second pin, described circuit comprises: the first pin, the second pin, the 3rd pin, the 4th pin, and described circuit is operated in first mode when described first pin and described second pin are communicated with by described first blade and described 3rd pin is communicated with by the second blade with described 4th pin simultaneously;
The described circuit described first blade being communicated with to described first pin and described second pin carries out reliability testing.
On the other hand, the embodiment of the present invention also provides the proving installation of circuit reliability, comprising:
First connected unit, for the first blade being placed in the first pin and second pin of circuit, described circuit comprises: the first pin, the second pin, the 3rd pin, the 4th pin, and described circuit is operated in first mode when described first pin and described second pin are communicated with by described first blade and described 3rd pin is communicated with by the second blade with described 4th pin simultaneously;
First test cell, carries out reliability testing for the described circuit described first blade being communicated with to described first pin and described second pin.
As can be seen from the above technical solutions, the embodiment of the present invention has the following advantages:
In embodiments of the present invention, for the circuit including four pins, only the first pin and the second pin are communicated with by the first blade, now because four pins of circuit are not connected therefore circuit can not enter work simultaneously, now reliability testing is carried out to the circuit being only communicated with the first pin and the second pin, due to this kind of situation normally limit that can tolerate of circuit, therefore the unfailing performance of this circuit can be judged, can the hidden danger of discovery circuit fast, the method of the embodiment of the present invention does not need a large amount of third gear ganged switch, test process is simple, testing cost is lower.
Accompanying drawing explanation
In order to be illustrated more clearly in the technical scheme in the embodiment of the present invention, below the accompanying drawing used required in describing embodiment is briefly described, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, to those skilled in the art, other accompanying drawing can also be obtained according to these accompanying drawings.
The schematic flow sheet of the method for testing of a kind of circuit reliability that Fig. 1 provides for the embodiment of the present invention;
The structural relation schematic diagram of a kind of circuit that Fig. 2 provides for the embodiment of the present invention and the first blade, the second blade;
The schematic flow sheet of the method for testing of the another kind of circuit reliability that Fig. 3 provides for the embodiment of the present invention;
The schematic flow sheet of the method for testing of the another kind of circuit reliability that Fig. 4 provides for the embodiment of the present invention;
The structural relation schematic diagram of the another kind of circuit that Fig. 5 provides for the embodiment of the present invention and the first blade, the second blade;
The structural relation schematic diagram of the another kind of circuit that Fig. 6 provides for the embodiment of the present invention and the first blade, the second blade;
The structural representation of the proving installation of the circuit reliability that Fig. 7 provides for the embodiment of the present invention.
Embodiment
Embodiments providing a kind of method of testing and relevant apparatus of circuit reliability, for simplifying the test process of circuit, reducing testing cost.
For making goal of the invention of the present invention, feature, advantage can be more obvious and understandable, below in conjunction with the accompanying drawing in the embodiment of the present invention, technical scheme in the embodiment of the present invention is clearly and completely described, obviously, the embodiments described below are only the present invention's part embodiments, and not all embodiments.Based on the embodiment in the present invention, the every other embodiment that those skilled in the art obtains, all belongs to the scope of protection of the invention.
The method of testing of a kind of circuit reliability that the embodiment of the present invention provides, as shown in Figure 1, comprising:
101, on the first pin the first blade being placed in circuit and the second pin.
Wherein, the circuit that the embodiment of the present invention provides comprises: the first pin, the second pin, the 3rd pin, the 4th pin, and this circuit is operated in first mode when the first pin and the second pin are communicated with by the first blade and the 3rd pin is communicated with by the second blade with the 4th pin simultaneously.
In the embodiment of the present invention, the circuit of testing reliability generally includes four pins, wherein be operated in first mode when the first pin and the second pin are communicated with by the first blade and the 3rd pin is communicated with by the second blade with the 4th pin simultaneously, that is, first blade is communicated with wherein two pins of this circuit simultaneously, second blade is communicated with another two pins of this circuit, this circuit can be operated in first mode, such as, if this circuit is the control circuit that Lawn lamp series of products use, include four pins, the mode of operation that when first blade and the second blade are communicated with the pin of this circuit simultaneously, this circuit can enter 6 hours.
