CN113777528A - IIC leakage current detection circuit, detection method and test tool - Google Patents
IIC leakage current detection circuit, detection method and test tool Download PDFInfo
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Abstract
The invention discloses an IIC leakage current detection circuit, a detection method and a test tool, wherein the IIC leakage current detection circuit comprises: the device comprises a test unit, a switching unit and a tool interface; the tool interface is used for connecting a target product to be tested, and the target product is communicated based on the IIC protocol; the test unit is used for providing driving voltage for the switching unit and providing working voltage and test voltage for a target product through the tool interface; the switching unit is used for switching the working voltage of the target product to a test voltage and disconnecting the IIC end of the target product and the tool interface when the test unit provides the driving voltage; and the test unit is also used for switching the working voltage of the target product into a test voltage at the switching unit, and reading the leakage current of the IIC end after disconnecting the tooling interface and the IIC end of the target product. When the target product is the camera module chip, the invention can carry out IIC leakage current test when the camera module chip is used for lighting test, thereby improving the test efficiency.
Description
Technical Field
The invention relates to the technical field of testing, in particular to an IIC leakage current detection circuit, an IIC leakage current detection method and an IIC leakage current detection tool.
Background
At present, the camera module needs to be detected in the process of producing the camera module. When the existing method is used for monitoring, the conventional shooting performance is generally detected, but the Inter-Integrated Circuit (IIC) leakage current of the camera module cannot be detected. However, the existing products have defects in this respect, and if a station is designed separately for leakage current detection, the production and test efficiency is reduced, and no corresponding existing detection means exists at present.
Therefore, a test current capable of simultaneously lighting the camera module and testing the IIC leakage current of the camera module is needed to ensure high efficiency test.
Disclosure of Invention
In view of this, an embodiment of the present invention provides an IIC leakage current detection circuit, a detection method and a test tool, which can perform an IIC leakage current test when a lighting test is performed on a camera module chip when a target product is the camera module chip, so as to improve test efficiency.
In a first aspect, the present application provides the following technical solutions through an embodiment:
an IIC leakage current detection circuit comprising: the device comprises a test unit, a switching unit and a tool interface; the test unit is connected to the tool interface through the switching unit;
the tool interface is used for connecting a target product to be tested; the target product communicates based on an IIC protocol; the test unit is used for providing a driving voltage for the switching unit and providing a working voltage and a test voltage for the target product through the tool interface; the switching unit is used for switching the working voltage of the target product to a test voltage and disconnecting the target product from the IIC end of the tool interface when the test unit provides the driving voltage; the test unit is further used for switching the working voltage of the target product to a test voltage by the switching unit, disconnecting the tool interface and the IIC end of the target product, and reading the leakage current of the IIC end.
Optionally, the switching unit includes a power relay;
the test unit is used for providing driving voltage for the power supply relay; the power supply relay is used for switching the working voltage of the target product into a test voltage when the test unit provides the driving voltage; the test voltage is less than the drive voltage.
Optionally, the power supply relay includes a first relay and a second relay;
the test unit is used for providing driving voltage for the first relay and the second relay; the first relay is used for maintaining the power supply voltage of the target product when the test unit provides the driving voltage; the second relay is used for cutting off the focusing voltage of the target product when the test unit provides the driving voltage.
Optionally, the switching unit further includes: a signal relay;
the test unit is used for providing driving voltage for the signal relay; the signal relay is used for disconnecting the target product and the IIC end of the tool interface when the test unit provides the driving voltage.
Optionally, the test unit includes a power supply subunit and a reading subunit;
the power supply subunit is used for providing a driving voltage for the switching unit and providing a working voltage and a testing voltage for the target product through the tool interface; the reading subunit is used for reading the current of the IIC end after the switching unit switches the working voltage of the target product to the test voltage and disconnects the tool interface and the IIC end of the target product.
