CN102759703A - Testing method and related device for reliability of circuit - Google Patents
Testing method and related device for reliability of circuit Download PDFInfo
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- CN102759703A CN102759703A CN2012102391941A CN201210239194A CN102759703A CN 102759703 A CN102759703 A CN 102759703A CN 2012102391941 A CN2012102391941 A CN 2012102391941A CN 201210239194 A CN201210239194 A CN 201210239194A CN 102759703 A CN102759703 A CN 102759703A
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Abstract
The embodiment of the invention discloses a testing method and a related device for the reliability of a circuit, which is used for simplifying the testing process of the circuit, can rapidly find the hidden danger of the circuit and reduces the testing cost. The testing method disclosed by the embodiment of the invention comprises the following steps of: placing a first linkage knife blade on a first pin and a second pin of the circuit, wherein the circuit comprises the first pin, the second pin, a third pin and a fourth pin, and when the first pin is communicated with the second pin through the first linkage knife blade and simultaneously the third pin is communicated with the fourth pin through a second linkage knife blade, the circuit works at a first mode; and carrying out reliability test on the circuit, the first pin and the second pin of which are communicated through the first linkage knife blade.
Description
Technical field
The present invention relates to circuit field, relate in particular to a kind of method of testing and relevant apparatus of circuit reliability.
Background technology
The Lawn lamp series of products are provided with two kinds of mode of operations usually: 6 hours patterns (6h) and 10 hours patterns (10h); And can freely change between these two kinds of patterns; It is mainly through being provided with the pin that connects two kinds of patterns respectively and connecting the switch realization that each pin carries out conversion and control on the circuit of this product; This circuit working is under 6 hours patterns when this switch is connected on the pin of 6 hours patterns; This circuit just is operated under 10 hours patterns when this switch is transformed on the pin of 10 hours patterns from the pin of 6 hours patterns, and when this switch cut out, entire circuit was in (OFF) pattern of closing.The two kinds of patterns of circuit working and the Kai Heguan of power supply also come synchro control through this switch, and therefore, this switch is referred to as the third gear ganged switch again usually, can realize " 6h-OFF-10h " function conversion.
The reliability of circuit how when changing between these three kinds of patterns for the circuit of testing this series products; Need test promptly whether conversion can cause multiple bad phenomenon such as circuit heating, damage between these three kinds of patterns; The way of prior art is to be connected to one by one on this circuit with a large amount of third gear ganged switches; Let the third gear ganged switch between three patterns, change then; Observe circuit and bad phenomenon whether occurs; Inventor of the present invention finds: this third gear ganged switch of the every use of method of testing one by one through a large amount of third gear ganged switches all need be connected to separately on this circuit, and test process is quite numerous and diverse, can not find the hidden danger that circuit possibly exist fast; And the third gear ganged switch is the element that is connected in the circuit, and the method for using the third gear ganged switch to do test can test out circuit and exist the possibility of hidden danger also very little.Owing to needing a large amount of third gear ganged switches and repeatedly testing the life-span that influences the third gear ganged switch too, make testing cost also higher.
Summary of the invention
The embodiment of the invention provides a kind of method of testing and relevant apparatus of circuit reliability, is used to simplify the test process of circuit, can find the hidden danger of circuit fast, reduces testing cost.
For solving the problems of the technologies described above, the embodiment of the invention provides following technical scheme:
On the one hand, the embodiment of the invention provides a kind of method of testing of circuit reliability, comprising:
First blade is placed on first pin and second pin of circuit; Said circuit comprises: first pin, second pin, the 3rd pin, the 4th pin, said circuit are operated in first pattern when said first pin and said second pin are communicated with through said first blade and said the 3rd pin and said the 4th pin are communicated with through second blade simultaneously;
The said circuit that said first blade has been communicated with said first pin and said second pin carries out reliability testing.