It should be noted that, in embodiments of the present invention, the circuit of this method of testing test specifically can refer to general conventional circuit, also integrated circuit (the IC applied on the industrial products of complexity can be referred to, Integrated Circuit), as long as this IC circuit needs the pin be communicated with on it by connection blade just can carry out reliability, in practical application scene, determine it is general circuit or integrated circuit according to the product that this circuit is applied, herein for illustrative purposes only, not as a limitation of the invention.
It should be noted that, the first blade described in the step 101 of the embodiment of the present invention is the connection blade of the pin in a kind of connecting circuit in fact, the second blade described in this step in addition is also the connection blade of the pin in a kind of connecting circuit, why called after first blade is just in order to distinguish with the second blade of follow-up appearance in a step 101, its " first " and " second " do not have any relation in sequential or in logic, not to occur the second blade when appearance the first blade, certainly the first blade neither be there is when appearance the second blade, only two different connection blades respectively to represent.Certainly can also adopt other naming method in order to distinguish these two different connection blades, such as, called after connection blade a and connection blade b etc. can be distinguished.And the implication of " first mode " recorded in the embodiment of the present invention, " the second pattern " also can be used herein about the explanation of " first " and " second ".
In order to the structural relation of the circuit that provides in the embodiment of the present invention and the first blade, the second blade clearly can be described, refer to shown in Fig. 2, circuit 201 includes four pins, be respectively the first pin 2011, second pin 2012, the 3rd pin 2013, the 4th pin 2014, this circuit 201 is operated in first mode when the first pin 2011 and the second pin 2012 are communicated with by the first blade 202 and the 3rd pin 2013 is communicated with by the second blade 203 with the 4th pin 2014 simultaneously.Corresponding to step 101, on the first pin 2011 namely 202, the first blade being placed in circuit 201 in fig. 2 and the second pin 2012, now just can perform by triggered step 102.
102, reliability testing is carried out to the circuit that the first blade has been communicated with the first pin and the second pin.
After the pin of two on circuit is communicated with by the first blade, now just can carry out testing of reliability to this circuit, concrete, step 102 can comprise:
Judge whether the circuit that the first blade has been communicated with the first pin and the second pin produces abnormal heating, or, judge whether the circuit that the first blade has been communicated with the first pin and the second pin damages.
After the pin of two on circuit is communicated with by the first blade, can judge whether this circuit produces abnormal heating, if there is abnormal fever phenomenon to produce, further can test this circuit, to find out the reason that it produces fault, this circuit is improved, because now four pins of this circuit are not communicated with simultaneously, this circuit also just can not be operated in first mode, wherein two pins that this circuit connected by blade are joined owing to only having one, this is the limit that can tolerate of circuit normally, if now produce abnormal heating, may be that this circuit has defect, need further to judge.Wherein the abnormal heating of circuit refers to the abnormal heating phenomenon except the normal heating of generation when circuit normally works, such as, all slight heating can be produced during general circuit work, it is then normal heating, more heating may be produced when circuit exists hidden danger when unreliable (namely), such as hot etc., then can conclude that circuit may have defect, need further to judge.
In addition, judge whether the circuit that the first blade has been communicated with the first pin and the second pin damages, and specifically can comprise the steps:
A1, the first blade is communicated with the first pin with the second pin and the second blade is communicated with the 3rd pin and the 4th pin simultaneously;
A2, judge whether this circuit is normally operated in first mode, if not indication circuit damages.
For steps A 1, belong to simultaneously by the situation of four of this circuit pins connections, steps A 2 can carry out judging whether this circuit is be operated in first mode normally, if not, this circuit represents that this circuit damages, needs the reparation carrying out fault, if can normally work in the flrst mode, show that this circuit have passed reliability testing, this circuit is qualified.
It should be noted that, in embodiments of the present invention, the reliability of decision circuitry, except preceding method, can also have multiple implementation, is some of them implementation herein, can not as limitation of the invention.
In embodiments of the present invention, for the circuit including four pins, only the first pin and the second pin are communicated with by the first blade, now because four pins of circuit are not connected therefore circuit can not enter work simultaneously, now reliability testing is carried out to the circuit being only communicated with the first pin and the second pin, due to this kind of situation normally limit that can tolerate of circuit, therefore the unfailing performance of this circuit can be judged, can the hidden danger of discovery circuit fast, the method of the embodiment of the present invention does not need a large amount of third gear ganged switch, test process is simple, testing cost is lower.