Optionally, the power supply subunit further includes a voltage regulator;
the voltage stabilizer is used for providing 3V driving voltage for the switching unit and providing 1.8V testing voltage for the target product through the tool interface.
Optionally, the IIC leakage current detection circuit further includes: a verification unit;
and the verification unit is used for performing defect response when the leakage current is greater than a preset current threshold value.
In a second aspect, based on the same inventive concept, the present application provides the following technical solutions through an embodiment:
the utility model provides a be used for testing module IIC of making a video recording leaks current test fixture, includes: the IIC leakage current detection circuit according to any one of the first aspects.
In a third aspect, based on the same inventive concept, the present application provides the following technical solutions through an embodiment:
an IIC leakage current detection method applied to the IIC leakage current detection circuit according to any one of the first aspects, the IIC leakage current detection method comprising:
controlling the test unit to provide driving voltage for the switching unit so that the switching unit switches the working voltage of the target product to the test voltage and disconnects the target product from the IIC end of the tool interface; wherein the target product communicates based on an IIC protocol; and controlling the test unit to read the leakage current of the IIC end.
Optionally, the switching unit includes a power relay and a signal relay; the control the test unit provides driving voltage for the switching unit, so that the switching unit switches the working voltage of the target product to the test voltage, and disconnects the target product and the IIC end of the tool interface, including:
controlling the test unit to provide driving voltage for the power supply relay so that the power supply relay switches the working voltage of the target product to test voltage; and controlling the test unit to provide driving voltage for the signal relay so that the signal relay disconnects the target product and the IIC end of the tool interface.
The technical scheme provided in the embodiment of the application at least has the following technical effects or advantages:
an IIC leakage current detection circuit provided in an embodiment of the present invention includes: the device comprises a test unit, a switching unit and a tool interface; the test unit is connected to the tool interface through the switching unit; the tool interface is used for connecting a target product to be tested, and the target product is communicated based on the IIC protocol; the test unit is used for providing driving voltage for the switching unit and providing working voltage and test voltage for a target product through the tool interface; the switching unit is used for switching the working voltage of the target product into a test voltage and disconnecting the IIC end of the target product and the tooling interface when the test unit provides the driving voltage, so that the camera module is ensured to be in a standby state, the IIC is prevented from passing through the working current, and the IIC leakage current test accuracy is ensured; furthermore, the test unit is further configured to switch the working voltage of the target product to a test voltage at the switching unit, and read a leakage current at the IIC end after disconnecting the tool interface and the IIC end of the target product, where the leakage current may be used as a leakage current generated due to a defect of the target product. When the target product is a camera module chip, the test circuit can be effectively integrated into a test tool, IIC leakage current test is carried out in the same test procedure process of lighting test of the camera module chip, and test efficiency is improved.
In order to make the aforementioned and other objects, features and advantages of the present invention comprehensible, preferred embodiments accompanied with figures are described in detail below.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
FIG. 1 is a schematic diagram of an IIC leakage current detection circuit according to an embodiment of the present invention;
fig. 2 is a schematic diagram of an implementation structure of an exemplary switching unit in the embodiment of the present invention;
FIG. 3 is a schematic diagram of an exemplary first relay in an embodiment of the invention;
FIG. 4 is a schematic diagram of an exemplary second relay in an embodiment of the invention;
FIG. 5 is a schematic diagram of an exemplary signal relay in an embodiment of the present invention;
FIG. 6 is a schematic diagram of an exemplary tool interface according to an embodiment of the present disclosure;
fig. 7 is a schematic structural diagram of an exemplary camera module chip according to an embodiment of the present invention;
FIG. 8 is a flowchart illustrating an IIC leakage current detection method according to an embodiment of the present invention.
Icon: 100-IIC leakage current detection circuit; 11-a test unit; 111-a power supply subunit; 112-read subcell; 12-a switching unit; 121-power supply relay; s1-a first relay; s2-a second relay; s3-signal relay; 13-a tooling interface; 20-a camera module chip; 300-IIC leakage current detection means; 301-a handover control module; 302-read control module.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. The components of embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the present invention, presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.