On the other hand, the embodiment of the invention also provides the proving installation of circuit reliability, comprising:
First connected unit; Be used for first blade is placed first pin and second pin of circuit; Said circuit comprises: first pin, second pin, the 3rd pin, the 4th pin, said circuit are operated in first pattern when said first pin and said second pin are communicated with through said first blade and said the 3rd pin and said the 4th pin are communicated with through second blade simultaneously;
First test cell, the said circuit that is used for said first blade has been communicated with said first pin and said second pin carries out reliability testing.
Can find out that from above technical scheme the embodiment of the invention has the following advantages:
In embodiments of the present invention, for the circuit that includes four pins, only first pin and second pin have been communicated with through first blade; This moment, the event circuit can not get into work because four pins of circuit are not connected simultaneously; Carry out reliability testing to the circuit that only has been communicated with first pin and second pin this moment, because this kind situation limit that can tolerate of circuit normally, so can judge the unfailing performance of this circuit; Can find the hidden danger of circuit fast; The method of the embodiment of the invention does not need a large amount of third gear ganged switches, and test process is simple, and testing cost is lower.
Description of drawings
In order to be illustrated more clearly in the technical scheme in the embodiment of the invention; The accompanying drawing of required use is done to introduce simply in will describing embodiment below; Obviously; Accompanying drawing in describing below only is some embodiments of the present invention, to those skilled in the art, can also obtain other accompanying drawing according to these accompanying drawings.
The schematic flow sheet of the method for testing of a kind of circuit reliability that Fig. 1 provides for the embodiment of the invention;
The structural relation synoptic diagram of a kind of circuit that Fig. 2 provides for the embodiment of the invention and first blade, second blade;
The schematic flow sheet of the method for testing of the another kind of circuit reliability that Fig. 3 provides for the embodiment of the invention;
The schematic flow sheet of the method for testing of the another kind of circuit reliability that Fig. 4 provides for the embodiment of the invention;
The structural relation synoptic diagram of the another kind of circuit that Fig. 5 provides for the embodiment of the invention and first blade, second blade;
The structural relation synoptic diagram of the another kind of circuit that Fig. 6 provides for the embodiment of the invention and first blade, second blade;
The structural representation of the proving installation of the circuit reliability that Fig. 7 provides for the embodiment of the invention.
Embodiment
The embodiment of the invention provides a kind of method of testing and relevant apparatus of circuit reliability, is used to simplify the test process of circuit, reduces testing cost.
For make goal of the invention of the present invention, characteristic, advantage can be more obvious and understandable; To combine the accompanying drawing in the embodiment of the invention below; Technical scheme in the embodiment of the invention is carried out clear, intactly description; Obviously, the embodiments described below only are the present invention's part embodiment, but not whole embodiment.Based on the embodiment among the present invention, the every other embodiment that those skilled in the art obtained belongs to the scope that the present invention protects.
The method of testing of a kind of circuit reliability that the embodiment of the invention provides, as shown in Figure 1, comprising:
101, first blade is placed on first pin and second pin of circuit.
Wherein, The circuit that the embodiment of the invention provides comprises: first pin, second pin, the 3rd pin, the 4th pin, this circuit are operated in first pattern when first pin and second pin are communicated with through first blade and the 3rd pin and the 4th pin are communicated with through second blade simultaneously.
The circuit of testing reliability generally includes four pins in the embodiment of the invention; Wherein when first pin and second pin are communicated with through first blade and the 3rd pin and the 4th pin are communicated with through second blade simultaneously, be operated in first pattern; That is to say, simultaneously with first blade be communicated with this circuit wherein two pins, second blade is communicated with two pins in addition of this circuit, this circuit can be operated in first pattern; For example; If this circuit is the control circuit that uses on the Lawn lamp series of products, four pins have been comprised, the mode of operation that this circuit can get into 6 hours when first blade and second blade were communicated with the pin of this circuit simultaneously.