The embodiment of the present invention additionally provides the method for testing of another kind of circuit reliability, except comprising step 101 as shown in Figure 1 and 102, also comprises the steps, refers to shown in Fig. 3:
103, after on the first pin the first blade being placed in circuit and the second pin, on the 3rd pin the second blade being placed in circuit and the 4th pin.
In embodiments of the present invention, as shown in Figure 2, after 202, first blade being placed on the first pin 2011 of circuit 201 and the second pin 2012, on the 3rd pin 2013 the second blade 203 being placed in circuit 201 and the 4th pin 2014, now just can perform by triggered step 104.
It should be noted that, on the 3rd pin second blade being placed in circuit in preset time after on the first pin the first blade being placed in circuit and the second pin and the 4th pin, preset time is any instant between 1 millisecond (ms) to 5 seconds (s), that is, after step 101 executes, step 103 is performed in a preset time, this preset time is specifically as follows any instant in 1ms to 5s, in embodiments of the present invention, for the circuit needing testing reliability, the first blade and the second blade can not the pin of synchronous connection circuit time (this time be usually exactly Millisecond or second level time), the suffertibility of circuit is the poorest, likely there is bad phenomenon, now reliability testing is carried out to circuit, good effect can be obtained.
104, reliability testing is carried out to the circuit again the second blade being communicated with the 3rd pin and the 4th pin after first the first blade being communicated with the first pin and the second pin.
It should be noted that, in embodiments of the present invention, reliability testing is carried out to the circuit again the second blade being communicated with the 3rd pin and the 4th pin after first the first blade being communicated with the first pin and the second pin, concrete test mode see the description of previous embodiment, can repeat no more herein.
In embodiments of the present invention, for the circuit including four pins, reliability testing is carried out to the circuit again the second blade being communicated with the 3rd pin and the 4th pin after first the first blade being communicated with the first pin and the second pin, now because four pins of circuit are not to be connected therefore circuit can not enter work at once simultaneously, now reliability testing is carried out to circuit, due to this kind of situation normally limit that can tolerate of circuit, therefore the unfailing performance of this circuit can be judged, the method of the embodiment of the present invention does not need a large amount of third gear ganged switch, test process is simple, testing cost is lower.
The embodiment of the present invention additionally provides the method for testing of another kind of circuit reliability, except comprising step 101 as shown in Figure 3 to 104, also comprises the steps, refers to shown in Fig. 4:
105, when circuit also comprises the 5th pin and the 6th pin, after second blade being placed on the 3rd pin of circuit and the 4th pin, on the second pin first blade being placed in circuit and the 5th pin, wherein, circuit is operated in the second pattern when the 4th pin and the 6th pin are communicated with by the second blade and the second pin is communicated with by the first blade with the 5th pin simultaneously.
In the embodiment of the present invention, the circuit of testing reliability generally includes six pins, as shown in Figure 5, circuit 201 includes six pins, be respectively the first pin 2011, second pin 2012, 3rd pin 2013, 4th pin 2014, 5th pin 2015, 6th pin 2016, this circuit 201 is operated in first mode when the first pin 2011 and the second pin 2012 are communicated with by the first blade 202 and the 3rd pin 2013 is communicated with by the second blade 203 with the 4th pin 2014 simultaneously, be communicated with by the second blade 203 with the 6th pin 2016 at the 4th pin 2014, and be operated in the second pattern when the second pin 2012 is communicated with by the first blade 202 with the 5th pin 2015 simultaneously, that is, this circuit can be operated in two kinds of patterns, such as, if this circuit is the control circuit that Lawn lamp series of products use, include six pins, first blade and the second blade are communicated with the first pin and second pin of this circuit simultaneously, the mode of operation that when the 3rd pin and the 4th pin, this circuit can enter 6 hours, first blade and the second blade are communicated with the second pin and the 5th pin of this circuit simultaneously, the mode of operation that when the 4th pin and the 6th pin, this circuit can enter 10 hours.