In the description of the present invention, it should be noted that the terms "first", "second", and the like are used only for distinguishing the description, and are not intended to indicate or imply relative importance.
In the description of the present invention, it should also be noted that, unless otherwise explicitly specified or limited, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
The embodiment of the invention provides an IIC leakage current detection circuit 100 which can be applied to a target product to be tested, wherein the target product to be tested can be a product based on IIC protocol communication. In the present embodiment, the target product is taken as an example of a camera module chip, and details of the embodiment will be described later.
Referring to fig. 1, an embodiment of the present invention provides an IIC leakage current detection circuit 100, where the IIC leakage current detection circuit 100 is applicable to a test fixture of a camera module test platform, and the test fixture is used for performing a lighting test on a camera module. The method comprises the following steps: the system comprises a test unit 11, a switching unit 12 and a tool interface 13; the test unit 11 is connected to the tool interface 13 through the switching unit 12.
And the test unit 11 is used for providing a driving voltage for the switching unit 12 and providing a working voltage and a test voltage for the camera module chip 20 through the tool interface 13. And the tool interface 13 is used for connecting the camera module chip 20 to be tested. The switching unit 12 is configured to switch the working voltage of the camera module chip 20 to a test voltage and disconnect the IIC end of the camera module chip 20 and the tool interface 13 when the test unit 11 provides a driving voltage; the testing unit 11 is further configured to switch the working voltage of the camera module chip 20 to a testing voltage at the switching unit 12, and disconnect the IIC end of the tool interface 13 and the camera module chip 20, and then read the leakage current at the IIC end.
The working principle is as follows:
when the camera module performs the lighting test, the test unit 11 does not provide the driving voltage for the switching unit 12; the camera module chip 20 is only supplied with operating voltage, and the camera module is normally turned on at this time. When the IIC leakage current test is performed on the camera module, the test unit 11 provides a driving voltage for the switching unit 12; at this time, the switching unit 12 is driven by the driving voltage to disconnect the working voltage of the camera module chip 20, and then switches to the test voltage to supply power to the camera module chip 20; at this time, the test unit 11 can collect the leakage current at the IIC end of the camera module chip 20.
Specifically, the test unit 11 may include a power supply subunit 111 and a read subunit 112.
And the power supply subunit 111 is configured to provide a driving voltage for the switching unit 12, and provide a working voltage and a testing voltage for the camera module chip 20 through the tool interface 13.
The working voltage of the camera module chip 20 can be directly provided after the power supply subunit 111 is connected to the power supply of the test fixture; the tool power supply may be set to 5V. In addition, the power supply subunit 111 may include a voltage Regulator, for example, implemented by a Low Dropout Regulator (LDO) module, and the structure thereof may be as shown in fig. 2. The voltage stabilizer can be connected to a power supply of the test tool, and the power supply can provide programmable voltage. The voltage stabilizer can convert the voltage of the power supply into different voltages. For example, in the present embodiment, a driving voltage of 3V may be provided for the switching unit 12, and a testing voltage of 1.8V may be provided for the camera module chip 20 through the tool interface 13, as shown in fig. 2; VPP1 is an input programmable voltage which can be 3.6V-4V; VOUT3V is the driving voltage provided for the switching unit 12; when the voltage regulator is powered on and enabled, the OUT port of the voltage regulator can provide 3V driving voltage.
And a reading subunit 112, configured to read a current at the IIC end after the switching unit 12 switches the working voltage of the camera module chip 20 to a test voltage and disconnects the tool interface 13 and the IIC end of the camera module chip 20. The function of the reading sub-unit 112 can be realized by the own functional unit of the camera module testing platform, which is not described in detail in this embodiment.