Need to prove; In embodiments of the present invention, the circuit of this method of testing test specifically can refer to general circuit commonly used, also can refer to the integrated circuit (IC that on the industrial products of complicacy, uses; Integrated Circuit); As long as this IC circuit need just can carry out reliability through the pin that the couplet blade is communicated with on it, in the practical application scene, applied product decision is general circuit or integrated circuit according to this circuit; Here for illustrative purposes only, not as to qualification of the present invention.
Need to prove; First blade of in the step 101 of the embodiment of the invention, describing is the couplet blade of the pin on a kind of CC in fact; Second blade of describing in this step in addition also is the couplet blade of the pin on a kind of CC; Why called after first blade is just in order to distinguish with second blade of follow-up appearance mutually in step 101; Its " first " and " second " do not have on the sequential or any relation in logic; When first blade occurring is not second blade to occur, when second blade occurring, first blade neither occur certainly, only in order to represent it is respectively two different couplet blades.Certainly, for example, can distinguish called after and join blade a and join blade b etc. in order to distinguish the naming method that these two different couplet blades can also adopt other.And " first pattern " put down in writing in the embodiment of the invention, the implication of " second pattern " also can be used here the explanation about " first " and " second ".
In order clearly to describe the structural relation of the circuit that provides in the embodiment of the invention and first blade, second blade; See also shown in Figure 2; Circuit 201 has comprised four pins; Be respectively first pin 2011, second pin 2012, the 3rd pin 2013, the 4th pin 2014, this circuit 201 first pin 2011 and second pin 2012 is communicated with through first blade 202 and simultaneously the 3rd pin 2013 be operated in first pattern during through 203 connections of second blade with the 4th pin 2014.Corresponding to step 101, in Fig. 2, just 202 on first blade is placed on first pin 2011 and second pin 2012 of circuit 201, just can trigger step 102 and carry out this moment.
102, the circuit that first blade has been communicated with first pin and second pin carries out reliability testing.
After two pins on the circuit were communicated with by first blade, just can carry out the test of reliability to this circuit this moment, and concrete, step 102 can comprise:
Judge whether the circuit that first blade has been communicated with first pin and second pin produces undesired heating, or, judge whether the circuit that first blade has been communicated with first pin and second pin damages.
After two pins on the circuit are communicated with by first blade, can judge whether this circuit produces undesired heating, if there is abnormal heating phenomenon to produce; Can further test this circuit,, this circuit improved to find out the reason that it produces fault; Because this moment, four pins of this circuit were not communicated with simultaneously, this circuit also just can not be operated in first pattern, owing to have only one to join wherein two pins that blade has been connected this circuit; This is the limit that can tolerate of circuit normally; If produce undesired heating this moment, possibly be that this circuit has defective, need further to judge.Abnormal heating phenomenon the normal heating that produces when wherein the undesired heating of circuit refers to except the circuit operate as normal; For example, all can produce slight heating during general circuit work, then be normal heating; When existing hidden danger (when being unreliable), circuit may produce more heating; For example hot etc., can conclude that then circuit possibly have defective, need further to judge.
In addition, judge that whether the circuit that first blade has been communicated with first pin and second pin damages, and specifically can comprise the steps:
A1, first blade is communicated with first pin and second pin and simultaneously second blade is communicated with the 3rd pin and the 4th pin;
A2, whether operate as normal is in first pattern to judge this circuit, if not indication circuit damages.
For steps A 1, belong to simultaneously the situation that four pins with this circuit are communicated with, steps A 2 can judge whether this circuit is to be operated in first pattern normally; If not; Represent that this circuit damages, need carry out the reparation of fault, if this circuit can operate as normal under first pattern; Show that this circuit has passed through reliability testing, this circuit is qualified.
Need to prove that in embodiments of the present invention, the reliability of decision circuitry can also have multiple implementation except preceding method, some of them implementation just here can not be as to qualification of the present invention.
In embodiments of the present invention, for the circuit that includes four pins, only first pin and second pin have been communicated with through first blade; This moment, the event circuit can not get into work because four pins of circuit are not connected simultaneously; Carry out reliability testing to the circuit that only has been communicated with first pin and second pin this moment, because this kind situation limit that can tolerate of circuit normally, so can judge the unfailing performance of this circuit; Can find the hidden danger of circuit fast; The method of the embodiment of the invention does not need a large amount of third gear ganged switches, and test process is simple, and testing cost is lower.