Based on the method that the embodiment of the present invention provides, when circuit includes 8 pins, this circuit can include Three models, such as, if this circuit is the control circuit 201 that Lawn lamp series of products use, as shown in Figure 6, including 8 pins (is the first pin 2011 respectively, second pin 2012, 3rd pin 2013, 4th pin 2014, 5th pin 2015, 6th pin 2016, 7th pin 2017, 8th pin 2018), the first blade 202 and the second blade 203 are communicated with the first pin and second pin of this circuit simultaneously, the mode of operation that when the 3rd pin and the 4th pin, this circuit can enter 6 hours, the first blade and the second blade are communicated with the second pin and the 5th pin of this circuit simultaneously, when the 4th pin and the 6th pin, this circuit can enter OFF pattern, and the first blade and the second blade are communicated with the 5th pin and the 7th pin of this circuit simultaneously, the mode of operation that when the 6th pin and the 8th pin, this circuit can enter 10 hours.
106, reliability testing is carried out to the circuit again the first blade being communicated with the second pin and the 5th pin after the second blade being communicated with the 3rd pin and the 4th pin.
It should be noted that, in embodiments of the present invention, reliability testing is carried out to the circuit again the first blade being communicated with the second pin and the 5th pin after the second blade being communicated with the 3rd pin and the 4th pin, concrete test mode see the description of previous embodiment, can repeat no more herein.
In embodiments of the present invention, for the circuit including six pins, the second blade is communicated with the 3rd pin and carries out reliability testing with the circuit again the first blade being communicated with the second pin and the 5th pin after the 4th pin, now because four pins of circuit are not to be connected therefore circuit can not enter work at once simultaneously, now reliability testing is carried out to circuit, due to this kind of situation normally limit that can tolerate of circuit, therefore the unfailing performance of this circuit can be judged, the method of the embodiment of the present invention does not need a large amount of third gear ganged switch, test process is simple, testing cost is lower.
In actual applications, the circuit reliability proving installation that the embodiment of the present invention provides specifically can be built in the existing equipment tested circuit, also can be arranged to separately an autonomous device test circuit, the reliability testing process that specifically can realize circuit by the mode of software or hardware integration.The device corresponding with the method introduced in said method embodiment will be introduced in embodiments of the present invention, the manner of execution of concrete each unit can see said method embodiment, the content of correlation unit is only described at this, be described as follows, as shown in Figure 7, circuit reliability proving installation 700, comprising:
First connected unit 701, for the first blade being placed in the first pin and second pin of circuit, circuit comprises: the first pin, the second pin, the 3rd pin, the 4th pin, and circuit is operated in first mode when the first pin and the second pin are communicated with by the first blade and the 3rd pin is communicated with by the second blade with the 4th pin simultaneously;
First test cell 702, carries out reliability testing for the circuit the first blade being communicated with to the first pin and the second pin.
It should be noted that, in embodiments of the present invention, for circuit reliability proving installation 700, as a kind of implementation wherein, can also comprise (not shown in Figure 7):
Second connected unit, after on the first pin the first blade being placed in circuit and the second pin, on the 3rd pin the second blade being placed in circuit and the 4th pin;
Second test cell, for carrying out reliability testing to the circuit again the second blade being communicated with the 3rd pin and the 4th pin after first the first blade being communicated with the first pin and the second pin.
It should be noted that, in embodiments of the present invention, for circuit reliability proving installation 700, as a kind of implementation wherein, can also comprise (not shown in Figure 7):
Third connecting unit, during for also comprising the 5th pin and the 6th pin when circuit, after second blade being placed on the 3rd pin of circuit and the 4th pin, on the second pin first blade being placed in circuit and the 5th pin, wherein, circuit is operated in the second pattern when the 4th pin and the 6th pin are communicated with by the second blade and the second pin is communicated with by the first blade with the 5th pin simultaneously;
3rd test cell, for carrying out reliability testing to the circuit again the first blade being communicated with the second pin and the 5th pin after the second blade being communicated with the 3rd pin and the 4th pin.
It should be noted that, in embodiments of the present invention, for the first test cell 702, as a kind of implementation wherein, specifically for judging whether the circuit that the first blade has been communicated with the first pin and the second pin produces abnormal heating, or, judge whether the circuit that the first blade has been communicated with the first pin and the second pin damages.