And a switching unit 12 including a power relay 121 and a signal relay S3. At this time, the test unit 11 is specifically configured to supply the power relay 121 and the signal relay S3 with driving voltages.
And a power relay 121 for switching the operating voltage of the camera module chip 20 to a test voltage when the test unit 11 supplies the driving voltage. The test voltage is less than the drive voltage to realize IIC leakage current detection of the camera module chip 20 under the condition that the camera module is not lighted. The power supply relay 121 may be implemented using a first relay S1 and a second relay S2 to control a supply voltage and a focus voltage among the operating voltages.
Specifically, the first relay S1 is specifically configured to maintain the power supply voltage of the camera module chip 20 when the test unit 11 provides the driving voltage; i.e., the camera module chip 20 is maintained powered. Referring to fig. 3, when the first relay S1 is activated, the first relay S1 is deactivated, the chip pin 2 and pin 3 of the first relay S1 are kept connected, and the pin 6 and pin 7 are kept connected, i.e., the power supply voltage is maintained (i.e., the power supply of the vdd and DVDD is maintained).
The second relay S2 is specifically configured to cut off the focus voltage of the camera module chip 20 when the test unit 11 supplies the driving voltage. At this time, the power supply voltage of the camera module chip 20 is maintained, the focus voltage is cut off, the standby state of the camera module chip 20 can be maintained, and a precondition is provided for the leakage current detection of the camera module IIC. That is, the test voltage in this embodiment is only one set of voltages, i.e., the supply voltage. Referring to fig. 4, when the second relay S2 is activated, the second relay S2 is activated, the chip pins 2 and 3 in the second relay S2 are disconnected, and the pin 6 and the pin 7 are disconnected, i.e. the focusing voltage is disconnected (i.e. the power supply of AFVCC and AVDD is disconnected).
And the signal relay S3 is used for disconnecting the IIC terminal of the tool interface 13 from the camera module chip 20 when the test unit 11 provides the driving voltage. The current generated in the IIC during data signal transmission can be avoided after the IIC end of the camera module chip 20 and the tool interface 13 are disconnected, so that the accuracy of IIC leakage current detection is ensured. Referring to fig. 5, when the signal relay S3 is activated, the signal relay S3 is activated, the chip pins 2 and 3 in the signal relay S3 are disconnected, and the pin 6 is disconnected from the pin 7. Therefore, no current influence generated by the data signal exists in the IIC, and the test accuracy is guaranteed.
In the present embodiment, the first relay S1, the second relay S2, and the signal relay S3 may be implemented by commonly used relay chips capable of connecting and disconnecting two signals.
The tool interface 13 is used for connecting a camera module chip 20 to be tested; the structure of the tool interface 13 is shown in fig. 6. The camera module chip 20 can be plugged into the tool interface 13 through an interface. The interface structure of the camera module chip 20 used in this embodiment is shown in fig. 7. Wherein, the pin 19 and the pin 21 of the camera module chip 20 are respectively communicated with the pin 37 and the pin 39 of the tool interface 13, so as to realize IIC protocol communication; the pins 17, 18 and 20 of the camera module chip 20 can be connected to the pins 16, 18 and 8 of the tool interface 13, respectively, so as to supply power to the camera module chip 20.
Further, the IIC leakage current detection circuit 100 of the present embodiment may further include a verification unit; the verification unit is used for performing defect response when the leakage current is larger than a preset current threshold. The defect response mode can be alarming or logging, and is not limited. The leakage current comparison function of the verification unit can be realized by using a programmable chip, and can also be realized based on the own function of the test fixture, and the method for setting the current comparison is well known by those skilled in the art, and is not described in detail in this embodiment. For example, when the current threshold in this embodiment is 0.2uA, the IIC leakage current of the camera module chip 20 is considered to meet the product requirement if the leakage current is less than 0.2uA, otherwise, it is determined that the IIC leakage current of the camera module chip 20 meets the product requirement.