The embodiment of the invention also provides the method for testing of another kind of circuit reliability, except comprising step 101 as shown in Figure 1 and 102, also comprises the steps, sees also shown in Figure 3:
103, after on first pin that first blade is placed circuit and second pin, second blade is placed on the 3rd pin and the 4th pin of circuit.
In embodiments of the present invention; As shown in Figure 2; After 202 on first blade being placed on first pin 2011 and second pin 2012 of circuit 201, second blade 203 is placed on the 3rd pin 2013 and the 4th pin 2014 of circuit 201, just can trigger step 104 and carry out this moment.
Need to prove that in the preset time after on first pin that first blade is placed circuit and second pin second blade is placed on the 3rd pin and the 4th pin of circuit, preset time is the arbitrary moment between 1 millisecond (ms) to 5 seconds (s); That is to say that after step 101 executed, execution in step 103 in a preset time; This preset time specifically can be the arbitrary moment in the 1ms to 5s; In embodiments of the present invention, for the circuit that needs testing reliability, first blade and second blade (this time is exactly the time of Millisecond or second level usually) during the pin of connection circuit synchronously; The suffertibility of circuit is the poorest; Bad phenomenon might occur, carry out reliability testing to circuit this moment, can obtain good effect.
104, carry out reliability testing to earlier first blade being communicated with after first pin and second pin circuit that second blade is communicated with the 3rd pin and the 4th pin again.
Need to prove; In embodiments of the present invention; Carry out reliability testing to earlier first blade being communicated with after first pin and second pin circuit that second blade is communicated with the 3rd pin and the 4th pin again; Concrete test mode can repeat no more referring to the description of previous embodiment here.
In embodiments of the present invention; For the circuit that includes four pins, carry out reliability testing to earlier first blade being communicated with after first pin and second pin circuit that second blade is communicated with the 3rd pin and the 4th pin again, this moment is because four pins of circuit are not to be connected simultaneously so circuit can not get into work at once; Carry out reliability testing to circuit this moment; Because this kind situation is the limit that can tolerate of circuit normally, so can judge the unfailing performance of this circuit, the method for the embodiment of the invention does not need a large amount of third gear ganged switches; Test process is simple, and testing cost is lower.
The embodiment of the invention also provides the method for testing of another kind of circuit reliability, except comprising that step 101 as shown in Figure 3 to 104, also comprises the steps, sees also shown in Figure 4:
105, when circuit also comprises the 5th pin and the 6th pin; After second blade being placed on the 3rd pin and the 4th pin of circuit; First blade is placed on second pin and the 5th pin of circuit; Wherein, circuit is operated in second pattern when the 4th pin and the 6th pin are communicated with through second blade and second pin and the 5th pin are communicated with through first blade simultaneously.
The circuit of testing reliability generally includes six pins in the embodiment of the invention; As shown in Figure 5; Circuit 201 has comprised six pins; Be respectively first pin 2011, second pin 2012, the 3rd pin 2013, the 4th pin 2014, the 5th pin 2015, the 6th pin 2016; This circuit 201 first pin 2011 and second pin 2012 be communicated with through first blade 202 and simultaneously the 3rd pin 2013 be operated in first pattern during through 203 connections of second blade with the 4th pin 2014; When the 4th pin 2014 and the 6th pin 2016 are communicated with through second blade 203 and second pin 2012 and the 5th pin 2015 are communicated with through first blade 202 simultaneously, be operated in second pattern; That is to say that this circuit can be operated in two kinds of patterns, for example; If this circuit is the control circuit that uses on the Lawn lamp series of products; Six pins have been comprised, the mode of operation that this circuit can get into 6 hours when first blade and second blade were communicated with first pin and second pin, the 3rd pin and the 4th pin of this circuit simultaneously, the mode of operation that this circuit can get into 10 hours when first blade and second blade were communicated with second pin and the 5th pin, the 4th pin and the 6th pin of this circuit simultaneously.