More specifically, for the first test cell 701, during for judging whether the circuit that the first blade has been communicated with the first pin and the second pin damages, following content (not shown in Figure 7) can also be comprised:
Doubly-linked leads to subelement, the second blade is communicated with the 3rd pin and the 4th pin for the first blade being communicated with the first pin with described second pin simultaneously;
Whether judgment sub-unit, be normally operated in first mode for decision circuitry, if not indication circuit damages.
It should be noted that, the content such as information interaction, implementation between each module/unit of said apparatus, due to the inventive method embodiment based on same design, its technique effect brought is identical with the inventive method embodiment, particular content see describing in the aforementioned shown embodiment of the method for the present invention, can repeat no more herein.
In embodiments of the present invention, for the circuit including four pins, first connected unit has only been communicated with the first pin and the second pin by the first blade, now because four pins of circuit are not connected therefore circuit can not enter work simultaneously, now the first test cell carries out reliability testing to the circuit being only communicated with the first pin and the second pin, due to this kind of situation normally limit that can tolerate of circuit, therefore the unfailing performance of this circuit can be judged, can the hidden danger of discovery circuit fast, the device that the embodiment of the present invention provides does not need a large amount of third gear ganged switch, test process is simple, testing cost is lower.
One of ordinary skill in the art will appreciate that all or part of step realized in above-described embodiment method is that the hardware that can carry out instruction relevant by program completes, described program can be stored in a kind of computer-readable recording medium, the above-mentioned storage medium mentioned can be ROM (read-only memory), disk or CD etc.
Above the method for testing of a kind of circuit reliability provided by the present invention and relevant apparatus are described in detail, for one of ordinary skill in the art, according to the thought of the embodiment of the present invention, all will change in specific embodiments and applications, in sum, this description should not be construed as limitation of the present invention.
Claims (11)
1. a method of testing for circuit reliability, is characterized in that, comprising:
On the first pin first blade being placed in lamp-controlling circuit and the second pin, described lamp-controlling circuit comprises: the first pin, the second pin, the 3rd pin, the 4th pin, described lamp-controlling circuit is operated in first mode when described first pin and described second pin are communicated with by described first blade and described 3rd pin is communicated with by the second blade with described 4th pin simultaneously, and when four pins of described lamp-controlling circuit are not connected simultaneously, described lamp-controlling circuit can not enter work;
Described first pin has been communicated with described second pin and the described lamp-controlling circuit that described second blade is not communicated with described 3rd pin and described 4th pin carries out reliability testing to described first blade.
2. method according to claim 1, is characterized in that, described method also comprises:
After on the first pin the first blade being placed in lamp-controlling circuit and the second pin, on described 3rd pin described second blade being placed in described lamp-controlling circuit and described 4th pin;
Reliability testing is carried out to the described lamp-controlling circuit more described second blade being communicated with described 3rd pin and described 4th pin after first described first blade being communicated with described first pin and described second pin.
3. method according to claim 2, is characterized in that, described method also comprises:
When described lamp-controlling circuit also comprises the 5th pin and the 6th pin, after described second blade being placed on described 3rd pin of described lamp-controlling circuit and described 4th pin, on described second pin described first blade being placed in described lamp-controlling circuit and described 5th pin, wherein, described lamp-controlling circuit is operated in the second pattern when described 4th pin and described 6th pin are communicated with by described second blade and described second pin is communicated with by described first blade with described 5th pin simultaneously;
Reliability testing is carried out to the described lamp-controlling circuit more described first blade being communicated with described second pin and described 5th pin after described second blade being communicated with described 3rd pin and described 4th pin.
4. method according to claim 2, it is characterized in that, on described 3rd pin described second blade being placed in described lamp-controlling circuit in preset time after on the first pin the first blade being placed in lamp-controlling circuit and the second pin and described 4th pin, described preset time is any instant between 1 millisecond of ms to 5 second s.
5. method according to claim 1, it is characterized in that, described described first pin is communicated with described second pin and the described lamp-controlling circuit that described second blade is not communicated with described 3rd pin and described 4th pin carries out reliability testing to described first blade, has comprised:
Judge that described first blade has been communicated with described first pin with described second pin and whether the described lamp-controlling circuit that described second blade is not communicated with described 3rd pin and described 4th pin produces abnormal heating, or judge described first blade be communicated with described first pin with described second pin and the described lamp-controlling circuit that described second blade is not communicated with described 3rd pin and described 4th pin whether damage.