An IIC leakage current detection circuit 100 according to an embodiment of the present invention includes: the system comprises a test unit 11, a switching unit 12 and a tool interface 13; the test unit 11 is connected to the tool interface 13 through the switching unit 12; the tool interface 13 is used for connecting a camera module chip 20 to be tested; the testing unit 11 is used for providing a driving voltage for the switching unit 12 and providing a working voltage and a testing voltage for the camera module chip 20 through the tool interface 13; the switching unit 12 is configured to switch the working voltage of the camera module chip 20 to a test voltage when the test unit 11 provides the driving voltage, and disconnect the IIC end of the camera module chip 20 and the tool interface 13, so as to ensure that the camera module is in a standby state, avoid the IIC from passing through the working current, and ensure the accuracy of the IIC leakage current test.
Further, the testing unit 11 is further configured to switch the working voltage of the camera module chip 20 to a testing voltage at the switching unit 12, and read a leakage current at the IIC end after disconnecting the tooling interface 13 and the IIC end of the camera module chip 20, where the leakage current may be a leakage current generated due to a defect of the camera module chip 20; and this test circuit can be effectual integrated to the test fixture, carries out IIC leakage current test at camera module chip 20 and carries out the same test procedure process of lighting test, has improved efficiency of software testing.
In another embodiment of the present invention, a testing tool for testing leakage current of an IIC of a camera module is further provided, including: the IIC leakage current detection circuit described in the foregoing embodiments. It should be noted that, the specific implementation and technical effects of the test fixture provided in the embodiment of the present invention are the same as those of the foregoing embodiment related to the IIC leakage current detection circuit, and for a brief description, corresponding contents in the foregoing embodiment may be referred to for what is not mentioned in the embodiment.
Referring to fig. 8, in another embodiment of the present invention, an IIC leakage current detection method is further provided, which can be applied to the IIC leakage current detection circuit in the foregoing embodiment, and the method can be written into a control chip in a test fixture as a program, or stored in an upper computer corresponding to the test fixture, so as to be executed when a camera module chip test is performed. Specifically, the IIC leakage current detection method comprises the following steps:
step S10: controlling the test unit to provide driving voltage for the switching unit so that the switching unit switches the working voltage of the target product to the test voltage and disconnects the target product from the IIC end of the tool interface; wherein the target product communicates based on an IIC protocol.
The implementation at step S10 may specifically include the following processes:
the switching unit includes a power relay and a signal relay S3; firstly, controlling a test unit to provide driving voltage for a power relay so that the power relay switches the working voltage of a camera module chip into test voltage; and then, the control test unit provides driving voltage for the signal relay so that the signal relay disconnects the IIC end of the camera module chip and the tool interface. Thus, the leakage current at the IIC end of the reading tool interface is the current existing in the IIC of the camera module chip; the leakage current is non-working current, so that the accuracy and the reliability of reading the leakage current are ensured.
Step S20: and controlling the test unit to read the leakage current of the IIC end.
In step S20, the specific manner of reading the leakage current at the IIC terminal by the test unit can be found in the previous embodiments with reference to the test unit. Since the IIC leakage current detection circuit may further include a verification unit, after step S20, the verification unit may be further controlled to compare whether the leakage current is greater than the preset current threshold; if so, the verification unit can be controlled to respond to the defect.
It should be noted that, details of implementation and beneficial effects of each step of the method of this embodiment may refer to specific function implementation of each unit in the IIC leakage current detection circuit, and are not described in detail in this embodiment.
As will be appreciated by one skilled in the art, embodiments of the present invention may be provided as a method, system, or computer program product. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present invention is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
While preferred embodiments of the present invention have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including preferred embodiments and all such alterations and modifications as fall within the scope of the invention.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present invention without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include such modifications and variations.