The method that provides based on the embodiment of the invention; When circuit includes 8 pins; This circuit can include three kinds of patterns; For example; If this circuit is the control circuit 201 that uses on the Lawn lamp series of products; As shown in Figure 6, comprised 8 pins (being respectively first pin 2011, second pin 2012, the 3rd pin 2013, the 4th pin 2014, the 5th pin 2015, the 6th pin 2016, the 7th pin 2017, the 8th pin 2018), the mode of operation that this circuit can get into 6 hours when first blade 202 and second blade 203 were communicated with first pin and second pin, the 3rd pin and the 4th pin of this circuit simultaneously; This circuit can get into the OFF pattern when first blade and second blade were communicated with second pin and the 5th pin, the 4th pin and the 6th pin of this circuit simultaneously, the mode of operation that this circuit can get into 10 hours when first blade and second blade were communicated with the 5th pin and the 7th pin, the 6th pin and the 8th pin of this circuit simultaneously.
106, carry out reliability testing to second blade being communicated with after the 3rd pin and the 4th pin circuit that first blade is communicated with second pin and the 5th pin again.
Need to prove; In embodiments of the present invention; Carry out reliability testing to second blade being communicated with after the 3rd pin and the 4th pin circuit that first blade is communicated with second pin and the 5th pin again; Concrete test mode can repeat no more referring to the description of previous embodiment here.
In embodiments of the present invention; For the circuit that includes six pins, second blade is communicated with after the 3rd pin and the 4th pin circuit that first blade is communicated with second pin and the 5th pin again and carries out reliability testing, this moment is because four pins of circuit are not to be connected simultaneously so circuit can not get into work at once; Carry out reliability testing to circuit this moment; Because this kind situation is the limit that can tolerate of circuit normally, so can judge the unfailing performance of this circuit, the method for the embodiment of the invention does not need a large amount of third gear ganged switches; Test process is simple, and testing cost is lower.
In practical application; The circuit reliability proving installation that the embodiment of the invention provides specifically can be built in the existing equipment that circuit is tested; Also can be arranged to an autonomous device separately circuit is tested, specifically can realize the reliability testing of circuit is handled through software or the integrated mode of hardware.To introduce in embodiments of the present invention with said method embodiment in the corresponding device of method introduced; The manner of execution of concrete each unit can be referring to said method embodiment; In this content of only describing correlation unit, specify as follows, as shown in Figure 7; Circuit reliability proving installation 700 comprises:
First connected unit 701; Be used for first blade is placed first pin and second pin of circuit; Circuit comprises: first pin, second pin, the 3rd pin, the 4th pin, circuit are operated in first pattern when first pin and second pin are communicated with through first blade and the 3rd pin and the 4th pin are communicated with through second blade simultaneously;
First test cell 702, the circuit that is used for first blade has been communicated with first pin and second pin carries out reliability testing.
Need to prove that in embodiments of the present invention, for circuit reliability proving installation 700, a kind of implementation as wherein can also comprise (not shown in Fig. 7):
Second connected unit, be used on first pin that first blade is placed circuit and second pin after, second blade is placed on the 3rd pin and the 4th pin of circuit;
Second test cell is used for carrying out reliability testing to earlier first blade being communicated with after first pin and second pin circuit that second blade is communicated with the 3rd pin and the 4th pin again.
Need to prove that in embodiments of the present invention, for circuit reliability proving installation 700, a kind of implementation as wherein can also comprise (not shown in Fig. 7):
The third connecting unit; Be used for when circuit also comprises the 5th pin and the 6th pin; After second blade being placed on the 3rd pin and the 4th pin of circuit; First blade is placed on second pin and the 5th pin of circuit, wherein, circuit is operated in second pattern when the 4th pin and the 6th pin are communicated with through second blade and second pin and the 5th pin are communicated with through first blade simultaneously;
The 3rd test cell is used for carrying out reliability testing to second blade being communicated with after the 3rd pin and the 4th pin circuit that first blade is communicated with second pin and the 5th pin again.