6. method according to claim 5, it is characterized in that, described judge described first blade be communicated with described first pin with described second pin and the described lamp-controlling circuit that described second blade is not communicated with described 3rd pin and described 4th pin whether damage, comprising:
Described first blade is communicated with described first pin and described second blade is communicated with described 3rd pin and described 4th pin with described second pin simultaneously;
Judge whether described lamp-controlling circuit is normally operated in first mode, if not, represent that described lamp-controlling circuit damages.
7. a circuit reliability proving installation, is characterized in that, comprising:
First connected unit, for the first blade being placed in the first pin and second pin of lamp-controlling circuit, described lamp-controlling circuit comprises: the first pin, the second pin, the 3rd pin, the 4th pin, described lamp-controlling circuit is operated in first mode when described first pin and described second pin are communicated with by described first blade and described 3rd pin is communicated with by the second blade with described 4th pin simultaneously, and when four pins of described lamp-controlling circuit are not connected simultaneously, described lamp-controlling circuit can not enter work;
First test cell, for being communicated with described first pin with described second pin and the described lamp-controlling circuit that described second blade is not communicated with described 3rd pin and described 4th pin carries out reliability testing to described first blade.
8. device according to claim 7, is characterized in that, described lamp-controlling circuit RTA reliability test assembly also comprises:
Second connected unit, after on the first pin the first blade being placed in lamp-controlling circuit and the second pin, on described 3rd pin described second blade being placed in described lamp-controlling circuit and described 4th pin;
Second test cell, for carrying out reliability testing to the described lamp-controlling circuit more described second blade being communicated with described 3rd pin and described 4th pin after first described first blade being communicated with described first pin and described second pin.
9. device according to claim 8, is characterized in that, described lamp-controlling circuit RTA reliability test assembly also comprises:
Third connecting unit, during for also comprising the 5th pin and the 6th pin when described lamp-controlling circuit, after described second blade being placed on described 3rd pin of described lamp-controlling circuit and described 4th pin, on described second pin described first blade being placed in described lamp-controlling circuit and described 5th pin, wherein, described lamp-controlling circuit is operated in the second pattern when described 4th pin and described 6th pin are communicated with by described second blade and described second pin is communicated with by described first blade with described 5th pin simultaneously;
3rd test cell, for carrying out reliability testing to the described lamp-controlling circuit more described first blade being communicated with described second pin and described 5th pin after described second blade being communicated with described 3rd pin and described 4th pin.
10. device according to claim 7, it is characterized in that, described first test cell, specifically for judging that described first blade has been communicated with described first pin with described second pin and whether the described lamp-controlling circuit that described second blade is not communicated with described 3rd pin and described 4th pin produces abnormal heating, or judge described first blade be communicated with described first pin with described second pin and the described lamp-controlling circuit that described second blade is not communicated with described 3rd pin and described 4th pin whether damage.
11. devices according to claim 10, is characterized in that, described first test cell, comprising:
Doubly-linked leads to subelement, described second blade is communicated with described 3rd pin and described 4th pin for described first blade is communicated with described first pin with described second pin simultaneously;
Judgment sub-unit, for judging whether described lamp-controlling circuit is normally operated in first mode, if not, represent that described lamp-controlling circuit damages.
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| CN201210239194.1A CN102759703B (en) | 2012-07-11 | 2012-07-11 | Testing method and related device for reliability of circuit |
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| CN201210239194.1A CN102759703B (en) | 2012-07-11 | 2012-07-11 | Testing method and related device for reliability of circuit |
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| CN102759703B true CN102759703B (en) | 2015-03-04 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN102116832A (en) * | 2009-12-30 | 2011-07-06 | 上海汽车集团股份有限公司 | Parameter tester for interference rejection circuit of vehicle power supply |
| CN102128994A (en) * | 2010-12-03 | 2011-07-20 | 海信（山东）空调有限公司 | Circuit and method for verifying reliability of current-limiting resistor |
| CN202177688U (en) * | 2011-06-30 | 2012-03-28 | 南京王行航空附件维修工程有限公司 | Integrated test system for airplane electric accessory motor-type test |
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