Claims (10)
1. An IIC leakage current detection circuit, comprising: the device comprises a test unit, a switching unit and a tool interface; the test unit is connected to the tool interface through the switching unit;
the tool interface is used for connecting a target product to be tested; the target product communicates based on an IIC protocol;
the test unit is used for providing a driving voltage for the switching unit and providing a working voltage and a test voltage for the target product through the tool interface;
the switching unit is used for switching the working voltage of the target product to a test voltage and disconnecting the target product from the IIC end of the tool interface when the test unit provides the driving voltage;
the test unit is further used for switching the working voltage of the target product to a test voltage by the switching unit, disconnecting the tool interface and the IIC end of the target product, and reading the leakage current of the IIC end.
2. The IIC leakage current detection circuit according to claim 1, wherein the switching unit includes a power supply relay;
the test unit is used for providing driving voltage for the power supply relay;
the power supply relay is used for switching the working voltage of the target product into a test voltage when the test unit provides the driving voltage; the test voltage is less than the drive voltage.
3. The IIC leakage current detection circuit according to claim 2, wherein the power supply relay includes a first relay and a second relay;
the test unit is used for providing driving voltage for the first relay and the second relay;
the first relay is used for maintaining the power supply voltage of the target product when the test unit provides the driving voltage;
the second relay is used for cutting off the focusing voltage of the target product when the test unit provides the driving voltage.
4. The IIC leakage current detection circuit according to claim 1, wherein the switching unit further includes: a signal relay;
the test unit is used for providing driving voltage for the signal relay;
the signal relay is used for disconnecting the target product and the IIC end of the tool interface when the test unit provides the driving voltage.
5. The IIC leakage current detection circuit of claim 1, wherein the test unit includes a power supply subunit and a read subunit;
the power supply subunit is used for providing a driving voltage for the switching unit and providing a working voltage and a testing voltage for the target product through the tool interface;
the reading subunit is used for reading the current of the IIC end after the switching unit switches the working voltage of the target product to the test voltage and disconnects the tool interface and the IIC end of the target product.
6. The IIC leakage current detection circuit of claim 5, wherein said power supply subunit further comprises a voltage regulator;
the voltage stabilizer is used for providing 3V driving voltage for the switching unit and providing 1.8V testing voltage for the target product through the tool interface.
7. The IIC leakage current detection circuit as claimed in claim 5, further comprising: a verification unit;
and the verification unit is used for performing defect response when the leakage current is greater than a preset current threshold value.
8. The utility model provides a be used for testing module IIC that makes a video recording leaks current test fixture which characterized in that includes: the IIC leakage current detection circuit as set forth in any one of claims 1-7.
9. An IIC leakage current detection method applied to the IIC leakage current detection circuit according to any one of claims 1 to 7, the IIC leakage current detection method comprising:
controlling the test unit to provide driving voltage for the switching unit so that the switching unit switches the working voltage of the target product to the test voltage and disconnects the target product from the IIC end of the tool interface; wherein the target product communicates based on an IIC protocol;
and controlling the test unit to read the leakage current of the IIC end.
10. The IIC leakage current detection method according to claim 9, wherein the switching unit includes a power relay and a signal relay; the control the test unit provides driving voltage for the switching unit, so that the switching unit switches the working voltage of the target product to the test voltage, and disconnects the target product and the IIC end of the tool interface, including:
controlling the test unit to provide driving voltage for the power supply relay so that the power supply relay switches the working voltage of the target product to test voltage;
and controlling the test unit to provide driving voltage for the signal relay so that the signal relay disconnects the target product and the IIC end of the tool interface.
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| CN202111064716.4A CN113777528A (en) | 2021-09-10 | 2021-09-10 | IIC leakage current detection circuit, detection method and test tool |
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| CN202111064716.4A CN113777528A (en) | 2021-09-10 | 2021-09-10 | IIC leakage current detection circuit, detection method and test tool |
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Cited By (1)
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| CN116413632A (en) * | 2023-06-12 | 2023-07-11 | 荣耀终端有限公司 | Leakage current testing device and leakage current testing method |
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