Need to prove; In embodiments of the present invention; For first test cell 702,, be used to specifically to judge whether the circuit that first blade has been communicated with first pin and second pin produces undesired heating as a kind of implementation wherein; Or, judge whether the circuit that first blade has been communicated with first pin and second pin damages.
More concrete, for first test cell 701, be used to judge when whether circuit that first blade has been communicated with first pin and second pin damages, can also comprise following content (not shown in Fig. 7):
Doubly-linked leads to subelement, is used for first blade is communicated with first pin and said second pin and simultaneously second blade is communicated with the 3rd pin and the 4th pin;
Judgment sub-unit, whether operate as normal is in first pattern to be used for decision circuitry, if not indication circuit damages.
Need to prove; Contents such as the information interaction between each module/unit of said apparatus, implementation; Since with the inventive method embodiment based on same design; Its technique effect that brings is identical with the inventive method embodiment, and the narration among the method embodiment shown in particular content is can be referring to the present invention aforementioned is repeated no more here.
In embodiments of the present invention, for the circuit that includes four pins, first connected unit only has been communicated with first pin and second pin through first blade; This moment, the event circuit can not get into work because four pins of circuit are not connected simultaneously; This moment, first test cell carried out reliability testing to the circuit that only has been communicated with first pin and second pin, because this kind situation limit that can tolerate of circuit normally, so can judge the unfailing performance of this circuit; Can find the hidden danger of circuit fast; The device that the embodiment of the invention provides does not need a large amount of third gear ganged switches, and test process is simple, and testing cost is lower.
One of ordinary skill in the art will appreciate that all or part of step that realizes in the foregoing description method is to instruct relevant hardware to accomplish through program; Described program can be stored in a kind of computer-readable recording medium; The above-mentioned storage medium of mentioning can be a ROM (read-only memory), disk or CD etc.
More than the method for testing and the relevant apparatus of a kind of circuit reliability provided by the present invention carried out detailed introduction; For one of ordinary skill in the art; Thought according to the embodiment of the invention; The part that on embodiment and range of application, all can change, in sum, this description should not be construed as limitation of the present invention.
Claims (11)
1. the method for testing of a circuit reliability is characterized in that, comprising:
First blade is placed on first pin and second pin of circuit; Said circuit comprises: first pin, second pin, the 3rd pin, the 4th pin, said circuit are operated in first pattern when said first pin and said second pin are communicated with through said first blade and said the 3rd pin and said the 4th pin are communicated with through second blade simultaneously;
The said circuit that said first blade has been communicated with said first pin and said second pin carries out reliability testing.
2. method according to claim 1 is characterized in that, said method also comprises:
After on first pin that first blade is placed circuit and second pin, said second blade is placed on said the 3rd pin and said the 4th pin of said circuit;
Carry out reliability testing to earlier will said first blade being communicated with the said circuit that said first pin and said second pin be communicated with said the 3rd pin and said the 4th pin with said second blade afterwards again.
3. method according to claim 2 is characterized in that, said method also comprises:
When said circuit also comprises the 5th pin and the 6th pin; After said second blade being placed on said the 3rd pin and said the 4th pin of said circuit; Said first blade is placed on said second pin and said the 5th pin of said circuit; Wherein, said circuit is operated in second pattern when said the 4th pin and said the 6th pin are communicated with through said second blade and said second pin and said the 5th pin are communicated with through said first blade simultaneously;
Carry out reliability testing to said second blade being communicated with after said the 3rd pin and said the 4th pin the more said circuit that said first blade is communicated with said second pin and said the 5th pin.
4. according to right 2 described methods; It is characterized in that; In the preset time after on first pin that first blade is placed circuit and second pin said second blade is placed on said the 3rd pin and said the 4th pin of said circuit, said preset time is the arbitrary moment between 1 millisecond of ms to 5 second s.
5. method according to claim 1 is characterized in that, the said said circuit that said first blade has been communicated with said first pin and said second pin carries out reliability testing, comprising:
Judge whether the said circuit that said first blade has been communicated with said first pin and said second pin produces undesired heating, or, judge whether the said circuit that said first blade has been communicated with said first pin and said second pin damages.
6. according to right 5 described methods, it is characterized in that whether the said said circuit of judging that said first blade has been communicated with said first pin and said second pin damages, and comprising:
Said first blade is communicated with said first pin and said second pin and simultaneously said second blade is communicated with said the 3rd pin and said the 4th pin;
Whether operate as normal is in first pattern to judge said circuit, if not, represent that said circuit damages.
7. a circuit reliability proving installation is characterized in that, comprising:
First connected unit; Be used for first blade is placed first pin and second pin of circuit; Said circuit comprises: first pin, second pin, the 3rd pin, the 4th pin, said circuit are operated in first pattern when said first pin and said second pin are communicated with through said first blade and said the 3rd pin and said the 4th pin are communicated with through second blade simultaneously;
First test cell, the said circuit that is used for said first blade has been communicated with said first pin and said second pin carries out reliability testing.
8. device according to claim 7 is characterized in that, said circuit reliability proving installation also comprises:
Second connected unit, be used on first pin that first blade is placed circuit and second pin after, said second blade is placed on said the 3rd pin and said the 4th pin of said circuit;
Second test cell is used for carrying out reliability testing to earlier will said first blade being communicated with the said circuit that said first pin and said second pin be communicated with said the 3rd pin and said the 4th pin with said second blade afterwards again.
9. device according to claim 8 is characterized in that, said circuit reliability proving installation also comprises:
The third connecting unit; Be used for when said circuit also comprises the 5th pin and the 6th pin; After said second blade being placed on said the 3rd pin and said the 4th pin of said circuit; Said first blade is placed on said second pin and said the 5th pin of said circuit; Wherein, said circuit is operated in second pattern when said the 4th pin and said the 6th pin are communicated with through said second blade and said second pin and said the 5th pin are communicated with through said first blade simultaneously;
The 3rd test cell is used for carrying out reliability testing to said second blade being communicated with after said the 3rd pin and said the 4th pin the more said circuit that said first blade is communicated with said second pin and said the 5th pin.
10. device according to claim 7; It is characterized in that; Said first test cell; Be used to specifically to judge whether the said circuit that said first blade has been communicated with said first pin and said second pin produces undesired heating, or, judge whether the said circuit that said first blade has been communicated with said first pin and said second pin damages.
11. device according to claim 10 is characterized in that, said first test cell comprises:
Doubly-linked leads to subelement, is used for said first blade is communicated with said first pin and said second pin and simultaneously said second blade is communicated with said the 3rd pin and said the 4th pin;
Judgment sub-unit, whether operate as normal is in first pattern to be used to judge said circuit, if not, represent that said circuit damages.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201210239194.1A CN102759703B (en) | 2012-07-11 | 2012-07-11 | Testing method and related device for reliability of circuit |
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| CN201210239194.1A CN102759703B (en) | 2012-07-11 | 2012-07-11 | Testing method and related device for reliability of circuit |
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| CN102759703B CN102759703B (en) | 2015-03-04 |
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| CN102116832A (en) * | 2009-12-30 | 2011-07-06 | 上海汽车集团股份有限公司 | Parameter tester for interference rejection circuit of vehicle power supply |
| US20120026667A1 (en) * | 2010-07-28 | 2012-02-02 | Atluri Prasad R | Enclosure with an e-fuse connected to multiple blade comptuers |
| US20120043619A1 (en) * | 2010-08-20 | 2012-02-23 | Texas Instruments Incorporated | System and circuit for simulating gate-to-drain breakdown |
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| CN102759703B (en) | 2015-03-04 |
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